Method, system and equipment for evaluating storage life of electronic complete machine and medium

Abstract

The invention provides an electronic complete machine storage life evaluation method, system and device and a medium, and belongs to the technical field of electronic complete machine storage life evaluation. According to the method for evaluating the storage life of the electronic complete machine, an acceleration factor of the electronic complete machine is determined by using obtained life information of a storage weak component; and if the electronic complete machine has the failure condition or does not have the failure condition within the set time, evaluating the storage life of the electronic complete machine by using the acceleration factor of the electronic complete machine to obtain an evaluation result. Compared with the prior art, the method effectively solves the problems that in the prior art, the method is only suitable for the situation that an electronic product fails, the storage life of the whole electronic machine cannot be evaluated under the situation that the electronic product does not fail, and the life information (acceleration factors) of used weak components is not obtained through a component acceleration test; and the acceleration factor is not accurate enough.

Description

Technical Field

[0001] The present invention belongs to the technical field of storage life assessment of electronic whole machines, and in particular relates to a storage life assessment method, system, equipment and medium for electronic whole machines. Background Art

[0002] The storage life of electronic complete products is an important indicator for measuring equipment performance. For some high-reliability electronic complete products, the storage life is usually required to be relatively long. To obtain the life data of such products, the traditional method is to obtain it through natural environment storage, long-term monitoring and data statistics. Although the traditional method can obtain real data and conclusions, the traditional method has a long test cycle.

[0003] At present, it is usually necessary to evaluate the storage life of electronic equipment during the equipment development stage. In the existing technology, the storage life evaluation of electronic equipment mostly adopts the following methods: the storage life of electronic equipment is evaluated by accelerated storage test, and environmental stress exceeding natural storage conditions is applied to the sample, and the failure or degradation data of the test parameters (such as output current and output voltage) of the sample are collected and recorded. The test data is analyzed and modeled, and then the storage life index under normal stress is inferred.

[0004] The current existing technology uses the accelerated storage test method to evaluate the storage life of electronic devices, which has the following problems: 1) The cost of electronic equipment is relatively high, and it is not possible to invest in a large number of samples for testing.

[0005] 2) During the accelerated test, in most cases the whole machine will not fail, and even the electrical performance will not degrade, which will increase the difficulty of evaluating the storage life of the electronic whole machine. In this case, it is necessary to refer to various standards or acceleration factors of similar whole machine products for evaluation. For example, refer to GJB / Z108B-2010 "Handbook of Reliability Prediction of Electronic Products in Non-Working State", calculate the failure rate of all electronic components in the electronic whole machine at room temperature and high temperature, and combine the failure rate of each electronic component to obtain the whole machine acceleration factor. Because not all electronic components will degrade in the accelerated test, it will affect the performance of the whole machine. Moreover, the component life information used in this method to calculate the acceleration factor is obtained through references, relevant standards, and similar products. Compared with the component life information obtained directly by using component accelerated testing, the obtained whole machine acceleration factor is not accurate enough, which in turn affects the accuracy of the storage life evaluation results of the electronic whole machine.

[0006] For example, the patent application document with application publication number CN116244882A discloses an accelerated storage life test evaluation method for electronic products. This evaluation method can save test time and test samples while obtaining the safe storage period or dangerous storage life of the tested product by calculating the acceleration factor for each situation. However, this evaluation method is only applicable to situations where electronic products fail. It is impossible to evaluate the storage life of the entire electronic device when the electronic product does not fail. Moreover, the life information (acceleration factor) of the weak components used in this evaluation method is not obtained through accelerated component testing, resulting in inaccurate acceleration factors. Summary of the invention

[0007] The purpose of the present invention is to provide a method, system, device and medium for evaluating the storage life of an electronic whole machine, so as to solve the problem that the prior art is only applicable to the situation where the electronic product fails, the storage life of the electronic whole machine cannot be evaluated when the electronic product does not fail, and the life information (acceleration factor) of the weak components used is not obtained by component acceleration testing, resulting in the acceleration factor being not accurate enough.

