Detection method and system for chip operation process

Abstract

The invention provides a detection method and system for a chip operation process, and the method comprises the steps: obtaining a detection task, obtaining a plurality of detection targets based on the detection task, obtaining a plurality of original detection flows corresponding to the detection targets, and carrying out the detection of the chip operation process based on the detection targets. Obtaining a plurality of target operation processes corresponding to the plurality of original detection processes, adjusting the plurality of original detection processes based on the plurality of target operation processes to obtain a plurality of final detection processes, and obtaining a current operation process, and identifying a current target detection process in the plurality of final detection processes based on the current operation process, and detecting the chip based on the current target detection process to obtain a detection result of the chip operation process, thereby realizing synchronous operation of the chip operation process and the detection process, and improving the detection efficiency. And furthermore, the accuracy of a chip performance detection result is improved through real-time detection of the dynamic operation process of the chip.

Description

Technical Field

[0001] The present invention relates to the field of smart chips and signal transmission technology, and in particular to a detection method and system for a chip operation process. Background Art

[0002] A chip refers to a silicon wafer containing an integrated circuit, also known as a microcircuit, microchip or integrated circuit (IC). Its essence is an integrated circuit containing semiconductors and has certain special functions.

[0003] With the iteration of chip technology, the computing power of existing chips is constantly improving, and the processing types of chips are also increasing. However, high-performance chips always face various possible failures and abnormal conditions in the process of actual application. At present, in order to reduce the failure rate of chips and extend the life of chips, the performance of chips is usually tested regularly during the actual application of chips. However, when the existing technology performs performance testing on the chip, the current process of the chip will be stopped, thereby delaying the normal working process of the chip. Therefore, how to reduce the impact of performance testing on the normal working process of the chip is the current research focus.

[0004] In order to reduce the impact of performance testing on the normal working process of the chip, the current research direction is to improve the efficiency of performance testing, reduce the process and time of performance testing, and thus reduce the time when the chip interrupts normal operation. However, this method will actually still stop the current process of the chip, and the existing technology itself cannot detect the dynamic operation process of the chip. On this basis, deleting the test process will further increase the deviation of the test results, resulting in the test process still having a great impact on the chip operation process, while the accuracy of the chip performance test results is greatly reduced. Summary of the invention

[0005] The present application provides a detection method, system and related equipment for the chip operation process, with the aim of realizing the synchronization of the chip operation process and the detection process, reducing the impact of the detection process on the normal operation process of the chip, and solving the problem that the existing chip detection technology has a great impact on the chip operation process and the chip performance detection results have low accuracy.

[0006] In a first aspect, the present application provides a method for detecting a chip operation process, the method comprising the following steps:

[0007] Acquire a detection task, acquire a number of detection targets based on the detection task, and then obtain a number of original detection processes corresponding to the number of detection targets;

[0008] Based on the plurality of detection targets, obtaining a plurality of target operation processes corresponding to the plurality of original detection processes;

[0009] Based on the target running processes, adjusting the original detection processes to obtain the final detection processes;

[0010] Get the current running process;

[0011] Identifying a current target detection process from among the plurality of final detection processes based on the current running process;

[0012] The chip is detected based on the current target detection process to obtain the detection result of the chip operation process.

[0013] By implementing the method described in the first aspect, the original detection process is adjusted through the target operation process to obtain the final detection process that can identify the current operation process of the chip in real time and thus perform detection, thereby achieving the synchronization of the chip operation process and the detection process, solving the technical problem that the prior art has a great impact on the chip operation process, and further improving the accuracy of the chip performance detection results through real-time detection of the chip dynamic operation process.

[0014] In combination with the first aspect, in a possible implementation manner of the first aspect, the acquiring, based on the plurality of detection targets, a plurality of target operation processes corresponding to the plurality of original detection processes includes:

[0015] For any of the detection targets, obtaining the detection type and detection content corresponding to the detection target based on its corresponding original detection process;

[0016] Based on the detection target, obtaining the operation task corresponding to the historical operation process in the preset historical database;

[0017] Based on the detection type, obtaining the operation type of the corresponding historical operation process in the historical database;

[0018] Based on the detection content, obtaining the operation result of the corresponding historical operation process in the historical database;

[0019] The target operation process corresponding to the detection target is screened out in the historical database based on the operation task, the operation type and the operation result.

