Spectral system and method for rapidly detecting macroscopic parameters of single-particle energetic material

Abstract

The invention belongs to the field of energetic material detonation performance detection, and particularly provides a macroscopic parameter rapid detection spectrum system and method.The system comprises an optical lens set, the optical lens set comprises a beam expanding lens, a first dichroscope, a second dichroscope and a third dichroscope, and a microscope objective is arranged on the downstream of the optical path of the optical lens set; the beam expander is used for receiving a laser pulse emitted by the pulse laser, the first dichroscope is used for receiving a light beam emitted by the visible light source, the second dichroscope is used for reflecting a sample optical signal transmitted by the third dichroscope into the CMOS camera, the third dichroscope is used for reflecting a plasma spectrum transmitted by the microscope objective to the convex lens, and the convex lens is used for reflecting the plasma spectrum transmitted by the microscope objective to the visible light source. An optical fiber is arranged on the side, away from the third dichroscope, of the convex lens and connected with the spectrograph, and the microscope objective is arranged above the sample table. According to the spectrum system, the energetic material single particle micro-explosion is loaded through laser to generate plasma, plasma radiation spectrum information is collected, and parameter prediction of the energetic material is achieved.

Description

Technical Field

[0001] The present invention belongs to the field of detection of detonation performance of energetic materials, and in particular, relates to a spectral system and method for rapid detection of macroscopic parameters of single-particle energetic materials. Background Art

[0002] Energetic materials are a class of compounds or mixtures with high energy density and the ability to release energy quickly. They are widely used in military, mining, construction and other industrial fields. Detonation performance is one of the important indicators for evaluating the performance of energetic materials. It involves the ability of materials to undergo rapid chemical reactions when impacted or ignited, release large amounts of energy and produce high-speed gases. Detonation performance can not only evaluate the safety of explosives under various conditions and ensure their stability during storage, transportation and use, but also help optimize the formulation and processing of explosives and improve their energy release efficiency and stability. In the military field, the study of detonation performance is directly related to the effectiveness of weapon systems, and helps develop more efficient weapons and enhance tactical and strategic advantages.

[0003] Traditional detonation performance testing mainly relies on national military standard methods, which have high testing costs and require a large number of energetic material samples. When conducting macroscopic actual explosion measurements, it is often necessary to consume hundreds of grams to kilograms of energetic materials. This large-scale consumption of explosives not only increases the cost of testing, but also makes it difficult to conduct sufficient testing for some rare or high-value new energetic materials due to their limited production. Different detonation performance parameters require different technical methods to evaluate, and different types of test equipment and environments are required, which increases the complexity and cost of testing. Traditional detonation performance testing often involves actual explosion events. During the test, high-speed fragments, strong shock waves and high temperatures may be generated, which poses a high safety risk. In addition, the macroscopic detonation process will have a certain impact on the environment, which is not fully consistent with the current concept of sustainable development and environmental protection. In recent years, the detection technology based on the particle group micro-explosion method under laser loading is expected to solve this problem, but this method inevitably introduces factors such as particle size differences, inter-particle interface effects, and different ablation volumes and thermal conductivity in the detection, resulting in insufficient detection reliability and failure to represent the intrinsic energy release law of energetic materials. Some new energetic materials are initially synthesized with only a few or a single particle, which cannot meet the milligram-level minimum detection dosage requirement of the particle group micro-explosion detection method. Summary of the invention

[0004] The technical problem to be solved by the present invention is to provide a spectral system and method for rapid detection of macroscopic parameters of single-particle energetic materials, which generates plasma by laser-loaded micro-explosion of a single particle of energetic material, collects plasma radiation spectral information, and is used to obtain spectral data required for energetic material parameter prediction and to predict energetic material parameters.

