Involute sample plate measuring device with special-shaped repairable measuring head and measuring method
By designing a special-shaped repairable probe and an involute sample measuring device combining inductive rods and grinding tooling, the problem of inaccurate probe adjustment of dual roller-rail measuring instruments and errors in non-reflective surface measurement is solved. , realizes the measurement of high-precision gear involute sample and the repairability of the probe.
Patent Information
- Application Number
- CN202411206644.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-30
- Publication Date
- 2024-12-31
- Estimated Expiration
- 2044-08-30
AI Technical Summary
The existing gear involute sample measuring device has difficulties in measuring accuracy and measuring point position adjustment, especially the probe adjustment of the dual-roller-rail measuring instrument is inaccurate, and laser measurement technology exists in non-reflective and curved surface measurements. Abe error and base disc interference problems, and the ball probe is difficult to repair after wear, which affects the measurement accuracy.
A special-shaped repairable probe is designed, including a cylindrical body and a cylindrical blade edge probe. It uses a wedge-shaped surface and a repairable cylindrical blade edge, combined with an inductive rod and grinding tooling to achieve high-precision adjustment and repair of the probe. Avoid interference with the base disc and adjust the perpendicularity of the measurement bus through the optical gap method.
It realizes accurate measurement of the tooth profile deviation of high-precision gear involute sample, improves measurement accuracy and efficiency, simplifies the position adjustment of the probe, and the probe can be repaired and extends the service life.
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Figure CN119223151A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of precision testing, and relates to an involute template measuring device of a special-shaped repairable probe and its application in pure rolling generation measurement of involute templates, which is used for pure rolling generation measurement of high-precision gear involute templates. Background Art
[0002] As a standard instrument for calibrating involute measuring instruments, gear involute templates have very strict accuracy requirements for both gear templates and measuring instruments. The national standard for gear involute templates GB / T 6467-2010 divides gear involute templates into two levels: level 1 and level 2. Level 1 is the highest accuracy level, and level 1 templates must be symmetrical or mass balanced. Foreign countries can provide small and medium-sized gear involute templates with a tooth profile shape deviation of level 1 accuracy (i.e. 1μm), but their unfolded length does not meet the requirements of my country's level 1 gear involute templates.
[0003] At present, the most commonly used and authoritative gear measuring instruments on the market are mainly three-dimensional coordinate measuring machines and gear measuring centers. The working principle of three-dimensional coordinate measuring machines and gear measuring centers is based on the coordinate method or electronic development method. They have high measurement accuracy, fast speed and powerful functions, but the dimension chain is long, the structure is complex, the manufacturing cost is high, and it is difficult to improve the accuracy. The team of Academician Wang Liding of Dalian University of Technology has developed a double roller-guide type gear involute template measurement and grinding device. It is designed based on the mechanical development method, strictly follows the involute development principle, and has no principle error. Germany and Japan also use this development mechanism to achieve high-precision measurement of involutes. It is generally believed to have the highest development accuracy at home and abroad, but there is a problem of difficulty in accurately adjusting the measuring point position.
[0004] For the double roller-guide type involute measuring instrument, the probe should be located in the plane of the guide rail, but it is difficult to adjust the probe to the theoretical position during actual operation, and this factor must be taken into account when designing the instrument structure. The invention patent [CN200910303302.5] discloses a method for accurately positioning the measuring point of a generating method involute gear profile measuring instrument, which uses the tooth profile angle comparison method and the measuring point deviation trial value compensation method for precise adjustment of the measuring point position in the generating method measuring instrument. The measuring point position adjustment accuracy is ±10μm, and there is still a lot of room for improvement in the adjustment accuracy.
[0005] Considering that the laser measurement method is not suitable for the measurement of non-reflective surfaces and curved surfaces, it is necessary to design an involute measurement device that uses a probe and combines the laser measurement method. The device requires a micro-displacement transmission device to transmit the micro-displacement of the probe in proportion to the laser interferometer. The authorized invention patent [ZL201711398299.0] discloses a laser measurement device and method for measuring the normal error of an arbitrary surface, which converts the micro-displacement of the measuring point position into the micro-displacement of the reflector spot in proportion, and characterizes the change of the measuring point position on the surface of the part by the change of the spot position. The device still has Abbe errors during use. The authorized invention patent [ZL201910749549.3] discloses a laser measurement probe device for measuring the form and position errors of arbitrary surfaces, which transmits the micro-displacement of the probe in proportion to the measuring target mirror at the tail of the device, and the laser interferometer collects the micro-displacement of the target mirror in real time. The device can be used to measure the profile deviation of high-precision gear involute templates, but it does not provide installation and positioning of the device, precise adjustment of the measuring point position, and reasonable arrangement of the mirror group.
[0006] Laser measurement technology has been widely used in the field of gear measurement in recent years due to its advantages such as non-contact, rapidity, automation, and high measurement accuracy. Invention patent [ZL201810704461.5] discloses a double-base disc gear involute template measurement system based on laser heterodyne interference, which applies laser heterodyne interference technology to the measurement of double-base disc gear involute templates. The laser is divided into three beams and directly irradiated onto the two base discs and the gear involute template, thereby achieving high-resolution and dynamic real-time measurement. This patent provides a high-precision non-contact measurement method, but it has strict requirements on the surface accuracy of the base disc and the template, does not involve the problem of adjusting the position of the measuring point, and does not mention the device. Authorized invention patent [ZL202110734307.4] discloses a laser measurement device for the gear involute template tooth profile deviation, which integrates a dual roller-guide development mechanism and a laser measurement probe device for arbitrary surface form and position errors, provides an installation and positioning device for the probe and the lens group, and a precise adjustment method for the measuring point position, and uses the laser interference principle to achieve high-precision measurement of the gear involute template tooth profile deviation. The device can be used to measure the gear involute template tooth profile deviation of high-precision gears, but it is difficult to adjust the measuring point position to a precise position, and there is the possibility of base disc interference measurement bracket. In addition, the contact point of the ball probe will wear out after use and cannot be repaired, and subsequent use may affect the measurement accuracy. Therefore, this measuring device still has room for improvement. Summary of the invention
[0007] In order to solve the above problems, the present invention provides a cylindrical knife edge measuring device which is directly connected to the side of the unfolded guide rail; does not interfere with the base disc during the measurement process, does not require precise adjustment of the probe height, is insensitive to the probe installation position, and is easy to repair after the probe is worn, wherein the measuring generatrix of the cylindrical knife edge probe can be high-precision ground using a cylindrical grinding tool. The device can be used to measure the tooth profile deviation of a high-precision gear involute template. A special-shaped repairable probe comprises a cylindrical body, characterized in that: a cylindrical knife edge probe is provided at one end of the cylindrical body; a connecting portion is provided at the other end of the cylindrical body, and two symmetrical wedge surfaces are provided on the cylindrical knife edge probe; a repairable cylindrical knife edge is provided at the intersection of the two wedge surfaces, and there is a chamfer above the cylindrical knife edge.
