Method, device and system for optimizing sensitivity, extinction ratio and EMI (Electro-Magnetic Interference) of long-distance optical module

Abstract

The invention relates to a method, a device and a system for optimizing the sensitivity, the extinction ratio and the EMI (Electro-Magnetic Interference) of a long-distance optical module. The method mainly comprises the following steps: detecting the output sensitivity of the optical module at different temperatures, and compensating and adjusting the voff voltage according to the sensitivity offset at different temperatures; after the voff voltage is compensated and adjusted, the bias current is compensated and adjusted according to the optical power offset at different temperatures; the output extinction ratio of the optical module is detected at different temperatures, and the Vmod voltage is compensated and adjusted according to the offset of the extinction ratio at the different temperatures; the EMI of the optical module is detected at different temperatures, if the EMI is unqualified, the Vmod voltage is subjected to compensation adjustment, and if the EMI is unqualified after the Vmod voltage is subjected to multiple times of compensation adjustment, the RX amplitude voltage and the RX pre-emphasis voltage are subjected to compensation adjustment, so that the sensitivity, the extinction ratio and the EMI of the optical module are all qualified. According to the invention, the sensitivity and extinction ratio of the optical module at each temperature can be optimized to the optimal value under the condition that EMI is ensured to be qualified.

Description

Technical Field

[0001] The present invention relates to the field of optical communication technology, and in particular to a method, device and system for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module. Background Art

[0002] With the rapid development of the optical communication industry, we have entered the 5G era, and the performance requirements for optical modules, which are important components of optical communication equipment, are getting higher and higher. Electromagnetic interference (EMI) is a very important indicator of optical modules. With the gradual improvement of the performance requirements for optical modules and the control of costs, it is not cost-effective to reduce the overall performance due to the mutual electromagnetic interference between optical modules. Therefore, the EMI indicator is becoming more and more important. EMI will be taken into consideration when designing the printed circuit board (PCB) in the hardware solution to reduce the radiation of the signal as much as possible. In addition, adding some absorbing materials inside when assembling the optical module is also an effective way to optimize EMI. However, if you want to ensure that the final optical module meets the electromagnetic compatibility indicators 100%, the above methods alone are not enough. Based on this, in mass production, by testing EMI and compensating the module parameters, ensuring that the EMI of the optical module at high and low temperatures is qualified is the fundamental solution to ultimately ensure that the module has good EMI performance.

[0003] The key point of EMI index is not to exceed the specified limit, so that it will not affect other modules. When EMI is qualified, the optical module also needs to have better sensitivity and extinction ratio, so that the comprehensive performance of the module is optimal, and it can adapt to various environments and ensure that the optical module can work normally. The power consumption of long-distance electro-absorption modulated laser (EML) optical module is greater than that of conventional direct modulated laser (DML) optical module, and EMI is also greater, so it is difficult to optimize it. Therefore, how to determine the parameter settings of long-distance optical modules and perform temperature compensation is the most important part of optimizing sensitivity, extinction ratio and EMI.

[0004] In view of this, how to overcome the defects of the existing technology, how to determine the parameter settings of the long-distance optical module and perform temperature compensation to optimize the sensitivity, extinction ratio and EMI, has become an important technical problem that the industry needs to solve urgently. Summary of the invention

[0005] In view of the defects or improvement needs in the prior art: how to determine the various parameter settings of the long-distance optical module and perform temperature compensation to optimize the sensitivity, extinction ratio and EMI. The present invention provides a method, device and system for optimizing the sensitivity, extinction ratio and EMI of the long-distance optical module, determining the various parameter settings of the long-distance optical module and performing temperature compensation, and optimizing the sensitivity and extinction ratio of the optical module to the optimal value at each temperature while ensuring that the EMI is qualified.

[0006] The present invention adopts the following technical solution:

[0007] In a first aspect, the present invention provides a method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, comprising:

[0008] The output sensitivity of the optical module is detected at different temperatures, and the voff voltage is compensated and adjusted according to the sensitivity deviation at different temperatures; after the voff voltage is compensated and adjusted, the bias current is compensated and adjusted according to the optical power deviation at different temperatures;

[0009] The output extinction ratio of the optical module is detected at different temperatures, and the Vmod voltage is compensated and adjusted according to the extinction ratio offset at different temperatures;

[0010] The EMI of the optical module is detected at different temperatures. If the EMI is unqualified, the Vmod voltage is compensated and adjusted. If the EMI is unqualified after multiple compensation adjustments of the Vmod voltage, the RX amplitude voltage and RX pre-emphasis voltage are compensated and adjusted to make the sensitivity, extinction ratio and EMI of the optical module qualified.

[0011] In some embodiments, it also includes: by statistically analyzing different sample data, obtaining the sensitivity, extinction ratio, and EMI change data of the optical module under different temperature conditions, and by fitting compensation parameters, obtaining the compensation curve when the setting values ​​of voff voltage, bias current, Vmod voltage, RX amplitude voltage, and RX pre-emphasis voltage change with the external temperature; when performing compensation adjustment, performing compensation adjustment according to the compensation curve.

[0012] In some embodiments, it also includes: dividing the sensitivity and extinction ratio indicators into three levels respectively. When the indicator requirements are qualified, the first level indicator requirement is the highest, the second level indicator requirement is in the middle, and the third level indicator requirement is the lowest; when performing compensation adjustment, compensation adjustment is performed in the priority order of the first level, the second level, and the third level.

[0013] In a second aspect, the present invention provides a device for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, which uses the method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module as described in the first aspect, including a temperature detection module, an index monitoring module and a compensation adjustment module; wherein,

[0014] The temperature detection module is used to detect the external working temperature of the optical module;

[0015] The indicator monitoring module is used to detect the sensitivity offset, optical power offset, extinction ratio offset and EMI offset of the optical module at different temperatures, and provide real-time feedback to the compensation adjustment module;

[0016] The compensation adjustment module samples the current to monitor the ambient temperature in real time, and calculates the voff voltage, bias current, Vmod voltage, RX amplitude voltage and RX pre-emphasis voltage in real time according to the temperature compensation curve, so as to respond to the parameter feedback of sensitivity, extinction ratio and EMI at different temperatures, and adjust the temperature compensation curve in real time; and divides the sensitivity and extinction ratio into three index levels, giving priority to satisfying the better index level.

