Reliability test method and device for anti-vulcanization evaluation of optoelectronic device and module

Abstract

The embodiment of the invention provides a reliability test method and device for anti-vulcanization evaluation of an optoelectronic device and a module, and relates to the technical field of optical communication. The method comprises the steps that a test container is kept at a preset test temperature, a vulcanization test is started, sublimed sulfur powder with a preset initial dosage and an optical device and a vulcanization indicator located above the sublimed sulfur powder are placed in the test container, and the initial dosage is in one-to-one correspondence with the capacity of the test container; after the vulcanization test is started, the dosage of sublimed sulfur powder meeting the test requirement is determined according to the state of a vulcanization indicator; when the dosage of the sublimed sulfur powder meets the test requirement and the duration of starting the vulcanization test reaches the preset duration, the vulcanization test is stopped, the optical device is tested, test data is obtained, and the test data is used for indicating whether the optical device fails or not. According to the method, the reliability of vulcanization acceleration test results can be improved, the test cost is lower, and the cost of the device applying the method is lower.

Description

Technical Field

[0001] The embodiments of the present application relate to, but are not limited to, the field of optical communication technology, and in particular to a reliability test method and device for evaluating the anti-sulfurization of optoelectronic devices and modules. Background Art

[0002] In the field of optical communication technology, due to the influence of factors such as temperature, humidity, and gas environment, non-airtight optoelectronic devices and modules face the problem of low service life due to device failure. A large amount of practice has proved that sulfides in the atmospheric environment are an important factor that causes device failure and cannot be ignored. Therefore, the anti-sulfurization design of optoelectronic devices and modules and the accelerated sulfurization test are an indispensable part of ensuring the reliability of optical devices. In the related art, the flowing gas corrosion method is usually used for the accelerated sulfurization test, but the gas is limited by the external test environment and safety requirements, resulting in poor reliability of the results of the accelerated sulfurization test and high test costs. Therefore, a reliability test method is urgently needed to solve the above problems. Summary of the invention

[0003] The embodiments of the present application provide a reliability test method and device for evaluating the anti-sulfurization of optoelectronic devices and modules, which can solve the technical problems of poor reliability of test results of sulfurization tests and high test costs.

[0004] On the one hand, an embodiment of the present application provides a reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules, the method comprising: performing a test preparation step; the test preparation step comprising: testing the performance of an optical device before starting a sulfurization test to obtain initial test data under normal working conditions, the optical device comprising at least one of an optoelectronic device and an optical module; placing a preset initial dose of sublimated sulfur powder at the bottom of a test container, the initial dose corresponding to the capacity of the test container; placing the optical device and a sulfurization indicator in the test container and above the sublimated sulfur powder; placing the test container in a preset position; At a test temperature, the vulcanization test is started; an indicator verification step is performed, the indicator verification step includes: regularly detecting the state of the vulcanization indicator at a preset first time interval, and verifying whether the sublimated sulfur powder meets the test requirements according to the state of the vulcanization indicator; a test step is performed, the test step includes: regularly stopping the vulcanization test at a preset second time interval, taking out the optical device for testing, until the cumulative time of the vulcanization test reaches a preset third time; the test data obtained after each vulcanization test is compared with the initial test data, and determining whether the optical device fails according to the comparison result.

[0005] On the other hand, an embodiment of the present application also provides a reliability test device for anti-sulfurization evaluation of optoelectronic devices and modules, including a heating thermostat and a test container, wherein the heating thermostat is used to provide a preset test temperature; the test container is placed in the heating thermostat, and a preset initial dose of sublimated sulfur powder, an optical device to be tested, and a vulcanization indicator are arranged at the bottom of the test container, and the optical device and the vulcanization indicator are arranged above the sublimated sulfur powder; the initial dose corresponds to the capacity of the test container one by one, and the vulcanization indicator is used to periodically detect the state of the vulcanization indicator at intervals of a preset first time period after starting the vulcanization test, and verify whether the sublimated sulfur powder meets the test requirements according to the state of the vulcanization indicator.

[0006] In the embodiment of the present application, the sulfur fumigation of the optical device is achieved by maintaining the sublimated sulfur powder at the test temperature for volatilization, so as to complete the accelerated sulfurization test of the optical device. Compared with gas, the acceleration effect of the method provided in the embodiment of the present application is far superior to the flowing gas corrosion test. And because the sublimated sulfur powder is solid, the requirements for the equipment for transportation, storage and verification are lower, and the test cost of the test using the device and method of the embodiment of the present application is lower. Therefore, compared with the related art, the embodiment of the present application can improve the reliability of the results of the accelerated sulfurization test of the optical device and reduce the test cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Figure 1 A schematic structural diagram of an embodiment of a reliability test device for evaluating the anti-sulfurization of optoelectronic devices and modules provided in the present application;

[0008] Figure 2 A schematic flow chart of an embodiment of a reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules provided in the present application;

[0009] Figure 3 A schematic flow chart of another embodiment of a reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules provided in the present application;

[0010] Figure 4 A schematic diagram of an application of the reliability test method for anti-sulfurization evaluation of optoelectronic devices and modules provided in the present application. DETAILED DESCRIPTION

[0011] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0012] It should be noted that, although the functional modules are divided in the device schematic diagram and the logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the module division in the device or the order in the flowchart. The terms "first", "second", etc. in the specification, claims and the above drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0013] The flowcharts shown in the accompanying drawings are only exemplary and do not necessarily include all the contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps can be decomposed, and some operations / steps can be combined or partially combined, so the actual execution order may change according to actual conditions.