[0008] According to the above-mentioned special-shaped repairable probe, it is characterized in that: the angle between the two symmetrical wedge surfaces is 20°-150°; the cross-sectional chord length of the cylindrical blade is 0.3-1.0mm; the straightness of the generatrix of the cylindrical blade is ≤0.1μm; the roughness of the cylindrical blade is ≤100 nanometers; and the connecting part arranged at the other end of the cylindrical body is a screw.
[0009] An involute template measuring device with a special-shaped repairable probe is characterized in that it includes the special-shaped repairable probe, a marble platform, and two expansion guide rails arranged on the marble platform; one of the expansion guide rails is fixedly provided with a probe fixture adjustment block; the probe fixture adjustment block is adjustably provided with a probe fixture, and the probe fixture is provided with an electric sensing rod; one end of the electric sensing rod is screwed to the special-shaped repairable probe; a template measurement bracket is provided between the tops of the two expansion guide rails; a verticality calibration block for adjusting the measuring position of the special-shaped repairable probe is provided on the template measurement bracket; the special-shaped repairable probe can be repaired using a grinding tool.
[0010] The involute template measuring device with the above-mentioned special-shaped repairable probe is characterized in that: the probe fixture adjustment block is rectangular, and countersunk holes for connecting to the inner side of an unfolded guide rail are provided at both ends of the probe fixture adjustment block; a rectangular hole is provided in the center of the fixture adjustment block; and a plurality of fine-tuning threaded holes passing through the upper and lower side walls of the rectangular hole are respectively provided on the upper and lower side walls of the fixture adjustment block.
[0011] According to the above-mentioned involute template measuring device with a special-shaped repairable probe, it is characterized in that: the cross-section of the probe fixture is T-shaped, and one end of the probe fixture is a rectangular block that can be set in the rectangular hole of the probe fixture adjustment block; countersunk holes are symmetrically arranged at both ends of the rectangular block; a probe holder with a zigzag cross-section is arranged at the other end of the probe fixture; a clamping groove for installing an inductive sensing rod is arranged on the probe holder; one end of the clamping groove is open and provided with a circular through hole for clamping the column inductive sensing rod, and the other end of the clamping groove is provided with an elliptical through hole; the upper and lower surfaces of the probe holder parallel to the axis of the circular through hole are respectively provided with locking threaded holes and locking through holes for adjusting and fixing the cylindrical knife-edge probe with the same central axis; the diameter of the circular through hole is larger than the outer diameter of the inductive sensing rod.
[0012] According to the above-mentioned involute template measuring device with a special-shaped repairable probe, it is characterized in that: the template measuring bracket is in the shape of a long strip, and two raised mounting platforms are symmetrically arranged on the upper surface of the template measuring bracket, and threaded holes are arranged on the mounting surface E on the mounting platform for screwing the verticality calibration block; two mounting seats with the same width as the width of the unfolded guide rail are arranged on the lower surface of the template measuring bracket; the mounting surfaces F on the two mounting seats are coplanar.
[0013] According to the involute template measuring device with a special-shaped repairable probe as described above, it is characterized in that: the cross-section of the verticality calibration block is L-shaped, and one side of the verticality calibration block is provided with a countersunk hole for connecting the template measuring bracket; the other side of the verticality calibration block is provided with three calibration bosses at equal intervals and perpendicular to the verticality calibration block; the upper surfaces of the three calibration bosses are coplanar, and the upper surface of the calibration boss in the middle of the three calibration bosses is the calibration surface, which is perpendicular to the mounting surface G of the verticality calibration block and is used as an adjustment reference for adjusting the verticality of the cylindrical generatrix of the cylindrical knife-edge probe and the upper surface of the unfolded guide rail.
[0014] According to the above-mentioned involute template measuring device with a special-shaped repairable probe, it is characterized in that: the grinding tool comprises: a probe grinding positioning shaft for installing the special-shaped repairable probe, a probe grinding pressure plate connected to the probe grinding positioning shaft for fixing the special-shaped repairable probe, and a grinding sleeve for grinding the special-shaped repairable probe;
[0015] The probe grinding and positioning shaft is a stepped shaft-shaped part, one end of which is a large-diameter shaft and the other end is a small-diameter shaft; the mounting surface A on the end surface of the large-diameter shaft is provided with a plurality of V-shaped through grooves evenly distributed along the radial direction for positioning the special-shaped repairable probe; the mounting surface A is also provided with a grinding and positioning shaft groove coaxial with the large-diameter shaft; the axis of the cylindrical body of the special-shaped repairable probe arranged in the V-shaped through groove is perpendicular to the cylindrical surface of the large-diameter shaft, and the side wall of the cylindrical knife-edge probe fits the groove surface of the V-shaped through groove ; After the cylindrical blade probe is positioned, it does not protrude above the mounting surface A of the probe grinding and positioning shaft; the small diameter shaft is the clamping end, which is used for clamping and fixing by the three-jaw chuck of the lathe; V-shaped through grooves are evenly arranged between the V-shaped through grooves of the mounting surface A; a guide groove and a guide ring are arranged at one end of the large diameter shaft to facilitate the grinding sleeve to be inserted into the large diameter shaft of the probe grinding and positioning shaft; the cylindrical surface diameter of the cylindrical blade of the cylindrical blade probe is consistent with the large end diameter of the probe grinding and positioning shaft and is coaxial, that is, a common cylindrical surface;
[0016] The probe grinding plate is a circular ring structure, and the mounting surface B of the grinding plate is provided with a through hole for cooperating with the connecting threaded hole to connect the probe grinding positioning shaft; a tightening threaded hole is provided at the corresponding position of the V-shaped through groove of the probe grinding positioning shaft to connect a tightening screw for tightening the cylindrical body of the special-shaped repairable probe; an inner hole of the probe grinding plate is provided in the middle to adjust the position of the cylindrical blade of the cylindrical blade probe; the inner ring of the grinding sleeve is sleeved on the outer diameter of the large-diameter shaft of the probe grinding positioning shaft, and the cylindrical blade of the cylindrical blade probe is ground to restore the accuracy through reciprocating motion.