[0020] It should be noted that the preset historical database can be a database for storing and managing chip operation history data, which stores information on the chip's historical operation processes, such as the operation tasks performed by the chip in each operation process, the operation type of each historical operation process, and the operation result data of the chip's historical operation processes.

[0021] In this implementation, the target operation process corresponding to the detection target is obtained through the three indicators of the operation task corresponding to the detection target, the operation type corresponding to the detection type, and the operation result corresponding to the detection content, which can ensure that the selected target operation process is highly relevant to the detection target, thereby improving the detection accuracy. In addition, by screening through the historical database, the target operation process can be quickly located, reducing manual intervention and duplication of work, and improving the efficiency of the entire implementation method.

[0022] In combination with the first aspect, or any of the foregoing possible implementations of the first aspect, in another possible implementation of the first aspect, for any of the detection targets, obtaining a detection type and a detection content corresponding to the detection target based on its corresponding original detection process includes:

[0023] For any of the detection targets, obtaining the corresponding chip program;

[0024] Based on the original detection process corresponding to the detection target and the chip program, matching the program function of the chip program corresponding to the original detection process;

[0025] Acquire the functional content corresponding to the program function and use the functional content as the detection content corresponding to the detection target;

[0026] The detection type of the original detection process is queried through a preset detection database and is used as the detection type corresponding to the detection target.

[0027] It should be noted that the program function is a specific functional module in the chip program. For example, the program function of the operation program is to perform data operations, and the program function of the processing program is to perform data processing. In addition, the functional content corresponding to the program function is the specific operation content of the chip program. For example, the program function of the operation program is to perform data operations, and its functional content includes specific operation methods such as differential operations, geometric operations and basic operations.

[0028] In this implementation, by matching the original detection process with the program function of the chip program, the accuracy and consistency of the detection content are ensured and the reliability of the detection is improved.

[0029] In combination with the first aspect, or any of the foregoing possible implementations of the first aspect, in another possible implementation of the first aspect, acquiring the operation type of the corresponding historical operation process in the historical database based on the detection type includes:

[0030] Based on the detection type, the operation type with the strongest correlation with the detection type is screened out in the historical database through a preset knowledge graph.

[0031] It should be noted that the knowledge graph can be a graphical data structure, specifically, it can be an operation detection knowledge graph. Among them, the knowledge graph stores the association relationship between each operation type and each detection type, and the association relationship is represented by the association node between the operation type and the detection type. The association node refers to a node that simultaneously connects the operation type and the detection type in the knowledge graph, which is used to indicate the strength of the association between the two types. Generally speaking, the more association nodes there are, the stronger the strength of the association between the two types.

[0032] In this implementation, the complex information and relationship between the detection type and the operation type are represented by associating nodes, and then the operation type that best matches the detection type is filtered through the knowledge graph, which simplifies the complexity of the matching process and improves the efficiency and accuracy of the detection method.

[0033] In combination with the first aspect, or any of the foregoing possible implementations of the first aspect, in another possible implementation of the first aspect, obtaining, based on the detection content, an operation result of a corresponding historical operation process in the historical database includes:

[0034] Acquire detection features corresponding to the detection content;

[0035] By calculating the similarity between the detection feature and the result features of the result contents corresponding to a plurality of operation results in the historical database, the operation result corresponding to the result feature having the highest similarity to the detection feature is screened out.

[0036] It should be noted that the detection feature is a feature extracted from the detection content, used to represent the key attributes and information of the detection content, and can be a text feature of the text content corresponding to the detection content; the result feature is a feature extracted from the result content, used to represent the key attributes and information of the result content, and can be a text feature of the text content corresponding to the result content. The calculation of the similarity between the detection feature and the result feature of the result content corresponding to several operation results in the historical database can be to calculate the similarity between the text feature of the text content corresponding to the detection content and the text feature of the text content corresponding to the result content through a similarity algorithm.

