A multi-point withstand voltage test equipment for aluminum substrate

Abstract

The present invention relates to the field of aluminum substrate testing, and in particular to a multi-point withstand voltage test device for aluminum substrates, including a test platform, an electric push rod, a pressure plate and a support platform; the test platform is connected to a mounting frame; the mounting frame is connected to an electric push rod; the telescopic end of the electric push rod is fixedly connected to a pressure plate; and the support platform is installed on the test platform. The present invention realizes that a conductive ejector is pre-contacted with an aluminum substrate in an uncharged state, and then a test current is connected to the conductive ejector, so as to avoid the high-voltage current breaking through the air and generating sparks when the conductive ejector in a charged state contacts the aluminum substrate, thereby damaging the surface of the aluminum substrate and affecting the quality of the aluminum substrate; and in the above steps, the withstand voltage tester continuously outputs a high-voltage current, so as to avoid the need to restart the voltage boost when replacing the next aluminum substrate for testing, thereby reducing the testing efficiency.

Description

Technical Field

[0001] The invention relates to the field of aluminum substrate testing, and in particular to a multi-point withstand voltage testing device for an aluminum substrate. Background Art

[0002] An aluminum substrate is a printed circuit board with aluminum as the base material and copper foil as the conductive circuit. The withstand voltage test is one of the essential inspection items for forming an aluminum substrate. The withstand voltage test of the existing aluminum substrate is performed by contacting the positive stylus of the withstand voltage tester with the copper foil conductive area, and the negative stylus with the aluminum substrate to form a loop, applying a high voltage to the aluminum substrate and monitoring to obtain the test results. However, the copper foil conductive area on the surface of the aluminum substrate is in different positions, and the positive stylus of the tester needs to be constantly moved during the inspection process. After the positive stylus carrying high voltage changes its position, at the moment of contact with the copper foil conductive area, the high voltage current breaks through the air and easily generates sparks, which damages the surface of the aluminum substrate and affects the quality of the aluminum substrate. Summary of the invention

[0003] In order to overcome the disadvantage that when the positive stylus of the withstand voltage tester contacts the conductive area of ​​the copper foil, the high voltage current breaks through the air and easily generates sparks, damages the surface of the aluminum substrate, and affects the quality of the aluminum substrate, the present invention provides a multi-point withstand voltage test device for the aluminum substrate.

[0004] A multi-point withstand voltage test device for an aluminum substrate comprises a test platform, an electric push rod, a pressure plate and a supporting platform; the test platform is connected to a mounting frame; the mounting frame is connected to an electric push rod; the telescopic end of the electric push rod is fixedly connected to a pressure plate; a first conductive plate is mounted on the pressure plate; the supporting platform is mounted on the test platform; a second conductive plate is mounted on the supporting platform; a withstand voltage tester is arranged on the test platform; the positive pole of the withstand voltage tester is connected to the first conductive plate, and the negative pole of the withstand voltage tester is connected to the second conductive plate; and a first elastic member, a mounting plate, a second elastic member are provided. Parts and conductive ejector pins; a plurality of guide rods are fixedly connected to the pressure plate; a first elastic part is fixedly connected to each guide rod; a mounting plate is commonly connected to all the guide rods; the mounting plate is fixedly connected to all the first elastic parts; a plurality of conductive rods are fixedly connected to the first conductive plate; a third conductive plate is mounted on the mounting plate; a plurality of conductive ejector pins are connected to the mounting plate; the conductive ejector pins are composed of a metal inner core and a contact head; a rubber sleeve is mounted on the metal inner core; a plurality of second elastic parts are fixedly connected to the mounting plate; each second elastic part is fixedly connected to a corresponding conductive ejector pin.

[0005] Furthermore, the lower side of the contact head is configured to be spherical.

[0006] Furthermore, an insulating plate is also included.

[0007] Furthermore, the upper side of the rubber sleeve is arranged at an oblique angle.

[0008] Furthermore, it also includes a rubber cover; each metal inner core is connected to a rubber cover; the diameter of the rubber cover is larger than the diameter of the metal inner core; and holes corresponding to the rubber covers are opened on the insulating plate.

[0009] Furthermore, the rubber cover is threadedly connected to the metal inner core.

[0010] Furthermore, a socket adapted to the conductive rod is provided on the third conductive plate.

[0011] Furthermore, it also includes an isolation component, which includes a slide rail and an isolation cover; a plurality of slide rails are installed on the mounting plate; each slide rail corresponds to a row of conductive ejector pins; each slide rail is connected to two isolation covers; the upper side of the isolation cover is made of plastic material, and the lower side is made of rubber material.

