A dual-air duct memory test server

Abstract

A dual-air duct memory test server provided by the present invention belongs to the field of memory test technology, and includes a test device, the test device is used to test the memory, and the test device is provided with two picking devices and two conveying devices, the picking device is used to place the memory on the test device, and the conveying device is used to convey the memory to be tested and the memory after the test. The test device provided by the present invention is provided with multiple memory sockets, and the picking device inserts the memory into the corresponding slots of the test motherboard in batches for multiple times. During the test, the heat sink of the test motherboard is cooled by the dual air ducts, and the corresponding marking mechanism marks the unqualified memory, and the test efficiency is high; two clamping mechanisms are respectively provided on the two picking devices, one for inserting the memory to be tested into the test motherboard, and the other for pulling out the tested memory from the test motherboard, and the two are performed continuously, with a high degree of automation and good continuity.

Description

Technical Field

[0001] The invention relates to the technical field of memory testing, and in particular to a stainless steel angle steel hardness detection device. Background Art

[0002] A memory test server is a special server that is mainly used to test the performance and reliability of computer memory. This server has many memory slots, and most of them support hot plugging to improve the test speed and effect. The memory, including read and write speed, bandwidth test, and fault detection, is mainly tested through the memory test software built into the server motherboard, so as to screen out the memory that functions normally and meets the stress test; the dual-duct memory test server in the prior art mainly tests the memory through the test motherboard. When the memory test fails, the unqualified memory needs to be marked and distinguished so that it can be removed for repair or scrapping later. When the memory is tested continuously, the test motherboard will heat up severely, and the test motherboard needs to be cooled. At the same time, the existing memory test server usually cannot realize continuous batch memory automatic detection, and the degree of automation is low. Summary of the invention

[0003] In response to the above technical problems, the technical solution adopted by the present invention is: a dual-duct memory testing server, including a testing device, the testing device including a base box, the testing device being used to test the memory, the testing device being provided with two picking devices and two conveying devices, the picking device including a picking electric cylinder, the picking electric cylinder being fixedly installed in the base box, the picking device being used to place the memory on the testing device, the conveying device including two transmission wheels, the transmission wheels being rotatably installed on the base box, and the conveying device being used to convey the memory to be tested and the memory after the test is completed.

[0004] Furthermore, the testing device includes a testing mainboard fixedly mounted on a base box, a duct shell fixedly mounted on the base box, two mainboard heat sinks fixedly mounted on the testing mainboard, the duct shell is divided into two air ducts, the air ducts are separated from the two mainboard heat sinks, a fan is fixedly mounted in the base box, the top of the testing mainboard is divided into two sides by the duct shell, four memory chips are inserted into each side through a card slot, a server is arranged on the testing mainboard, and the memory is tested by controlling the testing mainboard through the server.

[0005] Furthermore, eight marking mechanisms are provided on the base box, which are respectively located in front of the eight memory chips, and the marking mechanism includes a marking electric cylinder fixedly installed on the base box, a movable block is fixedly installed on the top of the marking electric cylinder, a movable rack is fixedly installed on the movable block, a marking gear is rotatably installed on the air duct shell, a support block is fixedly installed on the air duct shell, the movable rack is meshed with the marking gear, a marking rack is meshed on the marking gear, a fixed support is fixedly installed on the marking rack, a rotating cover is rotatably installed on the fixed support, a marking pen is clamped between the fixed support and the rotating cover, the rotating cover is connected to the fixed support by a snap buckle, the marking pen is slidably installed on the air duct shell, and the marking pen is slidably installed on the support block. When the marking pen needs to be replaced, the rotating cover is opened to replace the marking pen.

[0006] The memory is inserted into the card slot of the test mainboard by the taking device, and the memory is tested through the server controlling the test mainboard. During the test, the test mainboard dissipates heat through the mainboard heat sink, and the fan starts to blow air to the air duct shell, thereby blowing air to dissipate heat from the mainboard heat sink. When the tested memory is unqualified, the marking electric cylinder corresponding to the unqualified memory extends, driving the movable block and the movable rack to move, thereby driving the marking gear to rotate, thereby driving the marking rack and the fixed support to slide inward, thereby driving the marking pen to slide inward, and the memory that failed the test is marked by the marking pen.

[0007] Furthermore, the picking device includes a support plate fixedly installed on the top of the picking electric cylinder, an inner groove cylinder fixedly installed on the bottom box, a lifting and lowering rotating rod rotatably installed on the air duct shell, the lifting and lowering rotating rod can slide in the air duct shell, a turntable and a quarter gear are fixedly installed on the lifting and lowering rotating rod, the turntable is rotatably installed with the support plate, and a transfer gear is rotatably installed on the bottom box.