[0008] In order to achieve the above object, the present invention adopts the following technical solution: In a first aspect, the present invention provides a method for evaluating the storage life of an electronic device, comprising the following steps: Analyze the temperature tolerance of the electronic whole machine to obtain the accelerated test temperature of the electronic whole machine, and conduct accelerated tests on several electronic whole machines according to the test temperature of the electronic whole machine to obtain the weak components; Performing an accelerated test on the obtained weak storage components to obtain life information of the weak storage components, and then determining the acceleration factor of the electronic whole machine using the obtained life information of the weak storage components; If the electronic machine fails or does not fail within the set time, the electronic machine acceleration factor is used to evaluate the storage life of the electronic machine to obtain an evaluation result. The failure refers to the performance parameters of the electronic machine being unable to perform its original functions.

[0009] A further improvement of the present invention is that during an accelerated test of several electronic machines according to the test temperature of the electronic machine, one of the electronic machines is disassembled, and performance parameters of components of the disassembled electronic machine are tested to obtain component performance parameter test results, and based on the component performance parameter test results after the disassembly of the electronic machine, storage weak components and life information of storage weak components are determined.

[0010] A further improvement of the present invention is that the conditions for disassembling one of the electronic machines are as follows: if the electronic machines fail within a set time, the electronic machine that fails the earliest is disassembled; if none of the electronic machines fail within a set time, but the performance parameters of the electronic machines are degraded, the electronic machine with the most severely degraded performance parameters is disassembled; if none of the electronic machines fail within a set time, and the performance parameters of the electronic machines are not degraded, one of the electronic machines is randomly selected for disassembly; the degradation condition refers to the phenomenon that during the accelerated test of the electronic machine, the performance parameters of the electronic machine gradually change, resulting in a decline in the original function of the electronic machine.

[0011] A further improvement of the present invention is that the stopping condition of the accelerated test is: a) If no failure occurs in the electronic device within the set time, the accelerated test will be stopped within the set time; b) If all electronic devices fail within the set time, the accelerated test will be stopped at the last electronic device failure time; c) If a part of the electronic equipment fails within the set time, while the other part of the electronic equipment does not fail, the accelerated test will be stopped within the set time.

[0012] A further improvement of the present invention is that the method for determining the acceleration factor of the electronic whole machine includes: A) When only one type of storage weak component is determined, the acceleration factor of the component is used as the acceleration factor of the electronic whole device, and the acceleration factor refers to the ratio between the characteristic value of life under accelerated stress and the characteristic value of life under normal stress; B) When the number of weak storage components is set, the acceleration factor of the weak storage component that has the greatest impact on the whole machine is used as the acceleration factor of the whole electronic machine; C) When the determined weak storage components are a set number, and the determined weak storage components all have an impact on the entire electronic machine, and the determined weak storage components do not include the weak storage components that have the greatest impact on the entire machine in method B), the acceleration factor after combining the acceleration factors of each weak storage component is used as the acceleration factor of the entire electronic machine.

[0013] A further improvement of the present invention is that, when the determined weak storage components are a set number, and the determined weak storage components all have an impact on the electronic whole machine, and the determined weak storage components do not include the weak storage components that have the greatest impact on the whole machine in mode B), the acceleration factor after the acceleration factors of the weak storage components are integrated is used as the acceleration factor of the electronic whole machine, and the calculation formula of the acceleration factor of the electronic whole machine is:

[0014] in, τ is the electronic machine acceleration factor, is the failure rate of electronic equipment under high temperature, is the failure rate of the entire electronic device at room temperature;

[0015] in, is the failure rate of electronic equipment at room temperature, m To store the types of weak components, For electronic equipment i The number of weak components, It is the failure rate of weak components stored at room temperature;

[0016] in, is the failure rate of electronic equipment under high temperature, For electronic equipment i The number of weak components stored. For the normal temperature i The failure rate of weak storage components, For the i An acceleration factor for storing weak components, m To store the types of weak components, For the i A kind of activation energy stored in weak components, k is the Boltzmann constant, T 0 is normal temperature, T 1 is the acceleration temperature; At room temperature i Failure rate of weak storage components The calculation formula is:

[0017] in, is the failure rate of the i-th type of storage weak component at room temperature, is the average life of the i-th type of storage weak component at room temperature.

