Testing device, testing method and testing system for high-frequency power supply equipment

Abstract

The invention relates to a testing device, a testing method and a testing system for high-frequency power supply equipment. The testing device is used for being connected to an output port of high-frequency power supply equipment; the testing device comprises a resistor module; the capacitor module is connected with the resistor module in parallel; the control module is respectively connected with the resistor module and the capacitor module; and the control module controls the resistance module and / or the capacitance module to access the analog impedance of the output port of the high-frequency power supply equipment according to a preset program. By adopting the testing device, the testing effect on the high-frequency power supply equipment can be improved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a testing device, a testing method and a testing system for high-frequency power supply equipment. Background Art

[0002] High-frequency power supply equipment is a device that provides power output for high-frequency electrosurgical instruments. High-frequency power supply equipment can achieve effects such as cutting, coagulation and drying of tissues through electrothermal conversion. Taking a high-frequency electrosurgical knife as an example, the high-frequency electrosurgical knife host outputs a high-frequency electrical signal, which acts on the tissue through the instrument. The output power of the high-frequency electrosurgical knife host will directly affect the effect of the instrument on the tissue.

[0003] However, the current testing methods or traditional methods of high-frequency power supply equipment have the problem of poor testing effect. Summary of the invention

[0004] Based on this, it is necessary to provide a test device, a test method and a test system for high-frequency power supply equipment that can improve the test effect in response to the above technical problems.

[0005] In a first aspect, the present application provides a testing device for a high-frequency power supply device, the testing device being used to access an output port of the high-frequency power supply device; the testing device comprising:

[0006] Resistor module;

[0007] Capacitor module, the capacitor module is connected in parallel with the resistor module;

[0008] The control module is connected to the resistance module and the capacitance module respectively; the control module controls the analog impedance of the output port of the resistance module and / or the capacitance module connected to the high-frequency power supply device according to a preset program.

[0009] In one embodiment, the resistor module includes at least one resistor array; the capacitor module includes at least one capacitor array.

[0010] In one embodiment, the resistance module includes at least one sliding resistor; the capacitance module includes at least one adjustable capacitor.

[0011] In one embodiment, the resistor array includes a plurality of resistor units connected in series, and each resistor unit includes a plurality of resistors connected in parallel;

[0012] The capacitor array includes a plurality of capacitor units connected in series, and each capacitor unit includes a plurality of capacitors connected in parallel.

[0013] In one embodiment, the resistance values ​​of the resistors in the same resistor unit in the resistor array are the same, and the resistance values ​​of the resistors in different resistor units in the resistor array are different;

[0014] The capacitance values ​​of the capacitors in the same capacitor unit in the capacitor array are the same, and the capacitance values ​​of the capacitors in different capacitor units in the capacitor array are different.

[0015] In one embodiment, the testing device further comprises:

[0016] A plurality of switches, each switch is respectively arranged on a branch where the resistor is located or a branch where the capacitor is located;

[0017] The control module is used to control each switch separately to adjust the analog impedance of the output port connected to the high-frequency power supply device.

[0018] In one embodiment, the testing device comprises:

[0019] The output module includes at least one single-pole access port, at least one neutral access port and at least one double-pole access port.

[0020] In a second aspect, the present application provides a testing method, which is applied to the testing device of the above-mentioned high-frequency power supply device; the method comprises:

[0021] Initialize a preset program in response to a user's demand instruction;

[0022] The analog impedance of the output port of the high-frequency power supply device connected to the resistance module and / or the capacitance module is controlled according to a preset program.

[0023] In a third aspect, the present application provides a test system, the system comprising a high-frequency power supply device and a test device for the high-frequency power supply device; the test device is used to access an output port of the high-frequency power supply device; the test device comprises:

[0024] Resistor module;

[0025] Capacitor module, the capacitor module is connected in parallel with the resistor module;

[0026] The control module is connected to the resistance module and the capacitance module respectively; the control module controls the analog impedance of the output port of the resistance module and / or the capacitance module connected to the high-frequency power supply device according to a preset program.

[0027] In a fourth aspect, the present application provides a testing method, which is applied to the above-mentioned testing system; the method comprises:

[0028] When the test device is started, the simulated impedance of the output port of the control module connected to the high-frequency power supply device and the calculated impedance obtained by the high-frequency power supply device according to the detection electrical signal of the output port are obtained;

[0029] Compare the simulated impedance and calculated impedance to determine whether the high-frequency power supply equipment is qualified.

[0030] The test device, test method and test system of the above-mentioned high-frequency power supply equipment, the test device of the high-frequency power supply equipment of the embodiment of the present application, the test device is used to connect to the output port of the high-frequency power supply equipment; the test device includes: a resistance module, which can be used to simulate the resistance characteristics of the actual tissue; a capacitance module, which can be used to simulate the capacitance characteristics of the actual tissue, wherein the capacitance module is connected in parallel with the resistance module; a control module, which is respectively connected to the resistance module and the capacitance module; the control module can control the resistance module and / or the capacitance module according to a preset program to connect to the simulated impedance of the output port of the high-frequency power supply equipment, thereby simulating the resistance and capacitance characteristics of the actual tissue, and realizing accurate and comprehensive testing of the performance of the high-frequency power supply equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 is a structural block diagram of a testing device in one embodiment;