[0005] In order to solve the above technical problems, the technical solution adopted by the present invention is: a macroscopic parameter rapid detection spectroscopy system for a single particle energetic material, comprising an optical path system, wherein the optical path system comprises an optical lens group, wherein the optical lens group comprises a beam expander, a first dichroic mirror, a second dichroic mirror and a third dichroic mirror arranged in sequence, wherein a microscope objective lens is arranged downstream of the optical path of the optical lens group, wherein the beam expander, the first dichroic mirror, the second dichroic mirror, the third dichroic mirror and the microscope objective lens are located on the same optical path and their optical axes coincide, wherein the beam expander is used to receive laser pulses emitted by a pulsed laser, and the first dichroic mirror is used to receive laser pulses emitted by a pulsed laser. The invention is used to receive a light beam emitted by a visible light source, the visible light source is arranged on one side of the first dichroic mirror, the second dichroic mirror is used to reflect the sample optical signal transmitted from the third dichroic mirror into the CMOS camera, the CMOS camera is arranged on one side of the second dichroic mirror, the third dichroic mirror is used to reflect the plasma spectrum transmitted by the microscope objective lens to the convex lens, the convex lens is arranged on one side of the third dichroic mirror, an optical fiber is arranged on the side of the convex lens away from the third dichroic mirror, the convex lens is used to couple the plasma spectrum into the optical fiber, the optical fiber is connected to the spectrometer, and the microscope objective lens is arranged above the sample stage.

[0006] In a preferred embodiment, the optical lens assembly also includes a reflector, which is arranged upstream of the optical path of the beam expander. The pulse laser is arranged on one side of the reflector. The reflector is used to reflect the pulse laser emitted by the pulse laser to the beam expander, and the optical axis of the reflector coincides with that of the beam expander.

[0007] In a preferred embodiment, a timing controller is further included. The timing controller is electrically connected to the pulse laser and the spectrometer, and is used to control the triggering time of the pulse laser and the spectrometer.

[0008] In a preferred solution, the spectrum acquisition time of the spectrometer is 0.5-0.8 μs later than the light emission time of the pulse laser.

[0009] In a preferred solution, the mirror surfaces of the first dichroic mirror, the second dichroic mirror and the third dichroic mirror are placed at an angle of 45° to the horizontal plane.

[0010] The present invention also provides a method for rapid detection of macroscopic parameters of a single particle energetic material, which uses the above-mentioned rapid detection spectrum system for macroscopic parameters to perform detection, and comprises the following steps: Step 1: Confocalization of the laser focus and the best focal plane of the microscope objective: Adjust the optical lens group of the optical path system so that the laser is focused on the best focal plane of the microscope objective; Step 2, find the laser focus position: the visible light source is reflected by the first dichroic mirror, and then transmitted by the second dichroic mirror, the third dichroic mirror, and the microscope objective lens to the sample stage, providing an observation light source for the microscope objective lens. Before placing the sample, a laser pulse is emitted to leave an ablation pit on the sample stage. The ablation pit is the laser focus position, and the CMOS camera captures the position image of the ablation pit. Step 3: Place a single particle of the energetic material at the laser focus position: Place the sample, move the sample stage horizontally and observe the CMOS camera image until a particle of the energetic material is at the laser focus position; Step 4: Inducing plasma with laser action: Inducing single-particle energetic material to generate plasma with pulsed laser emitted by a pulsed laser. The pulsed laser emitted by the pulsed laser is reflected by a reflector in turn, transmitted by a beam expander, a first dichroic mirror, a second dichroic mirror, a third dichroic mirror, and a microscope objective lens, and finally focused on a single-particle energetic material on a sample stage, thereby inducing plasma with laser. Step 5: Obtaining the laser-induced plasma spectrum of a single particle of energetic material using a spectrometer: The laser-induced plasma radiation light is transmitted through the microscope objective, reflected by the third dichroic mirror to the convex lens, converged by the convex lens and coupled into the optical fiber, and then transmitted to the spectrometer to obtain the spectrum; Step 6: preprocess the collected raw spectral data to obtain a preprocessed spectrum of each sample; Step 7. Obtain laser induced plasma pretreatment spectrum data of a single energetic material particle with known macroscopic parameters through steps 1 to 6, and establish a linear relationship model between the pretreated plasma spectrum and the macroscopic parameters of the energetic material for predicting the macroscopic parameters of other energetic materials.

[0011] In a preferred embodiment, the step 1 comprises the following steps: S101, turning on the visible light source and the CMOS camera, adjusting the optical lens group and the microscope objective lens so that the central optical axes of the optical lens group and the microscope objective lens coincide with each other, at which point the CMOS camera can observe the imaging effect in real time, and while observing the imaging, adjusting the distance between the sample stage position and the microscope objective lens until the imaging is clearest, which is the best focal plane position of the microscope objective lens; S102, turn on the pulse laser to emit pulse laser, adjust the beam expander to change the laser spot size and divergence angle until the laser focus position is at the same height as the position of the sample stage adjusted in step S101.