[0018] A further improvement of the present invention is that in step 3), if the electronic device fails within the set time, the calculation formula for the storage life is:

[0019] in, The time required for storage life, is the time when the electronic device fails. is the electronic machine acceleration factor; If no failure occurs in the electronic machine within the set time, when the product of the set time and the acceleration factor of the electronic machine is greater than the storage life requirement, the storage life meets the storage period requirement; when the product of the set time and the acceleration factor of the electronic machine is less than or equal to the storage life requirement, the storage life does not meet the storage period requirement.

[0020] In a second aspect, the present invention provides an evaluation system for the storage life of an electronic whole machine, comprising a storage weak component determination module, a storage weak component life information determination module, an electronic whole machine acceleration factor determination module and an electronic whole machine storage life evaluation module; The storage weak component determination module is used to analyze the tolerance temperature of the electronic whole machine to obtain the accelerated test temperature of the electronic whole machine, and to perform accelerated tests on several electronic whole machines according to the electronic whole machine test temperature to obtain the storage weak components; The life information determination module of the stored weak components is used to perform an accelerated test on the obtained stored weak components to obtain the life information of the stored weak components; The electronic whole machine acceleration factor determination module is used to determine the electronic whole machine acceleration factor by using the obtained life information of the stored weak components; The electronic machine storage life assessment module is used to assess the storage life of the electronic machine using the electronic machine acceleration factor to obtain an assessment result if the electronic machine fails or does not fail within a set time. The failure refers to the performance parameters of the electronic machine being unable to perform its original functions.

[0021] In a third aspect, the present invention provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above-mentioned method for evaluating the storage life of an electronic device when executing the computer program.

[0022] In a fourth aspect, the present invention provides a storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the method for evaluating the storage life of an electronic device introduced above.

[0023] Compared with the prior art, the present invention has the following beneficial effects: The present invention belongs to an improved invention. Compared with the existing evaluation method for the storage life of an electronic whole machine, the evaluation method for the storage life of an electronic whole machine proposed by the present invention determines the acceleration factor of the electronic whole machine by using the life information of the obtained storage weak components. If the electronic whole machine fails or does not fail within the set time, the storage life of the electronic whole machine is evaluated by using the acceleration factor of the electronic whole machine. It can be seen that the present invention takes into account two situations: the failure of the electronic whole machine or the failure of the whole machine. In the case that the electronic whole machine does not fail, the present invention can also use the acceleration factor of the electronic whole machine to evaluate the storage life of the electronic whole machine. The evaluation method of the present invention is more widely applicable. Moreover, the life information of the storage weak components of the present invention is obtained by performing an accelerated test on the obtained storage weak components, not directly by the accelerated test of the electronic whole machine. Compared with the prior art, the present invention effectively solves the problem that the prior art is only applicable to the situation where the electronic product fails, the storage life of the electronic whole machine cannot be evaluated when the electronic product does not fail, and the life information (acceleration factor) of the weak components used is not obtained by the accelerated test of the components, resulting in the acceleration factor being inaccurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a flow chart of the method for evaluating the storage life of an electronic device of the present invention; Figure 2 A schematic diagram of an evaluation system for the storage life of an electronic device of the present invention; Figure 3 It is a structural schematic diagram of the electronic device of the present invention. DETAILED DESCRIPTION

[0025] In order to further understand the content of the present invention, the present invention is described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the embodiments are only for explaining the present invention and are not intended to limit it.

[0026] The method for evaluating the storage life of an electronic whole machine proposed in the present invention uses the obtained life information of the stored weak components to determine the acceleration factor of the electronic whole machine. If the electronic whole machine fails or does not fail within the set time, the electronic whole machine acceleration factor is used to evaluate the storage life of the electronic whole machine. Compared with the prior art, the present invention effectively solves the problem that the prior art is only applicable to the situation where the electronic product fails, and the storage life of the electronic whole machine cannot be evaluated when the electronic product does not fail, and the life information (acceleration factor) of the weak components used is not obtained by the component acceleration test, resulting in the acceleration factor being inaccurate.