[0008] Furthermore, an inner signal transmitter is fixedly mounted on the air duct shell, and an outer signal transmitter is fixedly mounted on the inner corrugated cylinder.

[0009] Furthermore, two clamping mechanisms are provided on the lifting and lowering rotating rod, one clamping mechanism is used to remove the memory on the conveying device and insert the memory into the test mainboard, and the other clamping mechanism is used to pull out the tested memory in the test mainboard and place the tested memory on the conveyor belt. The clamping mechanism includes a top bending tube fixedly installed on the lifting and lowering rotating rod, a clamping frame is fixedly installed on the top bending tube, a clamping electric cylinder is fixedly installed on the clamping frame, a lifting plate is fixedly installed on the top of the clamping electric cylinder, a rotating rod is rotatably installed on the lifting plate, six clamping plates are slidably installed on the clamping frame, the rotating rod and the clamping plate are rotatably installed, and an induction sheet is fixedly installed on the clamping frame.

[0010] Furthermore, the lifting rod is provided with four semi-convex balls, and the inner groove cylinder is provided with four vertical grooves, an upper curved groove and a lower curved groove, and the semi-convex balls slide in the vertical grooves, the upper curved grooves and the lower curved grooves.

[0011] The extension of the picking electric cylinder drives the pallet up, thereby driving the turntable and the lifting rod to rise. The semi-convex ball slides along the vertical groove first. At this time, the lifting rod and the top bending tube rise vertically. When the semi-convex ball reaches the upper curved arc groove, the semi-convex ball drives the lifting rod and the top bending tube to rotate forty-five degrees under the action of the upper curved arc groove. At this time, the picking electric cylinder is in the longest extended position. Then the picking electric cylinder contracts, driving the pallet to descend, thereby driving the turntable and the lifting rod to descend. The semi-convex ball reaches the lower curved arc groove. Under the action of the lower curved arc groove, the semi-convex ball drives the lifting rod and the top bending tube to rotate forty-five degrees. Then the lifting rod and the top bending tube begin to descend vertically, that is, each time the picking electric cylinder is lifted, it first drives the lifting rod and the top bending tube to rise, then rotates ninety degrees and then descends.

[0012] When the clamping mechanism for pulling out the memory on the test mainboard reaches above the memory on the test mainboard, the lifting rod and the top bending tube descend, so that the two outer memories on the test mainboard are respectively located between the clamping frame and the clamping plate, and the two inner memories are respectively located between the two sets of clamping plates. At this time, the internal signal transmitter detects the sensor sheet, and the internal signal transmitter controls the clamping electric cylinder to contract, driving the lifting plate to descend, thereby driving the rotating rod to rotate, thereby driving the clamping plate to slide, clamping the memory, and then the taking electric cylinder extends, and the top bending tube rises, driving the memory to rise together, The four tested memories are pulled out and taken away from the test main board; when the clamping mechanism brings the memories to the top of the conveyor belt, the lifting rod and the top bending tube descend, and the tested memories are placed on the conveyor belt. At this time, the conveyor belt has not moved since the memories on it were taken away. When the external signal transmitter detects the sensor sheet, the external signal transmitter controls the clamping electric cylinder to rise, driving the lifting plate to rise, thereby driving the rotating rod to rotate, thereby driving the clamping plate to slide, releasing the memories, and the memories stay on the conveyor belt. Then the lifting rod and the top bending tube rise, and this reciprocating process is repeated.

[0013] When the clamping mechanism for taking away the memory on the conveyor belt reaches above the conveyor belt, the lifting rotating rod and the top bending tube descend, so that the two outer memories on the conveyor belt are respectively located between the clamping frame and the clamping plate, and the two inner memories are respectively located between the two groups of clamping plates. At this time, the external signal transmitter detects the sensor sheet, and the external signal transmitter controls the clamping electric cylinder to contract, drive the lifting plate to descend, thereby driving the rotating rod to rotate, thereby driving the clamping plate to slide, clamping the memory, and then the taking electric cylinder extends, and the rising of the top bending tube will drive the memory to rise together, and the four memories to be tested are taken away from the conveyor belt; when the clamping mechanism brings the memory to the top of the test mainboard, the lifting rotating rod and the top bending tube descend, and the memory is inserted into the test mainboard. The memory previously inserted into the test mainboard has been tested and taken away, and the internal signal transmitter detects the sensor sheet, and the internal signal transmitter controls the clamping electric cylinder to extend, drive the lifting plate to rise, thereby driving the rotating rod to rotate, thereby driving the clamping plate to slide, releasing the memory, and the memory stays in the test mainboard, and this reciprocating process is repeated.