[0017] The method for measuring an involute template using the involute template measuring device with a special-shaped repairable probe as described above is characterized in that it comprises the following steps:
[0018] S1: Install the marble platform and unfold the guide rails;
[0019] First, place the marble platform on the test bench, and then face the two sides of the two guide rails with threaded holes, and screw the two guide rails on the marble platform, so that the two guide rails are parallel;
[0020] S2: Connect the probe fixture adjustment block screw to the inner side of a development guide rail;
[0021] S3: In the square hole of the probe fixture adjustment block, the probe fixture screw is connected to the inner side of the expansion guide rail, and the end of the zigzag probe holder with the probe fixture inner hole faces upward.
[0022] S4: Install the special-shaped repairable probe; the special-shaped repairable probe is threadedly connected to the inductive sensing rod, and the inductive sensing rod is installed in the inner hole of the probe fixture; in order to accurately measure the tooth profile deviation of the involute template, the chamfered part of the cylindrical knife-edge probe faces upward, and the inductive sensing rod is clamped on the probe fixture by screws;
[0023] S5: Install the sample measuring bracket onto the upper surface of the two developed guide rails;
[0024] Place the sample measuring bracket installation surface F on the generating guide rail working surface, and align the two side surfaces of the sample measuring bracket with the outer side surfaces of the two generating guide rails 2 respectively;
[0025] S6: Install the verticality calibration block onto the sample measurement bracket;
[0026] The verticality calibration block is installed on the sample measuring bracket by screw connection, and the calibration surface is installed on one side of the cylindrical knife-edge probe;
[0027] S7: Adjust the verticality between the measuring generatrix and the working surface of the generating guide rail;
[0028] Adjust the verticality between the measuring generatrix and the working surface of the developing guide rail: translate the combination of the sample measuring bracket and the verticality calibration block along the developing guide rail direction to make the calibration surface contact the measuring generatrix, and observe the light gap between the measuring generatrix and the calibration surface by the light gap method; adjust the screws in the threaded holes of the fine-tuning fixture adjustment block to make sure there is no light gap between the calibration surface and the measuring generatrix;
[0029] S8: Remove the sample measuring bracket and the verticality calibration block, place the rolling assembly of the involute sample so that the cylindrical knife-edge probe contacts the sample tooth profile of the rolling assembly of the involute sample and is located within the measuring range. The base circle of the rolling assembly of the involute sample rolls along the generating guide rail, generating motion, and measuring the tooth profile deviation of the involute sample by measuring the displacement caused by the contact between the cylindrical generatrix on the profiled repairable probe and the tooth profile of the involute sample.
[0030] The method for measuring an involute template using the involute template measuring device with a special-shaped repairable probe is characterized in that: in step S1, the distance between the outermost sides of the two generating guide rails is 200 mm; in step S7, the perpendicularity between the measuring generatrix and the working surface of the generating guide rail is adjusted to ≤0.5 μm.
[0031] The beneficial effects of the present invention are as follows:
[0032] 1. The special-shaped repairable probe of the present invention is arranged on the inner side of the developing guide rail through a probe fixture and a probe fixture adjustment block. A chamfer is arranged above the cylindrical surface of the blade of the special-shaped repairable probe to prevent the special-shaped repairable probe from interfering with the tooth root of the template when measuring the involute template.
[0033] 2. When measuring the involute template, the cylindrical generatrix of the blade cylindrical surface of the special-shaped repairable probe forms a point contact with the tooth profile of the involute template to be measured, and the cylindrical generatrix passing through this contact point is the measuring generatrix. Accurate measurement can be achieved when any point on the measuring generatrix contacts the tooth profile of the measured involute template. There is no need to accurately adjust the probe height and the probe is insensitive to the installation position of the probe, which improves the measurement accuracy, greatly shortens the time for adjusting the probe position before measurement, and improves the measurement efficiency.
[0034] 3. The special-shaped repairable probe of the present invention can be repaired by a cylindrical grinding tool after being worn. The cylindrical grinding tool is provided with a plurality of V-shaped through grooves evenly distributed along the radial direction, and multiple special-shaped repairable probes can be placed thereon at one time. At the same time, the probe grinding pressure plate is used for clamping and fixing. There is no need to adjust the clamping position of the special-shaped repairable probe multiple times, thereby improving the efficiency of repairing the special-shaped repairable probe.
