Method and device for determining calibration point of PT100 temperature measurement equipment, storage medium and processor

Abstract

The embodiment of the invention provides a method and device for determining a calibration point of PT100 temperature measurement equipment, a storage medium and a processor, and belongs to the technical field of electrics. The method for determining the calibration point of the PT100 temperature measurement equipment comprises the following steps: firstly, determining a group of calibration temperature values and a first corresponding relation between Vo and Rpt determined according to a circuit principle of the PT100 temperature measurement equipment, and correcting the first corresponding relation by calibrating measured values of resistance and voltage difference of two end points in the group of calibration temperature values; therefore, errors between component products such as resistors in the temperature measurement circuit and design parameters are reduced to the greatest extent, and finally, the resistance values of the PT100 temperature measurement equipment corresponding to the T10, T20 and multiple calibration temperature values are calibrated based on the corrected first corresponding relation. Therefore, when the temperature value in the equipment or the environment is monitored through the temperature measuring equipment, the accurate resistance value is obtained based on the monitored voltage difference value, and then the accurate temperature value is obtained according to the accurate resistance value.

Description

Technical Field

[0001] The present invention relates to the field of electrical technology, and in particular to a method, a device, a storage medium and a processor for determining a calibration point of a PT100 temperature measuring device. Background Art

[0002] In the prior art, the PT100 temperature measuring device is calibrated by simulating different ambient temperatures through external devices, collecting and reading the resistance values ​​of the temperature measuring components in the PT100 temperature measuring device, and then recording and saving them in a storage device. Since the ambient temperature cannot change rapidly, continuous calibration is impossible, and only a small number of discrete temperature calibration points and the resistance values ​​corresponding to the temperature measuring components can be recorded in the temperature-resistance calibration record table. When the temperature value of the device or environment is monitored by the temperature measuring device, the voltage or current monitoring value in the PT100 temperature measuring device is first obtained to infer the resistance value of the temperature measuring component, and then the temperature-resistance calibration record table recorded in the storage device is queried to find the two resistance calibration points and the corresponding temperature values ​​that are close to the resistance value, and the actual temperature of the device or environment is inferred by linear interpolation.

[0003] However, due to the errors in the design parameters of components such as resistors in the temperature measurement circuit, the actual temperature of the device or environment calculated by linear interpolation will have a large error.

[0004] The inventors of this application discovered during the process of implementing the present invention that the above technical problems have not yet been solved. Summary of the invention

[0005] The purpose of the embodiment of the present invention is to provide a method, which can reduce the temperature measurement deviation caused by errors of components such as resistors in a PT100 temperature measurement device.

[0006] In order to achieve the above object, an embodiment of the present invention provides a method for determining a calibration point of a PT100 temperature measuring device. The PT100 temperature measuring device uses a voltage difference Vo of a resistance bridge including a PT100 temperature measuring component to feed back a resistance value Rpt of the PT100 temperature measuring component. The method for determining a calibration point of the PT100 temperature measuring device includes:

[0007] Determine the temperature measurement range of the PT100 temperature measuring device, which is a continuous interval from the lowest measurement temperature T1 to the highest measurement temperature T2, and determine a first calibration temperature value T1_0 and a second calibration temperature value T2_0 between T1 and T2, as well as multiple calibration temperature values ​​between T1_0 and T2_0;

[0008] According to the circuit principle of the PT100 temperature measuring device, the first corresponding relationship between Vo and Rpt is determined;

[0009] Based on the voltage differences Vo_1 and Vo_2 measured at T1_0 and T2_0 and the corresponding resistance values ​​Rpt_1 and Rpt_2 of the PT100 temperature measuring component measured, the first corresponding relationship is corrected; and

[0010] The resistance values ​​and / or voltage differences of the PT100 temperature measuring device corresponding to T1_0, T2_0 and a plurality of calibration temperature values ​​are calibrated based on the corrected first corresponding relationship.

[0011] Optionally, the multiple calibration temperature values ​​are calibration temperature values ​​selected at equal distances between T1_0 and T2_0.

[0012] Optionally, T1_0 and T2_0 are endpoint values ​​of a temperature measurement interval in which a temperature measurement curve of the PT100 temperature measurement component conforms to a linear relationship.

[0013] Optionally, T1_0=0.2*T2+0.8*T1, T2_0=0.8*T2+0.2*T1.

