Insulated gate bipolar transistor operation power loss test system

Abstract

The invention discloses an insulated gate bipolar transistor operation power loss test system, relates to the technical field of power loss test, and solves the technical problem that in the prior art, loss test analysis cannot be carried out on operation power, so that the operation efficiency cannot be ensured. Specifically, an operation influence analysis unit analyzes the operation influence of the electric control equipment, collects a time consumption influence parameter and a temperature influence parameter of the electric control equipment, and analyzes and judges whether the operation influence is abnormal or not according to the parameters; the power loss test unit is used for performing power loss test on the electric control equipment, acquiring power floating information and duration delay information of the electric control equipment, and analyzing and judging whether the power loss test is qualified or not according to the information; whether the current electric control equipment loss test is qualified or not is judged according to the real-time power floating detection, so that the operation of the electric control equipment is monitored in real time, and timely regulation and control are facilitated when the electric control equipment is monitored to be abnormal.

Description

Technical Field

[0001] The invention relates to the technical field of power loss testing, and in particular to an insulated gate bipolar transistor operation power loss testing system. Background Art

[0002] The insulated gate bipolar transistor is a device composed of a MOSFET and a bipolar transistor. Its input pole is a MOSFET and its output pole is a PNP transistor. It combines the advantages of these two devices. It has the advantages of low driving power and fast switching speed of MOSFET devices, and the advantages of low saturation voltage and large capacity of bipolar devices.

[0003] However, in the prior art, it is not possible to perform dynamic characteristic analysis and operating performance analysis on the insulated gate bipolar transistor during operation, so that the operating qualification cannot be ensured before the power loss test, and the real-time operation cannot be detected, which reduces the operating efficiency. In addition, it is impossible to perform loss test analysis on the operating power, so that the operating efficiency cannot be guaranteed and unnecessary costs cannot be avoided.

[0004] In view of the above technical defects, a solution is now proposed. Summary of the invention

[0005] The purpose of the present invention is to solve the above-mentioned problems and to provide an insulated gate bipolar transistor operation power loss test system.

[0006] The purpose of the present invention can be achieved through the following technical solutions:

[0007] An insulated gate bipolar transistor operation power loss test system includes a loss test platform, wherein the loss test platform is communicatively connected with a device sub-platform and an operation sub-platform; the insulated gate bipolar transistor is marked as an electric control device;

[0008] The equipment sub-platform is connected with: a dynamic characteristic analysis unit, which is used to perform dynamic characteristic analysis on the electric control equipment, collect the start-up operation data and the shutdown operation data of the electric control equipment, substitute them into the formula to obtain the dynamic characteristic analysis coefficient of the electric control equipment, and compare and infer whether the dynamic characteristic analysis is qualified according to the dynamic characteristic analysis coefficient;

[0009] The operation performance analysis unit is used to perform operation performance analysis on the electric control equipment, collect the saturation voltage influence information and rated voltage influence information of the electric control equipment, and compare the information to determine whether the operation performance analysis is qualified;

[0010] The operation sub-platform is connected with: an operation impact analysis unit, which is used to analyze the operation impact of the electric control equipment, collect the time consumption impact parameters and temperature impact parameters of the electric control equipment, and judge whether the operation impact is abnormal based on the parameter analysis;

[0011] The power loss test unit is used to perform power loss test on the electronic control equipment, collect the power floating information and time delay information of the electronic control equipment, and judge whether the power loss test is qualified based on the information analysis.

[0012] As a preferred embodiment of the present invention, the startup operation data includes the non-overlapping duration of the time period for the gate-emitter voltage value to reach the set value and the time period for the collector current value to reach the set value when the electronic control device starts to run, and the increase in the speed of the collector current value rising to the set value at adjacent moments in the process of the gate-emitter voltage value rising to the set value; the shutdown operation data includes the delay duration of the moment when the gate-emitter voltage set value decreases and the moment when the collector current set value decreases when the electronic control device ends running, and the maximum deviation value of the real-time collector current value decrease speed corresponding to adjacent moments after the electronic control device ends running.

[0013] As a preferred embodiment of the present invention, the dynamic characteristic analysis coefficient comparison process is as follows:

[0014] If the dynamic characteristic analysis coefficient of the electronic control device exceeds the dynamic characteristic analysis coefficient threshold, the dynamic characteristic analysis is judged to be unqualified and a dynamic characteristic abnormality signal is generated;

[0015] If the dynamic characteristic analysis coefficient of the electronic control device does not exceed the dynamic characteristic analysis coefficient threshold, the dynamic characteristic analysis is determined to be qualified, and a dynamic characteristic normal signal is generated.