[0017] In some embodiments, the indicator monitoring module includes a sensitivity monitoring module, an optical power monitoring module, an extinction ratio monitoring module and an EMI monitoring module, and the compensation adjustment module includes a voff voltage adjustment module, a bias current adjustment module, a Vmod voltage adjustment module, an RX amplitude voltage adjustment module and an RX pre-emphasis voltage adjustment module; wherein the sensitivity monitoring module is used to detect the sensitivity offset of the optical module at different temperatures, and feed back to the voff voltage adjustment module to adjust the voff voltage; the optical power monitoring module is used to detect the optical power offset of the optical module at different temperatures, and feed back to the bias current adjustment module to adjust the bias current; the extinction ratio monitoring module is used to detect the extinction ratio offset of the optical module at different temperatures, and feed back to the Vmod voltage adjustment module to adjust the Vmod voltage; the EMI monitoring module is used to detect the EMI offset of the optical module at different temperatures, and feed back to the Vmod voltage adjustment module to adjust the Vmod voltage. When adjusting the Vmod voltage fails to make the EMI qualified, the EMI offset is fed back to the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module to adjust the RX amplitude voltage and the RX pre-emphasis voltage.

[0018] In some embodiments, after the temperature detection module detects the temperature, the sensitivity monitoring module is called to work;

[0019] The sensitivity monitoring module determines whether the sensitivity meets a certain index. If not, the voff voltage is adjusted by the voff voltage adjustment module to make the sensitivity meet the index. If it is satisfied, the optical power monitoring module is called to work; the optical power monitoring module determines whether the optical power is qualified. If it is not qualified, the bias current is adjusted by the bias current adjustment module to make the optical power qualified. If it is qualified, the extinction ratio monitoring module is called to work;

[0020] The extinction ratio monitoring module determines whether the extinction ratio meets a certain index. If not, the Vmod voltage adjustment module adjusts the Vmod voltage so that the extinction ratio meets the index. If it does, the EMI monitoring module is called to work.

[0021] The EMI monitoring module determines whether the EMI is qualified. If qualified, the adjustment is completed and the optical module test is determined to be qualified; if unqualified, the Vmod voltage is adjusted through the Vmod voltage adjustment module, and the number of adjustments of the Vmod voltage is accumulated to select the index gear that the extinction ratio needs to meet according to the number of adjustments of the Vmod voltage; if the EMI is still unqualified after the Vmod voltage is adjusted multiple times, the RX amplitude voltage and the RX pre-emphasis voltage are adjusted through the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module, and the number of adjustments of the Vmod voltage is cleared, and the number of adjustments of the RX amplitude voltage and the RX pre-emphasis voltage is accumulated to select the index gear that the sensitivity needs to meet according to the number of adjustments of the RX amplitude voltage and the RX pre-emphasis voltage.

[0022] In some embodiments, the sensitivity monitoring module preferentially determines whether the sensitivity meets the first-level indicator; when the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module are working, and the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are not greater than the first preset value, the sensitivity monitoring module is adjusted to determine whether the sensitivity meets the second-level indicator; when the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are greater than the first preset value and not greater than the second preset value, the sensitivity monitoring module is adjusted to determine whether the sensitivity meets the third-level indicator; when the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are greater than the second preset value, the adjustment is completed, and it is determined that the optical module test is unqualified; wherein the first preset value is less than the second preset value.

[0023] In some embodiments, when the EMI monitoring module and the Vmod voltage adjustment module are working, and the number of adjustments of the Vmod voltage is not greater than the third preset value, the extinction ratio monitoring module preferentially determines whether the extinction ratio meets the first-level indicator; when the number of adjustments of the Vmod voltage is greater than the third preset value and not greater than the fourth preset value, the extinction ratio monitoring module is adjusted to determine whether the extinction ratio meets the second-level indicator; when the number of adjustments of the Vmod voltage is greater than the fourth preset value and not greater than the fifth preset value, the extinction ratio monitoring module is adjusted to determine whether the extinction ratio meets the third-level indicator; when the number of adjustments of the Vmod voltage is greater than the fifth preset value, the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module are called to work; wherein, the third preset value is less than the fourth preset value and less than the fifth preset value.

[0024] In a third aspect, the present invention provides a system for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, applying the method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module as described in the first aspect, including an EMI test receiving antenna and an EMI test tooling equipment, wherein the EMI test receiving antenna is connected to a spectrum analyzer, and the EMI test tooling equipment is provided with an optical module to be tested, the TX end of the optical module to be tested is connected to a first splitter, one branch of the first splitter is connected to an oscilloscope, the oscilloscope is connected to a bit error meter, another branch of the first splitter is connected to an attenuator and then connected to the RX end of a light source, the RX end of the optical module to be tested is connected to a second splitter, one branch of the second splitter is connected to a power meter, another branch of the second splitter is connected to an attenuator and then connected to the TX end of the light source, the light source is arranged on a test board, the test board is connected to the bit error meter, and the test board is connected to a DC regulated power supply.

[0025] In some embodiments, the height of the EMI test receiving antenna is set to 0.9-1.1 m, and the rotation angle is set to 0-180°.

[0026] Compared with the prior art, the present invention provides a method, device and system for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, which has the following beneficial effects:

[0027] (1) According to the external ambient temperature, the register values ​​of the voff voltage, bias current, Vmod voltage, RX amplitude voltage, and RX pre-emphasis voltage are adjusted in real time through the compensation curve to obtain the best sensitivity, extinction ratio, and EMI while ensuring EMI compliance, significantly improving the stability of the optical module in the entire temperature range.

[0028] (2) The parameter fitting curves obtained from small-batch testing can be used for subsequent mass production of optical modules, so that EMI testing is not required during mass production. This effectively solves the problem of manually and complexly debugging different modules at different temperature points due to differences between different modules during mass production of optical modules, effectively saving time.

[0029] (3) Both the sensitivity index and the extinction ratio index have three levels, which can not only ensure that the performance of most modules is adjusted to the optimal level, but also ensure the module yield and save costs.

[0030] (4) EMI testing takes a long time. By adding a splitter to build a new test station, EMI testing and performance testing can be performed simultaneously, which greatly saves the testing time for collecting parameters in small-batch preliminary tests.

[0031] Figure Description

[0032] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the figures required for use in the embodiments of the present invention. Obviously, the figures described below are only some embodiments of the present invention, and for those skilled in the art, other figures can be obtained based on these figures without creative work.

