Multi-machine synchronous automatic test method, system, equipment and medium

Abstract

The invention discloses a multi-machine synchronous automatic test method, system, device and medium, and the method comprises the steps: generating a test signal of each to-be-tested device through a cloud platform, and transmitting the test signal of each to-be-tested device to the corresponding to-be-tested device; synchronously testing the to-be-tested equipment according to each test signal to obtain a test result; the test results of the to-be-tested devices are analyzed, multi-machine synchronous automatic testing is completed, and testing synchronism and accuracy of the method, the system, the devices and the medium are good.

Description

Technical Field

[0001] The invention belongs to the field of automatic testing, and relates to a multi-machine synchronous automatic testing method, system, equipment and medium. Background Art

[0002] The OCC control center provided by the foreign company OMICRON is a serialized test module, but it lacks automated test functions such as automatic reading of set values ​​and automatic insertion and withdrawal of pressure plates. The OCC system cannot automatically capture the parameters of the protection device as a whole and automatically control the connection test process, and its test process still requires manual intervention. At the same time, OCC lacks a standardized communication interface with the protection device, and its compatibility and scalability are poor. Overall, there are no application examples of one-button, fully automated protection device testing technology based on the IEC61850 standard abroad.

[0003] GPS (Global Positioning System) technology plays a key role in the multi-machine synchronous automatic test system. The system uses GPS signals to ensure accurate time synchronization between multiple test equipment, thereby realizing synchronous control and data acquisition of the system. In the power system, GPS technology can be used for power angle measurement and synchronous phasor applications, which is crucial for the stable operation and control of the power system. Through real-time phasor measurement based on GPS, the state quantity of the power grid can be obtained in real time, that is, the historical data and current trajectory of the actual system accurate model can be obtained. In addition, the multi-motor synchronous coordination system has also been widely used in the field of motor control, and the control strategy plays a decisive role in the performance of the multi-motor synchronous system. Domestic and foreign scholars have conducted in-depth research on the problem of multi-motor synchronization and proposed a variety of solutions. In the automatic test system, high-precision time synchronization technology is the key to achieving multi-machine synchronization.

[0004] There have always been studies on automatic testing in China, such as Beijing Bodian's fully automatic relay protection automatic testing system, but it has not been widely promoted and applied. In summary, the problems that still exist are as follows:

[0005] Many tests require multiple testers to output current and voltage analog values ​​simultaneously to facilitate fault state simulation. Since there are certain synchronization differences in the analog outputs between the testers, the device sampling is biased, so the test accuracy is poor. Summary of the invention

[0006] The purpose of the present invention is to overcome the shortcomings of the above-mentioned prior art and provide a multi-machine synchronous automatic testing method, system, equipment and medium, which have good testing synchronization and accuracy.

[0007] In order to achieve the above object, the present invention adopts the following technical scheme:

[0008] In one aspect of the present invention, the multi-machine synchronous automatic testing method of the present invention comprises:

[0009] Generate test signals for each device under test through the cloud platform, and send the test signals for each device under test to the corresponding device under test;

[0010] Perform synchronous testing on the device under test according to each test signal to obtain the test result;

[0011] The test results of each device under test are analyzed to complete multi-machine synchronous automatic testing.

[0012] The multi-machine synchronous automatic testing method of the present invention is further improved in that:

[0013] Furthermore, the test signal includes a fault current signal, a fault voltage signal and a fault triggering time of the device under test.

[0014] Furthermore, the process of analyzing the test results of each device under test is as follows:

[0015] According to the test results of each device under test, the action time of each device under test is obtained;

[0016] Determine the error distribution of the action time of each device under test relative to a preset reference action time;

[0017] The performance of each device under test is evaluated according to the error distribution.

[0018] Furthermore, the device under test is synchronously tested according to each test signal to obtain a test result, and the process of obtaining the test result is:

[0019] Using GPS or Beidou, according to each test signal, the device under test is synchronously tested to obtain the test results.

[0020] In a second aspect of the present invention, the multi-machine synchronous automatic testing system of the present invention comprises:

[0021] A generation module is used to generate a test signal for each device under test through the cloud platform, and send the test signal of each device under test to the corresponding device under test;

[0022] The test module is used to perform synchronous tests on the device under test according to each test signal to obtain the test results;

[0023] The analysis module is used to analyze the test results of each device under test and complete multi-machine synchronous automatic testing.

