Telescope lens polishing detection system and method thereof

Abstract

The invention discloses a telescope lens polishing detection system and method, and belongs to the technical field of astronomical metrology, and the method comprises the following steps: placing a telescope lens on a polishing die holder, and adjusting the working state of a polishing mechanism to an initial polishing state; starting a polishing mechanism to polish the surface of the telescope lens, detecting the polishing condition of the telescope lens in real time through a polishing sensor, and generating corresponding polishing detection data; the polishing detection data are processed, whether the polishing effect of the telescope lens meets a preset standard or not is judged, if the polishing effect meets the preset standard, polishing is stopped, and if the polishing effect does not meet the preset standard, polishing control parameters in the polishing process are adjusted; and the telescope lens which stops polishing is cleaned and dried, and the polished telescope lens is obtained. According to the invention, the polishing process of the telescope lens can be monitored in real time and accurately controlled, and the lens polishing quality and the production efficiency are effectively improved.

Description

Technical Field

[0001] The invention relates to the technical field of astronomical measurement, in particular to a telescope lens polishing detection system and method thereof. Background Art

[0002] A telescope is an optical instrument that uses lenses or reflectors and other optical devices to observe distant objects. In order to ensure the observation accuracy and imaging quality of the telescope, its lenses need to be strictly polished and ground to achieve the required surface accuracy and quality. The polishing process removes tiny defects on the surface of the lens through mechanical and chemical methods, so that its surface achieves extremely high smoothness and geometric accuracy.

[0003] In the prior art, the traditional telescope lens polishing inspection method usually requires multiple disassembly and reinstallation of the lens during the polishing process, which not only increases the complexity of the operation, resulting in high time cost and low efficiency, but also may cause the lens to be damaged during the disassembly process, affecting its optical performance, thereby extending the production cycle and increasing production costs. At the same time, most of the existing inspection methods rely on independent inspection equipment and manual operation. The inspection accuracy is easily affected by human factors and equipment accuracy, and it is difficult to meet the needs of modern optical components for high-precision inspection. Traditional polishing inspection methods usually perform offline inspections after polishing is completed. It is impossible to provide real-time feedback on quality information during the polishing process, and it is difficult to adjust the polishing control parameters in a timely manner, thus affecting the polishing efficiency and quality.

[0004] Therefore, how to monitor and accurately control the telescope lens polishing process in real time and effectively improve the lens polishing quality and production efficiency has become a problem that needs to be solved urgently. Summary of the invention

[0005] In order to solve the above problems, the present invention proposes a telescope lens polishing detection system and method, which polishes the surface of the telescope lens through a polishing mechanism, and detects the polishing status in real time through a polishing sensor, processes the generated polishing detection data, and determines whether the polishing effect meets the preset standard. If the polishing effect meets the preset standard, polishing is stopped, otherwise the polishing control parameters in the polishing process are adjusted, and finally the telescope lens that has stopped polishing is cleaned and dried to obtain a polished telescope lens, so that the telescope lens polishing process can be monitored and accurately controlled in real time, effectively improving the lens polishing quality and production efficiency.

[0006] In order to achieve the above object, the present invention is implemented by the following technical solutions:

[0007] A telescope lens polishing detection system of the present invention comprises:

[0008] A polishing preparation module is used to place the telescope lens on the polishing die seat and adjust the working state of the polishing mechanism to the initial polishing state;

[0009] A start detection module is used to start the polishing mechanism to polish the surface of the telescope lens, and detect the polishing condition of the telescope lens in real time through a polishing sensor to generate corresponding polishing detection data;

[0010] A data processing module, used for processing the polishing detection data, judging whether the polishing effect of the telescope lens meets the preset standard, stopping the polishing if the polishing effect meets the preset standard, and adjusting the polishing control parameters in the polishing process if the polishing effect does not meet the preset standard;

[0011] The cleaning and drying module is used to clean and dry the telescope lens that has stopped polishing to obtain a polished telescope lens.

[0012] A further improvement of the present invention is that the polishing preparation module comprises:

[0013] A placement unit, used for placing the telescope lens on the polishing die seat and fixing the position of the telescope lens by a clamping device on the polishing die seat;

[0014] An adjustment unit, used for adjusting the working state of the polishing mechanism to an initial polishing state according to the material and polishing requirements of the telescope lens, wherein the initial polishing state includes an initial polishing speed and an initial polishing pressure;

[0015] The setting unit is used to set polishing control parameters in the polishing process according to the polishing requirements of the telescope lens, and the polishing control parameters include polishing time and polishing mode.

