Multi-physical environment electromagnetic disturbance simulation test system and method

Abstract

The invention discloses a multi-physical environment electromagnetic disturbance simulation test system and method. The system comprises a plurality of switches, a first isolation transformer, a second isolation transformer, a signal generator, a filter, a decoupling clamp, an electromagnetic disturbance module, a temperature and humidity module and an analysis report module. Complex electromagnetic interference and temperature and humidity conditions possibly encountered by electronic equipment in an actual working environment can be more comprehensively simulated, so that the accuracy and reliability of testing are improved. By accurately controlling the amplitude, the frequency, the waveform and the temperature and humidity parameters of the electromagnetic disturbance, the performance and the stability of the electronic equipment under extreme conditions can be more effectively evaluated. In addition, the invention further provides a method for monitoring and analyzing the response data of the to-be-tested equipment in real time, a detailed analysis report can be quickly generated, and powerful support is provided for design improvement and fault diagnosis.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic transformer testing, and in particular to a multi-physical environment electromagnetic disturbance simulation testing system and method. Background Art

[0002] In today's era, with the rapid development of science and technology, various electronic devices have been widely used in daily life and work. However, in the research and development and testing stages of these devices, electromagnetic compatibility (EMC) testing is particularly important. Electromagnetic compatibility testing ensures that electronic equipment can operate normally in a complex electromagnetic environment without being interfered by other electromagnetic signals. With the increasing types and number of electronic equipment, electromagnetic interference problems have become more and more prominent, and the impact on equipment performance has become increasingly significant. Therefore, in order to ensure that electronic equipment can work stably and reliably in actual use, it is essential to conduct rigorous electromagnetic disturbance simulation tests on them.

[0003] Existing electromagnetic disturbance simulation test systems are often designed to focus on a single physical environmental factor, such as temperature, humidity, or electromagnetic disturbance itself. These systems are usually unable to fully simulate the combined effects of multiple physical factors on the performance of electronic equipment in the actual working environment. For example, an electronic device may exhibit completely different performance in a high temperature and high humidity environment than in a normal temperature and humidity environment, and existing test systems are often unable to simulate these two environmental conditions at the same time. In addition, in actual use, electronic equipment may be affected by temperature, humidity, and electromagnetic disturbance at the same time, and a single-factor test system cannot accurately evaluate the performance of the device under the combined effects of these multiple factors.

[0004] Therefore, it is particularly important to develop an electromagnetic disturbance test system that can simulate multiple physical environmental factors at the same time. This system can not only simulate a single temperature, humidity or electromagnetic disturbance environment, but also simulate the complex environment under the combined effect of these factors. Through this comprehensive test, the performance and reliability of electronic equipment in actual use can be more comprehensively evaluated, thereby improving the stability of the equipment and the user experience. This multi-physical environment simulation test system will provide electronic equipment manufacturers with more accurate test data, helping them optimize product design and ensure the normal operation of equipment in various complex environments. Summary of the invention

[0005] The purpose of this section is to summarize some aspects of embodiments of the present invention and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this section and the specification abstract and the invention title of this application to avoid blurring the purpose of this section, the specification abstract and the invention title, and such simplifications or omissions cannot be used to limit the scope of the present invention.

[0006] In view of the above existing problems, the present invention is proposed.

[0007] Therefore, the present invention provides a multi-physical environment electromagnetic disturbance simulation test system and method, which can solve the problems mentioned in the background technology.

[0008] In order to solve the above technical problems, the present invention provides the following technical solutions:

[0009] In a first aspect, the present invention provides a multi-physical environment electromagnetic disturbance simulation test system, including: a plurality of switches, a first isolation transformer, a second isolation transformer, a signal generator, a filter, a decoupling clamp, an electromagnetic disturbance module, a temperature and humidity module, and an analysis report module;

[0010] The temperature and humidity module includes a coupling clamp module, which includes a fast-instantaneous capacitive coupling clamp and an electromagnetic coupling clamp, and the target electronic device to be tested is electrically connected to the temperature and humidity module;

[0011] The electromagnetic disturbance module includes a fast transient surge generator and an immunity generator;

[0012] The fast transient surge generator includes a linear power supply, a high-voltage power supply, a high-voltage capacitor and a high-voltage unit which are electrically connected in sequence. The linear power supply is electrically connected to a main control unit, the main control unit is electrically connected to the high-voltage power supply, the high-voltage unit and a phase switch, the high-voltage unit and the phase switch are both electrically connected to a coupling-decoupling network, and the main control unit is electrically connected to a display screen.

[0013] As a preferred solution of the multi-physical environment electromagnetic disturbance simulation test system of the present invention, it also includes:

[0014] The first isolation transformer is directly electrically connected to the filter, the first isolation transformer is used to provide a stable power supply for the electronic device to be tested and the electromagnetic disturbance module, and the filter is used to preset filtering parameters to eliminate the influence of the external power grid on the test;

[0015] The second isolation transformer is electrically connected to the signal generator through a switch, and the second isolation transformer is electrically connected to the analysis and reporting module, and is used to power the signal generator and the analysis and reporting module. At the same time, the second isolation transformer is electrically connected to the signal generator and the decoupling clamp and the electronic device to be tested in sequence through the switch;

[0016] The coupling clamp module is used to couple the disturbance signal generated by the electromagnetic disturbance module to the electronic device to be tested, so as to simulate the electromagnetic disturbance in the actual working environment. The coupling clamp and the electronic device to be tested are both arranged in the temperature and humidity module;

[0017] The electromagnetic disturbance module is used to simulate the electronic test environment under different working conditions, and the temperature and humidity module is used to simulate the temperature and humidity environment of the electronic device to be tested under different working conditions.