[0012] In the preferred solution, in step 6, the spectral data collected by the spectrometer are preprocessed, including removing saturated spectra, removing abnormal spectra, removing background spectra, normalizing spectra, and searching for spectral peaks, which are respectively performed as follows: S601, removing saturated spectra: removing the spectra whose maximum intensity exceeds the saturation intensity of the spectrometer; S602. Remove abnormal spectra: Remove abnormal spectra based on the Laida criterion. The Laida criterion means that the experimental data is assumed to follow a normal distribution, and the confidence interval of the data is defined by calculating the standard deviation of the average spectral intensity data of each spectrum. The average spectral intensity is obtained by averaging the spectrum obtained by each laser pulse. If the average spectral intensity of a spectrum The average of the average spectral intensity of all spectra for this sample If the difference is greater than the standard deviation σ of the average spectral intensity of all spectra of this sample, then this spectrum is considered abnormal and needs to be removed; S603, removing background spectrum: removing the background spectrum based on the window translation smoothing method, setting the window width and translation width, finding the minimum value in each window, fitting all the found values ​​to obtain the background spectrum, and subtracting the background spectrum from the original spectrum to remove the background light spectrum; S604, spectrum normalization: performing spectrum normalization based on a channel-by-channel background intensity normalization method, dividing the intensity of each channel at each wavelength by the integral value of the background spectrum intensity of the corresponding channel, to complete spectrum normalization; S605, spectrum peak search: retain the peak intensity corresponding to the wavelength with intensity greater than the specified threshold, and set the rest to zero, to obtain the final pre-processed spectrum.

[0013] In the preferred embodiment, in step seven, a linear relationship model between the preprocessed spectral data of the particle-scale energetic material and the macroscopic parameters of the energetic material is established by combining principal component analysis with partial least squares regression intelligent algorithm.

[0014] In a preferred embodiment, the macroscopic parameters include explosion velocity, explosion pressure, explosion heat, explosion volume and explosion temperature. The present invention provides a single-particle energetic material macroscopic parameter rapid detection spectroscopy system and method, which has the following beneficial effects: 1. Laser loading of single particle micro-explosion of energetic materials generates plasma, collects plasma radiation spectrum information, and establishes a linear model of micro-explosion spectrum and macro parameters through intelligent algorithm to realize the prediction of five explosion parameters of energetic materials.

[0015] 2. Solve the problems that traditional energetic material performance testing methods consume a large amount of medicine, different properties need to be tested separately, the experimental operation is complicated, the risk is high, and the particle size difference and interface effect of particle group micro-explosion method lead to insufficient reliability. Some new energetic materials with only a few particles cannot be tested for detonation velocity.

[0016] 3. The present invention eliminates the interaction between particles and can provide an in-depth understanding of the intrinsic energy release characteristics of energetic materials. It consumes very little sample and has high safety. It is of great significance to improve the safety of energetic material testing and to perform performance testing on new energetic materials with ultra-small doses or even several single particles. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present invention will be further described below in conjunction with the accompanying drawings and embodiments: Figure 1 It is an overall schematic diagram of the present invention; In the figure: pulse laser 1; reflector 2; beam expander 3; first dichroic mirror 4; second dichroic mirror 5; third dichroic mirror 6; microscope objective 7; sample stage 8; visible light source 9; CMOS camera 10; convex lens 11; optical fiber 12; spectrometer 13; timing controller 14. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0019] Embodiment 1: A spectroscopy system for rapid detection of macroscopic parameters of single-particle energetic materials, such as Figure 1 As shown, it includes an optical path system, which includes an optical lens group, the optical lens group includes a beam expander 3, a first dichroic mirror 4, a second dichroic mirror 5 and a third dichroic mirror 6 which are arranged in sequence, a microscope objective lens 7 is provided on the optical downstream of the optical lens group, and the microscope objective lens 7 is arranged above the sample stage 8, the beam expander 3, the first dichroic mirror 4, the second dichroic mirror 5, the third dichroic mirror 6 and the microscope objective lens 7 are located on the same optical path and the optical axes coincide. In this embodiment, the beam expander 3, the first dichroic mirror 4, the second dichroic mirror 5, the third dichroic mirror 6 and the microscope objective lens 7 are arranged vertically from top to bottom in sequence, the mirror surfaces of the first dichroic mirror 4, the second dichroic mirror 5 and the third dichroic mirror 6 are placed at an angle of 45° to the horizontal plane, and the beam expander 3, the microscope objective lens 7 and the sample stage 8 are placed parallel to the horizontal plane.