[0014] Furthermore, the conveying device comprises a conveying belt wound around the outside of two transmission wheels, and a plurality of docking teeth are arranged on the conveying belt, and the docking teeth are meshed with the transfer gear.

[0015] When the clamping mechanism for taking away the memory on the conveyor belt is about to reach the top of the conveyor belt again, that is, after the lifting rod and the clamping frame rotate 270 degrees from the initial state, the lifting rod starts to rise again, which will drive the quarter gear to rise, and the quarter gear starts to mesh with the transfer gear. As the lifting rod reaches the highest point and rotates ninety degrees, the quarter gear will drive the transfer gear to rotate ninety degrees. The rotation of the transfer gear drives the docking teeth and the conveyor belt to advance one station, so that the next batch of memory to be tested arrives under the clamping mechanism for taking away the memory on the conveyor belt, and so on. The memory to be tested on the conveyor belt is continuously placed into the test mainboard for testing, and before the memory to be tested is placed in the test mainboard, the tested memory in the test mainboard is first pulled out and placed on the conveyor belt.

[0016] That is, each time the memory on the test mainboard that has been tested is first pulled out by the clamping mechanism for pulling out the memory on the test mainboard. When the electric cylinder is lifted next time, the clamping mechanism for picking up the memory on the conveyor belt inserts the memory to be tested into the test mainboard. When the clamping mechanism for pulling out the memory on the test mainboard puts the tested memory on the conveyor belt, the conveyor belt has not moved forward yet. The tested memory is placed at the position of the memory to be tested that has been taken out. When the electric cylinder is lifted next time, the conveyor belt will be driven forward one station, so that the next round of memory to be tested arrives under the clamping mechanism for picking up the memory on the conveyor belt, and the tested memory is conveyed forward, and this cycle repeats.

[0017] Compared with the prior art, the present invention has the following beneficial effects: (1) The test device provided by the present invention is provided with a plurality of memory slots, and the memory is inserted into the corresponding slots of the test mainboard in batches multiple times by two picking devices. When the memory is tested, the heat sink of the test mainboard is cooled by the dual air ducts. When the memory is found to be unqualified, the corresponding marking mechanism marks the unqualified memory, and the test efficiency is high; (2) Two gripping mechanisms are respectively provided on the two picking devices provided by the present invention, one for inserting the memory to be tested into the test mainboard, and the other for pulling out the tested memory from the test mainboard, and the two are performed continuously, with a high degree of automation and good continuity; (3) The conveying device provided by the present invention uniformly conveys the memory to be tested and the memory after the test is completed. After the memory to be tested is taken away by the gripping mechanism, the other gripping mechanism places the memory after the test is completed on the conveyor belt, which is located at the position where the memory to be tested that was taken away before is placed. The picking device drives the conveying device to automatically advance one station every 360 degrees, delivers the memory after the test, and delivers the next group of memory to be tested to the bottom of the gripping mechanism. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a schematic diagram of the overall structure of the present invention.

[0019] Figure 2 The structure of the test device of the present invention is shown in FIG. Figure 1 .

[0020] Figure 3 The structure of the test device of the present invention is shown in FIG. Figure 2 .

[0021] Figure 4 The structure of the test device of the present invention is shown in FIG. Figure 3 .

[0022] Figure 5 For the present invention Figure 4 A local enlarged schematic diagram of point A in the middle.

[0023] Figure 6 The structure of the picking device of the present invention is shown in FIG. Figure 1 .

[0024] Figure 7 The structure of the picking device of the present invention is shown in FIG. Figure 2 .

[0025] Figure 8 It is a schematic diagram of the structure of the clamping mechanism of the present invention.

[0026] Fig. 9 The structure of the picking device of the present invention is shown in FIG. Figure 3 .

[0027] Fig.10 It is a schematic diagram of the cooperation between the semi-convex ball and the inner groove cylinder of the present invention.

[0028] Fig.11 The structure of the conveying device of the present invention is shown in FIG. Figure 1 .

[0029] Fig.12 The structure of the conveying device of the present invention is shown in FIG. Figure 2 .

[0030] Figure numbers: 101-bottom box; 102-test motherboard; 103-air duct shell; 104-fan; 105-mainboard heat sink; 106-memory; 107-support block; 108-marking electric cylinder; 109-movable block; 110-movable rack; 111-marking gear; 112-marking rack; 113-fixed support; 114-rotating cover; 115-marking pen; 201-take electric cylinder; 202-support plate; 203-lifting rod; 204-turntable; 2 05-quarter gear; 206-inner groove cylinder; 207-transfer gear; 208-inner signal transmitter; 209-outer signal transmitter; 210-top bending pipe; 211-clamping frame; 212-lifting plate; 213-clamping electric cylinder; 214-rotating rod; 215-clamping plate; 216-semi-convex ball; 217-vertical groove; 218-upper curved arc groove; 219-lower curved arc groove; 220-induction plate; 301-transmission wheel; 302-convex belt; 303-jointing tooth. DETAILED DESCRIPTION

[0031] The specific implementation of the present invention will be further described below in conjunction with the accompanying drawings.