[0016] As a preferred embodiment of the present invention, the saturation voltage impact information and the rated voltage impact information are respectively the time consumption for the collector-emitter voltage to increase and float when the current does not float and return to the original rated value when the collector-emitter voltage passes through the rated current in the operation stage of the electronic control equipment in saturation conduction, and the shortening speed of the excess value between the gate-emitter rated voltage value and the real-time gate-emitter voltage when the electronic control equipment is not in saturation conduction in the operation stage.

[0017] As a preferred embodiment of the present invention, the information comparison process is as follows:

[0018] If the saturation voltage impact information exceeds the time-consuming floating amount threshold, or the rated voltage impact information exceeds the excess value shortening speed threshold, an operation performance risk signal is generated;

[0019] If the saturation voltage impact information does not exceed the time-consuming floating amount threshold, and the rated voltage impact information does not exceed the excess value shortening speed threshold, an operation performance safety signal is generated.

[0020] As a preferred embodiment of the present invention, the time consumption influencing parameter and the temperature consumption influencing parameter are respectively the continuously rising span value of the average increase in the opening and closing time of adjacent operating cycles of the electronic control equipment and the rising speed of the peak operating temperature of the circuit within a single operating cycle of the electronic control equipment.

[0021] As a preferred embodiment of the present invention, the parameter analysis process is as follows:

[0022] If the time-consuming impact parameter exceeds the continuous rise span value threshold, or the temperature impact parameter exceeds the peak temperature rise rate threshold, an environmental high impact signal is generated;

[0023] If the time impact parameter does not exceed the continuous rise span value threshold, and the temperature impact parameter does not exceed the peak temperature rise rate threshold, an environmental low impact signal is generated.

[0024] As a preferred embodiment of the present invention, the power floating information and the time delay information are respectively the ratio of the average growth span value of the time consumption of the electric control equipment during the stage of increasing average turning on and off time consumption of the electric control equipment during operation to the growth span value of the power floating span with the same trend, and the accumulated delay time of the power value floating node when the circuit temperature rises and is controlled to the set range during operation of the electric control equipment.

[0025] As a preferred embodiment of the present invention, the information analysis process is as follows:

[0026] If the power fluctuation information exceeds the growth span value ratio threshold, or the duration delay information exceeds the duration delay information, a power loss abnormality signal is generated and sent to the operation sub-platform;

[0027] If the power floating information does not exceed the growth span value ratio threshold, and the duration delay information does not exceed the duration delay information, a power loss normal signal is generated and sent to the operation sub-platform.

[0028] Compared with the prior art, the present invention has the following beneficial effects:

[0029] 1. In the present invention, the dynamic characteristics of the insulated gate bipolar transistor are analyzed to determine whether the dynamic characteristics of the insulated gate bipolar transistor meet the actual needs, so as to ensure that the on-off and off of the insulated gate bipolar transistor are qualified, and the operating efficiency of the insulated gate bipolar transistor is guaranteed, so as to better control parameters such as voltage; the operating performance analysis of the electric control equipment is performed, and the operating parameters of the electric control equipment are analyzed through the operating performance analysis to ensure the operating qualification of the electric control equipment, ensure the effectiveness of power control and work efficiency, and improve the operating quality of the electric control equipment.

[0030] 2. In the present invention, the impact on the operation of the electronic control equipment is analyzed, and the operating environment of the electronic control equipment is analyzed to determine whether the current operating environment affects the power of the electronic control equipment, so as to avoid the abnormal operating environment causing increased operating loss of the electronic control equipment and reducing the operating efficiency of the electronic control equipment; a power loss test is performed on the electronic control equipment, and it is determined whether the current loss test of the electronic control equipment is qualified based on real-time power floating detection, so as to monitor the operation of the electronic control equipment in real time, so as to facilitate timely regulation when the electronic control equipment is monitored abnormally, ensure the high operating efficiency of the electronic control equipment, and reduce unnecessary loss of the electronic control equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to facilitate understanding by those skilled in the art, the present invention is further described below with reference to the accompanying drawings.