[0018] As a preferred solution of the multi-physical environment electromagnetic disturbance simulation test system of the present invention, the fast transient surge generator includes:

[0019] The linear power supply provides stable DC energy for the control unit and the high-voltage power supply. The high-voltage power supply charges and stores energy for the high-voltage capacitor through the high-voltage voltage doubling technology. When the high-voltage capacitor is fully charged, the high-voltage unit sends a charging completion instruction to the main control unit.

[0020] After the main control unit obtains the charging completion instruction, it sends an electromagnetic disturbance instruction to the display screen. When the display screen displays the electromagnetic disturbance option, the user can perform electromagnetic disturbance simulation;

[0021] When the user performs electromagnetic disturbance simulation, the user inputs the electromagnetic disturbance simulation requirement or selects the electromagnetic disturbance simulation type through the display screen. The main control unit obtains the input data of the display screen in real time, and generates and sends instructions to the high-voltage unit according to the input data of the display screen. The high-voltage unit controls the discharge of the high-voltage capacitor according to the instructions transmitted by the main control unit.

[0022] As a preferred solution of the multi-physical environment electromagnetic disturbance simulation test system described in the present invention, the fast transient surge generator also includes: when the high-voltage capacitor discharges according to the instruction of the high-voltage unit, the generated target discharge waveform is coupled to the access line of the electronic device to be tested through a coupling and decoupling network, and the access line at least includes a power line and a signal line.

[0023] As a preferred solution of the multi-physical environment electromagnetic disturbance simulation test system described in the present invention, the immunity generator is used to control a control unit, which communicates with the main control unit, receives instructions from the main control unit, and sends interference instructions to the main control unit.

[0024] As a preferred solution of the multi-physical environment electromagnetic disturbance simulation test system of the present invention, it also includes:

[0025] When the user performs electromagnetic disturbance simulation, the electromagnetic disturbance simulation requirement is input or the electromagnetic disturbance simulation type is selected through the display screen, and the main control unit obtains the input data of the display screen in real time, and generates and sends instructions to the high-voltage unit according to the input data of the display screen, and the high-voltage unit controls the discharge of the high-voltage capacitor according to the instructions transmitted by the main control unit;

[0026] The instruction generation and sending includes the generation and sending of an interference degree instruction and a waveform disturbance degree instruction. The interference degree instruction is used to control the amplitude of electromagnetic disturbance, and the waveform disturbance instruction is used to control the amplitude and frequency of electromagnetic disturbance.

[0027] As a preferred solution of the multi-physical environment electromagnetic disturbance simulation test system described in the present invention, wherein: the analysis report module obtains the response data of the electronic device to be tested under electromagnetic disturbance in real time, and analyzes and processes these data, the analysis report module includes a data acquisition card, an analysis unit and a report generator, the data acquisition card is responsible for real-time acquisition of the response signal of the electronic device to be tested, and transmits the collected data to the analysis unit, and the analysis unit processes the collected data, including time domain analysis, frequency domain analysis and statistical analysis of the signal, so as to evaluate the performance of the electronic device to be tested under different electromagnetic disturbances.

[0028] In a second aspect, the present invention provides a multi-physical environment electromagnetic disturbance simulation test method, comprising:

[0029] Obtaining electromagnetic disturbance requirements of a user terminal and generating machine instructions corresponding to the electromagnetic disturbance requirements;

[0030] Generate a corresponding disturbance environment according to the machine instruction, wherein the disturbance environment includes an electromagnetic disturbance environment and a temperature and humidity environment;

[0031] The response data of the target electronic device in the disturbance environment is obtained, and an analysis report is generated according to the response data to complete the electromagnetic disturbance simulation test.

[0032] In a third aspect, the present invention provides a computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above-mentioned method when executing the computer program.

[0033] In a fourth aspect, the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program implements the steps of the method described above when executed by a processor.

[0034] Compared with the prior art, the present invention has the following beneficial effects: The present invention proposes a multi-physical environment electromagnetic disturbance simulation test system and method, which can more comprehensively simulate the complex electromagnetic interference and temperature and humidity conditions that electronic equipment may encounter in the actual working environment, thereby improving the accuracy and reliability of the test. By precisely controlling the amplitude, frequency and waveform of the electromagnetic disturbance, as well as the temperature and humidity parameters, the performance and stability of electronic equipment under extreme conditions can be more effectively evaluated. In addition, the present invention also provides a method for real-time monitoring and analysis of the response data of the device under test, which can quickly generate a detailed analysis report, providing strong support for design improvement and fault diagnosis. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative labor. Among them:

[0036] Figure 1 A method flow chart of a multi-physical environment electromagnetic disturbance simulation test system and method provided by one embodiment of the present invention;

[0037] Figure 2 A schematic diagram of the system structure of a multi-physical environment electromagnetic disturbance simulation test system and method provided by one embodiment of the present invention;

[0038] Figure 3 A schematic diagram of a fast transient surge generator structure of a multi-physical environment electromagnetic disturbance simulation test system and method provided by an embodiment of the present invention;

[0039] Figure 4 An equivalent circuit diagram of a main circuit of a fast transient generator of a multi-physical environment electromagnetic disturbance simulation test system and method provided by an embodiment of the present invention;

[0040] Figure 5 An equivalent circuit diagram of a surge generator main circuit of a multi-physical environment electromagnetic disturbance simulation test system and method provided by an embodiment of the present invention;

[0041] Figure 6 A fast transient generator waveform diagram of a multi-physical environment electromagnetic disturbance simulation test system and method provided by an embodiment of the present invention;

[0042] Figure 7 A surge generator waveform diagram of a multi-physical environment electromagnetic disturbance simulation test system and method provided by an embodiment of the present invention;

[0043] Figure 8 An internal structural diagram of a computer device of a multi-physical environment electromagnetic disturbance simulation test system and method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0044] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the drawings of the specification. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary persons in the art without creative work should fall within the scope of protection of the present invention.

