Multi-pin chip capacitance testing device and system

Abstract

The invention relates to a multi-pin chip capacitance testing device and system. The multi-pin chip capacitance testing device comprises a plurality of relay modules and a driver, a first end of each relay module is used for connecting a pair of to-be-tested pins of a to-be-tested chip capacitor, and a second end of each relay module is used for connecting an input end of an LCR instrument; when a specified target to-be-tested pin is tested, the driver controls the relay module corresponding to the target to-be-tested pin to be closed and controls the relay modules corresponding to other to-be-tested pins to be disconnected. The to-be-tested pin is switched by controlling the on-off of the relay module, and compared with an existing pin switching mode based on a movable sliding table, the switching speed is higher, operation is more convenient, the control difficulty is lower, and the testing efficiency is higher.

Description

Technical Field

[0001] The invention relates to the field of electronic component testing, and in particular to a multi-pin chip capacitor testing device and system. Background Art

[0002] Multi-layer ceramic capacitor (MLCC) is a chip capacitor component, which is composed of ceramic dielectric diaphragms with printed electrodes (inner electrodes) stacked in an offset manner, sintered at a high temperature once to form a ceramic chip, and then sealed with a metal layer (outer electrode) at both ends of the ceramic chip.

[0003] The existing technology mainly uses the four-terminal pair (4TP) self-balancing bridge method based on LCR meter (inductance, capacitance, resistance measuring instrument) to test the capacity of MLCC. Figure 1 , Figure 1 The schematic diagram of the principle of testing the capacitance of the capacitor by the self-balancing bridge method is shown in FIG. The input terminals of the LCR meter include the Hc terminal, the Hp terminal, the Lc terminal and the Lp terminal. During the test, the Hc terminal and the Hp terminal of the LCR meter are connected to the first terminal of the capacitor DUT to be tested (or the positive terminal of the polar capacitor), and the Lc terminal and the Lp terminal are connected to the second terminal of the capacitor DUT to be tested (or the negative terminal of the polar capacitor). The impedance Z of the capacitor DUT to be tested can be calculated based on the reading of the LCR meter, and finally the capacity of the capacitor DUT to be tested can be calculated based on the impedance Z.

[0004] This existing testing method based on an LCR meter requires frequent switching of the MLCC pins to be tested to which the Hc and Hp terminals of the LCR meter are connected when testing MLCCs with multiple pairs of pins. As for how to automatically switch the pins to be tested, the prior art usually fixes the Hc and Hp terminals of the LCR meter on a movable slide, and controls the position of the movable slide by a motor, so that the Hc and Hp terminals of the LCR meter slide to the position of the target pin, so that the Hc and Hp terminals of the LCR meter are electrically connected to the designated pins to be tested. This existing method for testing multi-pin electronic components based on a movable slide is inconvenient to switch the pins to be tested, and the test efficiency and test accuracy are relatively low. Summary of the invention

[0005] Based on this, the object of the present invention is to provide a multi-pin electronic component testing device, which has the advantages of fast switching speed, convenient operation, low control difficulty, high testing efficiency, small space occupation and low cost.

[0006] The present invention provides a multi-pin chip capacitor testing device, comprising: a plurality of relay modules and a driver; each of the relay modules has a first end for connecting a pair of pins to be tested of a chip capacitor to be tested, and a second end for connecting an input end of an LCR meter; when testing a designated target pin to be tested, the driver controls the relay module corresponding to the target pin to be tested to be closed, and controls the relay modules corresponding to other pins to be tested to be disconnected.

[0007] The present invention switches the pin to be tested by controlling the on-off switching of the relay module. Compared with the existing pin switching method based on a mobile slide, the present invention has faster switching speed, more convenient operation, lower control difficulty and higher test efficiency.

