Single-particle latch-up effect test system for Chiplet architecture microsystem

Abstract

The invention provides a single-particle latch-up effect test system for a Chiplet architecture microsystem, and a Chiplet microsystem test board card is used for the single-particle latch-up test of the Chiplet microsystem, and is composed of a peripheral power supply circuit, a storage circuit, a communication circuit and the like required by the microsystem. The multi-path adjustable power supply module is used for supplying power to the Chiplet microsystem test board card and transmitting the current and voltage of the microsystem to the remote control monitoring module; the remote control monitoring module receives a microsystem test result sent by the Chiplet microsystem test board card and Chiplet microsystem current and voltage information fed back by the multi-path adjustable power supply module, gives an alarm when the Chiplet microsystem current exceeds a set threshold value, and records the Chiplet microsystem current and voltage changes in the test process. Aiming at the characteristic that the existing Chiplet microsystem single event latch test needs too many types of current networks, the difficulty that the distance between a test microsystem board card and a tester is too long is overcome, and the operability of the tester on the test is effectively improved.

Description

Technical Field

[0001] The invention relates to a single-particle latch effect test system for a chiplet architecture microsystem, and belongs to the field of microsystem irradiation test. Background Art

[0002] With the rapid development of my country's aerospace technology, domestic aerospace equipment represented by satellites and space stations are developing in the direction of high integration, multi-function and low power consumption. Therefore, the new generation of aerospace engineering and weapons and equipment urgently need to have radiation-resistant high-performance information processing microsystem products, and urgently need to solve the technical bottlenecks such as the measurability and evaluation of the radiation capability of such products. In aerospace applications, when high-energy ions in space are incident on integrated circuits, if the energy deposited in the incident path is sufficient to cause the performance of the integrated circuit to degrade or even lose its function, a single-particle effect occurs, among which the single-particle latch effect has the greatest impact on integrated circuits.

[0003] For on-orbit applications, simulating the single-particle effect evaluation in the space environment is crucial for microsystems. Existing test systems are all for monolithic circuits and cannot meet the needs of microsystem single-particle effect latch-up tests. Therefore, for the above microsystem single-particle effect test needs, it is necessary to solve the problems of cumbersome configuration, large number of power supplies, complex control, and difficult monitoring. Existing single-particle latch-up effect test systems are mostly single-chip design solutions. Compared with the single-particle latch-up effect test systems required by microsystem products, they have simple functions, can provide fewer power supplies, and are more complex to control. Therefore, it is necessary to propose a single-particle latch-up effect test system for chiplet architecture microsystems that is comprehensive in functions, simple in control, can be remotely controlled, and has high real-time monitoring. Summary of the invention

[0004] The technical problem solved by the present invention is: the present invention provides a single-particle latch effect test system for a chiplet architecture microsystem, which is used to overcome the defects of the existing single-particle latch effect test system, such as simple function, less power supply, and complex control.

[0005] The above-mentioned object of the present invention is mainly achieved through the following technical solutions: a single-particle latch effect test system for a chiplet architecture microsystem, comprising a chiplet microsystem test board, a multi-channel adjustable power supply module, and a remote control monitoring module; during the test, the chiplet microsystem test board is placed in an irradiation room to be irradiated with heavy ions;

[0006] Chiplet microsystem test board, including chiplet microsystem, power module and communication module;

[0007] The chiplet microsystem is the object of the single-particle latch test. The maximum bias is selected for power supply. Under heavy ion irradiation, the single-particle latch test is performed: the current is monitored in real time. If the working current of the device suddenly exceeds 1.5 times the normal working current, it is judged as current abnormality. At this time, observe whether the working state of the circuit is normal and whether the current can be automatically reduced. If the circuit current can return to normal, it is judged that no single-particle latch effect occurs, and the current is returned to real-time monitoring. Otherwise, it is judged that a single-particle latch effect occurs, and the locking current at this time is recorded; when it reaches 1×10 7 Particles / cm 2 After the injection amount is reached, the irradiation is stopped and the irradiation test is ended; the power module is used to stabilize the voltage and supply power to each power network of the chiplet microsystem; the communication module is used to communicate data with the remote control monitoring module to realize the chiplet microsystem monitoring function;

[0008] Multi-channel adjustable power supply module, including power supply unit group and information flow control module;

[0009] The power supply unit group consists of multiple adjustable programmable power supplies, which are used to power the chiplet microsystem test board. The information flow control module consists of a multi-channel Ethernet switch. The adjustable programmable power supply is connected to the information flow control module to aggregate the information of multiple adjustable programmable power supplies and send it to the remote control monitoring module in sequence.