[0020] The microscope objective lens 7 is a Mitutoyo model, with a magnification of 5 times and a numerical aperture of 0.14. The sample stage 8 can be adjusted in three-dimensional XYZ directions respectively, and is used to place the sample.

[0021] The beam expander 3 is used to receive the laser pulses emitted by the pulse laser 1. The beam expander 3 is used to change the divergence angle of the laser, expand the laser spot area to avoid damage to the subsequent optical lens group, and ultimately change the distance between the actual focus point of the laser and the microscope objective 7.

[0022] The laser wavelength emitted by the pulse laser 1 is 1064 nm, the pulse width is 9 ns, the single pulse laser energy is adjustable from 10 to 120 mJ, the divergence angle is less than 0.5 mrad, and the pulse repetition frequency is adjustable from 1 to 10 Hz.

[0023] The first dichroic mirror 4 is used to receive the light beam emitted by the visible light source 9. The first dichroic mirror 4 changes the direction of the visible light source 9 so that it shines on the sample surface and transmits the 1064 nm laser.

[0024] The visible light source 9 is arranged on one side of the first dichroic mirror 4 to provide observation light for observing the sample under the microscope objective 7. The visible light source 9 is a white light LED.

[0025] The second dichroic mirror 5 is used to reflect the sample optical signal transmitted from the third dichroic mirror 6 into the CMOS camera 10, and change the optical path direction of the sample optical signal so that it enters the CMOS camera 10 and transmits the 1064 nm laser.

[0026] The CMOS camera 10 is arranged on one side of the second dichroic mirror 5 . The CMOS camera 10 adopts an area array CMOS photosensitive chip, and the exposure time is 0.3-1000 ms.

[0027] The third dichroic mirror 6 is used to reflect the plasma spectrum transmitted by the microscope objective lens 7 to the convex lens 11, so as to change the optical path direction of the plasma optical signal.

[0028] The convex lens 11 is arranged on one side of the third dichroic mirror 6. The side of the convex lens 11 away from the third dichroic mirror 6 is provided with an optical fiber 12. The convex lens 11 is used to couple the plasma spectrum into the optical fiber, and the optical fiber 12 is connected to the spectrometer 13. The convex lens 11 is a fused silica plano-convex lens with a focal length of 40 mm. The plasma light reflected back from the third dichroic mirror 6 is focused and coupled into the optical fiber 12, and then transmitted to the spectrometer 13 for collection. The optical fiber 12 is a one-to-six optical fiber with a length of 2 m and a core diameter of 400 μm. The spectrometer 13 is a six-channel optical fiber spectrometer, using a 6×2048 pixel CMOS array detector, covering a wavelength range of 180 nm-920 nm.

[0029] Preferably, the optical lens assembly further includes a reflector 2, which is arranged upstream of the optical path of the beam expander 3, and the pulse laser 1 is arranged on one side of the reflector 2. The reflector 2 is used to reflect the pulse laser emitted by the pulse laser 1 to the beam expander 3, and the optical axes of the reflector 2 and the beam expander 3 coincide. The reflector 2 is used to change the optical path direction of the 1064nm laser so that the laser is perpendicular to the horizontal plane and the reflectivity is greater than 99.5%.

[0030] Preferably, a timing controller 14 is further included. The timing controller 14 is electrically connected to the pulse laser 1 and the spectrometer 13. The timing controller 14 is used to control the triggering time of the pulse laser 1 and the spectrometer 13. In this embodiment, the timing controller 14 is DG535.

[0031] The spectrum acquisition time of the spectrometer 13 is 0.5-0.8 μs later than the light emission time of the pulse laser 1. In this embodiment, the spectrum acquisition time of the spectrometer 13 is 0.5 μs later than the light emission time of the pulse laser 1, and the integration time of the spectrometer 13 is set to 30 μs.

[0032] The system includes a single particle energetic material selection system, a LIBS system and a spectrum collection system. The particle energetic material selection system is composed of a first dichroic mirror 4, a second dichroic mirror 5, a third dichroic mirror 6, a microscope objective lens 7, a sample stage 8, a visible light source 9, and a CMOS camera 10. The LIBS system is composed of a pulse laser 1, a reflector 2, a beam expander 3, a first dichroic mirror 4, a second dichroic mirror 5, a third dichroic mirror 6, a microscope objective lens 7, and a sample stage 8. The spectrum collection system is composed of an optical lens group, a third dichroic mirror 6, a convex lens 11, a microscope objective lens 7, an optical fiber 12, and a spectrometer 13.

