A SOT chip high temperature working life detection device

Abstract

The present invention relates to the field of chip detection technology, and specifically discloses a SOT chip high-temperature working life detection device, including a support cabinet and a chip body, the support cabinet includes a cabinet body and a cabinet door, the inner wall of the cabinet is provided with two partitions, the support cabinet is divided into a detection cavity and two distribution cavities by the two partitions, a heating component for heating the chip body is provided in the detection cavity, a supporting component for supporting the heating component is provided in the detection cavity, multiple groups of detection components for detecting the high-temperature working life of the chip body are provided in the support cabinet, and a driving component for adjusting the distance between the heating component and the detection component is provided in the detection cavity. The present invention has an automatic detection function for the working life of the chip at different ambient temperatures, improves the accuracy of the detection data of the chip life, facilitates the placement and removal of the chip body, and prolongs the service life of the life prediction module in the detection component.

Description

Technical Field

[0001] The present invention relates to the technical field of chip detection, and in particular to a SOT chip high temperature working life detection device. Background Art

[0002] SOT chip refers to a chip that uses spin-orbit torque technology, which is a technology that uses the strong spin-orbit coupling of materials to efficiently manipulate non-volatile magnetic storage and spin logic devices. This technology has application potential in fields such as memory, sensors, and magnetic domain movement.

[0003] Chip aging experiment is a common test method used to evaluate the reliability and life of semiconductor chips under high-temperature working conditions. In this experiment, the chip is placed in a high-temperature environment for a long time for accelerated aging to simulate the high-temperature working conditions that may be encountered in actual applications. The purpose of the aging experiment is to study the performance changes and possible failure phenomena of the chip under high-temperature working conditions. Through long-term high-temperature heating, the experimenter can observe and record the changes in the chip's electrical properties, temperature characteristics, reliability indicators and other parameters to infer the chip's life and reliability in actual applications.

[0004] The Chinese patent (CN209028177U) discloses a single chip life prediction module, including a chip, a part of the chip area is used as a detection area; an impedance detection unit, which is connected to the detection area through a binding line and detects the impedance of the detection area as the impedance of the chip; and a judgment unit, which judges whether the degradation of the chip exceeds a preset threshold value based on the impedance of the chip detected by the impedance detection unit, thereby deciding whether it needs to be replaced.

[0005] However, there are some drawbacks in the above-mentioned related technologies. For example, during the chip life detection process, the chip is generally tested at room temperature through a separate chip life prediction module, while the actual chip use environment may have a higher temperature, resulting in the chip life prediction accuracy being not high enough. Summary of the invention

[0006] In order to solve the above problems existing in the prior art, the present invention provides a SOT chip high temperature working life detection device, which can overcome the technical defects.

[0007] The purpose of the present invention can be achieved through the following technical solutions:

[0008] A SOT chip high temperature working life detection device, comprising a support cabinet and a chip body, the support cabinet comprising a cabinet body and a cabinet door, the inner wall of the cabinet body is provided with two partitions, the support cabinet is divided into a detection cavity and two distribution cavities by the two partitions, a heating component for heating the chip body is provided in the detection cavity, a supporting component for supporting the heating component is provided in the detection cavity, a plurality of detection components for detecting the high temperature working life of the chip body are provided in the support cabinet, and a driving component for adjusting the distance between the heating component and the detection component is provided in the detection cavity;

[0009] The heating assembly comprises a heating box, the heating box is located in the detection cavity, a plurality of electric heaters are arranged in the heating box, and a plurality of heat exchange holes are arranged at the bottom end of the heating box;

[0010] The support assembly includes two first right-angle bent plates and two second right-angle bent plates, the two first right-angle bent plates are respectively fixedly installed on the opposite sides of the two partitions, the two second right-angle bent plates are respectively fixedly installed on the opposite sides of the two partitions, two support rods are fixedly installed between the first right-angle bent plate and the second right-angle bent plate on the same partition, a limit block is slidably installed between the two support rods in the same group, and the limit block is fixedly installed on the side wall of the heating box;

[0011] The detection component includes a plurality of detection boxes distributed in an array, support blocks are fixedly installed on the opposite sides of the two partitions, a carrying plate is slidably installed between the two support blocks, the carrying plate is located below the heating box, the detection box passes through and is fixedly installed on the top of the carrying plate, a bottom plate is installed on the bottom end of the detection box by screws, a box cover is rotatably installed on the top of the detection box by hinges, a magnetic suction component is arranged between the box cover and the detection box, a vent is arranged on the top of the box cover, a sealing structure is arranged in the vent of the box cover, a life prediction module for detecting the chip body is arranged on the top of the bottom plate, and a temperature sensor is arranged on the carrying plate.