[0033] Figure 1 A flow chart of a method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module provided in Embodiment 1 of the present invention;

[0034] Figure 2 A schematic diagram of a specific method for adjusting the sensitivity, extinction ratio and EMI of an optical module provided in Embodiment 2 of the present invention;

[0035] Figure 3 A schematic diagram showing the variation of the Voff voltage compensation curve with the external temperature provided in Example 2 of the present invention;

[0036] Figure 4 A schematic diagram showing the variation of the bias current compensation curve with the external temperature provided in Example 2 of the present invention;

[0037] Figure 5 A schematic diagram showing the variation of the Vmod voltage compensation curve with the external temperature provided in Example 2 of the present invention;

[0038] Figure 6 A schematic diagram showing the variation of the RX amplitude voltage compensation curve with the external temperature provided in Embodiment 2 of the present invention;

[0039] Figure 7 A schematic diagram showing the variation of the RX pre-emphasis voltage compensation curve with the external temperature provided in Embodiment 2 of the present invention;

[0040] Figure 8 A test bench connection diagram of a system for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module provided in Example 3 of the present invention;

[0041] Fig. 9 A schematic diagram of the structure of a storage device provided in Example 4 of the present invention. DETAILED DESCRIPTION

[0042] The present invention is described in detail below in conjunction with specific embodiments. The following embodiments will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that, for those of ordinary skill in the art, without departing from the concept of the present invention, several variations and improvements can also be made. These all belong to the protection scope of the present invention. It should be noted that, if there is no conflict, the various features in the embodiments of the present invention can be combined with each other, all within the protection scope of this application. In addition, although the functional module division may be performed in the device schematic diagram, and the logical order may be shown in the flow chart, in some cases, it may be different from the module division in the device, or the steps shown or described in the order in the flow chart may be performed.

[0043] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used in this specification and in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. In addition, the technical features involved in each embodiment of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0044] Unless the context requires otherwise, throughout the specification and claims, the term "including" is to be interpreted as open inclusion, that is, "including, but not limited to". In the description of the specification, the terms "one embodiment", "some embodiments", "exemplary embodiments", "examples", "specific examples" or "some examples" and the like are intended to indicate that specific features, structures, materials or characteristics associated with the embodiment or example are included in at least one embodiment or example of the present disclosure. The schematic representation of the above terms does not necessarily refer to the same embodiment or example. In addition, the specific features, structures, materials or characteristics may be included in any one or more embodiments or examples in any appropriate manner, that is, although they may be carried in the embodiments or examples of the above terms due to reasons such as the order and position of appearance, it is not limited to that they can be carried in combination by one embodiment or example.

[0045] It should be noted that, since the two indicators of sensitivity and extinction ratio are contradictory to a certain extent with EMI, the larger the Vmod, the better the extinction ratio, but the worse the EMI will be; when the RX amplitude and RX pre-emphasis are adjusted to the optimal sensitivity, the EMI is poor, and the EMI will become better after reducing the RX amplitude and increasing the RX pre-emphasis, but the sensitivity will become worse; the method and device of the present embodiment monitor the sensitivity, extinction ratio and EMI under normal temperature, high temperature and low temperature conditions, and the register values ​​of the Voff voltage, Vmod voltage, bias current, RX amplitude voltage and RX pre-emphasis voltage are changed in real time by fitting the temperature compensation curve to optimize the sensitivity and extinction ratio at the same time when EMI is qualified. Through the construction of a new system (test bench), EMC test and performance test are carried out simultaneously, which greatly saves test time. Through this test method, small batch tests are carried out to obtain the fitting curves of the parameters of the optical module, which are used for subsequent batch production, so that EMI can be not measured during batch production, and EMI can also be guaranteed to be qualified, and the sensitivity and extinction ratio are adjusted to the optimal value.

[0046] In order to make the purpose, technical scheme and advantages of the present application clearer, the present application is further described in detail below in conjunction with the figures and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application. The present invention is described in detail below with reference to the figures and embodiments.

[0047] Embodiment 1:

[0048] like Figure 1 As shown, an embodiment of the present invention provides a method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, and the method includes the following steps.

[0049] Step 101: Detect the output sensitivity of the optical module at different temperatures, and compensate and adjust the voff voltage according to the sensitivity offset at different temperatures; after compensating and adjusting the voff voltage, compensate and adjust the bias current according to the optical power offset at different temperatures.

[0050] Step 102: Detect the output extinction ratio of the optical module at different temperatures, and compensate and adjust the Vmod voltage according to the extinction ratio offset at different temperatures.

[0051] Step 103: Detect the EMI of the optical module at different temperatures. If the EMI is unqualified, compensate and adjust the Vmod voltage. If the EMI is unqualified after multiple compensation and adjustment of the Vmod voltage, compensate and adjust the RX amplitude voltage and RX pre-emphasis voltage to make the sensitivity, extinction ratio and EMI of the optical module qualified.

[0052] In some embodiments, it also includes: by statistically analyzing different sample data, obtaining the sensitivity, extinction ratio, and EMI change data of the optical module under different temperature conditions, and by fitting compensation parameters, obtaining the compensation curve when the setting values ​​of voff voltage, bias current, Vmod voltage, RX amplitude voltage, and RX pre-emphasis voltage change with the external temperature; when performing compensation adjustment, performing compensation adjustment according to the compensation curve.

[0053] In some embodiments, it also includes: dividing the sensitivity and extinction ratio indicators into three levels respectively. When the indicator requirements are qualified, the first level indicator requirement is the highest, the second level indicator requirement is in the middle, and the third level indicator requirement is the lowest; when performing compensation adjustment, compensation adjustment is performed in the priority order of the first level, the second level, and the third level.

[0054] It should be noted that since the reverse bias voltage (Voff) is a key parameter that affects the chirp and dispersion of the EML laser, the Voff value has a direct impact on the laser output optical power, chirp, extinction ratio (ER), dispersion (DP), output optical eye diagram margin (MM), bias current, etc., and the extinction ratio, dispersion, output optical eye diagram margin, and bias current are necessary indicators for evaluating the quality of EML lasers and transmitter optical subassemblies (TOSAs), so whether the Voff value is reasonable directly affects the quality of TOSAs. In addition, some of the terms in this embodiment are explained as follows: modulation voltage (Vmod); receiving end swing amplitude (RX swing amplitude), hereinafter referred to as RX amplitude; receiving end pre-emphasis (RX pre-emphasis), hereinafter referred to as RX pre-emphasis.

[0055] In some embodiments, the output sensitivity of the optical module is detected at different temperatures (e.g., normal temperature, high temperature, and low temperature). When the sensitivity deteriorates, the module will compensate the voff voltage according to the sensitivity offset at normal temperature, high temperature, and low temperature, so as to stabilize the sensitivity at a better level; after the compensation and adjustment of the voff voltage, the optical power will also change. At this time, the module will compensate the bias current according to the optical power offset at normal temperature, high temperature, and low temperature, so as to ensure the stability of the output optical power. Then, the output extinction ratio of the optical module is detected at normal temperature, high temperature, and low temperature. As the temperature changes, the extinction ratio will change. The module will compensate the Vmod voltage according to the extinction ratio offset at normal temperature, high temperature, and low temperature, so as to ensure that the extinction ratio is stable at a better level. Then, the EMI of the optical module is detected at room temperature, high temperature and low temperature. As the temperature changes, the EMI will change, and after adjusting the Vmod voltage, the EMI will also change. At this time, the module will process according to the detection results. If the EMI is qualified, no processing will be done. If the EMI is unqualified, the Vmod, RX amplitude, and RX pre-emphasis adjustment steps will be entered to adjust the optical module to ensure that the module EMI is qualified. Each compensation curve can be divided into two sections: from room temperature to high temperature and from room temperature to low temperature, and each section is a straight line.