[0037] In this implementation, by calculating the similarity between the detection feature and the result feature of the result content corresponding to several operation results in the historical database, the error of matching the detection content with the operation result is reduced and the accuracy of the detection method is improved.

[0038] In combination with the first aspect, or any of the foregoing possible implementations of the first aspect, in another possible implementation of the first aspect, acquiring a detection task, acquiring a plurality of detection targets based on the detection task, and then obtaining a plurality of original detection processes corresponding to the plurality of detection targets, includes:

[0039] Obtaining a detection task, splitting the detection task into a plurality of sub-detection tasks, and then obtaining a plurality of task objectives corresponding to the plurality of sub-detection tasks;

[0040] Based on any task target, the corresponding chip program is selected from the preset chip database as the detection target of the sub-detection task corresponding to the task target;

[0041] Based on the sub-detection tasks, a historical detection process with the least detection process nodes and the shortest detection time is screened out in a preset detection database as the original detection process corresponding to the detection target.

[0042] It should be noted that the detection process node may be a step or task that needs to be executed in the detection process. The fewer the detection process nodes are, the lower the complexity of the detection process is, the shorter the detection time is, and the higher the efficiency of the detection process is.

[0043] In this implementation, by screening out the historical detection process with the least detection process nodes and the shortest detection time in the preset detection database, the detection efficiency of the detection process is improved while reducing the complexity of the detection process. In addition, by splitting the detection task into multiple sub-detection tasks and matching the corresponding detection processes respectively, the accuracy of the detection method is improved.

[0044] In combination with the first aspect, or any of the foregoing possible implementations of the first aspect, in another possible implementation of the first aspect, the adjusting the plurality of original detection processes based on the plurality of target operation processes to obtain the plurality of final detection processes includes:

[0045] Obtaining a plurality of process nodes of the target running process and a plurality of process contents corresponding to the process nodes;

[0046] Splitting the original detection process into a running data extraction process and a running detection process;

[0047] Filtering out target process content from a plurality of process contents based on the operation data extraction process;

[0048] Based on the target process content, adding a running content extraction identifier in the corresponding process node for subsequent identification of the current target detection process;

[0049] The running detection process is combined with the target running process as the final detection process.

[0050] It should be noted that the data extraction process can extract the operation content from the operation process, and the operation detection process can detect and analyze the operation content.

[0051] In this implementation, the detection process is split into a data extraction process and an operation detection process, and by adding an operation content extraction identifier to the target operation process, the operation detection process is merged with the target operation process as the final detection process. The process of extracting the operation content in the detection process is simplified to the process of identifying and matching the operation content with the content extraction identifier, which simplifies the complexity of the detection process, thereby improving the detection efficiency of the detection process and reducing the impact of the detection process on the operation process.

[0052] In combination with the first aspect, or any of the foregoing possible implementations of the first aspect, in another possible implementation of the first aspect, the identifying a current target detection process from among the plurality of final detection processes based on the current running process includes:

[0053] Based on the current running process, a final detection process whose running content extraction identifier matches the current running process is identified among the multiple final detection processes as the current target detection process.

[0054] In this implementation, the final detection process that matches the current running process is identified by running content extraction identification, thereby achieving simultaneous execution of the chip running process and the chip detection process, solving the technical problem that the prior art has a great impact on the chip running process, and further improving the accuracy of the chip performance detection results through real-time detection of the chip dynamic running process.

[0055] In a second aspect, the present application provides a detection system for a chip operation process, the system comprising:

[0056] A first acquisition module is used to acquire a detection task, acquire a number of detection targets based on the detection task, and then obtain a number of original detection processes corresponding to the number of detection targets;

[0057] A second acquisition module is used to acquire a plurality of target operation processes corresponding to a plurality of the original detection processes based on a plurality of the detection targets;

[0058] An adjustment module, used to adjust several original detection processes based on several target operation processes to obtain several final detection processes;

[0059] The third acquisition module is used to obtain the current running process;

[0060] An identification module, used to identify a current target detection process among the plurality of final detection processes based on the current running process;

[0061] The detection module is used to detect the chip based on the current target detection process to obtain the detection result of the chip operation process.