[0012] Preferably, the cabinet door is rotatably mounted on the open opening of the cabinet body, a window is provided on the side wall of the cabinet door, a glass plate is provided on the window of the cabinet door, and four supporting feet are provided on the bottom end of the supporting cabinet.

[0013] Preferably, a plurality of mounting plates distributed in an array are provided in the power distribution cavity, and the mounting plates are used to install electrical components.

[0014] Preferably, the driving assembly includes a servo motor, a screw is rotatably installed between the first right-angle bent plate and the second right-angle bent plate located on the same partition, the limit block is threadedly connected to the screw, a transmission rod is rotatably installed between the two partitions, a gear set is arranged between the top end of the screw and the transmission rod, the gear set includes two vertically distributed and meshing bevel gears, the two bevel gears of the gear set are respectively keyed to the screw and the transmission rod, the servo motor is fixedly installed on the side wall of one of the partitions, and the output shaft of the servo motor is fixedly connected to the shaft end of the transmission rod through a coupling.

[0015] Preferably, the magnetic attraction assembly includes two groups of carrying boxes and magnetic blocks, the two carrying boxes are fixedly installed on the side walls of the detection box and the box cover respectively, the magnetic blocks are fixedly installed in the carrying boxes, and the two magnetic blocks are arranged in a magnetic attraction manner.

[0016] Preferably, the blocking structure includes a heat insulation board, and the inner walls on both sides of the ventilation opening of the box cover are embedded with limit rails. The heat insulation board passes through one side of the box cover and is slidably installed between the two limit rails. A shift block is provided at the top of the heat insulation board.

[0017] Preferably, the life prediction module includes an insulating substrate, which is fixedly mounted on the top of the base plate, a circuit pattern is arranged on the top of the insulating substrate, an insulating plate is fixedly mounted on the inner wall of the detection box, a plurality of probes are passed through and fixedly mounted on the top of the insulating plate, the probes are electrically connected to the circuit pattern through leads, a life prediction unit is arranged on the top of the insulating substrate, a binding wire is arranged between the chip body and the life prediction unit, a notch is arranged on one side of the insulating plate for passing the binding wire, and an elastic support structure for improving the stability of the chip body is arranged in the detection box.

[0018] Preferably, the elastic support structure includes a lifting plate, which is located above the insulating plate, the probe and the lifting plate are arranged to penetrate each other, a plurality of springs are arranged between the lifting plate and the insulating plate, a plurality of limiting tubes are arranged at the top end of the insulating plate, a plurality of limiting columns are arranged at the bottom end of the lifting plate, and the limiting columns and limiting tubes are slidably connected.

[0019] The beneficial effects of the present invention are:

[0020] 1. By setting up the detection component, the support component and the drive component, the beneficial effect that can be obtained is that multiple chip bodies can be placed on the lifting plate in the detection box according to the needs, and then the box cover is turned over. Through the magnetic suction component, the box cover presses down the chip body, the lifting plate descends, the spring is compressed, the probe is electrically connected to the chip body, the lead is electrically connected to the circuit pattern, the chip body runs, and the chip body is electrically connected to the life prediction unit through the binding wire. When the heating temperature of the chip body needs to be adjusted, multiple electric heaters are opened by changing the number, and the heating temperature is adjusted in a step-by-step manner. The temperature in the detection cavity is heated through the heat exchange hole, and then the servo motor drives the transmission rod to rotate, and the two gear sets drive the two screws to rotate, and the limit block and the support rod are cooperated to adjust the distance between the heating box and the chip body. The temperature sensor detects the heating temperature of the chip body and accurately controls the heating temperature of the chip body. It has the function of automatically detecting the working life of the chip under different ambient temperatures, thereby improving the accuracy of the detection data of the chip life.

[0021] 2. By setting up a magnetic suction component, the beneficial effect that can be obtained is that the magnetic suction component includes two groups of carrying boxes and magnetic blocks, the two carrying boxes are fixedly installed on the side walls of the detection box and the box cover respectively, the magnetic blocks are fixedly installed in the carrying boxes, the two magnetic blocks are magnetically arranged, a vent is provided on the top of the box cover, the two magnetic blocks are respectively installed on the detection box and the side walls of the box cover through the two carrying boxes, the two magnetic blocks attract each other, it is convenient to open or close the detection box, and it is convenient to take and put the chip body.