[0010] Remote control monitoring module, including control module, monitoring module, alarm module and recording module;

[0011] The control module is used to control the multi-channel adjustable power supply module. The monitoring module is used to receive the chiplet microsystem test results sent by the chiplet microsystem test board communication module and the chiplet microsystem current and voltage information fed back by the information flow control module. The alarm module is responsible for alarming when the chiplet microsystem current exceeds the set threshold. The recording module is responsible for recording the chiplet microsystem current and voltage change data during the test.

[0012] Furthermore, when designing the hardware of the chiplet microsystem test board, it is ensured that the chiplet microsystem is located in the irradiation area, and other parts of the board are not in the irradiation area.

[0013] Furthermore, the communication module of the chiplet microsystem test board communicates with the remote control monitoring module through the RS485 serial port, and sends the microsystem test result to the monitoring module to monitor the chiplet microsystem operation status in real time.

[0014] Furthermore, the power supply unit group is composed of three four-way adjustable programmable DC power supplies, and data communication between the DC power supply and other devices is carried out through the LAN port.

[0015] Furthermore, the information flow control module is an eight-way Ethernet switch, which is placed in the irradiation room together with the adjustable programmable power supply, providing full-duplex network port communication with a rate of not less than 20Mbps, and providing a specific MAC address for each connected adjustable programmable power supply for control and monitoring by the remote control monitoring module.

[0016] Furthermore, the control module sends instructions to the adjustable programmable power supply to configure the power supply voltage, current, and current range required by the chiplet microsystem, and remotely controls the channel switch of the adjustable programmable power supply by sending instructions.

[0017] Furthermore, the instruction content includes an identification code, a control instruction code, and a check code. The identification code and the check code are used to confirm whether the control object selection is correct and whether the communication is correctly connected. The control instruction code is sent through the LAN port in the form of a character string to achieve real-time control of multiple adjustable programmable power supplies.

[0018] Furthermore, the monitoring module implements monitoring by sending corresponding instructions through the computer LAN port every second to request the adjustable programmable power supply to return the monitored chiplet microsystem current and voltage, and processes the returned data through the computer, converting the string current and voltage data into decimal data, and transmitting them to the alarm module to verify whether the single-particle latch effect occurs, and at the same time displaying the current and voltage data in real time through a chart.

[0019] Furthermore, the recording module records the chiplet microsystem test results received by the monitoring module from the chiplet microsystem test board and the chiplet microsystem current and voltage data from the multi-channel adjustable power supply module as a text file, so as to facilitate data analysis after the test.

[0020] The advantages of the present invention compared with the prior art are:

[0021] (1) In the single-particle latch effect test system for chiplet architecture microsystem provided by the present invention, the multi-channel adjustable power supply module can be remotely controlled by the remote control monitoring module by adopting the instruction control method, and different power supply units are controlled by sending different instructions. The instructions are in the form of identification code + control instruction + check code. The advantage of this is that it solves the complexity of manual configuration caused by too many power supplies, which is convenient for test personnel to control and to build the test system at the test site. This remote control method reduces the time for setting up the test site, reduces the influence of human factors through software automation, and increases the accuracy of test data;

[0022] (2) In the single-particle latch effect test system for chiplet architecture microsystem provided by the present invention, the remote control monitoring module can receive the microsystem test program running result sent by the chiplet microsystem, process the test data after receiving the running result, display the test results of each unit inside the microsystem in software, monitor the working state of the chiplet microsystem in real time, and receive the chiplet microsystem current and voltage data sent by the multi-channel adjustable power supply module, integrate the data in the software display, convert the string current and voltage data into decimal data through data conversion, and display it in real time through charts, which is convenient for observation during the test;