[0032] Example: Reference Figure 1-Figure 12 A dual-duct memory test server includes a test device, the test device includes a bottom box 101, the test device is used to test the memory, the test device is provided with two picking devices and two conveying devices, the picking device includes a picking electric cylinder 201, the picking electric cylinder 201 is fixedly installed in the bottom box 101, the picking device is used to place the memory on the test device, the conveying device includes two transmission wheels 301, the transmission wheels 301 are rotatably installed on the bottom box 101, and the conveying device is used to convey the memory to be tested and the memory after the test is completed.

[0033] like Figure 2-Figure 5 As shown, the test device includes a test mainboard 102 fixedly mounted on a base box 101, a duct shell 103 fixedly mounted on the base box 101, two mainboard heat sinks 105 fixedly mounted on the test mainboard 102, the duct shell 103 is divided into two air ducts, the air ducts are separated from the two mainboard heat sinks 105, a fan 104 is fixedly mounted in the base box 101, the upper part of the test mainboard 102 is divided into two sides by the duct shell 103, four memory chips 106 are inserted into each side through a card slot, and a server is arranged on the test mainboard 102, and the test mainboard 102 is controlled by the server to test the memory 106.

[0034] like Figure 2-Figure 5As shown, eight marking mechanisms are arranged on the bottom box 101, which are respectively located in front of the eight memory chips 106. The marking mechanism includes a marking electric cylinder 108 fixedly mounted on the bottom box 101, a movable block 109 is fixedly mounted on the top of the marking electric cylinder 108, a movable rack 110 is fixedly mounted on the movable block 109, a marking gear 111 is rotatably mounted on the air duct housing 103, a support block 107 is fixedly mounted on the air duct housing 103, the movable rack 110 is meshed with the marking gear 111, and the marking gear 111 is engaged with the marking gear 111. A marking rack 112 is meshed on the upper portion, a fixed support 113 is fixedly mounted on the marking rack 112, a rotating cover 114 is rotatably mounted on the fixed support 113, a marking pen 115 is clamped between the fixed support 113 and the rotating cover 114, the rotating cover 114 and the fixed support 113 are connected by a snap, the marking pen 115 is slidably mounted on the air duct shell 103, and the marking pen 115 is slidably mounted on the support block 107. When the marking pen 115 needs to be replaced, the rotating cover 114 is opened to replace the marking pen 115.

[0035] The memory 106 is inserted into the card slot of the test mainboard 102 by the taking device, and the test mainboard 102 is controlled by the server to test the memory 106. During the test, the test mainboard 102 dissipates heat through the mainboard heat sink 105, and the fan 104 is started to blow air to the air duct shell 103, thereby blowing air to dissipate heat to the mainboard heat sink 105. When the tested memory 106 is unqualified, the marking electric cylinder 108 corresponding to the unqualified memory 106 extends, driving the movable block 109 and the movable rack 110 to move, thereby driving the marking gear 111 to rotate, thereby driving the marking rack 112 and the fixed support 113 to slide inward, thereby driving the marking pen 115 to slide inward, and the memory 106 that failed the test is marked by the marking pen 115.

[0036] like Figure 6-Figure 10 As shown, the picking device includes a support plate 202 fixedly mounted on the top of the picking electric cylinder 201, an inner groove cylinder 206 fixedly mounted on the bottom box 101, a lifting rod 203 rotatably mounted on the air duct shell 103, the lifting rod 203 can slide in the air duct shell 103, a turntable 204 and a quarter gear 205 are fixedly mounted on the lifting rod 203, the turntable 204 is rotatably mounted with the support plate 202, and a transfer gear 207 is rotatably mounted on the bottom box 101.

[0037] like Figure 6-Figure 10 As shown, an inner signal transmitter 208 is fixedly mounted on the air duct housing 103 , and an outer signal transmitter 209 is fixedly mounted on the inner corrugated cylinder 206 .

[0038] like Figure 6-Figure 10As shown, two clamping mechanisms are arranged on the lifting rod 203, one clamping mechanism is used to take away the memory 106 on the conveying device and insert the memory 106 into the test main board 102, and the other clamping mechanism is used to pull out the tested memory 106 in the test main board 102 and place the tested memory 106 on the conveyor belt 302, and the clamping mechanism includes a top bending tube 210 fixedly mounted on the lifting rod 203, a clamping frame 211 is fixedly mounted on the top bending tube 210, a clamping electric cylinder 213 is fixedly mounted on the clamping frame 211, a lifting plate 212 is fixedly mounted on the top of the clamping electric cylinder 213, a rotating rod 214 is rotatably mounted on the lifting plate 212, six clamping plates 215 are slidably mounted on the clamping frame 211, the rotating rod 214 and the clamping plate 215 are rotatably mounted, and an induction sheet 220 is fixedly mounted on the clamping frame 211.

