Storage product reliability test method and device, equipment and storage medium

Abstract

The invention relates to a storage product reliability test method and device, equipment and a storage medium, and the method comprises the steps: obtaining at least one single-point test case corresponding to each test scene for carrying out the reliability test of a target storage product in response to a detected test starting instruction; executing single-point test cases on the target storage product in sequence, and recording first log information corresponding to each single-point test case; based on the first log information, screening target single-point test items of which the reliability is greater than or equal to a preset threshold value from the single-point test items corresponding to the single-point test cases; and selecting at least two target single-point test items to carry out a combined test, and recording second log information generated in the combined test. According to the method and the device, the single-point test and the combined test are performed on the reliability of the target storage product in different test scenes, so that the single-point fault and the multi-point fault of the target storage product in different test scenes can be comprehensively tested, and the test efficiency is improved.

Description

Technical Field

[0001] The present disclosure relates to the field of testing technology, and in particular to a storage product reliability testing method, device, equipment and storage medium. Background Art

[0002] In the context of the rapid development of current storage technology, users have increasingly higher requirements for the quality of storage products, and the reliability test scenarios that storage products need to deal with are becoming more complex and diverse. Not only must the stability of the entire machine be guaranteed, but also the stable operation capabilities of components and network connections must be guaranteed. However, existing reliability test systems often perform isolated tests on these different test scenarios. This decentralized testing method is not only inefficient, but also difficult to fully and accurately reflect the overall reliability level of storage products. Therefore, how to conduct an overall test of the reliability of storage products is a technical problem that needs to be solved urgently. Summary of the invention

[0003] In order to solve the above technical problems, the present disclosure provides a storage product reliability testing method, device, equipment and storage medium.

[0004] A first aspect of an embodiment of the present disclosure provides a storage product reliability testing method, the method comprising:

[0005] In response to detecting the test start instruction, obtaining at least one single-point test case corresponding to each test scenario for performing reliability test on the target storage product;

[0006] Executing the single-point test cases on the target storage product in sequence, and recording first log information corresponding to each single-point test case;

[0007] Based on the first log information, select target single-point test items whose reliability is greater than or equal to a preset threshold from the single-point test items corresponding to each single-point test case;

[0008] At least two target single-point test items are selected for combined testing, and second log information generated in the combined testing is recorded.

[0009] Optionally, the step of selecting, based on the first log information, target single-point test items whose reliability is greater than or equal to a preset threshold from the single-point test items corresponding to each single-point test case includes:

[0010] For each single-point test case, determining a reliability score of a single-point test item corresponding to the single-point test case based on the first log information corresponding to the single-point test case;

[0011] Obtaining a scoring threshold corresponding to the single-point test item;

[0012] If the reliability score of the single-point test item is greater than or equal to the score threshold, the single-point test item is determined to be a target single-point test item.

[0013] Optionally, before selecting at least two target single-point test items for combined testing, the method further includes:

[0014] Determine the target number of single-point test items for combined testing;

[0015] For each screened target single-point test item, based on the reliability score of the target single-point test item, determine the selection probability corresponding to the target single-point test item;

[0016] The selecting at least two target single-point test items for combined testing includes:

[0017] Based on the selection probability corresponding to each target single-point test item, a target number of target single-point test items are selected from the screened target single-point test items;

[0018] Perform a combined test on the target number of target single-point test items.

[0019] Optionally, determining a target number of target single-point test items for combined testing includes:

[0020] Determine the maximum number of single-point test items for combined testing of the target storage product based on the pre-acquired fault domain information of the target storage product;

[0021] The target number is determined based on the maximum number, the target number being less than or equal to the maximum number.

[0022] Optionally, before responding to detecting the test start instruction, the method further includes:

[0023] Acquire attribute configuration information corresponding to the target storage product and test requirement information for performing reliability testing on the target storage product;

[0024] Performing initial attribute configuration on the target storage product based on the attribute configuration information;

[0025] After the test start instruction is detected, the method further includes:

[0026] The test environment is configured based on the test requirement information.

[0027] Optionally, after recording the second log information generated in the combined test, the method further includes:

[0028] A visual test report is generated based on the first log information and the second log information.