[0035] 4. The present invention observes the light gap between the measuring busbar and the calibration surface by the light gap method, fine-tunes the tightness of the screws in the threaded holes of the clamp adjustment block, and adjusts the verticality of the measuring busbar and the working surface of the unfolding guide rail so that there is no light gap between the calibration surface and the measuring busbar. The measuring device adjustment method is simple and efficient, and the measurement accuracy is guaranteed. BRIEF DESCRIPTION OF THE DRAWINGS
[0036] Figure 1 The involute sample measuring device with a special-shaped repairable probe and the rolling assembly of the sample to be measured of the present invention;
[0037] Figure 2 A schematic diagram of the clamping of the special-shaped repairable probe of the present invention;
[0038] Figure 3 A schematic structural diagram of a special-shaped repairable probe of the present invention;
[0039] Figure 4 A schematic diagram of the structure of the probe grinding and positioning shaft of the present invention;
[0040] Figure 5 A schematic structural diagram of a probe grinding plate of the present invention;
[0041] Figure 6 A schematic diagram of the assembly of the probe grinding positioning shaft and the probe grinding pressure plate of the present invention;
[0042] Figure 7 A schematic diagram of the grinding tool of the present invention;
[0043] Figure 8 A schematic structural diagram of the probe fixture of the present invention;
[0044] Fig. 9 A schematic structural diagram of a probe fixture adjustment block of the present invention;
[0045] Fig.10 A schematic structural diagram of a sample measuring bracket of the present invention;
[0046] Fig.11 A schematic structural diagram of a verticality calibration block of the present invention;
[0047] Fig.12 Schematic diagram of position adjustment of the special-shaped repairable probe of the present invention.
[0048] In the figure: 1: marble platform; 2: guide rail; 3: rolling assembly; 4: cylindrical blade probe; 4-1: wedge surface; 4-2: cylindrical generatrix; 4-3: chamfer; 5: probe grinding positioning shaft; 5-1: clamping end; 5-2: V-shaped through groove; 5-3: guide ring; 5-4: mounting surface A; 5-5: connecting threaded hole; 5-6: groove; 6: probe grinding pressure plate; 6-1: mounting surface B; 6-2: tightening threaded hole; 6-3: through hole; 6 -4: inner hole of pressure plate; 7: grinding sleeve; 8: probe fixture; 8-1: mounting surface C; 8-2: locking threaded hole; 8-3: inner hole of probe fixture; 9: probe fixture adjustment block; 9-1: mounting surface D; 9-2: fine-tuning threaded hole; 9-3: square hole; 10: sample measurement bracket; 10-1: mounting surface E; 10-2: mounting surface F; 11: verticality calibration block; 11-1: calibration surface; 11-2: mounting surface G; 12: inductive sensing rod. DETAILED DESCRIPTION
[0049] Preferred Embodiments
[0050] The technical solutions in the embodiments of the present invention are described clearly and completely below in conjunction with the accompanying drawings of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0051] like Figure 3 As shown: a special-shaped repairable probe comprises a cylindrical body, one end of which is provided with a cylindrical knife-edge probe 4; the other end of the cylindrical body is provided with a connecting portion, and the cylindrical knife-edge probe 4 is provided with two symmetrical wedge surfaces 4-1; a repairable cylindrical knife edge is provided at the intersection of the two wedge surfaces 4-1, and the top of the cylindrical knife edge is chamfered.
[0052] The angle between the two symmetrical wedge surfaces 4-1 is 20°-150°; the cross-sectional chord length of the cylindrical blade is 0.3-1.0mm; the straightness of the generatrix of the cylindrical blade is ≤0.1μm; the roughness of the cylindrical blade is ≤100 nanometers; the connecting part arranged at the other end of the cylindrical body is a screw.
[0053] like Figure 1As shown: an involute template measuring device with a special-shaped repairable probe, comprising a special-shaped repairable probe, a marble platform 1, and two developing guide rails 2 arranged on the marble platform 1; a probe fixture adjustment block 9 is fixedly arranged on one of the developing guide rails 2; a probe fixture 8 is adjustably arranged on the probe fixture adjustment block 9, and an electric sensing rod 12 is arranged on the probe fixture 8; one end of the electric sensing rod 12 is screwed to the special-shaped repairable probe; a template measuring bracket 10 is arranged between the tops of the two developing guide rails 2; a verticality calibration block 11 for adjusting the measuring position of the special-shaped repairable probe is arranged on the template measuring bracket 10; the special-shaped repairable probe can be repaired using a grinding tool.
[0054] like Fig. 9 As shown: the probe fixture adjustment block 9 is rectangular, and countersunk holes for connecting with the inner side of an expanded guide rail 2 are set at both ends of the probe fixture adjustment block 9; a rectangular hole is set in the center of the fixture adjustment block 9; and two fine-tuning threaded holes 9-2 passing through the upper and lower side walls of the rectangular hole are respectively set on the upper and lower side walls of the fixture adjustment block 9.
[0055] like Figure 8 As shown: the cross-section of the probe fixture 8 is T-shaped, and one end of the probe fixture 8 is a rectangular block that can be set in the rectangular hole of the probe fixture adjustment block 9; a countersunk hole is symmetrically arranged at both ends of the rectangular block; a probe holder with a zigzag cross-section is arranged at the other end of the probe fixture 8; a clamping groove for installing the electric sensing rod 12 is arranged on the probe holder; one end of the clamping groove is open and provided with a circular through hole 8-3 for clamping the column electric sensing rod 12, and the other end of the clamping groove is provided with an elliptical through hole; the upper and lower surfaces of the probe holder parallel to the axis of the circular through hole 8-3 are respectively provided with locking threaded holes and locking through holes for adjusting and fixing the cylindrical knife-edge probe 4 with the same central axis; the diameter of the circular through hole 8-3 is larger than the outer diameter of the electric sensing rod 12.
[0056] like Fig.10 As shown: the sample measuring bracket 10 is in the shape of a long strip, and two raised mounting platforms are symmetrically arranged on the upper surface of the sample measuring bracket 10, and threaded holes are arranged on the mounting surface E10-1 on the mounting platform for screwing the verticality calibration block 11; the lower surface of the sample measuring bracket 10 is provided with two mounting seats with the same width as the width of the unfolded guide rail; the mounting surfaces F10-2 on the two mounting seats are coplanar.