[0022] 3. By setting a sealing structure, the beneficial effect that can be obtained is that the sealing structure includes a heat insulation board, and the inner walls on both sides of the ventilation hole of the box cover are embedded with limit rails, the heat insulation board passes through one side of the box cover and is slidably installed between the two limit rails, and a shift block is provided on the top of the heat insulation board. Before testing the test box with a chip body inside, the shift block is held to slide the heat insulation board between the fixed limit rails to cancel the blockage of the box cover, and the chip body is exposed to the hot air in the test chamber. Before testing the test box without a chip body inside, the shift block is held to slide the heat insulation board between the fixed limit rails to seal the box cover, insulate the life prediction module in the test box, and extend the service life of the life prediction module in the test component. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to facilitate understanding by those skilled in the art, the present invention is further described below with reference to the accompanying drawings.

[0024] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0025] Figure 2 This is a structural diagram of the installation of the partition in the present invention;

[0026] Figure 3 It is the installation structure diagram of the installation plate in the present invention;

[0027] Figure 4 This is a diagram of the installation structure of the electric heater in the present invention;

[0028] Figure 5 It is the installation structure diagram of the temperature sensor in the present invention;

[0029] Figure 6 The box cover and the detection box of the present invention are in an open state;

[0030] Figure 7 This is a diagram of the opening state of the blocking structure in the present invention;

[0031] Figure 8 This is an installation structure diagram of the life prediction module in the present invention;

[0032] Fig. 9 The figure is a diagram of the installation structure of the chip body and the life prediction unit in the present invention;

[0033] Fig.10 This is a diagram of the installation structure of the limiting tube and the limiting column in the present invention.

[0034] Description of reference numerals:

[0035] In the figure: 1, support cabinet; 11, cabinet body; 12, cabinet door; 13, glass plate; 14, support foot; 15, partition; 16, detection chamber; 17, power distribution chamber; 18, installation plate; 21, heating box; 22, electric heater; 23, heat exchange hole; 24, first right-angle bent plate; 25, second right-angle bent plate; 26, support rod; 27, limit block; 31, screw rod; 32, transmission rod; 33, gear set; 34, servo motor; 41, support Support block; 42, carrier plate; 43, test box; 44, bottom plate; 45, box cover; 46, chip body; 51, carrier box; 52, magnetic block; 53, limit rail; 54, heat insulation board; 55, shift block; 61, insulating substrate; 62, circuit pattern; 63, insulating board; 64, probe; 65, life prediction unit; 66, binding line; 71, lifting plate; 72, spring; 73, limit tube; 74, limit column; 8, temperature sensor. DETAILED DESCRIPTION

[0036] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the specific implementation methods, structures, features and effects of the present invention are clearly and completely described below in combination with the accompanying drawings and preferred embodiments. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0037] In the description of the present application, it should be understood that the orientation or position relationship indicated by "inside", "outside", etc. is based on the orientation or position described in the drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, a specific orientation structure and operation, and therefore cannot be understood as a limitation on the present application.

[0038] Reference Figure 1-Figure 10 , is a SOT chip high temperature working life detection device disclosed in the present invention, comprising a support cabinet 1 and a chip body 46, the support cabinet 1 comprises a cabinet body 11 and a cabinet door 12, the cabinet door 12 is rotatably installed at the open mouth of the cabinet body 11, the side wall of the cabinet door 12 is provided with a window, the window of the cabinet door 12 is provided with a glass plate 13, four support feet 14 are provided at the bottom end of the support cabinet 1, two partitions 15 are provided on the inner wall of the cabinet body 11, the support cabinet 1 is divided into a detection cavity 16 and two distribution cavities 17 by the two partitions 15, a plurality of mounting plates 18 distributed in an array are provided in the distribution cavity 17, the mounting plates 18 are used to install electrical components, and the detection cavity 16 is provided with A heating component is provided for heating the chip body 46, a supporting component for supporting the heating component is provided in the detection cavity 16, a plurality of detection components for detecting the high-temperature working life of the chip body 46 are provided in the support cabinet 1, a driving component for adjusting the distance between the heating component and the detection component is provided in the detection cavity 16, the heating component comprises a heating box 21, the heating box 21 is located in the detection cavity 16, a plurality of electric heaters 22 are provided in the heating box 21, a plurality of heat exchange holes 23 are provided at the bottom end of the heating box 21, the plurality of electric heaters 22 are opened to adjust the heating temperature by changing the number of heaters 22 being opened, and the temperature in the detection cavity 16 is heated through the heat exchange holes 23.