[0029] Optionally, the test scenarios include whole machine reliability test, component reliability test, process reliability test, hard disk reliability test, network reliability test, and time reliability test.

[0030] A second aspect of an embodiment of the present disclosure provides a storage product reliability testing device, the device comprising:

[0031] A first acquisition module, configured to acquire, in response to detecting a test start instruction, at least one single-point test case corresponding to each test scenario for performing a reliability test on a target storage product;

[0032] A single-point test module, used to execute the single-point test cases on the target storage product in sequence, and record first log information corresponding to each single-point test case;

[0033] A screening module, configured to screen target single-point test items whose reliability is greater than or equal to a preset threshold from the single-point test items corresponding to each single-point test case based on the first log information;

[0034] The combined test module is used to select at least two target single-point test items for combined testing and record second log information generated in the combined test.

[0035] A third aspect of an embodiment of the present disclosure provides a computer device, including a memory and a processor, and a computer program, wherein the computer program is stored in the memory, and when the computer program is executed by the processor, the storage product reliability testing method as described in the first aspect above is implemented.

[0036] A fourth aspect of an embodiment of the present disclosure provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the storage product reliability testing method as described in the first aspect above is implemented.

[0037] Compared with the prior art, the technical solution provided by the embodiments of the present disclosure has the following advantages:

[0038] In the storage product reliability testing method, device, equipment and storage medium provided by the embodiments of the present disclosure, in response to detecting a test start instruction, at least one single-point test case corresponding to each test scenario for performing reliability testing on a target storage product is obtained, the single-point test cases are executed on the target storage product in sequence, and first log information corresponding to each single-point test case is recorded. Based on the first log information, target single-point test items with reliability greater than or equal to a preset threshold are screened from the single-point test items corresponding to each single-point test case, at least two target single-point test items are selected for combined testing, and second log information generated in the combined testing is recorded. The reliability of the target storage product can be single-point tested in different test scenarios, and then multiple single-point test items with higher reliability are selected for combined testing, and log information generated during the testing process is recorded, so that a comprehensive and integrated test is performed on single-point failures and multiple-point failures that may occur in the target storage product in different test scenarios, and valuable data support is provided for subsequent test optimization and product improvement based on the log information, while avoiding taking the single-point test items corresponding to the single-point failures that have already caused serious impact on the storage product as the object of combined testing, eliminating potential high-risk items in advance, reducing unnecessary waste of test resources, and improving the overall test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0040] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0041] Figure 1 is a flow chart of a storage product reliability testing method provided by an embodiment of the present disclosure;

[0042] Figure 2 is a flow chart of a method for screening single-point test items provided by an embodiment of the present disclosure;

[0043] Figure 3 is a flow chart of a combined testing method provided by an embodiment of the present disclosure;

[0044] Figure 4 is a flow chart of a method for configuring a test environment provided by an embodiment of the present disclosure;

[0045] Figure 5 It is a structural schematic diagram of a storage product reliability testing device provided by an embodiment of the present disclosure;

[0046] Figure 6 It is a structural diagram of a computer device provided in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0047] In order to more clearly understand the above-mentioned objectives, features and advantages of the present disclosure, the scheme of the present disclosure will be further described below. It should be noted that the embodiments of the present disclosure and the features in the embodiments can be combined with each other without conflict.

[0048] In the following description, many specific details are set forth to facilitate a full understanding of the present disclosure, but the present disclosure may also be implemented in other ways different from those described herein; it is obvious that the embodiments in the specification are only part of the embodiments of the present disclosure, rather than all of the embodiments.

[0049] It should be understood that the various steps described in the method embodiments of the present disclosure may be performed in different orders and / or in parallel. In addition, the method embodiments may include additional steps and / or omit the steps shown. The scope of the present disclosure is not limited in this respect.

[0050] Figure 1 The present invention provides a flowchart of a storage product reliability test method provided by an embodiment of the present invention. The method can be executed by a storage product reliability test device. The storage product reliability test device can be implemented in software and / or hardware. The storage product reliability test device can be configured in an electronic device, such as a server or a terminal, wherein the terminal specifically includes a mobile phone, a computer or a tablet computer, etc. Figure 1 As shown, the storage product reliability testing method provided in this embodiment includes the following steps:

[0051] S101. In response to detecting a test start instruction, obtaining at least one single-point test case corresponding to each test scenario for performing reliability testing on a target storage product.