[0057] like Fig.11As shown: the cross-section of the verticality calibration block 11 is L-shaped, and one side of the verticality calibration block 11 is provided with a countersunk hole for connecting the sample measuring bracket 10; the other side of the verticality calibration block 11 is provided with three calibration bosses at equal intervals and perpendicular to the verticality calibration block 11; the upper surfaces of the three calibration bosses are coplanar, and the upper surface of the calibration boss in the middle of the three calibration bosses is the calibration surface 11-1, and the calibration surface 11-1 is perpendicular to the mounting surface G11-2 of the verticality calibration block 11, and is used as an adjustment reference for adjusting the verticality of the cylindrical generatrix 4-2 of the cylindrical knife-edge probe 4 and the upper surface of the unfolded guide rail 1.
[0058] like Figure 6 As shown: the grinding tool comprises: a probe grinding positioning shaft 5 for installing a special-shaped repairable probe, a probe grinding pressing plate 6 connected to the probe grinding positioning shaft 5 for fixing the special-shaped repairable probe, and a grinding sleeve 7 for grinding the special-shaped repairable probe;
[0059] like Figure 4 As shown: the probe grinding and positioning shaft 5 is a stepped shaft-shaped part, one end of which is a large-diameter shaft and the other end is a small-diameter shaft; the mounting surface A5-4 on the end surface of the large-diameter shaft is provided with 6 V-shaped through grooves 5-2 evenly distributed along the radial direction for positioning the special-shaped repairable probe; the mounting surface A5-4 is also provided with a grinding and positioning shaft groove 5-6 coaxial with the large-diameter shaft; the axis of the special-shaped repairable probe cylindrical body arranged in the V-shaped through groove 5-2 is perpendicular to the cylindrical surface of the large-diameter shaft, and the side wall of the cylindrical knife-edge probe 4 is in contact with the groove surface of the V-shaped through groove 5-2; After being positioned, the cylindrical knife-edge probe 4 does not protrude above the mounting surface A5-4 of the probe grinding and positioning shaft 5; the small-diameter shaft is the clamping end 5-1, which is used for clamping and fixing by the three-jaw chuck of the lathe; V-shaped through-slot connecting threaded holes 5-5 are evenly arranged between the V-shaped through-slots 5-2 of the mounting surface A5-4; a guide groove and a guide ring 5-3 are arranged at one end of the large-diameter shaft to facilitate the grinding sleeve 7 to be inserted into the large-diameter shaft of the probe grinding and positioning shaft 5; the cylindrical surface diameter of the cylindrical knife-edge probe 4 is consistent with the large end diameter of the probe grinding and positioning shaft 5 and is coaxial, that is, they share a common cylindrical surface;
[0060] like Figure 5 As shown: the probe grinding plate 6 is a circular ring structure, and the mounting surface B6-1 of the grinding plate 6 is provided with a through hole 6-3 for cooperating with the connecting threaded hole 5-5 to connect the probe grinding positioning shaft 5; a tightening threaded hole 6-2 is provided at the corresponding position of the V-shaped through groove 5-2 of the probe grinding positioning shaft 5 to connect a tightening screw for tightening the cylindrical body of the special-shaped repairable probe; a probe grinding plate inner hole 6-4 is provided in the middle to adjust the cylindrical blade position of the cylindrical blade probe 4; the inner ring of the grinding shaft sleeve 7 is sleeved on the outer diameter of the large diameter shaft of the probe grinding positioning shaft 5, and through reciprocating motion, the cylindrical blade of the cylindrical blade probe 4 is ground to restore the accuracy.
[0061] A method for measuring an involute template by an involute template measuring device with a special-shaped repairable probe comprises the following steps:
[0062] S1: Install the marble platform 1 and the guide rail 2;
[0063] First, place the marble platform 1 on the test bench, and then place the two sides of the two developing guide rails 2 with the threaded holes facing each other, and screw the two developing guide rails 2 onto the marble platform 1, so that the two developing guide rails 2 are parallel;
[0064] S2: Screw the probe fixture adjustment block 9 to the inner side of a development guide rail 2;
[0065] S3: In the square hole of the probe fixture adjustment block 9, the probe fixture 8 is screwed to the inner side of the development guide rail 2, and the end of the zigzag probe holder with the probe fixture inner hole 8-3 faces upward;
[0066] S4: Install the special-shaped repairable probe; the special-shaped repairable probe is threadedly connected to the electric sensing rod 12, and the electric sensing rod 12 is installed in the inner hole 8-3 of the probe fixture; in order to accurately measure the tooth profile deviation of the involute template, the chamfered part of the cylindrical knife-edge probe 4 faces upward, and the electric sensing rod 12 is clamped on the probe fixture 8 by screws;
[0067] S5: Install the sample measuring bracket 10 onto the upper surfaces of the two development guide rails 2;
[0068] Place the mounting surface F10-2 of the sample measuring bracket 10 on the working surface of the generating guide rail 2, and align the two side surfaces of the sample measuring bracket 10 with the outer side surfaces of the two generating guide rails 2 respectively;
[0069] S6: Install the verticality calibration block 11 onto the sample measurement bracket 10;
[0070] The verticality calibration block 11 is mounted on the sample measuring bracket 10 by screw connection, and the calibration surface 11-1 is mounted on one side of the cylindrical knife-edge probe 4;
[0071] S7: Adjust the verticality between the measuring busbar 4-2 and the working surface of the generating guide rail 2;
[0072] like Fig.12 As shown: the verticality adjustment between the measuring busbar 4-2 and the working surface of the developing guide rail 2: the combination of the sample measuring bracket 10 and the verticality calibration block 11 is translated along the direction of the developing guide rail 2 to make the calibration surface 11-1 contact the measuring busbar 4-2, and the light gap between the measuring busbar 4-2 and the calibration surface 11-1 is observed by the light gap method; the screws in the four threaded holes 9-2 of the fine-tuning fixture adjustment block 9 are adjusted to make no light gap between the calibration surface 11-1 and the measuring busbar 4-2;
[0073] by Fig. 9Taking the viewing angle as an example, the positions of the four threaded holes 9-2 of the fixture adjustment block 9 can be regarded as being located in the four quadrants of the coordinate system with the center of the square hole of the probe fixture adjustment block 9 as the center. The posture of the probe fixture 8 is fine-tuned by tightening the screws to indirectly adjust the verticality of the measuring generatrix 4-2 of the cylindrical knife-edge probe 4 and the unfolding guide rail 2; if the light gap is in the upper half, tighten the tightening screws in the first or third quadrant until there is no light gap; if the light gap is in the lower half, tighten the tightening screws in the second or fourth quadrant until there is no light gap.