[0014] Optionally, the first corrected correspondence is: Vo=k 1 Rpt+k 2 , where k 1 , k 2 The first corresponding relationship after correction is: Vo = k 1 Rpt+k 2 , where k 1 , k 2 It is a constant corrected according to the voltage difference measured at T1_0 and T2_0 and the resistance value of the PT100 temperature measuring component.

[0015] On the other hand, an embodiment of the present invention provides a device for determining a calibration point of a PT100 temperature measuring device. The PT100 temperature measuring device uses a voltage difference Vo of a resistance bridge including a PT100 temperature measuring component to feed back a resistance value Rpt of the PT100 temperature measuring component. The device for determining a calibration point of the PT100 temperature measuring device includes: a temperature measurement calibration point determination module, a first corresponding relationship determination module, and a calibration module.

[0016] The temperature measurement calibration point determination module is configured to: determine the temperature measurement range of the PT100 temperature measurement device, which is a continuous interval from the lowest measurement temperature T1 to the highest measurement temperature T2, and determine the first calibration temperature value T1_0 and the second calibration temperature value T2_0 between T1 and T2, as well as multiple calibration temperature values ​​between T1_0 and T2_0;

[0017] The first correspondence determination module is configured to: determine the first correspondence between Vo and Rpt according to the circuit principle of the PT100 temperature measuring device, and correct the first correspondence based on the voltage differences Vo_1 and Vo_2 measured at T1_0 and T2_0 and the corresponding resistance values ​​Rpt_1 and Rpt_2 of the PT100 temperature measuring components;

[0018] The calibration module is configured to: calibrate the resistance and / or voltage difference of the PT100 temperature measuring device corresponding to T1_0, T2_0 and multiple calibration temperature values ​​respectively based on the corrected first corresponding relationship.

[0019] Furthermore, the temperature measurement calibration point determination module is also configured as follows:

[0020] The plurality of calibration temperature values ​​are calibration temperature values ​​selected at equal distances between T1_0 and T2_0; and / or

[0021] T1_0 and T2_0 are the endpoint values ​​of the temperature measurement range where the temperature measurement curve of the PT100 temperature measurement component conforms to a linear relationship.

[0022] Furthermore, the temperature measurement calibration point determination module is also configured as: T1_0=0.2*T2+0.8*T1, T20=0.8*T2+0.2*T1.

[0023] On the other hand, an embodiment of the present invention provides a machine-readable storage medium, on which instructions are stored, and the instructions are used to enable a machine to execute the method for determining the calibration point of a PT100 temperature measuring device of the present application.

[0024] On the other hand, an embodiment of the present invention provides a processor for running a program, wherein the program, when being run, is used to execute the method for determining the calibration point of a PT100 temperature measuring device of the present application.

[0025] Through the above technical solution, the PT100 temperature measuring device uses the voltage difference Vo of the resistance bridge including the PT100 temperature measuring component to feedback the resistance Rpt of the PT100 temperature measuring component, first determine a set of calibration temperature values ​​and the first correspondence between Vo and Rpt determined according to the circuit principle of the PT100 temperature measuring device, and correct the first correspondence by the measured values ​​of the resistance and voltage difference of the two ends of the calibration temperature value, thereby minimizing the error existing in the components and design parameters such as the resistor in the temperature measuring circuit, and finally calibrating the resistance and / or voltage difference of the PT100 temperature measuring device at T1_0, T2_0 and multiple calibration temperature values ​​based on the corrected first correspondence. Therefore, when the temperature value in the device or environment is monitored by the temperature measuring device, the accurate resistance value is obtained based on the monitored voltage difference, and then the accurate temperature value is obtained according to the accurate resistance value.

[0026] Other features and advantages of the embodiments of the present invention will be described in detail in the subsequent detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The accompanying drawings are used to provide a further understanding of the embodiments of the present invention and constitute a part of the specification. Together with the following specific implementations, they are used to explain the embodiments of the present invention, but do not constitute a limitation on the embodiments of the present invention. In the accompanying drawings:

[0028] Figure 1 It is a flow chart of an embodiment of a method for determining a calibration point of a PT100 temperature measuring device of the present invention;

[0029] Figure 2 yes Figure 1 A schematic diagram of a circuit of a PT100 temperature measuring device used in the embodiment;

[0030] Figure 3 It is a composition structure diagram of an embodiment of a device for determining a calibration point of a PT100 temperature measuring device according to the present invention. DETAILED DESCRIPTION

[0031] The specific implementation of the embodiment of the present invention is described in detail below in conjunction with the accompanying drawings. It should be understood that the specific implementation described here is only used to illustrate and explain the embodiment of the present invention, and is not used to limit the embodiment of the present invention.