[0016] A further improvement of the present invention is that the startup detection module comprises:

[0017] A starting unit, used to start the polishing mechanism, control the polishing disc in the polishing mechanism to rotate and the polishing liquid injection port to spray the polishing liquid, so as to polish the surface of the telescope lens;

[0018] A detection unit, used to start the polishing sensor, and detect the polishing condition of the telescope lens surface in real time through the polishing sensor to generate the polishing detection data;

[0019] The abnormality handling unit is used to monitor whether an abnormality occurs during the polishing process, stop the polishing mechanism if an abnormality occurs, and restart the polishing process after troubleshooting.

[0020] A further improvement of the present invention is that the data processing module comprises:

[0021] A collecting unit, used for collecting the polishing detection data in real time;

[0022] An extraction unit, used to process and analyze the polishing detection data, extract key polishing features in the polishing detection data, and determine whether the polishing effect of the telescope lens meets the preset standard according to the key polishing features;

[0023] A feedback unit is used to adjust the polishing control parameters in the polishing process and re-polish the telescope lens when the polishing effect does not meet the preset standard, and stop polishing when the polishing effect meets the preset standard, summarize the judgment results and feed back to the operation end.

[0024] A further improvement of the present invention is that the key polishing features in the polishing detection data are extracted by the following feature extraction algorithm, specifically including:

[0025] grayscale processing is performed on the polishing detection data to obtain pre-processed polishing detection data;

[0026] Feature extraction is performed on the pre-processed polishing detection data to obtain a polishing detection matrix. The expression of the polishing detection matrix is:

[0027]

[0028] Where PGJC(i) represents the polishing detection matrix; i and j represent the positions of pixels in the polishing detection data; σ represents the neighborhood standard deviation of the pixels in the polishing detection data; D ii (i,σ) represents the second-order derivative of the polishing detection data at pixel position i; D ij (i,σ) represents the second-order derivative of the polishing detection data at pixel position i and j; D jj (i,σ) represents the second-order derivative of the polishing detection data at pixel position j;

[0029] Calculate the corresponding polishing detection matrix extreme value, the expression of the polishing detection matrix extreme value is:

[0030] J(PGJC(i))=D ii (i,σ)*D jj (i,σ)-0.81*D ij (i,σ) 2

[0031] Where PGJC(i) represents the polishing detection matrix; J(PGJC(i)) represents the extreme value of the polishing detection matrix; i and j represent the positions of the pixels in the polishing detection data; σ represents the neighborhood standard deviation of the pixels in the polishing detection data; D ii (i,σ) represents the second-order derivative of the polishing detection data at pixel position i; D ij (i,σ) represents the second-order derivative of the polishing detection data at pixel position i and j; D jj (i,σ) represents the second-order derivative of the polishing detection data at pixel position j;

[0032] Selecting the pixel point corresponding to the extreme value J(PGJC(i)) of the polishing detection matrix as the polishing detection feature point, and determining the corresponding stable polishing detection feature point;

[0033] Determine the polishing detection feature direction according to the wavelet feature of the circular neighborhood corresponding to the stable polishing detection feature point;

[0034] A 4×4 rectangular area around the stable polishing detection feature point is obtained, and the sum of the horizontal direction value, the sum of the vertical direction value, the sum of the horizontal direction absolute value and the sum of the vertical direction absolute value of the stable polishing detection feature point are counted to generate the corresponding key polishing feature.

[0035] A further improvement of the present invention is that: judging whether the polishing effect of the telescope lens meets the preset standard according to the key polishing features by using the following similarity judgment algorithm, specifically including:

[0036] Set the key polishing feature to Z GJPG , and the reference polishing feature corresponding to the preset standard is Z CKPG ;

[0037] For the key polishing feature Z GJPG and reference polishing feature Z CKPG After L2 regularization, the expression of the dot product is:

[0038]

[0039] In the formula, Z GJPG Indicates key polishing features; Z CKPG represents the reference polishing feature; S(Z GJPG ,Z CKPG ) represents the key polishing feature Z GJPG and reference polishing feature Z CKPG The dot product after L2 regularization; Z T GJPG Represents the key polishing feature Z GJPG The result of the transpose operation; ||Z GJPG||2 indicates the key polishing feature Z GJPG The L2 norm of ||Z CKPG ||2 represents the reference polishing feature Z CKPG The L2 norm of ; / represents the division sign;

[0040] By performing L2 regularization on the key polishing feature and the reference polishing feature, the similarity between the key polishing feature and the reference polishing feature is obtained according to the dot product;

[0041] A preset similarity threshold corresponding to the preset standard is obtained, and by comparing the similarity degree with the preset similarity threshold, it is determined whether the polishing effect of the telescope lens meets the preset standard, that is, if the similarity degree is greater than or equal to the preset similarity threshold, it is determined that the polishing effect of the telescope lens meets the preset standard; if the similarity degree is less than the preset similarity threshold, it is determined that the polishing effect of the telescope lens does not meet the preset standard.