[0032] Figure 2 is a schematic diagram of a resistance-capacitance characteristic equivalent circuit in an embodiment;

[0033] Figure 3 is a structural block diagram of a testing device in another embodiment;

[0034] Figure 4a is a structural block diagram of a resistor array and a capacitor array in one embodiment;

[0035] Figure 4b is a structural block diagram of a resistor array and a capacitor array in another embodiment;

[0036] Figure 4c is a structural block diagram of a resistor array and a capacitor array in yet another embodiment;

[0037] Figure 5a A schematic diagram of the connection between a high-frequency power supply device and a test device in one embodiment;

[0038] Figure 5b A schematic diagram of the connection between a high-frequency power supply device and a test device in another embodiment;

[0039] Figure 6 A flowchart of a testing method in one embodiment;

[0040] Figure 7 is a structural block diagram of a test control device in one embodiment;

[0041] Figure 8a It is an application schematic diagram of a high-frequency power supply device in one embodiment;

[0042] Figure 8b A test schematic diagram of a high-frequency power supply device in one embodiment;

[0043] Fig. 9 A flowchart of a testing method in another embodiment;

[0044] Fig.10 It is a structural block diagram of a test control device in another embodiment;

[0045] Fig.11 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0046] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0047] It should be noted that the host output power of the high-frequency power supply device will directly affect the effect of the device on the tissue, and the output power test usually uses the high-frequency power supply device to output the effective current I to the load, and calculate the power P=I through the resistance and current. 2 ×R method. In the traditional method, when testing high-frequency power supply equipment, the load is often pure resistance. In addition to resistance characteristics, the actual tissue also contains capacitive reactance, which leads to the test results of the high-frequency power supply equipment cannot reflect the real dynamic response effect of the high-frequency power supply equipment when it acts on the actual tissue. Take the high-frequency electrosurgical analyzer with a load variation range of 0Ω to 5200Ω as an example. The high-frequency electrosurgical analyzer can perform quality inspection on high-frequency equipment. The load of the equipment is pure resistance load. In addition to resistance characteristics, the actual tissue also contains capacitive reactance. The capacitor C will produce capacitive reactance Z under high frequency conditions. C :

[0048]

[0049] Where, f is the operating frequency of the circuit; C is the tissue capacitance; the above-mentioned capacitive reactance will cause the voltage U, current I, and the phase difference θ corresponding to the current I and the voltage U. In this case, the useful power is expressed as P = U × I × cosθ, and cosθ is less than 1. Therefore, the high-frequency power supply equipment needs to accurately detect and calculate the useful power and useless power, so as to accurately and efficiently control the output electrical parameters. For example, when the high-frequency power supply equipment is a constant current output, the electrical parameter is the output voltage, so that the power actually acting on the target part meets the preset requirements; and how to efficiently detect the detection and control performance of the high-frequency power supply equipment is an urgent problem to be solved. In order to evaluate the detection and control performance of the high-frequency power supply equipment, such as detecting useful power, useless power, output circuit current, voltage, real-time impedance of the target part, and controlling the response speed or control accuracy of the output electrical parameters of the high-frequency power supply equipment according to the detection of high-speed response, the present application proposes a test device, a test method and a test system for high-frequency power supply equipment that can efficiently simulate different impedance characteristics of the target part.

[0050] In one embodiment, Figure 1 As shown, a test device 10 for high-frequency power supply equipment is provided, and the test device 10 is used to access the output port of the high-frequency power supply equipment; the test device 10 includes:

[0051] Resistance module 110;

[0052] A capacitor module 120, the capacitor module 120 is connected in parallel with the resistor module 110;

[0053] The control module 130 is connected to the resistance module 110 and the capacitance module 120 respectively; the control module 130 controls the analog impedance of the output port of the resistance module 110 and / or the capacitance module 120 connected to the high-frequency power supply device according to a preset program.

[0054] Specifically, a high-frequency power supply device (for example, a high-frequency electric knife) can be a device that provides power output for high-frequency electrosurgical instruments. The high-frequency power supply device can achieve effects such as cutting, coagulation, and drying of tissues through electrothermal conversion. For example, the host of the high-frequency power supply device outputs a high-frequency electrical signal to the instrument of the high-frequency power supply device. The output power of the host of the high-frequency power supply device will directly affect the effect of the instrument of the high-frequency power supply device on the tissue. In order to test the detection and control performance of the high-frequency power supply device, a test device of the high-frequency power supply device (for example, a power tester) can be used to test and verify the detection and control performance of the host of the high-frequency power supply device. The test device 10 of the high-frequency power supply device is used to access the output port of the high-frequency power supply device to verify the performance of the high-frequency power supply device. The test device 10 of the high-frequency power supply device has a built-in resistor module 110 and a capacitor module 120 connected in parallel. It should be noted that the actual tissue contains capacitor characteristics in addition to the resistance characteristics, and can be equivalent to a three-element equivalent model showing resistance and capacitance characteristics, such as Figure 2 As shown, R1 is the extracellular fluid, R2 is the intracellular fluid, and C1 is the cell membrane, that is, the actual tissue can be equivalent to a series-parallel circuit of resistors and capacitors. Capacitors will produce capacitive reactance under high-frequency conditions, and this capacitance characteristic will change the impedance of the tissue, causing the target part to generate voltage, current, and phase difference between current and voltage under the output power of the power source 220. In this case, the useful power is expressed as P=U×I×cosθ, and cosθ is less than 1. This capacitance characteristic affects the output of the actual feedback voltage, current, and power, resulting in the phenomenon of inability to cut, severe mechanical pulling, and severe tissue damage during the operation of the electric knife.