[0074] S8: Remove the template measuring bracket 10 and the verticality calibration block 11, place the rolling component 3 of the involute template so that the cylindrical knife-edge probe 4 contacts the template tooth profile of the rolling component 3 of the involute template and is located within the measuring range. The base circle of the rolling component 3 of the involute template rolls along the developing guide rail 2, and the developing motion occurs. The displacement generated by the contact between the cylindrical generatrix 4-2 on the special-shaped repairable probe and the tooth profile of the involute template is used to measure the tooth profile deviation of the involute template.
[0075] In the step S1, the distance between the outermost sides of the two generating guide rails 2 is 200 mm; in the step S7, the verticality between the measuring busbar 4-2 and the working surface of the generating guide rail 2 is adjusted to be ≤0.5 μm.
[0076] The marble platform 1 of the present invention is used as the installation reference of the entire measuring device. A marble platform 1 of 00-level accuracy is selected. The marble platform 1 is reasonably arranged with holes for installing two developed guide rails 2. The material of the developed guide rail 2 is bearing steel. The upper and lower surface accuracy is obtained by grinding three developed guide rails 2 with aluminum oxide abrasives with a particle size not greater than W1. The upper and lower surface flatness does not exceed 0.5μm. One end of the cylindrical knife-edge probe 4 is processed by wire cutting to form two symmetrical wedge surfaces 4-1 with an angle of 20°-150°. There is a large-diameter knife-edge cylindrical surface at the intersection of the two wedge surfaces 4-1, with a width of 0.3-1.0mm, the diameter of the cylindrical surface of the knife edge is consistent with the large end diameter of the probe grinding and positioning shaft 5 and is coaxial, and is a common cylindrical surface; the outer diameter of the inductive sensing rod 12 is 8mm, and the diameter of the inner hole 8-3 of the probe fixture is designed to be slightly larger than 8mm. Using a high-precision grinding rod of similar specifications to grind the inner hole 8-3 of the probe fixture can improve the positioning accuracy of the inductive sensing rod 12 and make the clamping more stable; the mounting surface A5-4 on the large diameter shaft end of the probe grinding and positioning shaft 5 is provided with 6 V-shaped through grooves 5-2 evenly distributed in the radial direction, and the width of the V-shaped through groove 5-2 is consistent with the outer diameter of the cylindrical knife-edge probe 4, which is 5 mm, a guide ring 5-3 with a width of 0.03mm is provided at the large-diameter shaft end to facilitate the entry of the grinding sleeve 7; according to the size of the mounting surface C8-1, a square hole 9-3 is opened in the middle part of the probe fixture adjustment block 9 to facilitate the installation and adjustment of the probe fixture 8; 4 fine-tuning threaded holes 9-2 are provided at the upper and lower corresponding positions of the countersunk hole of the probe fixture 8 to facilitate fine-tuning the posture of the probe fixture 8 to adjust the verticality of the measuring generatrix 4-2 of the cylindrical knife-edge probe 4 and the working surface of the development guide rail 2; the development guide rail 2 is 30mm wide, and the distance between the outermost sides of the two development guide rails 2 is 200mm, based on According to these parameters, the length of the template measuring bracket 10 is designed to be 200mm, and the width of the two mounting surfaces F10-2 is consistent with the width of the development guide rail 2. The template measuring bracket 10 is made of 42CrMo material by wire cutting. After quenching, its HRC is not less than 54. It has sufficient strength and hardness to ensure that it will not deform after bearing the verticality calibration block 11; the verticality calibration block 11 is the adjustment reference for adjusting the verticality of the measuring generatrix 4-2 of the cylindrical knife-edge probe 4 and the working surface of the development guide rail 2, and strictly controls the verticality of the calibration surface 11-1 and the working surface of the development guide rail 2 to be ≤0.5μm.
[0077] Before assembling the involute template measuring device of the present invention, the working surface of the guide rail 2, the mounting surface A5-4, the mounting surface B6-1, the mounting surface C8-1, the inner hole 8-3 of the probe fixture, the mounting surface D9-1, the mounting surface E10-1, the mounting surface F10-2, the calibration surface 11-1, and the mounting surface G11-2 are refined, and the inner hole 8-3 of the probe fixture is ground with a high-precision grinding rod to improve the positioning accuracy of the electric sensing rod 12. After grinding, the probe fixture is The perpendicularity between the inner hole 8-3 and the mounting surface C8-1 is ≤1μm; after refinement, the flatness of the upper and lower working surfaces of the guide rail 2 is ≤0.5μm; the flatness errors of the mounting surfaces A5-4, B6-1, C8-1, D9-1, E10-1, F10-2 and G11-2 are all ≤1μm, and the perpendicularity errors of the calibration surface 11-1 and the mounting surface G11-2 are all ≤0.5μm.
[0078] Refining of the cylindrical surface of the knife edge probe 4:
[0079] The cylindrical grinding tooling is to assemble the probe grinding positioning shaft 5, the cylindrical knife-edge probe 4, and the probe grinding pressure plate 6, and grind the knife-edge cylindrical surface with the grinding sleeve 7 to grind out a high-precision measuring generatrix 4-2. The grinding steps are as follows:
[0080] S1: The probe grinding and positioning shaft 5 is placed vertically, the grinding sleeve 7 is inserted into the probe grinding and positioning shaft 5, the cylindrical knife-edge probe 4 is installed, and the probe grinding pressure plate 6 is fixed to the probe grinding and positioning shaft 5 by screw connection; the diameter of the cylindrical surface of the cylindrical knife-edge probe 4 is consistent with the large end diameter of the probe grinding and positioning shaft 5 and is coaxial, and is a common cylindrical surface.
