Method and device for determining operational range of working parameters of crystal oscillator, electronic equipment and storage medium

Abstract

The invention discloses a crystal oscillator working parameter operational range determination method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a rated range of a to-be-tested working parameter and a rated frequency range of a crystal oscillator, and transmitting a first adjustment signal, setting other working parameters except the to-be-tested working parameters as preset rated values; according to a preset fixed interval, sampling is carried out in a rated range of the to-be-tested working parameters, and a plurality of target working parameter values are generated; a second adjusting signal is sent to the crystal oscillator, so that the crystal oscillator is tested according to the target working parameter values, and testing frequencies of the target working parameter values are generated; adding a target working parameter value meeting a rated frequency range in the test frequency into the effective working parameter set; and generating an operable range of the to-be-tested working parameters of the crystal oscillator according to the effective working parameter set. According to the invention, the operable working range of the working parameters of the crystal oscillator can be determined.

Description

Technical Field

[0001] The present invention relates to the technical field of crystal oscillators, and in particular to a method, device, electronic device and storage medium for determining an operational range of operating parameters of a crystal oscillator. Background Art

[0002] In the power system, the grid frequency is a key parameter for the stable operation of the system. Crystal oscillators are widely used in many measurement devices and control systems to provide high-precision frequency reference signals. In applications such as power monitoring equipment, frequency meters, and synchronous regulators, crystal oscillators provide the necessary reference signals for monitoring and regulating the grid frequency. The output frequency of the crystal oscillator must be very precise to ensure accurate monitoring of the grid frequency.

[0003] The prior art usually focuses on the initial rated operating parameters of crystal oscillators, such as load capacitance and operating voltage, when using crystal oscillators. These parameters have been accurately tested and calibrated during manufacturing, and are usually clearly marked in the specification of the crystal oscillator. However, most prior art does not fully consider the aging phenomenon of crystal oscillators during long-term use when using crystal oscillators. The aging of crystal oscillators refers to the gradual decline in its frequency stability and operating performance over time, which is usually manifested as drift of oscillation frequency, increase in power consumption, etc. This aging phenomenon may cause the operating parameter range of the crystal oscillator to change, and the originally calibrated operating range is no longer applicable. In traditional applications, equipment is often operated for a long time based on the factory parameter settings and preset operating conditions, without adjusting the aging phenomenon of the crystal oscillator, resulting in the actual working state of the equipment may not be consistent with the initial rated operating range, resulting in deviations in the frequency of the crystal oscillator, and the power equipment cannot maintain a stable clock signal or frequency reference, thereby affecting the stability and reliability of the power system. Summary of the invention

[0004] The embodiments of the present invention provide a method, device, electronic device and storage medium for determining the operable range of operating parameters of a crystal oscillator. By implementing the present invention, the aging effect of the crystal oscillator can be effectively considered to determine the operable range of the operating parameters of the crystal oscillator.

[0005] An embodiment of the present invention provides a method for determining an operational range of operating parameters of a crystal oscillator, comprising:

[0006] Obtain the rated range of the operating parameter to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator;

[0007] Sending a first adjustment signal to the crystal oscillator, so that after receiving the first adjustment signal, the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values;

[0008] According to a preset fixed interval, sampling is performed from the rated range of the working parameter to be tested to obtain a number of working parameter values, and a number of target working parameter values ​​are generated;

[0009] Sending a second adjustment signal to the crystal oscillator so that the crystal oscillator performs a test according to each target operating parameter value and generates a test frequency for each target operating parameter value;

[0010] Add the target operating parameter value that meets the rated frequency range in the test frequency to the effective operating parameter set;

[0011] According to the valid working parameter set, an operable range of the working parameters of the crystal oscillator to be tested is generated.