[0056] It should also be noted that since adjusting the voff voltage will only affect the sensitivity, extinction ratio and optical power, but has no effect on EMI, the voff voltage should be compensated first; modifying the bias current mainly affects the optical power and extinction ratio of the module, but has no effect on the module sensitivity and EMI, so the bias current should be compensated in the next step; and modifying the Vmod voltage mainly affects the extinction ratio and EMI, but has little effect on the sensitivity and optical power, so Vmod should be compensated in the next step; modifying the RX amplitude and RX pre-emphasis mainly affects EMI, has a certain impact on sensitivity, and will make the sensitivity worse, but has no effect on optical power and extinction ratio. Therefore, only when the EMI test fails in the final test, the RX amplitude and RX pre-emphasis will be compensated to allow the module to have better sensitivity when the EMI is qualified.

[0057] In summary, this embodiment proposes a method for optimizing the sensitivity, extinction ratio, and EMI of a long-distance optical module, which has the following advantages:

[0058] (1) According to the external ambient temperature, the register values ​​of the voff voltage, bias current, Vmod voltage, RX amplitude voltage, and RX pre-emphasis voltage are adjusted in real time through the compensation curve to obtain the best sensitivity, extinction ratio, and EMI while ensuring EMI compliance, significantly improving the stability of the optical module in the entire temperature range.

[0059] (2) The parameter fitting curves obtained from small-batch testing can be used for subsequent mass production of optical modules, so that EMI testing is not required during mass production. This effectively solves the problem of manually and complexly debugging different modules at different temperature points due to differences between different modules during mass production of optical modules, effectively saving time.

[0060] (3) Both the sensitivity index and the extinction ratio index have three levels, which can not only ensure that the performance of most modules is adjusted to the optimal level, but also ensure the module yield and save costs.

[0061] Embodiment 2:

[0062] On the basis of Example 1, this Example 2 provides a device for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, including a temperature detection module, an index monitoring module and a compensation adjustment module; wherein the temperature detection module is used to detect the external working temperature of the optical module; the index monitoring module is used to detect the sensitivity offset, optical power offset, extinction ratio offset and EMI offset of the optical module at different temperatures, and provide real-time feedback to the compensation adjustment module; the compensation adjustment module samples the current to monitor the ambient temperature in real time, and calculates the voff voltage, bias current, Vmod voltage, RX amplitude voltage and RX pre-emphasis voltage in real time according to the temperature compensation curve, in order to respond to the parameter feedback of sensitivity, extinction ratio and EMI at different temperatures, and adjust the temperature compensation curve in real time; and divides the sensitivity and extinction ratio into three index gears, giving priority to satisfying the better index gear.

[0063] Specifically, the indicator monitoring module includes a sensitivity monitoring module, an optical power monitoring module, an extinction ratio monitoring module and an EMI monitoring module, and the compensation adjustment module includes a voff voltage adjustment module, a bias current adjustment module, a Vmod voltage adjustment module, an RX amplitude voltage adjustment module and an RX pre-emphasis voltage adjustment module; wherein the sensitivity monitoring module is used to detect the sensitivity offset of the optical module at different temperatures, and feed back to the voff voltage adjustment module to adjust the voff voltage; the optical power monitoring module is used to detect the optical power offset of the optical module at different temperatures, and feed back to the bias current adjustment module to adjust the bias current; the extinction ratio monitoring module is used to detect the extinction ratio offset of the optical module at different temperatures, and feed back to the Vmod voltage adjustment module to adjust the Vmod voltage; the EMI monitoring module is used to detect the EMI offset of the optical module at different temperatures, and feed back to the Vmod voltage adjustment module to adjust the Vmod voltage, and when adjusting the Vmod voltage cannot make the EMI qualified, the EMI offset is fed back to the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module to adjust the RX amplitude voltage and the RX pre-emphasis voltage. The above-mentioned different temperatures can include normal temperature, high temperature and low temperature.

[0064] It should be noted that this embodiment first determines the setting values ​​of voff voltage, bias current, Vmod voltage, RX amplitude voltage and RX pre-emphasis voltage when the universal optical module of the same type achieves stable sensitivity, extinction ratio and EMI output. After a large number of experimental tests, it is found that the change of sensitivity, extinction ratio and EMI with temperature is unidirectional and linear. For example, when the module temperature is higher than 25°C, the sensitivity will gradually increase with the increase of temperature, and when it is lower than 25°C, the sensitivity will gradually decrease with the decrease of temperature. Based on this, the universal data of the sensitivity, extinction ratio and EMI of the optical module under different temperature conditions are obtained by statistically analyzing the data of different samples, and by fitting the compensation parameters, the compensation curves of the setting values ​​of voff voltage, bias current, Vmod voltage, RX amplitude voltage and RX pre-emphasis voltage when the external temperature changes are obtained.

[0065] Combine the following Figure 2 , Figure 3 , Figure 4 , Figure 5 , Figure 6 and Figure 7 The specific implementation of this embodiment is described so that those skilled in the art can better understand the present invention. Figure 2 This is a schematic diagram of the specific adjustment method for the sensitivity, extinction ratio, and EMI of the optical module. During adjustment, the sensitivity and extinction ratio indicators are divided into three gears. The first gear has the highest indicator requirement, and the third gear has the lowest indicator requirement, but it also meets the indicator requirements of the module. In order of priority, the indicators are as follows:

[0066] 1. The sensitivity meets the first-level index, the extinction ratio meets the first-level index, and the EMI is qualified;

[0067] 2. The sensitivity meets the first-level index, the extinction ratio meets the second-level index, and the EMI is qualified;

[0068] 3. The sensitivity meets the first-level index, the extinction ratio meets the third-level index, and the EMI is qualified;

[0069] 4. The sensitivity meets the second-level index, the extinction ratio meets the first-level index, and the EMI is qualified;

[0070] 5. The sensitivity meets the second-level index, the extinction ratio meets the second-level index, and the EMI is qualified;

[0071] 6. The sensitivity meets the second-level index, the extinction ratio meets the third-level index, and the EMI is qualified;

[0072] 7. The sensitivity meets the third-level index, the extinction ratio meets the first-level index, and the EMI is qualified;

[0073] 8. The sensitivity meets the third-level index, the extinction ratio meets the second-level index, and the EMI is qualified;

[0074] 9. The sensitivity meets the third-level index, the extinction ratio meets the third-level index, and the EMI is qualified;

[0075] 10. Unable to adjust to pass, this optical module fails the test.