[0052] In the embodiment of the present disclosure, the test start instruction may include information of a target storage product to be tested, and information of various test scenarios for performing reliability tests on the target storage product.

[0053] The test scenarios in the embodiments of the present disclosure may include whole machine reliability test, component reliability test, process reliability test, hard disk reliability test, network reliability test, and time reliability test.

[0054] Among them, the reliability of the whole machine can include whole machine failure scenarios such as whole machine power failure and whole machine restart. The whole machine reliability test mainly focuses on whether the downward trend of the front-end business during the whole machine failure is in line with expectations, whether the business is interrupted, and whether the business performance can be restored to the level before the failure after the whole machine failure is restored, and whether there are abnormal situations such as data inconsistency in the whole process.

[0055] Component reliability mainly focuses on component failure scenarios such as the central processing unit (CPU), memory, and redundant array of independent disks controller (RAID Controller). It is necessary to pay attention to the product self-healing capabilities in scenarios such as busy components and exhausted hardware resources, such as memory leak protection mechanism (cgroup), memory leakage problems under high pressure, and system operation steady state under high memory usage.

[0056] Process reliability mainly focuses on key processes on the storage IO path and key processes related to configuration management. It is necessary to pay attention to changes in business / configuration / cluster status during process failures and whether the process can be started within the specified time.

[0057] Hard disk reliability mainly focuses on slow mechanical disks, pre-failure, bad sectors, bad blocks on flash disks, bad disks, and hot-swappable hard disks. On the one hand, it is necessary to use smart information to analyze the health of different types of hard disks online and give early warnings and solutions; on the other hand, it is necessary to test the stability of storage products when dealing with hard disk failures.

[0058] Network reliability mainly focuses on the distinction between storage networks and business networks and the management network. It is necessary to pay attention to hardware failures such as connecting devices and line failures (including damage, falling off, etc.), as well as software failures such as network storms, IP conflicts, network port disconnections, switch configuration loss, network card failures, delays and packet loss.

[0059] Time reliability mainly focuses on time jump failures, clock source synchronization failures, and time synchronization failures between nodes. It is necessary to pay attention to the cluster's response to time jumps, the business performance of clock asynchrony within the cluster, and self-repair capabilities.

[0060] The single point test in the embodiments of the present disclosure can be understood as a test method for testing the reliability of the target storage product when a single failure occurs. The single point test case can be understood as a reliability test case pre-written based on various abstract single point failure models. Each single point test case is used to simulate a specific type of single point failure, wherein each test scenario corresponds to at least one single point test case.

[0061] In the disclosed embodiment, the storage product reliability testing device can parse the test start instruction after detecting the test start instruction, determine the target storage product to be tested, and the test scenario in which the target storage product needs to be tested for reliability, and then obtain at least one single-point test case corresponding to each test scenario from a preset database according to the test scenario.

[0062] S102: Execute single-point test cases on the target storage product in sequence, and record first log information corresponding to each single-point test case.

[0063] The first log information in the embodiment of the present disclosure can be understood as the log record generated when each single point test case is executed.

[0064] In the disclosed embodiment, after acquiring each single-point test case, the storage product reliability testing device can independently execute each single-point test case in sequence in the target storage product according to a preset execution order, and acquire the first log information generated when executing each single-point test case.

[0065] In an exemplary implementation of the disclosed embodiment, a storage product reliability testing device can start an independent log thread to record in real time the log parameters pre-set during the entire test process, including but not limited to the number of input / output operations per second (IOPS), bandwidth, latency and other background business information, alarm information, storage system abnormality logs, storage system power consumption information, CPU and disk utilization and other storage system information, and then package and compress the collected logs at fixed time intervals for storage.

[0066] S103: Based on the first log information, select target single-point test items whose reliability is greater than or equal to a preset threshold from the single-point test items corresponding to each single-point test case.