[0032] Figure 1 It is the overall principle block diagram of the present invention;

[0033] Figure 2 It is a principle block diagram of the device sub-platform in the present invention;

[0034] Figure 3 It is a principle block diagram of the operating sub-platform in the present invention. DETAILED DESCRIPTION

[0035] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0036] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present invention. The appearance of the phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0037] See also Figure 1 As shown, an insulated gate bipolar transistor operation power loss test system includes a loss test platform, wherein the loss test platform is communicatively connected with a device sub-platform and an operation sub-platform;

[0038] Embodiment 1

[0039] See also Figure 2As shown, in this embodiment, during the use of the insulated gate bipolar transistor, the performance of the device itself is monitored and evaluated to ensure that the operating power loss test can eliminate the influence of abnormal device performance and improve the accuracy of the operating power loss test, wherein the device sub-platform is communicatively connected with the dynamic characteristic analysis unit and the operating performance analysis unit, and after the data processing of the dynamic characteristic analysis unit and the operating performance analysis unit is completed, the final signal transmission flow reaches the loss test platform;

[0040] After the loss test platform generates a device detection signal to the device sub-platform, the device sub-platform generates a dynamic characteristic analysis signal and sends the dynamic characteristic analysis signal to the dynamic characteristic analysis unit. After receiving the dynamic characteristic analysis signal, the dynamic characteristic analysis unit performs a dynamic characteristic analysis on the insulated gate bipolar transistor to determine whether the dynamic characteristics of the insulated gate bipolar transistor meet actual requirements, thereby ensuring that the insulated gate bipolar transistor is turned on and off properly and the operating efficiency of the insulated gate bipolar transistor is guaranteed, so as to better control parameters such as voltage;

[0041] Mark the insulated gate bipolar transistor as an electric control device, obtain the non-overlapping duration of the time period for the gate-emitter voltage value to reach the set value and the time period for the collector current value to reach the set value when the electric control device starts to operate, and the increase in the speed of the collector current value rising to the set value at adjacent moments in the process of the gate-emitter voltage value rising to the set value, and mark the non-overlapping duration of the time period for the gate-emitter voltage value to reach the set value and the time period for the collector current value to reach the set value when the electric control device starts to operate, and the increase in the speed of the collector current value rising to the set value at adjacent moments in the process of the gate-emitter voltage value rising to the set value as FCD and SDZ respectively; mark the above collected data as start-up operation data;

[0042] Obtain the delay time between the gate-emitter voltage setting value falling moment and the collector current setting value falling moment when the electric control device ends operation, and at the same time obtain the maximum deviation value of the collector current real-time value falling speed corresponding to the adjacent moments after the electric control device ends operation, and mark the delay time between the gate-emitter voltage setting value falling moment and the collector current setting value falling moment when the electric control device ends operation and the maximum deviation value of the collector current real-time value falling speed corresponding to the adjacent moments after the electric control device ends operation as YCS and SDP respectively; mark the above collected data as shutdown operation data;

[0043] Substituting the above collected data into the formula, the dynamic characteristic analysis coefficient DT of the electronic control equipment is obtained, where the formula is Wherein, faw1, faw2, faw3 and faw4 are respectively the non-overlapping duration of the time-consuming period, the speed increase of the ascending speed, the delay duration of the descending moment and the preset proportional coefficient of the maximum deviation value of the descending speed, and e is a natural constant, and β is an error correction factor with a value of 1.21;

[0044] Compare the dynamic characteristic analysis coefficient DT of the electronic control equipment with the dynamic characteristic analysis coefficient threshold:

[0045] If the dynamic characteristic analysis coefficient DT of the electric control equipment exceeds the dynamic characteristic analysis coefficient threshold, the dynamic characteristic analysis is judged to be unqualified, a dynamic characteristic abnormality signal is generated and sent to the loss test platform, which receives the signal and forwards it to the administrator terminal, and performs maintenance on the electric control equipment;

[0046] If the dynamic characteristic analysis coefficient DT of the electronic control device does not exceed the dynamic characteristic analysis coefficient threshold, the dynamic characteristic analysis is determined to be qualified, a dynamic characteristic normal signal is generated and the dynamic characteristic normal signal is sent to the loss test platform;

[0047] At the same time, an operation performance analysis signal is generated and sent to the operation performance analysis unit. After receiving the operation performance analysis signal, the operation performance analysis unit performs operation performance analysis on the electric control equipment. Through the operation performance analysis, data analysis is performed on the operation parameters of the electric control equipment to ensure the operation qualification of the electric control equipment, ensure the effectiveness and work efficiency of power control, and improve the operation quality of the electric control equipment;

