Test adjusting device and method for quartz crystal oscillator

Abstract

The invention provides a test adjusting device and method for a quartz crystal oscillator, a rack is fixedly provided with a bearing plate, the bearing plate is fixedly provided with a rotating device, a first manipulator, a second manipulator, a feeding mechanism and a packaging mechanism, the first manipulator takes out the quartz crystal oscillator and a chip from the feeding mechanism, and places the quartz crystal oscillator and the chip on a test seat; the frequency of the quartz crystal oscillator and the ID of the chip are tested through a circuit module on the circuit, a circuit adjusting instruction is extended according to the frequency of the quartz crystal oscillator, the circuit adjusting instruction is bound with the ID of the chip and stored in a database, and the tested quartz crystal oscillator and the chip are taken out through a second mechanical arm and placed on a packaging mechanism to be packaged. The quartz crystal oscillator and the chip are physically bound, the ID of the chip is matched with the data layer of the circuit adjustment instruction for binding, the test process of the quartz crystal oscillator is rapidly completed, the use of an IC chip is omitted in the data storage process, the production cost is reduced, and the economic benefit is improved.

Description

Technical Field

[0001] The invention belongs to the technical field of oscillator testing, and in particular relates to a testing and adjusting device and method for a quartz crystal oscillator. Background Art

[0002] Quartz crystal oscillators are passive components that generate stable frequencies and are widely used in various communication systems and terminals. With the widespread use of new electronic devices such as mobile phones and GPS, the demand for quartz crystal oscillators has been growing at a double-digit rate each year. In the use of quartz crystal oscillators, since quartz cannot be processed together with the materials currently used in the production of large-scale circuits, quartz crystal oscillators have always existed as a separate component.

[0003] Since the frequency of an unadjusted quartz crystal oscillator will have a large range of deviations as the ambient temperature changes, this problem greatly limits the application scope of this type of product, so the oscillation circuit of the quartz crystal oscillator must be adjusted through technical means to make the frequency change of the quartz crystal oscillator meet the requirements. In order to achieve the above purpose, the law of frequency change of each unadjusted quartz crystal oscillator with temperature changes must be tested and then adjusted, so it is urgent to develop testing technology for quartz crystal oscillators and corresponding oscillation circuit adjustment technology.

[0004] The Chinese invention patent with the authorization publication number CN1657957A discloses a test adjustment device for a quartz crystal oscillator and a test adjustment method thereof. The device includes a processing center, a transmission module and a test adjustment module. The processing center and the test adjustment module are connected to each other through the transmission module. The test adjustment module includes a power supply, a frequency meter and an adjustment circuit. The power supply supplies power to other components or circuits of the test adjustment module respectively. The frequency meter and the adjustment circuit can also be connected to an external quartz crystal oscillator. The frequency meter tests the performance parameters of the quartz crystal oscillator and transmits the performance parameters to the processing center through the transmission module. The processing center controls the frequency meter to work through the transmission module at the same time, processes the received performance parameters, and then controls the adjustment circuit to adjust the quartz crystal oscillator according to the processing results. The present invention solves the shortcomings of the prior art in large-scale test adjustment of quartz crystal oscillators and effectively improves the production technology of quartz crystal oscillators. However, the patent requires that the adjustment instructions be written into the IC chip bundled with the quartz crystal resonator. In the production process, the addition of the IC chip leads to an increase in production costs. Summary of the invention

[0005] The object of the present invention is to provide a test and adjustment device and method for a quartz crystal oscillator to solve the problems raised in the above background technology.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a test and adjustment device for a quartz crystal oscillator, comprising a frame, a support plate is fixedly installed on the frame, a rotating device, a first manipulator, a second manipulator, a feeding mechanism and a packaging mechanism are fixedly installed on the support plate, the rotating device comprises a driving device and a rotating disk, the driving device is connected to the rotating disk through a main shaft drive, a test seat is fixedly installed on the end surface of the rotating disk, the test seat is provided with a chip connecting seat and an oscillator connecting seat, a clamping motor is fixedly installed on the end surface of the test seat, and the clamping motor drives the connection between the first clamping arm and the second clamping arm.