[0067] In the disclosed embodiment, the storage product reliability testing device can determine the reliability of the single-point test items corresponding to each single-point test case based on the first log information corresponding to each single-point test case after obtaining the first log information corresponding to each single-point test case, and compare the reliability with a preset threshold, and determine the single-point test item whose corresponding reliability is greater than or equal to the preset threshold as the target single-point test item.

[0068] In an exemplary implementation of the disclosed embodiment, a storage product reliability testing device may evaluate indicators such as business stability during a storage product failure, an alarm prompt corresponding to the storage product, self-healing recovery time after a storage product failure, and business data consistency during a storage product failure based on the first log information corresponding to each single-point test case and pre-set evaluation indicators, and then comprehensively determine the reliability of each single-point test item.

[0069] S104: Select at least two target single-point test items to perform a combined test, and record second log information generated in the combined test.

[0070] The combined test in the embodiment of the present disclosure may be understood as a test method for testing the reliability of multiple single-point test items corresponding to multiple faults of a target storage product when multiple faults occur simultaneously.

[0071] In the embodiment of the present disclosure, the storage product reliability testing device can, after screening out target single-point test items whose reliability is greater than or equal to a preset threshold, select at least two target single-point test items from the screened out multiple target single-point test items, perform a combined test on the at least two selected target single-point test items, and obtain second log information generated during the combined test process.

[0072] In an exemplary implementation of the disclosed embodiment, a storage product reliability testing device may generate and execute a combined test case based on at least two single-point test cases corresponding to at least two selected target single-point test items, or may concurrently execute at least two single-point test cases corresponding to at least two target single-point test items to simulate a situation where at least two target single-point test items fail at the same time, thereby realizing a combined test of the target storage product.

[0073] In another exemplary implementation of the disclosed embodiment, the storage product reliability testing device may randomly select at least two target single-point test items from the screened multiple target single-point test items for combined testing, or may determine the target single-point test items for combined testing according to user instructions, which is not limited here.

[0074] The disclosed embodiment obtains at least one single-point test case corresponding to each test scenario for performing reliability test on the target storage product in response to detecting a test start instruction, executes the single-point test cases on the target storage product in sequence, and records first log information corresponding to each single-point test case. Based on the first log information, the target single-point test items with reliability greater than or equal to a preset threshold are screened from the single-point test items corresponding to each single-point test case, at least two target single-point test items are selected for combined test, and second log information generated in the combined test is recorded. The reliability of the target storage product can be single-point tested in different test scenarios, and then multiple single-point test items with higher reliability are selected for combined test, and the log information generated during the test is recorded, so as to perform comprehensive and integrated testing on single-point failures and multiple-point failures that may occur in the target storage product in different test scenarios, and provide valuable data support for subsequent test optimization and product improvement based on the log information, while avoiding taking the single-point test items corresponding to the single-point failures that have already caused serious impact on the storage product as the object of combined test, eliminating potential high-risk items in advance, reducing unnecessary waste of test resources, and improving the overall test efficiency.

[0075] Figure 2 is a flow chart of a method for screening single-point test items provided by an embodiment of the present disclosure, such as Figure 2 As shown, based on the above embodiment, single-point test items can be screened by the following method.

[0076] S201. For each single-point test case, determine a reliability score of a single-point test item corresponding to the single-point test case based on first log information corresponding to the single-point test case.

[0077] In the disclosed embodiment, the storage product reliability testing device can evaluate the reliability of single-point test items through reliability scoring, and determine the reliability score of the single-point test item corresponding to each single-point test case.

[0078] In an exemplary implementation of the disclosed embodiment, a storage product reliability testing device can determine a business stability score during a storage product failure, an alarm prompt score corresponding to the storage product, a self-healing recovery time score after a storage product failure, and a business data consistency score during a storage product failure based on the first log information corresponding to each single-point test case and pre-set evaluation indicators, and assign different weights based on the importance of each indicator, and finally perform weighted calculation based on the weight of each indicator item to determine the final reliability score of each single-point test item.

[0079] In another exemplary implementation of the disclosed embodiment, the storage product reliability testing device may also determine the reliability score of each single-point test item based on a pre-trained machine learning model, or may combine a rule-based scoring method and a machine learning-based scoring method to determine the final reliability score of each single-point test item, which is not limited here.

[0080] S202: Obtain a scoring threshold corresponding to a single-point test item.

