A method and system for adjusting parameters of main microscope of surgical microscope

Abstract

The present invention provides a method and system for adjusting parameters of a main microscope of a surgical microscope, belonging to the technical field of medical devices, and specifically comprising: taking parameters of a main microscope of the surgical microscope as adjustment objects, combining the adjustment objects to generate a plurality of alternative adjustment schemes, determining adjustment reliability coefficients under different alternative adjustment schemes and reliable adjustment schemes by using historical adjustment results, determining deviations between real-time parameters of the main microscope and adjustment targets of the reliable adjustment schemes, determining an optimal adjustment scheme by combining similarities between adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes and the adjustment reliability coefficients, adjusting parameters of the main microscope by using the optimal adjustment scheme, and ensuring efficiency and accuracy of parameter adjustment of the main microscope.

Description

Technical Field

[0001] The present invention belongs to the technical field of medical devices, and in particular relates to a method and system for adjusting parameters of a main microscope of a surgical microscope. Background Art

[0002] Surgical microscopes are widely used in specific types of surgeries, such as capillary suture and myopia surgery. At the same time, the parameters of the main microscope of the surgical microscope, such as magnification, resolution, numerical aperture, working distance, etc., will affect the accuracy of the surgical operation. Therefore, in the patent application CN202222114036.5 "A surgical microscope head with a touch operation panel", the parameters of the surgical microscope are adjusted by manual settings to avoid parameter deviations and affect the accuracy of the surgical operation.

[0003] However, it is not difficult to find out through analysis that during the operation, the surgical operator manually adjusts the parameters of the surgical microscope, which causes the operation time to be too long and also makes it difficult to meet the accuracy requirements of the parameter adjustment of the surgical microscope. Therefore, how to achieve automatic adjustment of the parameters of the surgical microscope has become a technical problem that needs to be solved urgently.

[0004] In view of the above technical problems, the present invention provides a method and system for adjusting parameters of a main microscope of a surgical microscope. Summary of the invention

[0005] To achieve the purpose of the present invention, the present invention adopts the following technical solutions:

[0006] According to one aspect of the present invention, a method for adjusting parameters of a main microscope of a surgical microscope is provided.

[0007] A method for adjusting parameters of a main microscope of a surgical microscope, specifically comprising:

[0008] S1 divides the position types of the focus position and other positions in the monitoring image of the surgical microscope by using the surgical operation type, and when it is determined that the focus state of the monitoring image of the surgical microscope meets the requirements based on the defocus data of different position types in the monitoring image of the surgical operator during the operation, proceeds to the next step;

[0009] S2 determines the image clarity data of the concerned position in different monitoring images, and when it is determined that the image feature clarity of the concerned position does not meet the requirement based on the image clarity data and the image size of the concerned position, proceeds to the next step;

[0010] S3: taking the parameters of the main microscope of the surgical microscope as adjustment objects, combining the adjustment objects to generate multiple alternative adjustment schemes, and determining the adjustment reliability coefficients under different alternative adjustment schemes and reliable adjustment schemes by using historical adjustment results;

[0011] S4 determines the deviation between the real-time parameters of the main microscope and the adjustment targets of the reliable adjustment scheme, and determines the optimal adjustment scheme based on the similarity of the adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes as well as the adjustment reliability coefficient, and uses the optimal adjustment scheme to adjust the parameters of the main microscope.

[0012] The beneficial effects of the present invention are:

[0013] 1. In the present invention, based on the defocus data of different positions and types in the monitoring image of the surgical operator during the operation, it is determined whether the focus state of the monitoring image of the surgical microscope meets the requirements, thereby achieving accurate evaluation of the focus state of the monitoring image from the perspective of the defocus situation of the monitoring image, and then achieving accurate identification of the monitoring image with abnormal focus, and also laying the foundation for differentiated determination of whether to automatically start the adjustment of the parameters of the main microscope.

[0014] 2. In the present invention, the deviation of the real-time parameters of the main microscope, the similarity with the adjustment targets of other reliable adjustment schemes, and the adjustment reliability coefficient are comprehensively considered to determine the optimal adjustment scheme. Not only the impact of the deviation from the real-time parameters on the difficulty of adjustment processing of the reliable adjustment scheme is considered, but also the similarity with the adjustment targets of other reliable adjustment schemes is further considered. This is also to further achieve a comprehensive consideration of the difficulty of switching to other reliable adjustment schemes when the adjustment result cannot meet the requirements, thereby ensuring the accuracy and reliability of the results of determining the optimal adjustment scheme.

