Universal automatic batch test verification system and method for embedded products

By designing a universal automated batch testing and verification system for embedded products that include components such as general interface extension adapter unit and main control unit, the problem of limited application scope of existing testing devices is solved, and the rapid application of multiple embedded products is achieved. Batch testing reduces costs and cycles.

CN119415388APending Publication Date: 2025-02-11NO 30 INST OF CHINA ELECTRONIC TECH GRP CORP
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Patent Information

Application Number
CN202411467717.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-10-21
Publication Date
2025-02-11

AI Technical Summary

Technical Problem

Due to the limited scope of application, existing testing devices cannot meet the mass production test and verification needs of multiple embedded products, resulting in high investment costs and long development cycles, which limits the development of embedded products.

Method used

A universal automated batch testing and verification system for embedded products is designed, including a general interface extension adapter unit, main control unit, switching unit, multi-channel power supply unit and test operation table, which can quickly build a test environment and support multiple products to test simultaneously. , realize batch automated testing.

Benefits of technology

This system realizes rapid testing and verification of embedded products with different structural forms and interface characteristics, reduces the need for customized development of test systems, reduces R&D costs and cycles, and greatly improves batch testing efficiency.

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Abstract

The invention discloses a universal automatic batch test verification system and method for embedded products. The system comprises a universal interface extension adaptation unit, a universal interface extension adaptation unit and a universal interface extension adaptation unit, wherein the universal interface extension adaptation unit comprises a high-speed interface extension adaptation unit, a low-speed interface extension adaptation unit and a computer bus interface extension adaptation unit; the main control unit is connected with the test operation table through the multi-path power supply unit; the main control unit is connected with the switching unit; the exchange unit is connected with the test operation table through the universal interface expansion adaptation unit; the test operation table is connected with the plurality of embedded products; and the universal interface expansion adaptation unit is used for carrying out adaptation according to the electrical interface of the embedded product and realizing signal excitation and data acquisition of all external interfaces of the embedded product. According to the invention, testing and verification environments can be provided for embedded products with different structural forms and interface characteristics, simultaneous testing of multiple sets of embedded products can be supported at a time, and batch automatic testing of the embedded products can be realized.
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Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to a universal automatic batch testing and verification system and method for embedded products. Background Art

[0002] Embedded products are widely used in various industries and fields. Especially with the development and application of emerging technologies such as artificial intelligence and the Internet of Things, embedded products have become more intelligent and personalized, and are constantly developing in the direction of high integration, high performance, and high customization. Embedded products have the characteristics of a wide variety of forms and large batch production quantities. Due to the high degree of integration, some embedded products have rich external interfaces. During testing and verification, they often require customized automated test devices to adapt to the interfaces and structural appearance of embedded products and provide a test and verification environment. The scope of application of such specially designed test devices is limited. When it comes to the development and mass production of multiple varieties of products, the test device investment cost is high and the development cycle is long. It cannot meet the growing test and verification needs of embedded products, which restricts the development of embedded products. Summary of the invention

[0003] In view of this, the present invention provides a universal automated batch testing and verification system and method for embedded products. In the testing system, a universal interface expansion adapter unit is provided. Combined with a standard testing operation table, a testing and verification environment can be provided for embedded products with different structural forms and interface characteristics. It supports simultaneous testing of multiple sets of embedded products at a time, thereby realizing batch automated testing of embedded products.

[0004] The invention discloses a universal automatic batch test verification system for embedded products, which comprises: a universal interface expansion adapter unit, a main control unit, a switching unit, a multi-way power supply unit, and a test operation table; the universal interface expansion adapter unit comprises a high-speed interface expansion adapter unit, a low-speed interface expansion adapter unit, and a computer bus interface expansion adapter unit; the main control unit is connected to the test operation table through the multi-way power supply unit; the main control unit is connected to the switching unit; the switching unit is connected to the test operation table through the universal interface expansion adapter unit; the test operation table is connected to a plurality of embedded products;

[0005] The universal interface expansion adapter unit is used to adapt according to the electrical interface of the embedded product to realize signal excitation and data acquisition of all external interfaces of the embedded product.

[0006] Furthermore, the main control unit stores test system software, a test case library and a test database;

[0007] The main control unit is used to initiate test cases, determine test results, and store test data. It uses a PCIE interface to exchange data with the general interface expansion unit.

[0008] The main control unit has a standard instrument calling interface for realizing program control and calling of various standard instruments; the test system software in the main control unit automatically obtains embedded product information through the test console, automatically calls the corresponding test case library and initiates testing; the standard instrument is connected to the test console.

[0009] Furthermore, the switching unit is used to implement data exchange between the main control unit and the universal interface expansion unit, and to expand the slots of the universal interface expansion unit according to demand.

[0010] Furthermore, the multi-channel power supply unit provides independent power supply for embedded products, provides a standard programmable interface, supports programmable control of the switch of embedded products, supports real-time adjustment of power supply and reading of current values, and supports multi-channel power supply output.