[0027] Embodiment 1: The flow chart of the method for evaluating the storage life of an electronic device of the present invention is as follows: Figure 1As shown, the method for evaluating the storage life of an electronic device of the present invention comprises the following steps: S1. Analyze the temperature tolerance of the electronic whole machine to obtain the accelerated test temperature of the electronic whole machine, and perform accelerated tests on several electronic whole machines according to the test temperature of the electronic whole machine to obtain storage weak components.

[0028] S2. Performing accelerated tests on the obtained stored weak components to obtain life information of the stored weak components.

[0029] S3. Determine the acceleration factor of the electronic device using the obtained life information of the stored weak components.

[0030] S4. If the electronic device fails or does not fail within the set time, the storage life of the electronic device is evaluated using the electronic device acceleration factor to obtain an evaluation result. The failure condition refers to the performance parameters of the electronic device being unable to perform its original functions.

[0031] Embodiment 2: The schematic diagram of the evaluation system for the storage life of an electronic device of the present invention is as follows: Figure 2 As shown, the electronic machine storage life evaluation system of the present invention includes a storage weak component determination module, a storage weak component life information determination module, an electronic machine acceleration factor determination module and an electronic machine storage life evaluation module.

[0032] The storage weak component determination module is used to analyze the tolerance temperature of the electronic whole machine, obtain the accelerated test temperature of the electronic whole machine, and perform accelerated tests on several electronic whole machines according to the electronic whole machine test temperature to obtain the storage weak components.

[0033] The life information determination module of the stored weak components is used to perform an accelerated test on the obtained stored weak components to obtain the life information of the stored weak components.

[0034] The electronic whole machine acceleration factor determination module is used to determine the electronic whole machine acceleration factor by using the obtained life information of the stored weak components.

[0035] The electronic equipment storage life assessment module is used to assess the storage life of the electronic equipment using the electronic equipment acceleration factor to obtain an assessment result if the electronic equipment fails or does not fail within the set time. The failure refers to the performance parameters of the electronic equipment being unable to perform its original functions.

[0036] Embodiment 3: S1. Analyze the temperature tolerance of the electronic whole machine to obtain the accelerated test temperature of the electronic whole machine, and perform accelerated tests on several electronic whole machines according to the test temperature of the electronic whole machine to obtain storage weak components.

[0037] The tolerance temperature of the electronic equipment is analyzed to obtain the accelerated test temperature of the electronic equipment (e.g. 130 ), perform accelerated tests on a number of electronic devices (e.g. 2-3 electronic devices) according to the electronic device test temperature to obtain storage weak components.

[0038] In this step, during the accelerated test of several electronic machines according to the test temperature of the electronic machine, one of the electronic machines is disassembled, and the performance parameters of the components of the disassembled electronic machine are tested to obtain the test results of the performance parameters of the components, and based on the test results of the performance parameters of the components after the disassembly of the electronic machine, the weak storage components are determined.

[0039] In this step, if the electronic machine fails within the set time, the electronic machine that fails the earliest is selected for disassembly. If no electronic machine fails within the set time, but the performance parameters of the electronic machine are degraded, the electronic machine with the most serious performance parameter degradation is disassembled. If no electronic machine fails within the set time, and the performance parameters of the electronic machine are not degraded, one of the electronic machines is randomly selected for disassembly. The degradation refers to the phenomenon that during the accelerated test of the electronic machine, the performance parameters of the electronic machine gradually change, resulting in a decline in the original function of the electronic machine.

[0040] In this step, the stopping conditions of the accelerated test are: b) If all electronic devices fail within the set time, the accelerated test will be stopped at the last electronic device failure time; c) If a part of the electronic equipment fails within the set time, while the other part of the electronic equipment does not fail, the accelerated test will be stopped within the set time.

[0041] In this step, based on the test results of component performance parameters after the electronic machine is disassembled, the weak storage components are determined. The specific instructions are as follows: a) Analyze the performance parameters of the components tested after the electronic device is disassembled to determine whether the performance parameters (such as power consumption current and output voltage) are within the card limit. If the performance parameters of the tested components exceed the card limit, they are considered to be weak storage components.