[0014] The following is an explanation of the technical terms involved in the embodiments of the present application:

[0015] The optical module consists of optoelectronic devices, functional circuits and optical interfaces, and its main function is to realize electro-optical and photoelectric conversion functions.

[0016] Optoelectronic devices are the basic components of optical modules, including lasers, modulators, detectors, etc.

[0017] Sublimated sulfur powder, also known as Flowers-of-Sulfur, abbreviated as FoS, is sulfur that vaporizes into gas at high temperature and condenses into a yellow crystalline powder when cooled. It has a slight odor.

[0018] Non-hermetic packaging, also known as non-hermetic package, means that the packaged chips and devices are in direct contact with environmental gases and liquids. The chip's ability to withstand harmful gases and liquids in the environment is improved through processes such as passivation layers.

[0019] With the rise of emerging applications such as large language models and intelligent computing, the demand for high-speed optical modules is increasing day by day. Optical modules are generally divided into two types: hermetic packaging and non-hermetic packaging. Hermetic packaging refers to the use of a packaging shell to isolate chips and devices from the surrounding environment, preventing harmful liquids, solids and gases from corroding and penetrating for a certain period of time to ensure the long-term reliability of the product; non-hermetic packaging refers to the direct contact of the packaged chips and devices with environmental gases and liquids, and the chip improves its ability to withstand harmful gases and liquids in the environment through processes such as passivation layers. Compared with hermetic packaging, non-hermetic packaging has significant advantages in terms of cost. However, due to factors such as temperature, humidity, and gas environment, non-hermetic optoelectronic devices and modules face the problem of low service life due to device failure. After a lot of practice, it has been proved that sulfides in the atmospheric environment are a factor that cannot be ignored in causing device failure. Therefore, the anti-sulfurization design and accelerated sulfurization test of non-hermetic optoelectronic devices and modules are an indispensable part of ensuring device reliability.

[0020] At present, the accelerated sulfurization test of optoelectronic devices and modules basically follows the sulfurization test methods and standards of electronic components. There are two main types, namely: (1) Flowing mixed gas corrosion test. For relevant methods and standards, please refer to 5.5.2 of Telcordia GR-63-CORE-2012 "NEBS Requirements: Physical Protection", 9.1.3 of Telcordia GR-1217-CORE-2013 "General Reliability Assurance Requirements for Electrical Connectors for Communication Hardware" and GB / T 2423.51-2020 "Environmental Testing Part 2: Test Method Test Ke: Flowing Mixed Gas Corrosion Test"; (2) Hydrogen sulfide (H2S) corrosion test. For relevant methods and standards, please refer to GB / T 2423.20-2014 "Environmental Testing Part 2: Test Method Test Kd: Hydrogen Sulfide Test for Contact Points and Connectors"). However, the test results of gas corrosion are related to factors such as temperature, humidity, and flow rate, which puts stringent requirements on the test environment, test equipment and equipment. At the same time, the gas used in the test is harmful, and its storage, transportation, and discharge methods must strictly comply with the requirements of the specifications, which in disguise increases the test cost and safety hazards. In addition, the methods and standards of the mixed gas accelerated test are different according to the degree of environmental pollution in the region, resulting in poor universality of the test results. Moreover, the sulfurization test standards for electronic components have certain limitations when applied to optoelectronic devices and modules. The test methods are not completely suitable for optoelectronic devices and modules, and cannot fully expose the root causes of failure of optoelectronic devices and modules, and cannot provide technical guidance for improving product reliability. For example, a company used hydrogen sulfide gas to conduct a sulfurization accelerated test on the module. Although the test results showed that it passed, the module still had failure problems caused by sulfurization corrosion two years later. It can be seen that the application of gas corrosion accelerated sulfurization test on optoelectronic devices and modules has prominent problems such as insufficient verification, unreliable results, large safety hazards, and high test costs. Based on this, the embodiments of the present application propose a reliability test method and device for anti-sulfurization evaluation of optoelectronic devices and modules, which can solve at least one of the above-mentioned problems to improve the reliability of the test results of the sulfurization test, reduce the test cost, and reduce the cost of the device applying the method.

[0021] It is understandable that if Figure 1As shown, an embodiment of the present application provides a reliability test device for anti-sulfurization evaluation of optoelectronic devices and modules, including a heating thermostat 100 and a test container 200, the heating thermostat 100 is used to provide a preset test temperature; the bottom of the test container 200 is placed in the heating thermostat 100, the test container 200 is provided with a preset initial dose of sublimated sulfur powder 300, an optical device 400 to be tested and a sulfide indicator 500, the optical device 400 and the sulfide indicator 500 are arranged above the sublimated sulfur powder 300; the initial dose corresponds to the capacity of the test container 200 one by one, the sulfide indicator 500 is used to periodically detect the state of the sulfide indicator 500 at intervals of a preset first time length after the sulfide test is started, and verify whether the sublimated sulfur powder 300 meets the test requirements according to the state of the sulfide indicator 500.

[0022] Therefore, the reliability test device in the embodiment of the present application realizes sulfur fumigation of the optical device 400 by maintaining the sublimated sulfur powder 300 at the test temperature for volatilization, so as to complete the accelerated sulfurization test of the optical device 400. And because the sublimated sulfur powder 300 is solid, the requirements for the transportation, storage and verification equipment are lower, the equipment is safer and the cost is lower, and the cost of the test method using the device is lower, and compared with gas, the acceleration effect of the method using the device is far better than the flowing gas corrosion test. Therefore, compared with the related art, the embodiment of the present application can improve the reliability of the accelerated sulfurization test results of the optical device 400 and reduce the test cost.