[0042] A further improvement of the present invention is that the cleaning and drying module comprises:

[0043] A cleaning unit, used to determine and remove the polishing liquid and particles remaining on the surface of the telescope lens where polishing has stopped;

[0044] A drying unit, used for drying the cleaned telescope lens by means of a drying device to obtain the polished telescope lens;

[0045] The packaging and storage unit is used to package and store the polished telescope lens.

[0046] A method for detecting the polishing of a telescope lens of the present invention comprises:

[0047] Place the telescope lens on the polishing die holder, and adjust the working state of the polishing mechanism to the initial polishing state;

[0048] The polishing mechanism is started to polish the surface of the telescope lens, and the polishing condition of the telescope lens is detected in real time by a polishing sensor to generate corresponding polishing detection data;

[0049] Processing the polishing detection data to determine whether the polishing effect of the telescope lens meets a preset standard, if the polishing effect meets the preset standard, stopping the polishing, if the polishing effect does not meet the preset standard, adjusting the polishing control parameters in the polishing process;

[0050] The telescope lens that has stopped polishing is cleaned and dried to obtain a polished telescope lens.

[0051] The invention has the following beneficial effects: the invention proposes a telescope lens polishing detection system and method thereof, wherein the telescope lens can be placed on a polishing mold seat through a polishing preparation module, a start detection module, a data processing module and a cleaning and drying module, and the working state of the polishing mechanism can be adjusted to an initial polishing state; the polishing mechanism is started to polish the surface of the telescope lens, and the polishing condition of the telescope lens is detected in real time through a polishing sensor to generate corresponding polishing detection data; the polishing detection data is processed to determine whether the polishing effect of the telescope lens meets a preset standard, and if the polishing effect meets the preset standard, the polishing is stopped, and if the polishing effect does not meet the preset standard, the polishing control parameter in the polishing process is adjusted; the telescope lens that has stopped polishing is cleaned and dried to obtain a polished telescope lens, thereby eliminating the need to disassemble the lens multiple times, improving the polishing efficiency of the telescope lens, and avoiding damage to the lens and waste of working time; and the polishing condition of the telescope lens can be detected in real time, and the polishing control parameter can be adjusted in time to ensure that the lens surface meets high finish and high precision requirements, thereby improving the product quality of the telescope lens; at the same time, the number of manual interventions and repeated detections can be reduced, and the production cost and labor intensity can be reduced; and the polishing detection method has strong production flexibility, is suitable for telescope lenses of different specifications and types, and has a wide range of production application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 A schematic structural diagram of a telescope lens polishing detection system provided by an embodiment of the present invention;

[0053] Figure 2 A schematic structural diagram of a polishing preparation module of a telescope lens polishing detection system provided by an embodiment of the present invention;

[0054] Figure 3 A schematic diagram of the structure of a start detection module of a telescope lens polishing detection system provided by an embodiment of the present invention;

[0055] Figure 4 A schematic diagram of the structure of a data processing module of a telescope lens polishing detection system provided by an embodiment of the present invention;

[0056] Figure 5 A schematic structural diagram of a cleaning and drying module of a telescope lens polishing detection system provided by an embodiment of the present invention;

[0057] Figure 6 A schematic flow chart of a method for detecting the polishing of a telescope lens provided by an embodiment of the present invention;

[0058] Figure 7 A schematic diagram of the hardware structure of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0059] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0060] See also Figure 1 , is a schematic diagram of the structure of a telescope lens polishing detection system provided by an embodiment of the present invention, the detection system comprising:

[0061] A polishing preparation module is used to place the telescope lens on the polishing die seat and adjust the working state of the polishing mechanism to the initial polishing state;

[0062] A start detection module is used to start the polishing mechanism to polish the surface of the telescope lens, and detect the polishing condition of the telescope lens in real time through a polishing sensor to generate corresponding polishing detection data;

[0063] A data processing module, used for processing the polishing detection data, judging whether the polishing effect of the telescope lens meets the preset standard, stopping the polishing if the polishing effect meets the preset standard, and adjusting the polishing control parameters in the polishing process if the polishing effect does not meet the preset standard;

[0064] The cleaning and drying module is used to clean and dry the telescope lens that has stopped polishing to obtain a polished telescope lens.

[0065] See also Figure 2 The polishing preparation module 21 includes a placement unit 211, an adjustment unit 212 and a setting unit 213:

[0066] A placement unit, used for placing the telescope lens on the polishing die seat and fixing the position of the telescope lens by a clamping device on the polishing die seat;

[0067] An adjustment unit, used for adjusting the working state of the polishing mechanism to an initial polishing state according to the material and polishing requirements of the telescope lens, wherein the initial polishing state includes an initial polishing speed and an initial polishing pressure;

[0068] The setting unit is used to set polishing control parameters in the polishing process according to the polishing requirements of the telescope lens, and the polishing control parameters include polishing time and polishing mode.