[0081] In the disclosed embodiment, according to different requirements of different users for the target storage product on different single-point test items, different single-point test items correspond to different scoring thresholds. The storage product reliability testing device can determine the scoring threshold corresponding to each single-point test item based on the correspondence between the single-point test items and the scoring thresholds obtained in advance.

[0082] S203: If the reliability score of the single-point test item is greater than or equal to the score threshold, determine the single-point test item as a target single-point test item.

[0083] In the disclosed embodiment, after obtaining the scoring thresholds corresponding to each single-point test item, the storage product reliability testing device can determine, for each single-point test item, that the single-point test item is a qualified target single-point test item if the current reliability score of the single-point test item is greater than or equal to the corresponding scoring threshold.

[0084] The disclosed embodiment determines, for each single-point test case, the reliability score of the single-point test item corresponding to the single-point test case based on the first log information corresponding to the single-point test case, obtains the score threshold corresponding to the single-point test item, and if the reliability score of the single-point test item is greater than or equal to the score threshold, determines that the single-point test item is the target single-point test item. The reliability test result of the single-point test item can be quantified through the reliability score, so as to more objectively and accurately screen qualified single-point test items to enter the subsequent combined test process. At the same time, the differences in the requirements for the reliability levels of different single-point test items are fully considered, so that the test process is more in line with the actual situation.

[0085] Figure 3 is a flow chart of a combined testing method provided by an embodiment of the present disclosure, such as Figure 3 As shown, based on the above embodiments, a combined test can be performed by the following method.

[0086] S301. Determine the target number of target single-point test items for combined testing.

[0087] In the disclosed embodiment, the storage product reliability testing device can determine the target number of target single-point test items selected for combined testing after screening target single-point test items whose reliability scores are greater than or equal to a score threshold.

[0088] In an exemplary implementation of the disclosed embodiment, a storage product reliability testing device may first determine the maximum number of single-point test items for combined testing of a target storage product based on pre-acquired fault domain information that can be satisfied by the storage cluster size of the target storage product, and then determine a target number that is less than or equal to the maximum number.

[0089] S302: For each screened target single-point test item, based on the reliability score of the target single-point test item, determine the selection probability corresponding to the target single-point test item.

[0090] In the disclosed embodiment, after determining the reliability scores corresponding to the screened target single-point test items, the storage product reliability testing device can determine the probability of the target single-point test items being selected for combined testing based on the reliability scores.

[0091] In an exemplary implementation of the disclosed embodiment, a storage product reliability testing device may determine the selection probability corresponding to a target single-point test item based on the reliability score of each target single-point test item and the corresponding scoring threshold. For example, the greater the ratio of the difference between the reliability score of the target single-point test item and the corresponding scoring threshold to the scoring threshold, the greater the corresponding selection probability.

[0092] S303 . Select a target number of target single-point test items from the screened target single-point test items based on the selection probability corresponding to each target single-point test item.

[0093] In the disclosed embodiment, the storage product reliability testing device can determine the selection probability corresponding to each target single-point test item after screening, and the target number of target single-point test items for combined testing, and then select a target number of target single-point test items from all the screened target single-point test items based on the selection probability.

[0094] S304: Perform a combined test on a target number of target single-point test items.

[0095] In the disclosed embodiment, the storage product reliability testing device may perform a combination test on the target number of target single-point test items after selecting the target number of target single-point test items.

[0096] The disclosed embodiment determines a target number of target single-point test items for combined testing, determines the probability of selection corresponding to the target single-point test item for each target single-point test item after screening based on the reliability score of the target single-point test item, selects a target number of target single-point test items from the screened target single-point test items based on the probability of selection corresponding to each target single-point test item, and performs combined testing on the target number of target single-point test items. Combined testing can be performed based on the reliability score and the probability of selection, thereby significantly improving testing efficiency.

[0097] Figure 4 FIG. 1 is a flow chart of a method for configuring a test environment provided by an embodiment of the present disclosure. Figure 4 As shown, based on the above embodiment, the test environment can be configured by the following method.

[0098] S401: Acquire attribute configuration information corresponding to a target storage product and test requirement information for performing reliability testing on the target storage product.

