Test socket

Abstract

The invention relates to a test socket, which comprises a base, an upper cover, a test unit and a reset elastic piece, and is characterized in that the test unit is arranged on the base; the upper cover is arranged on the base in a sliding mode, and the reset elastic piece is connected with the base and the upper cover. The device further comprises a locking device, the locking device comprises two abutting mechanisms and two buffering adjusting mechanisms, the two abutting mechanisms are arranged on the two opposite side walls of the base respectively, and the two buffering adjusting mechanisms are arranged on the two opposite side walls of the base respectively. The two buffer adjusting mechanisms are located between the two abutting mechanisms, and each abutting mechanism comprises a chip which is used for abutting against the test unit; the buffer adjusting mechanism can adjust the state of the abutting block and make the abutting block slowly abut against the test piece. The method has the effect of reducing the damage to the chip.

Description

Technical Field

[0001] The present application relates to the technical field of testing equipment, and in particular to a test socket. Background Art

[0002] Integrated circuits, or chips, are a form of miniaturized circuits. They are most widely used in the semiconductor industry. During the use of the chip, in order to ensure its normal function, various aspects of the chip will be tested. The test of chip aging involves the use of test sockets.

[0003] At present, a Chinese patent with publication number CN118294702A discloses a chip aging test socket, including a base, a sliding frame and a plurality of support components for elastically supporting the sliding frame are arranged in the base, a guide seat for placing the chip is fixedly arranged on the base, the guide seat is located above the sliding frame, an upper cover is clamped on the base, the upper cover is located on the circumferential periphery of the guide seat and is located above the sliding frame, and a linkage locking mechanism for cooperating with the upper cover to lock and fix the chip placed on the guide seat is arranged on the base; the linkage locking mechanism includes a locking mechanism for locking the chip on the guide seat. A clamping component for clamping the chip and a linkage component for linking the upper cover and the sliding frame, the clamping component is arranged on the opposite side walls of the base, and the linkage component is arranged on the other opposite side walls of the base; the clamping component includes a rotating seat, a rotating shaft, a clamp, a connecting block and a telescopic spring, the rotating seat is arranged on the base, the rotating shaft is rotatably arranged on the rotating seat, the clamp is fixedly connected to the rotating shaft, the connecting block is fixedly connected to the clamp, a pressing rod for pressing the connecting block is arranged on the upper cover, one end of the telescopic spring is fixedly connected to the rotating seat, and the other end of the telescopic spring is fixedly connected to the connecting block.

[0004] When the force pressing the upper cover is removed, the telescopic spring resets, causing the rotating shaft to drive the opening to rotate on the rotating seat, so that the clip is transformed into a locked state, and the clip will quickly press against the chip; when the clip moves quickly, the clip will have a certain impact force under inertia, and this impact force will cause damage to the chip. Summary of the invention

[0005] In order to reduce damage to the chip, the present application provides a test socket.

[0006] The present application provides a test socket, which adopts the following technical solution: A test socket, comprising a base, an upper cover, a test unit and a reset elastic member, wherein the test unit is arranged on the base; the upper cover is slidably arranged on the base, and the reset elastic member connects the base and the upper cover; and further comprising a locking device, wherein the locking device comprises two clamping mechanisms and two buffer adjustment mechanisms, wherein the two clamping mechanisms are respectively arranged on two opposite side walls of the base, the two buffer adjustment mechanisms are respectively arranged on two opposite side walls of the base, and the two buffer adjustment mechanisms are located between the two clamping mechanisms, and the clamping mechanism comprises a first rotating shaft, a second rotating shaft, a first connecting block, a second connecting block, a third connecting block, a third rotating shaft, a torsion spring, a second rotating shaft, a second rotating shaft, a second connecting block, a third connecting shaft ... A spring and a clamping block, the first rotating shaft is rotatably arranged on the upper cover, and the first connecting block is arranged on the first rotating shaft; the second rotating shaft is rotatably arranged on the base, one end of the second connecting block is connected to the second rotating shaft and the other end is connected to the first connecting block; the third connecting block is arranged on the first connecting block, the third rotating shaft is rotatably arranged on the third connecting block, and the clamping block is arranged on the third rotating shaft; the torsion spring is sleeved on the third rotating shaft, one end of the torsion spring is connected to the third rotating shaft and the other end is connected to the third connecting block; the buffer adjustment mechanism can adjust the state of the clamping block and make the clamping block slowly clamp the test piece.