[0062] In combination with the second aspect, in a possible implementation manner of the second aspect, the second acquisition module is preset with a historical database, and the second acquisition module is used to acquire, based on the plurality of detection targets, a plurality of target operation processes corresponding to the plurality of original detection processes, including:

[0063] For any of the detection targets, obtaining the detection type and detection content corresponding to the detection target based on its corresponding original detection process;

[0064] Based on the detection target, obtaining the running task corresponding to the historical running process in the historical database;

[0065] Based on the detection type, obtaining the operation type of the corresponding historical operation process in the historical database;

[0066] Based on the detection content, obtaining the operation result of the corresponding historical operation process in the historical database;

[0067] The target operation process corresponding to the detection target is screened out in the historical database based on the operation task, the operation type and the operation result.

[0068] A detection method and system for a chip operation process provided by the present application has at least the following advantages compared with the prior art:

[0069] First, a historical detection process with the least detection process nodes and the shortest detection time is selected in the historical database as the detection process, which reduces the complexity of the detection process and improves the detection efficiency of the detection process.

[0070] Second, use multiple indicators to match and detect the target operation process corresponding to the process, thereby improving the matching accuracy and improving the precision of the entire detection process.

[0071] Third, by adding an operation content extraction identifier to the target operation process, and then merging the operation detection process with the target operation process as the final detection process, the process of extracting the operation content in the detection process is simplified to the process of identifying and matching the operation content with the content extraction identifier, thereby simplifying the complexity of the detection process, thereby improving the detection efficiency of the detection process and reducing the impact of the detection process on the operation process.

[0072] Fourth, by running the content extraction identifier to identify the final detection process that matches the current running process, the chip running process and the chip detection process are carried out simultaneously, which solves the technical problem that the existing technology has a great impact on the chip running process, and further improves the accuracy of the chip performance detection results through real-time detection of the chip dynamic running process. BRIEF DESCRIPTION OF THE DRAWINGS

[0073] Figure 1 It is a flow chart of a detection method for a chip operation process provided in an embodiment of the present application;

[0074] Figure 2 It is a structural schematic diagram of a detection system for a chip operation process provided in an embodiment of the present application;

[0075] Figure 3 It is a structural schematic diagram of a computer device for implementing a detection method for a chip operation process provided in an embodiment of the present application. DETAILED DESCRIPTION

[0076] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments. It should be noted that the embodiments and features in the embodiments of the present invention can be combined with each other without conflict.

[0077] The following detailed descriptions are all exemplary descriptions, and are intended to provide further detailed descriptions of the present invention. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by technicians in the technical field of the present application; the terms used in the specification of the application herein are only for the purpose of describing specific embodiments, and are not intended to limit the present application; the terms "including" and "having" in the specification and claims of the present application and the above-mentioned drawings and any variations thereof are intended to cover non-exclusive inclusions. The terms "first", "second", etc. in the specification and claims of the present application or the above-mentioned drawings are used to distinguish different objects, not to describe a specific order.

[0078] It should be understood that, although the steps in the flowchart of the accompanying drawings are displayed in sequence as indicated by the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least a part of the steps in the flowchart of the accompanying drawings may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily executed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be executed in turn or alternately with other steps or at least a part of the sub-steps or stages of other steps.

[0079] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0080] Before describing the present application in detail with reference to the accompanying drawings and in combination with the embodiments, the terms and application scenarios involved in the present application are first described.

[0081] The detection method and system for the chip operation process described in the embodiment of the present application can be applied to a terminal and a server, and can also be applied to a system including a terminal and a server, and the method and system are implemented through data interaction between the terminal and the server. Among them, the terminal can be a hardware device or a software interface that allows a user to interact with a computer system, an embedded system or a chip system, such as: a computer device including a processor, a memory and a storage device; a portable computing device with a touch screen operation; a computer software for simulating the functions of a hardware terminal.