[0024] The multi-machine synchronous automatic testing system of the present invention is further improved in that:

[0025] Furthermore, the test signal includes a fault current signal, a fault voltage signal and a fault triggering time of the device under test.

[0026] Furthermore, the analysis module includes:

[0027] An analysis module, used for obtaining the action time of each device under test according to the test results of each device under test;

[0028] A determination module, used to determine the error distribution of the action time of each device under test relative to a preset reference action time;

[0029] An evaluation module is used to evaluate the performance of each device under test according to the error distribution.

[0030] Furthermore, the process of performing synchronous testing on the device under test according to each test signal to obtain the test result is as follows:

[0031] Using GPS or Beidou, according to each test signal, the device under test is synchronously tested to obtain the test results.

[0032] In a third aspect of the present invention, the computer device of the present invention comprises a memory, a processor and a computer program stored in the memory and executable on the processor, and the processor implements the steps of the multi-machine synchronous automatic testing method when executing the computer program.

[0033] In a fourth aspect of the present invention, the computer-readable storage medium of the present invention stores a computer program, and when the computer program is executed by a processor, the steps of the multi-machine synchronous automatic testing method are implemented.

[0034] The present invention has the following beneficial effects:

[0035] During specific operation, the multi-machine synchronous automatic testing method, system, equipment and medium described in the present invention uniformly generate test signals for each device under test through a cloud platform, and then send the test signals of each device under test to the corresponding device under test, and perform synchronous tests on the devices under test according to each test signal. It should be noted that the present invention uniformly generates test signals for each device under test through a cloud platform to improve the accuracy and synchronization of the synchronous testing of each device under test.

[0036] Furthermore, the test signal includes a fault current signal, a fault voltage signal and a fault triggering time of the device under test. Using GPS or Beidou, the device under test is synchronously tested according to each test signal to obtain a test result. Among them, the positioning and timing functions of GPS or Beidou are used to enable each device under test to be triggered tested at the same fault triggering time to improve the accuracy of the synchronous test. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The accompanying drawings constituting a part of the present invention are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the accompanying drawings:

[0038] Figure 1 is a flow chart of the method of the present invention;

[0039] Figure 2 It is a system structure diagram of the present invention. DETAILED DESCRIPTION

[0040] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiment of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiment of the present invention. Obviously, the described embodiment is only an embodiment of a part of the present invention, not all embodiments, and is not intended to limit the scope of the present invention. In addition, in the following description, the description of well-known structures and technologies is omitted to avoid unnecessary confusion of the concepts disclosed in the present invention. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work should fall within the scope of protection of the present invention.

[0041] The accompanying drawings show schematic diagrams of structures according to embodiments disclosed in the present invention. These figures are not drawn to scale, and some details are magnified and some details may be omitted for the purpose of clear expression. The shapes of various regions and layers shown in the figures and the relative sizes and positional relationships therebetween are only exemplary, and may deviate in practice due to manufacturing tolerances or technical limitations, and those skilled in the art may additionally design regions / layers with different shapes, sizes, and relative positions according to actual needs.

[0042] Embodiment 1

[0043] refer to Figure 1 The multi-machine synchronous automatic testing method of the present invention comprises the following steps:

[0044] 1) Generate a test signal for each device under test through the cloud platform, and send the test signal of each device under test to the corresponding device under test, wherein the device under test may be a relay protection device;

[0045] 2) The device under test performs a synchronous test according to the test signal to obtain a test result;

[0046] 3) Analyze the test results of each device under test and complete multi-machine synchronous automatic testing.

[0047] It should be noted that the test environment, test resources and test tools are deployed on the cloud platform, so that each device under test can remotely access and use the test environment, test resources and test tools on the cloud platform through the network, and at the same time, combined with GPS / Beidou synchronization, various types of tests can be performed on each device under test, such as line fiber differential testing, cross-interval protection testing, and remote testing.

[0048] It should be noted that the present invention adopts cloud services. In the remote multi-machine test system, a host formulates the test plan and completes the parameter setting. The test parameters are then transmitted to each device under test through the cloud service, and the host issues a test command for the device under test to perform the test. After the test is completed, the test results of each device under test are uniformly transmitted to the host for comparison, analysis and evaluation. Compared with the current multi-machine synchronous testing at home and abroad, the design, calculation and result comparison and analysis of the test plan are completed by a host, eliminating the coordination of multiple machines in the test and the summary analysis of the test results.