[0023] (3) The single-particle latch effect test system for chiplet architecture microsystems provided by the present invention adopts a remote control monitoring method to complete the collection and display of various test data. Compared with the traditional single-chip single-particle latch effect test system, it has more complete functions and higher efficiency, and provides a feasible solution for single-particle latch test of complex microsystem circuits, solving the technical bottleneck of single-particle latch test of microsystem products. At the same time, by changing the number of power supply units and the configuration of remote monitoring control modules, it can meet the test data monitoring needs of single-particle latch test of other microsystem products, and has the characteristics of universality and comprehensiveness. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 A specific structural diagram of the single-particle latch-up effect test system for chiplet architecture microsystems of the present invention;

[0025] Figure 2 The schematic diagram of the structure of the single-particle latch-up effect test system for chiplet architecture microsystem of the present invention. DETAILED DESCRIPTION

[0026] The present invention provides a single-particle latch effect test system for chiplet architecture microsystems. Figure 1 , Figure 2 As shown, it includes: Chiplet microsystem test board, multi-channel adjustable power supply module, remote control monitoring module;

[0027] Among them, the chiplet microsystem test board includes a chiplet microsystem, a power module and a communication module; the chiplet microsystem is the single-particle latch test object, the power supply selects the maximum bias, and the single-particle latch test is performed under heavy ion irradiation: the current is monitored in real time. If the working current of the device suddenly exceeds 1.5 times the normal working current, it is judged as current abnormality. At this time, observe whether the working state of the circuit is normal and whether the current can be automatically reduced. If the circuit current can return to normal, it is judged that the single-particle latch effect has not occurred, and the current is returned to real-time monitoring. Otherwise, it is judged that the single-particle latch effect has occurred, and the locking current at this time is recorded; when it reaches 1×10 7 Particles / cm 2 After the injection amount is reached, the irradiation is stopped and the irradiation test is ended. The power module is used to stabilize the voltage and supply power to each power network of the chiplet microsystem; the communication module is used to communicate data with the remote control monitoring module to realize the chiplet microsystem monitoring function.

[0028] The chiplet microsystem test board also includes a JTAG configuration module and a storage module; the JTAG configuration module is used to configure the chiplet test program before the test; the storage module is used to store typical application programs of the chiplet microsystem as test programs.

[0029] The multi-channel adjustable power supply module includes a power supply unit group and an information flow control module. The chiplet microsystem is characterized by a large number of pins and up to 14 power supply networks. Therefore, the power supply unit group is composed of multiple adjustable programmable power supplies to power the chiplet microsystem test board. The information flow control module is composed of a multi-channel Ethernet switch. The adjustable programmable power supply is connected to the information flow control module to aggregate the information of multiple adjustable programmable power supplies and send them to the remote control monitoring module in sequence.

[0030] The remote control monitoring module includes a control module, a monitoring module, an alarm module and a recording module, all of which are implemented through computer software. The control module is used to control the multi-channel adjustable power supply module. The monitoring module is used to receive the chiplet microsystem test results sent by the chiplet microsystem test board communication module and the chiplet microsystem current and voltage information fed back by the information flow control module. The alarm module is responsible for alarming the test personnel when the chiplet microsystem current exceeds the set threshold, so as to take timely action to avoid burning the test board. The recording module is responsible for recording data such as the chiplet microsystem current and voltage changes during the test.

[0031] In the single-particle latch effect test system for a chiplet architecture microsystem provided by the present invention, a chiplet microsystem test board is mainly responsible for storing typical chiplet microsystem applications as test programs, configuring chiplet test programs before a test, and performing data communication with a remote control communication module for voltage stabilization and power supply of each power supply network of the chiplet microsystem; a multi-channel adjustable power supply module is mainly composed of an adjustable programmable power supply, which is used to power a chiplet microsystem test board, and is connected to an information flow control module to collect information of multiple programmable power supplies and send them to a remote control monitoring module in sequence; the remote control monitoring module controls the multi-channel adjustable power supply module, receives chiplet microsystem test results sent by the chiplet microsystem test board, and receives chiplet microsystem current and voltage information fed back by the multi-channel adjustable power supply module, and alarms a tester when the chiplet microsystem current exceeds a threshold value, so as to timely operate to avoid burning the test board, and record the current and voltage changes of the chiplet microsystem during the test.