[0008] Furthermore, the relay module specifically includes an instrument-end relay and a chip-end relay connected in series; the instrument-end relay is close to the LCR meter, and the chip-end relay is close to the chip capacitor to be tested; when the driver controls the relay module to close, the instrument-end relay and the chip-end relay are controlled to close at the same time; when the driver controls the relay module to disconnect, the instrument-end relay and the chip-end relay are controlled to disconnect at the same time, thereby weakening the influence of the antenna effect to improve the test accuracy.

[0009] Furthermore, the multi-pin chip capacitor testing device also includes a probe card, a chip-end relay board and an instrument-end relay board; the probe card is used to install the chip capacitor to be tested; the chip-end relay board is used to install the chip-end relay; and the instrument-end relay board is used to install the instrument-end relay.

[0010] Furthermore, the probe card and the chip-end relay board are stacked to save space.

[0011] Furthermore, the instrument-end relay and the chip-end relay, as well as the chip-end relay and the pin to be tested of the chip capacitor to be tested, are electrically connected via an SMB coaxial connector.

[0012] Furthermore, the meter-end relay is electrically connected to an external LCR meter via a BNC coaxial connector.

[0013] Furthermore, the instrument-end relay and the chip-end relay are both coaxial relays.

[0014] Furthermore, the impedance of each signal transmission line on the chip-side relay board and the instrument-side relay board is equal.

[0015] Furthermore, the multi-pin chip capacitor testing device also includes: a base, a fixed guide rail, a lifting slider, a servo motor and a mounting platform; the fixed guide rail is vertically installed on the base; the lifting slider is slidably installed on the fixed guide rail; the output end of the servo motor is transmission-connected to the lifting slider for controlling the height of the lifting slider; the mounting platform is installed on the top of the lifting slider; the probe card is installed on the mounting platform; and the chip end relay board is installed on the probe card.

[0016] Based on the same inventive concept, the present invention also provides a multi-pin chip capacitor testing system, comprising: an LCR meter, a chip capacitor to be tested and any of the above-mentioned multi-pin chip capacitor testing devices; the chip capacitor to be tested is provided with a plurality of pins to be tested; each pin to be tested of the chip capacitor to be tested is connected to the input end of the LCR meter through a relay module of the multi-pin chip capacitor testing device.

[0017] The present invention has the following technical effects: 1. The present invention switches the pin to be tested by controlling the on-off switching of the relay module, which has faster switching speed, more convenient operation, lower control difficulty and higher test efficiency than the existing pin switching method based on a mobile slide. 2. The present invention reduces the influence of relay capacitance and antenna effect by setting instrument-end relays and chip-end relays, ensures measurement accuracy in high-frequency, high-speed and high-precision application scenarios, and balances the needs of reducing costs and improving measurement efficiency. The present invention adopts coaxial relays and coaxial connectors, and optimizes the PCB design to achieve impedance matching, which ensures the transmission stability and reliability of the test signal and further improves the test accuracy. 3. The present invention greatly reduces the space occupied by the measuring device by setting stacked probe cards and chip-end relay boards, and adapts to application scenarios with limited test station space.

[0018] For better understanding and implementation, the present invention is described in detail below with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a schematic diagram of the principle of testing the capacitance of the capacitor using the self-balancing bridge method;

[0020] Figure 2 This is a module schematic diagram of a multi-pin chip capacitor testing system according to Embodiment 1 of the present invention;

[0021] Figure 3 This is a module schematic diagram of a multi-pin chip capacitor testing system according to Embodiment 2 of the present invention;

[0022] Figure 4 This is a module schematic diagram of a multi-pin chip capacitor testing system according to Embodiment 3 of the present invention;

[0023] Figure 5 This is a partial structural diagram of a multi-pin chip capacitor testing device according to Embodiment 3 of the present invention. DETAILED DESCRIPTION

[0024] The following embodiments of the technical solution of the present application will be described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0025] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0026] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the terms "multiple" and "several" refer to more than two (including two), and similarly, "multiple groups" and "several groups" refer to more than two groups (including two groups), and "multiple pairs" and "several pairs" refer to more than two pairs (including two pairs).