[0048] The time consumption fluctuation amount of the collector-emitter voltage that passes the rated current and is in saturated conduction during the operation stage of the electric control device, when the current does not float, when the value increases and floats and returns to the original rated value unchanged, is obtained, and at the same time, the excess value reduction speed of the gate-emitter rated voltage value and the real-time gate-emitter voltage when the electric control device is not in saturated conduction during the operation stage is obtained, and the time consumption fluctuation amount of the collector-emitter voltage that passes the rated current and is in saturated conduction during the operation stage of the electric control device, when the current does not float, when the current increases and floats and returns to the original rated value unchanged, and the excess value reduction speed of the gate-emitter rated voltage value and the real-time gate-emitter voltage when the electric control device is not in saturated conduction during the operation stage are marked as saturation voltage influence information and rated voltage influence information, respectively, and compared with the time consumption fluctuation amount threshold and the excess value reduction speed threshold, respectively:

[0049] If during the operation stage of the electric control equipment, when the collector-emitter voltage passing the rated current is in saturated conduction, its value increases and fluctuates when the current does not float, and the time taken to recover to the original rated value unchanged exceeds the time taken to float threshold, or if during the operation stage of the electric control equipment, when the gate-emitter rated voltage value is not in saturated conduction and the excess value shortening speed of the real-time gate-emitter voltage exceeds the excess value shortening speed threshold, then the operation performance analysis of the electric control equipment is judged to be abnormal, an operation performance risk signal is generated and sent to the loss test platform; the loss test platform receives the operation performance risk signal and forwards it to the administrator terminal, and after receiving it, the administrator performs equipment operation adjustment and maintenance on the electric control equipment, and performs a loss test after the operation performance maintenance is qualified;

[0050] If the collector-emitter voltage passing the rated current during the operation stage of the electric control equipment in saturation conduction increases and fluctuates when the current does not float, and the time taken to recover to the original rated value does not exceed the time taken to float threshold, and the speed of shortening the excess value between the gate-emitter rated voltage value and the real-time gate-emitter voltage when the electric control equipment is not in saturation conduction during the operation stage does not exceed the threshold of the shortening speed, then it is judged that the operation performance analysis of the electric control equipment is normal, an operation performance safety signal is generated, and the operation performance safety signal is sent to the loss test platform;

[0051] Embodiment 2

[0052] See also Figure 3 As shown, after the previous embodiment is executed, it is ensured that the electric control equipment operates properly. In this embodiment, a loss test is performed on the operation of the electric control equipment, and the operation sub-platform is communicatively connected with the operation impact analysis unit and the power loss test unit;

[0053] The operation sub-platform generates an operation impact analysis signal and sends the operation impact analysis signal to the operation impact analysis unit. After receiving the operation impact analysis signal, the operation impact analysis unit analyzes the operation impact of the electric control equipment, and determines whether the current operation environment affects the power of the electric control equipment through the operation environment analysis of the electric control equipment, so as to avoid the increase of the operation loss of the electric control equipment due to the abnormal operation environment, thereby reducing the operation efficiency of the electric control equipment;

[0054] The continuously rising span value of the increase in the average time consumption for opening and closing the adjacent operating cycles of the electric control equipment and the rising speed of the peak temperature of the circuit operation in a single operating cycle of the electric control equipment are obtained, and the continuously rising span value of the increase in the average time consumption for opening and closing the adjacent operating cycles of the electric control equipment and the rising speed of the peak temperature of the circuit operation in a single operating cycle of the electric control equipment are marked as time influence parameters and temperature influence parameters, respectively, and compared with the continuously rising span value threshold and the peak temperature rising speed threshold, respectively:

[0055] If the continuous rising span value of the increase in the average time consumption for opening and closing the electric control equipment in adjacent operation cycles exceeds the continuous rising span value threshold, or the rising speed of the circuit operation peak temperature in a single operation cycle of the electric control equipment exceeds the peak temperature rising speed threshold, then the operation impact analysis of the electric control equipment is determined to be abnormal, and an environmental high impact signal is generated and sent to the operation sub-platform. After receiving the environmental high impact signal, the operation sub-platform controls the operation environment of the electric control equipment;

[0056] If the continuously rising span value of the increase in the average time consumed for opening and closing the electric control equipment in adjacent operating cycles does not exceed the continuously rising span value threshold, and the rising speed of the circuit operating peak temperature in a single operating cycle of the electric control equipment does not exceed the peak temperature rising speed threshold, then it is determined that the operation impact analysis of the electric control equipment is normal, and an environmental low impact signal is generated and sent to the operating sub-platform, which forwards the environmental low impact signal to the loss test platform after receiving it;