[0082] The chip described in the present application can be any semiconductor package structure with an integrated circuit, for example: a microprocessor, a memory chip, a graphics processing unit (GPU), a digital signal processor (DSP), a field programmable gate array (FPGA), an analog chip, a power management chip (PMIC), and a system-on-chip (SoC).

[0083] The "process" described in this application generally refers to a series of steps or operations used to complete a specific task or achieve a specific goal. The "operation process" involved in this application can be defined as a series of operations and steps that a chip goes through when performing its designed function. When the prior art performs performance testing on a chip, the current process of the chip will stop running because the testing process requires the chip's resources and time, resulting in the chip being unable to execute other operation processes at the same time.

[0084] Figure 1 is a flow chart of a detection method for a chip operation process provided in an embodiment of the present application, with reference to Figure 1 The present application embodiment provides a method for detecting a chip operation process, comprising the following steps:

[0085] S101, obtaining a detection task, obtaining a number of detection targets based on the detection task, and then obtaining a number of original detection processes corresponding to the detection targets.

[0086] It should be noted that the detection task in step S101 may refer to a series of testing and verification activities performed to ensure chip performance, accuracy and reliability, such as: operation rate detection, operation accuracy detection and operation anomaly detection. Among them, one detection task corresponds to multiple detection targets, and one detection target corresponds to a chip program to be detected. The chip program to be detected may refer to specific chip software or firmware that needs to be tested and verified, such as: a subroutine for each type of operation in the chip operation program, a subroutine for each processing program in the chip processing program, and a subroutine for each transmission object in the chip data transmission program.

[0087] S102: Based on the plurality of detection targets, obtain a plurality of target operation processes corresponding to the plurality of original detection processes.

[0088] It should be noted that the detection type in step S102 may refer to a test method classified according to different detection targets and detection methods in the detection process, such as sampling detection type, result detection type, process detection type, and input data detection type. One detection type corresponds to one process stage in the operation process.

[0089] S103: Based on the target running processes, adjust the original detection processes to obtain final detection processes.

[0090] S104: Get the current running process.

[0091] Optionally, the step S104 of obtaining the current running process also includes obtaining the running information of the chip to be run, and the running information of the chip to be run may refer to various data and status information required when executing a program on the chip, and one chip to be run information corresponds to one current running process. Based on the current running process of the chip and the current to-be-run information, the running log corresponding to the current running process of the chip can be obtained for chip detection.

[0092] S105: Identify a current target detection process from among the plurality of final detection processes based on the current running process.

[0093] S106: Detect the chip based on the current target detection process to obtain a detection result of the chip operation process.

[0094] Specifically, the chip is detected based on the current target detection process, including detecting the operation log corresponding to the current operation process based on the current target detection process. The operation log can be a log file that records various events and status information generated by the chip in the operation process.

[0095] Optionally, step S106 further includes obtaining new chip information to be run, replacing the current chip information to be run with the new chip information to be run, so that several of the detection processes and several of the operation processes continue.

[0096] In this embodiment, by screening out the historical detection process with the least detection process nodes and the shortest detection time in the preset detection database, the detection efficiency of the detection process is improved while reducing the complexity of the detection process. In addition, by splitting the detection task into multiple sub-detection tasks and matching the corresponding detection processes respectively, the accuracy of the detection method is improved.

[0097] Optionally, the step of acquiring the detection task in step S101, acquiring a plurality of detection targets based on the detection task, and then obtaining a plurality of original detection processes corresponding to the plurality of detection targets, includes:

[0098] Obtaining a detection task, splitting the detection task into a plurality of sub-detection tasks, and then obtaining a plurality of task objectives corresponding to the plurality of sub-detection tasks;

[0099] Based on any task target, the corresponding chip program is selected from the preset chip database as the detection target of the sub-detection task corresponding to the task target;

[0100] Based on the sub-detection tasks, a historical detection process with the least detection process nodes and the shortest detection time is screened out in a preset detection database as the original detection process corresponding to the detection target.

[0101] It should be noted that the detection database stores the correspondence between historical detection processes and chip programs.