[0032] When designing the hardware of the chiplet microsystem test board, the chiplet microsystem should be far away from other chips and circuits on the board, and try to ensure that the chiplet microsystem is in the irradiation area during the test, and other parts of the board are not in the irradiation area; the communication module on the chiplet microsystem test board communicates with the remote control monitoring module through the RS485 serial port, and sends the microsystem test results to the monitoring module to monitor the running status of the chiplet microsystem in real time.

[0033] In the multi-channel adjustable power supply module, the power supply unit group is composed of three four-channel adjustable programmable DC power supplies, which can communicate data between the DC power supply and other devices through the LAN port.

[0034] The information flow control module is an 8-way Ethernet switch, which is placed in the irradiation room together with the adjustable programmable power supply, and is about 50 meters away from the remote control monitoring module. It can provide full-duplex network port communication with a rate of not less than 20Mbps, and provide a specific MAC address for each access device (adjustable programmable power supply) so that the remote control monitoring module can control and monitor. The information flow control module is mainly implemented to provide data screening and integration for the main current and voltage of specific units in the chiplet microsystem. Because the power supply network of the chiplet microsystem is complex and the data processed by the programmable power supply per unit time is limited, the information flow control module is required to classify the 14 current networks according to the unit current networks in the chiplet microsystem, such as main control, peripherals, etc., and give priority to sending the main control current, which is more conducive to the experiment and the observation of the experimenter.

[0035] The control module sends corresponding instructions to the adjustable programmable power supply to configure the power supply voltage, current, current range, etc. required by the chiplet microsystem, and can remotely control the channel switch of the adjustable programmable power supply by sending corresponding instructions. The corresponding instruction content includes an identification code, a control instruction code, and a check code. The identification code and the check code are used to confirm whether the control object selection is correct and whether the communication is correctly connected. The control instruction code is sent through the LAN port in the form of a string to realize real-time control of multiple adjustable programmable power supplies;

[0036] The monitoring module implements monitoring by sending corresponding instructions through the computer LAN port every second to request the adjustable programmable power supply to return the monitored chiplet microsystem current and voltage, and processes the returned data through the computer, converting the string current and voltage data into decimal data, and transmitting them to the alarm module to verify whether the single-particle latch effect occurs, and at the same time, the current and voltage data are displayed in real time through charts on the display interface.

[0037] The recording module records the chiplet microsystem test results sent by the chiplet microsystem test board and the chiplet microsystem current and voltage data sent by the multi-channel adjustable power supply module received by the monitoring module into a txt text file for data analysis after the test.

[0038] In addition, the alarm module compares the real-time current value of the chiplet microsystem with the threshold set before the test, and reminds the test personnel through the display light and sound through the software interface, so that the test personnel can determine the situation and cut off the power in the first time to avoid irreversible damage to the chiplet microsystem test board.

[0039] The single-particle latch-up effect test system for chiplet architecture microsystem provided by the present invention can not only monitor the program running status, current and voltage of the chiplet microsystem in real time through the remote control monitoring module, but also store the monitored data in real time into a local file through the recording module, which is beneficial to the later test result analysis.

[0040] like Figure 1 As shown, the remote control monitoring module includes a control module, an alarm module, a monitoring module and a recording module. The control module and the monitoring module communicate data and instructions with the chiplet microsystem and the multi-way power supply unit group to make the chiplet microsystem work in the test program. According to the single-particle latch effect mechanism, after the ion irradiation starts, the test program results and current changes are monitored. If the current exceeds the threshold, it is determined that the single-particle latch effect has occurred. If the received injection reaches the specified value and the single-particle latch effect does not occur, it is determined that the single-particle latch threshold of the test chiplet microsystem is greater than or equal to the ion LET value.

[0041] Parts of the present invention that are not described in detail belong to the well-known technology for those skilled in the art.