[0023] It is understandable that there is no limit to the number of optical devices 400 that are subjected to the vulcanization test in the same test container 200 , but it is required that adjacent optical devices 400 do not contact, cover or shield each other to ensure that the contact points are not disturbed during the exposure process.

[0024] It is understandable that the optical device 400 may include at least one of an optical module or an optoelectronic device. For example, in one embodiment, the optical device 400 to be tested is an optical module, and in another embodiment, the optical device 400 to be tested is an optoelectronic device. In another embodiment, the optical device 400 to be tested includes both an optical module and an optoelectronic device.

[0025] It is understood that the test temperature can be obtained based on actual tests and the initial dose can be confirmed based on actual tests.

[0026] It is understandable that the sulfur content of the sublimated sulfur powder 300 is related to the duration and effect of the test, wherein the higher the sulfur content, the better the effect of the accelerated vulcanization test. For example, in one embodiment, the vulcanization content of the sublimated sulfur powder 300 is set to 98%.

[0027] It is understandable that if Figure 1 As shown, the reliability test device of the optical device 400 is used to maintain the test container 200 at a preset test temperature and start the vulcanization test. The test process includes: (1) Test preparation stage: Before the vulcanization test, the performance of the optical device 400 is tested to obtain initial test data under normal working conditions. The optical device 400 includes at least one of an optoelectronic device and an optical module; a preset initial dose of sublimated sulfur powder 300 is placed at the bottom of the test container 200, and the initial dose corresponds to the capacity of the test container 200; the optical device 400 and the vulcanization indicator 500 are placed in the test container 200 and above the sublimated sulfur powder 300; the test container 200 is placed at the preset test temperature. (1) Start the vulcanization test at the test temperature; (2) Indicator verification phase: Regularly detect the state of the vulcanization indicator 500 at a first time interval, and verify whether the sublimated sulfur powder 300 meets the test requirements according to the state of the vulcanization indicator 500; (3) Execution test phase: Regularly stop the vulcanization test at a second time interval, take out the optical device 400 for testing, until the cumulative time of the vulcanization test reaches a preset third time; compare the test data obtained after each vulcanization test with the initial test data, and determine whether the optical device 400 has failed based on the comparison result.

[0028] It should be noted that, for the reliability test method in the present application, when the optical device 400, the sublimated sulfur powder 300 and the vulcanization indicator 500 have been placed in the test container 200 and the preset test temperature has been reached, it means that the vulcanization test has been started.

[0029] It can be understood that stopping the vulcanization test means ending one round of the vulcanization test, and multiple rounds of vulcanization tests can be performed within the third time period.

[0030] It is understandable that the vulcanization indicator 500 is used to indicate whether the dosage of the sublimated sulfur powder 300 meets the test requirements of the current round of vulcanization test.

[0031] It is understandable that taking out the optical device for testing can detect whether the optical device 400 meets at least any one of the performance requirements and the appearance quality requirements after the current round of vulcanization test.

[0032] Understandably, referring to Figure 2 As shown, according to an embodiment of the present application, a reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules is provided, and the method includes:

[0033] Step S100, executing the test preparation step; the test preparation step includes: before starting the vulcanization test, testing the performance of the optical device to obtain initial test data under normal working conditions, the optical device includes at least one of an optoelectronic device and an optical module; placing a preset initial dose of sublimated sulfur powder at the bottom of the test container, the initial dose corresponding to the capacity of the test container; placing the optical device and the vulcanization indicator in the test container and above the sublimated sulfur powder; setting the test container at a preset test temperature, and starting the vulcanization test;

[0034] Step S200, executing an indicator verification step, the indicator verification step comprising: regularly detecting the state of a vulcanization indicator at a preset first time interval, and verifying whether the sublimated sulfur powder meets the test requirements according to the state of the vulcanization indicator;

[0035] Step S300, executing the test step, the executing the test step includes: regularly stopping the vulcanization test at intervals of a preset second time length, taking out the optical device for testing, until the cumulative time length of the vulcanization test reaches a preset third time length; comparing the test data obtained after each vulcanization test with the initial test data, and determining whether the optical device has failed based on the comparison result.

[0036] Therefore, the reliability test method for the anti-sulfurization evaluation of optoelectronic devices and modules in the embodiment of the present application realizes sulfur fumigation of optical devices by maintaining the sublimated sulfur powder at the test temperature for volatilization, so as to complete the accelerated sulfurization test of optical devices. Compared with gas, the acceleration effect of this method far exceeds that of the flowing gas corrosion test. And because the sublimated sulfur powder is solid, the requirements for the equipment for transportation, storage and verification are lower, and the equipment using this method is safer and has lower cost. Therefore, compared with the related art, the embodiment of the present application can improve the reliability of the accelerated sulfurization test results of optical devices and reduce the test cost.

[0037] It should be noted that failure of an optical device means that it does not meet the performance requirements or appearance quality requirements in practical applications.

[0038] Exemplarily, assuming that the second time length is set to T2, it means that starting from time T0 when the sulfurization test is started, the optical device is taken out for testing after time T0+T2, and starting from time T0' when the next sulfurization test is started, the optical device is taken out for testing after T0'+T2, until nT2 reaches the third time length.

[0039] It is understandable that the cumulative duration reaching the total duration of the experiment means that the cumulative duration is greater than or equal to the total duration of the experiment. Assuming that the total duration of the experiment is T3, then nT2≥T3.