[0032] The embodiment of the present invention provides a method for determining the calibration point of a PT100 temperature measuring device, wherein the PT100 temperature measuring device uses a voltage difference Vo of a resistance bridge including a PT100 temperature measuring component to feed back the resistance value Rpt of the PT100 temperature measuring component. The circuit diagram of the PT100 temperature measuring device is as shown in FIG. Figure 2 As shown, the implementation process of the method for determining the calibration point of the PT100 temperature measuring equipment is as follows Figure 1 As shown, including:

[0033] Step 1: Determine the temperature measurement range of the PT100 temperature measuring device, which is a continuous interval from the lowest measurement temperature T1 to the highest measurement temperature T2, and determine the first calibration temperature value T1_0 and the second calibration temperature value T2_0 between T1 and T2, as well as multiple calibration temperature values ​​between T1_0 and T2_0;

[0034] Step 2: According to the circuit principle of the PT100 temperature measuring device, determine the first corresponding relationship between Vo and Rpt;

[0035] Step 3: Based on the voltage differences Vo_1 and Vo_2 measured at T1_0 and T2_0 and the corresponding resistance values ​​Rpt_1 and Rpt_2 of the PT100 temperature measuring component measured, the first corresponding relationship is corrected;

[0036] Step 4: Based on the corrected first corresponding relationship, calibrate the resistance and / or voltage difference of the PT100 temperature measuring device corresponding to T1_0, T2_0 and multiple calibration temperature values.

[0037] Specifically, in step 1, the temperature measurement ranges T1 and T2 of the PT100 temperature measuring device are determined according to the temperature range of the use environment of the temperature measuring device. The first calibration temperature value T1_0 and the second calibration temperature value T2_0 can be the endpoint temperature values ​​of the continuous interval that makes the temperature-resistance calibration curve conform to the linear relationship, or typical temperature values ​​selected based on experience. In this embodiment, in order to avoid the problem of serious drift in the low temperature zone and the high temperature zone, T1_0 and T2_0 are selected as the endpoint temperature values ​​of the continuous interval that makes the temperature-resistance calibration curve conform to the linear relationship, where T1_0 = (T2-T1)*0.2+T1 = 0.2*T2+0.8*T1, T2_0 = (T2-T1)*0.8+T1 = 0.8*T2+0.2*T1.

[0038] In some embodiments, the plurality of nominal temperature values ​​are nominal temperature values ​​selected equidistantly between T1_0 and T2_0.

[0039] In the present application, the PT100 temperature measuring device uses the voltage difference Vo of the resistance bridge including the PT100 temperature measuring component to feedback the resistance value Rpt of the PT100 temperature measuring component. The circuit diagram of the PT100 temperature measuring device is as follows: Figure 2 As shown. The given reference voltage Vref is 3.6V, which is loaded to one diagonal of the bridge. The other diagonal of the bridge outputs the voltage difference Vo of the two arms. The voltage of the resistance Rpt of the PT100 temperature measuring component in the bridge changes with the ambient temperature, so the output voltage difference Vo also changes accordingly. When designing the temperature measuring device, a large number of data experiments need to be done to verify the corresponding relationship between the output voltage Vo and the PT100 resistance Rpt, and between the PT100 resistance Rpt and the ambient temperature. When generating the temperature measuring device, considering the errors caused by the components in the product, it is necessary to calibrate each generated temperature measuring device, and save the calibrated temperature-resistance table, or temperature-voltage difference table, or temperature-resistance-voltage difference table to the storage device. When using the temperature measuring device to monitor the ambient temperature, the temperature-voltage difference table or temperature-resistance table is checked according to the monitored voltage difference or resistance, and the current monitored temperature is directly obtained or linearly interpolated.

[0040] Specifically, according to Figure 2 The circuit principle of the circuit, deriving V o The first correspondence with Rpt is as follows:

[0041]

[0042] In the formula, R1-R6 are Figure 2 The corresponding resistor values ​​in Z6 and Z7 are Figure 2 The impedance of the corresponding filter circuit in the complex frequency domain, s is the complex frequency domain parameter, C 1 , C 2 for Figure 2 The capacitance value of the corresponding capacitor in .