[0007] By adopting the above technical solution, the operator presses the upper cover, and the first rotating shaft on the upper cover drives the first connecting block to move, and under the action of the second connecting block on the second rotating shaft, the first connecting block will rotate; when the first connecting block rotates, the first connecting block drives the third connecting block to rotate, and the third rotating shaft on the third connecting block drives the pressing block to move, so that the pressing block moves away from the test unit; at this time, the elastic reset member will be compressed; then the operator places the chip to be tested on the test unit; then the operator releases the upper cover, and the elastic reset member drives the upper cover to move, so that the upper cover returns to its original position; when the upper cover moves When moving in the direction of restoring the original position, the first rotating shaft on the upper cover drives the first connecting block to move, and the third connecting block on the first connecting block drives the clamping block to move, so that the clamping block moves in the direction close to the chip located on the test unit. At this time, the buffer adjustment mechanism adjusts the state of the clamping block and makes the clamping block move slowly before it contacts the chip, so that the clamping block slowly presses against the chip located on the test unit; the clamping mechanism provided in the present application can better realize the adjustment of the clamping block; the buffer adjustment mechanism provided can reduce the impact force of the clamping block when it presses against the chip; therefore, the locking device provided in the present application can reduce damage to the chip.

[0008] Optionally, the third connecting block is provided with a mounting groove and a first through hole connected to the mounting groove; two fourth connecting blocks are provided on the tightening block, the third connecting block is located between the two fourth connecting blocks, and waist-shaped holes are provided on the two fourth connecting blocks; the third rotating shaft is rotatably set in the first through hole, a part of the third rotating shaft is located in the mounting groove, and the torsion spring is sleeved on the third rotating shaft located in the mounting groove; both ends of the third rotating shaft are respectively located in the two waist-shaped holes of the two fourth connecting blocks.

[0009] By adopting the above technical solution, when the first connecting block drives the third connecting block to move, the third rotating shaft on the third connecting block drives the fourth connecting block to move, and the fourth connecting block drives the pressing block to move.

[0010] Optionally, the buffer adjustment mechanism includes a lifting block, a buffer adjustment block, a limiting block and a first spring, the lifting block is slidably arranged on the base; the buffer adjustment block is arranged on the lifting block, and a first groove is opened on the buffer adjustment block; the limiting block is arranged on the buffer adjustment block and is located in the first groove; the two clamping blocks in the two clamping mechanisms both abut against the limiting block; one end of the first spring is connected to the buffer adjustment block and the other end is connected to the base.

[0011] By adopting the above technical solution, when the clamping block moves toward the direction approaching the test unit, the two clamping blocks in the two clamping mechanisms will respectively abut against the two sides of the same limiting block in the same buffer adjustment mechanism. When the clamping block continues to move, the clamping block will drive the buffer adjustment block to move. At the same time, under the action of the buffer adjustment block, the clamping block will maintain a vertical state and abut against the chip located on the test unit. Moreover, due to the existence of the first spring, the buffer adjustment block will move slowly, thereby causing the clamping block to move slowly, thereby reducing the impact force of the clamping block on the chip.

[0012] Optionally, a limiting support block is fixedly provided on the buffer adjustment block, and an end of the fourth connecting block away from the pressing block can abut against the limiting support block.

[0013] By adopting the above technical solution, when the clamping block abuts against the buffer adjustment block, the end of the fourth connecting block away from the clamping block abuts against the limiting support block, and the limiting support block can support the fourth connecting block; and before the clamping block abuts against the buffer adjustment block, the limiting support block can limit the fourth connecting block, thereby reducing the phenomenon of excessive rotation of the fourth connecting block.

[0014] Optionally, the base is provided with a second groove for the lifting block to slide, and the base is provided with a first anti-separation mechanism connected to the upper cover and a second anti-separation mechanism connected to the lifting block; the first anti-separation mechanism includes a first anti-separation block and a second anti-separation block, the first anti-separation block is arranged on the outer side wall of the base, and the second anti-separation block is arranged on the upper cover and cooperates with the first anti-separation block; the second anti-separation mechanism includes a third anti-separation block and a fourth anti-separation block, the third anti-separation block is arranged on the lifting block; the fourth anti-separation block is arranged on the base and cooperates with the third anti-separation block.

[0015] By adopting the above technical solution, when the upper cover is in the initial position, the first anti-separation block contacts the second anti-separation block; when the operator presses the upper cover to move the upper cover, the first anti-separation block does not contact the second anti-separation block; when the pressing block does not contact the buffer adjustment block, the third anti-separation block contacts the fourth anti-separation block, and when the pressing block drives the buffer adjustment block to move, the third anti-separation block does not contact the fourth anti-separation block; the first anti-separation mechanism and the second anti-separation mechanism can improve the stability of the upper cover and the lifting block on the base.