[0057] At the same time, a power loss test signal is generated and sent to a power loss test unit. After receiving the power loss test signal, the power loss test unit performs a power loss test on the electric control equipment, and determines whether the current electric control equipment loss test is qualified according to the real-time power floating detection, thereby performing real-time monitoring on the operation of the electric control equipment, facilitating timely regulation when the electric control equipment is abnormally monitored, ensuring the high efficiency of the operation of the electric control equipment, and reducing unnecessary loss of the electric control equipment;

[0058] The numerical ratio of the average growth span value of the time consumption of the electric control equipment during the stage of increasing the average time consumption for opening and closing the electric control equipment during operation to the growth span value of the power floating span with the same trend is obtained, and at the same time, the cumulative delay time of the power value floating node when the circuit temperature rises and is controlled to the set range when the electric control equipment is running is collected, where the floating node is represented by the power value rising time node and the falling time node, and the numerical ratio of the average growth span value of the time consumption of the electric control equipment during the stage of increasing the average time consumption for opening and closing the electric control equipment during operation to the growth span value of the power floating span with the same trend, and the cumulative delay time of the power value floating node when the circuit temperature rises and is controlled to the set range when the electric control equipment is running are marked as power floating information and time delay information, respectively, and compared with the growth span value ratio threshold and the delay time cumulative threshold, respectively:

[0059] If the ratio of the average growth span value of the time consumption of the electric control equipment during the stage of increasing average time consumption for opening and closing of the electric control equipment during operation to the growth span value of the power floating span with the same trend exceeds the growth span value ratio threshold, or the circuit temperature rises during operation of the electric control equipment and the accumulated delay time of the power value floating node when it is controlled to the set range exceeds the time delay information, then the power loss test of the electric control equipment is determined to be abnormal, a power loss abnormality signal is generated and sent to the operation sub-platform, which forwards it to the loss test platform, which records the current operation period of the electric control equipment, adjusts the operation of the electric control equipment, and inspects the equipment itself;

[0060] If the ratio of the average growth span value of the time consumption of the electric control equipment during the increase stage of the average time consumption of opening and closing of the electric control equipment during operation to the growth span value of the power floating span with the same trend does not exceed the growth span value ratio threshold, and the circuit temperature rises during operation of the electric control equipment and the accumulated delay time of the power value floating node when it is controlled to the set range does not exceed the time delay information, then it is determined that the power loss test of the electric control equipment is normal, a power loss normal signal is generated and sent to the operation sub-platform, and the operation sub-platform forwards it to the loss test platform;

[0061] The above formulas are obtained by collecting a large amount of data and performing software simulation, and a formula close to the actual value is selected. The coefficients in the formula are set by technicians in this field according to actual conditions;

[0062] When the present invention is in use, the dynamic characteristic analysis unit performs dynamic characteristic analysis on the electric control equipment, collects the start-up operation data and the shutdown operation data of the electric control equipment, substitutes the data into the formula to obtain the dynamic characteristic analysis coefficient of the electric control equipment, and infers whether the dynamic characteristic analysis is qualified based on the dynamic characteristic analysis coefficient comparison; the operation performance analysis unit performs operation performance analysis on the electric control equipment, collects the saturation voltage influence information and the rated voltage influence information of the electric control equipment, and judges whether the operation performance analysis is qualified based on the information comparison; the operation impact analysis unit analyzes the operation impact of the electric control equipment, collects the time consumption influence parameters and the temperature influence parameters of the electric control equipment, and judges whether the operation impact is abnormal based on the parameter analysis; the power loss test unit performs power loss test on the electric control equipment, collects the power floating information and the time delay information of the electric control equipment, and judges whether the power loss test is qualified based on the information analysis.

[0063] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to only specific implementation methods. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. An insulated gate bipolar transistor operating power loss test system, characterized in that: The invention comprises a loss test platform, wherein the loss test platform is communicatively connected with a device sub-platform and an operation sub-platform; and an insulated gate bipolar transistor is marked as an electric control device; The equipment sub-platform is connected with: a dynamic characteristic analysis unit, which is used to perform dynamic characteristic analysis on the electric control equipment, collect the start-up operation data and the shutdown operation data of the electric control equipment, substitute them into the formula to obtain the dynamic characteristic analysis coefficient of the electric control equipment, and compare and infer whether the dynamic characteristic analysis is qualified according to the dynamic characteristic analysis coefficient; The operation performance analysis unit is used to perform operation performance analysis on the electric control equipment, collect the saturation voltage influence information and rated voltage influence information of the electric control equipment, and compare the information to determine whether the operation performance analysis is qualified; The operation sub-platform is connected with: an operation impact analysis unit, which is used to analyze the operation impact of the electric control equipment, collect the time consumption impact parameters and temperature impact parameters of the electric control equipment, and judge whether the operation impact is abnormal based on the parameter analysis; The power loss test unit is used to perform power loss test on the electronic control equipment, collect the power floating information and time delay information of the electronic control equipment, and judge whether the power loss test is qualified based on the information analysis.