[0055] Further, the resistance value of the output port of the resistor module 110 connected to the high-frequency power supply device and the capacitance value of the output port of the capacitor module 120 connected to the high-frequency power supply device are both adjustable. The resistor module 110 and the capacitor module 120 are connected in parallel. The test device 10 combines the resistor module 110 and the capacitor module 120 to form loads of different impedances and simulate different impedance characteristics of the target part. The control module 130 controls the simulated impedance of the output port of the resistor module 110 and / or the capacitor module 120 connected to the high-frequency power supply device according to a preset program to achieve controllable adjustment of the resistor module 110 and the capacitor module 120. The test device 10 can dynamically simulate the resistance and capacitance characteristics and change characteristics of the target part, and can realize the continuous change output of the impedance. Then, the test device 10 can measure and simulate different resistance and capacitance characteristics to detect the detection and control performance of the high-frequency power supply device, and achieve the purpose of simulating different actual scenarios to perform performance detection on the high-frequency power supply device, and the detection device has a simple structure and is easy to use.

[0056] In some examples, under normal circumstances, the resistance of the high-frequency electric knife varies in the range of 50 to 4000Ω, and the capacitance of the high-frequency electric knife varies in the range of 10 to 800pF. During the operation of the high-frequency electric knife, the impedance of the tissue actually measured by the host of the high-frequency electric knife is in dynamic change due to the adjustment of the operator's operation mode, the change of the water content of the tissue, the replacement of the electrode of the high-frequency electric knife acting on the tissue, and other factors. For example, when the high-frequency electric knife starts to work, the resistance of the muscle tissue can be 400Ω, the capacitance is 150pF, and at 400kHz, the capacitive reactance is 2600Ω. At this time, the capacitive reactance has a great influence on the detection of impedance. During the operation of the high-frequency electric knife, the resistance value of the tissue may change from 400Ω to 2000Ω, then to 700Ω, and then to 3000Ω, or the pure resistance continues to increase, etc., showing a dynamic change process. In this process, if the impedance change cannot be detected in real time, and the power is adjusted according to the real resistance value consumed by Joule heat, it will be impossible to cut, mechanical pulling damage is large, and thermal damage on the electrocoagulation side is large. In order to achieve a better high-frequency electrosurgical operation effect, the output power of the high-frequency electrosurgical knife is required to be adjusted accordingly with the impedance change, so as to achieve the dynamic response effect of "how much power can be output according to the current impedance", and then form a standard for evaluating the operation effect of the high-frequency electrosurgical knife. The existing power tester includes an adjustable resistor to dynamically simulate the human body resistance distribution range, such as 10Ω-4000Ω. The existing power tester performs impedance detection on the high-frequency electrosurgical knife, and only detects the dynamic response effect of the high-frequency electrosurgical knife on the real resistance, that is, the object of the high-frequency electrosurgical knife is regarded as pure resistance. In addition to resistance, the impedance of the actual tissue also has capacitance. The actual tissue can be regarded as a resistor-capacitor series-parallel circuit. The existence of capacitance characteristics affects the output power. The power tester needs to meet the requirements of dynamic adjustable output of resistance and capacitance that can simulate the real human body to simulate the actual usage scenario. For example, the initial resistance of muscle tissue R = 100Ω, the capacitance C = 200pF, and the corresponding impedance is:

[0057]

[0058] The presence of capacitance in the tissue causes errors in the feedback of the output power of the high-frequency electrosurgical unit, resulting in large errors in the actual measured output power of the high-frequency electrosurgical unit, and the power tester cannot accurately evaluate the dynamic response effect of the high-frequency electrosurgical unit on the actual tissue. The test device 10 controls the resistance value of the output port of the resistance module 110 connected to the high-frequency power supply device and the capacitance value of the output port of the capacitance module 120 connected to the high-frequency power supply device through the control module 130, so that the simulated impedance of the output port of the test device 10 connected to the high-frequency power supply device changes according to a preset program to simulate the actual tissue.

[0059] The test device of the high-frequency power supply equipment in the embodiment of the present application is used to connect to the output port of the high-frequency power supply equipment; the test device includes: a resistance module, which can be used to simulate the resistance characteristics of the actual tissue; a capacitance module, which can be used to simulate the capacitance characteristics of the actual tissue, wherein the capacitance module is connected in parallel with the resistance module; and a control module, which is connected to the resistance module and the capacitance module respectively; the control module can control the simulated impedance of the resistance module and / or the capacitance module connected to the output port of the high-frequency power supply equipment according to a preset program, thereby simulating the resistance and capacitance characteristics of the actual tissue, and realizing accurate and comprehensive testing of the performance of the high-frequency power supply equipment.

[0060] In one embodiment, the resistor module 110 includes at least one resistor array; the capacitor module 120 includes at least one capacitor array.