[0039] like Figure 6-Figure 10 As shown, four semi-convex balls 216 are arranged on the lifting rotating rod 203, and four vertical grooves 217, an upper curved groove 218 and a lower curved groove 219 are arranged in the inner groove cylinder 206, and the semi-convex balls 216 slide in the vertical grooves 217, the upper curved grooves 218 and the lower curved grooves 219.

[0040] The pick-up electric cylinder 201 extends to drive the support plate 202 to rise, thereby driving the turntable 204 and the lifting rod 203 to rise, and the semi-convex ball 216 first slides along the vertical groove 217. At this time, the lifting rod 203 and the top curved tube 210 rise vertically. When the semi-convex ball 216 reaches the upper curved arc groove 218, the semi-convex ball 216 drives the lifting rod 203 and the top curved tube 210 to rotate forty-five degrees under the action of the upper curved arc groove 218. At this time, the pick-up electric cylinder 201 is in the longest extended position, and then the pick-up electric cylinder 201 is The cylinder 201 contracts, driving the support plate 202 to descend, thereby driving the turntable 204 and the lifting rod 203 to descend, and the semi-convex ball 216 reaches the lower curved arc groove 219. Under the action of the lower curved arc groove 219, the semi-convex ball 216 drives the lifting rod 203 and the top curved tube 210 to rotate forty-five degrees, and then the lifting rod 203 and the top curved tube 210 begin to descend vertically, that is, each time the electric cylinder 201 is lifted, it first drives the lifting rod 203 and the top curved tube 210 to rise, then rotate ninety degrees and then descend.

[0041] When the clamping mechanism for pulling out the memory 106 on the test mainboard 102 reaches above the memory 106 on the test mainboard 102, the lifting rod 203 and the top bending tube 210 descend, so that the two outer memories 106 on the test mainboard 102 are respectively located between the clamping frame 211 and the clamping plate 215, and the two inner memories 106 are respectively located between the two groups of clamping plates 215. At this time, the internal signal transmitter 208 detects the sensor sheet 220, and the internal signal transmitter 208 controls the clamping electric cylinder 213 to contract, driving the lifting plate 212 to descend, thereby driving the rotating rod 214 to rotate, thereby driving the clamping plate 215 to slide, clamping the memory 106, and then the taking electric cylinder 201 extends, and the top bending tube 210 rises to drive the memory 106 to rise together , pull out and take away the four tested memories 106 from the test main board 102; when the clamping mechanism brings the memories 106 to the top of the conveyor belt 302, the lifting rod 203 and the top bending tube 210 descend, and put the tested memories 106 on the conveyor belt 302. At this time, the conveyor belt 302 has not moved since the memories 106 on it were taken away. When the external signal transmitter 209 detects the sensor sheet 220, the external signal transmitter 209 controls the clamping electric cylinder 213 to rise, driving the lifting plate 212 to rise, thereby driving the rotating rod 214 to rotate, thereby driving the clamping plate 215 to slide, releasing the memories 106, and the memories 106 stay on the conveyor belt 302, and then the lifting rod 203 and the top bending tube 210 rise, and this reciprocating cycle is repeated.

[0042] When the clamping mechanism for taking away the memory 106 on the conveyor belt 302 reaches the top of the conveyor belt 302, the lifting rod 203 and the top bending tube 210 descend, so that the two outer memories 106 on the conveyor belt 302 are respectively located between the clamping frame 211 and the clamping plate 215, and the two inner memories 106 are respectively located between the two groups of clamping plates 215. At this time, the external signal transmitter 209 detects the sensor sheet 220, and the external signal transmitter 209 controls the clamping electric cylinder 213 to contract, driving the lifting plate 212 to descend, thereby driving the rotating rod 214 to rotate, thereby driving the clamping plate 215 to slide, clamping the memory 106, and then the taking electric cylinder 201 extends, and the top bending tube 210 rises to drive the memory 106 rises together and takes four memories 106 to be tested from the conveyor belt 302; when the clamping mechanism brings the memory 106 to the top of the test mainboard 102, the lifting rod 203 and the top bending tube 210 descend, and the memory 106 is inserted into the test mainboard 102. The memory 106 previously inserted into the test mainboard 102 has been tested and taken away, and the internal signal transmitter 208 detects the sensor sheet 220, and the internal signal transmitter 208 controls the clamping electric cylinder 213 to extend, driving the lifting plate 212 to rise, thereby driving the rotating rod 214 to rotate, thereby driving the clamping plate 215 to slide, releasing the memory 106, and the memory 106 stays in the test mainboard 102, and repeats this process.