[0045] Example 1

[0046] Reference Figure 1-Figure 8 , which is the first embodiment of the present invention, provides a multi-physical environment electromagnetic disturbance simulation test system and method, including:

[0047] Before describing the embodiments of the present application in detail, some related concepts are first explained for the sake of clarity.

[0048] Electromagnetic disturbance: refers to any electromagnetic phenomenon that may cause the performance of equipment, transmission channels or systems to degrade. In the use environment of electronic products and systems, electromagnetic disturbance usually refers to those unexpected electromagnetic energies, which may come from various internal or external sources, such as lightning, power fluctuations, operation of other electronic equipment, etc. Electromagnetic disturbance can be divided into two categories: Conducted Emission: electromagnetic energy transmitted through conductors (such as power lines or signal lines). Radiated Emission: electromagnetic energy transmitted through space. Electromagnetic disturbance can have adverse effects on electronic equipment, such as causing equipment performance degradation, functional failure or data loss. In order to ensure that electronic equipment can work normally in an environment with electromagnetic disturbance, electromagnetic compatibility (EMC) testing is usually performed to verify whether the equipment can operate stably in the expected electromagnetic environment and will not cause unacceptable electromagnetic interference to other equipment. In this application, the electromagnetic disturbance simulation test system can simulate different electromagnetic disturbance conditions to test the anti-interference ability of the electronic equipment to be tested. In this way, it can be ensured that the equipment will not be affected by the electromagnetic environment and fail during actual use.

[0049] There are some technical problems in the related technologies. For example, the test equipment cannot fully simulate the complex electromagnetic interference and temperature and humidity conditions in the actual working environment, resulting in inaccurate and unreliable test results. In addition, the existing technology often lacks real-time monitoring and analysis of electronic equipment response data in electromagnetic disturbance simulation tests, resulting in a lack of strong data support for design improvements and fault diagnosis.

[0050] The present application provides a method that can effectively solve the above-mentioned problems. Next, multiple embodiments will be combined to explain in detail how to implement the multi-physical environment electromagnetic disturbance simulation test system;

[0051] Specifically, the multi-physical environment electromagnetic disturbance simulation test system includes a number of switches, a first isolation transformer, a second isolation transformer, a signal generator, a filter, a decoupling clamp, an electromagnetic disturbance module, a temperature and humidity module, and an analysis report module;

[0052] The temperature and humidity module includes a coupling clamp module, which includes a fast-instantaneous capacitive coupling clamp and an electromagnetic coupling clamp, and the target electronic device to be tested is electrically connected to the temperature and humidity module;

[0053] The electromagnetic disturbance module includes a fast transient surge generator and an immunity generator;

[0054] The fast transient surge generator includes a linear power supply, a high-voltage power supply, a high-voltage capacitor and a high-voltage unit which are electrically connected in sequence. The linear power supply is electrically connected to a main control unit, the main control unit is electrically connected to the high-voltage power supply, the high-voltage unit and a phase switch, the high-voltage unit and the phase switch are both electrically connected to a coupling and decoupling network, and the main control unit is electrically connected to a display screen.

[0055] In the embodiment of the present application, the first isolation transformer is directly electrically connected to the filter, the first isolation transformer is used to provide a stable power supply for the electronic device to be tested and the electromagnetic disturbance module, and the filter is used to preset filtering parameters to eliminate the influence of the external power grid on the test;

[0056] The second isolation transformer is electrically connected to the signal generator through a switch, and the second isolation transformer is electrically connected to the analysis and report module, and is used to power the signal generator and the analysis and report module. At the same time, the second isolation transformer is electrically connected to the signal generator and the decoupling clamp and the electronic device to be tested in sequence through the switch;

[0057] The coupling clamp module is used to couple the disturbance signal generated by the electromagnetic disturbance module to the electronic device to be tested, so as to simulate the electromagnetic disturbance in the actual working environment. The coupling clamp and the electronic device to be tested are both arranged in the temperature and humidity module;

[0058] The electromagnetic interference module is electrically connected to the coupling clamp and the collector separately through a switch. The second isolation transformer is electrically connected to the report analyzer, and the second isolation transformer can be connected to the switch to be electrically connected to the device under test by sequentially electrically connecting the signal generator and the decoupling clamp. The first isolation transformer can power the device under test and the electromagnetic interference module through the filter. The first isolation transformer provides a stable power supply to the device under test and the electromagnetic interference module through the filter to ensure the power quality during the test. The second isolation transformer is used to connect the report analyzer, and is connected to the device under test through the switch, signal generator, and decoupling clamp for signal transmission and isolation; coupling clamp module: includes a fast-instantaneous capacitive coupling clamp and an electromagnetic coupling clamp. The coupling clamp is used to couple the interference signal generated by the electromagnetic interference module to the device under test to simulate the electromagnetic interference in the actual working environment. The coupling clamp and the device under test are both set in the temperature and humidity module to ensure the stability of the temperature and humidity environment during the test; temperature and humidity module: this module is used to control the temperature and humidity environment during the test to simulate various climatic conditions that the device under test may encounter in the actual working environment. By precisely controlling the temperature and humidity, the performance of the device under test in different environments can be more accurately evaluated;

[0059] See also Figure 4 The fast transient generation circuit consists of a high-voltage DC power supply U, a charging resistor R, and a high-voltage capacitor C s , main circuit switch K, pulse forming resistor R s , Impedance matching resistor R m , DC blocking capacitor C d Composition: high voltage DC power supply U, charging resistor R, main circuit switch K, impedance matching resistor R m , DC blocking capacitor C d Connect them in series in sequence, and connect high-voltage capacitors C in parallel on the left and right sides of the main circuit switch K s and pulse forming resistor R s .