[0061] Specifically, the resistance value of the simulated resistor connected to the output port of the high-frequency power supply device in the resistor array can be adjusted by the control module 130, and when the high-frequency power supply device is started and the circuit is turned on, the resistance module 110 simulates the resistance characteristics of the actual tissue; the capacitance value of the simulated capacitor connected to the output port of the high-frequency power supply device in the capacitor array can be adjusted by the control module 130, and when the high-frequency power supply device is started and the circuit is turned on, the resistance module 110 simulates the capacitance characteristics of the actual tissue. The control module 130 can control the resistance module 110 and the capacitance module 120 respectively according to a preset program, or can control the resistance module 110 and the capacitance module 120 at the same time, so as to achieve a selective combination of the simulated resistance of the resistance module 110 connected to the output port of the high-frequency power supply device and the simulated capacitance of the capacitance module 120 connected to the output port of the high-frequency power supply device, so as to simulate the resistance and capacitance characteristics of the actual tissue, and can also realize the continuous change output of the simulated impedance, so as to measure the performance of the high-frequency power supply device under different resistance and capacitance characteristics.

[0062] In some examples, the resistor module 110 may include a plurality of resistor arrays connected in series or in parallel; the capacitor module 120 may include a plurality of capacitor arrays connected in series or in parallel.

[0063] In one embodiment, the resistance module 110 includes at least one sliding resistor; the capacitance module 120 includes at least one adjustable capacitor.

[0064] Specifically, the resistance module 110 includes at least one sliding resistor, such as Figure 3 The sliding rheostat R4 shown in the figure can adjust the resistance value of the analog resistor connected to the output port of the high-frequency power supply device through the control module 130. When the high-frequency power supply device is started and the circuit is turned on, the resistance module 110 simulates the resistance characteristics of the actual tissue; the capacitor module 120 includes at least one adjustable capacitor, such as Figure 3The adjustable capacitor C4 shown can adjust the capacitance of the simulated capacitance of the output port of the high-frequency power supply device connected to the adjustable capacitor through the control module 130, and when the high-frequency power supply device is started and the circuit is turned on, the resistance module 110 can simulate the capacitance characteristics of the actual tissue. The control module 130 can combine the simulated resistance of the sliding rheostat connected to the output port of the high-frequency power supply device and the simulated capacitance of the adjustable capacitor connected to the output port of the high-frequency power supply device through a preset program to simulate the resistance and capacitance characteristics of the actual tissue, and realize accurate and comprehensive measurement of the performance of the high-frequency power supply device under different resistance and capacitance characteristics.

[0065] In one embodiment, the resistor array includes a plurality of resistor units connected in series, and each resistor unit includes a plurality of resistors connected in parallel;

[0066] The capacitor array includes a plurality of capacitor units connected in series, and each capacitor unit includes a plurality of capacitors connected in parallel.

[0067] Specifically, if Figure 4a As shown, the resistor array may include a number of resistor units connected in series, for example, three or more resistor units connected in series, each resistor unit includes a number of resistors connected in parallel, for example, each resistor unit includes 10 resistors connected in parallel; in the same resistor unit, the resistance value of each resistor may be the same, for example, each resistor in the first resistor unit is resistor R1; in different resistor units, the resistance value of each resistor may be the same or different, for example, the resistance values ​​of resistors such as resistor R1, resistor R2 and resistor R3 may be the same or different, and the capacitor array may include a number of capacitor units connected in series, for example, the capacitor array may include a capacitor unit; each capacitor unit includes a number of capacitors connected in parallel, for example, three or more capacitors connected in parallel, and the capacitance value of each capacitor may be the same or different. Through the above-mentioned resistor array and capacitor array, the simulated resistor of the resistor array connected to the output port of the high-frequency power supply device and the simulated capacitor of the capacitor array connected to the output port of the high-frequency power supply device can be combined to simulate the resistance-capacitance characteristics of the actual organization, so as to achieve accurate and comprehensive measurement of the performance of the high-frequency power supply device under different resistance-capacitance characteristics.

[0068] like Figure 4bAs shown, the resistor array may include a number of resistor units connected in series, for example, three or more resistor units connected in series, each resistor unit includes a number of resistors connected in parallel, for example, each resistor unit includes 10 resistors connected in parallel; in the same resistor unit, the resistance value of each resistor may be the same, for example, each resistor in the first resistor unit is resistor R1; in different resistor units, the resistance value of each resistor may be the same or different, for example, the resistance values ​​of resistors such as resistor R1, resistor R2 and resistor R3 may be the same or different; the capacitor array may include a number of capacitor units connected in series, for example, the capacitor array may include a capacitor unit; each capacitor unit includes a number of capacitors connected in parallel, for example, three or more capacitors connected in parallel, and the capacitance value of each capacitor may be the same or different. Through the above-mentioned resistor array and capacitor array, the simulated resistor of the resistor array connected to the output port of the high-frequency power supply device and the simulated capacitor of the capacitor array connected to the output port of the high-frequency power supply device can be combined to simulate the resistance-capacitance characteristics of the actual organization, so as to achieve accurate and comprehensive measurement of the performance of the high-frequency power supply device under different resistance-capacitance characteristics.