[0015] A further technical solution is to divide the position types of the focus position and other positions in the monitoring image of the surgical microscope, specifically including:

[0016] The surgical operation type is used to determine the surgical operation object corresponding to the surgical operation type, and the position corresponding to the surgical operation object in the monitoring image is used as the focus position, and other positions in the monitoring image except the focus position are used as other positions.

[0017] A further technical solution is that the defocus data includes defocus states of corresponding positions of different position types in the monitoring image.

[0018] A further technical solution is that the parameters of the main microscope include magnification, resolution, numerical aperture, and working distance.

[0019] A further technical solution is that the method for determining the reliable adjustment scheme is:

[0020] Determine defocus data and image clarity of different historical adjustment times under different alternative adjustment schemes according to the historical adjustment results, and determine the number of defocus problem adjustments in the historical adjustment times by using the defocus data, and determine the defocus problem value of the alternative adjustment scheme based on the number of defocus problem adjustments;

[0021] Determining the number of clarity defects in the historical adjustment times based on the image clarity of different historical adjustment times, and determining the clarity adjustment evaluation amount of the alternative adjustment scheme in combination with the average value of the image clarity of different historical adjustment times;

[0022] The out-of-focus problem value and the clarity adjustment evaluation amount are used to determine the adjustment reliability coefficient of the alternative adjustment scheme, and the reliable adjustment scheme is determined based on the adjustment reliability coefficient.

[0023] Determine the deviation between the real-time parameters of different dimensions of the main microscope and the adjustment targets of the reliable adjustment scheme, and determine the difficulty of adjusting the parameters of different reliable adjustment schemes in combination with the difficulty of adjusting the real-time parameters of different dimensions;

[0024] Determining the difficulty of switching the reliable adjustment scheme to other reliable adjustment schemes based on similarities between adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes;

[0025] Based on the parameter adjustment difficulty, the switching processing difficulty and the adjustment reliability coefficient, the scheme adaptation coefficients of different reliable adjustment schemes are determined, and the optimal adjustment scheme is determined using the scheme adaptation coefficients.

[0026] A further technical solution is to use the reliable adjustment solution with the largest solution adaptation coefficient as the optimal adjustment solution.

[0027] In a second aspect, the present invention provides a computer system comprising: a memory and a processor that are communicatively connected, and a computer program stored in the memory and capable of running on the processor, wherein the processor executes the above-mentioned method for adjusting the main microscope parameters of a surgical microscope when running the computer program.

[0028] Other features and advantages will be described in the following description. The objects and other advantages of the present invention are realized and obtained by the structures particularly pointed out in the description and drawings.

[0029] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The above and other features and advantages of the present invention will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings.

[0031] Figure 1 It is a flow chart of a method for adjusting parameters of a main microscope of a surgical microscope;

[0032] Figure 2 is a flow chart of a method for determining whether a focus state of a monitoring image of a surgical microscope meets requirements;

[0033] Figure 3 is a flow chart of a method for determining a basic focus state value of a monitoring image;

[0034] Figure 4 is a flow chart of a method for determining a significant defect period;

[0035] Figure 5 is a flow chart of a method for determining a reliable adjustment solution;

[0036] Figure 6 It is a framework diagram of a computer system. DETAILED DESCRIPTION

[0037] In order to enable those skilled in the art to better understand the technical solutions in this specification, the technical solutions in the embodiments of this specification will be clearly and completely described below in conjunction with the drawings in the embodiments of this specification. Obviously, the described embodiments are only part of the embodiments of this specification, not all of the embodiments. Based on the embodiments of this specification, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of this specification.