[0011] Furthermore, the test operating table includes a test operating table top and a mounting plate; the test operating table top and the universal interface expansion adapter unit are connected by cables, and the mounting plate is designed according to the structural shape and interface of the embedded product, and the mounting plate only realizes the physical connection between the embedded product interface and the cable.

[0012] Furthermore, the test operation table can be used to build an automated test line; it can also be installed in a high and low temperature test box or a vibration table to conduct environmental tests.

[0013] The present invention also discloses a universal automated batch test verification method for embedded products, which is applicable to any of the universal automated batch test verification systems for embedded products described above, and comprises:

[0014] Install the embedded products on the test bench in sequence, and install the universal interface expansion adapter unit that is compatible with the embedded products according to the requirements of the embedded products; turn on the power of the test system and run the test system software in the main control unit; after the test system software is running, it automatically obtains the relevant information of the embedded products through the test bench; the test system software loads the corresponding test case library according to the relevant information of the embedded products, and the test system software sends the corresponding test component program to the universal interface expansion adapter unit. After the universal interface expansion adapter unit successfully completes the loading, it returns a response; the test system software powers on the embedded product and initiates various test cases in sequence; when all test cases are executed, the test system software stores the test results and generates a test report; the test system software powers off the embedded product to complete the test.

[0015] Furthermore, the test cases are custom configured according to the embedded product requirements.

[0016] Due to the adoption of the above technical solution, the present invention has the following advantages:

[0017] 1. The present invention can realize the rapid construction of the embedded product test and verification environment, provides a rich and complete range of interface adapters, has high versatility, and can meet the test and verification needs of most embedded products.

[0018] 2. Due to the versatility and high scalability of the present invention, the customized development of the test system can be effectively reduced, the test R&D cost can be reduced, and the product development cycle can be shortened.

[0019] 3. The test console of the present invention supports the installation of multiple products, has automatic power on and off, automatically executes test cases and executes concurrent processes, which can greatly improve batch testing efficiency and ensure rapid production and delivery of products. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the embodiments of the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0021] Figure 1 A schematic diagram of the architecture of a universal automated batch test and verification system for embedded products according to an embodiment of the present invention;

[0022] Figure 2 A schematic diagram of the structure of a universal automated batch test and verification system for embedded products according to an embodiment of the present invention;

[0023] Figure 3 The present invention is a flowchart of a universal automated batch testing and verification method for embedded products according to an embodiment of the present invention. DETAILED DESCRIPTION

[0024] The present invention is further described in conjunction with the accompanying drawings and embodiments, and the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by ordinary technicians in this field should fall within the scope of protection of the embodiments of the present invention.

[0025] See also Figure 1 and Figure 2 The present invention provides an embodiment of a universal automated batch test verification system for embedded products, which comprises: a universal interface expansion adapter unit, a main control unit, a switching unit, a multi-way power supply unit, and a test operation table; the universal interface expansion adapter unit comprises a high-speed interface expansion adapter unit, a low-speed interface expansion adapter unit, and a computer bus interface expansion adapter unit; the main control unit is connected to the test operation table through the multi-way power supply unit; the main control unit is connected to the switching unit; the switching unit is connected to the test operation table through the universal interface expansion adapter unit; the test operation table is connected to a plurality of embedded products;

[0026] The universal interface expansion adapter unit can be quickly adapted according to the electrical interface of the embedded product to realize the signal excitation and data acquisition of all external interfaces of the embedded product. The universal interface expansion adapter unit is divided into three types: high-speed interface adapter unit, low-speed interface adapter unit and computer bus interface adapter unit.

[0027] The high-speed interface adapter unit supports the adaptation of electrical interface signals greater than 1Gbps. To ensure reliable signal transmission, optical signals are used for relay extension, supporting a maximum of 48 high-speed interfaces. The low-speed interface adapter unit provides standard and rich GPIO interfaces, which can support the adaptation of at least 100 GPIO signals, and supports the adaptation of SPI, SDIO, IIC, RS422, RS485, RS232 and other interfaces. The computer bus interface adapter unit provides USB, PCIE, LAN and other standard interface adaptation.

[0028] Users can customize the combination of universal interface expansion adapter units according to the needs of embedded products, greatly shortening the design cycle of test development and automated test equipment. High-speed interface adapter units and low-speed interface adapter units can dynamically load internal programs according to the needs of different embedded products, quickly switch the corresponding test component programs of embedded products, and adapt the interface standards of embedded products. Universal interface expansion adapter units can be used in combination to meet the interface adaptation of most embedded products, and have rich interface adaptation resources to support large-scale test access of products.

[0029] The main control unit implements functions such as test case initiation, test result judgment, and test data storage. It uses the PCIE interface to exchange data with the general interface expansion unit. It has a standard instrument call interface and can realize program control and call of various standard instruments. The test system software in the main control unit can automatically obtain embedded product information through the test console, automatically call the corresponding test case library and initiate the test. The standard instrument is connected to the test console.