[0039] The support assembly includes two first right-angle bent plates 24 and two second right-angle bent plates 25, the two first right-angle bent plates 24 are respectively fixedly installed on the opposite sides of the two partitions 15, and the two second right-angle bent plates 25 are respectively fixedly installed on the opposite sides of the two partitions 15. Two support rods 26 are fixedly installed between the first right-angle bent plates 24 and the second right-angle bent plates 25 on the same partition 15. A limit block 27 is slidably installed between the two support rods 26 of the same group. The limit block 27 is fixedly installed on the side wall of the heating box 21. The driving assembly includes a servo motor 34. A screw 31 is rotatably installed between the first right-angle bent plate 24 and the second right-angle bent plate 25 on the same partition 15, and the limit block 27 is screwed with the screw 31. The two partitions 15 are connected in a groove manner, and a transmission rod 32 is rotatably installed between the two partitions 15. A gear set 33 is arranged between the top of the screw 31 and the transmission rod 32. The gear set 33 includes two bevel gears that are vertically distributed and meshingly arranged. The two bevel gears of the gear set 33 are keyed to the screw 31 and the transmission rod 32 respectively. The servo motor 34 is fixedly installed on the side wall of one of the partitions 15. The output shaft of the servo motor 34 is fixedly connected to the axial end of the transmission rod 32 through a coupling. When the heating temperature of the chip body 46 needs to be adjusted, the servo motor 34 drives the transmission rod 32 to rotate, and cooperates with the two gear sets 33 to drive the two screws 31 to rotate, and cooperates with the limit block 27 and the support rod 26 to adjust the distance between the heating box 21 and the chip body 46.

[0040] The detection assembly includes a plurality of detection boxes 43 distributed in an array, a support block 41 is fixedly installed on one side of the two partitions 15 facing each other, a bearing plate 42 is slidably installed between the two support blocks 41, the bearing plate 42 is located below the heating box 21, the detection box 43 passes through and is fixedly installed on the top of the bearing plate 42, a bottom plate 44 is installed on the bottom end of the detection box 43 by screws, a box cover 45 is rotatably installed on the top of the detection box 43 by hinges, a magnetic suction assembly is arranged between the box cover 45 and the detection box 43, the magnetic suction assembly includes two groups of bearing boxes 51 and magnetic blocks 52, the two bearing boxes 51 are fixedly installed on the side walls of the detection box 43 and the box cover 45, respectively, and the magnetic blocks 52 is fixedly installed in the carrying box 51, the two magnetic blocks 52 are arranged in a magnetic attraction manner, a vent is arranged at the top of the box cover 45, a blocking structure is arranged in the vent of the box cover 45, the blocking structure includes a heat insulation plate 54, the inner walls on both sides of the vent of the box cover 45 facing each other are embedded with limit rails 53, the heat insulation plate 54 passes through one side of the box cover 45 and is slidably installed between the two limit rails 53, a shift block 55 is arranged on the top of the heat insulation plate 54, the two magnetic blocks 52 are respectively installed on the detection box 43 and the side wall of the box cover 45 through the two carrying boxes 51, the two magnetic blocks 52 attract each other, it is convenient to open or close the detection box 43, and it is convenient to take and put the chip body 46.

[0041] A life prediction module for detecting the chip body 46 is arranged at the top of the bottom plate 44, and the life prediction module includes an insulating substrate 61, which is fixedly mounted on the top of the bottom plate 44, and a circuit pattern 62 is arranged at the top of the insulating substrate 61. An insulating plate 63 is fixedly mounted on the inner wall of the detection box 43, and a plurality of probes 64 are penetrated and fixedly mounted on the top of the insulating plate 63, and the probes 64 are electrically connected to the circuit pattern 62 through leads. A life prediction unit 65 is arranged at the top of the insulating substrate 61, and a binding wire 66 is arranged between the chip body 46 and the life prediction unit 65. A notch for passing the binding wire 66 is arranged on one side of the insulating plate 63, and an elastic support structure for improving the stability of the chip body 46 is arranged in the detection box 43, and the elastic support structure includes a lifting plate 71, and the lifting plate 71 is located above the insulating plate 63, and the probes 64 and the lifting plate 71 are arranged to penetrate, and the lifting plate 71 and the insulating plate 66 are arranged to penetrate. 3 is provided with a plurality of springs 72, a plurality of limit tubes 73 are provided at the top of the insulating plate 63, a plurality of limit posts 74 are provided at the bottom of the lifting plate 71, the limit posts 74 and the limit tubes 73 are slidably sleeved, a temperature sensor 8 is provided on the bearing plate 42, the temperature sensor 8 detects the heating temperature of the chip body 46, cooperates with the driving component, adjusts the distance between the heating box 21 and the chip body 46, and puts a plurality of chip bodies 46 on the lifting plate 71 in the detection box 43 according to the demand, and then turns over the box cover 45, and through the magnetic suction component, the box cover 45 presses down the chip body 46, the lifting plate 71 descends, the spring 72 is compressed, the probe 64 is electrically connected to the chip body 46, and the lead is electrically connected to the circuit pattern 62, the chip body 46 runs, and the chip body 46 is electrically connected to the life prediction unit 65 through the binding wire 66. The working principle of the life prediction unit 65 is the existing technology, which will not be elaborated in detail in this embodiment.