[0069] Among them, the telescope lens can be accurately placed on the polishing mold base and fixed by the clamping device integrated on the polishing mold base. These clamping devices usually adopt non-contact or light contact design to avoid any unnecessary damage to the lens surface, while ensuring that the lens remains stable during the polishing process.

[0070] The adjustment unit can adjust the working state of the polishing mechanism according to the specific material of the telescope lens and the polishing requirements until the preset initial polishing state is reached. These specific materials can be optical glass, crystal or special synthetic materials, and the initial polishing state directly affects the polishing efficiency and the final optical performance. Specifically, the initial polishing state includes two core parameters: initial polishing speed and initial polishing pressure. The selection of the initial polishing speed needs to consider the hardness and toughness of the telescope lens material to avoid surface scratches or overheating caused by polishing too fast; and the initial polishing pressure needs to be determined according to the curvature radius of the lens and the expected removal amount to achieve uniform and efficient material removal.

[0071] In addition, the setting unit can accurately set the polishing control parameters during the polishing process according to the polishing requirements of the telescope lens. These parameters include polishing time, that is, the total time the lens is processed on the polishing mold, and polishing mode. The specific polishing mode can be single-point polishing, multi-point random polishing, and path planning polishing. Each mode has its specific application scenarios and advantages, so as to meet the different requirements of different lenses for surface roughness, shape accuracy and removal efficiency. By accurately setting these parameters, the setting unit can ensure that the polishing process meets specific optical quality standards and efficiently produces lenses that meet the requirements of telescope use.

[0072] See also Figure 3 The startup detection module 31 includes a startup unit 311, a detection unit 312 and an exception handling unit 313:

[0073] A starting unit, used to start the polishing mechanism, control the polishing disc in the polishing mechanism to rotate and the polishing liquid injection port to spray the polishing liquid, so as to polish the surface of the telescope lens;

[0074] A detection unit, used to start the polishing sensor, and detect the polishing condition of the telescope lens surface in real time through the polishing sensor to generate the polishing detection data;

[0075] The abnormality handling unit is used to monitor whether an abnormality occurs during the polishing process, stop the polishing mechanism if an abnormality occurs, and restart the polishing process after troubleshooting.

[0076] In actual applications, the start control unit can ensure that the polishing mechanism starts smoothly according to the preset parameters and processes through precise circuit design and programming logic. Specifically, the start control unit can control the polishing disc inside the polishing mechanism to rotate at a specific speed by sending instructions to the polishing mechanism to ensure that the lens surface is evenly stressed, thereby achieving the expected polishing effect. At the same time, the start control unit can accurately control the polishing liquid to be ejected from the injection port at a suitable pressure and flow rate and cover the lens surface to assist the polishing process and improve polishing efficiency and quality.

[0077] The detection unit can capture and analyze the polishing status information of the telescope lens surface in real time by integrating polishing sensor technology. The polishing sensor adopts non-contact measurement principles, such as optical interference, laser scattering and other technologies, to accurately measure the microscopic morphology, roughness and polishing progress of the telescope lens surface, and convert these data into polishing detection data.

[0078] The exception handling unit can promptly detect and identify any abnormal conditions that deviate from the preset range by real-time monitoring of various parameters and sensor feedback during the polishing process, such as abnormal polishing disc speed, insufficient polishing liquid supply, excessive lens surface temperature, and uneven polishing. Once an abnormal condition is detected, the exception handling unit will immediately trigger the emergency shutdown mechanism and stop all actions of the polishing mechanism to prevent irreversible damage to the lens. At the same time, the exception handling unit can record the specific information of the abnormal event to facilitate subsequent analysis and troubleshooting. After the fault is successfully eliminated, the exception handling unit will safely restart the polishing process according to the preset restart procedure to ensure that the polishing operation can continue, thereby effectively improving the stability and reliability of the polishing operation.

[0079] See also Figure 4 , the data processing module 41 includes a collection unit 411, an extraction unit 412 and a feedback unit 413:

[0080] A collecting unit, used for collecting the polishing detection data in real time;

[0081] An extraction unit, used to process and analyze the polishing detection data, extract key polishing features in the polishing detection data, and determine whether the polishing effect of the telescope lens meets the preset standard according to the key polishing features;

[0082] A feedback unit is used to adjust the polishing control parameters in the polishing process and re-polish the telescope lens when the polishing effect does not meet the preset standard, and stop polishing when the polishing effect meets the preset standard, summarize the judgment results and feed back to the operation end.

[0083] Furthermore, the collection unit can collect various types of inspection data in the polishing process in real time and accurately, including key parameters such as surface roughness, shape error, surface shape accuracy and polishing rate. These data are captured through a high-precision sensor network and collected based on high-speed data transmission technology to ensure the timeliness and accuracy of the data.