[0042] b) If the performance parameters of the disassembled component test do not exceed the card limit, first compare them with the test data before electronic installation to determine whether the performance parameters of the component test have been significantly degraded. If the degradation exceeds 20% of the value between the pre-installation test parameter level and the card limit level, it is considered to be a storage weak component.

[0043] c) If there is no pre-installation test data for comparison, the drift of the test performance parameters is determined. If the performance parameters of the disassembled component test are close to the limit level, and the distance from the limit level is less than 20% of the distance between the upper and lower limit values, it is considered to be a storage weak component.

[0044] The above-mentioned card limits refer to the set test thresholds. Different component manuals have provisions for the card limits of various performance parameters.

[0045] S2. Performing accelerated tests on the obtained stored weak components to obtain life information of the stored weak components.

[0046] The obtained stored weak components are subjected to accelerated tests to obtain life information of the stored weak components.

[0047] S3. Determine the acceleration factor of the electronic device using the obtained life information of the stored weak components.

[0048] The obtained life information of the weak storage components (such as the average life of the weak storage components, the activation energy of the weak storage components and the acceleration factor of the weak storage components) is used to determine the acceleration factor of the electronic whole machine.

[0049] In this step, the electronic equipment acceleration factor is determined by: A) When only one type of storage weak component is identified, the acceleration factor of this component is used as the acceleration factor of the electronic whole machine. The acceleration factor refers to the ratio between the characteristic value of life under accelerated stress and the characteristic value of life under normal stress.

[0050] B) When the determined weak storage components are a set number (the set number in this embodiment is 2, and the set number can be adjusted according to actual market demand), the acceleration factor of the weak storage component that has the greatest impact on the whole machine is used as the acceleration factor of the electronic whole machine.

[0051] C) When the determined storage weak components are a set number, and the determined storage weak components all have an impact on the electronic whole machine, and the determined storage weak components do not include the storage weak components that have the greatest impact on the whole machine in method B), the acceleration factor after the acceleration factors of each storage weak component are combined is used as the acceleration factor of the electronic whole machine. In this case, the calculation formula of the electronic whole machine acceleration factor is:

[0052] in, τ is the electronic machine acceleration factor, is the failure rate of electronic equipment under high temperature, is the failure rate of the entire electronic device at room temperature;

[0053] in, is the failure rate of electronic equipment at room temperature, m To store the types of weak components, For electronic equipment i The number of weak components, It is the failure rate of weak components stored at room temperature;

[0054] in, is the failure rate of electronic equipment under high temperature, For electronic equipment i The number of weak components stored. For the normal temperature i The failure rate of weak storage components, For the i An acceleration factor for storing weak components, m To store the types of weak components, For the i A kind of activation energy stored in weak components, k is the Boltzmann constant, T 0 is normal temperature, T 1 is the acceleration temperature; At room temperature i Failure rate of weak storage components The calculation formula is:

[0055] in, is the failure rate of the i-th type of storage weak component at room temperature, is the average life of the i-th type of storage weak component at room temperature.

[0056] S4. If the electronic device fails or does not fail within the set time, the storage life of the electronic device is evaluated using the electronic device acceleration factor to obtain an evaluation result.

[0057] If the electronic device fails or does not fail within the set time, the electronic device acceleration factor is used to evaluate the storage life of the electronic device to obtain an evaluation result. The failure refers to the performance parameters of the electronic device (such as output current and output voltage, different models of electronic devices have different test parameters) that cannot perform their original functions.

[0058] In this step, if the electronic device fails within the set time, the calculation formula for the storage life is:

[0059] in, The time required for storage life, is the time when the electronic device fails. is the acceleration factor of the electronic machine.

[0060] In this step, if the electronic machine does not fail within the set time, when the product of the set time and the acceleration factor of the electronic machine is greater than the storage life requirement, the storage life meets the storage period requirement; when the product of the set time and the acceleration factor of the electronic machine is less than or equal to the storage life requirement, the storage life does not meet the storage period requirement, and the acceleration time can be extended until the storage life meets the storage period requirement.