[0042] The working principle and use process of the present invention are as follows: as required, multiple chip bodies 46 are placed on the lifting plate 71 in the detection box 43, and then the box cover 45 is turned over. Through the magnetic suction component, the box cover 45 presses down the chip body 46, the lifting plate 71 descends, the spring 72 is compressed, the probe 64 is electrically connected to the chip body 46, and the lead is electrically connected to the circuit pattern 62, the chip body 46 is running, and the chip body 46 is electrically connected to the life prediction unit 65 through the binding line 66. When it is necessary to adjust the heating temperature of the chip body 46, multiple electric heaters 22 are opened in a large-scale step-by-step manner by changing the number of heaters, and the temperature in the detection cavity 16 is heated through the heat exchange hole 23. Then the servo motor 34 drives the transmission rod 32 to rotate, cooperates with the two gear sets 33 to drive the two screws 31 to rotate, cooperates with the limit block 27 and the support rod 26 to adjust the distance between the heating box 21 and the chip body 46 Spacing, the temperature sensor 8 detects the heating temperature of the chip body 46 and accurately controls the heating temperature of the chip body 46. The two magnetic blocks 52 are respectively installed on the side walls of the detection box 43 and the box cover 45 through the two supporting boxes 51. The two magnetic blocks 52 attract each other, which is convenient for opening or closing the detection box 43 and taking and placing the chip body 46. Before testing the detection box 43 with the chip body 46, the hand-held shift block 55 slides the insulation board 54 between the fixed limit rails 53 to cancel the blockage of the box cover 45, and the chip body 46 is exposed to the hot air of the detection chamber 16. Before testing the detection box 43 without the chip body 46, the hand-held shift block 55 slides the insulation board 54 between the fixed limit rails 53 to block the box cover 45, and insulates the life prediction module in the detection box 43, thereby extending the service life of the life prediction module in the detection component.

[0043] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any form. Although the present invention has been disclosed as a preferred embodiment as above, it is not used to limit the present invention. Any technical personnel in this field can make some changes or modify the technical contents disclosed above into equivalent embodiments without departing from the scope of the technical solution of the present invention. However, any brief modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention still fall within the scope of the technical solution of the present invention.