[0016] Optionally, a locking mechanism is provided on the base, and the locking mechanism includes a locking block, a second spring, an unlocking block and a third spring; the locking block is slidably arranged on the base, and a locking groove which is engaged with the locking block is provided on the upper cover; one end of the second spring is connected to the locking block and the other end is connected to the base; a third groove which is connected to the locking groove is provided on the upper cover, the unlocking block is slidably arranged in the third groove, and the unlocking block can contact the locking block; one end of the third spring is connected to the unlocking block and the other end is connected to the upper cover.

[0017] By adopting the above technical solution, at the beginning, the locking block abuts against the upper cover, the second spring is in a compressed state, and the third spring is in a normal state; when the operator presses the upper cover to move the upper cover a certain distance and the locking block is aligned with the locking groove, the second spring restores its elastic deformation, and the elastic force of the second spring drives the locking block to move, so that the locking block is engaged with the locking groove; then the operator places the chip on the test unit, or takes the chip off the test unit; then the operator presses the unlocking block, the unlocking block abuts against the locking block in the locking groove and pushes the locking block to move, so that the locking block is no longer engaged with the locking groove, and the elastic reset piece will restore its elastic deformation, so that the upper cover returns to its original position, and the pressing block presses against the chip on the test unit; the provided locking mechanism can facilitate the operator to install or take out the chip.

[0018] Optionally, an adjustment mechanism is provided on the base, and the adjustment mechanism includes an adjustment block and a first adjustment component. A fourth groove is opened on the base, and the adjustment block is slidably set in the fourth groove, and the test unit is set on the adjustment block; the first adjustment component is set on the base, and the adjustment block and the locking block are both connected to the first adjustment component.

[0019] By adopting the above technical solution, when the locking block is engaged with the locking groove, the locking block drives the adjusting block to move through the first adjusting component, and the adjusting block drives the test unit to move, and then the operator places the chip to be tested on the test unit; when the chip is placed on the test unit, the locking block is no longer engaged with the locking groove, and the locking block drives the adjusting block to move through the first adjusting component, and the adjusting block is restored to its original position; the set adjustment mechanism makes it convenient for the operator to place the test chip on the test unit, or to take the chip off the test unit.

[0020] Optionally, a limiting mechanism is provided on the base, and the limiting mechanism includes a limiting block and a second adjustment component. The limiting block is slidably provided on the base, and the adjustment block is provided with a limiting groove that is engaged with the limiting block; the second adjustment component is provided on the base, and the upper cover and the limiting block are both connected to the second adjustment component.

[0021] By adopting the above technical solution, when the operator presses the upper cover to move the upper cover, the upper cover drives the limiting block to move through the second adjusting component, so that the limiting block is no longer engaged with the limiting groove; when the upper cover moves a certain distance, the locking block is engaged with the locking groove again, and then the adjusting block drives the test unit to rise; after the chip is placed on it; first, the locking block is no longer engaged with the locking groove, and the adjusting block drives the test unit to return to its original position; after the locking block is no longer engaged with the locking groove, the upper cover is moved again, and under the action of the second adjusting component, the limiting block is engaged with the limiting groove on the adjusting block, thereby improving the stability of the adjusting block on the base.

[0022] In summary, the present application includes at least one of the following beneficial technical effects: 1. The locking device provided in this application can reduce damage to the chip; 2. The first anti-separation mechanism and the second anti-separation mechanism can improve the stability of the upper cover and the lifting block on the base. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a schematic diagram of the structure of the test socket in Example 1 of the present application; Figure 2 This is a schematic diagram of the structure of the first anti-separation mechanism in Example 1 of the present application; Figure 3This is a schematic diagram of the structure of the base in Example 1 of the present application; Figure 4 This is a schematic diagram of the structure of the tightening mechanism in Example 1 of the present application; Figure 5 This is a schematic diagram of the structure of the buffer adjustment mechanism in Example 1 of the present application; Figure 6 This is a schematic diagram of the structure of the locking mechanism in Example 2 of the present application; Figure 7 This is a schematic diagram of the structure of the locking groove in Example 2 of the present application; Figure 8 This is a schematic diagram of the structure of the adjustment mechanism in Example 2 of the present application.