[0060] The output voltage of the fast instantaneous generation circuit is as high as 4kV, the repetition frequency is 5kHz, and the pulse front is 5ns. Therefore, the main circuit switch is required to withstand high voltage, high repetition frequency, and short conduction time. The hydrogen thyratron is used as the main circuit switch. The hydrogen thyratron is a hot cathode low-pressure gas discharge device with the advantages of small tube voltage drop when turned on, short ionization time and deionization time, small size, small mass, stable operation, and long life. The hydrogen thyratron consists of an anode, a cathode, a grid, a filament, and a hydrogen generator. When working, the cathode and the hot filament of the hydrogen generator need to be powered on and preheated for a few minutes. The electrons emitted by the cathode heat accumulate between the cathode and the grid. When a trigger pulse signal is applied to the grid, plasma is formed between the cathode and the grid. Under the action of the anode electric field, a current is formed, causing the hydrogen thyratron to turn on. The larger the amplitude of the grid trigger pulse and the steeper the front, the shorter the conduction time of the hydrogen thyratron and the smaller the jitter.

[0061] See also Figure 5 The surge generating circuit is composed of a pulse forming network consisting of a high voltage DC power supply U, a high voltage capacitor C, a main circuit switch K, a charging resistor R1, an impedance matching resistor R2, a pulse forming resistor R3, a pulse forming resistor R4, and an inductor L. The pulse forming resistor R3 and the pulse forming resistor R4 are resistors for adjusting the pulse duration, and the inductor L is an inductor for adjusting the rise time.

[0062] In the embodiment of the present application, the electromagnetic interference module is used to simulate the electronic test environment under different working conditions, and the temperature and humidity module is used to simulate the temperature and humidity environment of the electronic device to be tested under different working conditions. The temperature and humidity module can control the temperature (-50℃-+85℃) and humidity (≤95%) to simulate the use environment of the electronic transformer.

[0063] In an embodiment of the present application, the fast transient surge generator includes:

[0064] The linear power supply provides stable DC energy for the control unit and the high-voltage power supply. The high-voltage power supply charges and stores energy for the high-voltage capacitor through the high-voltage voltage doubling technology. When the high-voltage capacitor is fully charged, the high-voltage unit sends a charging completion instruction to the main control unit.

[0065] After the main control unit obtains the charging completion instruction, it sends an electromagnetic disturbance instruction to the display screen. When the display screen displays the electromagnetic disturbance option, the user can perform electromagnetic disturbance simulation;

[0066] When the user performs electromagnetic disturbance simulation, he inputs the electromagnetic disturbance simulation requirements or selects the electromagnetic disturbance simulation type through the display screen. The main control unit obtains the input data of the display screen in real time, and generates and sends instructions to the high-voltage unit according to the input data of the display screen. The high-voltage unit controls the discharge of the high-voltage capacitor according to the instructions transmitted by the main control unit.

[0067] In an embodiment of the present application, the fast surge generator also includes: when the high-voltage capacitor discharges according to the instruction of the high-voltage unit, the generated target discharge waveform is coupled to the access line of the electronic device to be tested through a coupling and decoupling network, and the access line includes at least a power line and a signal line.

[0068] The anti-interference generator is used for controlling a control unit, which communicates with the main control unit, receives instructions from the main control unit, and sends interference instructions to the main control unit.

[0069] When the user performs electromagnetic disturbance simulation, the user inputs the electromagnetic disturbance simulation requirements or selects the electromagnetic disturbance simulation type through the display screen. The main control unit obtains the input data of the display screen in real time, and generates and sends instructions to the high-voltage unit according to the input data of the display screen. The high-voltage unit controls the discharge of the high-voltage capacitor according to the instructions transmitted by the main control unit.

[0070] In an embodiment of the present application, instruction generation and sending includes generation and sending of interference degree instructions and waveform disturbance degree instructions. The interference degree instruction is used to control the amplitude of electromagnetic disturbance, and the waveform disturbance instruction is used to control the amplitude and frequency of electromagnetic disturbance.

[0071] In an embodiment of the present application, the interference degree instruction includes the amplitude of the disturbance signal, which specifies the maximum voltage or current value of the disturbance signal. For example, it can be set to a peak value of 100V or 1A. The duration of the disturbance signal specifies the length of time the disturbance signal acts. For example, it can be set to 10μs or 1ms. The repetition rate of the disturbance signal specifies the frequency at which the disturbance signal repeats. For example, it can be set to 1Hz or 1kHz. The shape of the disturbance signal specifies the waveform type of the disturbance signal, such as a sine wave, a square wave, or a pulse wave. For example, a sine wave or a pulse wave can be selected.