[0076] refer to Figure 2 After the temperature detection module detects the temperature, the sensitivity monitoring module is called to work; the sensitivity monitoring module determines whether the sensitivity meets a certain index. If not, the voff voltage is adjusted through the voff voltage adjustment module to make the sensitivity meet the index. If it is satisfied, the optical power monitoring module is called to work; the optical power monitoring module determines whether the optical power is qualified. If it is not qualified, the bias current is adjusted through the bias current adjustment module to make the optical power qualified. If it is qualified, the extinction ratio monitoring module is called to work; the extinction ratio monitoring module determines whether the extinction ratio meets a certain index. If not, the Vmod voltage is adjusted through the Vmod voltage adjustment module to make the extinction ratio meet the index. If it is satisfied, the EMI monitoring module is called to work. The EMI monitoring module determines whether the EMI is qualified. If qualified, the adjustment is completed and the optical module test is determined to be qualified. If unqualified, the Vmod voltage is adjusted by the Vmod voltage adjustment module, and the number of adjustments of the Vmod voltage is accumulated to select the index gear that the extinction ratio needs to meet according to the number of adjustments of the Vmod voltage. If the EMI is still unqualified after the Vmod voltage is adjusted multiple times, the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module are used to adjust the RX amplitude voltage and the RX pre-emphasis voltage, and the number of adjustments of the Vmod voltage is cleared, and the number of adjustments of the RX amplitude voltage and the RX pre-emphasis voltage is accumulated to select the index gear that the sensitivity needs to meet according to the number of adjustments of the RX amplitude voltage and the RX pre-emphasis voltage.

[0077] Specifically, the sensitivity monitoring module preferentially determines whether the sensitivity meets the first-level index; when the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module are working, and the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are not greater than the first preset value, the sensitivity monitoring module is adjusted to determine whether the sensitivity meets the second-level index; when the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are greater than the first preset value and not greater than the second preset value, the sensitivity monitoring module is adjusted to determine whether the sensitivity meets the third-level index; when the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are greater than the second preset value, the adjustment is completed, and it is determined that the optical module test is unqualified; wherein, the first preset value is less than the second preset value, for example, the first preset value is 1, and the second preset value is 2.

[0078] Specifically, when the EMI monitoring module and the Vmod voltage adjustment module are working, and the number of adjustments of the Vmod voltage is not greater than the third preset value, the extinction ratio monitoring module preferentially determines whether the extinction ratio meets the first-level index; when the number of adjustments of the Vmod voltage is greater than the third preset value and not greater than the fourth preset value, the extinction ratio monitoring module is adjusted to determine whether the extinction ratio meets the second-level index; when the number of adjustments of the Vmod voltage is greater than the fourth preset value and not greater than the fifth preset value, the extinction ratio monitoring module is adjusted to determine whether the extinction ratio meets the third-level index; when the number of adjustments of the Vmod voltage is greater than the fifth preset value, the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module are called to work; wherein, the third preset value is less than the fourth preset value and less than the fifth preset value, for example, the third preset value is 2, the fourth preset value is 4, and the fifth preset value is 6.

[0079] refer to Figure 3 This is a schematic diagram of the voff voltage compensation curve changing with the external temperature. Figure 4 This is a schematic diagram of the bias current compensation curve changing with the external temperature. Figure 5 This is a schematic diagram of the Vmod voltage compensation curve changing with the external temperature. Figure 6 This is a schematic diagram of the RX amplitude voltage compensation curve changing with the external temperature. Figure 7 It is a schematic diagram of the variation of the RX pre-emphasis voltage compensation curve with the external temperature. It should be noted that in the following description, when the detailed description of known functions and designs may dilute the main content of the present invention, these descriptions will be ignored.

[0080] Before the implementation of the present invention, it is necessary to first determine the relationship curve between the sensitivity, extinction ratio, and EMI of the optical module and the change of the external temperature when the same type of EML optical module is in normal output. After a large number of experimental tests, it is found that the sensitivity, extinction ratio, and EMI of the optical module change with the external temperature in a univariate function relationship, and the parameters that can adjust these three indicators are fixed values ​​under normal circumstances. In order to ensure that the sensitivity, extinction ratio, and EMI of the optical module are more stable, the setting values ​​of the voff voltage, bias current, Vmod voltage, RX amplitude voltage, and RX pre-emphasis voltage change with the external temperature and are divided into two sections with the normal temperature of 25°C as the dividing point. The initial situation is as follows Figure 3 AF segment in Figure 4 IM segment in Figure 5 The PT segment in Figure 6 The P2T2 segment in Figure 7 As shown in the P3T3 section of the test module, it is a fixed value. Then, the compensation curves of voff voltage, bias current, Vmod voltage, RX amplitude voltage and RX pre-emphasis voltage as the ambient temperature changes are fitted through the test results of the detection module and the parameter debugging results, and are fitted into a straight line form, as shown in Figure 3 , Figure 4 , Figure 5, Figure 6 , Figure 7 As shown by the dotted line in the middle, the compensation curve can be stored in the register, and then the microcontroller calls the compensation curve to work.

[0081] According to the feedback results, when the module's sensitivity, extinction ratio, and EMI offset at three temperature points, normal temperature, high temperature, and low temperature, exceed the normal range, the MCU will correct the compensation curve based on the feedback results, as follows.

[0082] When the optical module is at room temperature (usually 25°C), the sensitivity, extinction ratio, and EMI are qualified by default. At this time, the voff voltage, bias current, Vmod voltage, RX amplitude voltage, and RX pre-emphasis voltage are the initial values, that is, Figure 3 Point D in Figure 4 The K point in Figure 5 Point R in Figure 6 Point R1 in Figure 7 The R2 point in .