[0043] like Fig.11 , Fig.12 As shown, the conveying device includes a conveying belt 302 wound around the outside of two transmission wheels 301 , and a plurality of mating teeth 303 are provided on the conveying belt 302 , and the mating teeth 303 are meshed with the transfer gear 207 .

[0044] When the clamping mechanism for taking away the memory 106 on the conveyor belt 302 is about to reach the top of the conveyor belt 302 again, that is, after the lifting rod 203 and the clamping frame 211 rotate 270 degrees from the initial state, the lifting rod 203 starts to rise again, driving the quarter gear 205 to rise, and the quarter gear 205 and the transfer gear 207 begin to mesh. As the lifting rod 203 reaches the highest point and rotates 90 degrees, the quarter gear 205 drives the transfer gear 207 to rotate 90 degrees. The rotation drives the docking teeth 303 and the conveyor belt 302 to move forward one station, so that the next batch of memories 106 to be tested arrives under the clamping mechanism for taking away the memories 106 on the conveyor belt 302, and the memory 106 to be tested on the conveyor belt 302 is continuously placed into the test mainboard 102 for testing. Before placing the memory 106 to be tested into the test mainboard 102, the memory 106 that has been tested in the test mainboard 102 is first pulled out and placed on the conveyor belt 302.

[0045] That is, each time, the memory 106 on the test mainboard 102 that has been tested is first pulled out by the clamping mechanism for pulling out the memory 106 on the test mainboard 102. When the electric cylinder 201 is lifted and lowered next time, the clamping mechanism for picking up the memory 106 on the conveyor belt 302 inserts the memory 106 to be tested into the test mainboard 102. When the clamping mechanism for pulling out the memory 106 on the test mainboard 102 puts the memory 106 that has been tested on the conveyor belt 302, the conveyor belt 302 has not moved forward at this time, and the memory 106 that has been tested is placed at the position of the memory 106 to be tested that has been taken away. When the electric cylinder 201 is lifted and lowered next time, the conveyor belt 302 will be driven to move forward one station, so that the next round of memory 106 to be tested arrives under the clamping mechanism for picking up the memory 106 on the conveyor belt 302, and the memory 106 that has been tested is conveyed forward, and this cycle is repeated.