[0072] In an embodiment of the present application, the waveform disturbance instruction includes the amplitude and frequency combination of the disturbance signal, which specifies the combination of the amplitude and frequency of the disturbance signal. For example, it can be set to a peak value of 100V and a frequency of 1MHz. The frequency range of the disturbance signal specifies the center frequency or frequency range of the disturbance signal. For example, it can be set to a frequency range of 1MHz to 1GHz. The bandwidth of the disturbance signal specifies the frequency bandwidth of the disturbance signal. For example, it can be set to a bandwidth of 100kHz. The modulation mode of the disturbance signal specifies whether the disturbance signal is modulated and the modulation method. For example, it can be set to AM modulation or FM modulation. The modulation parameters of the disturbance signal, if the disturbance signal is modulated, need to specify the modulation parameters, such as the modulation frequency or modulation degree. For example, it can be set to a modulation frequency of 1kHz and a modulation degree of 50%.

[0073] In the embodiment of the present application, the user selects the simulation type and sets the parameters on the touch screen. The touch screen sends these data to the main control unit in the form of electronic signals. After receiving the data, the main control unit parses and converts the parameters into an instruction format. The corresponding instructions are generated according to the parsed data. The main control unit sends the instructions to the high-voltage unit through the interface. After receiving the instructions, the high-voltage unit configures the circuit parameters and generates an electromagnetic disturbance signal. The high-voltage unit outputs the generated electromagnetic disturbance signal to the test area.

[0074] When the user sets the parameters himself, the user selects several specific electromagnetic disturbance simulation types on the touch screen, such as fast transient pulse group (EFT / Burst) and continuous wave (CW) radiation interference. The display input data is fast transient pulse group (EFT / Burst):

[0075] Amplitude: 2kV

[0076] Repetition rate: 1kHz

[0077] Pulse width: 0.5μs

[0078] Number of pulses: 5

[0079] Frequency range: 1MHz to 100MHz

[0080] The continuous wave (CW) radiated interference is:

[0081] Amplitude: 10V / m

[0082] Frequency: 100MHz

[0083] Duration: 10s

[0084] Furthermore, when the main control unit receives these inputs, it parses the data and converts it into instructions that the high voltage unit can understand. Here is an example of how the conversion is done:

[0085] Fast transient pulse group (EFT / Burst):

[0086] Instruction encoding:

[0087] Interference type: EFT

[0088] Amplitude: 2kV

[0089] Repetition rate: 1kHz

[0090] Pulse width: 0.5μs

[0091] Number of pulses: 5

[0092] Frequency range: 1MHz to 100MHz

[0093] Instruction format: EFT:2kV:1kHz:0.5μs:5:1MHz-100MHz

[0094] Continuous wave (CW) radiated interference:

[0095] Instruction encoding:

[0096] Interference type: CW

[0097] Amplitude: 10V / m

[0098] Frequency: 100MHz

[0099] Duration: 10s

[0100] Instruction format: CW:10V / m:100MHz:10s

[0101] Furthermore, the main control unit sends these instructions to the high-voltage unit through an appropriate communication protocol (such as RS-232, USB, Ethernet, etc.). After receiving the instructions, the high-voltage unit sets the circuit parameters according to the parameters in the instructions, and then generates corresponding electromagnetic interference signals.

[0102] In the embodiment of the present application, several fixed simulation types are set, including fast transient pulse group, continuous wave radiation immunity, surge, voltage drop, short interruption and voltage change. Fast transient pulse group simulates fast transient pulse group transmitted by power line or signal line. Such disturbance is usually caused by switch operation or lightning strike, etc. Continuous wave radiation immunity simulates continuous wave radiation immunity caused by radio frequency signal. Such disturbance is usually caused by radio signal. Surge simulates surge disturbance transmitted by power line or signal line. Such disturbance is usually caused by lightning or power failure. And voltage drop, short interruption and voltage change simulate voltage drop, short interruption and voltage change transmitted by power line. Such disturbance is usually caused by power quality problem.

[0103] For example, the user selects the "fast transient pulse group" simulation type on the touch screen and automatically sets the parameters: amplitude is 2kV, repetition rate is 1kHz, pulse width is 0.5μs, and number of pulses is 5. The main control unit obtains these parameters and converts them into the instruction format EFT:2kV:1kHz:0.5μs:5. The main control unit sends the instruction to the high-voltage unit. The high-voltage unit generates the corresponding electromagnetic disturbance signal according to the instruction.

[0104] The user selects the "Continuous Wave Radiated Immunity" simulation type on the touch screen and automatically sets the parameters: amplitude is 10V / m, frequency is 100MHz, and duration is 10s. The main control unit obtains these parameters and converts them into the instruction format Cw:10V / m:180NHz:18s. The main control unit sends the instruction to the high-voltage unit. The high-voltage unit generates the corresponding electromagnetic disturbance signal according to the instruction.

[0105] The user selects the "Surge" simulation type on the touch screen. The parameters are automatically set: amplitude is 4kV, rise time is 1.2μs, and fall time is 50μs. The main control unit obtains these parameters and converts them into the instruction format SURGE:4kV:1.2μs:5θμs. The main control unit sends the instruction to the high-voltage unit. The high-voltage unit generates the corresponding electromagnetic disturbance signal according to the instruction.

[0106] The user selects the "voltage drop, short interruption and voltage change" simulation type on the touch screen, and automatically sets the parameters: a voltage drop of 50% and a duration of 100ms. The main control unit obtains these parameters and converts them into instruction format. The main control unit sends the command to the high voltage unit, which generates the corresponding electromagnetic disturbance signal according to the command.