Claims

1. A SOT chip high temperature working life detection device, comprising a support cabinet (1) and a chip body (46), characterized in that: The support cabinet (1) comprises a cabinet body (11) and a cabinet door (12); the inner wall of the cabinet body (11) is provided with two partitions (15); the support cabinet (1) is divided into a detection chamber (16) and two power distribution chambers (17) by the two partitions (15); a heating component for heating a chip body (46) is provided in the detection chamber (16); a supporting component for supporting the heating component is provided in the detection chamber (16); a plurality of detection components for detecting the high-temperature working life of the chip body (46) are provided in the support cabinet (1); and a driving component for adjusting the distance between the heating component and the detection component is provided in the detection chamber (16); The detection component comprises a plurality of detection boxes (43) distributed in an array, a support block (41) is fixedly mounted on one side of the two partitions (15) facing each other, a carrier plate (42) is slidably mounted between the two support blocks (41), the detection box (43) penetrates and is fixedly mounted on the top of the carrier plate (42), a bottom plate (44) is mounted on the bottom of the detection box (43) by screws, a box cover (45) is rotatably mounted on the top of the detection box (43) by hinges, a magnetic attraction component is arranged between the box cover (45) and the detection box (43), a vent is arranged on the top of the box cover (45), a sealing structure is arranged in the vent of the box cover (45), a life prediction module for detecting a chip body (46) is arranged on the top of the bottom plate (44), and a temperature sensor (8) is arranged on the carrier plate (42); The blocking structure comprises a heat insulating plate (54), and inner walls on both sides of the vent of the box cover (45) facing each other are both provided with limit rails (53), the heat insulating plate (54) passes through one side of the box cover (45) and is slidably mounted between the two limit rails (53), and a shifting block (55) is provided at the top end of the heat insulating plate (54); The life prediction module comprises an insulating substrate (61), the insulating substrate (61) is fixedly mounted on the top of a bottom plate (44), a circuit pattern (62) is arranged on the top of the insulating substrate (61), an insulating plate (63) is fixedly mounted on the inner wall of the detection box (43), a plurality of probes (64) are penetrated and fixedly mounted on the top of the insulating plate (63), the probes (64) are electrically connected to the circuit pattern (62) through leads, a life prediction unit (65) is arranged on the top of the insulating substrate (61), a binding wire (66) is arranged between the chip body (46) and the life prediction unit (65), a notch for passing the binding wire (66) is arranged on one side of the insulating plate (63), and an elastic support structure for improving the stability of the chip body (46) is arranged in the detection box (43); The elastic support structure comprises a lifting plate (71), the lifting plate (71) is located above the insulating plate (63), the probe (64) and the lifting plate (71) are arranged to penetrate each other, a plurality of springs (72) are arranged between the lifting plate (71) and the insulating plate (63), a plurality of limiting tubes (73) are arranged at the top end of the insulating plate (63), a plurality of limiting columns (74) are arranged at the bottom end of the lifting plate (71), and the limiting columns (74) and the limiting tubes (73) are slidably sleeved.

2. A SOT chip high temperature working life detection device according to claim 1, characterized in that: The cabinet door (12) is rotatably mounted on an open opening of the cabinet body (11); a window is provided on a side wall of the cabinet door (12); a glass plate (13) is provided on the window of the cabinet door (12); and four supporting legs (14) are provided at the bottom end of the supporting cabinet (1).

3. A SOT chip high temperature working life detection device according to claim 1, characterized in that: A plurality of mounting plates (18) distributed in an array are arranged in the power distribution cavity (17), and the mounting plates (18) are used to mount electrical components.

4. A SOT chip high temperature working life detection device according to claim 1, characterized in that: The support assembly comprises two first right-angle bent plates (24) and two second right-angle bent plates (25); the two first right-angle bent plates (24) are respectively fixedly mounted on the opposite sides of the two partitions (15); the two second right-angle bent plates (25) are respectively fixedly mounted on the opposite sides of the two partitions (15); two support rods (26) are fixedly mounted between the first right-angle bent plates (24) and the second right-angle bent plates (25) on the same partition (15); a limit block (27) is slidably mounted between the two support rods (26) in the same group; the limit block (27) is fixedly mounted on the side wall of the heating box (21).

5. A SOT chip high temperature working life detection device according to claim 4, characterized in that: The driving assembly comprises a servo motor (34); a screw rod (31) is rotatably mounted between the first right-angle bent plate (24) and the second right-angle bent plate (25) located on the same partition (15); the limit block (27) is threadedly connected to the screw rod (31); a transmission rod (32) is rotatably mounted between the two partitions (15); a gear set (33) is arranged between the top end of the screw rod (31) and the transmission rod (32); the gear set (33) comprises two bevel gears that are vertically distributed and meshingly arranged; the two bevel gears of the gear set (33) are keyed to the screw rod (31) and the transmission rod (32), respectively; the servo motor (34) is fixedly mounted on the side wall of one of the partitions (15); and the output shaft of the servo motor (34) is fixedly connected to the shaft end of the transmission rod (32) via a coupling.

6. A SOT chip high temperature working life detection device according to claim 1, characterized in that: The heating assembly comprises a heating box (21), the heating box (21) being located in the detection chamber (16), a plurality of electric heaters (22) being arranged in the heating box (21), a plurality of heat exchange holes (23) being arranged at the bottom end of the heating box (21), and the supporting plate (42) being located below the heating box (21).

7. A SOT chip high temperature working life detection device according to claim 1, characterized in that: The magnetic attraction assembly comprises two groups of carrying boxes (51) and magnetic blocks (52); the two carrying boxes (51) are fixedly mounted on the side walls of the detection box (43) and the box cover (45), respectively; the magnetic blocks (52) are fixedly mounted in the carrying boxes (51); and the two magnetic blocks (52) are arranged in a magnetic attraction manner.

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