[0061] Embodiment 4: See also Figure 3 As shown, the present invention also provides an electronic device 100 for evaluating the storage life of an electronic device; the electronic device 100 includes a memory 101, at least one processor 102, a computer program 103 stored in the memory 101 and executable on the at least one processor 102, and at least one communication bus 104.

[0062] The memory 101 can be used to store the computer program 103. The processor 102 implements the steps of the electronic device storage life evaluation method described in Example 1 by running or executing the computer program stored in the memory 101 and calling the data stored in the memory 101. The memory 101 can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, an application required for at least one function (such as a sound playback function, an image playback function, etc.), etc.; the data storage area can store data (such as audio data) created according to the use of the electronic device 100, etc. In addition, the memory 101 can include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (FlashCard), at least one disk storage device, a flash memory device, or other non-volatile solid-state storage devices.

[0063] The at least one processor 102 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The processor 102 may be a microprocessor or any conventional processor, etc. The processor 102 is the control center of the electronic device 100, and uses various interfaces and lines to connect various parts of the entire electronic device 100.

[0064] The memory 101 in the electronic device 100 stores a plurality of instructions to implement a method for evaluating the storage life of an electronic device, and the processor 102 can execute the plurality of instructions to implement: Analyze the temperature tolerance of the electronic whole machine to obtain the accelerated test temperature of the electronic whole machine, and conduct accelerated tests on several electronic whole machines according to the test temperature of the electronic whole machine to obtain the weak components; Performing accelerated tests on the obtained stored weak components to obtain life information of the stored weak components; The acceleration factor of the electronic whole machine is determined by using the obtained life information of the stored weak components; If the electronic machine fails or does not fail within the set time, the electronic machine acceleration factor is used to evaluate the storage life of the electronic machine to obtain an evaluation result. The failure refers to the performance parameters of the electronic machine being unable to perform its original functions.

[0065] Embodiment 5: If the module / unit integrated in the electronic device 100 is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the process in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device that can carry the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory and read-only memory (ROM, Read-Only Memory).

[0066] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0067] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0068] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0069] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0070] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A method for evaluating the storage life of an electronic device, characterized in that: The following steps are involved: Analyze the temperature tolerance of the electronic whole machine to obtain the accelerated test temperature of the electronic whole machine, and conduct accelerated tests on several electronic whole machines according to the test temperature of the electronic whole machine to obtain the weak components; Performing accelerated tests on the obtained stored weak components to obtain life information of the stored weak components; The acceleration factor of the electronic whole machine is determined by using the obtained life information of the stored weak components; If the electronic machine fails or does not fail within the set time, the electronic machine acceleration factor is used to evaluate the storage life of the electronic machine to obtain an evaluation result. The failure refers to the performance parameters of the electronic machine being unable to perform its original functions.

2. The method for evaluating the storage life of an electronic device according to claim 1, characterized in that: During an accelerated test of several electronic machines according to the test temperature of the electronic machine, one of the electronic machines is disassembled, and performance parameters of components after the electronic machine is disassembled are tested to obtain component performance parameter test results, and weak storage components are determined based on the component performance parameter test results after the electronic machine is disassembled.

3. The method for evaluating the storage life of an electronic device according to claim 2, characterized in that: The conditions for disassembling one of the electronic machines are as follows: if the electronic machines fail within a set time, the electronic machine with the earliest failure will be disassembled; if none of the electronic machines fail within a set time, but the performance parameters of the electronic machines are degraded, the electronic machine with the most serious performance parameter degradation will be disassembled; if none of the electronic machines fail within a set time, and the performance parameters of the electronic machines are not degraded, one of the electronic machines is randomly selected for disassembly; the degradation condition refers to the phenomenon that during the accelerated test of the electronic machine, the performance parameters of the electronic machine gradually change, resulting in a decline in the original function of the electronic machine.