[0083] Correct the high temperature compensation curve. At high temperature (usually 85°C), the voff voltage real-time adjustment module makes a judgment based on the sensitivity feedback result of the bit error meter test. If the sensitivity is qualified, it is used Figure 3 If the DF segment in the test fails, the voff voltage is adjusted and compensated according to the sensitivity until the sensitivity meets the requirements, and the voff voltage curve after compensation of the DE segment or DG segment is formed by fitting; the bias current real-time adjustment module makes a judgment based on the optical power feedback result tested by the power meter. If the optical power is qualified, it is adopted Figure 4 If the KM segment in the test fails, the bias current is adjusted and compensated according to the optical power until the optical power meets the requirements, and the bias current curve after compensation of the KL segment or KN segment is formed by fitting. The Vmod voltage real-time adjustment module makes a judgment based on the extinction ratio feedback result of the oscilloscope test. If the extinction ratio is qualified, it is adopted Figure 5 If the RT segment in the test fails, the Vmod voltage is adjusted and compensated according to the extinction ratio until the extinction ratio meets the requirements, and the RS segment or RU segment compensated Vmod voltage curve is fitted; then the EMI test module is entered. If it passes, the module test is completed. If it fails, the Vmod voltage return adjustment step is entered to adjust the Vmod voltage until the EMI meets the requirements, and the RS1 segment or RU1 segment compensated curve is fitted. If the EMI is still unqualified after 6 adjustments, the RX amplitude voltage and RX pre-emphasis voltage adjustment compensation are entered. The two values ​​are corrected and compensated synchronously according to experience, refer to Figure 6 and Figure 7, after compensation, the RX amplitude voltage curve of the R2S2 segment or R2U2 segment and the RX amplitude voltage curve of the R3S3 segment or R3U3 segment are fitted. After adjustment, the module sensitivity, extinction ratio and EMI are tested to see if they are qualified. If they are qualified, the module test is completed. If they are not qualified, the module test is continued until the module test is qualified or the number of times reaches the upper limit to determine that the module test is unqualified. At this point, the optical module has completed the redrawing of the temperature compensation curves of the three parameters in the high temperature segment and stored them in the register.

[0084] It should be noted that the compensated curves fitted in this embodiment are symmetrical upper and lower segments based on fixed values. This is because although the influence of various parameters on the index is linearly related to the temperature, there are differences in the corresponding different types of optical modules, and the slopes are positive and negative, that is, some modules have better performance when the high temperature increases this parameter, and some modules have better performance when the high temperature decreases this parameter. However, for a specified model, the positive and negative slopes are determined, and need to be confirmed by testing the curves in small batches.

[0085] Correct the low temperature compensation curve. At low temperatures (usually -40°C), the voff voltage real-time adjustment module makes a judgment based on the sensitivity feedback results of the bit error meter test. If the sensitivity is qualified, it is used Figure 3 If the DA segment in the test fails, the voff voltage is adjusted and compensated according to the sensitivity until the sensitivity meets the requirements, and the voff voltage curve after DB segment or DC segment compensation is formed by fitting; the bias current real-time adjustment module makes a judgment based on the optical power feedback result tested by the power meter. If the optical power is qualified, it is adopted Figure 4 If the KI segment in the test fails, the bias current is adjusted and compensated according to the optical power until the optical power meets the requirements, and the bias current curve after compensation of the KH segment or KJ segment is formed. The Vmod voltage real-time adjustment module makes a judgment based on the extinction ratio feedback result of the oscilloscope test. If the extinction ratio is qualified, it is adopted. Figure 5 If the RP segment in the test fails, the Vmod voltage is adjusted and compensated according to the extinction ratio until the extinction ratio meets the requirements, and the compensated Vmod voltage curve of the RO segment or RQ segment is formed by fitting; then the EMI test module is entered. If it passes, the module test is completed. If it fails, the Vmod voltage return adjustment step is entered to adjust the Vmod voltage until the EMI meets the requirements, and the compensated curve of the RO segment or RQ1 segment is formed by fitting. If the EMI is still unqualified after 6 adjustments, the RX amplitude voltage and RX pre-emphasis voltage adjustment compensation are entered. The two values ​​are corrected and compensated synchronously according to experience, refer to Figure 6 and Figure 7, after compensation, the RX amplitude voltage curve of the R2O2 segment or R2Q2 segment and the RX amplitude voltage curve of the R3O3 segment or R3Q3 segment are fitted. After adjustment, the module sensitivity, extinction ratio and EMI are tested to see if they are qualified. If they are qualified, the module test is completed. If they are not qualified, the module test is continued until the module test is qualified or the number of times reaches the upper limit to determine that the module test is unqualified. At this point, the optical module has completed the redrawing of the temperature compensation curves of the three parameters in the low temperature segment and stored them in the register.

[0086] In this way, the module can obtain stable sensitivity, extinction ratio, and EMI by calling the compensation curve refitted by the single-chip microcomputer. In practical applications, this method solves the sensitivity, extinction ratio, and EMI offset problems of most modules within the full temperature working range, with obvious effects and advantages. In addition, the compensation curves of various parameters can be obtained through small batch tests, so that EMI testing can be omitted during mass production and the module EMI can be guaranteed to be qualified, and the sensitivity and extinction ratio are adjusted to the optimal state.

[0087] In summary, this embodiment proposes a device for optimizing the sensitivity, extinction ratio, and EMI of a long-distance optical module, which has the following advantages:

[0088] (1) According to the external ambient temperature, the register values ​​of the voff voltage, bias current, Vmod voltage, RX amplitude voltage, and RX pre-emphasis voltage are adjusted in real time through the compensation curve to obtain the best sensitivity, extinction ratio, and EMI while ensuring EMI compliance, significantly improving the stability of the optical module in the entire temperature range.

[0089] (2) The parameter fitting curves obtained from small-batch testing can be used for subsequent mass production of optical modules, so that EMI testing is not required during mass production. This effectively solves the problem of manually and complexly debugging different modules at different temperature points due to differences between different modules during mass production of optical modules, effectively saving time.

[0090] (3) Both the sensitivity index and the extinction ratio index have three levels, which can not only ensure that the performance of most modules is adjusted to the optimal level, but also ensure the module yield and save costs.

[0091] Example 3

[0092] On the basis of the above-mentioned embodiments, this embodiment 3 further provides a system for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module. The system provides a connection method for test stations to improve test efficiency.

[0093] refer to Figure 8The system of this embodiment includes an EMI test receiving antenna and an EMI test fixture (internal electrical self-loop), the EMI test receiving antenna is connected to a spectrum analyzer (testing EMI radiation data), the EMI test fixture is provided with an optical module to be tested, the TX end of the optical module to be tested is connected to a first splitter, one branch of the first splitter is connected to an oscilloscope (testing TX optical power and eye diagram), the oscilloscope is connected to a bit error meter, another branch of the first splitter is connected to an attenuator and then connected to the RX end of a light source, the RX end of the optical module to be tested is connected to a second splitter, one branch of the second splitter is connected to a power meter (testing RX optical power), another branch of the second splitter is connected to an attenuator and then connected to the TX end of the light source, the light source is arranged on a test board, the test board is connected to the bit error meter, and the test board is connected to a DC regulated power supply. Preferably, the height of the EMI test receiving antenna is set to 0.9-1.1m. Generally speaking, the optical module is inserted into the EMI test fixture, and the EMI test fixture is placed on a test round table, which can rotate, and the rotation angle of the test round table is set to 0-180°. The antenna is three meters outside the round table, and the position and angle are fixed, but the height can be adjusted to test the external radiation value of the optical module to be tested.