[0081] S2: Adjust the position of the cylindrical knife-edge probe 4 so that the cylindrical surface of the knife-edge contacts the inner wall of the grinding sleeve 7 and the cylindrical surface of the knife-edge is perpendicular to the mounting surface A5-4, and tighten the set screw to fix the cylindrical knife-edge probe 4.
[0082] S3: The lathe three-jaw chuck clamps the cylindrical grinding tool holding end 5-1, starts the lathe, and grinds the cylindrical surfaces of the blades of several cylindrical blade probes 4 synchronously through the grinding sleeve 7 to obtain a high-precision measurement generatrix 4-2.
[0083] The above description is only a preferred embodiment of the present invention and is not intended to limit the patent of the present invention. Any modifications, equivalent substitutions and improvements made within the patent of the present invention should be included in the protection scope of the patent of the present invention.
Claims
1. A special-shaped repairable probe, comprising a cylindrical body, characterized in that: A cylindrical blade probe (4) is arranged at one end of the cylindrical body; a connecting portion is arranged at the other end of the cylindrical body, and two symmetrical wedge-shaped surfaces (4-1) are arranged on the cylindrical blade probe (4); a repairable cylindrical blade is arranged at the intersection of the two wedge-shaped surfaces (4-1), and a chamfer is arranged above the cylindrical blade.
2. The special-shaped repairable probe according to claim 1, characterized in that: The angle between the two symmetrical wedge surfaces (4-1) is 20°-150°; the cross-sectional chord length of the cylindrical blade is 0.3-1.0 mm; the straightness of the generatrix of the cylindrical blade is ≤0.1 μm; the roughness of the cylindrical blade is ≤100 nanometers; and the connecting part arranged at the other end of the cylindrical body is a screw.
3. An involute template measuring device with a special-shaped repairable probe, characterized in that: It comprises the special-shaped repairable probe as claimed in claim 1 or 2, a marble platform (1), and two unfolding guide rails (2) arranged on the marble platform (1); a probe fixture adjustment block (9) is fixedly arranged on one of the unfolding guide rails (2); a probe fixture (8) is adjustably arranged on the probe fixture adjustment block (9), and an electric sensing rod (12) is arranged on the probe fixture (8); one end of the electric sensing rod (12) is screwed to the special-shaped repairable probe; a template measurement bracket (10) is arranged between the tops of the two unfolding guide rails (2); a verticality calibration block (11) for adjusting the measuring position of the special-shaped repairable probe is arranged on the template measurement bracket (10); the special-shaped repairable probe can be repaired using a grinding tool.
4. The involute template measuring device with a special-shaped repairable probe according to claim 3 is characterized in that: The probe fixture adjustment block (9) is rectangular, and countersunk holes for connecting to the inner side of an expansion guide rail (2) are arranged at both ends of the probe fixture adjustment block (9); a rectangular hole is arranged at the center of the fixture adjustment block (9); and a plurality of fine-tuning threaded holes (9-2) passing through the upper and lower side walls of the rectangular hole are arranged on the upper and lower side walls of the fixture adjustment block (9).
5. The involute template measuring device with a special-shaped repairable probe according to claim 4 is characterized in that: The probe fixture (8) has a T-shaped cross section, and one end of the probe fixture (8) is a rectangular block that can be set in the rectangular hole of the probe fixture adjustment block (9); countersunk holes are symmetrically arranged at both ends of the rectangular block; a probe holder with a zigzag cross section is arranged at the other end of the probe fixture (8); a clamping groove for mounting an electric sensing rod (12) is arranged on the probe holder; one end of the clamping groove is open and is provided with a circular through hole (8-3) for clamping the column electric sensing rod (12), and the other end of the clamping groove is provided with an elliptical through hole; the upper and lower surfaces of the probe holder parallel to the axis of the circular through hole (8-3) are respectively provided with a locking threaded hole and a locking through hole with the same central axis for adjusting and fixing the cylindrical knife-edge probe (4); the diameter of the circular through hole (8-3) is larger than the outer diameter of the electric sensing rod (12).
6. The involute template measuring device with a special-shaped repairable probe according to claim 5, characterized in that: The sample measuring bracket (10) is in the shape of an elongated strip. Two raised mounting platforms are symmetrically arranged on the upper surface of the sample measuring bracket (10). A mounting surface E (10-1) on the mounting platform is provided with a threaded hole for screwing a verticality calibration block (11). Two mounting seats having a width the same as that of the developed guide rail are arranged on the lower surface of the sample measuring bracket (10); and mounting surfaces F (10-2) on the two mounting seats are coplanar.
7. The involute template measuring device with a special-shaped repairable probe according to claim 6, characterized in that: The cross section of the verticality calibration block (11) is L-shaped. One side of the verticality calibration block (11) is provided with a countersunk hole for connecting a sample plate measuring bracket (10). The other side of the verticality calibration block (11) is provided with three calibration bosses at equal intervals and perpendicular to the verticality calibration block (11). The upper surfaces of the three calibration bosses are coplanar. The upper surface of the calibration boss in the middle of the three calibration bosses is a calibration surface (11-1). The calibration surface (11-1) is perpendicular to a mounting surface G (11-2) of the verticality calibration block (11) and is used as an adjustment reference for adjusting the verticality between a cylindrical generatrix (4-2) of a cylindrical knife-edge probe (4) and the upper surface of a development guide rail (1).