[0012] Furthermore, the lower side of the isolation cover is arranged in an arc shape.

[0013] Furthermore, it also includes a pneumatic suction cup; a plurality of pneumatic suction cups are installed on the mounting plate; and all the pneumatic suction cups are connected to an air pump.

[0014] Beneficial effects of the present invention: The present invention realizes that the conductive ejector is in contact with the aluminum substrate in advance in an uncharged state, and then the test current is connected to the conductive ejector, so as to avoid that the high-voltage current breaks through the air and generates sparks when the conductive ejector in a charged state contacts the aluminum substrate, thereby damaging the surface of the aluminum substrate and affecting the quality of the aluminum substrate; and in the above steps, the withstand voltage tester continuously outputs the high-voltage current, thereby avoiding the need to restart the voltage boost when the next aluminum substrate is replaced for testing, thereby reducing the testing efficiency;

[0015] The conductive ejector pin in contact with the lamp bead is moved up relative to the mounting plate to disconnect the metal inner core from the third conductive plate, so that the conductive ejector pin in contact with the lamp bead cannot form a loop, thereby avoiding the conductive ejector pin in contact with the lamp bead being too close to the aluminum substrate, which may still generate electric sparks;

[0016] The conductive ejector pins not in contact with the aluminum substrate are wrapped and isolated by an isolation cover to prevent the conductive ejector pins not in contact with the aluminum substrate from approaching the second conductive plate and generating an arc, thereby causing oxidation of the contact heads of the conductive ejector pins and the surface of the second conductive plate, thereby affecting the conductivity.

[0017] After the inspection is completed, the aluminum substrate is sucked up by a pneumatic suction cup for easy removal and unloading. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a schematic diagram of the first three-dimensional structure of the multi-point withstand voltage test equipment for aluminum substrates of the present invention;

[0019] Figure 2 A schematic diagram of a second three-dimensional structure of the multi-point withstand voltage test equipment for an aluminum substrate of the present invention;

[0020] Figure 3 It is a schematic diagram of the three-dimensional structure of the electric push rod, the first elastic member, the pressing plate and the mounting plate combination of the present invention;

[0021] Figure 4 It is a schematic diagram of the three-dimensional structure of the combination of the first elastic member, the pressing plate and the mounting plate of the present invention, wherein the pressing plate is cut open;

[0022] Figure 5 It is a schematic diagram of the three-dimensional structure of the combination of the pressing plate, the mounting plate and the conductive ejector pin of the present invention;

[0023] Figure 6 For the present invention Figure 5 The enlarged view of point A in the middle;

[0024] Figure 7 It is a schematic diagram of the three-dimensional structure of the second elastic member and the conductive ejector pin combination of the present invention;

[0025] Figure 8 It is a schematic diagram of the three-dimensional structure of the conductive ejector pin, rubber sleeve and rubber cover combination of the present invention, wherein the rubber sleeve is cut open;

[0026] Fig. 9 An exploded view of the combination of the pressing plate, the mounting plate, the third conductive plate and the insulating plate of the present invention;

[0027] Fig.10 It is a schematic diagram of the three-dimensional structure of the isolation assembly of the present invention;

[0028] Fig.11 It is a left side view of the combination of the pressing plate, the mounting plate, the conductive ejector pin and the isolation assembly of the present invention;

[0029] Fig.12 It is a schematic diagram of the three-dimensional structure of the combination of the pressing plate, the mounting plate and the pneumatic suction cup of the present invention.

[0030] Figure numbers: 1-testing table, 1001-voltage tester, 1002-mounting frame, 2-pressing plate, 2001-first conductive plate, 2002-conductive rod, 3-supporting table, 3001-second conductive plate, 4-mounting plate, 4001-third conductive plate, 4002-insulating plate, 5-conductive ejector pin, 5001-metal inner core, 5002-contact head, 5003-rubber sleeve, 5004-rubber cover, 101-electric push rod, 102-first elastic member, 103-second elastic member, 21-slide rail, 22-isolation cover, 31-pneumatic suction cup, 1111-aluminum substrate. DETAILED DESCRIPTION