[0043] Simplifying the above formula (1), the complex resistance relationship can be simplified and recorded as:

[0044]

[0045] In the formula, F 1 -F 7 All of these are to simplify the above expressions, specifically expressed as:

[0046] F 1 =R 1 R 4 R pt +R 2 R 4 R pt +R 1 R 2 R pt ,

[0047] F 2 =R 1 R pt +R 2 R pt ,

[0048] F 3 =R 1 R 3 R pt +R 1 R 5 R pt +R 1 R 3 R 5 ,

[0049] F 4 =R 1 R pt +R 1 R 3 ,

[0050] F 5 =R 1 R 4 +R 2 R 4 +R 1 R 2 ,

[0051] F 6 =R3 R pt +R 5 R pt +R 3 R 5 ,

[0052] F 7 =R 3 +R pt ,

[0053] Substituting equations (2) and (3) into the simplified equation (4), we can derive the following equation:

[0054] (5)

[0056] According to the above formula (5), the output voltage V o The corresponding relationship between the resistance Rpt of PT100 is the first corresponding relationship in step 2. It can be seen that the corresponding relationship is not a linear relationship. The resistance-voltage difference table of the PT100 temperature measuring component calculated based on formula (5) is shown in Table 1 below.

[0057]

[0058]

[0059]

[0060] Further, the relationship between the factory-set temperature and resistance value of the PT100 temperature measuring component in this embodiment is shown in Table 2 below:

[0061]

[0062]

[0063]

[0064]

[0065]

[0066]

[0067] According to Table 1 and Table 2 above, the theoretical output voltage difference V of the temperature measuring device o The relationship with PT100 resistance Rpt is as follows:

[0068] V o = 0.0107716Rpt + 2.80572 (6)

[0069] That is, equation (6) is obtained in step 2 according to the circuit principle of the temperature measuring device, and the output voltage difference V o The first correspondence with the PT100 resistance Rpt.

[0070] In step 3, the voltage difference Vo and Rpt at the two temperature calibration points T1_0 and T2_0 selected in step 1 are actually monitored for each temperature measuring device produced, and the first corresponding relationship is corrected based on the measured values ​​of Vo and Rpt at the two temperature calibration points. The corrected first corresponding relationship is recorded as: Vo = k 1 Rpt+k 2 , where k 1 , k 2 It is a constant corrected according to the voltage difference measured at T1_0 and T2_0 and the resistance value of the PT100 temperature measuring component.

[0071] In step 4, based on the corrected first correspondence: Vo=k 1 Rpt+k 2 , calibrate the resistance and / or voltage difference of the PT100 temperature measuring device at T1_0, T2_0 and multiple calibration temperature values. That is, there is no need to change the ambient temperature to make it conform to T1_0, T2_0 and multiple calibration temperature values, and calibrate the measured value of the resistance and / or voltage difference at each temperature calibration point, but directly according to Vo=k 1 Rpt+k 2 Calibrate the resistance and / or voltage difference of the temperature measuring equipment at different temperature measurement calibration points.

[0072] Compared with the prior art, the technical advantages of this embodiment are:

[0073] (1) First determine a set of calibration temperature values ​​and the first correspondence between Vo and Rpt determined according to the circuit principle of the PT100 temperature measuring device, and correct the first correspondence based on the measured values ​​of the resistance and voltage difference of the two end points in the calibration set of temperature values, thereby minimizing the errors existing in the components and design parameters such as the resistors in the temperature measuring circuit, and finally calibrate the resistance and / or voltage difference of the PT100 temperature measuring device at T1_0, T2_0 and multiple calibration temperature values ​​based on the corrected first correspondence. Therefore, when the temperature value of the device or environment is monitored by the temperature measuring device, the accurate resistance value is obtained based on the monitored voltage difference, and then the accurate temperature value is obtained based on the accurate resistance value.

[0074] (2) Select two temperature measurement calibration points to calibrate the designed temperature voltage formula. There is no need to save a large number of calibration data tables, avoiding calibration in low and high temperature areas with severe drift. It can cover 60% of the working range and achieve maximum fitting within the working temperature range.