[0040] In one embodiment, taking out the optical device for testing includes a static recovery phase, thereby ensuring that the optical device is recovered before measurement after the sulfurization test is suspended, further ensuring the reliability of the measurement result.

[0041] It is understandable that the dosage of sublimated sulfur powder has two meanings, one is the sulfur content in the sublimated sulfur powder, and the other is the quality of the sublimated sulfur powder itself. At this time, the sulfur indicator can be used as a control to determine whether the quality and dosage of the sublimated sulfur powder meet the test requirements. Among them, the possibilities of not meeting the test requirements are: (1) the quality meets the requirements, but the sulfur content does not meet the requirements (such as too much impurities due to too long use); (2) the sulfur content of the sublimated sulfur powder meets the requirements, but the quality of the sublimated sulfur powder does not meet the requirements; (3) both the sulfur content and the quality of the sublimated sulfur powder do not meet the requirements.

[0042] It should be noted that, for the optical device in step S100, in one embodiment, multiple optoelectronic devices can be placed in the same test container as optical devices to be vulcanized. In another embodiment, multiple optical modules can be placed in the same test container as optical devices to be vulcanized. In another embodiment, optoelectronic devices and optical modules can be mixed and placed in the same test container.

[0043] Understandably, referring to Figure 3 As shown, after taking out the optical device for testing, the method further includes:

[0044] Step S310: if the cumulative duration of the vulcanization test does not reach the third duration, the sublimated sulfur powder is adjusted, and the process jumps to the indicator verification step;

[0045] Step S320: When the cumulative duration of the vulcanization test of the optical device reaches a preset third duration and the test data obtained after the last vulcanization test indicates that the optical device has not failed, it is determined that the optical device has passed the verification.

[0046] It is understandable that by setting the cumulative duration, multiple rounds of sulfurization tests can be carried out on the optical device, thereby dividing the granularity of the anti-sulfurization test of the optical device, and further providing more accurate analysis data for the anti-sulfurization design of the optical device.

[0047] It is understandable that adjusting the sublimated sulfur powder includes adding or replacing at least one of the sublimated sulfur powders. For example, in one embodiment, the dosage of the sublimated sulfur powder is directly replaced with the dosage of the sublimated sulfur powder that meets the test requirements of the previous round of vulcanization test. In another embodiment, the dosage of the sublimated sulfur powder can be directly added to the dosage when the previous round of vulcanization test meets the test requirements.

[0048] It is understandable that, in one embodiment, when the vulcanization indicator is disposable, such as monitoring the dosage of sublimated sulfur powder by a silver sheet, when the sublimated sulfur powder is adjusted, the vulcanization indicator will be replaced accordingly, and then the vulcanization test will be restarted and the indicator verification step will be entered.

[0049] It can be understood that the verification indicates that the anti-sulfur reliability design of the optical device meets the preset requirements.

[0050] It is understandable that after obtaining the test data, the method further includes: if the test data indicates that the optical device fails, determining that the optical device verification has failed.

[0051] It should be understood that failure of the optical device to pass the verification indicates that its anti-sulfur reliability design does not meet the requirements, and the anti-sulfur reliability design of the optical device still needs to be improved. Specifically, improvements can be made based on the indicators that failed the verification.

[0052] It is understandable that in step S200, verifying whether the sublimated sulfur powder meets the test requirements according to the state of the sulfurization indicator includes:

[0053] After starting the vulcanization test, the vulcanization indicator is tested at intervals of a first time period, wherein the first time period is 24 hours;

[0054] In response to the test result indicating that the dosage of the sublimated sulfur powder does not meet the test requirements, the sublimated sulfur powder is added or replaced until the latest test result indicates that the dosage of the sublimated sulfur powder meets the test requirements.

[0055] It is understandable that the purpose of setting the first time length to 24h is to improve the credibility of the verification result. The credibility of the verification result is lower than or greater than the first time length. When the first time length is reached, after the vulcanization indicator is tested, the state of the vulcanization indicator still indicates that the dosage of the sublimated sulfur powder does not meet the test requirements, which means that the vulcanization test is invalid and it is necessary to re-enter the test preparation step to start the test.

[0056] In one embodiment, assuming that the first time length is T1, the sulfide indicator can be tested at T0+mT1, where m is greater than or equal to 1, that is, it is tested once at T0+T1. If it is not satisfied, sublimated sulfur powder is added again and tested once at T0+2T1, and so on until the test requirements are met.

[0057] It is understood that the sulfide indicator comprises a silver flake, wherein when the silver flake turns black, it indicates that the dosage of the sublimated sulfur powder meets the test requirements.

[0058] It should be noted that the use of silver sheets can more intuitively indicate whether the dosage of sublimated sulfur powder meets the test requirements, and the operation is more convenient.

[0059] Therefore, incorporating “sulfur fumigation” into the vulcanization test of non-hermetic optoelectronic devices and modules, using sublimated sulfur powder to conduct accelerated vulcanization tests at specific temperature and time, and using silver sheet samples as test monitoring materials can further improve the operational convenience of the test.

[0060] It should be noted that, in one embodiment, the application of the vulcanization test standard for electronic components to optoelectronic devices and modules has certain limitations, and the failure judgment of its devices is not completely suitable for optoelectronic devices and modules, and cannot fully expose the root causes of failure of optoelectronic devices and modules, and cannot provide technical guidance for improving product reliability. Based on this, the embodiment of the present application proposes applicable failure criteria for the root causes of failure of optical devices, which can effectively avoid the risk of misjudgment and missed judgment of optical device failure, and improve the reliability and universality of the test results, as shown below:

[0061] In one embodiment, when the test data indicates that the optical device fails, the test data includes at least one of the following:

[0062] The electrical performance of the optical device does not meet the preset performance requirements;

[0063] There are abnormalities in the appearance quality of the optical device;

[0064] The photoelectric test results of the optical device do not meet the preset photoelectric conditions.