[0049] In addition, in actual operation, the whole site configuration file SCD file can be obtained and parsed to obtain the test cases and the intelligent analysis scheme of the test results to improve the efficiency and quality of the test.

[0050] For example, when the device under test is a relay protection device, the test signal includes a fault current signal, a fault voltage signal and a fault triggering time, then the OMICRON relay protection tester generates the fault current signal, the fault voltage signal and the fault triggering time of each device under test, and then sends the fault current signal, the fault voltage signal and the fault triggering time of each device under test to the corresponding devices under test, each device under test is tested synchronously according to the fault current signal, the fault voltage signal and the fault triggering time, using the triggering time and position determined by GPS or Beidou to obtain the test results, and then the test results of the device under test are analyzed, and a comparison curve of the action time of each relay protection device is drawn to obtain the error distribution of the action time of each relay protection device relative to the benchmark action time, and the performance of each relay protection device is evaluated according to the error distribution of the action time of each relay protection device relative to the benchmark time, wherein the larger the error, the worse the performance of the relay protection device.

[0051] According to prediction, the present invention can save 70% of manpower time, greatly improve the efficiency of on-site debugging, and effectively solve the problem of slow test progress and low debugging quality caused by uneven technical levels of on-site debugging personnel. The scheme can replace the tedious work that needs to be performed manually during the test process through automated operations, such as manually applying voltage, control word signals, setting protection settings, and restoring these settings after the test, thereby greatly improving the degree of automation of on-site debugging. At the same time, the scheme can automatically generate standardized test reports, effectively avoiding the problems of inaccurate results and omissions that may be caused by manual transcription of test results, and ensuring the authenticity and reliability of test results. This scheme can play an important role in the debugging of protection devices and is worthy of wide promotion and application.

[0052] The present invention is based on GPS technology or Beidou, provides high-precision time signals and location information, realizes synchronization and coordination among multiple test devices, and thus improves the accuracy and reliability of the test.

[0053] Embodiment 2

[0054] refer to Figure 2 The multi-machine synchronous automatic testing system of the present invention comprises:

[0055] A generating module, used for generating a test signal for each device under test, and sending the test signal for each device under test to the corresponding device under test;

[0056] The test module is used to perform synchronous tests on the device under test according to each test signal to obtain the test results;

[0057] The analysis module is used to analyze the test results of each device under test and complete multi-machine synchronous automatic testing.

[0058] As an implementation manner of the present invention, the test signal includes a fault current signal, a fault voltage signal and a fault triggering time of the device under test.

[0059] As an embodiment of the present invention, the analysis module includes:

[0060] An analysis module, used for obtaining the action time of each device under test according to the test results of each device under test;

[0061] A determination module, used to determine the error distribution of the action time of each device under test relative to a preset reference action time;

[0062] An evaluation module is used to evaluate the performance of each device under test according to the error distribution.

[0063] As an implementation mode of the present invention, the process of performing synchronous testing on the device under test according to each test signal to obtain the test result is as follows:

[0064] Using GPS or Beidou, according to each test signal, the device under test is synchronously tested to obtain the test results.

[0065] The division of modules in the embodiments of the present application is schematic and is only a logical function division. There may be other division methods in actual implementation. In addition, each functional module in each embodiment of the present application may be integrated into a processor, or may exist physically separately, or two or more modules may be integrated into one module. The above-mentioned integrated modules may be implemented in the form of hardware or in the form of software functional modules.

[0066] Embodiment 3

[0067] A computer device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the multi-machine synchronous automatic test method are implemented, for example, including: generating a test signal for each device under test, sending the test signal of each device under test to the corresponding device under test; performing synchronous tests on the device under test according to each test signal to obtain a test result; analyzing the test results of each device under test to complete the multi-machine synchronous automatic test. The process of analyzing the test results of each device under test is: obtaining the action time of each device under test according to the test results of each device under test; determining the error distribution of the action time of each device under test relative to the preset reference action time; and evaluating the performance of each device under test according to the error distribution. Among them, the memory may include a memory, such as a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk memory, etc. The processor, the network interface, and the memory are interconnected through an internal bus, and the internal bus may be an industrial standard architecture bus, a peripheral component interconnection standard bus, an extended industrial standard structure bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. The memory is used to store programs. Specifically, the program may include program codes, and the program codes include computer operation instructions. The memory may include internal memory and non-volatile memory, and provide instructions and data to the processor.