[0046] The working principle of a dual-duct memory test server disclosed in the present invention is as follows: the extension of the electric cylinder 201 drives the support plate 202 to rise, thereby driving the turntable 204 and the lifting rod 203 to rise, and the semi-convex ball 216 first slides along the vertical groove 217. At this time, the lifting rod 203 and the top curved tube 210 rise vertically. When the semi-convex ball 216 reaches the upper curved arc groove 218, the semi-convex ball 216 drives the lifting rod 203 and the top curved tube 210 to rotate forty-five degrees under the action of the upper curved arc groove 218. At this time, the electric cylinder 201 is in the extension state. After it grows to its longest position, the electric cylinder 201 for picking up contracts, driving the support plate 202 to descend, thereby driving the turntable 204 and the lifting rod 203 to descend, and the semi-convex ball 216 reaches the lower curved arc groove 219. Under the action of the lower curved arc groove 219, the semi-convex ball 216 drives the lifting rod 203 and the top curved tube 210 to rotate forty-five degrees, and then the lifting rod 203 and the top curved tube 210 begin to descend vertically, that is, each time the electric cylinder 201 is lifted, it first drives the lifting rod 203 and the top curved tube 210 to rise, then rotate ninety degrees and then descend. The memory 106 is inserted into the card slot of the test mainboard 102 by the taking device, and the test mainboard 102 is controlled by the server to test the memory 106. During the test, the test mainboard 102 dissipates heat through the mainboard heat sink 105, and the fan 104 is started to blow air to the air duct shell 103, thereby blowing air to dissipate heat to the mainboard heat sink 105. When the tested memory 106 is unqualified, the marking electric cylinder 108 corresponding to the unqualified memory 106 extends, driving the movable block 109 and the movable rack 110 to move, thereby driving the marking gear 111 to rotate, thereby driving the marking rack 112 and the fixed support 113 to slide inward, thereby driving the marking pen 115 to slide inward, and the memory 106 that failed the test is marked by the marking pen 115.When the clamping mechanism for pulling out the memory 106 on the test mainboard 102 reaches above the memory 106 on the test mainboard 102, the lifting rod 203 and the top bending tube 210 descend, so that the two outer memories 106 on the test mainboard 102 are respectively located between the clamping frame 211 and the clamping plate 215, and the two inner memories 106 are respectively located between the two groups of clamping plates 215. At this time, the internal signal transmitter 208 detects the sensor sheet 220, and the internal signal transmitter 208 controls the clamping electric cylinder 213 to contract, driving the lifting plate 212 to descend, thereby driving the rotating rod 214 to rotate, thereby driving the clamping plate 215 to slide, clamping the memory 106, and then the taking electric cylinder 201 extends, and the top bending tube 210 rises to drive the memory 106 to rise together , pull out and take away the four tested memories 106 from the test main board 102; when the clamping mechanism brings the memories 106 to the top of the conveyor belt 302, the lifting rod 203 and the top bending tube 210 descend, and put the tested memories 106 on the conveyor belt 302. At this time, the conveyor belt 302 has not moved since the memories 106 on it were taken away. When the external signal transmitter 209 detects the sensor sheet 220, the external signal transmitter 209 controls the clamping electric cylinder 213 to rise, driving the lifting plate 212 to rise, thereby driving the rotating rod 214 to rotate, thereby driving the clamping plate 215 to slide, releasing the memories 106, and the memories 106 stay on the conveyor belt 302, and then the lifting rod 203 and the top bending tube 210 rise, and this reciprocating cycle is repeated. When the clamping mechanism for taking away the memory 106 on the conveyor belt 302 reaches the top of the conveyor belt 302, the lifting rod 203 and the top bending tube 210 descend, so that the two outer memories 106 on the conveyor belt 302 are respectively located between the clamping frame 211 and the clamping plate 215, and the two inner memories 106 are respectively located between the two groups of clamping plates 215. At this time, the external signal transmitter 209 detects the sensor sheet 220, and the external signal transmitter 209 controls the clamping electric cylinder 213 to contract, driving the lifting plate 212 to descend, thereby driving the rotating rod 214 to rotate, thereby driving the clamping plate 215 to slide, clamping the memory 106, and then the taking electric cylinder 201 extends, and the top bending tube 210 rises to drive the memory 106 rises together and takes four memories 106 to be tested from the conveyor belt 302; when the clamping mechanism brings the memory 106 to the top of the test mainboard 102, the lifting rod 203 and the top bending tube 210 descend, and the memory 106 is inserted into the test mainboard 102. The memory 106 previously inserted into the test mainboard 102 has been tested and taken away, and the internal signal transmitter 208 detects the sensor sheet 220, and the internal signal transmitter 208 controls the clamping electric cylinder 213 to extend, driving the lifting plate 212 to rise, thereby driving the rotating rod 214 to rotate, thereby driving the clamping plate 215 to slide, releasing the memory 106, and the memory 106 stays in the test mainboard 102, and repeats this process.When the clamping mechanism for taking away the memory 106 on the conveyor belt 302 is about to reach the top of the conveyor belt 302 again, that is, after the lifting rod 203 and the clamping frame 211 rotate 270 degrees from the initial state, the lifting rod 203 starts to rise again, driving the quarter gear 205 to rise, and the quarter gear 205 and the transfer gear 207 begin to mesh. As the lifting rod 203 reaches the highest point and rotates 90 degrees, the quarter gear 205 drives the transfer gear 207 to rotate 90 degrees. The rotation drives the docking teeth 303 and the conveyor belt 302 to move forward one station, so that the next batch of memories 106 to be tested arrives under the clamping mechanism for taking away the memories 106 on the conveyor belt 302, and the memory 106 to be tested on the conveyor belt 302 is continuously placed into the test mainboard 102 for testing. Before placing the memory 106 to be tested into the test mainboard 102, the memory 106 that has been tested in the test mainboard 102 is first pulled out and placed on the conveyor belt 302. That is, each time, the memory 106 on the test mainboard 102 that has been tested is first pulled out by the clamping mechanism for pulling out the memory 106 on the test mainboard 102. When the electric cylinder 201 is lifted and lowered next time, the clamping mechanism for picking up the memory 106 on the conveyor belt 302 inserts the memory 106 to be tested into the test mainboard 102. When the clamping mechanism for pulling out the memory 106 on the test mainboard 102 puts the memory 106 that has been tested on the conveyor belt 302, the conveyor belt 302 has not moved forward at this time, and the memory 106 that has been tested is placed at the position of the memory 106 to be tested that has been taken away. When the electric cylinder 201 is lifted and lowered next time, the conveyor belt 302 will be driven to move forward one station, so that the next round of memory 106 to be tested arrives under the clamping mechanism for picking up the memory 106 on the conveyor belt 302, and the memory 106 that has been tested is conveyed forward, and this cycle is repeated.