[0102] Optionally, the step S102 of acquiring a plurality of target operation processes corresponding to a plurality of the original detection processes based on the plurality of the detection targets includes:

[0103] For any of the detection targets, obtaining the corresponding chip program;

[0104] Based on the original detection process corresponding to the detection target and the chip program, matching the program function of the chip program corresponding to the original detection process;

[0105] Acquire the functional content corresponding to the program function and use the functional content as the detection content corresponding to the detection target;

[0106] Querying the detection type of the original detection process through a preset detection database and using it as the detection type corresponding to the detection target;

[0107] Based on the detection target, obtaining the operation task corresponding to the historical operation process in the preset historical database;

[0108] Based on the detection type, the operation type with the strongest correlation with the detection type is screened out in the historical database through a preset knowledge graph.

[0109] Acquire detection features corresponding to the detection content;

[0110] By calculating the similarity between the detection feature and the result features of the result contents corresponding to a plurality of operation results in the historical database, the operation result corresponding to the result feature having the highest similarity to the detection feature is screened out.

[0111] The target operation process corresponding to the detection target is screened out in the historical database based on the operation task, the operation type and the operation result.

[0112] It should be noted that the chip program function may be a function implemented by a program running on the chip, for example, the program function of the operation program is a data operation function, and the program function of the processing program is a data processing function. The functional content corresponding to the chip program function may be a specific function and task implemented by the program running on the chip, for example, when the program function is a data operation function, the functional content may be a specific operation method such as differential operation, geometric operation or basic operation.

[0113] It should also be noted that the historical database also includes an operation database. The historical database stores operation log information of the historical operation process. The operation log information can be detailed data and status information recorded during the operation of the chip, which is used to track and analyze the historical operation process of the chip. By querying the operation log information in the historical database, the operation results and operation contents of the corresponding historical operation process can be obtained. The operation database stores the corresponding relationship between several operation types and several operation contents.

[0114] Specifically, the detection features corresponding to the detection content and the result features of the result content corresponding to the operation result are respectively obtained through the text feature recognition network. The detection features are features extracted from the detection content, used to represent the key attributes and information of the detection content, and can be text features of the text content corresponding to the detection content; the result features are features extracted from the result content, used to represent the key attributes and information of the result content, and can be text features of the text content corresponding to the result content. The calculation of the similarity between the detection features and the result features of the result content corresponding to several operation results in the historical database can be to calculate the similarity between the text features of the text content corresponding to the detection content and the text features of the text content corresponding to the result content through a similarity algorithm. Among them, the similarity algorithm used can be a cosine similarity algorithm, and the text feature recognition network can be a neural network based on a large language model.

[0115] Optionally, the step S103, based on the plurality of target running processes, adjusts the plurality of original detection processes to obtain a plurality of final detection processes, including:

[0116] Obtaining a plurality of process nodes of the target running process and a plurality of process contents corresponding to the process nodes;

[0117] Splitting the original detection process into a running data extraction process and a running detection process;

[0118] Filtering out target process content from a plurality of process contents based on the operation data extraction process;

[0119] Based on the target process content, adding a running content extraction identifier in the corresponding process node for subsequent identification of the current target detection process;

[0120] The running detection process is combined with the target running process as the final detection process.

[0121] Optionally, the step S105 of identifying a current target detection process from among the plurality of final detection processes based on the current running process includes:

[0122] Based on the current running process, a final detection process whose running content extraction identifier matches the current running process is identified among the multiple final detection processes as the current target detection process.

[0123] Based on the same inventive concept, the embodiment of the present application also provides a detection system for the chip operation process. The implementation method for solving the problem provided by the system is similar to the implementation method recorded in any of the above possible embodiments, so the embodiment of a detection system for the chip operation process provided below can be combined with the implementation method recorded in any of the above possible embodiments for further limitation, which will not be repeated here.