[0012] Further, according to a preset fixed interval, sampling is performed from the rated range of the working parameter to be tested to obtain a number of working parameter values, and a number of target working parameter values ​​are generated, including:

[0013] The starting value of sampling is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set;

[0014] Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

[0015] Furthermore, the preset fixed interval is determined by:

[0016] Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator;

[0017] Express the allowable deviation value in scientific notation, and determine the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value;

[0018] The mantissa of the allowable deviation value is used as the mantissa of the fixed interval;

[0019] The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval;

[0020] The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

[0021] Further, sending a second adjustment signal to the crystal oscillator so that the crystal oscillator performs a test according to each target operating parameter value and generates a test frequency of each target operating parameter value, including:

[0022] Repeat the following test operations until all target operating parameter values ​​have been tested, generating the test frequency for each target operating parameter value:

[0023] Sending a second adjustment signal to the crystal oscillator, so that after receiving the second adjustment signal, the crystal oscillator adjusts the working parameter to be tested to the current target working parameter value and generates a test frequency of the current target working parameter value;

[0024] A target operating parameter value that has not been tested is reselected to update the current target operating parameter value.

[0025] Further, generating an operable range of the operating parameters of the crystal oscillator to be tested according to the valid operating parameter set includes:

[0026] The minimum value and the maximum value are extracted from the valid working parameter set, the minimum value is used as the lower limit of the operating range of the working parameter to be tested, and the maximum value is used as the upper limit of the operating range of the working parameter to be tested, so as to generate the operating range of the working parameter to be tested of the crystal oscillator.

[0027] Based on the above method embodiment, the present invention provides a corresponding device embodiment.

[0028] An embodiment of the present invention provides a device for determining an operable range of operating parameters of a crystal oscillator, comprising: a data acquisition module, a parameter setting module, a sampling module, a testing module and an operable range determination module.

[0029] The data acquisition module is used to obtain the rated range of the working parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator;

[0030] The parameter setting module is used to send a first adjustment signal to the crystal oscillator, so that the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values ​​after receiving the first adjustment signal;

[0031] The sampling module is used to sample from the rated range of the working parameter to be tested according to a preset fixed interval, obtain a number of working parameter values, and generate a number of target working parameter values;

[0032] The test module is used to send a second adjustment signal to the crystal oscillator so that the crystal oscillator is tested according to each target operating parameter value and generates a test frequency for each target operating parameter value;

[0033] The operable range determination module is used to add the target operating parameter value that meets the rated frequency range in the test frequency to the effective operating parameter set; and generate the operable range of the operating parameter to be tested of the crystal oscillator according to the effective operating parameter set.

[0034] Furthermore, the sampling module samples from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a number of working parameter values ​​and generate a number of target working parameter values, including:

[0035] The starting value of sampling is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set;

[0036] Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

[0037] Furthermore, the preset fixed interval is determined by:

[0038] Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator;

[0039] Express the allowable deviation value in scientific notation, and determine the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value;

[0040] The mantissa of the allowable deviation value is used as the mantissa of the fixed interval;

[0041] The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval;

[0042] The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

[0043] Based on the above method embodiment, the present invention provides a corresponding electronic device embodiment.

[0044] An embodiment of the present invention provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the method for determining the operating range of the crystal oscillator operating parameters described in any one of the above method embodiments can be implemented.

[0045] Based on the above method item embodiments, the present invention provides a corresponding storage medium item embodiment.

[0046] An embodiment of the present invention provides a storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method for determining the operating range of the crystal oscillator operating parameters described in any one of the above method embodiments can be implemented.

[0047] Compared with the prior art, the present invention has the following beneficial effects:

[0048] The embodiment of the present invention provides a method, device, electronic device and storage medium for determining the operable range of the operating parameters of a crystal oscillator. The method obtains the rated range of the operating parameters to be tested and the rated frequency range of the crystal oscillator, sets the other operating parameters except the operating parameters to be tested to preset rated values, ensures that only the operating parameters to be tested are tested each time, and excludes the influence of other operating parameters on the test results. Samples are taken at fixed intervals from the rated range of the operating parameters to be tested to generate several target parameter values. Send an adjustment signal to test each target parameter value one by one, record the test frequency, add the target operating parameter value whose test frequency meets the rated frequency range to the valid operating parameter set, and then determine the operable range of the operating parameters to be tested. By sampling and testing the operating parameters to be tested, and adjusting the operable range of the operating parameters in combination with the frequency test results, the limitations of relying on the initial setting value of the crystal oscillator are avoided, the changes caused by the aging effect are better dealt with, and the reliability and stability of the crystal oscillator in long-term use are ensured, thereby ensuring the normal operation of the power system. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] Figure 1 It is a flow chart of a method for determining an operable range of operating parameters of a crystal oscillator provided by an embodiment of the present invention.