[0024] Figure numerals: 11, base; 111, second groove; 12, upper cover; 121, locking groove; 13, reset elastic member; 14, synchronization block; 2, locking device; 3, tightening mechanism; 31, first rotating shaft; 32, second rotating shaft; 33, first connecting block; 34, second connecting block; 35, third connecting block; 351, mounting groove; 36, third rotating shaft; 37, tightening block; 371, sliding cavity; 38, fourth connecting block; 381, waist-shaped hole; 4, buffer adjustment mechanism; 41, lifting block; 42, buffer adjustment block; 421, first groove; 43, limiting block; 44, first spring; 45, limiting supporting block; 5, first anti-separation mechanism; 51, first anti-separation block; 52 , the second anti-separation block; 61, the third anti-separation block; 62, the fourth anti-separation block; 7, the locking mechanism; 71, the locking block; 72, the second spring; 73, the unlocking block; 74, the third spring; 75, the slider; 8, the adjusting mechanism; 81, the adjusting block; 821, the first rack; 822, the first adjusting shaft; 823, the first gear; 824, the second rack; 825, the second gear; 826, the third gear; 827, the transmission gear; 9, the limiting mechanism; 91, the limiting block; 92, the second adjusting assembly; 921, the support block; 922, the fifth spring; 923, the third rack; 924, the second adjusting shaft; 925, the fourth gear; 926, the fifth gear; 927, the fourth rack. DETAILED DESCRIPTION

[0025] The following is combined with Figure 1-8 This application is described in further detail.

[0026] Example 1 An embodiment of the present application discloses a test socket.

[0027] refer to Figure 1 , a test socket, comprising a base 11, refer to Figure 1 and Figure 2An upper cover 12 is slidably connected to the base 11 ; a test unit is arranged at the central position of the base 11 ; a reset elastic member 13 connected to the upper cover 12 is arranged on the base 11 ; and a locking mechanism 7 is arranged on the base 11 .

[0028] In this embodiment, the resetting elastic member 13 is a fourth spring, one end of which is connected to the upper cover 12 and the other end of which is connected to the base 11 .

[0029] refer to Figure 2 and Figure 3 The base 11 is located inside the upper cover 12, and a first release and separation mechanism connected to the base 11 is provided on the upper cover 12. The first anti-separation mechanism 5 includes a first anti-separation block 51 integrally provided on the outer wall of the base 11, and a second anti-separation block 52 cooperating with the first anti-separation block 51 is integrally provided on the base 11, and the second anti-separation block 52 is located below the first anti-separation block 51.

[0030] When the operator presses the upper cover 12, the fourth spring will be compressed, and at this time there will be a certain distance between the second anti-separation block 52 and the first anti-separation block 51; when the operator removes the force pressing the upper cover 12, that is, when the fourth spring restores its elastic deformation, the upper cover 12 will drive the second anti-separation block 52 to move in the direction close to the first anti-separation block 51, and the second anti-separation block 52 will resist the first anti-separation block 51, thereby restoring the upper cover 12 to its original position.

[0031] refer to Figure 2 and Figure 4 The locking device 2 includes two abutting mechanisms 3, which are respectively located on two opposite side walls of the base 11. Each abutting mechanism 3 includes a first rotating shaft 31 rotatably connected to the upper cover 12, and a first connecting block 33 is rotatably connected to the first rotating shaft 31; a second rotating shaft 32 is rotatably connected to the base 11, and a second connecting block 34 is rotatably connected to the second rotating shaft 32, and one end of the second connecting block 34 away from the second rotating shaft 32 is hinged to the first connecting block 33.

[0032] One end of the first connecting block 33 away from the first rotating shaft 31 is fixedly connected to the third connecting block 35, and the third connecting block 35 is provided with a mounting groove 351 and a first through hole connected to the mounting groove 351; a fourth connecting block 38 is provided at both ends of the third connecting block 35, and each fourth connecting block 38 is provided with a waist-shaped hole 381; the two fourth connecting blocks 38 are commonly connected to a clamping block 37, and a sliding cavity 371 is provided on the side of the clamping block 37 close to the first connecting block 33, and the end of the third connecting block 35 away from the first connecting block 33 is located in the sliding cavity 371, so that the clamping block 37 can slide along the third connecting block 35. A third rotating shaft 36 is rotatably connected in the first through hole of the third connecting block 35, a part of the third rotating shaft 36 is located in the mounting groove 351 of the third connecting block 35, and both ends of the third rotating shaft 36 are respectively located in the waist-shaped holes 381 of the two fourth connecting blocks 38; a torsion spring is sleeved on the third rotating shaft 36 located in the mounting groove 351, one end of the torsion spring is connected to the third rotating shaft 36 and the other end is connected to the third connecting block 35.

[0033] When the chip needs to be placed on the test unit, the operator first presses the upper cover 12, and the first rotating shaft 31 on the upper cover 12 drives the first connecting block 33 to move, and the second connecting block 34 on the first connecting block 33 also rotates; the moving first connecting block 33 drives the third connecting block 35 to move, and the third rotating shaft 36 on the third connecting block 35 drives the two fourth connecting blocks 38 to move, and the fourth connecting block 38 drives the clamping block 37 to move, so that the clamping block 37 moves away from the test unit; then the operator places the chip on the test unit.