[0124] Figure 2 is a schematic diagram of a detection system for a chip operation process provided in an embodiment of the present application, with reference to Figure 2 The embodiment of the present application provides a detection system 200 for a chip operation process, including a first acquisition module 210, a second acquisition module 220, an adjustment module 230, a third acquisition module 240, an identification module 250 and a detection module 260, wherein:

[0125] A first acquisition module 210 is used to acquire a detection task, acquire a number of detection targets based on the detection task, and then obtain a number of original detection processes corresponding to the detection targets;

[0126] A second acquisition module 220 is used to acquire a plurality of target operation processes corresponding to a plurality of the original detection processes based on a plurality of the detection targets;

[0127] An adjustment module 230, configured to adjust a plurality of the original detection processes based on a plurality of the target operation processes to obtain a plurality of final detection processes;

[0128] The third acquisition module 240 is used to acquire the current running process;

[0129] An identification module 250, configured to identify a current target detection process from among the plurality of final detection processes based on the current running process;

[0130] The detection module 260 is used to detect the chip based on the current target detection process to obtain the detection result of the chip operation process.

[0131] Optionally, the second acquisition module 220 is preset with a historical database, and the second acquisition module is used to acquire a plurality of target operation processes corresponding to a plurality of the original detection processes based on a plurality of the detection targets, including:

[0132] For any of the detection targets, obtaining the detection type and detection content corresponding to the detection target based on its corresponding original detection process;

[0133] Based on the detection target, obtaining the running task corresponding to the historical running process in the historical database;

[0134] Based on the detection type, obtaining the operation type of the corresponding historical operation process in the historical database;

[0135] Based on the detection content, obtaining the operation result of the corresponding historical operation process in the historical database;

[0136] The target operation process corresponding to the detection target is screened out in the historical database based on the operation task, the operation type and the operation result.

[0137] Any possible embodiment of the above-mentioned detection system for chip operation process can be implemented in whole or in part by software, hardware and / or a combination of software and hardware. Any possible module can be embedded in or independent of the processor of the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute any possible implementation method.

[0138] Figure 3 It is a structural schematic diagram of a computer device for implementing a detection method for a chip operation process provided by an embodiment of the present application. The computer device may be a terminal, including a processor, a memory, a communication interface, a display unit, and an input device connected via a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. The computer program is executed by the processor to implement a chip detection method during the operation of a chip. The display screen of the computer device may be a liquid crystal display screen or an electronic ink display screen, and the input system of the computer device may be a touch layer covered on the display screen, or a key, a trackball or a touchpad provided on the housing of the computer device, or an external keyboard, touchpad or mouse, etc.

[0139] Those skilled in the art will understand that Figure 3 The structure shown in the figure is only a block diagram of a partial structure related to the embodiment of the present application, and does not constitute a limitation on the computer device to which the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0140] Those skilled in the art can understand that all or part of the processes in any of the above possible embodiments can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the process of any of the above possible embodiments. Among them, any reference to a memory, a database or other medium used in any possible embodiment provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory may include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0141] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope recorded in this specification.

[0142] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the present application. It should be noted that, for a person of ordinary skill in the art, several improvements and substitutions may be made without departing from the concept of the present application, and these improvements and substitutions shall also be regarded as the protection scope of the present invention. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A detection method for a chip operation process, characterized in that: include: Acquire a detection task, acquire a number of detection targets based on the detection task, and then obtain a number of original detection processes corresponding to the number of detection targets; Based on the plurality of detection targets, obtaining a plurality of target operation processes corresponding to the plurality of original detection processes; Based on the target running processes, adjusting the original detection processes to obtain the final detection processes; Get the current running process; Identifying a current target detection process from among the plurality of final detection processes based on the current running process; The chip is detected based on the current target detection process to obtain the detection result of the chip operation process.

2. A detection method for a chip operation process according to claim 1, characterized in that: The step of obtaining, based on the plurality of detection targets, a plurality of target operation processes corresponding to the plurality of original detection processes comprises: For any of the detection targets, obtaining the detection type and detection content corresponding to the detection target based on its corresponding original detection process; Based on the detection target, obtaining the operation task corresponding to the historical operation process in the preset historical database; Based on the detection type, obtaining the operation type of the corresponding historical operation process in the historical database; Based on the detection content, obtaining the operation result of the corresponding historical operation process in the historical database; The target operation process corresponding to the detection target is screened out in the historical database based on the operation task, the operation type and the operation result.