[0031] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0032] Example 1: Figure 1-Figure 9As shown, a multi-point withstand voltage test equipment for an aluminum substrate includes a test platform 1, an electric push rod 101, a pressure plate 2 and a supporting platform 3; a mounting frame 1002 is bolted to the test platform 1; an electric push rod 101 is bolted to the upper side of the mounting frame 1002; a pressure plate 2 is fixedly connected to the telescopic end of the electric push rod 101; a first conductive plate 2001 is installed on the pressure plate 2; a supporting platform 3 is installed on the test platform 1; a second conductive plate 3001 is installed on the supporting platform 3; a withstand voltage tester 1001 is arranged on the test platform 1; the positive pole of the withstand voltage tester 1001 is connected to the first conductive plate 2001, and the negative pole of the withstand voltage tester 1001 is connected to the second conductive plate 3001;

[0033] It also includes a first elastic member 102, a mounting plate 4, a second elastic member 103 and a conductive ejector pin 5; four guide rods are fixedly connected to the lower side of the pressure plate 2; each guide rod is fixedly connected to a first elastic member 102; the first elastic member 102 is a spring; a mounting plate 4 is slidably connected to all guide rods; the mounting plate 4 is fixedly connected to all first elastic members 102; a plurality of conductive rods 2002 are fixedly connected to the lower side of the first conductive plate 2001; a third conductive plate 4001 is mounted on the mounting plate 4; a plurality of conductive ejector pins 5 are slidably connected to the mounting plate 4; the conductive ejector pin 5 consists of a metal inner core 5001 and a contact head 5002; a rubber sleeve 5003 is mounted on the outer side of the metal inner core 5001; a plurality of second elastic members 103 are fixedly connected to the lower side of the mounting plate 4; the second elastic member 103 is a spring; each second elastic member 103 is fixedly connected to a corresponding conductive ejector pin 5.

[0034] The lower side of the contact head 5002 is spherical, which reduces friction and increases service life.

[0035] An insulating plate 4002 is also included to prevent the first conductive plate 2001 and the third conductive plate 4001 from being too close to each other and generating an arc.

[0036] The upper side of the rubber sleeve 5003 is arranged at an oblique angle; when the conductive ejector pin 5 is replaced, it is convenient for the rubber sleeve 5003 to be inserted upward into the mounting plate 4 .

[0037] It also includes a rubber cover 5004; each metal core 5001 is connected to a rubber cover 5004; to prevent the upper side of the metal core 5001 and the first conductive plate 2001 from being too close to generate an arc; the diameter of the rubber cover 5004 is larger than the diameter of the metal core 5001; to prevent the conductive pin 5 from falling off the mounting plate 4; and the insulating plate 4002 is provided with a hole corresponding to the rubber cover 5004.

[0038] The rubber cover 5004 is threadedly connected to the metal inner core 5001, so that the metal inner core 5001 can be disassembled and replaced when it is damaged.

[0039] The third conductive plate 4001 is provided with a socket matched with the conductive rod 2002; the conductive rod 2002 is inserted into the socket to increase the contact area with the third conductive plate 4001 and improve the connection effect.

[0040] When the existing aluminum substrate 1111 is subjected to a withstand voltage test, since the copper foil conductive area on the surface of the aluminum substrate 1111 is at different positions, the positive stylus of the tester needs to be continuously moved during the detection process to perform multi-point testing. After the positive stylus carrying high voltage changes position, sparks are easily generated when it contacts the copper foil conductive area, thereby damaging the surface of the aluminum substrate 1111 and affecting the quality of the aluminum substrate 1111.

[0041] In view of the above problems, the present invention provides a multi-point withstand voltage test device for an aluminum substrate 1111, and the operating steps are as follows:

[0042] The worker places the aluminum substrate 1111 on the second conductive plate 3001 of the support platform 3, connects the positive electrode of the withstand voltage tester 1001 to the first conductive plate 2001, and the negative electrode to the second conductive plate 3001, then starts the withstand voltage tester 1001 to increase the pressure, and performs the preparation work for the withstand voltage test; then controls the electric push rod 101 to extend, drives the pressing plate 2 and the parts thereon to move downward, and when the conductive ejector pin 5 contacts the upper surface of the aluminum substrate 1111, the conductive ejector pin 5 is not in a charged state at this time, and the electric push rod 101 continues to push the pressing plate 2 downward. At this time, the stiffness coefficient of the second elastic member 103 is greater than the stiffness coefficient of the first elastic member 102, and then the mounting plate 4 and the conductive ejector pin 5 do not move, and the pressing plate 2 will squeeze and compress the first elastic member 102. The conductive member 102 is formed on the first conductive plate 2001, and then the pressing plate 2 is moved closer to the mounting plate 4 until the conductive rod 2002 on the first conductive plate 2001 is inserted into the jack of the third conductive plate 4001, so that the first conductive plate 2001 is connected with the third conductive plate 4001, the metal inner core 5001 of each conductive ejector pin 5 is in contact and connected with the third conductive plate 4001, the contact head 5002 is in contact with the upper surface of the aluminum substrate 1111, and the lower surface of the aluminum substrate 1111 is in contact with the second conductive plate 3001, thereby the withstand voltage tester 1001 is connected with the aluminum substrate 1111 to form a loop, the high voltage current of the withstand voltage tester 1001 passes through the aluminum substrate 1111, the withstand voltage tester 1001 obtains current and voltage data, and the withstand voltage test of the aluminum substrate 1111 is completed.