[0084] The extraction unit can perform in-depth processing and analysis on the received polishing test data, and then identify and extract the key polishing features in the polishing test data, which are directly related to the optical performance and surface quality of the lens. By comparing and analyzing the differences between these key polishing features and the preset standards, it can be accurately judged whether the polishing effect of the telescope lens meets the expected requirements.

[0085] Specifically, if the judgment result shows that the polishing effect does not meet the preset standard, the system will trigger the operation of the feedback unit. The feedback unit can intelligently adjust the polishing control parameters in the polishing process, such as polishing force, polishing liquid flow rate and polishing disk speed, according to the analysis results of the extraction unit, and re-polish the telescope lens to ensure that the polishing effect can be optimized in subsequent polishing operations.

[0086] Once the polishing effect reaches the preset standard, the feedback unit will terminate the polishing operation, summarize all judgment results and key data in the entire polishing process, and send and display the feedback information to the operation end through the user interface or automated communication interface, so that the operator can understand the polishing status in time and make corresponding decisions.

[0087] The key polishing features in the polishing detection data are extracted by the following feature extraction algorithm, specifically including:

[0088] grayscale processing is performed on the polishing detection data to obtain pre-processed polishing detection data;

[0089] Feature extraction is performed on the pre-processed polishing detection data to obtain a polishing detection matrix. The expression of the polishing detection matrix is:

[0090]

[0091] Where PGJC(i) represents the polishing detection matrix; i and j represent the positions of pixels in the polishing detection data; σ represents the neighborhood standard deviation of the pixels in the polishing detection data; D ii (i,σ) represents the second-order derivative of the polishing detection data at pixel position i; D ij (i,σ) represents the second-order derivative of the polishing detection data at pixel position i and j; D jj (i,σ) represents the second-order derivative of the polishing detection data at pixel position j;

[0092] Calculate the corresponding polishing detection matrix extreme value, the expression of the polishing detection matrix extreme value is:

[0093] J(PGJC(i))=D ii (i,σ)*D jj (i,σ)-0.81*D ij (i,σ) 2

[0094] Where PGJC(i) represents the polishing detection matrix; J(PGJC(i)) represents the extreme value of the polishing detection matrix; i and j represent the positions of the pixels in the polishing detection data; σ represents the neighborhood standard deviation of the pixels in the polishing detection data; D ii (i,σ) represents the second-order derivative of the polishing detection data at pixel position i; D ij (i,σ) represents the second-order derivative of the polishing detection data at pixel position i and j; D jj (i,σ) represents the second-order derivative of the polishing detection data at pixel position j;

[0095] Selecting the pixel point corresponding to the extreme value J(PGJC(i)) of the polishing detection matrix as the polishing detection feature point, and determining the corresponding stable polishing detection feature point;

[0096] Determine the polishing detection feature direction according to the wavelet feature of the circular neighborhood corresponding to the stable polishing detection feature point;

[0097] A 4×4 rectangular area around the stable polishing detection feature point is obtained, and the sum of the horizontal direction value, the sum of the vertical direction value, the sum of the horizontal direction absolute value and the sum of the vertical direction absolute value of the stable polishing detection feature point are counted to generate the corresponding key polishing feature.

[0098] The following similarity judgment algorithm is used to judge whether the polishing effect of the telescope lens meets the preset standard according to the key polishing features, specifically including:

[0099] Set the key polishing feature to Z GJPG , and the reference polishing feature corresponding to the preset standard is Z CKPG ;

[0100] For the key polishing feature Z GJPG and reference polishing feature Z CKPG After L2 regularization, the expression of the dot product is:

[0101] S(Z GJPG ,Z CKPG )=Z T GJPG Z CKPG / (||Z GJPG||2||Z CKPG ||2)

[0102] In the formula, Z GJPG Indicates key polishing features; Z CKPG represents the reference polishing feature; S(Z GJPG ,Z CKPG ) represents the key polishing feature Z GJPG and reference polishing feature Z CKPG The dot product after L2 regularization; Z T GJPG Represents the key polishing feature Z GJPG The result of the transpose operation; ||Z GJPG ||2 indicates the key polishing feature Z GJPG The L2 norm of ||Z CKPG ||2 represents the reference polishing feature Z CKPG The L2 norm of ; / represents the division sign;

[0103] By performing L2 regularization on the key polishing feature and the reference polishing feature, the similarity between the key polishing feature and the reference polishing feature is obtained according to the dot product;

[0104] A preset similarity threshold corresponding to the preset standard is obtained, and by comparing the similarity degree with the preset similarity threshold, it is determined whether the polishing effect of the telescope lens meets the preset standard, that is, if the similarity degree is greater than or equal to the preset similarity threshold, it is determined that the polishing effect of the telescope lens meets the preset standard; if the similarity degree is less than the preset similarity threshold, it is determined that the polishing effect of the telescope lens does not meet the preset standard.