4. The method for evaluating the storage life of an electronic device according to claim 1, characterized in that: The stopping conditions for the accelerated test are: a) If no failure occurs in the electronic device within the set time, the accelerated test will be stopped within the set time; b) If all electronic devices fail within the set time, the accelerated test will be stopped at the last electronic device failure time; c) If a part of the electronic equipment fails within the set time, while the other part of the electronic equipment does not fail, the accelerated test will be stopped within the set time.

5. The method for evaluating the storage life of an electronic device according to claim 1, characterized in that: The methods for determining the acceleration factor of an electronic whole machine include: A) When only one type of storage weak component is determined, the acceleration factor of the component is used as the acceleration factor of the electronic whole device, and the acceleration factor refers to the ratio between the characteristic value of life under accelerated stress and the characteristic value of life under normal stress; B) When the number of weak storage components is set, the acceleration factor of the weak storage component that has the greatest impact on the whole machine is used as the acceleration factor of the whole electronic machine; C) When the determined weak storage components are a set number, and the determined weak storage components all have an impact on the entire electronic machine, and the determined weak storage components do not include the weak storage components that have the greatest impact on the entire machine in method B), the acceleration factor after combining the acceleration factors of each weak storage component is used as the acceleration factor of the entire electronic machine.

6. The method for evaluating the storage life of an electronic device according to claim 5, characterized in that: When the determined storage weak components are the set number, and the determined storage weak components all have an impact on the electronic whole machine, and the determined storage weak components do not include the storage weak components that have the greatest impact on the whole machine in method B), the acceleration factor after the acceleration factors of the storage weak components are combined is used as the acceleration factor of the electronic whole machine. The calculation formula of the electronic whole machine acceleration factor is: in, τ is the electronic machine acceleration factor, is the failure rate of electronic equipment under high temperature, is the failure rate of the entire electronic device at room temperature; in, is the failure rate of electronic equipment at room temperature, m To store the types of weak components, For electronic equipment i The number of weak components, It is the failure rate of weak components stored at room temperature; in, is the failure rate of electronic equipment under high temperature, For electronic equipment i The number of weak components stored. For the normal temperature i The failure rate of weak storage components, For the i An acceleration factor for storing weak components, m To store the types of weak components, For the i A kind of activation energy stored in weak components, k is the Boltzmann constant, T 0 is normal temperature, T 1 is the acceleration temperature; At room temperature i Failure rate of weak storage components The calculation formula is: in, is the failure rate of the i-th type of storage weak component at room temperature, is the average life of the i-th type of storage weak component at room temperature.

7. The method for evaluating the storage life of an electronic device according to claim 1, characterized in that: If the electronic device fails within the set time, the calculation formula for storage life is: in, The time required for storage life, is the time when the electronic device fails. is the electronic machine acceleration factor; If no failure occurs in the electronic machine within the set time, when the product of the set time and the acceleration factor of the electronic machine is greater than the storage life requirement, the storage life meets the storage period requirement; when the product of the set time and the acceleration factor of the electronic machine is less than or equal to the storage life requirement, the storage life does not meet the storage period requirement.

8. An evaluation system for the storage life of an electronic device, characterized in that: It includes a storage weak component determination module, a storage weak component life information determination module, an electronic whole machine acceleration factor determination module and an electronic whole machine storage life evaluation module; The storage weak component determination module is used to analyze the tolerance temperature of the electronic whole machine to obtain the accelerated test temperature of the electronic whole machine, and to perform accelerated tests on several electronic whole machines according to the electronic whole machine test temperature to obtain the storage weak components; The life information determination module of the stored weak components is used to perform an accelerated test on the obtained stored weak components to obtain the life information of the stored weak components; The electronic whole machine acceleration factor determination module is used to determine the electronic whole machine acceleration factor by using the obtained life information of the stored weak components; The electronic machine storage life assessment module is used to assess the storage life of the electronic machine using the electronic machine acceleration factor to obtain an assessment result if the electronic machine fails or does not fail within a set time. The failure refers to the performance parameters of the electronic machine being unable to perform its original functions.

9. An electronic device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method for evaluating the storage life of an electronic device according to any one of claims 1 to 7 are implemented.

10. A storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method for evaluating the storage life of an electronic device according to any one of claims 1 to 7 are implemented.

Images