[0065] It should be noted that the preset performance requirements, appearance quality anomalies, and optoelectronic conditions are all requirements related to reliability.

[0066] In one embodiment, the test data includes at least one of the following, and it is determined that the photoelectric test result of the optical device does not meet the preset photoelectric condition:

[0067] The test result of the optoelectronic test of the optical device is failure;

[0068] Among the optoelectronic test parameters of the optical device, there is at least one parameter indicator whose change amount exceeds a preset first change threshold.

[0069] Exemplarily, if after reaching the second time period, a photoelectric test is performed when the optical device is tested for failure, and the test result of the photoelectric test is failure, it means that the optical device is failed. For example, in one embodiment, a demand is made for the change of the photoelectric parameters, and therefore, the reliability judgment is made on the change amount of each parameter index of the photoelectric test parameter obtained from the photoelectric test result. The first change threshold can be specified by the user or summarized based on the empirical data in the actual R&D test. For example, if there is at least one parameter index in the photoelectric test parameter that changes more than the user-specified change amount, it does not meet the user's reliability requirements. For example, there is at least one parameter index in the photoelectric test parameter that changes by more than 30% (such as the change in the transmitted optical power is greater than 1.5dB, the change in the receiving sensitivity is greater than 1.5dB, etc.), where 30% is summarized based on the empirical data in the actual R&D test.

[0070] In one embodiment, the test data includes at least one of the following, and determines that the appearance quality of the optical device is abnormal:

[0071] The markings on the optical device are completely or partially peeled off, faded or blurred;

[0072] The coating of the packaged metal part on the optical device is corroded, blistered or discolored; and the degree of discoloration meets a preset second change threshold;

[0073] The corrosion area of ​​the substrate or outer packaging material of the optical device is greater than the preset corrosion percentage and / or there is penetrating corrosion.

[0074] For example, taking the case where the mark on the optical device is completely or partially detached, faded or blurred, in one embodiment, the mark on the optical device is completely detached, in another embodiment, the mark on the optical device is completely faded, and in another embodiment, the mark on the optical device is blurred and cannot be recognized. In another embodiment, the mark on the optical device is partially detached, in another embodiment, the mark on the optical device is partially faded, and in another embodiment, the mark on the optical device is partially blurred and cannot be completely recognized.

[0075] For example, the coating of the packaged metal part on the optical device is corroded, blistered or discolored. For example, in one embodiment, the coating of the packaged metal part on the optical device is corroded; in another embodiment, the packaged metal part on the optical device is blistered; in another embodiment, the packaged metal part on the optical device is obviously discolored. The second change threshold represents a color change that can be recognized by the naked eye, so that the optical device can be judged as failed when the color is obviously changed.

[0076] For example, the corrosion area of ​​the substrate or outer packaging material of the optical device is greater than a preset corrosion percentage and / or there is through-corrosion. For example, the corrosion area of ​​the substrate of the optical device is greater than 5% (wherein 5% is the set corrosion percentage, which can be modified according to actual needs); or there is through-corrosion (such as corrosion forming a through hole) in the substrate of the optical device; or there is corrosion area of ​​the outer packaging material of the optical device is greater than 5%; or there is through-corrosion in the outer packaging material of the optical device.

[0077] Therefore, the reliability of the optical device can be further ensured through the above-mentioned failure basis.

[0078] In one embodiment, the test data includes at least one of the following, when it is determined that the electrical performance of the optical device does not meet the preset performance requirements:

[0079] There is at least one of a solder joint damage, a lead damage, a solder joint partial separation, and a lead partial separation on the optical device;

[0080] The impedance of a specific pin on the optical device changes and the amount of impedance change exceeds a preset tolerance;

[0081] Silver sulfide crystals appear on electrodes on optics.

[0082] It is understandable that the specific pins are pins that affect reliability, which can be specified by the user or determined according to the actual circuit design of the optical device, and the embodiments of the present application do not impose too many restrictions on this. The preset tolerance can be manually specified or a specification technical tolerance requirement.

[0083] It is understandable that the appearance of silver sulfide crystals indicates that the electrode was corroded by sulfur in the air during the sulfidation test.

[0084] For example, at least one of the following is taken as an example: a solder joint is damaged, a lead is damaged, a solder joint is partially separated, or a lead is partially separated on the optical device. For example, a solder joint on the optical device is damaged, or a solder joint on the optical device is partially separated, resulting in failure to conduct electricity normally or a risk of use. For example, a lead on the optical device is damaged, or a lead on the optical device is partially separated, resulting in failure to use normally or a risk of use.

[0085] It should be noted that any combination or any one of the following conditions, including damaged or partially separated solder joints or leads on the optical device, changes in the impedance of specific pins on the optical device and the amount of impedance change exceeds a preset tolerance, and the presence of silver sulfide crystals on the electrodes on the optical device, indicates that the optical device is failed.

[0086] It is understandable that, before performing failure detection on the optical device, the method further includes:

[0087] The optics are placed in a standard recovery environment for a fourth period of time, and the optics are tested after the fourth period of time.