[0034] refer to Figure 1 , Figure 2 and Figure 5 A fifth groove is formed on the base 11, a synchronization block 14 is slidably connected in the fifth groove, and a second through hole corresponding to the test unit is formed on the synchronization block 14.

[0035] The synchronization block 14 is provided with two buffer adjustment mechanisms 4 . The two buffer adjustment mechanisms 4 are respectively located on two opposite side walls of the synchronization block 14 , and the two pressing blocks 37 are both located between the two buffer adjustment mechanisms 4 .

[0036] Each buffer adjustment mechanism 4 includes a buffer adjustment block 42 fixedly connected to the synchronization block 14, the buffer adjustment block 42 is connected to a first spring 44, and the end of the first spring 44 away from the buffer adjustment block 42 is connected to the base 11; the buffer adjustment block 42 is provided with a first groove 421 on one end away from the synchronization block 14 and on the side away from the upper cover 12, and the buffer adjustment block 42 is fixedly connected with a limiting block 43 located in the first groove 421, and the two clamping blocks 37 in the two clamping mechanisms 3 respectively abut against the two side walls of the limiting block 43, and the ends of the two clamping blocks 37 in the two clamping mechanisms 3 can be located in the first groove 421.

[0037] Four limiting support blocks 45 are fixedly connected to the synchronization block 14, and the four limiting support blocks 45 are all located between the two buffer adjustment blocks 42 in the two buffer adjustment mechanisms 4. The four limiting support blocks 45 correspond one-to-one to the four fourth connecting blocks 38 in the two clamping mechanisms 3, and one end of each fourth connecting block 38 away from the clamping block 37 can abut against the corresponding limiting support block 45.

[0038] refer to Figure 1 , Figure 3 and Figure 5 The base 11 is provided with two second grooves 111 communicating with the fifth groove. The buffer adjustment blocks 42 in the two buffer adjustment mechanisms 4 are integrally provided with two lifting blocks 41 . The two lifting blocks 41 are slidably arranged in one second groove 111 .

[0039] Both lifting blocks 41 are provided with a second anti-separation mechanism connected to the base 11, and the second anti-separation mechanism includes a third anti-separation block 61 integrally arranged on the lifting block 41, and a fourth anti-separation block 62 located in the second groove 111 and cooperating with the third anti-separation block 61 is fixedly connected to the base 11.

[0040] When the upper cover 12 is pressed, the pressing block 37 moves away from the test unit, and the first spring 44 is in a normal state; when the force pressing the upper cover 12 is removed and the upper cover 12 is reset, the two pressing blocks 37 will move toward the test unit, and the two ends of the pressing blocks 37 will enter the first grooves 421 of the two buffer adjustment blocks 42, and the two pressing blocks 37 will respectively contact the two side walls of the buffer adjustment blocks 42, and the pressing blocks 37 will move relative to the third connecting block 35, so as to adjust the positions of the two pressing blocks 37, so that the two pressing blocks 37 vertically press against the chip on the test unit; and when the pressing blocks 37 move toward the test chip, the pressing blocks 37 will drive the synchronization block 14 to move downward. When the upper cover 12 returns to its original position, the first spring 44 is in a compressed state, the fourth spring is in a normal state, and the pressing blocks 37 remain in a vertical state and press against the chip on the test unit.

[0041] In this embodiment, the test unit is a standard test fixture, which is provided with probes, a test interface board and related fixing mechanisms to fix, release and perform testing operations on the chip placed thereon in a timely manner.

[0042] The implementation principle of the embodiment 1 of the present application is as follows: when it is necessary to place the chip on the test unit, the operator first presses the upper cover 12, the first rotating shaft 31 on the upper cover 12 drives the first connecting block 33 to move, and the second connecting block 34 on the first connecting block 33 also rotates; the moving first connecting block 33 drives the third connecting block 35 to move, the third rotating shaft 36 on the third connecting block 35 drives the two fourth connecting blocks 38 to move, and the fourth connecting block 38 drives the pressing block 37 to move, so that the pressing block 37 moves in a direction away from the test unit, and then the operator places the chip on the test unit. At this time, the fourth spring is in a compressed state, and the first spring 44 is in a normal state.