[0027] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, indicating that there may be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0028] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0029] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0030] Regarding the problem of how to automatically switch the pins to be tested, the present invention adopts a solution that is completely different from the existing switching method using a mobile slide. The present invention connects multiple pairs of pins of the chip capacitor (MLCC) to be tested in parallel with the input end of the LCR meter through a relay module. When switching the pins to be tested, it is only necessary to disconnect the relay modules corresponding to other pins and close the relay module corresponding to the target pin, so that the input end of the LCR meter can be electrically connected to the target pin, with faster switching speed, more convenient operation, lower control difficulty, and higher test efficiency.

[0031] Example 1

[0032] See also Figure 2 , Figure 2 Schematic diagram of a module of a multi-pin chip capacitor test system of Embodiment 1 of the present invention. The multi-pin chip capacitor test system of Embodiment 1 of the present invention comprises an LCR meter 1, a test device 2 and a chip capacitor 3 to be tested. The test device 2 is the multi-pin chip capacitor test device of the present invention. The pins to be tested of the chip capacitor 3 to be tested are all connected to the input end of the LCR meter 1 through the test device 2.

[0033] Specifically, the chip capacitor 3 to be tested is a multi-pin polarized capacitor, and its pins to be tested include n pairs of positive pins HC1 / HP1, HC2 / HP2, ..., HCn / HPn and a pair of negative pins LC / LP. The chip capacitor 3 to be tested is equivalent to n polarized capacitors with unconnected positive poles and parallel negative poles.

[0034] Specifically, the input terminals of the LCR meter 1 include the Hc terminal, the Hp terminal, the Lc terminal and the Lp terminal. The test device 2 includes n relay modules S1 to Sn, and a driver (not shown) for controlling the on and off of the relay modules. A pair of negative pins LC / LP of the chip capacitor 3 to be tested are electrically connected to the Lc terminal and the Lp terminal of the LCR meter, respectively. The i-th pair of positive pins HCi / HPi of the chip capacitor 3 to be tested are electrically connected to the Hc terminal and the Hp terminal of the LCR meter, respectively, through the i-th relay module Si; i is any integer in the interval [1, n].

[0035] When it is necessary to test the i-th pair of positive pins of the chip capacitor 3 to be tested, the driver of the testing device 2 controls the i-th relay module Si to close, and controls other relay modules to disconnect, so that the connection between the designated i-th pair of positive pins and the Hc terminal and Hp terminal of the LCR meter is turned on, and the LCR meter 1 can test the capacitance corresponding to the i-th pair of positive pins by the self-balancing bridge method.

[0036] When the pin to be tested needs to be replaced, the driver only needs to control the relay module corresponding to the target pin to close and control other relay modules to disconnect to complete the switching. Compared with the existing switching method using a moving slide, the switching speed of the present invention is faster, the operation is more convenient, the control difficulty is lower, and the test efficiency is higher.

[0037] According to the working principle of the present invention, it can be deduced that the multi-pin chip capacitor test device of the present invention can also be used to test non-polar capacitors. Since non-polar capacitors do not distinguish between positive pins and negative pins, in the embodiment of testing non-polar capacitors, the positive pin can be replaced by a pin to be tested that is equivalent to the first end of the capacitor in the circuit, and the negative pin can be replaced by a pin to be tested that is equivalent to the second end of the capacitor in the circuit.

[0038] In this embodiment, since the chip capacitor 3 to be tested has only one pair of negative pins LC / LP, it is not necessary to switch the pins to be tested connected to the Lc and Lp ends of the LCR meter when switching the pins to be tested. In other embodiments, the chip capacitor to be tested may be provided with multiple pairs of negative pins. At this time, each pair of negative pins of the chip capacitor 3 to be tested is also connected to the Lc and Lp ends of the LCR meter through a relay module. The driver can also switch the target negative pins connected to the Lc and Lp ends of the LCR meter by controlling the on and off of the corresponding relay module.