3. A detection method for a chip operation process according to claim 2, characterized in that: For any of the detection targets, obtaining the detection type and detection content corresponding to the detection target based on its corresponding original detection process includes: For any of the detection targets, obtaining the corresponding chip program; Based on the original detection process corresponding to the detection target and the chip program, matching the program function of the chip program corresponding to the original detection process; Acquire the functional content corresponding to the program function and use the functional content as the detection content corresponding to the detection target; The detection type of the original detection process is queried through a preset detection database and is used as the detection type corresponding to the detection target.

4. A detection method for a chip operation process according to claim 2, characterized in that: The acquiring, based on the detection type, the operation type of the corresponding historical operation process in the historical database includes: Based on the detection type, the operation type with the strongest correlation with the detection type is screened out in the historical database through a preset knowledge graph.

5. A detection method for a chip operation process according to claim 2, characterized in that: The obtaining, based on the detection content, the operation result of the corresponding historical operation process in the historical database includes: Acquire detection features corresponding to the detection content; By calculating the similarity between the detection feature and the result features of the result contents corresponding to a plurality of operation results in the historical database, the operation result corresponding to the result feature having the highest similarity to the detection feature is screened out.

6. A detection method for a chip operation process according to claim 1, characterized in that: The acquiring of the detection task, acquiring a plurality of detection targets based on the detection task, and then obtaining a plurality of original detection processes corresponding to the plurality of detection targets, includes: Obtaining a detection task, splitting the detection task into a plurality of sub-detection tasks, and then obtaining a plurality of task objectives corresponding to the plurality of sub-detection tasks; Based on any task target, the corresponding chip program is selected from the preset chip database as the detection target of the sub-detection task corresponding to the task target; Based on the sub-detection tasks, a historical detection process with the least detection process nodes and the shortest detection time is screened out in a preset detection database as the original detection process corresponding to the detection target.

7. A detection method for a chip operation process according to claim 1, characterized in that: The step of adjusting a plurality of original detection processes based on the plurality of target operation processes to obtain a plurality of final detection processes includes: Obtaining a plurality of process nodes of the target running process and a plurality of process contents corresponding to the process nodes; Splitting the original detection process into a running data extraction process and a running detection process; Filtering out target process content from a plurality of process contents based on the operation data extraction process; Based on the target process content, adding a running content extraction identifier in the corresponding process node for subsequent identification of the current target detection process; The running detection process is combined with the target running process as the final detection process.

8. A detection method for a chip operation process according to claim 7, characterized in that: The step of identifying a current target detection process from among the plurality of final detection processes based on the current running process includes: Based on the current running process, a final detection process whose running content extraction identifier matches the current running process is identified among the multiple final detection processes as the current target detection process.

9. A detection system for a chip operation process, characterized in that: include: A first acquisition module is used to acquire a detection task, acquire a number of detection targets based on the detection task, and then obtain a number of original detection processes corresponding to the number of detection targets; A second acquisition module is used to acquire a plurality of target operation processes corresponding to a plurality of the original detection processes based on a plurality of the detection targets; An adjustment module, used to adjust several original detection processes based on several target operation processes to obtain several final detection processes; The third acquisition module is used to obtain the current running process; An identification module, used to identify a current target detection process among the plurality of final detection processes based on the current running process; The detection module is used to detect the chip based on the current target detection process to obtain the detection result of the chip operation process.

10. A detection system for chip operation process according to claim 9, characterized in that: The second acquisition module is preset with a historical database, and the second acquisition module is used to acquire a plurality of target operation processes corresponding to a plurality of the original detection processes based on a plurality of the detection targets, including: For any of the detection targets, obtaining the detection type and detection content corresponding to the detection target based on its corresponding original detection process; Based on the detection target, obtaining the running task corresponding to the historical running process in the historical database; Based on the detection type, obtaining the operation type of the corresponding historical operation process in the historical database; Based on the detection content, obtaining the operation result of the corresponding historical operation process in the historical database; The target operation process corresponding to the detection target is screened out in the historical database based on the operation task, the operation type and the operation result.

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