[0088] It is understandable that the standard recovery environment refers to a normal temperature and pressure environment. The fourth time period can be selectively set according to actual needs. In one embodiment, the value range of the fourth time period is 1 to 2 hours. Setting the fourth time period allows recovery before measurement before failure detection, further ensuring the reliability of the measurement results.

[0089] It is understandable that, before step S100, the method further includes:

[0090] Perform mechanical inspection and mechanical durability tests on optics.

[0091] It should be noted that mechanical inspection includes inspection of appearance quality, such as whether the surface of the device is intact; mechanical durability test includes pin firmness, variable frequency vibration, etc., so that it is possible to judge whether the optical device has failed through the test data before the vulcanization test and the test data of failure detection after the vulcanization test.

[0092] The setting of the optical devices meets the preset conditions, which include uniform distribution between the optical devices, no contact between any two optical devices, no stacking between the optical devices, no covering or shielding of any optical device, and no interference between the contact points of the optical devices during the exposure process.

[0093] Understandably, the optics were removed for testing, including:

[0094] After the vulcanization test is stopped, the optical device is visually inspected, and the visual inspection includes at least one of the following: ordinary visual inspection; visual inspection under a magnifying glass with a magnification greater than or equal to 20 times.

[0095] It is understandable that before placing the preset initial dose of sublimated sulfur powder at the bottom of the test container in step S100, the method further includes:

[0096] Obtaining a preset volume dosage ratio;

[0097] Calculate the product of the test container capacity and the capacity-dose ratio and determine the calculated result as the initial dose.

[0098] It should be noted that the volume dosage ratio can be measured based on multiple tests. In one embodiment, the volume dosage ratio represents that 30g of sublimated sulfur powder is used in a 40L container. For example, the initial dosage of an 80L test container can be determined to be 60g.

[0099] It can be understood that the test temperature is within the maximum storage temperature range or the general test temperature range, and the general test temperature range is smaller than the maximum storage temperature range; the total test duration is 480h or 720h.

[0100] The maximum storage temperature range is obtained by offsetting the preset temperature with the maximum or highest storage temperature of the optical device. The general test temperature range refers to the temperature that is applicable to a variety of different optical devices and is used for the vulcanization test in this application.

[0101] It is understandable that the maximum storage temperature range is TEMP-2°C to TEMP+2°C, where TEMP is the maximum storage temperature of the optical device.

[0102] It should be noted that ±2°C is the upper and lower tolerance limits of the preset offset temperature.

[0103] For example, taking the maximum storage temperature of the optical device as 85° C., the test temperature can be set to 83° C., 84° C., or 87° C., etc.

[0104] It is understandable that the general test temperature range is S-2°C to S+2°C, where S is 60°C.

[0105] It should be noted that 60 degrees in the present application represents the general value of the temperature required for the various optical devices applicable in the present application during the sulfurization test.

[0106] Illustratively, the test temperature can be set to 58°C, 59°C, 60°C, 61°C, 62°C, etc.

[0107] It is understandable that after step S300, the method further includes: performing an appearance inspection on the optical device, including ordinary visual inspection and visual inspection under a magnifying glass of 20 times or more. The content of the appearance inspection may include whether the external quality of the label, appearance, metal plating, coating, etc. meets the requirements.

[0108] like Figure 1 and Figure 4As shown, a vulcanization test device for non-airtight optoelectronic devices and modules. The vulcanization test device includes a heating constant temperature device 100 (such as a constant temperature box or a heat wave oven, etc.). The test temperature is not less than (60±2)℃, such as the maximum storage temperature of optoelectronic devices and modules (85±2)℃; the total test time is not less than 480h; the test container 200 can be made of high temperature resistant and anti-sulfurization materials, such as glass, polycarbonate, stainless steel, etc.; the silver sheet as a vulcanization indicator 500 can be suspended in the container through anti-sulfurization materials such as nylon wire. The silver sheet and elemental sulfur react chemically to generate gray-black silver sulfide (Ag2S), so whether the vulcanization effect is normal can be judged by observing whether the silver sheet is black. In addition, the reaction process does not depend on the ambient humidity, so the test results are more consistent. The optical device 400 to be vulcanized can also be hung in the test container 200 or placed on a shelf by anti-vulcanization materials such as nylon lines. The sublimated sulfur powder 300 (Flower-of-Sulfur, FoS) is used as a test reagent, and its sulfur content is not less than 98%, and it is required to be laboratory grade or above. The required mass of the sublimated sulfur powder 300 during the test can be determined according to the capacity of the test container 200, such as using 30g of sublimated sulfur powder 300 in a 40L container.

[0109] For example, Figure 4 As shown, a vulcanization test method for non-hermetic optoelectronic devices and modules comprises the following steps:

[0110] S1. Sample. The sample to be subjected to the vulcanization test is determined to be one or both of the optoelectronic devices or modules.

[0111] S2. Initial parameter determination, including but not limited to photoelectric parameter testing of samples, mechanical inspection and mechanical durability testing.

[0112] S3, vulcanization test requirements are set to start the vulcanization test. Figure 1 The vulcanization test device shown in the figure places the samples evenly and without stacking in the test container 200. The samples should not touch, cover or shield each other, and the contact points should not be disturbed during the exposure process. The test temperature is set to (60±2)℃ or (85±2)℃. The total test time is set to T4 (such as 480h or 720h).

[0113] S4. Visual inspection of the test: Perform a visual inspection of the test environment and conditions every first time period T1 (eg, T1 = 24 hours).