[0039] Example 2

[0040] The present invention introduces a new relay capacitor after adopting the relay module, and the frequent disconnection / closing of the relay module also enhances the influence of the antenna effect, resulting in a decrease in test accuracy. Although reducing the frequency of disconnection / closing of the relay module can reduce the influence of the antenna effect, it also reduces the pin switching speed, affecting the test efficiency. Although increasing the number of test stations or LCR meters can ensure test efficiency, the cost is extremely high.

[0041] For the above questions, please refer to Figure 3 , Figure 3The module diagram of the multi-pin chip capacitor test system of embodiment 2 of the present invention. In this embodiment, each relay module Si of the test device 2 specifically includes: an instrument-end relay Si0 and a chip-end relay Si1 connected in series between the input end of the LCR meter 1 and the test pin of the chip capacitor 3 to be tested; the instrument-end relay Si0 is close to the LCR meter 1, and the chip-end relay Si1 is close to the chip capacitor 3 to be tested; i is any integer in the interval [1, n].

[0042] In addition, the instrument-end relay is close to the LCR meter, and the chip-end relay is close to the chip capacitor to be tested, which means that in terms of circuit connection, the input end of the LCR meter is connected to the instrument-end relay, the instrument-end relay is connected to the chip-end relay, and the chip-end relay is connected to the test pin of the chip capacitor to be tested, which does not mean "close" in spatial position.

[0043] When the driver of the test device 2 controls the i-th relay module Si to close, the driver controls the i-th instrument-end relay Si0 and the i-th chip-end relay Si1 to close simultaneously, so that the connection between the i-th positive pin HCi / HPi and the Hc end and Hp end of the LCR meter 1 is turned on. When the driver of the test device 2 controls the i-th relay module Si to disconnect, the driver controls the i-th instrument-end relay Si0 and the i-th chip-end relay Si1 to disconnect simultaneously, so that the connection between the i-th positive pin HCi / HPi and the Hc end and Hp end of the LCR meter is disconnected. i is any integer in the interval [1, n]. By setting the instrument-end relay and the chip-end relay, this embodiment weakens the influence of the antenna effect and ensures the test accuracy without reducing the switching speed and increasing the cost.

[0044] Example 3

[0045] See also Figure 4 , Figure 4 This is a module schematic diagram of a multi-pin chip capacitor testing device according to Embodiment 3 of the present invention.

[0046] In order to facilitate the replacement of the chip capacitor 3 to be tested, as well as the installation of relays and the design of routing, the test device 2 also includes: a probe card 201, a chip-end relay board 202 and an instrument-end relay board 203. The chip capacitor 3 to be tested is installed on the probe card 201, and its pins to be tested are electrically connected to the printed wires on the probe card 201. The chip-end relays S11 to Sn1 are all installed on the chip-end relay board 202. The instrument-end relays S10 to Sn0 are all installed on the instrument-end relay board 203.

[0047] Furthermore, due to the limited number of test stations, in order to save space, the probe card 201 and the chip-end relay board 202 are stacked. Figure 5 , Figure 5 The schematic diagram of the partial structure of the multi-pin chip capacitor test device of embodiment 3 of the present invention is shown in FIG. The chip-end relay board 202 is arranged on the upper layer of the probe card 201. In order to facilitate the staff to replace the chip capacitor 3 to be tested installed on the probe card 201, an opening 202a is also provided in the chip-end relay board 202, so that the staff can replace the chip capacitor 3 to be tested installed on the lower layer of the probe card 201 through the opening 202a.

[0048] Furthermore, the chip-end relay board 202 and / or the instrument-end relay board 203 are also provided with relay indicator lights (not shown) for indicating the on / off status of the n instrument-end relays S10~Sn0 and / or the n chip-end relays S11~Sn1, so as to facilitate observation and debugging by the staff.