[0038] Example 1

[0039] To solve the above problems, according to one aspect of the present invention, Figure 1 As shown, a method for adjusting parameters of a main microscope of a surgical microscope is provided, which specifically includes:

[0040] S1 divides the position types of the focus position and other positions in the monitoring image of the surgical microscope by using the surgical operation type, and when it is determined that the focus state of the monitoring image of the surgical microscope meets the requirements based on the defocus data of different position types in the monitoring image of the surgical operator during the operation, proceeds to the next step;

[0041] Furthermore, the position types of the focus position and other positions in the monitoring image of the surgical microscope are divided, specifically including:

[0042] The surgical operation type is used to determine the surgical operation object corresponding to the surgical operation type, and the position corresponding to the surgical operation object in the monitoring image is used as the focus position, and other positions in the monitoring image except the focus position are used as other positions.

[0043] It can be understood that the defocus data includes the defocus states of corresponding positions of different position types in the monitoring image.

[0044] Specifically, Figure 2 As shown, determining whether the focus state of the monitoring image of the surgical microscope meets the requirements specifically includes:

[0045] Determine a monitoring image with a defocus situation according to the defocus data, and use it as a defocus monitoring image, and perform defocus monitoring images with a defocus situation at a focus position and defocus monitoring images with a defocus situation at other positions based on defocus data of different position types in different defocus monitoring images;

[0046] Determine the basic focus state value of the monitoring image by using the ratio of the number of out-of-focus monitoring images with out-of-focus conditions at the focus position and the ratio of the number of out-of-focus monitoring images with out-focus conditions at other positions;

[0047] Determine the continuous defocus period by the time corresponding to different defocus monitoring images, and determine the defocus duration value of the monitoring image by using the duration ratio of the continuous defocus period;

[0048] The focus state value of the monitoring image is determined based on the defocus persistence state value and the basic focus state value of the monitoring image, and the focus state value is used to determine whether the focus state of the monitoring image of the surgical microscope meets the requirements.

[0049] Further, such as Figure 3 As shown, the method for determining the basic focus state value of the monitoring image is:

[0050] The proportion of the out-of-focus monitoring images in which the focus position is out-of-focus is used as the focus state value of the focus position;

[0051] The proportion of the out-of-focus monitoring images in the other positions that are out-of-focus is used as the focus state value of the other positions;

[0052] The basic focus state value of the monitoring image is determined by using the focus state value of the attention position and the weight sum of the state values ​​of other positions.

[0053] It can be understood that when the focus state value is not within the preset range, it is determined that the focus state of the monitoring image of the surgical microscope does not meet the requirement.

[0054] Furthermore, when the focus state of the monitoring image does not meet the requirements, a reliable adjustment solution is directly determined.

[0055] It should also be noted that determining whether the focus state of the monitoring image of the surgical microscope meets the requirements specifically includes:

[0056] Determine a monitoring image with a defocus situation according to the defocus data, and use it as a defocus monitoring image, and perform defocus monitoring images with a defocus situation at a focus position and defocus monitoring images with a defocus situation at other positions based on defocus data of different position types in different defocus monitoring images;

[0057] Using the out-of-focus monitoring image in which the focus position has an out-of-focus condition as the focus position out-of-focus image, and determining the longest duration of the focus position out-of-focus image according to the corresponding time of the focus position out-of-focus image;

[0058] The longest duration is used to determine whether the focus state of the monitoring image of the surgical microscope meets the requirements.

[0059] It should also be noted that determining whether the focus state of the monitoring image of the surgical microscope meets the requirements specifically includes:

[0060] S11 determines the monitoring images with out-of-focus conditions according to the out-of-focus data, and uses them as out-of-focus monitoring images, and determines whether the number of the out-of-focus monitoring images is less than the preset number of monitoring images. If so, proceed to the next step; if not, proceed to step S14;

[0061] S12: based on the defocus data of different position types in different defocus monitoring images, defocus monitoring images with defocus conditions at the focus position and defocus monitoring images with defocus conditions at other positions are obtained, and the defocus monitoring images with defocus conditions at the focus position are used as defocus images at the focus position, and it is determined whether the number of defocus images at the focus position meets the requirement; if so, it is determined that the focus state of the monitoring image of the surgical microscope meets the requirement; if not, the process proceeds to the next step;

[0062] S13 determines the longest duration of the defocused image at the focus position according to the corresponding moment of the defocused image at the focus position, and judges whether the longest duration of the focused image at the focus position meets the requirement. If so, determines that the focus state of the monitoring image of the surgical microscope meets the requirement. If not, proceeds to the next step.