[0105] See also Figure 5 The cleaning and drying module 51 includes a cleaning unit 511, a drying unit 512 and a packaging storage unit 513:

[0106] A cleaning unit, used to determine and remove the polishing liquid and particles remaining on the surface of the telescope lens where polishing has stopped;

[0107] A drying unit, used for drying the cleaned telescope lens by means of a drying device to obtain the polished telescope lens;

[0108] The packaging and storage unit is used to package and store the polished telescope lens.

[0109] It is understood that after the polishing operation, the cleaning unit can accurately identify and effectively remove the polishing liquid residue and tiny particles left on the surface of the telescope lens to ensure the light transmittance, surface finish and final imaging quality of the lens. The cleaning unit uses high-pressure water or specific solvents to rinse the lens surface through integrated spray and ultrasonic cleaning technology to remove most visible contaminants, and separates tiny particles from the lens surface through high-frequency sound wave vibrations, deeply cleaning hard-to-reach gaps and pits. In addition, the cleaning unit is equipped with a sophisticated filtration system that can recycle the cleaning fluid to reduce waste and maintain the consistency of the cleaning effect.

[0110] The drying unit can dry the cleaned telescope lens to eliminate moisture or other residual liquids, ensure that the lens reaches an ideal dry state, thereby preventing the lens surface from mildewing and ensuring the optical performance under long-term storage conditions. The drying unit is equipped with high-efficiency drying equipment, such as a hot air drying oven or a vacuum dryer, which can adjust the temperature, humidity and drying time according to different lens materials and sizes, complete the drying process under the most suitable conditions, and obtain a polished and thoroughly dried telescope lens.

[0111] Finally, the packaging and storage unit can package and store the polished telescope lenses to prevent them from being damaged by external environmental factors during transportation and long-term storage. The packaging materials need to have good moisture-proof, dust-proof and anti-static properties to protect the lenses from humidity changes, dust accumulation, and electrostatic discharge. At the same time, the storage unit needs to maintain constant temperature and humidity conditions, use professional shelves or lens boxes for orderly storage, and accurately record relevant information of the telescope lenses, such as model, serial number and production date, for subsequent tracking management and quick retrieval.

[0112] Through the above method, the quality and safety of the telescope lens can be ensured before use, laying the foundation for subsequent optical performance testing and installation.

[0113] See also Figure 6 , is a flow chart of a method for detecting the polishing of a telescope lens provided by an embodiment of the present invention, the detection method comprising:

[0114] S1, placing the telescope lens on the polishing mold base, and adjusting the working state of the polishing mechanism to the initial polishing state;

[0115] S2, starting the polishing mechanism to polish the surface of the telescope lens, and detecting the polishing condition of the telescope lens in real time through a polishing sensor to generate corresponding polishing detection data;

[0116] S3, processing the polishing detection data to determine whether the polishing effect of the telescope lens meets the preset standard, if the polishing effect meets the preset standard, stopping the polishing, if the polishing effect does not meet the preset standard, adjusting the polishing control parameters in the polishing process;

[0117] S4, cleaning and drying the telescope lens whose polishing has been stopped to obtain a polished telescope lens.

[0118] It should be noted that Figure 6 The execution subject of the method shown may be software and / or hardware devices. The execution subject of the present application may include but is not limited to at least one of the following: user equipment, network equipment, etc. Among them, the user equipment may include but is not limited to computers, smart phones, personal digital assistants (Personal Digital Assistant, referred to as: PDA) and the electronic devices mentioned above. The network equipment may include but is not limited to a single network server, a server group consisting of multiple network servers, or a cloud based on cloud computing consisting of a large number of computers or network servers, wherein cloud computing is a kind of distributed computing, a super virtual computer composed of a group of loosely coupled computers. This embodiment does not limit this.

[0119] See also Figure 7 , is a schematic diagram of the hardware structure of an electronic device provided by an embodiment of the present invention, the electronic device 70 includes: a processor 71, a memory 72 and a computer program; wherein:

[0120] The memory 72 is used to store the computer program, and the memory may also be a flash memory. The computer program is, for example, an application program, a functional module, etc. for implementing the above method.

[0121] The processor 71 is used to execute the computer program stored in the memory to implement each step performed by the device in the above method. For details, please refer to the relevant description in the above method embodiment.

[0122] Optionally, the memory 72 may be independent or integrated with the processor 71 .

[0123] When the memory 72 is a device independent of the processor 71, the device may further include:

[0124] The bus 73 is used to connect the memory 72 and the processor 71 .

[0125] The present invention also provides a readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, it is used to implement the methods provided by the various embodiments described above.