2. The insulated gate bipolar transistor operating power loss test system according to claim 1, characterized in that: The start-up operation data include the non-overlapping duration of the time period for the gate-emitter voltage value to reach the set value and the time period for the collector current value to reach the set value when the electronic control equipment starts to run, and the increase in the speed of the collector current value rising to the set value at adjacent moments in the process of the gate-emitter voltage value rising to the set value; the shutdown operation data include the delay duration of the moment when the gate-emitter voltage set value decreases and the moment when the collector current set value decreases when the electronic control equipment stops running, and the maximum deviation value of the collector current real-time value decrease speed corresponding to adjacent moments after the electronic control equipment stops running.

3. The insulated gate bipolar transistor operating power loss test system according to claim 2, characterized in that: The dynamic characteristics analysis coefficient comparison process is as follows: If the dynamic characteristic analysis coefficient of the electronic control device exceeds the dynamic characteristic analysis coefficient threshold, the dynamic characteristic analysis is judged to be unqualified and a dynamic characteristic abnormality signal is generated; If the dynamic characteristic analysis coefficient of the electronic control device does not exceed the dynamic characteristic analysis coefficient threshold, the dynamic characteristic analysis is determined to be qualified, and a dynamic characteristic normal signal is generated.

4. The insulated gate bipolar transistor operating power loss test system according to claim 1, characterized in that: The saturation voltage impact information and the rated voltage impact information are respectively the time consumption for the collector-emitter voltage to increase and float when the current does not float and return to the original rated value when the collector-emitter voltage passes through the rated current in the operation stage of the electronic control equipment in saturation conduction when the current is not floating, and the shortening speed of the excess value between the gate-emitter rated voltage value and the real-time gate-emitter voltage when the electronic control equipment is not in saturation conduction in the operation stage.

5. The insulated gate bipolar transistor operating power loss test system according to claim 4, characterized in that: The information comparison process is as follows: If the saturation voltage impact information exceeds the time-consuming floating amount threshold, or the rated voltage impact information exceeds the excess value shortening speed threshold, an operation performance risk signal is generated; If the saturation voltage impact information does not exceed the time-consuming floating amount threshold, and the rated voltage impact information does not exceed the excess value shortening speed threshold, an operation performance safety signal is generated.

6. The insulated gate bipolar transistor operating power loss test system according to claim 1, characterized in that: The time consumption influencing parameter and the temperature influencing parameter are respectively the continuously rising span value of the increase in the average time consumption for opening and closing the electric control equipment in adjacent operating cycles and the rising speed of the peak operating temperature of the circuit in a single operating cycle of the electric control equipment.

7. The insulated gate bipolar transistor operating power loss test system according to claim 6, characterized in that: The parameter analysis process is as follows: If the time-consuming impact parameter exceeds the continuous rise span value threshold, or the temperature impact parameter exceeds the peak temperature rise rate threshold, an environmental high impact signal is generated; If the time-consuming impact parameter does not exceed the continuous rise span value threshold, and the temperature impact parameter does not exceed the peak temperature rise rate threshold, an environmental low impact signal is generated.

8. The insulated gate bipolar transistor operating power loss test system according to claim 1, characterized in that: The power floating information and time delay information are respectively the ratio of the average growth span value of the time consumption of the electronic control equipment during the stage of increasing average opening and closing time consumption of the electronic control equipment during operation to the growth span value of the power floating span with the same trend, and the cumulative delay time of the power value floating node when the circuit temperature rises and is controlled to the set range during operation of the electronic control equipment.

9. The insulated gate bipolar transistor operating power loss test system according to claim 8, characterized in that: The information analysis process is as follows: If the power fluctuation information exceeds the growth span value ratio threshold, or the duration delay information exceeds the duration delay information, a power loss abnormality signal is generated and sent to the operation sub-platform; If the power floating information does not exceed the growth span value ratio threshold, and the duration delay information does not exceed the duration delay information, a power loss normal signal is generated and sent to the operation sub-platform.

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