[0069] In some examples, the resistance value of resistor R1 can be 10Ω; the resistance value of resistor R2 can be 100Ω; and the resistance value of resistor R3 can be 1000Ω. The control module 130 controls the switch array to achieve a selective combination of the resistor array and the capacitor array to achieve a continuous impedance change output to simulate the actual tissue. Figure 4c Taking a test device 10 including a resistor array and a capacitor array as an example, at time t1, the resistor R1 and the capacitor C1 can be selected to be connected in parallel through switches S1 and SS1, wherein the resistance value of the resistor R1 is R1=50Ω, and the capacitance value of the capacitor C1 is C1=200pF, and the initial simulated impedance of the corresponding test device 10 is:

[0070]

[0071] At time t2, the resistor R2 and the capacitor C2 can be selected to be connected in parallel through the switches S2 and SS2, wherein the resistance value of the resistor R2 is R2=100Ω, and the capacitance value of the capacitor C1 is C2=250pF, and the corresponding simulated impedance of the test device 10 is:

[0072]

[0073] At time t3, the resistor R3 and the capacitor C3 can be selected to be connected in parallel through switches S3 and SS3, so as to simulate the change of actual tissue impedance through different resistance and capacitance combinations at different times.

[0074] In one embodiment, the resistance values ​​of the resistors in the same resistor unit in the resistor array are the same, and the resistance values ​​of the resistors in different resistor units in the resistor array are different;

[0075] The capacitance values ​​of the capacitors in the same capacitor unit in the capacitor array are the same, and the capacitance values ​​of the capacitors in different capacitor units in the capacitor array are different.

[0076] Specifically, if Figure 4b As shown, the resistor array may include a number of resistor units connected in series, for example, three or more resistor units connected in series, each resistor unit includes a number of resistors connected in parallel, for example, each resistor unit includes 10 resistors connected in parallel; in the same resistor unit, the resistance value of each resistor may be the same, for example, each resistor in the first resistor unit is resistor R1; in different resistor units, the resistance value of each resistor may be different, for example, the resistance values ​​of resistors R1, R2, and R3 may be different; the capacitor array may include a number of capacitor units connected in series, for example, the capacitor array may include a capacitor unit; each capacitor unit includes a number of capacitors connected in parallel, for example, three or more capacitors connected in parallel. Through the above-mentioned resistor array and capacitor array, the simulated resistor of the resistor array connected to the high-frequency power supply device and the simulated capacitor of the capacitor array connected to the high-frequency power supply device can be combined to simulate the resistance-capacitance characteristics of the actual tissue, so as to achieve accurate and comprehensive measurement of the performance of the high-frequency power supply device under different resistance-capacitance characteristics.

[0077] In some examples, the resistance values ​​of the resistors R1 may be 10Ω; the resistance values ​​of the resistors R2 may be 100Ω; and the resistance values ​​of the resistors R3 may be 1000Ω.

[0078] In one embodiment, the testing device 10 further includes:

[0079] A plurality of switches, each switch is respectively arranged on a branch where the resistor is located or a branch where the capacitor is located;

[0080] The control module 130 is used to control each switch respectively to adjust the analog impedance of the output port connected to the high-frequency power supply device.

[0081] Specifically, each switch is respectively arranged on a branch where the resistor is located or a branch where the capacitor is located, such as Figure 4a As shown, each resistor can be connected in series with the corresponding switch, and the switch can be controlled by the control module 130 to disconnect and connect the resistor, so as to adjust the resistance value of the analog resistor connected to the output port of the high-frequency power supply device; each capacitor can be connected in series with the corresponding switch, and the switch can be controlled by the control module 130 to disconnect and connect the capacitor, so as to adjust the capacitance value of the analog capacitor connected to the output port of the high-frequency power supply device. Figure 4bAs shown, each resistor can be connected in parallel with the corresponding switch, and the switch can be controlled by the control module 130 to achieve short-circuiting and connecting the resistor, so as to adjust the resistance value of the analog resistor connected to the output port of the high-frequency power supply device; each capacitor can be connected in series with the corresponding switch, and the switch can be controlled by the control module 130 to achieve disconnection and connection of the capacitor, so as to adjust the capacitance value of the analog capacitor connected to the output port of the high-frequency power supply device.