[0114] S5. Visual inspection content. By placing a silver sheet as a sulfide indicator 500, a control silver sheet sample is visually inspected in the test container 200 before the test begins. The silver sheet must turn black within T2 time before the test can continue (that is, the silver sheet meets the test requirements only when it turns black).

[0115] S6. Visually inspect the silver sheet and make sure it has not turned black. Add or replace 300% sublimated sulfur powder and restart the verification. Note: During the test, when opening the can to take the sample, there is a strong sulfur odor and a gas mask needs to be worn.

[0116] S7, visually inspect the silver sheet to see if it has turned black. Test the photoelectric properties at room temperature every second time period T2 (e.g., T2=168h), specifically, test the photoelectric properties after placing it under standard recovery conditions for a fourth time period T4 (e.g., T4=1-2h), and restart the test after the photoelectric properties test to enter S6.

[0117] S8. Failure criteria for samples after vulcanization. Failure criteria include but are not limited to:

[0118] Silver sulfide crystals appear on the electrodes;

[0119] The logo is completely or partially peeled off, faded and blurred;

[0120] The plating of packaged metal parts is corroded, blistering and noticeably discolored;

[0121] The corrosion area of ​​the sample substrate or outer packaging material exceeds 5%, or there is penetrating corrosion;

[0122] The solder joints or leads are damaged or partially separated;

[0123] The impedance of a specific pin changes and exceeds the specification technical tolerance requirement;

[0124] The photoelectric test fails, or the photoelectric parameter changes exceed the user's specified value;

[0125] The change in major optoelectronic parameter indicators exceeds 30%, such as the change in transmitted optical power is greater than 1.5dB, and the change in receiving sensitivity is greater than 1.5dB.

[0126] S9. Failed the vulcanization test. If the test index parameters of the sample meet the failure criteria, the sample has failed the vulcanization test and the test is terminated immediately. At the end of the test, an appearance inspection should be carried out, including ordinary visual inspection and visual inspection under a magnifying glass of 20 times or more.

[0127] S10, cumulative duration of the vulcanization test. If the test index parameters of the sample do not meet the failure criterion, add or replace the sublimated sulfur powder 300 to continue the vulcanization test until the cumulative duration exceeds T3.

[0128] S11, vulcanization test passed. If the sample has not failed after the vulcanization test for T3 time, the sample has passed the vulcanization test and the test is terminated. At the end of the test, an appearance inspection should also be carried out, including ordinary visual inspection and visual inspection under a magnifying glass of 20 times or more.

[0129] Therefore, the embodiments of the present application not only stipulate the ambient temperature, test duration and test time requirements for the sulfurization test of non-airtight optoelectronic devices and modules, but also unify the test and testing standards. At the same time, based on the test results of the sample performance before and after the sulfurization test, the failure criterion of the sample after the sulfurization test is proposed, which provides a basis for judging whether the non-airtight optoelectronic devices and modules pass the sulfurization test.

[0130] It should be noted that the embodiments of the present application can be used for accelerated sulfurization tests of non-airtight optoelectronic devices and modules in stages including research and development, conversion and mass production, and provide support for reliability verification of optoelectronic devices and modules. Non-airtight optoelectronic devices and modules and their products are exposed to environments with high sulfur content for a long time, and sulfidation corrosion is the main cause of component failure. At present, the sulfurization test methods and standards for optoelectronic devices and modules are still incomplete. The traditional scheme of hydrogen sulfide and other gas corrosion tests not only has gas storage, transportation, and emission problems, which increases the test cost and safety hazards, but also the gas corrosion test results depend on ambient temperature, atmospheric humidity, gas flow rate, etc., and the consistency of the test results is poor. Therefore, the sulfur fumigation implemented in this application can be used as a low-cost sulfurization test method with both safety and universality, which provides technical guidance for the anti-sulfurization design of non-airtight optoelectronic devices and modules.

[0131] Compared with the existing hydrogen sulfide gas corrosion method, sulfur fumigation reduces the dependence on environmental humidity, temperature, and flow rate, and the test equipment is simple, which improves the universality, economy, and safety of sulfurization tests on non-hermetic optoelectronic devices and modules.

[0132] The above describes some embodiments of the present application with reference to the accompanying drawings, but does not limit the scope of the present invention. Any modification, equivalent substitution and improvement made by those skilled in the art without departing from the scope and essence of the present invention shall be within the scope of the present application.

Claims

1. A reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules, the method comprising: Perform test preparation steps; The test preparation step includes: before starting the vulcanization test, testing the performance of the optical device to obtain initial test data under normal working conditions, wherein the optical device includes at least one of an optoelectronic device and an optical module; Placing a preset initial dose of sublimated sulfur powder at the bottom of a test container, wherein the initial dose corresponds to the capacity of the test container; arranging the optical device and the vulcanization indicator in the test container and above the sublimated sulfur powder; setting the test container at a preset test temperature and starting the vulcanization test; Performing an indicator verification step, the performing indicator verification step comprising: regularly detecting the state of the vulcanization indicator at a preset first time interval, and verifying whether the sublimated sulfur powder meets the test requirements according to the state of the vulcanization indicator; The step of executing the test comprises: regularly stopping the vulcanization test at intervals of a preset second time length, taking out the optical device for testing, until the cumulative time length of the vulcanization test reaches a preset third time length; comparing the test data obtained after each vulcanization test with the initial test data, and determining whether the optical device has failed according to the comparison result.