[0050] Figure 2 It is a structural schematic diagram of a device for determining an operable range of operating parameters of a crystal oscillator provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0051] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0052] like Figure 1 As shown, an embodiment of the present invention provides a method for determining an operating range of a crystal oscillator operating parameter, comprising at least the following steps:

[0053] Step S1, obtaining the rated range of the working parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator;

[0054] Optionally, obtain the rated range of the operating parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator by consulting the oscillator's technical specifications or factory test report; in these documents, the manufacturer will list the rated values ​​of each operating parameter and the allowable tolerances. For example, the rated value of the load capacitance is 20pF, and the allowable deviation range is ±2pF. Therefore, the rated range of the load capacitance is 18pF to 22pF. The rated frequency range of the crystal oscillator is usually given in the technical specifications, such as 10MHz to 100MHz. This frequency range defines the stable frequency range that the crystal oscillator can output under normal working conditions.

[0055] Step S2, sending a first adjustment signal to the crystal oscillator, so that after receiving the first adjustment signal, the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values;

[0056] Exemplarily, when the operating parameter to be tested is the load capacitance, it is necessary to set other operating parameters except the load capacitance to preset rated values;

[0057] When the working parameter to be tested is the working voltage, other working parameters except the working voltage need to be set to preset rated values;

[0058] It can be understood that by sending the first adjustment signal to the crystal oscillator, the crystal oscillator can accurately adjust its own operating state after receiving the first adjustment signal, and set all other operating parameters except the operating parameters to be tested to their respective rated values, thereby ensuring that when testing the operating parameters to be tested, other operating parameters of the crystal oscillator remain stable, avoiding mutual interference that may be caused by simultaneous changes in multiple operating parameters, thereby providing a reliable experimental environment for accurate testing of the operating parameters to be tested.

[0059] Step S3: sampling from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a number of working parameter values ​​and generate a number of target working parameter values;

[0060] Specifically, in a preferred embodiment, sampling is performed from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a plurality of working parameter values, and a plurality of target working parameter values ​​are generated, including:

[0061] The starting value of sampling is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set;

[0062] Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

[0063] It can be understood that through this sampling method, it can be ensured that the generated target operating parameter values ​​accurately cover the entire rated range of the operating parameters to be tested, avoiding the omission of any key values ​​that may affect the performance of the crystal oscillator, and can effectively provide sufficient and representative operating parameters for subsequent tests.

[0064] In an optional embodiment, the preset fixed interval is determined by:

[0065] Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator;

[0066] Express the allowable deviation value in scientific notation, and determine the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value;

[0067] The mantissa of the allowable deviation value is used as the mantissa of the fixed interval;

[0068] The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval;

[0069] The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

[0070] For example, when the working parameter to be measured is the load capacitance, the allowable deviation value of the load capacitance of the crystal oscillator is 2pF, then the mantissa of the allowable deviation value is determined to be 2, and the order of magnitude is 0. If the order of magnitude of the allowable deviation value is reduced by 1 bit, the order of magnitude of the fixed interval is -1, and the mantissa of the fixed interval is 2, so it can be determined that the fixed interval is 0.2pF;

[0071] When the working parameter to be measured is the working voltage, the allowable deviation value of the working voltage of the crystal oscillator is 0.04V, then the mantissa of the allowable deviation value is determined to be 4, and the order of magnitude is -2. If the order of magnitude of the allowable deviation value is reduced by 2 digits, the order of magnitude of the fixed interval is -4, and the mantissa of the fixed interval is 4, so it can be determined that the fixed interval is 0.0004V.