[0099] The attribute configuration information in the embodiment of the present disclosure may include information for configuring the attributes of the target storage device itself, such as storage node IP, disk type and quantity, network type and other information; the test requirement information may include information for configuring conditions related to test requirements such as storage environment and business type, such as test volume redundancy type, number of test volumes, whether to configure value-added features, online analytical processing (OLAP) business type, online transaction processing (OLTP) business type, etc., which are not limited here.

[0100] In the disclosed embodiment, the storage product reliability testing device may first obtain the property configuration information corresponding to the target storage product and the test requirement information for performing reliability testing on the target storage product before starting to execute the test task.

[0101] S402: Perform initial attribute configuration on the target storage product based on the attribute configuration information.

[0102] In the disclosed embodiment, after acquiring the attribute configuration information corresponding to the target storage product, the storage product reliability testing apparatus may perform initial attribute configuration on the target storage product based on the attribute configuration information.

[0103] S403: Configure the test environment based on the test requirement information.

[0104] In the disclosed embodiment, the storage product reliability testing device may initialize and configure the test environment based on the test requirement information after acquiring the test requirement information.

[0105] In an exemplary implementation of the disclosed embodiment, a storage product reliability testing device can monitor the busy and idle status of the test environment in real time after the initial configuration of the test environment is completed, and after the reliability test is officially started, monitor the number of test tasks in the task management queue in real time through a listening thread. When the number of tasks is greater than zero and there is an idle test environment, apply for the test environment, take out the head task from the task management queue and associate it with the applied test environment, and start the test task.

[0106] The disclosed embodiment obtains the attribute configuration information corresponding to the target storage product and the test requirement information for performing reliability testing on the target storage product, performs initial attribute configuration on the target storage product based on the attribute configuration information, and performs test environment configuration based on the test requirement information. This eliminates the need for staff to manually complete complex and tedious configuration work, thereby reducing the operational difficulty of performing reliability testing on storage products.

[0107] In some embodiments, the storage product reliability testing apparatus may generate a visual test report based on the first log information and the second log information after recording the second log information generated in the combined test.

[0108] Specifically, after the combination test is completed and the second log information recorded in the combination test process is obtained, the storage product reliability testing device can integrate and analyze the first log information and the second log information, convert the process data of each test item into an intuitive graph or chart, and generate a visual test report. Optionally, after detecting the user's interactive operation on the visual test report, such as clicking or dragging, the corresponding data and detailed analysis results are further displayed, so as to facilitate the user to quickly and intuitively obtain the test results and improve the user experience.

[0109] Figure 5 Schematic diagram of a storage product reliability test device provided by an embodiment of the present disclosure. Figure 5As shown, the storage product reliability testing device 500 includes: a first acquisition module 510, a single-point test module 520, a screening module 530, and a combination test module 540, wherein the first acquisition module 510 is used to obtain at least one single-point test case corresponding to each test scenario for reliability testing of a target storage product in response to detecting a test start instruction; the single-point test module 520 is used to execute the single-point test cases on the target storage product in sequence, and record first log information corresponding to each single-point test case; the screening module 530 is used to screen target single-point test items whose reliability is greater than or equal to a preset threshold from the single-point test items corresponding to each single-point test case based on the first log information; the combination test module 540 is used to select at least two target single-point test items for combination testing, and record second log information generated in the combination testing.

[0110] Optionally, the screening module 530 includes: a scoring unit, used to determine, for each single-point test case, a reliability score of a single-point test item corresponding to the single-point test case based on the first log information corresponding to the single-point test case; an acquisition unit, used to acquire a scoring threshold corresponding to the single-point test item; and a determination unit, used to determine that the single-point test item is a target single-point test item if the reliability score of the single-point test item is greater than or equal to the scoring threshold.

[0111] Optionally, the storage product reliability testing device 500 also includes: a quantity determination module, which is used to determine the target number of target single-point test items for combined testing; a probability determination module, which is used to determine the selection probability corresponding to each target single-point test item after screening based on the reliability score of the target single-point test item; the combined testing module 540 includes: a selection unit, which is used to select a target number of target single-point test items from the screened target single-point test items based on the selection probability corresponding to each target single-point test item; and a combined testing unit, which is used to perform combined testing on the target number of target single-point test items.