[0063] S14 determines the basic focus state value of the monitoring image by using the proportion of the number of defocus monitoring images with defocus conditions at the focus position and the proportion of the number of defocus monitoring images with defocus conditions at other positions, determines the continuous defocus period by the time points corresponding to different defocus monitoring images, and determines the defocus duration state value of the monitoring image by using the proportion of the duration of the continuous defocus period;

[0064] S15 determines the focus state value of the monitoring image based on the defocus persistence state value and the basic focus state value of the monitoring image, and uses the focus state value to determine whether the focus state of the monitoring image of the surgical microscope meets the requirements.

[0065] S2 determines the image clarity data of the concerned position in different monitoring images, and when it is determined that the image feature clarity of the concerned position does not meet the requirement based on the image clarity data and the image size of the concerned position, proceeds to the next step;

[0066] It can be understood that the image clarity data of the focus position includes the image clarity of different organs of the surgical operation object corresponding to the focus position.

[0067] Further, determining that the image feature clarity of the focus position does not meet the requirement specifically includes:

[0068] Determine the image clarity of the focus position in different monitoring images according to the image clarity data of the focus position in different monitoring images, and determine the image feature significance of the focus position in different monitoring images in combination with the image size of the focus position in different monitoring images;

[0069] The image feature significance is used to determine the significant defect image in the monitoring image, and whether the image feature of the focus position meets the requirement is determined according to the proportion of the significant defect images.

[0070] Specifically, when the significance of the image feature of the monitoring image is less than a preset significance threshold, it is determined that the monitoring image is a significant defect image.

[0071] It should be noted that, when the proportion of the number of the significant defect images does not meet the requirement, it is determined that the image feature clarity of the focus position does not meet the requirement.

[0072] It should also be noted that determining that the image feature clarity of the focus position does not meet the requirement specifically includes:

[0073] Determine the image clarity of the focus position in different monitoring images according to the image clarity data of the focus position in different monitoring images, and determine the image feature significance of the focus position in different monitoring images in combination with the image size of the focus position in different monitoring images;

[0074] Determine a significant defect image in the monitoring image by using the image feature significance, and determine a significant defect period according to the distribution time of the significant defect image;

[0075] Whether the image feature of the focus position meets the requirement is determined according to the duration ratio of the significant defect period.

[0076] Specifically, Figure 4 As shown, the method for determining the significant defect period is:

[0077] Determine the interval durations between different significant defect images according to the distribution moments of different significant defect images, and regard significant defect images with an interval duration shorter than a preset interval duration as adjacent defect images;

[0078] The adjacent defect images are divided into different significant defect time periods according to the proximity relationship between the adjacent defect images.

[0079] It should also be noted that determining that the image feature clarity of the focus position does not meet the requirement specifically includes:

[0080] S21 determines the image clarity of the focus position in different monitoring images according to the image clarity data of the focus position in different monitoring images, and determines the image feature significance of the focus position in different monitoring images in combination with the image size of the focus position in different monitoring images, and judges whether the image feature significance of the focus position in different monitoring images meets the requirements, if so, proceeds to the next step, if not, determines that the image feature clarity of the focus position does not meet the requirements;

[0081] S22 determines the significant defect images in the monitoring image by using the image feature significance, and judges whether the number of the significant defect images meets the requirement, if yes, proceeds to the next step, if no, proceeds to step S25;

[0082] S23 determines the significant defect period according to the distribution time of the significant defect image, and judges whether the duration ratio of the significant defect period meets the requirement, if yes, proceeds to the next step, if no, proceeds to step S25;

[0083] S24 determines whether the longest duration of the significant defect period meets the requirement. If so, the image feature clarity of the focus position meets the requirement. If not, proceed to the next step.

[0084] S25: determining the significance evaluation amount of the monitoring image by using the number of significant defect images in the monitoring image and the significance of image features of different significant defect images, and determining the significance period abnormal value of the monitoring image according to the duration proportion of the significant defect period and the duration of different significant defect periods;

[0085] S26 determines the clarity evaluation value of the focus position according to the significance period abnormal value of the monitoring image and the significance evaluation value of the monitoring image, and uses the clarity evaluation value to determine whether the image feature clarity of the focus position meets the requirements.