[0007] Preferably, a protective shell is fixedly mounted on the bottom of the rotating disk, and a circuit board is fixedly mounted inside the protective shell.

[0008] Preferably, the circuit board is provided with a wireless communication module, and the wireless communication module is a 2-4G WIFI module.

[0009] Preferably, the first manipulator and the second manipulator are both driven and connected to a synchronous grasping mechanism, the synchronous grasping mechanism comprises a moving seat and a driving cylinder, the driving cylinder is driven and connected to the moving seat, and the moving seat is fixedly mounted with a first suction nozzle and a second suction nozzle.

[0010] Preferably, both the first pressing arm and the second pressing arm are fixedly mounted with a silicone top block.

[0011] Preferably, the feeding mechanism comprises a first guide, a quartz crystal oscillator reel and a chip reel, and the first guide is provided with a quartz crystal oscillator belt guide groove and a chip belt guide groove.

[0012] Preferably, the packaging mechanism comprises a winding mechanism, a second guide and an empty braid reel, the winding mechanism comprises a hot melt roller, a packaging reel and a film reel, and the second guide is provided with a braid guide groove.

[0013] A method for testing and adjusting a quartz crystal oscillator, comprising the testing and adjusting device for the quartz crystal oscillator, comprising:

[0014] S1: The first manipulator takes out the quartz crystal oscillator and the chip from the feeding mechanism at the same time and places them accurately on the test seat. The quartz crystal oscillator is placed in the oscillator connection seat, and the chip is placed in the chip connection seat;

[0015] S2: The clamping motor starts to drive the first clamping arm and the second clamping arm to clamp the chip and the quartz crystal oscillator respectively;

[0016] S3: The rotating device starts, drives the rotating disk to rotate 90 degrees, and switches the test seat on the rotating disk;

[0017] S4: The circuit board obtains the frequency of the quartz crystal oscillator and the ID of the chip, produces a data pair, and sends the data to the main controller through the wireless communication module;

[0018] S5: The main controller generates a circuit adjustment instruction according to the received data pair and the frequency of the quartz crystal oscillator. The circuit adjustment instruction is bound to the chip ID and stored in the database;

[0019] S6: The second robot takes out the tested quartz crystal oscillator and chip, puts them into the tape, and packs them through the packaging mechanism.

[0020] Preferably, the braid is provided with a quartz crystal oscillator box body and a chip box body, and the quartz crystal oscillator box body and the chip box body are alternately arranged along the length direction of the braid.

[0021] Preferably, the database is a cloud database.

[0022] Compared with the prior art, the present invention has the following beneficial effects:

[0023] The present invention takes out a quartz crystal oscillator and a chip from a feeding mechanism through a first manipulator. At this time, the quartz crystal oscillator and the chip are a pair of bound test units, which are placed on a test seat. The frequency of the quartz crystal oscillator and the ID of the chip are tested through a circuit module on the circuit. A circuit adjustment instruction is extended according to the frequency of the quartz crystal oscillator, and is bound to the chip ID and stored in a database. The tested quartz crystal oscillator and chip are taken out by a second manipulator and placed in a packaging mechanism for packaging, so that the quartz crystal oscillator and the chip are physically bound, and the chip ID is bound to the data layer of the circuit adjustment instruction to quickly complete the test process of the quartz crystal oscillator. The data storage process eliminates the use of IC chips, reduces production costs, and improves economic benefits. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is the first perspective structural view of the present invention.

[0025] Figure 2 This is the second perspective structural view of the present invention.

[0026] Figure 3 It is a partial structural view of the present invention.

[0027] Figure 4 It is a structural view of the rotating device of the present invention.

[0028] Figure 5 It is a structural view of the test socket of the present invention.