[0126] Among them, the readable storage medium can be a computer storage medium or a communication medium. The communication medium includes any medium that facilitates the transmission of a computer program from one place to another. The computer storage medium can be any available medium that can be accessed by a general-purpose or special-purpose computer. For example, a readable storage medium is coupled to a processor so that the processor can read information from the readable storage medium and write information to the readable storage medium. Of course, the readable storage medium can also be a component of the processor. The processor and the readable storage medium can be located in an application-specific integrated circuit (Application Specific Integrated Circuits, abbreviated as: ASIC). In addition, the ASIC can be located in a user device. Of course, the processor and the readable storage medium can also exist in a communication device as discrete components. The readable storage medium can be a read-only memory (ROM), a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, and an optical data storage device, etc.

[0127] The present invention also provides a program product, which includes an execution instruction, which is stored in a readable storage medium. At least one processor of a device can read the execution instruction from the readable storage medium, and at least one processor executes the execution instruction so that the device implements the methods provided in the above various embodiments.

[0128] In the embodiments of the above-mentioned devices, it should be understood that the processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. The general-purpose processor may be a microprocessor or any conventional processor. The steps of the method disclosed in the present invention may be directly implemented as being executed by a hardware processor, or may be executed by a combination of hardware and software modules in the processor.

[0129] Through the introduction of the above embodiments, the present invention provides a telescope lens polishing detection system and method thereof. Through a polishing preparation module, a start detection module, a data processing module and a cleaning and drying module, the telescope lens can be placed on a polishing mold seat, and the working state of the polishing mechanism can be adjusted to an initial polishing state; the polishing mechanism is started to polish the surface of the telescope lens, and the polishing condition of the telescope lens is detected in real time by a polishing sensor to generate corresponding polishing detection data; the polishing detection data is processed to determine whether the polishing effect of the telescope lens meets the preset standard, if the polishing effect meets the preset standard, the polishing is stopped, if the polishing effect does not meet the preset standard, the polishing control parameters in the polishing process are adjusted; the telescope lens that has stopped polishing is cleaned and dried to obtain a polished telescope lens, thereby eliminating the need to disassemble the lens multiple times, improving the polishing efficiency of the telescope lens, and avoiding damage to the lens and waste of working time; and the polishing condition of the telescope lens can be detected in real time, and the polishing control parameters can be adjusted in time to ensure that the lens surface meets the requirements of high finish and high precision, thereby improving the product quality of the telescope lens; at the same time, the number of manual interventions and repeated detections can be reduced, and the production cost and labor intensity can be reduced; and the polishing detection method has strong production flexibility, is suitable for telescope lenses of different specifications and types, and has a wide range of production application prospects.

[0130] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A telescope lens polishing detection system, characterized in that: The system comprises: A polishing preparation module is used to place the telescope lens on the polishing die seat and adjust the working state of the polishing mechanism to the initial polishing state; A start detection module is used to start the polishing mechanism to polish the surface of the telescope lens, and detect the polishing condition of the telescope lens in real time through a polishing sensor to generate corresponding polishing detection data; A data processing module, used for processing the polishing detection data, judging whether the polishing effect of the telescope lens meets the preset standard, stopping the polishing if the polishing effect meets the preset standard, and adjusting the polishing control parameters in the polishing process if the polishing effect does not meet the preset standard; The cleaning and drying module is used to clean and dry the telescope lens that has stopped polishing to obtain a polished telescope lens.

2. A telescope lens polishing detection system according to claim 1, characterized in that: The polishing preparation module comprises: A placement unit, used for placing the telescope lens on the polishing die seat and fixing the position of the telescope lens by a clamping device on the polishing die seat; An adjustment unit, used for adjusting the working state of the polishing mechanism to an initial polishing state according to the material and polishing requirements of the telescope lens, wherein the initial polishing state includes an initial polishing speed and an initial polishing pressure; The setting unit is used to set polishing control parameters in the polishing process according to the polishing requirements of the telescope lens, and the polishing control parameters include polishing time and polishing mode.

3. A telescope lens polishing detection system according to claim 1, characterized in that: The startup detection module comprises: A starting unit, used to start the polishing mechanism, control the polishing disc in the polishing mechanism to rotate and the polishing liquid injection port to spray the polishing liquid, so as to polish the surface of the telescope lens; A detection unit, used to start the polishing sensor, and detect the polishing condition of the telescope lens surface in real time through the polishing sensor to generate the polishing detection data; The abnormality handling unit is used to monitor whether an abnormality occurs during the polishing process, stop the polishing mechanism if an abnormality occurs, and restart the polishing process after troubleshooting.

4. A telescope lens polishing detection system according to claim 1, characterized in that: The data processing module comprises: A collecting unit, used for collecting the polishing detection data in real time; An extraction unit, used to process and analyze the polishing detection data, extract key polishing features in the polishing detection data, and determine whether the polishing effect of the telescope lens meets the preset standard according to the key polishing features; A feedback unit is used to adjust the polishing control parameters in the polishing process and re-polish the telescope lens when the polishing effect does not meet the preset standard, and stop polishing when the polishing effect meets the preset standard, summarize the judgment results and feed back to the operation end.