[0094] Specifically, the EMI test receiving antenna, EMI test fixture equipment and the optical module to be tested are set in the EMI test darkroom (enclosed); other components are set outside the EMI test darkroom. The distance between the EMI test receiving antenna and the EMI test fixture equipment is 3m. The EMI test receiving antenna is electrically connected to the spectrum analyzer, the bit error meter is electrically connected to the oscilloscope, the test board is electrically connected to the bit error meter, the test board is electrically connected to the DC regulated power supply, and the connections between other components are optical connections.

[0095] The TX end of the optical module to be tested is connected to a 50:50 1-to-2 splitter, one branch of the splitter is connected to the optical port IN end of the oscilloscope, and the Trigger end of the oscilloscope is connected to the Trigger end of the bit error tester; the other branch of the splitter is connected to the IN end of an attenuator, and the OUT end of the attenuator is connected to the RX end of the light source.

[0096] The RX end of the optical module to be tested is also connected to a 50:50 1-to-2 splitter, one branch of which is connected to the power meter; the other branch of the splitter is connected to the OUT end of an attenuator, and the IN end of the attenuator is connected to the TX end of the light source.

[0097] The TD+ end of the test board is connected to the OUT end of the bit error meter, the TD- end of the test board is connected to the OUT- end of the bit error meter, the RD+ end of the test board is connected to the IN end of the bit error meter, the RD- end of the test board is connected to the IN- end of the bit error meter, and the GND end of the test board is connected to the GND end of the DC regulated power supply. The DC regulated power supply supplies 3.3V voltage to the test board.

[0098] It should be noted that since the EMI test of one module takes about 12 to 15 minutes, the time is relatively long. Through a large number of tests, it is found that the EMI test value of the optical port of the optical module is the largest when the antenna height is 1m, so only 1m can be tested, and the EMI value is the largest when the rotation angle is 0 to 180°, so only half a circle of 0 to 180° can be tested, so the EMI test time of a single optical module can be reduced to 3 minutes; and the performance test of the module (eye diagram, optical power, sensitivity, alarm, reporting accuracy, power consumption, etc.), the test time of one optical module is 2 to 3 minutes. If EMI and performance are tested separately, the test time will be longer, affecting efficiency and also bringing higher test costs; and according to Figure 8 The test bench connection diagram allows the module EMI and performance to be tested simultaneously. All tests can be completed in 3 minutes, greatly improving the test efficiency.

[0099] In summary, the present invention provides a system for optimizing the sensitivity, extinction ratio and EMI of long-distance optical modules. Based on the situation that the EMI test time is long, a splitter is added to build a new test station, so that EMI testing and performance testing can be carried out simultaneously, which greatly saves the test time for collecting parameters in small-batch preliminary tests.

[0100] It should also be noted that the corresponding relationship between each module in the aforementioned embodiment and the components in this embodiment is as follows. Temperature detection module: generally reads the software report of the optical module, and a spot thermometer can also be used to test the actual temperature value; sensitivity monitoring module: corresponding to the bit error meter; optical power monitoring module: corresponding to the power meter; extinction ratio monitoring module: corresponding to the oscilloscope; EMI monitoring module: corresponding to the spectrum analyzer; voff voltage adjustment module, bias current adjustment module, Vmod voltage adjustment module, RX amplitude voltage adjustment module and RX pre-emphasis voltage adjustment module: these all correspond to the optical module and are adjusted internally by the optical module.

[0101] Embodiment 4:

[0102] Based on the method for optimizing the sensitivity, extinction ratio and EMI of the long-distance optical module provided in the above embodiment 1, the present invention also provides a storage device that can be used to implement the above method and system, such as Fig. 9 , which is a schematic diagram of the device architecture of an embodiment of the present invention. The storage device of this embodiment includes one or more processors 21 and a memory 22. Fig. 9A processor 21 is taken as an example. The processor 21 and the memory 22 may be connected via a bus or other means. Fig. 9 The example of connecting through bus is taken in the following.

[0103] The memory 22, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer executable programs and modules, such as the method for optimizing the sensitivity, extinction ratio and EMI of the long-distance optical module in Example 1. The processor 21 executes various functional applications and data processing of the device for optimizing the sensitivity, extinction ratio and EMI of the long-distance optical module by running the non-volatile software programs, instructions and modules stored in the memory 22, that is, the method for optimizing the sensitivity, extinction ratio and EMI of the long-distance optical module in Example 1 is implemented.

[0104] The memory 22 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 22 may optionally include a memory remotely arranged relative to the processor 21, and these remote memories may be connected to the processor 21 via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0105] The program instructions / modules are stored in the memory 22. When executed by one or more processors 21, the method for optimizing the sensitivity, extinction ratio and EMI of the long-distance optical module in the above-mentioned embodiment 1 is executed. For example, the above-described Figure 1 The steps shown.

[0106] The above-mentioned product can execute the method provided in the embodiment of the present application, and has the functional modules and beneficial effects corresponding to the execution method. For technical details not fully described in this embodiment, please refer to the method provided in the embodiment of the present application.

[0107] It should be noted that the device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0108] Through the description of the above implementation methods, ordinary technicians in this field can clearly understand that each implementation method can be implemented by means of software plus a general hardware platform, and of course, it can also be implemented by hardware. Ordinary technicians in this field can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing related hardware through a computer program, and the program can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, the storage medium can be a disk, an optical disk, a read-only memory (ROM) or a random access memory (RAM), etc.

[0109] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them. Under the concept of the present invention, the technical features in the above embodiments or different embodiments may also be combined, the steps may be implemented in any order, and there are many other changes in different aspects of the present invention as described above, which are not provided in detail for the sake of simplicity. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, characterized in that: include: The output sensitivity of the optical module is detected at different temperatures, and the voff voltage is compensated and adjusted according to the sensitivity offset at different temperatures; After compensating and adjusting the voff voltage, the bias current is compensated and adjusted according to the optical power offset at different temperatures; The output extinction ratio of the optical module is detected at different temperatures, and the Vmod voltage is compensated and adjusted according to the extinction ratio offset at different temperatures; The EMI of the optical module is detected at different temperatures. If the EMI is unqualified, the Vmod voltage is compensated and adjusted. If the EMI is unqualified after multiple compensation adjustments of the Vmod voltage, the RX amplitude voltage and RX pre-emphasis voltage are compensated and adjusted to make the sensitivity, extinction ratio and EMI of the optical module qualified.

2. The method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module according to claim 1, characterized in that: Also includes: By statistically analyzing data from different samples, we obtain the sensitivity, extinction ratio, and EMI of the optical module under different temperature conditions. By fitting the compensation parameters, we obtain the compensation curves when the setting values ​​of the voff voltage, bias current, Vmod voltage, RX amplitude voltage, and RX pre-emphasis voltage change with the external temperature. When making compensation adjustments, we make compensation adjustments based on the compensation curves.