2. The reliability test method for anti-sulfurization evaluation of optoelectronic devices and modules according to claim 1, characterized in that: After taking out the optical device for testing, the method further comprises: When the cumulative duration of the vulcanization test does not reach the third duration, adjusting the sublimated sulfur powder and jumping to the indicator verification step; When the cumulative duration of the vulcanization test of the optical device reaches the preset third duration and the test data obtained after the last vulcanization test indicates that the optical device has not failed, it is determined that the optical device has passed the verification.

3. The reliability test method for anti-sulfurization evaluation of optoelectronic devices and modules according to claim 1 or 2, characterized in that: In the event that the test data indicates that the optical device has failed, it is determined that the optical device has failed verification.

4. The reliability test method for anti-sulfurization evaluation of optoelectronic devices and modules according to claim 1, characterized in that: The step of verifying whether the sublimated sulfur powder meets the test requirements according to the state of the vulcanization indicator includes: After starting the vulcanization test, the vulcanization indicator is tested at each interval of the first time period, wherein the first time period is 24 hours; In response to the detection result indicating that the dosage of the sublimated sulfur powder does not meet the test requirements, the sublimated sulfur powder is added or replaced until the latest detection result indicates that the dosage of the sublimated sulfur powder meets the test requirements.

5. The reliability test method for anti-sulfurization evaluation of optoelectronic devices and modules according to claim 1, characterized in that: The sulfide indicator comprises a silver sheet, wherein when the silver sheet turns black, it indicates that the dosage of the sublimated sulfur powder meets the test requirements.

6. The reliability test method for anti-sulfurization evaluation of optoelectronic devices and modules according to claim 1, characterized in that: The test data includes at least one of the following, and determining that the test data indicates that the optical device has failed: The electrical performance of the optical device does not meet the preset performance requirements; The appearance quality of the optical device is abnormal; The photoelectric test result of the optical device does not meet the preset photoelectric condition.

7. The reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules according to claim 6, characterized in that: The test data includes at least one of the following, determining that the photoelectric test result of the optical device does not meet the preset photoelectric condition: The optical device fails the photoelectric test; Among the optoelectronic test parameters of the optical device, there is at least one parameter indicator whose change amount exceeds a preset first change threshold.

8. The reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules according to claim 6, characterized in that: The test data includes at least one of the following, and determines that the appearance quality of the optical device is abnormal: The markings on the optical device are completely or partially peeled off, faded or blurred; The coating of the packaged metal part on the optical device is at least one of corroded, blistered or discolored; and the degree of discoloration meets a preset second change threshold; The corrosion area of ​​the substrate or outer packaging material of the optical device is greater than a preset corrosion percentage and / or there is penetrating corrosion.

9. The reliability test method for anti-sulfurization evaluation of optoelectronic devices and modules according to claim 6, characterized in that: The test data includes at least one of the following, when it is determined that the electrical performance of the optical device does not meet the preset performance requirements: The optical device has at least one of a damaged solder joint, a damaged lead, a partially separated solder joint, and a partially separated lead; The impedance of a specific pin on the optical device changes and the impedance change exceeds a preset tolerance; Silver sulfide crystals appear on the electrodes on the optical device.

10. The reliability test method for anti-sulfurization evaluation of optoelectronic devices and modules according to claim 1, characterized in that: The taking out the optical device for testing comprises: The optical device is placed in a standard recovery environment and left to stand for a fourth period of time, and the optical device is subjected to the test after the fourth period of time.

11. The reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules according to claim 1, characterized in that: Before placing the preset initial dose of sublimated sulfur powder at the bottom of the test container, the method further comprises: Obtaining a preset volume dosage ratio; The product of the capacity of the test container and the capacity-dose ratio is calculated, and the calculated result is determined as the preset initial dose.

12. The reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules according to claim 1, characterized in that: Before starting the vulcanization test, the method further includes: Performing mechanical inspection and mechanical durability test on the optical device; The setting of the optical devices meets preset conditions, which include that the optical devices are evenly distributed and there is no contact between any two of the optical devices; there is no stacking between the optical devices, any one of the optical devices is not covered or shielded, and the contact points of the optical devices are not interfered during the exposure process.

13. The reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules according to claim 1, characterized in that: The taking out the optical device for testing comprises: After the vulcanization test is stopped, the optical device is subjected to an appearance inspection, wherein the appearance inspection comprises at least one of the following: ordinary visual inspection; visual inspection under a magnifying glass with a magnification greater than or equal to 20 times.

14. The reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules according to claim 1, characterized in that: The test temperature may be one of the following: Within the maximum storage temperature range; Within the general test temperature range; Wherein, the general test temperature range is smaller than the maximum storage temperature range.

15. The reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules according to claim 14, characterized in that: The maximum storage temperature range is TEMP-2°C to TEMP+2°C, wherein TEMP is the maximum storage temperature of the optical device.

16. The reliability test method for evaluating the anti-sulfurization of optoelectronic devices and modules according to claim 14, characterized in that: The general test temperature range is S-2°C to S+2°C, wherein S is 60°C.

17. A reliability test device for evaluating the anti-sulfurization of optoelectronic devices and modules, comprising: Heating thermostat, used to provide preset test temperature; A test container, the test container is placed in the heating constant temperature device, a preset initial dose of sublimated sulfur powder, an optical device to be tested and a vulcanization indicator are arranged at the bottom of the test container, and the optical device and the vulcanization indicator are arranged above the sublimated sulfur powder; the initial dose corresponds to the capacity of the test container one by one, and the vulcanization indicator is used to regularly detect the state of the vulcanization indicator at intervals of a preset first time length after starting the vulcanization test, and verify whether the sublimated sulfur powder meets the test requirements according to the state of the vulcanization indicator.

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