5. A telescope lens polishing detection system according to claim 4, characterized in that: The key polishing features in the polishing detection data are extracted by the following feature extraction algorithm, specifically including: grayscale processing is performed on the polishing detection data to obtain pre-processed polishing detection data; Feature extraction is performed on the pre-processed polishing detection data to obtain a polishing detection matrix. The expression of the polishing detection matrix is: Where PGJC(i) represents the polishing detection matrix; i and j represent the positions of pixels in the polishing detection data; σ represents the neighborhood standard deviation of the pixels in the polishing detection data; D ii (i,σ) represents the second-order derivative of the polishing detection data at pixel position i; D ij (i,σ) represents the second-order derivative of the polishing detection data at pixel position i and j; D jj (i,σ) represents the second-order derivative of the polishing detection data at pixel position j; Calculate the corresponding polishing detection matrix extreme value, the expression of the polishing detection matrix extreme value is: J(PGJC(i))=D ii (i,σ)*D jj (i,σ)-0.81*D ij (i,σ) 2 Where PGJC(i) represents the polishing detection matrix; J(PGJC(i)) represents the extreme value of the polishing detection matrix; i and j represent the positions of the pixels in the polishing detection data; σ represents the neighborhood standard deviation of the pixels in the polishing detection data; D ii (i,σ) represents the second-order derivative of the polishing detection data at pixel position i; D ij (i,σ) represents the second-order derivative of the polishing detection data at pixel position i and j; D jj (i,σ) represents the second-order derivative of the polishing detection data at pixel position j; Selecting the pixel point corresponding to the extreme value J(PGJC(i)) of the polishing detection matrix as the polishing detection feature point, and determining the corresponding stable polishing detection feature point; Determine the polishing detection feature direction according to the wavelet feature of the circular neighborhood corresponding to the stable polishing detection feature point; A 4×4 rectangular area around the stable polishing detection feature point is obtained, and the sum of the horizontal direction value, the sum of the vertical direction value, the sum of the horizontal direction absolute value and the sum of the vertical direction absolute value of the stable polishing detection feature point are counted to generate the corresponding key polishing feature.

6. A telescope lens polishing detection system according to claim 5, characterized in that: The following similarity judgment algorithm is used to judge whether the polishing effect of the telescope lens meets the preset standard according to the key polishing features, specifically including: Set the key polishing feature to Z GJPG , and the reference polishing feature corresponding to the preset standard is Z CKPG ; For the key polishing feature Z GJPG and reference polishing feature Z CKPG After L2 regularization, the expression of the dot product is: In the formula, Z GJPG Indicates key polishing features; Z CKPG represents the reference polishing feature; S(Z GJPG ,Z CKPG ) represents the key polishing feature Z GJPG and reference polishing feature Z CKPG The dot product after L2 regularization; Represents the key polishing feature Z GJPG The result of the transpose operation; ||Z GJPG ||2 indicates the key polishing feature Z GJPG The L2 norm of ||Z CKPG ||2 represents the reference polishing feature Z CKPG The L2 norm of ; / represents the division sign; By performing L2 regularization on the key polishing feature and the reference polishing feature, the similarity between the key polishing feature and the reference polishing feature is obtained according to the dot product; A preset similarity threshold corresponding to the preset standard is obtained, and by comparing the similarity degree with the preset similarity threshold, it is determined whether the polishing effect of the telescope lens meets the preset standard, that is, if the similarity degree is greater than or equal to the preset similarity threshold, it is determined that the polishing effect of the telescope lens meets the preset standard; if the similarity degree is less than the preset similarity threshold, it is determined that the polishing effect of the telescope lens does not meet the preset standard.

7. A telescope lens polishing detection system according to claim 1, characterized in that: The cleaning and drying module comprises: A cleaning unit, used to determine and remove the polishing liquid and particles remaining on the surface of the telescope lens where polishing has stopped; A drying unit, used for drying the cleaned telescope lens by means of a drying device to obtain the polished telescope lens; The packaging and storage unit is used to package and store the polished telescope lens.

8. A method for detecting the polishing of a telescope lens according to any one of claims 1 to 7, characterized in that: The method comprises: Place the telescope lens on the polishing die holder, and adjust the working state of the polishing mechanism to the initial polishing state; The polishing mechanism is started to polish the surface of the telescope lens, and the polishing condition of the telescope lens is detected in real time by a polishing sensor to generate corresponding polishing detection data; Processing the polishing detection data to determine whether the polishing effect of the telescope lens meets a preset standard, if the polishing effect meets the preset standard, stopping the polishing, if the polishing effect does not meet the preset standard, adjusting the polishing control parameters in the polishing process; The telescope lens that has stopped polishing is cleaned and dried to obtain a polished telescope lens.

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