[0043] When the chip is on the test unit, the operator removes the force pressing the upper cover 12, and the fourth spring restores the elastic deformation force to drive the upper cover 12 to move upward, and the moving upper cover 12 drives the pressing block 37 to move toward the test unit, and the pressing block 37 drives the synchronization block 14 to move downward. When the upper cover 12 returns to its original position, the first spring 44 is in a compressed state, the fourth spring is in a normal state, and the pressing block 37 remains in a vertical state and presses against the chip on the test unit.

[0044] Example 2 refer to Figure 6 and Figure 7 A locking groove 121 is formed on one side of the upper cover 12 close to the base 11 , a third groove connected to the locking groove 121 is formed on the upper cover 12 , and a sixth groove is formed on the side wall of the base 11 .

[0045] refer to Figure 6 and Figure 8 A locking groove 121 is provided on one side of the upper cover 12 close to the base 11, and a third groove connected to the locking groove 121 is provided on the upper cover 12. A locking mechanism 7 is provided on the base 11, and the locking mechanism 7 includes a locking block 71 which is slidably connected in the sixth groove and engaged with the locking groove 121; a second spring 72 is connected to the locking block 71, and one end of the second spring 72 away from the locking block 71 is connected to the base 11.

[0046] refer to Figure 7 The upper cover 12 is provided with a slide groove connected to the third groove. An unlocking block 73 is slidably connected in the third groove of the upper cover 12, a slider 75 that slides in the slide groove is fixedly connected to the unlocking block 73, a third spring 74 is connected to the slider 75, and one end of the third spring 74 away from the slider 75 is connected to the upper cover 12.

[0047] When the fourth spring is in a normal state, the locking block 71 is completely located in the third groove, and the locking block 71 contacts the side wall of the upper cover 12 close to the base 11. The locking groove 121, the third groove and the unlocking block 73 on the upper cover 12 are all located above the locking block 71; the third spring 74 is in a compressed state. When the upper cover 12 is pressed to align the locking groove 121 with the unlocking block 73, the third spring 74 restores its elastic deformation. Under the action of the elastic force of the third spring 74, the elastic force of the third spring 74 drives the locking block 71 to move, so that the locking block 71 is engaged with the locking groove 121, and the locking block 71 contacts the unlocking block 73; at this time, the fourth spring is in a compressed state, and then the operator places the chip on the test unit. When the upper cover 12 needs to be restored to its original position, the operator presses the unlocking block 73, and the unlocking block 73 pushes the locking block 71 to move, so that the locking block 71 is no longer engaged with the locking groove 121 and re-enters the third groove, and the force of the fourth spring to restore the elastic deformation will drive the upper cover 12 to return to its original position; when the unlocking block 73 moves, the slider 75 on the unlocking block 73 slides in the slide groove, and when the locking block 71 is completely located in the third groove, the third spring 74 is in a stretched state; when the upper cover 12 moves upward and the locking block 71 is misaligned with the locking groove 121, the force of the third spring 74 to restore the elastic deformation will drive the slider 75 to move, and the slider 75 drives the locking block 71 to return to its original position.

[0048] Reference 6 and Figure 8 A seventh groove is formed on the base 11, and a first cavity is formed on the base 11 to connect the sixth groove and the seventh groove.

[0049] An adjusting mechanism 8 is disposed on the base 11 . The adjusting mechanism 8 includes an adjusting block 81 slidably connected in the seventh groove. The testing unit is located on the adjusting block 81 . The adjusting block 81 can pass through the second through hole on the synchronization block 14 . A first adjusting component is provided on the base 11, and the first adjusting component includes a first rack 821 fixedly connected to the locking block 71; a first adjusting shaft 822 located in the first cavity is rotatably connected to the base 11, one end of the first adjusting shaft 822 is keyed to a first gear 823 meshing with the first rack 821, and the end of the first adjusting shaft 822 away from the first gear 823 is keyed to a third gear 826; a second rack 824 is fixedly connected to the adjusting block 81, and a second gear 825 meshing with the second rack 824 is rotatably connected to the base 11; an even number of transmission gears 827 are rotatably connected between the second gear 825 and the third gear 826, two adjacent transmission gears 827 are meshed with each other, and the multiple transmission gears 827 are linearly distributed, and the transmission gear 827 at one end of the multiple transmission gears 827 is meshed with the second gear 825 and the transmission gear 827 at the other end is meshed with the third gear 826.

[0050] When the locking block 71 moves and engages with the locking groove 121, the first rack 821 on the locking block 71 drives the first gear 823 to rotate, the first gear 823 drives the first adjustment shaft 822 to rotate, the first adjustment shaft 822 drives the third gear 826 to rotate, the third gear 826 drives the second gear 825 to rotate under the action of multiple transmission gears 827, the second gear 825 drives the second rack 824 to move, and the second rack 824 will adjust the block 81 to move upward, so that the adjustment block 81 passes through the second through hole on the synchronization block 14, and then the operator places the chip on the test unit. When the unlocking block 73 pushes the locking block 71 to move so that the locking block 71 is completely located in the third groove, the adjustment block 81 will return to its original position.