[0030] The switching unit realizes data exchange between the main control unit and each universal interface expansion unit. The slots of the universal interface expansion unit can be expanded according to needs. This test system supports the access of at least 7 universal interface expansion units.

[0031] The multi-channel power supply unit provides independent power supply for embedded products, provides a standard programmable interface, supports the switch power control of embedded products, supports real-time adjustment of power supply and current value reading. This test system supports at least 48 power outputs.

[0032] The test operation table, including the operation table and the mounting plate, is connected to the universal interface expansion adapter unit using a standard test cable. The mounting plate is designed according to the structure and interface of the embedded product. The mounting plate only realizes the physical connection between the embedded product interface and the standard test cable. The design is simple and the cost is low. The test operation table has high flexibility and can meet various test and verification requirements of embedded products. For example, after integrating the robotic arm, an automated test line can be built; it can also be installed in a high and low temperature test chamber or a vibration table for environmental testing.

[0033] See also Figure 3 The present invention also provides an embodiment of a universal automated batch test verification method for embedded products, which is applicable to the universal automated batch test verification system for embedded products described in the above embodiment, and comprises:

[0034] Install the embedded products on the test bench in sequence; install the universal interface expansion adapter unit according to the embedded product requirement combination; turn on the test system power and run the test system software; after the test system software is running, automatically obtain the relevant information of the embedded product through the test bench; the test system software loads the corresponding test case library according to the information; the test system software sends the corresponding test component program to the universal interface expansion adapter unit, and the universal interface adapter unit returns a response after successfully completing the loading; the test system software powers on the embedded product and initiates various test cases in sequence; when all test cases are executed, the test system software stores the test results and generates a test report; the test system software powers off the embedded product to complete the test.

[0035] Test cases can be customized according to embedded product requirements.

[0036] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A universal automated batch test and verification system for embedded products, characterized in that: include: Universal interface expansion adapter unit, main control unit, switching unit, multi-channel power supply unit, test operation table; The universal interface expansion adapter unit includes a high-speed interface expansion adapter unit, a low-speed interface expansion adapter unit and a computer bus interface expansion adapter unit; the main control unit is connected to the test operation table through a multi-channel power supply unit; the main control unit is connected to the switching unit; The switching unit is connected to the test operation table through the universal interface expansion adapter unit; the test operation table is connected to multiple embedded products; The universal interface expansion adapter unit is used to adapt according to the electrical interface of the embedded product to realize signal excitation and data acquisition of all external interfaces of the embedded product.

2. The universal automated batch test and verification system for embedded products according to claim 1, characterized in that: The main control unit stores test system software, test case library and test database; The main control unit is used to implement test case initiation, test result judgment, and test data storage. It uses the PCIE interface to exchange data with the general interface expansion unit; The main control unit has a standard instrument calling interface, which is used to realize the program control and calling of various standard instruments; the test system software in the main control unit automatically obtains embedded product information through the test console, automatically calls the corresponding test case library and initiates the test; The standard instrument is connected to the test bench.

3. The universal automated batch test verification system for embedded products according to claim 1, characterized in that: The exchange unit is used to realize data exchange between the main control unit and the universal interface expansion unit, and to expand the slots of the universal interface expansion unit according to demand.

4. The universal automated batch test and verification system for embedded products according to claim 1, characterized in that: The multi-channel power supply unit provides independent power supply for embedded products, provides a standard programmable control interface, supports programmable control of the switch of embedded products, supports real-time adjustment of power supply and reading of current values, and supports multi-channel power supply output.

5. The universal automated batch test verification system for embedded products according to claim 1, characterized in that: The test operation table includes a test operation table and a mounting plate; the test operation table and the universal interface expansion adapter unit are connected by cables, and the mounting plate is designed according to the structural shape and interface of the embedded product. The mounting plate only realizes the physical connection between the embedded product interface and the cable.

6. The universal automated batch test and verification system for embedded products according to claim 1, characterized in that: The test operation table can be used to build an automated test line; it can also be installed in a high and low temperature test box or a vibration table to perform environmental tests.

7. A universal automated batch test verification method for embedded products, applicable to the universal automated batch test verification system for embedded products according to any one of claims 1 to 6, characterized in that: include: Install the embedded products on the test operation table in sequence, and install the universal interface expansion adapter unit adapted to the embedded products according to their requirements; turn on the power of the test system and run the test system software in the main control unit; after the test system software is running, automatically obtain the relevant information of the embedded products through the test operation table; The test system software loads the corresponding test case library according to the relevant information of the embedded product, and sends the corresponding test component program to the general interface extension adapter unit. After the general interface extension adapter unit successfully completes the loading, it returns a response; The test system software powers on the embedded product and initiates each test case in sequence; After executing all test cases, the test system software stores the test results and generates a test report; the test system software cuts off the power supply to the embedded product to complete the test.

8. The universal automated batch testing and verification method for embedded products according to claim 7, characterized in that: Test cases are custom configured according to embedded product requirements.