Claims

1. A single-particle latch effect test system for chiplet architecture microsystems, characterized in that: It includes a chiplet microsystem test board, a multi-channel adjustable power supply module, and a remote control monitoring module. During the test, the chiplet microsystem test board is placed in the irradiation room and exposed to heavy ions. Chiplet microsystem test board, including chiplet microsystem, power module and communication module; The chiplet microsystem is the object of the single-particle latch test. The maximum bias is selected for power supply. Under heavy ion irradiation, the single-particle latch test is performed: the current is monitored in real time. If the working current of the device suddenly exceeds 1.5 times the normal working current, it is judged as current abnormality. At this time, observe whether the working state of the circuit is normal and whether the current can be automatically reduced. If the circuit current can return to normal, it is judged that no single-particle latch effect occurs, and the current is returned to real-time monitoring. Otherwise, it is judged that a single-particle latch effect occurs, and the locking current at this time is recorded; when it reaches 1×10 7 Particles / cm 2 After the injection amount is reached, the irradiation is stopped and the irradiation test is ended; the power module is used to stabilize the voltage and supply power to each power network of the chiplet microsystem; the communication module is used to communicate data with the remote control monitoring module to realize the chiplet microsystem monitoring function; Multi-channel adjustable power supply module, including power supply unit group and information flow control module; The power supply unit group consists of multiple adjustable programmable power supplies, which are used to power the chiplet microsystem test board; The information flow control module is composed of a multi-channel Ethernet switch. The adjustable programmable power supply is connected to the information flow control module to collect information of multiple adjustable programmable power supplies and send them to the remote control monitoring module in sequence. Remote control monitoring module, including control module, monitoring module, alarm module and recording module; The control module is used to control the multi-channel adjustable power supply module. The monitoring module is used to receive the chiplet microsystem test results sent by the chiplet microsystem test board communication module and the chiplet microsystem current and voltage information fed back by the information flow control module. The alarm module is responsible for alarming when the chiplet microsystem current exceeds the set threshold. The recording module is responsible for recording the chiplet microsystem current and voltage change data during the test.

2. According to claim 1, a single-particle latch-up effect test system for chiplet architecture microsystems is characterized in that: When designing the hardware of the chiplet microsystem test board, it is ensured that the chiplet microsystem is located in the irradiation area, and other parts of the board are not in the irradiation area.

3. According to the single-particle latch effect test system for chiplet architecture microsystems according to claim 1, it is characterized in that: The communication module of the chiplet microsystem test board communicates with the remote control monitoring module through the RS485 serial port, and sends the microsystem test results to the monitoring module to monitor the chiplet microsystem operating status in real time.

4. According to the single-particle latch effect test system for chiplet architecture microsystems according to claim 1, it is characterized in that: The power supply unit group is composed of three four-way adjustable programmable DC power supplies, and data communication between the DC power supply and other devices is carried out through the LAN port.

5. A single-particle latch-up effect test system for chiplet architecture microsystems according to claim 1, characterized in that: The information flow control module is an eight-way Ethernet switch, which is placed in the irradiation room together with the adjustable programmable power supply, providing full-duplex network port communication with a rate of not less than 20Mbps, and providing a specific MAC address for each connected adjustable programmable power supply for control and monitoring by the remote control monitoring module.

6. A single-particle latch-up effect test system for chiplet architecture microsystems according to claim 1, characterized in that: The control module sends instructions to the adjustable programmable power supply to configure the power supply voltage, current, and current range required by the chiplet microsystem, and remotely controls the channel switch of the adjustable programmable power supply by sending instructions.

7. A single-particle latch-up effect test system for chiplet architecture microsystems according to claim 6, characterized in that: The instruction content includes an identification code, a control instruction code, and a check code. The identification code and the check code are used to confirm whether the control object selection is correct and whether the communication is correctly connected. The control instruction code is sent through the LAN port in the form of a character string to achieve real-time control of multiple adjustable programmable power supplies.

8. A single-particle latch-up effect test system for chiplet architecture microsystems according to claim 1, characterized in that: The monitoring module implements monitoring by sending corresponding instructions through the computer LAN port every second to request the adjustable programmable power supply to return the monitored chiplet microsystem current and voltage, and processes the returned data through the computer, converting the string current and voltage data into decimal data, and transmitting them to the alarm module to verify whether the single-particle latch effect occurs, and at the same time displaying the current and voltage data in real time through charts.

9. A single-particle latch-up effect test system for chiplet architecture microsystems according to claim 1, characterized in that: The recording module records the chiplet microsystem test results received by the monitoring module from the chiplet microsystem test board and the chiplet microsystem current and voltage data from the multi-channel adjustable power supply module as a text file for data analysis after the test.

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