[0049] Furthermore, the application scenario of the present invention is a high-speed and high-frequency scenario. In order to improve the test accuracy, the instrument-end relay and the chip-end relay are both coaxial relays, specifically reed coaxial relays with high insulation, impedance of 50Ω, and contacts that work normally at a frequency of 1Mhz. Figure 4 , the Hc end and Hp end of the LCR meter are connected to the instrument-end relay on the instrument-end relay board 203 through a BNC (Bayonet Neill-Concelman) coaxial connector; the i-th instrument-end relay Si0 on the instrument-end relay board 203 is connected to the corresponding i-th chip-end relay Si1 on the chip-end relay board 202 through an SMB coaxial connector; i is any integer in the interval [1, n]. The chip-end relay on the chip-end relay board 202 is connected to the probe card 201 through the SMB coaxial connector, so that the chip-end relay is connected to the corresponding pin to be tested through the SMB coaxial connector and the printed wire on the probe card 201. The coaxial relay is sensitive to switching and has excellent isolation and protection performance. The wire of the coaxial connector is coated with an electromagnetic shielding layer, which can effectively isolate the internal signal from the external electromagnetic interference, and has good impedance matching, which can effectively reduce the reflection and attenuation of the signal during the transmission process. The present invention adopts a coaxial relay and a coaxial connector, which effectively improves the signal transmission quality and thus improves the test accuracy.

[0050] In this embodiment, the wire length of the SMB coaxial connector is 0.5-1.5 m, which is convenient for quick plugging and unplugging.

[0051] Furthermore, in order to improve the test accuracy, the present invention performs impedance matching when designing the PCB routing of the chip-end relay board 202 and the instrument-end relay board 203, so that the impedance of each signal transmission line on the chip-end relay board 202 and the instrument-end relay board 203 is equal and maintained at 50Ω, further ensuring the transmission stability and reliability of the test signal and improving the test accuracy.

[0052] In this embodiment, the chip-end relay board 202 and the instrument-end relay board 203 are PCB boards made of FR-4 material.

[0053] Furthermore, in an actual automated test scenario, after a test device 2 completes a round of testing on all the pins to be tested, the test device 2 needs to change its position to perform data synchronization or other processes. Therefore, the test device 2 of the present invention also has a height adjustment function. Figure 5 The testing device 2 further includes: a base 211 , a fixed guide rail 212 , a reinforcing rib 212 a , a lifting slider 213 , a servo motor 214 and a mounting platform 215 .

[0054] The base 211 is installed on the ground or a workbench. The fixed guide rail 212 is vertically installed on the base 211. In order to improve the stability of the fixed guide rail 212 installed on the base 211, a reinforcing rib 212a is also provided between the fixed guide rail 212 and the base 211. The lifting slider 213 is slidably installed on the fixed guide rail 212, and can slide up and down within the range limited by the fixed guide rail 212, thereby changing the height. The output end of the servo motor 214 is transmission-connected with the lifting slider 213, and is used to control the height of the lifting slider 213. The mounting platform 215 is a fiberglass board, which is mounted on the top of the lifting slider 213 and can change the height following the lifting slider 213. The probe card 201 is embedded and installed on the mounting platform 215. The chip-end relay board 202 is installed on the upper layer of the probe card 201.

[0055] Obviously, the relative positions of the lifting slider 213, the mounting platform 215, the probe card 201 and the chip-end relay board 202 are fixed, and the four change height synchronously. In this embodiment, when the test starts, the servo motor 214 controls the height of the lifting slider 213 to drop, and the mounting platform 215, the probe card 201 and the chip-end relay board 202 drop in height synchronously; after the test is completed, the servo motor 216 controls the height of the lifting slider 213 to rise, and the mounting platform 215, the probe card 201 and the chip-end relay board 202 rise in height synchronously, so that the staff can intuitively understand the status of the test device 2 through the height, and it is also convenient to perform other processes such as data synchronization after the test is completed.