[0033] The visible light source 9 of the single-particle energetic material selection system is reflected by the first dichroic mirror 4, transmitted through the second dichroic mirror 5, the third dichroic mirror 6 and the microscope objective 7 to irradiate the sample stage 8, and provide an observation light source for imaging the sample surface. The sample optical signal is transmitted through the microscope objective 7 and the third dichroic mirror 6 in succession, and reflected by the second dichroic mirror 5 to enter the CMOS camera 10. The optical signal is converted into an image, and the height of the sample stage 8 is changed until the image observed under the microscope objective 7 is the clearest, and the sample morphology is observed in real time. The visible light source 9 adopts a white light LED, the first dichroic mirror 4 and the second dichroic mirror 5 transmit a wavelength of 1064 nm, and reflect a wavelength band of 200-1000 nm. The magnification of the microscope objective 7 is 5 times, and the numerical aperture is 0.14.

[0034] The LIBS system excites single-particle energetic materials based on the LIBS technology. A frequency-adjustable pulse laser 1 with a wavelength of 1064 nm is selected as the excitation light source to provide injection energy. The emission energy of the pulse laser 1 is adjusted to control the laser energy at the focus of the focusing lens to 6 mJ. The pulse laser is reflected by the reflector 2 and transmitted by the beam expander 3 in succession. The beam expander 3 expands the laser spot area to avoid damage to the subsequent optical lens group. At the same time, the divergence angle is fine-tuned to make the clearest position under the microscope objective 7 of the single-particle energetic material selection system and the focusing position of the LIBS system at the same horizontal height. The laser after beam expansion is transmitted by the first dichroic mirror 4, the second dichroic mirror 5, and the third dichroic mirror 6. Finally, the pulse laser is focused by the microscope objective 7. The excited single-particle energetic material generates high-temperature and high-pressure plasma and a rapid exothermic chemical reaction. The surrounding air is violently compressed to generate an air shock wave.

[0035] The spectral acquisition system collects the plasma spectrum of a single particle of energetic material induced by laser focusing in real time, couples the plasma light into the optical fiber 12 through the lens 11, and then transmits it to the spectrum 13 to obtain the spectral information. The lens 11 is a fused silica plano-convex lens with a focal length of 40 mm, which is located on the collection light path of the third dichroic mirror 6, and the collection light path is perpendicular to the excitation light path of the LIBS system.

[0036] The single particle energetic material selection system, LIBS system, and spectrum acquisition system share the same optical path. The reflector 2, beam expander 3, first dichroic mirror 4, second dichroic mirror 5, third dichroic mirror 6, and microscope objective 7 are located on the same optical path and their optical axes coincide.

[0037] Embodiment 2: A method for rapid detection of macroscopic parameters of a single particle energetic material comprises the following steps: Step 1: Confocalization of the laser focus and the best focal plane of the microscope objective 7: Adjust the optical lens group of the optical path system so that the laser is focused on the best focal plane of the microscope objective 7.

[0038] The specific steps include: S101, turn on the visible light source 9 and the CMOS camera 10, adjust the optical lens group and the microscope objective lens 7 so that the central optical axes of the optical lens group and the microscope objective lens 7 coincide. At this time, the CMOS camera 10 can observe the imaging effect in real time. While observing the imaging, adjust the distance between the position of the sample stage 8 and the microscope objective lens 7 until the imaging is clearest. This position is the optimal focal plane position of the microscope objective lens 7.

[0039] S102, turn on the pulse laser 1 to emit pulse laser, and adjust the beam expander 3 to change the laser spot size and divergence angle until the laser focus position is at the same height as the position of the sample stage 8 adjusted in step S101.

[0040] Step 2, find the laser focus position: the visible light source 9 is reflected by the first dichroic mirror 4 in sequence, and is transmitted through the second dichroic mirror 5, the third dichroic mirror 6, and the microscope objective lens 7 to irradiate the sample stage 8, providing an observation light source for the microscope objective lens 7. The ablation pit after a single laser pulse is observed under the microscope objective lens 7, and the ablation pit is the laser focus position. That is, before placing the sample, a laser pulse is emitted once to leave an ablation pit on the sample stage 8, and the ablation pit is the laser focus position. The CMOS camera 10 captures the position image of the ablation pit for reference in the subsequent adjustment of the horizontal position of the sample.