[0107] In an embodiment of the present application, the analysis and reporting module acquires the response data of the electronic device under electromagnetic disturbance in real time, and analyzes and processes the data. The analysis and reporting module includes a data acquisition card, an analysis unit and a report generator. The data acquisition card is responsible for acquiring the response signal of the electronic device under test in real time, and transmitting the acquired data to the analysis unit. The analysis unit processes the acquired data, including time domain analysis, frequency domain analysis and statistical analysis of the signal, so as to evaluate the performance of the electronic device under different electromagnetic disturbances.

[0108] In the embodiment of the present application, the test system is initialized, and the electronic device to be tested (vehicle electronic control system) is connected to the temperature and humidity module. The temperature and humidity module is set to simulate specific environmental conditions (eg, temperature 25°C, humidity 50% RH).

[0109] Prepare fast surge generators and other related components to generate specific types of electromagnetic disturbances, use fast surge generators to generate the required electromagnetic disturbance signals, and adjust the high-voltage capacitor discharge parameters to obtain specific disturbance waveforms. In the automotive industry, the following types may be of particular concern: Electromagnetic disturbances generated by the ignition system: high-frequency pulses generated by the car's ignition system. Radio interference: radio frequency signals from the on-board communication system. Voltage changes during engine startup: when the engine is started, the power supply voltage may change significantly.

[0110] The data acquisition card starts to collect the response signal of the electronic device to be tested in real time. The collected data includes but is not limited to voltage, current, frequency response, etc.;

[0111] Analyze the changes of the collected voltage or current signal over time, and convert the time domain signal into a frequency domain signal through Fourier transform to identify the main frequency components.

[0112] Calculate the signal's mean, standard deviation, peak value and other statistics to evaluate the signal's stability.

[0113] Generate a detailed test report based on the analysis results, which includes information such as test conditions, test results, and performance evaluation.

[0114] Specifically, assuming that the collected voltage signal is v(t), where t is time, the root mean square value (RMS) of the signal can be calculated to evaluate the signal strength:

[0115]

[0116] Where T is the length of a complete cycle. Calculate the maximum and minimum values:

[0117] V max =max(v(t)),V min =min(v(t))

[0118] For frequency domain analysis, use the Discrete Fourier Transform (DFT) or Fast Fourier Transform (FFT) to convert the signal to the frequency domain:

[0119]

[0120] Where f is the frequency, N is the number of sampling points, and x(n) is the value of the time domain signal at the nth sampling point. Calculate the spectral density:

[0121] |X(f)| 2

[0122] average value:

[0123]

[0124] variance:

[0125]

[0126] Standard Deviation:

[0127]

[0128] For example, assume that a test is being conducted to evaluate the immunity of an onboard electronic control system within a specific frequency range. A fast transient surge generator is used to generate a sine waveform with a frequency of 100 kHz as an electromagnetic disturbance signal.

[0129] The data acquisition card collects 1000 samples per second for 1 second. Perform FFT analysis on the collected signal to obtain a spectrum density plot. Observe the peak at 100kHz in the spectrum density plot. Calculate the RMS value, maximum value, and minimum value of the signal. Perform statistical analysis, such as calculating the mean, variance, and standard deviation. Generate a report that includes the test setup, statistical analysis results of the collected data, spectrum plot, etc.

[0130] In the embodiment of the present application, the electronic transformer testing process is as follows:

[0131] Preparation stage: Place the device to be tested in the temperature and humidity module and connect all necessary test cables and interfaces. Set the temperature and humidity parameters of the temperature and humidity module according to the test requirements.

[0132] Electromagnetic disturbance simulation stage: Start the electromagnetic disturbance module and generate the required electromagnetic disturbance signals through the fast transient surge generator and the immunity (CS) generator. These signals are coupled to the device under test through the coupling clamp module to simulate the electromagnetic disturbance in the actual working environment.

[0133] Performance test phase: While simulating electromagnetic disturbance, the performance of the equipment under test is tested and evaluated through report analyzers and other equipment. The test content includes but is not limited to the electrical performance and anti-interference ability of the equipment under test.

[0134] Result analysis phase: Evaluate and analyze the performance of the device under test based on the test data. By comparing the test results in different environments, you can have a more comprehensive understanding of the performance of the device under test and its adaptability in different environments.

[0135] In summary, the present invention proposes a multi-physical environment electromagnetic disturbance simulation test system, which can more comprehensively simulate the complex electromagnetic interference and temperature and humidity conditions that electronic equipment may encounter in the actual working environment, thereby improving the accuracy and reliability of the test. By accurately controlling the amplitude, frequency and waveform of the electromagnetic disturbance, as well as the temperature and humidity parameters, the performance and stability of electronic equipment under extreme conditions can be more effectively evaluated. In addition, the present invention also provides a method for real-time monitoring and analysis of the response data of the device under test, which can quickly generate a detailed analysis report, providing strong support for design improvement and fault diagnosis.

[0136] This embodiment also provides a multi-physical environment electromagnetic disturbance simulation test method, including:

[0137] Obtain the electromagnetic disturbance requirements of the user end and generate machine instructions corresponding to the electromagnetic disturbance requirements;

[0138] Generate the corresponding interference environment according to the machine instructions. The interference environment includes electromagnetic interference environment and temperature and humidity environment;

[0139] Obtain the response data of the target electronic device in the interference environment, generate an analysis report based on the response data, and complete the electromagnetic interference simulation test.

[0140] The above-mentioned unit modules may be embedded in or independent of a processor in a computer device in the form of hardware, or may be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to the above-mentioned modules.