3. The method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module according to claim 1, characterized in that: Also includes: The sensitivity and extinction ratio indicators are divided into three levels respectively. When the indicator requirements are qualified, the first level indicator requirement is the highest, the second level indicator requirement is in the middle, and the third level indicator requirement is the lowest. When making compensation adjustments, compensation adjustments are made in the order of priority of the first level, the second level, and the third level.

4. A device for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, using the method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module as described in any one of claims 1 to 3, characterized in that: It includes a temperature detection module, an indicator monitoring module and a compensation adjustment module; among which, The temperature detection module is used to detect the external working temperature of the optical module; The indicator monitoring module is used to detect the sensitivity offset, optical power offset, extinction ratio offset and EMI offset of the optical module at different temperatures, and provide real-time feedback to the compensation adjustment module; The compensation adjustment module samples the current to monitor the ambient temperature in real time, and calculates the voff voltage, bias current, Vmod voltage, RX amplitude voltage and RX pre-emphasis voltage in real time according to the temperature compensation curve, so as to respond to the parameter feedback of sensitivity, extinction ratio and EMI at different temperatures, and adjust the temperature compensation curve in real time; and divides the sensitivity and extinction ratio into three index levels, giving priority to satisfying the better index level.

5. The device for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module according to claim 4, characterized in that: The indicator monitoring module includes a sensitivity monitoring module, an optical power monitoring module, an extinction ratio monitoring module and an EMI monitoring module, and the compensation adjustment module includes a voff voltage adjustment module, a bias current adjustment module, a Vmod voltage adjustment module, an RX amplitude voltage adjustment module and an RX pre-emphasis voltage adjustment module; wherein the sensitivity monitoring module is used to detect the sensitivity offset of the optical module at different temperatures, and feed back to the voff voltage adjustment module to adjust the voff voltage; the optical power monitoring module is used to detect the optical power offset of the optical module at different temperatures, and feed back to the bias current adjustment module to adjust the bias current; the extinction ratio monitoring module is used to detect the extinction ratio offset of the optical module at different temperatures, and feed back to the Vmod voltage adjustment module to adjust the Vmod voltage; the EMI monitoring module is used to detect the EMI offset of the optical module at different temperatures, and feed back to the Vmod voltage adjustment module to adjust the Vmod voltage. When adjusting the Vmod voltage fails to make the EMI qualified, the EMI offset is fed back to the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module to adjust the RX amplitude voltage and the RX pre-emphasis voltage.

6. The device for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module according to claim 5, characterized in that: After the temperature detection module detects the temperature, the sensitivity monitoring module is called to work; The sensitivity monitoring module determines whether the sensitivity meets a certain index. If not, the voff voltage is adjusted by the voff voltage adjustment module to make the sensitivity meet the index. If it is satisfied, the optical power monitoring module is called to work; the optical power monitoring module determines whether the optical power is qualified. If it is not qualified, the bias current is adjusted by the bias current adjustment module to make the optical power qualified. If it is qualified, the extinction ratio monitoring module is called to work; The extinction ratio monitoring module determines whether the extinction ratio meets a certain index. If not, the Vmod voltage adjustment module adjusts the Vmod voltage so that the extinction ratio meets the index. If it does, the EMI monitoring module is called to work. The EMI monitoring module determines whether the EMI is qualified. If qualified, the adjustment is completed and the optical module test is determined to be qualified; if unqualified, the Vmod voltage is adjusted through the Vmod voltage adjustment module, and the number of adjustments of the Vmod voltage is accumulated to select the index gear that the extinction ratio needs to meet according to the number of adjustments of the Vmod voltage; if the EMI is still unqualified after the Vmod voltage is adjusted multiple times, the RX amplitude voltage and the RX pre-emphasis voltage are adjusted through the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module, and the number of adjustments of the Vmod voltage is cleared, and the number of adjustments of the RX amplitude voltage and the RX pre-emphasis voltage is accumulated to select the index gear that the sensitivity needs to meet according to the number of adjustments of the RX amplitude voltage and the RX pre-emphasis voltage.

7. The device for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module according to claim 6, characterized in that: The sensitivity monitoring module preferentially determines whether the sensitivity meets the first-level index; when the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module are working, and the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are not greater than the first preset value, the sensitivity monitoring module is adjusted to determine whether the sensitivity meets the second-level index; when the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are greater than the first preset value and not greater than the second preset value, the sensitivity monitoring module is adjusted to determine whether the sensitivity meets the third-level index; when the adjustment times of the RX amplitude voltage and the RX pre-emphasis voltage are greater than the second preset value, the adjustment is completed, and it is determined that the optical module test is unqualified; wherein the first preset value is less than the second preset value.

8. The device for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module according to claim 6, characterized in that: When the EMI monitoring module and the Vmod voltage adjustment module are working, and the number of adjustments of the Vmod voltage is not greater than the third preset value, the extinction ratio monitoring module preferentially determines whether the extinction ratio meets the first-level index; when the number of adjustments of the Vmod voltage is greater than the third preset value and not greater than the fourth preset value, the extinction ratio monitoring module is adjusted to determine whether the extinction ratio meets the second-level index; when the number of adjustments of the Vmod voltage is greater than the fourth preset value and not greater than the fifth preset value, the extinction ratio monitoring module is adjusted to determine whether the extinction ratio meets the third-level index; when the number of adjustments of the Vmod voltage is greater than the fifth preset value, the RX amplitude voltage adjustment module and the RX pre-emphasis voltage adjustment module are called to work; wherein, the third preset value is less than the fourth preset value and less than the fifth preset value.

9. A system for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module, using the method for optimizing the sensitivity, extinction ratio and EMI of a long-distance optical module as described in any one of claims 1 to 3, characterized in that: It comprises an EMI test receiving antenna and an EMI test fixture, wherein the EMI test receiving antenna is connected to a spectrum analyzer, the EMI test fixture is provided with an optical module to be tested, the TX end of the optical module to be tested is connected to a first splitter, one branch of the first splitter is connected to an oscilloscope, the oscilloscope is connected to a bit error meter, another branch of the first splitter is connected to an attenuator and then to the RX end of a light source, the RX end of the optical module to be tested is connected to a second splitter, one branch of the second splitter is connected to a power meter, another branch of the second splitter is connected to an attenuator and then to the TX end of the light source, the light source is provided on a test board, the test board is connected to the bit error meter, and the test board is connected to a DC regulated power supply.

10. The system for optimizing sensitivity, extinction ratio and EMI of a long-distance optical module according to claim 9, characterized in that: The height of the EMI test receiving antenna is set to 0.9-1.1 m, and the rotation angle is set to 0-180°.

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