[0051] refer to Figure 6 and Figure 8 An eighth groove is formed on the base 11, and a second cavity connecting the eighth groove and the seventh groove is formed on the base 11.

[0052] The base 11 is provided with a limiting mechanism 9, which includes a limiting block 91 slidably connected in the second cavity, and a limiting groove engaged with the limiting block 91 is provided on the adjusting block 81. The base 11 is provided with a second adjusting assembly 92, which includes a support block 921 slidably connected in the eighth groove, and the upper cover 12 can resist the support block 921; the support block 921 is connected with a fifth spring 922, and the end of the fifth spring 922 away from the support block 921 is connected to the base 11; the support block 921 is fixedly connected with a third rack 923, and the base 11 is rotatably connected with a second adjusting shaft 924 located in the second cavity, one end of the second adjusting shaft 924 is keyed to a fourth gear 925 meshing with the third rack 923, and one end of the second adjusting shaft 924 away from the fourth gear 925 is keyed to a fifth gear 926, and the limiting block 91 is fixedly connected with a fourth rack 927 meshing with the fifth gear 926.

[0053] When the upper cover 12 is pressed, the upper cover 12 will contact the support block 921 and push the support block 921 to move, and the fifth spring 922 is compressed; the third rack 923 on the support block 921 drives the fourth gear 925 to rotate, the fourth gear 925 drives the second adjusting shaft 924 to rotate, the second adjusting shaft 924 drives the fifth gear 926 to rotate, the fifth gear 926 drives the fourth rack 927 to move, and the fourth rack 927 drives the limiting block 91 to move, so that the limiting block 91 is no longer engaged with the limiting groove on the adjusting block 81; at this time, the locking block 71 is not aligned with the locking groove 121 on the upper cover 12.

[0054] Then continue to press the upper cover 12. When the locking block 71 is aligned with the locking groove 121 on the upper cover 12, the third spring 74 will drive the locking block 71 to engage with the locking groove 121. At the same time, the locking block 71 drives the adjusting block 81 to move upward, so that the end of the adjusting block 81 with the test unit passes through the second through hole on the synchronization block 14. The operator then places the chip on the test unit.

[0055] Then the operator presses the unlocking block 73, and the unlocking block 73 pushes the locking block 71 to move, so that the locking block 71 completely enters the third groove and is no longer engaged with the locking groove 121; at this time, the locking block 71 drives the adjustment block 81 to return to its original position. When the locking block 71 is no longer engaged with the locking groove 121, the fifth spring 922 and the fourth spring will restore elastic deformation. When the fifth spring 922 restores elastic deformation, the support block 921 will return to its original position. When the support block 921 moves, it will drive the limiting block 91 to move, so that the limiting block 91 is engaged with the adjustment groove on the adjustment block 81; after the fifth spring 922 has completely restored its elastic deformation, the fourth spring has not completely restored its elastic deformation; then the force of the fourth spring to completely restore its elastic deformation will continue to drive the upper cover 12 to move, so that the upper cover 12 returns to its original position, that is, after the limiting block 91 is engaged with the limiting groove on the adjustment block 81, the upper cover 12 continues to move.

[0056] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.

Claims

1. A test socket, comprising a base (11), an upper cover (12), a test unit and a reset elastic member (13), wherein the test unit is arranged on the base (11); the upper cover (12) is slidably arranged on the base (11), and the reset elastic member (13) connects the base (11) and the upper cover (12); characterized in that: The invention also comprises a locking device (2), wherein the locking device (2) comprises two abutting mechanisms (3) and two buffer adjustment mechanisms (4), wherein the two abutting mechanisms (3) are respectively arranged on two opposite side walls of the base (11), and the two buffer adjustment mechanisms (4) are respectively arranged on two opposite side walls of the base (11), and the two buffer adjustment mechanisms (4) are located between the two abutting mechanisms (3). The clamping mechanism (3) comprises a first rotating shaft (31), a second rotating shaft (32), a first connecting block (33), a second connecting block (34), a third connecting block (35), a third rotating shaft (36), a torsion spring and a clamping block (37). The first rotating shaft (31) is rotatably disposed on the upper cover (12), and the first connecting block (33) is disposed on the first rotating shaft (31); The second rotating shaft (32) is rotatably disposed on the base (11); one end of the second connecting block (34) is connected to the second rotating shaft (32) and the other end is connected to the first connecting block (33); The third connecting block (35) is arranged on the first connecting block (33), the third rotating shaft (36) is rotatably arranged on the third connecting block (35), and the abutting block (37) is arranged on the third rotating shaft (36); The torsion spring is sleeved on the third rotating shaft (36), one end of the torsion spring is connected to the third rotating shaft (36) and the other end is connected to the third connecting block (35); The buffer adjustment mechanism (4) is capable of adjusting the state of the pressing block (37) and causing the pressing block (37) to slowly press against the test piece.