[0043] It can be seen from the above steps that the conductive ejector pin 5 is in contact with the aluminum substrate 1111 in advance in an uncharged state, and then the test current is connected to the conductive ejector pin 5, so as to avoid the high-voltage current breaking through the air and generating sparks when the conductive ejector pin 5 in a charged state contacts the aluminum substrate 1111, thereby damaging the surface of the aluminum substrate 1111 and affecting the quality of the aluminum substrate 1111; and in the above steps, the withstand voltage tester 1001 continuously maintains the output of the high-voltage current, so as to avoid the need to restart the voltage boost when replacing the next aluminum substrate 1111 for testing, thereby reducing the detection efficiency.

[0044] After the detection is completed, the electric push rod 101 is controlled to retract, driving the pressure plate 2 and the parts thereon to move upward. During this process, the conductive rod 2002 is out of contact with the third conductive plate 4001, and then the third conductive plate 4001 and the conductive ejector pin 5 are in a power-off state. The first conductive plate 2001 and the conductive rod 2002 are still connected to the positive pole of the withstand voltage tester 1001 and are in a pressurized state, which is convenient for the subsequent detection of the next aluminum substrate 1111. Finally, the pressure plate 2 is moved up and reset.

[0045] The aluminum substrate 1111 is usually used to make LED circuit boards, and a number of lamp beads are usually welded on the surface for voltage resistance testing. When the contact head 5002 contacts the surface of the lamp bead, the conductive pin 5 cannot connect to the aluminum substrate 1111 through the lamp bead to form a loop. However, the lamp bead is small in size, and the contact head 5002 is close to the aluminum substrate 1111. There is still a possibility of electric sparks between the high-voltage contact head 5002 and the aluminum substrate 1111, which in turn causes damage to the surface of the aluminum substrate 1111. The lamp beads are soldered to the surface of the aluminum substrate 1111 by tin soldering. The melting point of tin is low, and the energy temperature generated by the electric sparks can easily melt the tin of the welded lamp beads, causing the lamp beads to be misaligned.

[0046] Then, when the pressing plate 2 drives the mounting plate 4 and the conductive ejector pin 5 to move downward, the lamp bead is higher than the upper surface of the aluminum substrate 1111. After the contact head 5002 contacts the lamp bead, the pressing plate 2 continues to move downward. At this time, the conductive ejector pin 5 in contact with the lamp bead will move upward relative to the mounting plate 4, and then the conductive ejector pin 5 compresses the corresponding second elastic member 103. In this process, Figure 6 As shown, the conductive ejector pin 5 moves upward relative to the mounting plate 4, the metal inner core 5001 will be out of contact with the third conductive plate 4001, and then the metal inner core 5001 will be disconnected from the third conductive plate 4001, and the conductive ejector pin 5 in contact with the lamp bead will not be able to form a loop, thereby avoiding the conductive ejector pin 5 in contact with the lamp bead and being close to the aluminum substrate 1111, which still has the possibility of generating electric sparks; and after the conductive ejector pin 5 moves upward relative to the mounting plate 4, the rubber sleeve 5003 replaces the metal inner core 5001 to contact the third conductive plate 4001, and the original contact portion between the third conductive plate 4001 and the metal inner core 5001 is closed, and the metal inner core 5001 and the third conductive plate 4001 are insulated and isolated, so as to avoid the generation of an arc between the metal inner core 5001 and the third conductive plate 4001, so that the metal inner core 5001 is connected to the third conductive plate 4001 and is charged.