[0082] In some examples, such as Figure 4aAs shown, the resistance value of the resistor R1 can be 10Ω. When the resistor unit where the resistor R1 is located closes all switches (S1, S2, S3, S4, S5, S6, S7, S8, S9 and S10) connected to the resistor R1, the resistance value of the resistor unit is 1Ω; when the resistor unit where the resistor R1 is located closes one switch (any one of S1, S2, S3, S4, S5, S6, S7, S8, S9 and S10) connected to the resistor R1, the resistance value of the resistor unit is 10Ω; the resistance value of the resistor R2 can be 100Ω. When the resistor unit where the resistor R2 is located closes one switch (SS1, SS2, SS3, SS4, SS5, SS6, SS7, SS8) connected to the resistor R1 In the case of any one of SS8, SS9 and SS10), the resistance value of the resistor unit is 100Ω, and in the case of all switches (SS1, SS2, SS3, SS4, SS5, SS6, SS7, SS8, SS9 and SS10) connected to the resistor R2 in the resistor unit where the resistor R2 is located, the resistance value of the resistor unit is 10Ω, and the switch SS11 is closed, and the resistance value of the resistor unit is 0Ω; the resistance value of the resistor R3 can be 1000Ω, and in the case of one switch (SSS1, SSS2, SSS3, SSS4, SSS5, SSS6, SSS7, SSS8, SSS9 and SSS10) connected to the resistor R3 in the resistor unit where the resistor R3 is located When all switches (SSS1, SSS2, SSS3, SSS4, SSS5, SSS6, SSS7, SSS8, SSS9 and SSS10) connected to resistor R3 are closed in the resistor unit where resistor R3 is located, the resistance of the resistor unit is 100Ω. When switch SSS11 is closed, the resistance of the resistor unit is 0Ω. The resistance values ​​of the above three resistor units can vary from 1Ω to 1110Ω. Similarly, if there is a fourth resistor unit, the resistance values ​​of each resistor in the fourth resistor unit can be 10000Ω. When all switches connected to the resistors in the fourth resistor unit are closed, the resistance of the fourth resistor unit is 0Ω. The value is 1000Ω; when the fourth resistance unit closes a switch connected to the resistor, the resistance of the fourth resistance unit is 10000Ω, and when the short-circuit switch in the fourth resistance unit is closed, the resistance of the fourth resistance unit is 0Ω; the resistance range of the resistor array can be 1-11111Ω; the switch corresponding to the capacitor is not closed, and the test device 10 is a pure resistor; the switches S1', S2' and S3' can be controlled to be closed respectively to control the connection of capacitors C1, C2 and C3, and capacitors C1, C2 and C3 can preferably use capacitors with the same capacitance; if at least one switch in the capacitor array is closed, the test device 10 presents resistance-capacitance characteristics.

[0083] like Figure 4bAs shown, the resistance value of the resistor R1 can be 10Ω. When all switches (S1, S2, S3, S4, S5, S6, S7, S8, S9 and S10) of the resistor unit where the resistor R1 is located are closed, the resistance value of the resistor unit is 0Ω; when 9 switches (any 9 of S1, S2, S3, S4, S5, S6, S7, S8, S9 and S10) of the resistor unit where the resistor R1 is located are closed, the resistance value of the resistor unit is approximately 10Ω; the resistance value of the resistor R2 can be 100Ω. When 9 switches (SS1, SS2, SS3, S4, S5, S6, S7, S8, S9 and S10) of the resistor unit where the resistor R2 is located are closed, the resistance value of the resistor unit is approximately 10Ω. In the case of any 9 of SS3, SS4, SS5, SS6, SS7, SS8, SS9 and SS10), the resistance of the resistance unit is approximately 100Ω, all switches (SS1, SS2, SS3, SS4, SS5, SS6, SS7, SS8, SS9 and SS10) of the resistance unit are closed, and the resistance of the resistance unit is 0Ω; the resistance of resistor R3 can be 1000Ω, and the 9 switches (SSS1, SSS2, SSS3, SSS4, SSS5, SSS6, SSS7, SSS8, SSS9) of the resistance unit where resistor R3 is located are closed. and any 9 of SSS10 and SSS11), the resistance of the resistance unit is approximately 1000Ω, and when all switches (SSS1, SSS2, SSS3, SSS4, SSS5, SSS6, SSS7, SSS8, SSS9 and SSS10) of the resistance unit where resistor R3 is located are closed, the resistance of the resistance unit is 0Ω, and the resistance of the above three resistance units can vary from 1Ω to 1110Ω; similarly, if there is a fourth resistance unit, the resistance of each resistor in the fourth resistance unit can be 10000Ω, and when all switches in the fourth resistance unit are closed, the resistance of the fourth resistance unit can be 10000Ω. The resistance of the four resistor units is 0Ω; when any 9 switches of the fourth resistor unit are closed, the resistance of the fourth resistor unit is approximately 10000Ω; the resistance range of the resistor array can be 0-11111Ω; the switch corresponding to the capacitor is not closed, and the test device 10 is a pure resistor; the switches S1', S2' and S3' can be controlled to be closed respectively to control the access of capacitors C1, C2 and C3, and capacitors C1, C2 and C3 can preferably use capacitors with the same capacitance; if at least one switch in the capacitor array is closed, the test device 10 exhibits resistance-capacitance characteristics.

[0084] In one embodiment, the testing device 10 comprises:

[0085] The output module includes at least one single-pole access port, at least one neutral access port and at least one double-pole access port.

[0086] Specifically, the test device 10 includes a single-pole access port, a neutral access port, and a double-pole access port. Figure 5a As shown, the test device 10 can be connected to a single pole of the high-frequency power supply device through a single-pole access port and to a neutral electrode of the high-frequency power supply device through a neutral access port to connect the simulated impedance to the output port of the high-frequency power supply device, and can also be connected to a double pole of the high-frequency power supply device through a bipolar access port to connect the simulated impedance to the output port of the high-frequency power supply device.

[0087] In some examples, such as Figure 5a As shown, the high-frequency power supply device may include an electrosurgery host, which may provide two function buttons, namely, electrocuting CUT and electrocoagulating COAG, and a gear position of 0-30, to achieve different effects on tissues. The high-frequency power supply device and the test device 10 may also be connected via a foot switch. The output port of the high-frequency power supply device is connected to the simulated impedance provided by the test device 10. By adjusting the simulated impedance and the closed-loop control of the output power of the high-frequency power supply device by the test device 10, a functional test of the high-frequency power supply device may be achieved.