[0112] Optionally, the quantity determination module includes: a first determination unit, used to determine the maximum number of single-point test items for combined testing of the target storage product based on pre-acquired fault domain information of the target storage product; and a second determination unit, used to determine the target number based on the maximum number, the target number being less than or equal to the maximum number.

[0113] Optionally, the storage product reliability testing device 500 also includes: a second acquisition module, used to obtain attribute configuration information corresponding to the target storage product, and test requirement information for performing reliability testing on the target storage product; a first configuration module, used to perform initial attribute configuration on the target storage product based on the attribute configuration information; and a second configuration module, used to configure the test environment based on the test requirement information.

[0114] Optionally, the storage product reliability testing device 500 further includes: a report generating module, configured to generate a visual test report based on the first log information and the second log information.

[0115] Optionally, the test scenarios include whole machine reliability test, component reliability test, process reliability test, hard disk reliability test, network reliability test, and time reliability test.

[0116] The storage product reliability testing device provided in this embodiment can execute the method described in any of the above embodiments. Its execution method and beneficial effects are similar and will not be described in detail here.

[0117] Figure 6 It is a structural diagram of a computer device provided in an embodiment of the present disclosure.

[0118] like Figure 6 As shown, the computer device may include a processor 610 and a memory 620 storing computer program instructions.

[0119] Specifically, the processor 610 may include a central processing unit (CPU), or an application specific integrated circuit (ASIC), or may be configured to implement one or more integrated circuits of the embodiments of the present application.

[0120] The memory 620 may include a large capacity memory for information or instructions. By way of example and not limitation, the memory 620 may include a hard disk drive (HDD), a floppy disk drive, a flash memory, an optical disk, a magneto-optical disk, a tape, or a universal serial bus (USB) drive or a combination of two or more of these. Where appropriate, the memory 620 may include a removable or non-removable (or fixed) medium. Where appropriate, the memory 620 may be inside or outside the integrated gateway device. In a particular embodiment, the memory 620 is a non-volatile solid-state memory. In a particular embodiment, the memory 620 includes a read-only memory (ROM). Where appropriate, the ROM may be a mask-programmed ROM, a programmable ROM (PROM), an erasable PROM (EPROM), an electrically erasable PROM (Electrically Erasable Programmable ROM, EEPROM), an electrically rewritable ROM (EAROM) or a flash memory, or a combination of two or more of these.

[0121] The processor 610 reads and executes the computer program instructions stored in the memory 620 to perform the steps of the storage product reliability testing method provided in the embodiment of the present disclosure.

[0122] In one example, the computer device may further include a transceiver 630 and a bus 640. Figure 6 As shown, the processor 610, the memory 620 and the transceiver 630 are connected via a bus 640 and communicate with each other.

[0123] The bus 640 includes hardware, software, or both. For example, but not limitation, the bus may include an Accelerated Graphics Port (AGP) or other graphics bus, an Extended Industry Standard Architecture (EISA) bus, a Front Side Bus (FSB), a Hyper Transport (HT) interconnect, an Industrial Standard Architecture (ISA) bus, an InfiniBand interconnect, a Low Pin Count (LPC) bus, a memory bus, a MicroChannel Architecture (MCA) bus, a Peripheral Component Interconnect (PCI) bus, a PCI-Express (PCI-X) bus, a Serial Advanced Technology Attachment (SATA) bus, a Video Electronics Standards Association Local Bus (VLB) bus, or other suitable buses or a combination of two or more of these. Where appropriate, the bus 640 may include one or more buses. Although embodiments of the present application describe and illustrate a particular bus, the present application contemplates any suitable bus or interconnect.

[0124] The embodiments of the present disclosure also provide a computer-readable storage medium, which may store a computer program. When the computer program is executed by a processor, the processor implements the storage product reliability testing method provided by the embodiments of the present disclosure.