2. A test socket according to claim 1, characterized in that: The third connecting block (35) is provided with a mounting groove (351) and a first through hole communicating with the mounting groove (351); Two fourth connection blocks (38) are arranged on the abutting block (37), the third connection block (35) is located between the two fourth connection blocks (38), and waist-shaped holes (381) are provided on the two fourth connection blocks (38); The third rotating shaft (36) is rotatably disposed in the first through hole, a portion of the third rotating shaft (36) is located in the mounting groove (351), and the torsion spring is sleeved on the third rotating shaft (36) located in the mounting groove (351); two ends of the third rotating shaft (36) are respectively located in the two waist-shaped holes (381) of the two fourth connecting blocks (38).

3. A test socket according to claim 2, characterized in that: The buffer adjustment mechanism (4) comprises a lifting block (41), a buffer adjustment block (42), a limiting block (43) and a first spring (44). The lifting block (41) is slidably arranged on the base (11); The buffer adjustment block (42) is arranged on the lifting block (41), and a first groove (421) is formed on the buffer adjustment block (42); The limiting block (43) is arranged on the buffer adjustment block (42) and is located in the first groove (421); the two pressing blocks (37) in the two pressing mechanisms (3) both abut against the limiting block (43); One end of the first spring (44) is connected to the buffer adjustment block (42) and the other end is connected to the base (11).

4. A test socket according to claim 3, characterized in that: A limiting support block (45) is fixedly arranged on the buffer adjustment block (42), and an end of the fourth connection block (38) away from the abutting block (37) is capable of abutting against the limiting support block (45).

5. The test socket according to claim 3, characterized in that: The base (11) is provided with a second groove (111) for the lifting block (41) to slide. The base (11) is provided with a first anti-separation mechanism (5) connected to the upper cover (12) and a second anti-separation mechanism connected to the lifting block (41); The first anti-separation mechanism (5) comprises a first anti-separation block (51) and a second anti-separation block (52). The first anti-separation block (51) is arranged on the outer side wall of the base (11), and the second anti-separation block (52) is arranged on the upper cover (12) and cooperates with the first anti-separation block (51); The second anti-separation mechanism comprises a third anti-separation block (61) and a fourth anti-separation block (62). The third anti-separation block (61) is arranged on the lifting block (41); and the fourth anti-separation block (62) is arranged in the second groove (111) and cooperates with the third anti-separation block (61).

6. The test socket according to claim 5, characterized in that: The base (11) is provided with a locking mechanism (7), the locking mechanism (7) comprising a locking block (71), a second spring (72), an unlocking block (73) and a third spring (74). The locking block (71) is slidably disposed on the base (11), and the upper cover (12) is provided with a locking groove (121) which is engaged with the locking block (71); One end of the second spring (72) is connected to the locking block (71) and the other end is connected to the base (11); The upper cover (12) is provided with a third groove which is in communication with the locking groove (121); the unlocking block (73) is slidably disposed in the third groove, and the unlocking block (73) is capable of contacting the locking block (71); One end of the third spring (74) is connected to the unlocking block (73) and the other end is connected to the upper cover (12).

7. A test socket according to claim 6, characterized in that: The base (11) is provided with an adjustment mechanism (8), the adjustment mechanism (8) comprising an adjustment block (81) and a first adjustment component. The base (11) is provided with a fourth groove, the adjustment block (81) is slidably arranged in the fourth groove, and the test unit is arranged on the adjustment block (81); The first adjustment component is arranged on the base (11), and the adjustment block (81) and the locking block (71) are both connected to the first adjustment component.

8. The test socket according to claim 7, characterized in that: The base (11) is provided with a limiting mechanism (9), wherein the limiting mechanism (9) comprises a limiting block (91) and a second adjustment component (92). The limiting block (91) is slidably arranged on the base (11), and the adjusting block (81) is provided with a limiting groove which is engaged with the limiting block (91); The second adjustment component (92) is arranged on the base (11), and the upper cover (12) and the limiting block (91) are both connected to the second adjustment component (92).

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