[0041] Step 3: Place a single particle of the energetic material at the laser focusing position: Place the sample, move the sample stage 8 horizontally while observing the image of the CMOS camera 10 until a particle of the energetic material is at the laser focusing position, and then fix the position of the sample stage 8.

[0042] Step 4: Inducing plasma with laser action: The pulsed laser emitted by the pulsed laser 1 induces the single particle of energetic material to generate plasma. The pulsed laser emitted by the pulsed laser 1 is reflected by the reflector 2 in turn, transmitted by the beam expander 3, the first dichroic mirror 4, the second dichroic mirror 5, the third dichroic mirror 6, and the microscope objective 7, and finally focused on the single particle of energetic material on the sample stage 8, and the laser induces the generation of plasma.

[0043] Step 5: The spectrometer 13 obtains the laser-induced plasma spectrum of the single-particle energetic material: the laser-induced plasma radiation light is transmitted through the microscope objective 7, reflected by the third dichroic mirror 6 to the convex lens 11, converged and coupled by the convex lens 11 into the optical fiber 12, and then transmitted to the spectrometer 13 to obtain the spectrum.

[0044] Step 6: Preprocess the collected raw spectral data to obtain the preprocessed spectrum of each sample.

[0045] The collected spectral data are preprocessed, including removing saturated spectra, removing abnormal spectra, removing background spectra, spectral normalization, and spectral peak search. The operations are as follows: 1. Removing saturated spectra: removing spectra whose maximum intensity exceeds the saturation intensity of the spectrometer 13.

[0046] 2. Remove abnormal spectra: Remove abnormal spectra based on the Laida criterion. The Laida criterion means that the experimental data is assumed to follow a normal distribution, and the confidence interval of the data is defined by calculating the standard deviation of the average spectral intensity data of each spectrum. The average spectral intensity is obtained by averaging the spectrum obtained by each laser pulse. If the average spectral intensity of a spectrum is The average of the average spectral intensity of all spectra for this sample If the difference is greater than the standard deviation σ of the average spectral intensity of all spectra of this sample, the spectrum is considered abnormal and needs to be removed.

[0047] 3. Remove background spectrum: Remove the background spectrum based on the window translation smoothing method, set the window width and translation width, find the minimum value in each window, fit all the values ​​found to get the background spectrum, and subtract the background spectrum from the original spectrum to remove the background light spectrum.

[0048] 4. Spectral normalization: Spectral normalization is performed based on the channel-by-channel background intensity normalization method. The intensity of each channel at each wavelength is divided by the integral value of the background spectrum intensity of the corresponding channel to complete the normalization of the spectrum.

[0049] 5. Spectral peak search: retain the peak intensity corresponding to the wavelength with intensity greater than the specified threshold, and set the rest to zero to obtain the final preprocessed spectrum.

[0050] Step 7. Obtain the spectrum of a single energetic material particle after laser induced plasma pretreatment with known macroscopic parameters through steps 1 to 6. Use the corresponding scatter plot between the laser induced plasma spectrum and the macroscopic parameters to fit a linear relationship model between the plasma spectrum and the macroscopic parameters of the energetic material, which is used to predict the macroscopic parameters of other energetic materials.

[0051] In this embodiment, a linear regression model or a linear relationship model between the preprocessed spectral data of energetic materials at the particle level and the macroscopic parameters of energetic materials is established through the intelligent algorithm of principal component analysis combined with partial least squares regression, and finally the simultaneous, safe and rapid prediction of the five explosion parameters is achieved at the particle level, and the macroscopic parameters of energetic materials are predicted based on the plasma radiation spectrum of single particle energetic materials.

[0052] Principal component analysis (PCA) is an unsupervised dimensionality reduction technique that reduces the dimensionality of data by identifying the main directions of variation in the data (principal components) and converting the original variables into new orthogonal variables (principal components). These new variables are linear combinations of the original variables. PPCA assumes that most of the variation in the data can be explained by a few principal components.

[0053] Partial least squares regression (PLS) is a supervised dimensionality reduction technique that not only considers the correlation between predictors, but also the relationship between predictors and response variables. PLS constructs a prediction model by finding the direction in the predictor space that explains the maximum covariance between the predictor and the response.

[0054] This combined method can be used for data preprocessing and feature extraction to improve the efficiency and effectiveness of subsequent analysis.

[0055] The macroscopic parameters include explosion velocity, explosion pressure, explosion heat, explosion volume, and explosion temperature, which are equivalent to the five explosion parameters.