[0141] This embodiment also provides a computer device, which may be a terminal, and its internal structure diagram may be as shown in FIG. Figure 8 As shown. The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be achieved through WIFI, an operator network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a multi-physical environment electromagnetic disturbance simulation test method is implemented. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a key, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse, etc.

[0142] This embodiment further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0143] Obtain the electromagnetic disturbance requirements of the user end and generate machine instructions corresponding to the electromagnetic disturbance requirements;

[0144] Generate the corresponding interference environment according to the machine instructions. The interference environment includes electromagnetic interference environment and temperature and humidity environment;

[0145] Obtain the response data of the target electronic device in the interference environment, generate an analysis report based on the response data, and complete the electromagnetic interference simulation test.

[0146] Example 2

[0147] Reference Figure 2-Figure 7 , which is an embodiment of the present invention, provides a multi-physical environment electromagnetic disturbance simulation test system and method. In order to verify the beneficial effects of the present invention, scientific demonstration is carried out through experiments.

[0148] Electronic transformer testing process:

[0149] Preparation stage: Place the device to be tested in the temperature and humidity module and connect all necessary test cables and interfaces. Set the temperature and humidity parameters of the temperature and humidity module according to the test requirements.

[0150] Electromagnetic disturbance simulation stage: Start the electromagnetic disturbance module and generate the required electromagnetic disturbance signals through the fast transient surge generator and the immunity (CS) generator. These signals are coupled to the device under test through the coupling clamp module to simulate the electromagnetic disturbance in the actual working environment.

[0151] Performance test phase: While simulating electromagnetic disturbance, the performance of the equipment under test is tested and evaluated through report analyzers and other equipment. The test content includes but is not limited to the electrical performance and anti-interference ability of the equipment under test.

[0152] Result analysis phase: Evaluate and analyze the performance of the device under test based on the test data. By comparing the test results in different environments, you can have a more comprehensive understanding of the performance of the device under test and its adaptability in different environments.

[0153] The reliability of this system is verified as follows:

[0154] Embodiment 1: Replace the device under test with a collector and a merging unit, turn off the switch, connect the signal generator and the fast transient surge generator to the switch, connect the fast transient capacitive coupling clamp, the temperature range is -50 to 80°C, and the humidity range is ≤95%RH.

[0155] Table 1: Fast signal line test table

[0156]

[0157] Embodiment 2: Replace the device under test with a collector and a merging unit, and turn off the switch connecting the collector and the CS generator. The temperature range is -50 to 80° C.; the humidity range is ≤95% RH.

[0158] Table 2: Surge signal line (line-ground coupling) test table

[0159] temperature humidity Peak voltage Coupling Network frequency Phenomenon <![CDATA[ 25 ]]> <![CDATA[ 95 、 80 ]]> ±3kV Signal line 5 each normal 31 95、80 ±3kV Signal line 5 each normal 37 95、80 ±3kV Signal line 5 each normal 43 95、80 ±3kV Signal line 5 each normal 49 95、80 ±3kV Signal line 5 each normal 55 95、80 ±3kV Signal line 5 each normal

[0160] Embodiment 3: Replace the device under test with a collector and a merging unit, turn off the signal generator and the fast transient surge generator connection switch, connect the electromagnetic coupling clamp, temperature range: -50 to 80°C; humidity range: ≤95%RH.

[0161] Table 3: Conducted disturbance signal line test table

[0162]

[0163]

[0164] Table 1-3 verifies that this system can test different interference sources under the temperature and humidity module.

[0165] In summary, the multi-physical environment electromagnetic disturbance simulation test system and method of the present invention have significant advantages. First, by simulating electromagnetic disturbance in the actual working environment, the performance of electronic equipment in a complex electromagnetic environment can be more accurately evaluated. Secondly, the system can generate a corresponding test environment according to the electromagnetic disturbance requirements of the user end, thereby providing customized testing services. In addition, the system can also generate analysis reports to help users fully understand the adaptability and performance of the device in different environments.

[0166] In practical applications, the system and method of the present invention have broad application prospects. For example, in the field of aerospace, electronic equipment needs to work under extreme temperature and humidity conditions. The present invention can provide reliable test results to ensure the stability and reliability of the equipment in harsh environments. In the field of automotive electronics, with the increasing degree of automotive electronics, electromagnetic compatibility testing has become particularly important. The present invention can help automobile manufacturers discover potential problems in the product design stage and improve product quality and safety.

[0167] In addition, the system and method of the present invention can also be applied to the fields of smart home, medical equipment, industrial automation, etc. By simulating electromagnetic disturbances in different environments, it can be ensured that these devices have good electromagnetic compatibility during actual use, thereby improving the stability and reliability of the entire system.

[0168] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

[0169] Those skilled in the art will appreciate that the embodiments of the present application can be provided as methods, systems, or computer program products. Therefore, the present application can adopt the form of complete hardware embodiments, complete software embodiments, or embodiments in combination with software and hardware. Moreover, the present application can adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that contain computer-usable program code. The scheme in the embodiments of the present application can be implemented in various computer languages, for example, object-oriented programming language Java and literal scripting language JavaScript, etc.

[0170] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0171] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0172] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1The steps for the functions specified in one or more boxes.

[0173] Although the preferred embodiments of the present application have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications falling within the scope of the present application.

[0174] Obviously, those skilled in the art can make various changes and modifications to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.