[0072] It is understandable that when setting the allowable deviation range of the crystal oscillator at the factory, the manufacturer takes into account the sensitivity of the operating parameters to ensure that the product can work properly in various usage environments. The sensitivity of the operating parameters refers to the degree of change in the performance of the crystal oscillator when the operating parameters change, such as the output frequency. Different operating parameters have different degrees of influence on the crystal oscillator. Some parameters have a greater impact on the oscillator frequency, such as load capacitance, while other parameters have a smaller impact on the frequency, such as operating voltage. In order to ensure that the crystal oscillator has good stability and reliability in actual use, the manufacturer will set a reasonable allowable deviation range based on the sensitivity of each operating parameter. If the sensitivity of a certain operating parameter is high, that is, a small change in the parameter will cause a large fluctuation in the performance of the oscillator, the manufacturer will usually set the allowable deviation range of the parameter to be smaller, so as to ensure the frequency stability of the oscillator. Therefore, for the setting of fixed intervals, for the situation where some parameter changes have a greater impact on the frequency of the crystal oscillator, a smaller sampling interval can be set to capture the fine trend of frequency changes; for parameters with less impact, a larger sampling interval can be selected to reduce the test workload.

[0073] Step S4, sending a second adjustment signal to the crystal oscillator, so that the crystal oscillator performs a test according to each target operating parameter value and generates a test frequency for each target operating parameter value;

[0074] Specifically, in a preferred embodiment, sending the second adjustment signal to the crystal oscillator so that the crystal oscillator performs a test according to each target operating parameter value and generates a test frequency of each target operating parameter value includes:

[0075] Repeat the following test operations until all target operating parameter values ​​have been tested, generating the test frequency for each target operating parameter value:

[0076] Sending a second adjustment signal to the crystal oscillator, so that after receiving the second adjustment signal, the crystal oscillator adjusts the working parameter to be tested to the current target working parameter value and generates a test frequency of the current target working parameter value;

[0077] A target operating parameter value that has not been tested is reselected to update the current target operating parameter value.

[0078] It can be understood that by sending a second adjustment signal to the crystal oscillator, it can adjust the current target operating parameter value one by one according to the pre-generated target operating parameter value, and perform a frequency test for each target value, record and generate corresponding test frequency data, so that the crystal oscillator can adjust and stabilize the target parameter point by point, ensuring that the actual operating conditions are consistent with the target operating parameter value, thereby obtaining accurate frequency test results.

[0079] Step S5, adding the target operating parameter value that meets the rated frequency range in the test frequency to the effective operating parameter set;

[0080] During the test, the test frequency of the current operating parameters is compared with the rated frequency range of the crystal oscillator. Only those target operating parameter values ​​that meet the rated frequency range will be considered as valid operating parameter values ​​and added to the valid operating parameter set. This step ensures that the operating state of the crystal oscillator matches its rated frequency range, thereby ensuring the validity and accuracy of the test results.

[0081] Step S6: Generate an operational range of the working parameters to be tested of the crystal oscillator according to the valid working parameter set.

[0082] Specifically, in a preferred embodiment, generating the operable range of the working parameters to be tested of the crystal oscillator according to the valid working parameter set includes:

[0083] The minimum value and the maximum value are extracted from the valid working parameter set, the minimum value is used as the lower limit of the operating range of the working parameter to be tested, and the maximum value is used as the upper limit of the operating range of the working parameter to be tested, so as to generate the operating range of the working parameter to be tested of the crystal oscillator.

[0084] In the specific implementation, by extracting the minimum and maximum values ​​from the valid working parameter set, it can ensure that the working state of the crystal oscillator will neither deviate too much from the rated value nor cause frequency instability or performance degradation due to excessively large changes, thereby determining a reasonable operating range for the working parameters to be tested.

[0085] Based on the above method embodiment, the present invention provides a corresponding device embodiment.