[0075] The embodiment of the present invention provides a device for determining the calibration point of a PT100 temperature measuring device, and its composition structure is as follows: Figure 3 As shown, it includes: a temperature measurement calibration point determination module, a first corresponding relationship determination module and a calibration module,

[0076] The temperature measurement calibration point determination module is configured to: determine the temperature measurement range of the PT100 temperature measurement device, which is a continuous interval from the lowest measurement temperature T1 to the highest measurement temperature T2, and determine the first calibration temperature value T1_0 and the second calibration temperature value T2_0 between T1 and T2, as well as multiple calibration temperature values ​​between T1_0 and T2_0;

[0077] The first correspondence determination module is configured to: determine the first correspondence between Vo and Rpt according to the circuit principle of the PT100 temperature measuring device, and correct the first correspondence based on the voltage differences Vo_1 and Vo_2 measured at T1_0 and T2_0 and the corresponding resistance values ​​Rpt_1 and Rpt_2 of the PT100 temperature measuring components;

[0078] The calibration module is configured to: calibrate the resistance values ​​of the PT100 temperature measuring device corresponding to T1_0, T2_0 and multiple calibration temperature values ​​respectively based on the corrected first corresponding relationship.

[0079] It should be noted that the PT100 temperature measuring device uses the voltage difference Vo of the resistance bridge including the PT100 temperature measuring component to feed back the resistance value Rpt of the PT100 temperature measuring component.

[0080] In some implementations, the temperature measurement calibration point determination module is further configured to:

[0081] The plurality of calibration temperature values ​​are calibration temperature values ​​selected at equal distances between T1_0 and T2_0; and / or

[0082] T1_0 and T2_0 are the endpoint values ​​of the temperature measurement range where the temperature measurement curve of the PT100 temperature measurement component conforms to a linear relationship.

[0083] In some embodiments, the temperature measurement calibration point determination module is further configured as: T1_0=0.2*T2+0.8*T1, T20=0.8*T2+0.2*T1.

[0084] An embodiment of the present invention provides a device for determining the calibration point of a PT100 temperature measuring device, the device comprising a processor and a memory, the temperature measurement calibration point determination module, the first correspondence determination module and the calibration module are all stored in the memory as program units, and the processor executes the program units stored in the memory to implement corresponding functions.

[0085] The processor includes a kernel, which retrieves the corresponding program unit from the memory. One or more kernels can be set, and the resistance value of the PT100 temperature measuring device corresponding to multiple calibration temperature values ​​can be accurately calibrated by adjusting the kernel parameters.

[0086] The memory may include non-permanent memory in a computer-readable medium, random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM, and the memory includes at least one memory chip.

[0087] An embodiment of the present invention provides a storage medium on which a program is stored. When the program is executed by a processor, the method for determining the calibration point of a PT100 temperature measuring device of the present application is implemented.

[0088] An embodiment of the present invention provides a processor, which is used to run a program, wherein the program executes the method for determining the calibration point of a PT100 temperature measuring device of the present application when running.

[0089] The embodiment of the present invention provides a device, which includes a processor, a memory, and a program stored in the memory and executable on the processor, and the method steps of determining the calibration point of the PT100 temperature measuring device of the present application are implemented when the processor executes the program. The device in this article can be a server, a PC, a PAD, a mobile phone, etc.

[0090] The present application also provides a computer program product, which, when executed on a data processing device, is suitable for executing a program that initializes the method steps of determining the calibration point of a PT100 temperature measuring device of the present application.

[0091] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented in one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that include computer-usable program code.

[0092] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0093] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0094] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0095] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0096] The memory may include non-permanent memory in a computer-readable medium, random access memory (RAM) and / or non-volatile memory in the form of read-only memory (ROM) or flash RAM. The memory is an example of a computer-readable medium.

[0097] Computer readable media include permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. Information can be computer readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer readable media does not include temporary computer readable media (transitory media), such as modulated data signals and carrier waves.

[0098] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0099] The above are only embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included within the scope of the claims of the present application.