[0056] The present invention has the following technical effects: 1. The present invention switches the pin to be tested by controlling the on-off switching of the relay module, which has a faster switching speed, more convenient operation, lower control difficulty and higher test efficiency than the existing switching pin method based on a mobile slide. Experiments have shown that the time taken to switch the pin to be tested by the present invention is less than 5ms, and the switching speed is extremely fast. 2. The present invention reduces the influence of relay capacitance and antenna effect by setting the instrument end relay and the chip end relay, ensures the measurement accuracy in the application scenario of high frequency, high speed and high precision, and balances the requirements of reducing costs and improving measurement efficiency. The present invention adopts coaxial relays and coaxial connectors, and optimizes the PCB design to achieve impedance matching, which ensures the transmission stability and reliability of the test signal and further improves the test accuracy. Experiments have shown that the test device of the present invention has excellent repeatability for multiple tests of 6-electrode chip capacitors, and the repeated test error is within 0.3%; when measuring the chip capacitor with a true capacitance of 220pF, the measurement error is less than 3pF. 3. The present invention greatly reduces the space occupied by the measuring device by setting a stacked probe card and a chip end relay board, and adapts to the application scenario with limited test station space.

[0057] The above-mentioned embodiments only express several implementation methods of the present invention, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the invention patent. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present invention, and the present invention is also intended to include these modifications and modifications.

Claims

1. A multi-pin chip capacitor testing device, characterized in that: include: Several relay modules and drivers; Each of the relay modules has a first end for connecting a pair of pins to be tested of the capacitor of the chip to be tested, and a second end for connecting an input end of an LCR meter; When testing a designated target pin to be tested, the driver controls the relay module corresponding to the target pin to be tested to close, and controls the relay modules corresponding to other pins to be tested to open.

2. The multi-pin chip capacitor testing device according to claim 1, characterized in that: The relay module specifically includes an instrument-end relay and a chip-end relay connected in series; the instrument-end relay is close to the LCR meter, and the chip-end relay is close to the chip capacitor to be tested; When the driver controls the relay module to close, it controls the instrument-end relay and the chip-end relay to close simultaneously; When the driver controls the relay module to be disconnected, the instrument-end relay and the chip-end relay are controlled to be disconnected simultaneously.

3. The multi-pin chip capacitor testing device according to claim 2, characterized in that: It also includes a probe card, a chip-end relay board and an instrument-end relay board; the probe card is used to install the chip capacitor to be tested; the chip-end relay board is used to install the chip-end relay; the instrument-end relay board is used to install the instrument-end relay.

4. The multi-pin chip capacitor testing device according to claim 3, characterized in that: The probe card and the chip end relay board are stacked.

5. The multi-pin chip capacitor testing device according to claim 4, characterized in that: The instrument-end relay and the chip-end relay, as well as the chip-end relay and the pin to be tested of the chip capacitor to be tested, are electrically connected via an SMB coaxial connector.

6. The multi-pin chip capacitor testing device according to claim 5, characterized in that: The meter-end relay is electrically connected to an external LCR meter via a BNC coaxial connector.

7. The multi-pin chip capacitor testing device according to claim 6, characterized in that: The instrument-end relay and the chip-end relay are both coaxial relays.

8. The multi-pin chip capacitor testing device according to claim 7, characterized in that: The impedance of each signal transmission line on the chip-side relay board and the instrument-side relay board is equal.

9. The multi-pin chip capacitor testing device according to any one of claims 3 to 8, characterized in that: It also includes: a base, a fixed guide rail, a lifting slider, a servo motor and a mounting platform; the fixed guide rail is vertically installed on the base; the lifting slider is slidably installed on the fixed guide rail; the output end of the servo motor is transmission-connected with the lifting slider for controlling the height of the lifting slider; the mounting platform is installed on the top of the lifting slider; the probe card is installed on the mounting platform; and the chip-end relay board is installed on the probe card.

10. A multi-pin chip capacitance test system, characterized in that: include: An LCR meter, a chip capacitor to be tested, and a multi-pin chip capacitor testing device according to any one of claims 1 to 9; The chip capacitor to be tested is provided with a plurality of pins to be tested; Each pin to be tested of the chip capacitor to be tested is connected to the input end of the LCR meter through a relay module of the multi-pin chip capacitor testing device.

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