[0056] The linear relationship model is: ; in, y is a macro parameter, , … is the spectral data after preprocessing.

[0057] , … It is the fitting parameter obtained by data fitting or model building.

[0058] The linear relationship model between the plasma spectrum and the macroscopic parameters of energetic materials is obtained and stored in the data processing module to save the model coefficients. k 0, … k n When testing the macroscopic parameters of a single energetic material, it is only necessary to obtain the spectral data of a single energetic material particle after laser induced plasma pretreatment through steps one to six, and then predict the unknown macroscopic parameters of the energetic material through a linear relationship model.

[0059] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A rapid detection spectroscopy system for macroscopic parameters of single-particle energetic materials, characterized in that: The optical path system comprises an optical lens group, the optical lens group comprises a beam expander (3), a first dichroic mirror (4), a second dichroic mirror (5) and a third dichroic mirror (6) which are arranged in sequence, a microscope objective lens (7) is arranged downstream of the optical path of the optical lens group, the beam expander (3), the first dichroic mirror (4), the second dichroic mirror (5), the third dichroic mirror (6) and the microscope objective lens (7) are located on the same optical path and their optical axes coincide, the beam expander (3) is used to receive laser pulses emitted by a pulsed laser (1), the first dichroic mirror (4) is used to receive a light beam emitted by a visible light source (9), the visible light source (9) is arranged on one side of the first dichroic mirror (4), and the third dichroic mirror (5) is used to receive a light beam emitted by a visible light source (9). The second dichroic mirror (5) is used to reflect the sample optical signal transmitted from the third dichroic mirror (6) into the CMOS camera (10). The CMOS camera (10) is arranged on one side of the second dichroic mirror (5). The third dichroic mirror (6) is used to reflect the plasma spectrum transmitted by the microscope objective lens (7) to the convex lens (11). The convex lens (11) is arranged on one side of the third dichroic mirror (6). An optical fiber (12) is provided on the side of the convex lens (11) facing away from the third dichroic mirror (6). The convex lens (11) is used to couple the plasma spectrum into the optical fiber. The optical fiber (12) is connected to the spectrometer (13). The microscope objective lens (7) is arranged above the sample stage (8).

2. The macroscopic parameter rapid detection spectroscopy system of a single particle energetic material according to claim 1, characterized in that: The optical lens assembly further comprises a reflector (2), the reflector (2) being arranged on an optical path upstream of the beam expander (3), the pulse laser (1) being arranged on one side of the reflector (2), the reflector (2) being used to reflect the pulse laser emitted by the pulse laser (1) to the beam expander (3), and the optical axes of the reflector (2) and the beam expander (3) being coincident.

3. The macroscopic parameter rapid detection spectroscopy system of a single particle energetic material according to claim 1, characterized in that: It also includes a timing controller (14), which is electrically connected to the pulse laser (1) and the spectrometer (13), and is used to control the triggering time of the pulse laser (1) and the spectrometer (13).

4. The macroscopic parameter rapid detection spectroscopy system of a single particle energetic material according to claim 3, characterized in that: The spectrum acquisition time of the spectrometer (13) is 0.5 to 0.8 μs later than the light emission time of the pulse laser (1).

5. The macroscopic parameter rapid detection spectroscopy system of a single particle energetic material according to claim 1, characterized in that: The mirror surfaces of the first dichroic mirror (4), the second dichroic mirror (5) and the third dichroic mirror (6) are placed at an angle of 45° to the horizontal plane.