Claims

1. A method for determining a calibration point of a PT100 temperature measuring device, wherein the PT100 temperature measuring device uses a voltage difference Vo of a resistance bridge including a PT100 temperature measuring component to feed back the resistance value Rpt of the PT100 temperature measuring component, characterized in that: The method for determining the calibration point of the PT100 temperature measuring device includes: Determine the temperature measurement range of the PT100 temperature measuring device, the temperature measurement range is a continuous interval from the lowest measurement temperature T1 to the highest measurement temperature T2, and determine a first calibration temperature value T1_0 and a second calibration temperature value T2_0 between T1 and T2, and multiple calibration temperature values ​​between T1_0 and T2_0; Determine a first corresponding relationship between Vo and Rpt according to the circuit principle of the PT100 temperature measuring device; Based on the voltage differences Vo_1 and Vo_2 measured at the T1_0 and the T2_0 and the corresponding resistance values ​​Rpt_1 and Rpt_2 of the PT100 temperature measuring component measured, the first corresponding relationship is corrected; and The resistance and / or voltage difference of the PT100 temperature measuring device corresponding to the T1_0, the T2_0 and the multiple calibration temperature values ​​are calibrated based on the corrected first corresponding relationship.

2. The method for determining the calibration point of a PT100 temperature measuring device according to claim 1, characterized in that: The plurality of calibrated temperature values ​​are calibrated temperature values ​​selected at equal distances between T1_0 and T2_0.

3. The method for determining the calibration point of a PT100 temperature measuring device according to claim 1, characterized in that: The T1_0 and T2_0 are the endpoint values ​​of the temperature measurement interval in which the temperature measurement curve of the PT100 temperature measurement component conforms to a linear relationship.

4. The method for determining the calibration point of a PT100 temperature measuring device according to any one of claims 1 to 3, characterized in that: T1_0=0.2*T2+0.8*T1, T2_0=0.8*T2+0.2*T1.

5. The method for determining the calibration point of a PT100 temperature measuring device according to claim 4, characterized in that: The first corrected corresponding relationship is: Vo=k1Rpt+k2, wherein k1 and k2 are corrected constants according to the voltage difference measured at T1_0 and T2_0 and the resistance value of the PT100 temperature measuring component.

6. A device for determining the calibration point of a PT100 temperature measuring device, wherein the PT100 temperature measuring device uses a voltage difference Vo of a resistance bridge including a PT100 temperature measuring component to feed back the resistance value Rpt of the PT100 temperature measuring component, characterized in that: The device for determining the calibration point of the PT100 temperature measuring device comprises: a temperature measurement calibration point determination module, a first corresponding relationship determination module and a calibration module. Wherein, the temperature measurement calibration point determination module is configured to: determine the temperature measurement range of the PT100 temperature measuring device, the temperature measurement range is a continuous interval from the lowest measurement temperature T1 to the highest measurement temperature T2, and determine a first calibration temperature value T1_0 and a second calibration temperature value T2_0 between T1 and T2, and multiple calibration temperature values ​​between T1_0 and T2_0; The first correspondence determination module is configured to: determine the first correspondence between the Vo and the Rpt according to the circuit principle of the PT100 temperature measuring device, and correct the first correspondence based on the voltage differences Vo_1 and Vo_2 measured at the T1_0 and the T2_0 and the corresponding resistance values ​​Rpt_1 and Rpt_2 of the PT100 temperature measuring component; The calibration module is configured to: calibrate the resistance values ​​of the PT100 temperature measuring device corresponding to the T1_0, the T2_0 and the multiple calibration temperature values ​​respectively based on the corrected first corresponding relationship.

7. The device for determining the calibration point of a PT100 temperature measuring device according to claim 6, characterized in that: The temperature measurement calibration point determination module is also configured as follows: The plurality of calibration temperature values ​​are calibration temperature values ​​selected at equal distances between T1_0 and T2_0; and / or The T1_0 and T2_0 are the endpoint values ​​of the temperature measurement interval in which the temperature measurement curve of the PT100 temperature measurement component conforms to a linear relationship.

8. The device for determining the calibration point of a PT100 temperature measuring device according to claim 6 or 7, characterized in that: The temperature measurement calibration point determination module is also configured as: T1_0=0.2*T2+0.8*T1, T2_0=0.8*T2+0.2*T1.

9. A machine-readable storage medium having instructions stored thereon, the instructions being used to cause a machine to execute: a method for determining a calibration point of a PT100 temperature measuring device according to any one of claims 1 to 5.

10. A processor, characterized in that: Used to run a program, wherein the program, when run, is used to execute: a method for determining a calibration point of a PT100 temperature measuring device according to any one of claims 1 to 5.

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