[0088] In some examples, such as Figure 5b As shown, the high-frequency power supply device may include an ultrasonic scalpel host, which may provide two function buttons, MAX power and MIN power, and corresponding gears to achieve different effects on tissues. The instrument interface of the high-frequency power supply device is connected to the resistance module 110 and the capacitance module 120 of the test device 10; the high-frequency power supply device and the test device 10 may also be connected via a foot switch. The output port of the high-frequency power supply device is connected to the simulated impedance provided by the test device 10. By adjusting the simulated impedance and the closed-loop control of the output power of the high-frequency power supply device by the test device 10, the test device 10 can simulate different working scenarios of the high-frequency power supply device to achieve functional testing of the high-frequency power supply device.

[0089] In one embodiment, Figure 6 As shown, a testing method is provided, which is applied to the testing device 10 of the high-frequency power supply device mentioned above; the method comprises:

[0090] Step 610, initializing a preset program in response to a user's demand instruction;

[0091] Step 620 , controlling the analog impedance of the output port of the high-frequency power supply device connected to the resistance module 110 and / or the capacitance module 120 according to a preset program.

[0092] Specifically, the user can set a preset program and start the test device 10. The test device 10 can initialize the preset program in response to the user's demand instructions, wherein the user's demand instructions can be generated based on the user's corresponding function selection of the test device 10; the test device 10 can control the analog impedance of the output port of the resistance module 110 and / or the capacitance module 120 connected to the high-frequency power supply device according to the preset program. For example, the test device 10 can control the corresponding switch according to the preset program to change the analog impedance of the output port of the test device 10 connected to the high-frequency power supply device.

[0093] In some examples, the preset program may adopt a linear step change or other preset function to control the analog impedance, and the real-time feedback may be dynamically adjusted through hardware circuits and control algorithms.

[0094] Based on the same inventive concept, the embodiment of the present application also provides a test control device for implementing the test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more test control device embodiments provided below can refer to the limitations on the test method above, and will not be repeated here.

[0095] In one embodiment, Figure 7 As shown, a test control device is provided, and the test control device is applied to the test device 10 of the above-mentioned high-frequency power supply device; the test control device includes:

[0096] Initialization module 710, for initializing a preset program in response to a user's demand instruction;

[0097] The analog impedance control module 720 is used to control the analog impedance of the output port of the resistance module 110 and / or the capacitance module 120 connected to the high-frequency power supply device according to a preset program.

[0098] Each module in the above test control device can be implemented in whole or in part by software, hardware or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0099] In one embodiment, a test system is provided, the system comprising a high-frequency power supply device and a test device 10 for the high-frequency power supply device; the test device 10 is used to access the output port of the high-frequency power supply device; the test device 10 comprises:

[0100] Resistance module 110;

[0101] A capacitor module 120, the capacitor module 120 is connected in parallel with the resistor module 110;

[0102] The control module 130 is connected to the resistance module 110 and the capacitance module 120 respectively; the control module 130 controls the analog impedance of the output port of the resistance module 110 and / or the capacitance module 120 connected to the high-frequency power supply device according to a preset program.

[0103] Specifically, a high-frequency power supply device (e.g., a high-frequency electric knife) can be a device that provides power output for a high-frequency electrosurgical instrument. The high-frequency power supply device can achieve effects such as cutting, coagulation, and drying of tissues through electrothermal conversion, for example, the host of the high-frequency power supply device outputs a high-frequency electrical signal to the instrument of the high-frequency power supply device. The output power of the host of the high-frequency power supply device will directly affect the effect of the instrument of the high-frequency power supply device on the tissue. In order to test the detection and control performance of the high-frequency power supply device, a test device of the high-frequency power supply device (e.g., a power tester) can be used to test and verify the performance of the host of the high-frequency power supply device. The test device 10 of the high-frequency power supply device is used to access the output port of the high-frequency power supply device to verify the performance of the high-frequency power supply device. The test device 10 of the high-frequency power supply device has a built-in resistor module 110 and a capacitor module 120 connected in parallel with each other. The specific definition of the test device 10 in the test system can refer to the definition of the test device 10 above, which will not be repeated here.

[0104] In some examples, such as Figure 8a As shown, the high-frequency power supply device may include a high-frequency power generator, a control unit, a high-speed acquisition unit, a signal processing unit, an output port, and a voltage / current mutual inductance unit, wherein the high-frequency power generator can be connected to a 220V / 100V voltage, and output power through the output port under the control of the control unit, and the output power can act on the tissue; the current and voltage of the output port can be collected through the voltage / current mutual inductance unit, and the collected current and voltage are converted to digital through the signal processing unit, sampled through the high-speed acquisition unit and transmitted to the control unit, and the control unit calculates the calculated impedance of the output port to control the output power of the high-frequency power generator, so that the output power can meet the requirements of the cutting function, coagulation function or drying function for the tissue. Figure 8b As shown, the output port of the high-frequency power supply device can be connected to a test device 10, and the test device is used to simulate actual tissue and provide a simulated impedance of the output port connected to the high-frequency power supply device.