[0068] Embodiment 4

[0069] A computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the multi-machine synchronous automatic test method are implemented, for example, including: generating a test signal for each device under test, sending the test signal of each device under test to the corresponding device under test; performing synchronous tests on the device under test according to each test signal to obtain a test result; analyzing the test results of each device under test to complete the multi-machine synchronous automatic test. The process of analyzing the test results of each device under test is: obtaining the action time of each device under test according to the test results of each device under test; determining the error distribution of the action time of each device under test relative to the preset reference action time; and evaluating the performance of each device under test according to the error distribution. Specifically, the computer-readable storage medium includes, but is not limited to, for example, volatile memory and / or non-volatile memory. The volatile memory may include a random access memory (RAM) and / or a cache memory (cache), etc. The non-volatile memory may include a read-only memory (ROM), a hard disk, a flash memory, an optical disk, a magnetic disk, etc.

[0070] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented in one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that include computer-usable program code.

[0071] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0072] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0073] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0074] Those skilled in the art will readily appreciate other embodiments of the present invention after considering the specification and disclosure of the invention. This application is intended to cover any variations, uses or adaptations of the present invention that follow the general principles of the present invention and include common knowledge or customary techniques in the art that are not disclosed by the present invention. The specification and examples are to be considered exemplary only, and the true scope and spirit of the present invention are indicated by the following claims.

[0075] It should be understood that the present invention is not limited to the exact construction that has been described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present invention is limited only by the appended claims.

[0076] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any way. Any simple modification, change and equivalent structural change made to the above embodiment based on the technical essence of the present invention still falls within the protection scope of the technical solution of the present invention.

Claims

1. A multi-machine synchronous automatic testing method, characterized in that: include: Generate test signals for each device under test through the cloud platform, and send the test signals for each device under test to the corresponding device under test; Perform synchronous testing on the device under test according to each test signal to obtain the test result; The test results of each device under test are analyzed to complete multi-machine synchronous automatic testing.

2. The multi-machine synchronous automatic testing method according to claim 1, characterized in that: The test signal includes a fault current signal, a fault voltage signal and a fault triggering time of the device under test.

3. The multi-machine synchronous automatic testing method according to claim 1, characterized in that: The process of analyzing the test results of each device under test is as follows: According to the test results of each device under test, the action time of each device under test is obtained; Determine the error distribution of the action time of each device under test relative to a preset reference action time; The performance of each device under test is evaluated according to the error distribution.

4. The multi-machine synchronous automatic testing method according to claim 1, characterized in that: The device under test is synchronously tested according to each test signal to obtain the test result. The process of obtaining the test result is as follows: Using GPS or Beidou, according to each test signal, the device under test is synchronously tested to obtain the test results.

5. A multi-machine synchronous automatic testing system, characterized in that: include: A generation module is used to generate a test signal for each device under test through the cloud platform, and send the test signal of each device under test to the corresponding device under test; The test module is used to perform synchronous tests on the device under test according to each test signal to obtain the test results; The analysis module is used to analyze the test results of each device under test and complete multi-machine synchronous automatic testing.

6. The multi-machine synchronous automatic testing system according to claim 5, characterized in that: The test signal includes a fault current signal, a fault voltage signal and a fault triggering time of the device under test.

7. The multi-machine synchronous automatic testing system according to claim 5, characterized in that: The analysis module comprises: An analysis module, used for obtaining the action time of each device under test according to the test results of each device under test; A determination module, used to determine the error distribution of the action time of each device under test relative to a preset reference action time; An evaluation module is used to evaluate the performance of each device under test according to the error distribution.

8. The multi-machine synchronous automatic testing system according to claim 5, characterized in that: The process of performing synchronous testing on the device under test according to each test signal and obtaining the test result is as follows: Using GPS or Beidou, according to each test signal, the device under test is synchronously tested to obtain the test results.

9. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the multi-machine synchronous automatic testing method as described in any one of claims 1-4 are implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the multi-machine synchronous automatic testing method as described in any one of claims 1 to 4 are implemented.

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