[0125] The above-mentioned storage medium may, for example, include a memory 620 of computer program instructions, and the above-mentioned instructions may be executed by the processor 610 of the storage product reliability test device to complete the storage product reliability test method provided by the embodiment of the present disclosure. Optionally, the storage medium may be a non-temporary computer-readable storage medium, for example, the non-temporary computer-readable storage medium may be a ROM, a random access memory (Random Access Memory, RAM), a compact disc read-only memory (Compact Disc ROM, CD-ROM), a magnetic tape, a floppy disk, and an optical data storage device, etc. The above-mentioned computer program may be written in any combination of one or more programming languages ​​to perform the program code for the operation of the embodiment of the present disclosure, and the programming language includes an object-oriented programming language, such as Java, C++, etc., and also includes a conventional procedural programming language, such as "C" language or similar programming language. The program code may be executed entirely on the user computing device, partially on the user device, as an independent software package, partially on the user computing device, partially on the remote computing device, or completely on the remote computing device or server.

[0126] It should be noted that, in this article, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0127] The above description is only a specific embodiment of the present disclosure, so that those skilled in the art can understand or implement the present disclosure. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present disclosure. Therefore, the present disclosure will not be limited to the embodiments described herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A storage product reliability testing method, characterized in that: The method comprises: In response to detecting the test start instruction, obtaining at least one single-point test case corresponding to each test scenario for performing reliability test on the target storage product; Executing the single-point test cases on the target storage product in sequence, and recording first log information corresponding to each single-point test case; Based on the first log information, select target single-point test items whose reliability is greater than or equal to a preset threshold from the single-point test items corresponding to each single-point test case; At least two target single-point test items are selected for combined testing, and second log information generated in the combined testing is recorded.

2. The method according to claim 1, characterized in that The step of selecting, based on the first log information, target single-point test items whose reliability is greater than or equal to a preset threshold from the single-point test items corresponding to each single-point test case includes: For each single-point test case, determining a reliability score of a single-point test item corresponding to the single-point test case based on the first log information corresponding to the single-point test case; Obtaining a scoring threshold corresponding to the single-point test item; If the reliability score of the single-point test item is greater than or equal to the score threshold, the single-point test item is determined to be a target single-point test item.

3. The method according to claim 2, characterized in that Before selecting at least two target single-point test items for combined testing, the method further includes: Determine the target number of single-point test items for combined testing; For each screened target single-point test item, based on the reliability score of the target single-point test item, determine the selection probability corresponding to the target single-point test item; The selecting at least two target single-point test items for combined testing includes: Based on the selection probability corresponding to each target single-point test item, a target number of target single-point test items are selected from the screened target single-point test items; Perform a combined test on the target number of target single-point test items.

4. The method according to claim 3, characterized in that Determining the target number of target single-point test items for combined testing includes: Determine the maximum number of single-point test items for combined testing of the target storage product based on the pre-acquired fault domain information of the target storage product; The target number is determined based on the maximum number, the target number being less than or equal to the maximum number.

5. The method according to claim 1, characterized in that Before responding to detecting the test start instruction, the method further includes: Acquire attribute configuration information corresponding to the target storage product and test requirement information for performing reliability testing on the target storage product; Performing initial attribute configuration on the target storage product based on the attribute configuration information; After the test start instruction is detected, the method further includes: The test environment is configured based on the test requirement information.

6. The method according to claim 1, characterized in that After recording the second log information generated in the combined test, the method further includes: A visual test report is generated based on the first log information and the second log information.

7. The method according to claim 1, characterized in that The test scenarios include whole machine reliability test, component reliability test, process reliability test, hard disk reliability test, network reliability test, and time reliability test.

8. A storage product reliability testing device, characterized in that: include: A first acquisition module, configured to acquire, in response to detecting a test start instruction, at least one single-point test case corresponding to each test scenario for performing a reliability test on a target storage product; A single-point test module, used to execute the single-point test cases on the target storage product in sequence, and record first log information corresponding to each single-point test case; A screening module, configured to screen target single-point test items whose reliability is greater than or equal to a preset threshold from the single-point test items corresponding to each single-point test case based on the first log information; The combined test module is used to select at least two target single-point test items for combined testing and record second log information generated in the combined testing.

9. A computer device, characterized in that: include: Memory; processor; and a computer program; wherein the computer program is stored in the memory and is configured to be executed by the processor to implement the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by a processor, the storage product reliability testing method according to any one of claims 1 to 7 is implemented.

Images