8. The involute template measuring device with a special-shaped repairable probe according to claim 7, characterized in that: The grinding tool comprises: a probe grinding positioning shaft (5) for mounting the special-shaped repairable probe, a probe grinding pressure plate (6) connected to the probe grinding positioning shaft (5) for fixing the special-shaped repairable probe, and a grinding sleeve (7) for grinding the special-shaped repairable probe; The probe grinding and positioning shaft (5) is a stepped shaft-shaped part, one end of which is a large-diameter shaft and the other end is a small-diameter shaft; a mounting surface A (5-4) on the end surface of the large-diameter shaft is provided with a plurality of V-shaped through grooves (5-2) evenly distributed along the radial direction for positioning the special-shaped repairable probe; the mounting surface A (5-4) is also provided with a grinding and positioning shaft groove (5-6) coaxial with the large-diameter shaft; the axis of the special-shaped repairable probe cylindrical body arranged in the V-shaped through groove (5-2) is perpendicular to the cylindrical surface of the large-diameter shaft, and the side wall of the cylindrical knife-edge probe (4) is in contact with the groove surface of the V-shaped through groove (5-2); After being positioned, the head (4) does not protrude above the mounting surface A (5-4) of the probe grinding and positioning shaft (5); the small diameter shaft is the clamping end (5-1) and is used for clamping and fixing with a three-jaw chuck of a lathe; V-shaped through grooves (5-2) of the mounting surface A (5-4) are evenly arranged with connecting threaded holes (5-5); a guide groove and a guide ring (5-3) are arranged at one end of the large diameter shaft to facilitate the grinding sleeve (7) to be inserted into the large diameter shaft of the probe grinding and positioning shaft (5); the cylindrical surface diameter of the cylindrical surface cutting edge of the cylindrical cutting edge probe (4) is consistent with the large end diameter of the probe grinding and positioning shaft (5) and is coaxial, that is, they share a common cylindrical surface; The probe grinding plate (6) is a circular ring structure. The mounting surface B (6-1) of the grinding plate (6) is provided with a through hole (6-3) for cooperating with the connecting threaded hole (5-5) to connect the probe grinding positioning shaft (5); a fixing threaded hole (6-2) is provided at a corresponding position of the V-shaped through groove (5-2) of the probe grinding positioning shaft (5) to connect a fixing screw for fastening the cylindrical body of the special-shaped repairable probe; an inner hole (6-4) of the probe grinding plate is provided in the middle to adjust the cylindrical blade position of the cylindrical blade probe (4); the inner ring of the grinding sleeve (7) is sleeved on the outer diameter of the large diameter shaft of the probe grinding positioning shaft (5), and the cylindrical blade of the cylindrical blade probe (4) is ground to restore the accuracy through reciprocating motion.
9. The method for measuring an involute template by using the involute template measuring device with a special-shaped repairable probe according to claim 8, characterized in that: The following steps are involved: S1: Installing the marble platform (1) and the guide rail (2); First, the marble platform (1) is placed on the test bench, and then the sides of the two unfolded guide rails (2) with threaded holes are placed opposite to each other, and the two unfolded guide rails (2) are screwed to the marble platform (1), so that the two unfolded guide rails 2 are parallel; S2: Screw the probe fixture adjustment block (9) onto the inner side of a development guide rail (2); S3: In the square hole of the probe fixture adjustment block (9), the probe fixture (8) is screwed to the inner side of the development guide rail (2), and the end of the zigzag probe holder with the probe fixture inner hole (8-3) faces upward; S4: Installing a special-shaped repairable probe; the special-shaped repairable probe is threadedly connected to the electric sensing rod (12), and the electric sensing rod (12) is installed in the inner hole (8-3) of the probe fixture; in order to accurately measure the tooth profile deviation of the involute template, the chamfered part of the cylindrical knife-edge probe (4) faces upward, and the electric sensing rod (12) is clamped on the probe fixture (8) by screws; S5: Install the sample measuring bracket (10) onto the upper surfaces of the two development guide rails (2); The mounting surface F (10-2) of the sample measuring bracket (10) is placed on the working surface of the developing guide rail (2), and the two side surfaces of the sample measuring bracket (10) are respectively aligned with the outer side surfaces of the two developing guide rails 2; S6: Install the verticality calibration block (11) onto the sample measurement bracket (10); The verticality calibration block (11) is mounted on the sample measuring bracket (10) by means of screw connection, and the calibration surface (11-1) is mounted on one side of the cylindrical knife-edge probe (4); S7: Adjust the verticality between the measuring busbar (4-2) and the working surface of the developing guide rail (2); Adjusting the verticality of the measuring generatrix (4-2) and the working surface of the developing guide rail (2): translating the combination of the sample measuring bracket (10) and the verticality calibration block (11) along the direction of the developing guide rail (2) so that the calibration surface (11-1) contacts the measuring generatrix (4-2), and observing the light gap between the measuring generatrix (4-2) and the calibration surface (11-1) by the light gap method; and adjusting the screws in the multiple threaded holes (9-2) of the fine-tuning fixture adjustment block (9) to make sure there is no light gap between the calibration surface (11-1) and the measuring generatrix (4-2); S8: Remove the sample measuring bracket (10) and the verticality calibration block (11), place the rolling assembly (3) of the involute sample so that the cylindrical knife-edge probe (4) contacts the sample tooth profile of the rolling assembly (3) of the involute sample and is located within the measuring range, the base circle of the rolling assembly (3) of the involute sample rolls along the developing guide rail (2), generating a developing motion, and measuring the tooth profile deviation of the involute sample through the displacement generated by the contact between the cylindrical generatrix (4-2) on the profiled repairable probe and the tooth profile of the involute sample.
10. The method for measuring an involute template by using the involute template measuring device with a special-shaped repairable probe according to claim 9, characterized in that: In step S1, the distance between the outermost sides of the two developing guide rails (2) is 200 mm; in step S7, the verticality between the measuring generatrix (4-2) and the working surface of the developing guide rail (2) is adjusted to be ≤0.5 μm.
Citation Information
Patent Citations
Measuring point accurate positioning method of generated involute tooth profile measuring apparatus
CN101614614A
Device and method of laser measurement for measuring normal errors of any one surface
CN108007362A
Double-base disc type involute template measuring system based on laser heterodyne interference
CN109084676A
Laser measurement measuring head device for measuring form and position error of any surface
CN110440698A
A method and apparatus for measuring the span of a cylindrical straight-tooth involute spline ring gauge.
CN102278933A
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