6. A method for rapid detection of macroscopic parameters of single particle energetic materials, characterized in that: The method of obtaining a laser-induced plasma spectrum of a single-particle energetic material by using the macroscopic parameter rapid detection spectrum system according to any one of claims 1 to 5 comprises the following steps: Step 1: Confocalization of the laser focus and the best focal plane of the microscope objective (7): adjusting the optical lens group of the optical path system so that the laser is focused on the best focal plane of the microscope objective (7); Step 2, finding the laser focus position: the visible light source (9) is reflected by the first dichroic mirror (4) in sequence, and is transmitted through the second dichroic mirror (5), the third dichroic mirror (6), and the microscope objective lens (7) to irradiate the sample stage (8), providing an observation light source for the microscope objective lens (7). Before placing the sample, a laser pulse is emitted to leave an ablation pit on the sample stage (8). The ablation pit is the laser focus position, and the CMOS camera (10) captures a position image of the ablation pit. Step 3, placing a single particle of the energetic material at the laser focus position: placing the sample, moving the sample stage (8) horizontally while observing the image of the CMOS camera (10) until a particle of the energetic material is located at the laser focus position; Step 4: Inducing plasma with laser action: Inducing the single particle of energetic material to generate plasma by using the pulsed laser emitted by the pulsed laser (1). The pulsed laser emitted by the pulsed laser (1) is reflected by the reflector (2) in sequence, transmitted by the beam expander (3), the first dichroic mirror (4), the second dichroic mirror (5), the third dichroic mirror (6), and the microscope objective lens (7), and finally focused on the single particle of energetic material on the sample stage (8), thereby inducing the generation of plasma by laser. Step 5: The spectrometer (13) obtains the laser-induced plasma spectrum of the single-particle energetic material: the laser-induced plasma radiation light is transmitted through the microscope objective (7), reflected by the third dichroic mirror (6) to the convex lens (11), converged and coupled by the convex lens (11) into the optical fiber (12), and then transmitted to the spectrometer (13) to obtain the original spectrum; Step 6: preprocess the collected raw spectral data to obtain a preprocessed spectrum of each sample; Step 7. Obtain laser induced plasma pretreatment spectrum data of a single energetic material particle with known macroscopic parameters through steps 1 to 6, and establish a linear relationship model between the pretreated plasma spectrum and the macroscopic parameters of the energetic material for predicting the macroscopic parameters of other energetic materials.

7. A method for rapid detection of macroscopic parameters of single particle energetic materials according to claim 6, characterized in that: The step 1 includes the following steps: S101, turning on the visible light source (9) and the CMOS camera (10), adjusting the optical lens group and the microscope objective lens (7) so that the central optical axes of the optical lens group and the microscope objective lens (7) coincide with each other, and at this time, the CMOS camera (10) can observe the imaging effect in real time, and while observing the imaging, adjusting the distance between the position of the sample stage (8) and the microscope objective lens (7) until the imaging is clearest, and this position is the best focal plane position of the microscope objective lens (7); S102, turning on the pulse laser (1) to emit pulse laser, adjusting the beam expander (3) to change the laser spot size and divergence angle until the laser focus position is at the same height as the position of the sample stage (8) adjusted in step S101.

8. A method for rapid detection of macroscopic parameters of single particle energetic materials according to claim 6, characterized in that: In step 6, the spectral data collected by the spectrometer (13) is preprocessed, including removing saturated spectra, removing abnormal spectra, removing background spectra, normalizing spectra, and searching for spectral peaks, and the operations are as follows: S601, removing saturated spectra: removing spectra whose maximum intensity exceeds the saturation intensity of the spectrometer (13); S602. Remove abnormal spectra: Remove abnormal spectra based on the Laida criterion. The Laida criterion means assuming that the experimental data follows a normal distribution and defining the confidence interval of the data by calculating the standard deviation of the average spectral intensity data of each spectrum. The average spectral intensity is obtained by averaging the spectrum obtained by each laser pulse. If the average spectral intensity of a spectrum The average of the average spectral intensity of all spectra for this sample If the difference is greater than the standard deviation σ of the average spectral intensity of all spectra of this sample, then this spectrum is considered abnormal and needs to be removed; S603, removing background spectrum: removing the background spectrum based on the window translation smoothing method, setting the window width and translation width, finding the minimum value in each window, fitting all the found values ​​to obtain the background spectrum, and subtracting the background spectrum from the original spectrum to remove the background light spectrum; S604, spectrum normalization: performing spectrum normalization based on a channel-by-channel background intensity normalization method, dividing the intensity of each channel at each wavelength by the integral value of the background spectrum intensity of the corresponding channel, to complete spectrum normalization; S605, spectrum peak search: retain the peak intensity corresponding to the wavelength with intensity greater than the specified threshold, and set the rest to zero, to obtain the final pre-processed spectrum.

9. A method for rapid detection of macroscopic parameters of single particle energetic materials according to claim 6, characterized in that: In the step seven, a linear relationship model between the preprocessed spectral data of the particle-scale energetic material and the macroscopic parameters of the energetic material is established by combining principal component analysis with partial least squares regression intelligent algorithm.

10. A method for rapid detection of macroscopic parameters of single particle energetic materials according to claim 6, characterized in that: The macroscopic parameters include explosion velocity, explosion pressure, explosion heat, explosion volume and explosion temperature.

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