[0047] It should be noted that the insulating plate 4002 is used to isolate the first conductive plate 2001 and the third conductive plate 4001 to prevent an arc from being generated between the first conductive plate 2001 and the third conductive plate 4001 when the pressure plate 2 and the mounting plate 4 are close to each other, so that the first conductive plate 2001 and the third conductive plate 4001 are connected, causing the conductive pin 5 to be always in a charged state; at the same time, the rubber sleeve 5003 isolates the metal core 5001 from the first conductive plate 2001 to prevent the metal core 5001 from being close to the first conductive plate 2001 and generating an arc.

[0048] After long-term use, oxidation damage occurs at the contact position between the metal inner core 5001 and the third conductive plate 4001, which affects the up and down sliding of the metal inner core 5001 and the conductive effect, resulting in errors in the test. In addition, since each conductive ejector pin 5 can be turned on and off individually, the damage of each metal inner core 5001 is different. At the same time, it is costly to replace all the conductive ejector pins 5, which wastes parts resources. Therefore, the rubber cover 5004 is set to be threadedly connected to the metal inner core 5001. The worker uses a multimeter to detect the current flow effect between the metal inner core 5001 and the third conductive plate 4001. The user can check the contact position between each metal core 5001 and the third conductive plate 4001 regularly, and replace the conductive thimble 5 corresponding to the oxidized metal core 5001, so as to avoid affecting the up and down sliding and conductive effect of the metal core 5001, resulting in errors in testing. At the same time, only the damaged conductive thimble 5 needs to be replaced, which saves costs.

[0049] Embodiment 2: Based on embodiment 1, Figure 2 and Figure 10-11 As shown, an isolation component is also included, and the isolation component includes a slide rail 21 and an isolation cover 22; a plurality of slide rails 21 are installed on the lower side of the mounting plate 4; each slide rail 21 corresponds to a row of conductive ejector pins 5; each slide rail 21 is symmetrically slidably connected to two isolation covers 22; the upper side of the isolation cover 22 is made of plastic material, and the lower side is made of rubber material.

[0050] The lower side of the isolation cover 22 is arranged in an arc shape, so as to facilitate its deformation after being compressed.

[0051] When the size of the aluminum substrate 1111 to be inspected is smaller than the coverage range of the conductive ejector pin 5, part of the conductive ejector pin 5 cannot contact the aluminum substrate 1111. When this part of the conductive ejector pin 5 is in a charged state and close to the second conductive plate 3001, an arc is easily generated, causing the contact head 5002 of this part of the conductive ejector pin 5 and the surface of the second conductive plate 3001 to oxidize, affecting the conductivity.

[0052] Therefore, when the worker selects an aluminum substrate 1111 that is smaller than the coverage of the conductive ejector pin 5 for testing, the worker pushes the corresponding isolation cover 22 to slide along the slide rail 21 toward the conductive ejector pin 5 according to the size of the aluminum substrate 1111, and then wraps the conductive ejector pin 5 that is not in contact with the aluminum substrate 1111 through the isolation cover 22. Therefore, when the conductive ejector pin 5 moves down and approaches the second conductive plate 3001, the isolation cover 22 isolates the conductive ejector pin 5 from the second conductive plate 3001, and an arc cannot be generated, thereby preventing the conductive ejector pin 5 that is not in contact with the aluminum substrate 1111 in a charged state from approaching the second conductive plate 3001 and generating an arc, so that the contact head 5002 of this part of the conductive ejector pin 5 and the surface of the second conductive plate 3001 are oxidized, thereby affecting the conductivity.

[0053] It should be noted that the lower side of the isolation cover 22 is made of rubber material, and the isolation cover 22 surrounding the conductive ejector pin 5 may contact the edge of the aluminum substrate 1111. When the isolation cover 22 contacts the aluminum substrate 1111, it is compressed and deformed to avoid affecting the downward movement of the mounting plate 4. Example

[0054] On the basis of Example 2, Fig.12 As shown, it also includes a pneumatic suction cup 31; a plurality of pneumatic suction cups 31 are installed on the lower side of the mounting plate 4; the lower side of the pneumatic suction cup 31 is flush with the lower side of the conductive ejector pin 5; all the pneumatic suction cups 31 are connected to an air pump.

[0055] After the inspection is completed, since the bottom surface of the aluminum substrate 1111 is flat and close to the surface of the second conductive plate 3001, it is not easy to pick up. If the aluminum substrate 1111 is slid on the surface of the second conductive plate 3001 to the edge of the supporting platform 3 and then picked up, the aluminum substrate 1111 is easily worn. Then, when the mounting plate 4 moves down and the conductive ejector pin 5 contacts the aluminum substrate 1111, the pneumatic suction cup 31 also contacts the aluminum substrate 1111. Then, the air pump is controlled to make the pneumatic suction cup 31 adsorb the aluminum substrate 1111. When the inspection is completed, the electric push rod 101 contracts and drives the pressure plate 2 and the parts thereon to move upward, and the pneumatic suction cup 31 drives the aluminum substrate 1111 to move upward. Then, the worker holds the aluminum substrate 1111, the air pump stops supplying air, and the pneumatic suction cup 31 disconnects the adsorption of the aluminum substrate 1111. The worker then removes the aluminum substrate 1111 that has been inspected.