[0086] S3: taking the parameters of the main microscope of the surgical microscope as adjustment objects, combining the adjustment objects to generate multiple alternative adjustment schemes, and determining the adjustment reliability coefficients under different alternative adjustment schemes and reliable adjustment schemes by using historical adjustment results;

[0087] It can be understood that the parameters of the main microscope include magnification, resolution, numerical aperture, and working distance.

[0088] Specifically, Figure 5 As shown, the method for determining the reliable adjustment scheme is:

[0089] Determine defocus data and image clarity of different historical adjustment times under different alternative adjustment schemes according to the historical adjustment results, and determine the number of defocus problem adjustments in the historical adjustment times by using the defocus data, and determine the defocus problem value of the alternative adjustment scheme based on the number of defocus problem adjustments;

[0090] Determining the number of clarity defects in the historical adjustment times based on the image clarity of different historical adjustment times, and determining the clarity adjustment evaluation amount of the alternative adjustment scheme in combination with the average value of the image clarity of different historical adjustment times;

[0091] The out-of-focus problem value and the clarity adjustment evaluation amount are used to determine the adjustment reliability coefficient of the alternative adjustment scheme, and the reliable adjustment scheme is determined based on the adjustment reliability coefficient.

[0092] Furthermore, when the adjustment reliability coefficient of the alternative adjustment scheme meets the requirement, the alternative adjustment scheme is determined to be a reliable adjustment scheme.

[0093] It should also be noted that the method for determining the reliable adjustment scheme is:

[0094] S31 determines the defocus data and image clarity of different historical adjustment times under different alternative adjustment schemes according to the historical adjustment results, and determines the proportion of monitoring images with defocus conditions in the historical adjustment times by using the defocus data, and judges whether the proportion of monitoring images with defocus conditions meets the requirements, if so, proceeds to step S33, if not, proceeds to the next step;

[0095] S32 uses the defocus data to determine the number of defocus problem adjustments in the historical adjustment times, and judges whether the number of defocus problem adjustments meets the requirements. If so, proceed to the next step; if not, determine that the alternative adjustment scheme does not belong to a reliable adjustment scheme;

[0096] S33 determines the proportion of monitoring images with defective image clarity in the historical adjustment times based on the image clarity of different historical adjustment times, and judges whether the proportion of monitoring images with defective image clarity meets the requirement, if yes, proceeds to step S35, if no, proceeds to the next step;

[0097] S34: determining the number of clarity defects in the historical adjustment times based on the image clarity of different historical adjustment times, and judging whether the number of clarity defects meets the requirement, if so, proceeding to the next step, if not, determining that the alternative adjustment scheme does not belong to a reliable adjustment scheme;

[0098] S35: determining the defocus problem value of the alternative adjustment scheme according to the number of defocus problem adjustments and the proportion of the monitoring images with defocus conditions in different defocus problem adjustment numbers, determining the number of clarity defects in the historical adjustment numbers based on the image clarity of different historical adjustment numbers, and determining the clarity adjustment evaluation amount of the alternative adjustment scheme in combination with the average value of the image clarity of different historical adjustment numbers;

[0099] S36 determines the adjustment reliability coefficient of the alternative adjustment scheme by using the out-of-focus problem value and the clarity adjustment evaluation value, and determines the reliable adjustment scheme according to the adjustment reliability coefficient.

[0100] S4 determines the deviation between the real-time parameters of the main microscope and the adjustment targets of the reliable adjustment scheme, and determines the optimal adjustment scheme based on the similarity of the adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes as well as the adjustment reliability coefficient, and uses the optimal adjustment scheme to adjust the parameters of the main microscope.

[0101] Furthermore, the method for determining the optimal adjustment scheme is:

[0102] Determine the deviation between the real-time parameters of different dimensions of the main microscope and the adjustment targets of the reliable adjustment scheme, and determine the difficulty of adjusting the parameters of different reliable adjustment schemes in combination with the difficulty of adjusting the real-time parameters of different dimensions;

[0103] Determining the difficulty of switching the reliable adjustment scheme to other reliable adjustment schemes based on similarities between adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes;

[0104] Based on the parameter adjustment difficulty, the switching processing difficulty and the adjustment reliability coefficient, the scheme adaptation coefficients of different reliable adjustment schemes are determined, and the optimal adjustment scheme is determined using the scheme adaptation coefficients.