[0105] In one embodiment, Fig. 9 As shown, a testing method is provided, which is applied to the above-mentioned testing system; the method comprises:

[0106] Step 910, when the test device 10 is started, obtain the simulated impedance of the output port of the high-frequency power supply device connected to the control module 130, and the calculated impedance obtained by the high-frequency power supply device according to the detection electrical signal of the output port;

[0107] Step 920, comparing the simulated impedance and the calculated impedance to determine whether the high-frequency power supply device is qualified.

[0108] Specifically, when the test device 10 is started, the simulated impedance of the output port of the high-frequency power supply device connected to the control module 130 can be obtained, wherein the simulated impedance of the output port of the high-frequency power supply device connected to the control module 130 can be determined based on the preset program responded by the control module 130 or the on-off state of each switch in the resistance module 110 and / or the capacitance module 120 controlled by the control module 130. When the test device 10 is started, the detection electrical signal of the output port of the high-frequency power supply device can also be obtained, and then the corresponding calculated impedance can be obtained. The high-frequency power supply device can detect the current and voltage of the output port of the high-frequency power supply device to obtain the calculated impedance of the output port of the high-frequency power supply device and output it. By comparing the simulated impedance and the calculated impedance, it can be determined whether the high-frequency power supply device is qualified. For example, if the deviation of the simulated impedance and the calculated impedance is within the preset range, the high-frequency power supply device can be determined to be qualified; if the deviation of the simulated impedance and the calculated impedance is outside the preset range, the high-frequency power supply device can be determined to be unqualified.

[0109] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0110] Based on the same inventive concept, the embodiment of the present application also provides a test control device for implementing the test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more test control device embodiments provided below can refer to the limitations on the test method above, and will not be repeated here.

[0111] In one embodiment, Fig.10As shown, a test control device is provided, and the method is applied to the above-mentioned test system; the test control device includes:

[0112] The impedance acquisition module 1010 is used to acquire the simulated impedance of the output port of the high-frequency power supply device connected to the control module 130 and the calculated impedance obtained by the high-frequency power supply device according to the detection electrical signal of the output port when the test device 10 is started;

[0113] The impedance comparison module 1020 is used to compare the simulated impedance and the calculated impedance to determine whether the high-frequency power supply device is qualified.

[0114] Each module in the above test control device can be implemented in whole or in part by software, hardware or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0115] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Fig.11 As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a test method is implemented. The display unit of the computer device is used to form a visually visible picture, which can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0116] Those skilled in the art will understand that Fig.11The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0117] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0118] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0119] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A test device for high-frequency power supply equipment, characterized in that: The testing device is used to access the output port of the high-frequency power supply device; the testing device comprises: Resistor module; A capacitor module, the capacitor module is connected in parallel with the resistor module; A control module, wherein the control module is connected to the resistance module and the capacitance module respectively; the control module controls the analog impedance of the output port of the resistance module and / or the capacitance module connected to the high-frequency power supply device according to a preset program.

2. The testing device according to claim 1, characterized in that: The resistor module includes at least one resistor array; the capacitor module includes at least one capacitor array.

3. The testing device according to claim 1, characterized in that: The resistance module includes at least one sliding resistor; the capacitance module includes at least one adjustable capacitor.

4. The testing device according to claim 2, characterized in that: The resistor array includes a plurality of resistor units connected in series, and each of the resistor units includes a plurality of resistors connected in parallel; The capacitor array includes a plurality of capacitor units connected in series, and each of the capacitor units includes a plurality of capacitors connected in parallel.

5. The testing device according to claim 4, characterized in that: The resistance values ​​of the resistors in the same resistor unit in the resistor array are the same, and the resistance values ​​of the resistors in different resistor units in the resistor array are different; The capacitance values ​​of the capacitors in the same capacitor unit in the capacitor array are the same, and the capacitance values ​​of the capacitors in different capacitor units in the capacitor array are different.

6. The testing device according to claim 4, characterized in that: The testing device also includes: A plurality of switches, each of which is respectively arranged on a branch where the resistor is located or a branch where the capacitor is located; The control module is used to control each of the switches respectively to adjust the analog impedance of the output port connected to the high-frequency power supply device.

7. The testing device according to claim 4, characterized in that: The testing device comprises: An output module includes at least one single-pole access port, at least one neutral access port, and at least one double-pole access port.

8. A testing method, characterized in that: The method is applied to the test device of the high-frequency power supply equipment according to any one of claims 1 to 7; the method comprises: Initialize a preset program in response to a user's demand instruction; The analog impedance of the output port of the high-frequency power supply device connected to the resistance module and / or the capacitance module is controlled according to the preset program.

9. A testing system, characterized in that: The system includes a high-frequency power supply device and a testing device for the high-frequency power supply device; The testing device is used to access the output port of the high-frequency power supply device; the testing device comprises: Resistor module; A capacitor module, the capacitor module is connected in parallel with the resistor module; A control module, wherein the control module is connected to the resistance module and the capacitance module respectively; the control module controls the analog impedance of the output port of the resistance module and / or the capacitance module connected to the high-frequency power supply device according to a preset program.

10. A testing method, characterized in that: The method is applied to the test system according to claim 9; the method comprises: When the test device is started, obtaining the simulated impedance of the output port of the high-frequency power supply device connected to the control module, and the calculated impedance obtained by the high-frequency power supply device according to the detection electrical signal of the output port; The simulated impedance and the calculated impedance are compared to determine whether the high-frequency power supply device is qualified.

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