Claims

1. A multi-physical environment electromagnetic disturbance simulation test system, characterized in that: include: Several switches, a first isolation transformer, a second isolation transformer, a signal generator, a filter, a decoupling clamp, an electromagnetic disturbance module, a temperature and humidity module, and an analysis report module; The temperature and humidity module includes a coupling clamp module, which includes a fast-instantaneous capacitive coupling clamp and an electromagnetic coupling clamp, and the target electronic device to be tested is electrically connected to the temperature and humidity module; The electromagnetic disturbance module includes a fast transient surge generator and an immunity generator; The fast transient surge generator includes a linear power supply, a high-voltage power supply, a high-voltage capacitor and a high-voltage unit which are electrically connected in sequence. The linear power supply is electrically connected to a main control unit, the main control unit is electrically connected to the high-voltage power supply, the high-voltage unit and a phase switch, the high-voltage unit and the phase switch are both electrically connected to a coupling-decoupling network, and the main control unit is electrically connected to a display screen.

2. The multi-physical environment electromagnetic disturbance simulation test system according to claim 1, characterized in that: Also includes: The first isolation transformer is directly electrically connected to the filter, the first isolation transformer is used to provide a stable power supply for the electronic device to be tested and the electromagnetic disturbance module, and the filter is used to preset filtering parameters to eliminate the influence of the external power grid on the test; The second isolation transformer is electrically connected to the signal generator through a switch, and the second isolation transformer is electrically connected to the analysis and reporting module, and is used to power the signal generator and the analysis and reporting module. At the same time, the second isolation transformer is electrically connected to the signal generator and the decoupling clamp and the electronic device to be tested in sequence through the switch; The coupling clamp module is used to couple the disturbance signal generated by the electromagnetic disturbance module to the electronic device to be tested, so as to simulate the electromagnetic disturbance in the actual working environment. The coupling clamp and the electronic device to be tested are both arranged in the temperature and humidity module; The electromagnetic disturbance module is used to simulate the electronic test environment under different working conditions, and the temperature and humidity module is used to simulate the temperature and humidity environment of the electronic device to be tested under different working conditions.

3. The multi-physical environment electromagnetic disturbance simulation test system according to claim 2, characterized in that: The fast transient surge generator comprises: The linear power supply provides stable DC energy for the control unit and the high-voltage power supply. The high-voltage power supply charges and stores energy for the high-voltage capacitor through the high-voltage voltage doubling technology. When the high-voltage capacitor is fully charged, the high-voltage unit sends a charging completion instruction to the main control unit. After the main control unit obtains the charging completion instruction, it sends an electromagnetic disturbance instruction to the display screen. When the display screen displays the electromagnetic disturbance option, the user can perform electromagnetic disturbance simulation; When the user performs electromagnetic disturbance simulation, the user inputs the electromagnetic disturbance simulation requirement or selects the electromagnetic disturbance simulation type through the display screen. The main control unit obtains the input data of the display screen in real time, and generates and sends instructions to the high-voltage unit according to the input data of the display screen. The high-voltage unit controls the discharge of the high-voltage capacitor according to the instructions transmitted by the main control unit.

4. The multi-physical environment electromagnetic disturbance simulation test system according to claim 3, characterized in that: The fast transient surge generator also includes: when the high voltage capacitor discharges according to the instruction of the high voltage unit, the generated target discharge waveform is coupled to the access line of the electronic device to be tested through a coupling and decoupling network, and the access line at least includes a power line and a signal line.

5. The multi-physical environment electromagnetic disturbance simulation test system according to claim 4, characterized in that: The anti-interference generator is used to control a control unit, which communicates with the main control unit, receives instructions from the main control unit, and sends interference instructions to the main control unit.

6. The multi-physical environment electromagnetic disturbance simulation test system according to claim 5, characterized in that: Also includes: When the user performs electromagnetic disturbance simulation, the electromagnetic disturbance simulation requirement is input or the electromagnetic disturbance simulation type is selected through the display screen, and the main control unit obtains the input data of the display screen in real time, and generates and sends instructions to the high-voltage unit according to the input data of the display screen, and the high-voltage unit controls the discharge of the high-voltage capacitor according to the instructions transmitted by the main control unit; The instruction generation and sending includes the generation and sending of an interference degree instruction and a waveform disturbance degree instruction. The interference degree instruction is used to control the amplitude of electromagnetic disturbance, and the waveform disturbance instruction is used to control the amplitude and frequency of electromagnetic disturbance.

7. The multi-physical environment electromagnetic disturbance simulation test system according to claim 6, characterized in that: The analysis and reporting module acquires the response data of the electronic device under test under electromagnetic disturbance in real time, and analyzes and processes the data. The analysis and reporting module includes a data acquisition card, an analysis unit and a report generator. The data acquisition card is responsible for acquiring the response signal of the electronic device under test in real time, and transmitting the acquired data to the analysis unit. The analysis unit processes the acquired data, including time domain analysis, frequency domain analysis and statistical analysis of the signal, so as to evaluate the performance of the electronic device under different electromagnetic disturbances.

8. A multi-physical environment electromagnetic disturbance simulation test method, characterized in that: include: Obtaining electromagnetic disturbance requirements of a user terminal and generating machine instructions corresponding to the electromagnetic disturbance requirements; Generate a corresponding disturbance environment according to the machine instruction, wherein the disturbance environment includes an electromagnetic disturbance environment and a temperature and humidity environment; The response data of the target electronic device in the disturbance environment is obtained, and an analysis report is generated according to the response data to complete the electromagnetic disturbance simulation test.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to claim 8 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to claim 8 are implemented.

Images