[0056] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit the scope of protection of the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solution of the present invention can be modified or replaced by equivalents without departing from the essence and scope of the technical solution of the present invention.

Claims

1. A multi-point withstand voltage test device for an aluminum substrate, comprising a test platform (1), an electric push rod (101), a pressure plate (2) and a supporting platform (3); the test platform (1) is connected to a mounting frame (1002); the mounting frame (1002) is connected to an electric push rod (101); the telescopic end of the electric push rod (101) is fixedly connected to the pressure plate (2); a first conductive plate (2001) is mounted on the pressure plate (2); the supporting platform (3) is mounted on the test platform (1); a second conductive plate (3001) is mounted on the supporting platform (3); a withstand voltage tester (1001) is arranged on the test platform (1); the positive electrode of the withstand voltage tester (1001) is connected to the first conductive plate (2001), and the negative electrode of the withstand voltage tester (1001) is connected to the second conductive plate (3001); the characteristics are: The invention also comprises a first elastic member (102), a mounting plate (4), a second elastic member (103) and a conductive ejector pin (5); a plurality of guide rods are fixedly connected to the pressing plate (2); each guide rod is fixedly connected to a first elastic member (102); all guide rods are connected to a mounting plate (4); the mounting plate (4) is fixedly connected to all first elastic members (102); a plurality of conductive rods (2002) are fixedly connected to the first conductive plate (2001); a third conductive plate (400 1); a plurality of conductive ejector pins (5) are connected to the mounting plate (4); the conductive ejector pin (5) is composed of a metal inner core (5001) and a contact head (5002); a rubber sleeve (5003) is installed on the metal inner core (5001); a plurality of second elastic members (103) are fixedly connected to the mounting plate (4); each second elastic member (103) is fixedly connected to a corresponding conductive ejector pin (5); and the stiffness coefficient of the second elastic member (103) is greater than the stiffness coefficient of the first elastic member (102).

2. A multi-point withstand voltage test equipment for an aluminum substrate according to claim 1, characterized in that: The lower side of the contact head (5002) is arranged in a spherical shape.

3. A multi-point withstand voltage test equipment for an aluminum substrate according to claim 2, characterized in that: Also included is an insulating plate (4002).

4. The multi-point withstand voltage test equipment for aluminum substrate according to claim 1, characterized in that: The upper side of the rubber sleeve (5003) is arranged at an oblique angle.

5. The multi-point withstand voltage test equipment for aluminum substrate according to claim 4, characterized in that: It also includes a rubber cover (5004); each metal inner core (5001) is connected to a rubber cover (5004); the diameter of the rubber cover (5004) is larger than the diameter of the metal inner core (5001); and the insulating plate (4002) is provided with holes corresponding to the rubber covers (5004).

6. A multi-point withstand voltage test device for an aluminum substrate according to claim 5, characterized in that: The rubber cover (5004) is threadedly connected to the metal inner core (5001).

7. The multi-point withstand voltage test equipment for aluminum substrate according to claim 1, characterized in that: The third conductive plate (4001) is provided with a socket adapted to the conductive rod (2002).

8. The multi-point withstand voltage test equipment for aluminum substrate according to claim 7, characterized in that: It also includes an isolation component, which includes a slide rail (21) and an isolation cover (22); a plurality of slide rails (21) are installed on the mounting plate (4); each slide rail (21) corresponds to a row of conductive ejector pins (5); each slide rail (21) is connected to two isolation covers (22); the upper side of the isolation cover (22) is made of plastic material, and the lower side is made of rubber material.

9. A multi-point withstand voltage test device for an aluminum substrate according to claim 8, characterized in that: The lower side of the isolation cover (22) is arranged in an arc shape.

10. The multi-point withstand voltage test equipment for aluminum substrate according to claim 9, characterized in that: It also includes a pneumatic suction cup (31); a plurality of pneumatic suction cups (31) are mounted on the mounting plate (4); and all the pneumatic suction cups (31) are connected to an air pump.

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