[0047] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A dual-air duct memory test server, comprising a test device, characterized in that: The testing device comprises a bottom box (101), the testing device is used to test a memory, two picking devices and two conveying devices are arranged on the testing device, the picking device comprises a picking electric cylinder (201), the picking electric cylinder (201) is fixedly mounted in the bottom box (101), the picking device is used to place the memory on the testing device, the conveying device comprises two transmission wheels (301), the transmission wheels (301) are rotatably mounted on the bottom box (101), and the conveying device is used to convey the memory to be tested and the memory after the test; The testing device comprises a testing mainboard (102) fixedly mounted on a bottom box (101), an air duct shell (103) fixedly mounted on the bottom box (101), two mainboard heat sinks (105) fixedly mounted on the testing mainboard (102), the air duct shell (103) being divided into two air ducts, the air ducts being separated from the two mainboard heat sinks (105), a fan (104) fixedly mounted in the bottom box (101), the upper part of the testing mainboard (102) being divided into two sides by the air duct shell (103), four memory chips (106) being inserted into each side through a card slot, a server being arranged on the testing mainboard (102), and the testing mainboard (102) being controlled by the server to test the memory chips (106); The bottom box (101) is provided with eight marking mechanisms, which are respectively located in front of the eight memory cells (106). The marking mechanisms include a marking electric cylinder (108) fixedly mounted on the bottom box (101), a movable block (109) fixedly mounted on the top of the marking electric cylinder (108), a movable rack (110) fixedly mounted on the movable block (109), a marking gear (111) rotatably mounted on the air duct housing (103), a support block (107) fixedly mounted on the air duct housing (103), the movable rack (110) meshing with the marking gear (111), and the marking gear (111) A marking rack (112) is meshed on the upper portion, a fixed support (113) is fixedly mounted on the marking rack (112), a rotating cover (114) is rotatably mounted on the fixed support (113), a marking pen (115) is clamped between the fixed support (113) and the rotating cover (114), the rotating cover (114) and the fixed support (113) are connected by a buckle, the marking pen (115) is slidably mounted on the air duct shell (103), and the marking pen (115) is slidably mounted on the support block (107), and when the marking pen (115) needs to be replaced, the rotating cover (114) is opened to replace the marking pen (115).

2. A dual-air duct memory test server according to claim 1, characterized in that: The picking device comprises a support plate (202) fixedly mounted on the top of the picking electric cylinder (201); an inner grooved cylinder (206) fixedly mounted on the bottom box (101); a lifting rod (203) rotatably mounted on the air duct shell (103); the lifting rod (203) can slide in the air duct shell (103); a turntable (204) and a quarter gear (205) are fixedly mounted on the lifting rod (203); the turntable (204) is rotatably mounted on the support plate (202); and a transfer gear (207) is rotatably mounted on the bottom box (101).

3. A dual-air duct memory test server according to claim 2, characterized in that: An inner signal transmitter (208) is fixedly mounted on the air duct shell (103), and an outer signal transmitter (209) is fixedly mounted on the inner corrugated cylinder (206).

4. The dual-air duct memory test server according to claim 2, characterized in that: The lifting rod (203) is provided with two clamping mechanisms, one clamping mechanism is used to remove the memory (106) on the conveying device and insert the memory (106) into the test mainboard (102), and the other clamping mechanism is used to pull out the tested memory (106) in the test mainboard (102) and place the tested memory (106) on the conveyor belt (302). The clamping mechanism includes a top bending pipe (210) fixedly mounted on the lifting rod (203) ), a clamping frame (211) is fixedly mounted on the top bending pipe (210), a clamping electric cylinder (213) is fixedly mounted on the clamping frame (211), a lifting plate (212) is fixedly mounted on the top of the clamping electric cylinder (213), a rotating rod (214) is rotatably mounted on the lifting plate (212), six clamping plates (215) are slidably mounted on the clamping frame (211), the rotating rod (214) and the clamping plates (215) are rotatably mounted, and an induction sheet (220) is fixedly mounted on the clamping frame (211).

5. The dual-air duct memory test server according to claim 2, characterized in that: The lifting rod (203) is provided with four semi-convex balls (216), and the inner groove cylinder (206) is provided with four vertical grooves (217), an upper curved groove (218) and a lower curved groove (219). The semi-convex balls (216) slide in the vertical grooves (217), the upper curved grooves (218) and the lower curved grooves (219).

6. The dual-air duct memory test server according to claim 2, characterized in that: The conveying device comprises a conveying belt (302) wound around the outside of two transmission wheels (301), and a plurality of mating teeth (303) are arranged on the conveying belt (302), and the mating teeth (303) mesh with the transfer gear (207).

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