[0105] It can be understood that the reliable adjustment scheme with the largest scheme adaptation coefficient is taken as the optimal adjustment scheme.

[0106] It should also be noted that the method for determining the optimal adjustment scheme is:

[0107] Determine the deviation between the real-time parameters of different dimensions of the main microscope and the adjustment targets of the reliable adjustment scheme, and use the deviation to determine the deviation adjustment targets, and judge whether the number of the deviation adjustment targets meets the requirements. If so, proceed to the next step; if not, determine that the reliable adjustment scheme does not belong to the optimal adjustment scheme;

[0108] Determine other reliable adjustment schemes similar to the reliable adjustment scheme based on similarities between adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes, and judge whether the number of the other similar reliable adjustment schemes meets the requirement, if yes, proceed to the next step, if no, determine that the reliable adjustment scheme does not belong to the optimal adjustment scheme;

[0109] Determine the deviation between the real-time parameters of different dimensions of the main microscope and the adjustment targets of the reliable adjustment scheme, and determine the parameter adjustment difficulty of different reliable adjustment schemes in combination with the adjustment processing difficulty of the real-time parameters of different dimensions, and judge whether the parameter adjustment difficulty of the reliable adjustment scheme meets the requirements. If so, proceed to the next step; if not, determine that the reliable adjustment scheme does not belong to the optimal adjustment scheme;

[0110] Determine the difficulty of switching the reliable adjustment scheme to other reliable adjustment schemes based on the similarity of the adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes, and judge whether the switching difficulty meets the requirement, if so, proceed to the next step, if not, determine that the reliable adjustment scheme does not belong to the optimal adjustment scheme;

[0111] Based on the parameter adjustment difficulty, the switching processing difficulty and the adjustment reliability coefficient, the scheme adaptation coefficients of different reliable adjustment schemes are determined, and the optimal adjustment scheme is determined using the scheme adaptation coefficients.

[0112] Example 2

[0113] Second, as Figure 6 As shown, the present invention provides a computer system, comprising: a memory and a processor that are communicatively connected, and a computer program stored in the memory and capable of running on the processor, wherein the processor executes the above-mentioned method for adjusting the main microscope parameters of a surgical microscope when running the computer program.

[0114] The above-mentioned method for adjusting the parameters of the main microscope of a surgical microscope specifically includes:

[0115] Determine a monitoring image with a defocus situation according to the defocus data, and use it as a defocus monitoring image, and perform defocus monitoring images with a defocus situation at a focus position and defocus monitoring images with a defocus situation at other positions based on defocus data of different position types in different defocus monitoring images;

[0116] Determine the basic focus state value of the monitoring image by using the ratio of the number of out-of-focus monitoring images with out-of-focus conditions at the focus position and the ratio of the number of out-of-focus monitoring images with out-focus conditions at other positions;

[0117] Determine the continuous defocus period by the time corresponding to different defocus monitoring images, and determine the defocus duration value of the monitoring image by using the duration ratio of the continuous defocus period;

[0118] Determining the focus state value of the monitoring image based on the defocus persistence state value and the basic focus state value of the monitoring image, and when determining by using the focus state value that the focus state of the monitoring image of the surgical microscope meets the requirements, proceeding to the next step;

[0119] Determine image clarity data of the focus position in different monitoring images, and when it is determined that the image feature clarity of the focus position does not meet the requirement based on the image clarity data and the image size of the focus position, proceed to the next step;

[0120] Taking the parameters of the main microscope of the surgical microscope as adjustment objects, combining the adjustment objects to generate multiple alternative adjustment schemes, and using historical adjustment results to determine adjustment reliability coefficients under different alternative adjustment schemes and reliable adjustment schemes;

[0121] Determine the deviation between the real-time parameters of different dimensions of the main microscope and the adjustment targets of the reliable adjustment scheme, and use the deviation to determine the deviation adjustment targets, and judge whether the number of the deviation adjustment targets meets the requirements. If so, proceed to the next step; if not, determine that the reliable adjustment scheme does not belong to the optimal adjustment scheme;