[0086] like Figure 2 As shown, an embodiment of the present invention provides a device for determining an operable range of operating parameters of a crystal oscillator, comprising: a data acquisition module 101, a parameter setting module 102, a sampling module 103, a testing module 104 and an operable range determination module 105;

[0087] The data acquisition module 101 is used to acquire the rated range of the working parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator;

[0088] The parameter setting module 102 is used to send a first adjustment signal to the crystal oscillator, so that the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values ​​after receiving the first adjustment signal;

[0089] The sampling module 103 is used to sample from the rated range of the working parameter to be tested according to a preset fixed interval, obtain a number of working parameter values, and generate a number of target working parameter values;

[0090] The test module 104 is used to send a second adjustment signal to the crystal oscillator so that the crystal oscillator is tested according to each target operating parameter value and generates a test frequency for each target operating parameter value;

[0091] The operable range determination module 105 is used to add the target operating parameter value in the test frequency that meets the rated frequency range to the effective operating parameter set; and generate the operable range of the operating parameter to be tested of the crystal oscillator according to the effective operating parameter set.

[0092] Specifically, in a preferred embodiment, the sampling module samples from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a number of working parameter values ​​and generate a number of target working parameter values, including:

[0093] The starting value of sampling is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set;

[0094] Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

[0095] In an optional embodiment, the preset fixed interval is determined by:

[0096] Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator;

[0097] Express the allowable deviation value in scientific notation, and determine the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value;

[0098] The mantissa of the allowable deviation value is used as the mantissa of the fixed interval;

[0099] The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval;

[0100] The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

[0101] It should be noted that the embodiments of the device described above correspond to the above embodiments of the present invention, and can implement any of the methods described above in the present invention. In addition, the embodiments of the above-mentioned device are merely schematic, wherein the modules described as separate components may or may not be physically separated, and the components displayed as modules may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. In addition, in the drawings of the device embodiments provided by the present invention, the connection relationship between the modules indicates that there is a communication connection between them, which can be specifically implemented as one or more communication buses or signal lines. A person of ordinary skill in the art can understand and implement it without paying any creative work.

[0102] Based on the above method embodiment of the present invention, a corresponding electronic device embodiment is provided.

[0103] An embodiment of the present invention provides an electronic device, comprising a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, the method for determining the operating range of the operating parameters of a crystal oscillator described in any one of the present invention is implemented, or, when the processor executes the computer program, the functions of the modules in the above-mentioned device embodiments are implemented.

[0104] Exemplarily, the computer program may be divided into one or more modules, which are stored in the memory and executed by the processor to implement the present invention. The one or more modules may be a series of computer program instruction segments capable of implementing specific functions, which are used to describe the execution process of the computer program in the terminal device.

[0105] The terminal device may be a computing device such as a desktop computer, a notebook, a PDA, a cloud server, etc. The terminal device may include, but is not limited to, a processor and a memory.

[0106] The processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc. The processor is the control center of the terminal device, and uses various interfaces and lines to connect various parts of the entire terminal device.

[0107] The memory can be used to store the computer program and / or module, and the processor realizes various functions of the terminal device by running or executing the computer program and / or module stored in the memory, and calling the data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required for a function, etc.; the data storage area can store data created according to the use of the mobile phone, etc. In addition, the memory can include a high-speed random access memory, and can also include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (SecureDigital, SD) card, a flash card (Flash Card), at least one disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0108] Based on the above method embodiment, the present invention provides a storage medium embodiment;

[0109] Another embodiment of the present invention provides a storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the storage medium is located is controlled to execute the method for determining the operating range of any crystal oscillator operating parameter described above in the present invention.

[0110] The storage medium is a computer-readable storage medium, and the computer program includes computer program code, which may be in source code form, object code form, executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc. It should be noted that the content contained in the computer-readable medium may be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0111] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example" or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine different embodiments or examples described in this specification and the features of different embodiments or examples, unless they are contradictory.

[0112] The above is a preferred embodiment of the present invention. It should be pointed out that a person skilled in the art can make several improvements and modifications without departing from the principle of the present invention. These improvements and modifications are also considered to be within the scope of protection of the present invention.