[0122] Determine other reliable adjustment schemes similar to the reliable adjustment scheme based on similarities between adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes, and judge whether the number of the other similar reliable adjustment schemes meets the requirement, if yes, proceed to the next step, if no, determine that the reliable adjustment scheme does not belong to the optimal adjustment scheme;

[0123] Determine the deviation between the real-time parameters of different dimensions of the main microscope and the adjustment targets of the reliable adjustment scheme, and determine the parameter adjustment difficulty of different reliable adjustment schemes in combination with the adjustment processing difficulty of the real-time parameters of different dimensions, and judge whether the parameter adjustment difficulty of the reliable adjustment scheme meets the requirements. If so, proceed to the next step; if not, determine that the reliable adjustment scheme does not belong to the optimal adjustment scheme;

[0124] Determine the difficulty of switching the reliable adjustment scheme to other reliable adjustment schemes based on the similarity of the adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes, and judge whether the switching difficulty meets the requirement, if so, proceed to the next step, if not, determine that the reliable adjustment scheme does not belong to the optimal adjustment scheme;

[0125] Based on the parameter adjustment difficulty, the switching processing difficulty and the adjustment reliability coefficient, the scheme adaptation coefficients of different reliable adjustment schemes are determined, and the optimal adjustment scheme is determined using the scheme adaptation coefficients.

[0126] Through the above technical solution, the present invention achieves the following beneficial effects:

[0127] 1. In the present invention, based on the defocus data of different positions and types in the monitoring image of the surgical operator during the operation, it is determined whether the focus state of the monitoring image of the surgical microscope meets the requirements, thereby achieving accurate evaluation of the focus state of the monitoring image from the perspective of the defocus situation of the monitoring image, and then achieving accurate identification of the monitoring image with abnormal focus, and also laying the foundation for differentiated determination of whether to automatically start the adjustment of the parameters of the main microscope.

[0128] 2. In the present invention, the deviation of the real-time parameters of the main microscope, the similarity with the adjustment targets of other reliable adjustment schemes, and the adjustment reliability coefficient are comprehensively considered to determine the optimal adjustment scheme. Not only the impact of the deviation from the real-time parameters on the difficulty of adjustment processing of the reliable adjustment scheme is considered, but also the similarity with the adjustment targets of other reliable adjustment schemes is further considered. This is also to further achieve a comprehensive consideration of the difficulty of switching to other reliable adjustment schemes when the adjustment result cannot meet the requirements, thereby ensuring the accuracy and reliability of the results of determining the optimal adjustment scheme.

[0129] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device, equipment, and non-volatile computer storage medium embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0130] The above is a description of a specific embodiment of the specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0131] The above description is only one or more embodiments of this specification and is not intended to limit this specification. For those skilled in the art, one or more embodiments of this specification may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of one or more embodiments of this specification shall be included in the scope of the claims of this specification.

Claims

1. A method for adjusting parameters of a main microscope of a surgical microscope, characterized in that: Specifically include: The surgical operation type is used to divide the position types of the focus position and other positions in the monitoring image of the surgical microscope, and based on the defocus data of different position types in the monitoring image of the surgical operator during the operation, when it is determined that the focus state of the monitoring image of the surgical microscope meets the requirements, the next step is entered; Determine image clarity data of the concerned position in different monitoring images, and proceed to the next step when it is determined that the image feature clarity of the concerned position does not meet the requirement based on the image clarity data and the image size of the concerned position; Taking the parameters of the main microscope of the surgical microscope as adjustment objects, combining the adjustment objects to generate multiple alternative adjustment schemes, and using historical adjustment results to determine adjustment reliability coefficients under different alternative adjustment schemes and reliable adjustment schemes; Determine the deviation between the real-time parameters of the main microscope and the adjustment target of the reliable adjustment scheme, determine the optimal adjustment scheme based on the similarity of the adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes and the adjustment reliability coefficient, and use the optimal adjustment scheme to adjust the parameters of the main microscope; The method for determining the reliable adjustment scheme is: Determine defocus data and image clarity of different historical adjustment times under different alternative adjustment schemes according to the historical adjustment results, and determine the number of defocus problem adjustments in the historical adjustment times by using the defocus data, and determine the defocus problem value of the alternative adjustment scheme based on the number of defocus problem adjustments; Determining the number of clarity defects in the historical adjustment times based on the image clarity of different historical adjustment times, and determining the clarity adjustment evaluation amount of the alternative adjustment scheme in combination with the average value of the image clarity of different historical adjustment times; The out-of-focus problem value and the clarity adjustment evaluation amount are used to determine the adjustment reliability coefficient of the alternative adjustment scheme, and the reliable adjustment scheme is determined based on the adjustment reliability coefficient.

2. The method for adjusting parameters of a main microscope of a surgical microscope according to claim 1, characterized in that: The position types of the focus position and other positions in the monitoring image of the surgical microscope are divided, specifically including: The surgical operation type is used to determine the surgical operation object corresponding to the surgical operation type, and the position corresponding to the surgical operation object in the monitoring image is used as the focus position, and other positions in the monitoring image except the focus position are used as other positions.

3. The method for adjusting parameters of a main microscope of a surgical microscope according to claim 1, characterized in that: The defocus data includes defocus states of corresponding positions of different position types in the monitoring image.

4. The method for adjusting parameters of a main microscope of a surgical microscope according to claim 1, characterized in that: Determining whether the focus state of the monitoring image of the surgical microscope meets the requirements specifically includes: Determine a monitoring image with a defocus situation according to the defocus data, and use it as a defocus monitoring image, and perform defocus monitoring images with a defocus situation at a focus position and defocus monitoring images with a defocus situation at other positions based on defocus data of different position types in different defocus monitoring images; Determine the basic focus state value of the monitoring image by using the ratio of the number of out-of-focus monitoring images with out-of-focus conditions at the focus position and the ratio of the number of out-of-focus monitoring images with out-focus conditions at other positions; Determine the continuous defocus period by the time corresponding to different defocus monitoring images, and determine the defocus duration value of the monitoring image by using the duration ratio of the continuous defocus period; The focus state value of the monitoring image is determined based on the defocus persistence state value and the basic focus state value of the monitoring image, and the focus state value is used to determine whether the focus state of the monitoring image of the surgical microscope meets the requirements.

5. The method for adjusting parameters of a main microscope of a surgical microscope according to claim 1, characterized in that: The image clarity data of the focus position includes image clarity of different organs of a surgical operation object corresponding to the focus position.

6. The method for adjusting parameters of a main microscope of a surgical microscope according to claim 1, characterized in that: Determining that the image feature clarity of the focus position does not meet the requirement specifically includes: Determine the image clarity of the focus position in different monitoring images according to the image clarity data of the focus position in different monitoring images, and determine the image feature significance of the focus position in different monitoring images in combination with the image size of the focus position in different monitoring images; The image feature significance is used to determine the significant defect image in the monitoring image, and whether the image feature of the focus position meets the requirement is determined according to the proportion of the number of the significant defect images.

7. The method for adjusting parameters of a main microscope of a surgical microscope according to claim 6, characterized in that: When the image feature significance of the monitoring image is less than a preset significance threshold, it is determined that the monitoring image is a significant defect image.

8. The method for adjusting parameters of a main microscope of a surgical microscope according to claim 1, characterized in that: The method for determining the optimal adjustment scheme is: Determine the deviation between the real-time parameters of different dimensions of the main microscope and the adjustment targets of the reliable adjustment scheme, and determine the difficulty of adjusting the parameters of different reliable adjustment schemes in combination with the difficulty of adjusting the real-time parameters of different dimensions; Determining the difficulty of switching the reliable adjustment scheme to other reliable adjustment schemes based on similarities between adjustment targets of the reliable adjustment scheme and other reliable adjustment schemes; Based on the parameter adjustment difficulty, the switching processing difficulty and the adjustment reliability coefficient, the scheme adaptation coefficients of different reliable adjustment schemes are determined, and the optimal adjustment scheme is determined using the scheme adaptation coefficients.

9. A computer system comprising: A memory and a processor connected in communication, and a computer program stored in the memory and capable of running on the processor, characterized in that the processor executes the method for adjusting the main microscope parameters of a surgical microscope as described in any one of claims 1-8 when running the computer program.

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