Claims

1. A method for determining the operating range of a crystal oscillator operating parameter, characterized in that: include: Obtain the rated range of the operating parameter to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator; Sending a first adjustment signal to the crystal oscillator, so that after receiving the first adjustment signal, the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values; According to a preset fixed interval, sampling is performed from the rated range of the working parameter to be tested to obtain a number of working parameter values, and a number of target working parameter values ​​are generated; Sending a second adjustment signal to the crystal oscillator so that the crystal oscillator performs a test according to each target operating parameter value and generates a test frequency for each target operating parameter value; Add the target operating parameter value that meets the rated frequency range in the test frequency to the effective operating parameter set; According to the valid working parameter set, an operable range of the working parameters of the crystal oscillator to be tested is generated.

2. A method for determining the operable range of operating parameters of a crystal oscillator as claimed in claim 1, characterized in that: According to the preset fixed interval, sampling is performed from the rated range of the working parameter to be tested to obtain a number of working parameter values, and a number of target working parameter values ​​are generated, including: The starting value of sampling is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set; Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

3. A method for determining the operable range of operating parameters of a crystal oscillator as claimed in claim 2, characterized in that: The preset fixed interval is determined by: Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator; Express the allowable deviation value in scientific notation, and determine the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value; The mantissa of the allowable deviation value is used as the mantissa of the fixed interval; The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval; The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

4. A method for determining the operable range of operating parameters of a crystal oscillator as claimed in claim 1, characterized in that: Sending a second adjustment signal to the crystal oscillator so that the crystal oscillator performs a test according to each target operating parameter value and generates a test frequency for each target operating parameter value, including: Repeat the following test operations until all target operating parameter values ​​have been tested, generating the test frequency for each target operating parameter value: Sending a second adjustment signal to the crystal oscillator, so that after receiving the second adjustment signal, the crystal oscillator adjusts the working parameter to be tested to the current target working parameter value and generates a test frequency of the current target working parameter value; A target operating parameter value that has not been tested is reselected to update the current target operating parameter value.

5. A method for determining the operable range of operating parameters of a crystal oscillator as claimed in claim 1, characterized in that: The step of generating an operable range of the operating parameters of the crystal oscillator to be tested according to the valid operating parameter set includes: The minimum value and the maximum value are extracted from the valid working parameter set, the minimum value is used as the lower limit of the operating range of the working parameter to be tested, and the maximum value is used as the upper limit of the operating range of the working parameter to be tested, so as to generate the operating range of the working parameter to be tested of the crystal oscillator.

6. A device for determining the operating range of a crystal oscillator operating parameter, characterized in that: include: Data acquisition module, parameter setting module, sampling module, testing module and operable range determination module; The data acquisition module is used to obtain the rated range of the working parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator; The parameter setting module is used to send a first adjustment signal to the crystal oscillator, so that the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values ​​after receiving the first adjustment signal; The sampling module is used to sample from the rated range of the working parameter to be tested according to a preset fixed interval, obtain a number of working parameter values, and generate a number of target working parameter values; The test module is used to send a second adjustment signal to the crystal oscillator so that the crystal oscillator is tested according to each target operating parameter value and generates a test frequency for each target operating parameter value; The operable range determination module is used to add the target operating parameter value that meets the rated frequency range in the test frequency to the effective operating parameter set; and generate the operable range of the operating parameter to be tested of the crystal oscillator according to the effective operating parameter set.

7. A device for determining the operable range of operating parameters of a crystal oscillator as claimed in claim 6, characterized in that: The sampling module samples from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a number of working parameter values ​​and generate a number of target working parameter values, including: The starting value of sampling is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set; Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

8. A device for determining the operable range of operating parameters of a crystal oscillator as claimed in claim 7, characterized in that: The preset fixed intervals are determined by: Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator; Express the allowable deviation value in scientific notation, and determine the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value; The mantissa of the allowable deviation value is used as the mantissa of the fixed interval; The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval; The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, it can implement the method for determining the operational range of the crystal oscillator operating parameters as described in any one of claims 1 to 5.

10. A storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, it can implement the method for determining the operable range of the operating parameters of the crystal oscillator as described in any one of claims 1 to 5.

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