[0029] Figure 6 It is a bottom structural view of the rotating disk of the present invention.

[0030] Figure 7 It is a structural view of the synchronous grasping mechanism of the present invention.

[0031] Markings in the figure: frame 1, support plate 2, rotating device 3, first manipulator 4, second manipulator 5, feeding mechanism 6, packaging mechanism 7, driving device 8, rotating disk 9, spindle 10, test seat 11, chip connecting seat 12, oscillator connecting seat 13, clamping motor 14, first clamping arm 15, second clamping arm 16, protective shell 17, circuit board 18, synchronous grasping mechanism 19, moving seat 20, driving cylinder 21, first suction nozzle 22, second suction nozzle 23, silicone top block 24, first guide 25, quartz crystal oscillator reel 26, chip reel 27, quartz crystal oscillator belt guide groove 28, chip belt guide groove 29, winding mechanism 30, second guide 31, empty braiding reel 32, hot melt roller 33, packaging reel 34, film reel 35, braiding guide groove 36. DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0033] Embodiment 1:

[0034] like Figure 1-Figure 7As shown, a test and adjustment device for a quartz crystal oscillator provided by the present invention comprises a frame 1, on which a support plate 2 is fixedly mounted, on which a rotating device 3, a first manipulator 4, a second manipulator 5, a feeding mechanism 6 and a packaging mechanism 7 are fixedly mounted, the rotating device 3 comprises a driving device 8 and a rotating disk 9, the driving device 8 is connected to the rotating disk 9 by driving through a main shaft 10, a test seat 11 is fixedly mounted on the end face of the rotating disk 9, the test seat 11 is provided with a chip connection seat 12 and an oscillator connection seat 13, a clamping motor 14 is fixedly mounted on the end face of the test seat 11, and the clamping motor 14 is connected to the first clamping arm 15 and the second clamping arm 16 by driving. A protective shell 17 is fixedly mounted on the bottom of the rotating disk 9, and a circuit board 18 is fixedly mounted in the protective shell 17. The circuit board 18 is provided with a wireless communication module, and the wireless communication module is a 2-4G WIFI module. The first manipulator 4 and the second manipulator 5 are both driven and connected with a synchronous grasping mechanism 19, and the synchronous grasping mechanism 19 includes a moving seat 20 and a driving cylinder 21. The driving cylinder 21 is driven and connected to the moving seat 20, and the moving seat 20 is fixedly installed with a first suction nozzle 22 and a second suction nozzle 23. The first clamping arm 15 and the second clamping arm 16 are both fixedly installed with a silicone top block 24. The feeding mechanism 6 includes a first guide 25, a quartz crystal oscillator reel 26 and a chip reel 27. The first guide 25 is provided with a quartz crystal oscillator belt guide groove 28 and a chip belt guide groove 29. The packaging mechanism 7 includes a winding mechanism 30, a second guide 31 and an empty braided tape reel 32. The winding mechanism 30 includes a hot melt roller 33, a packaging reel 34 and a film reel 35, and the second guide 31 is provided with a braided tape guide groove 36.

[0035] A test and adjustment method for a quartz crystal oscillator, including a test and adjustment device for a quartz crystal oscillator, comprising: S1: a first manipulator 4 simultaneously takes out a quartz crystal oscillator and a chip from a feeding mechanism 6, and accurately places them on a test seat 11, the quartz crystal oscillator is placed in an oscillator connection seat 13, and the chip is placed in a chip connection seat 12; S2: a clamping motor 14 is started, driving a first clamping arm 15 and a second clamping arm 16 to clamp the chip and the quartz crystal oscillator respectively; S3: a rotating device 3 is started, driving a rotating disk 9 to rotate 90 degrees, and switching the test seat 11 on the rotating disk 9; S4: a circuit board 18 obtains the frequency of the quartz crystal oscillator and the ID of the chip, produces a data pair, and sends the data to a main controller through a wireless communication module; S5: the main controller generates a circuit adjustment instruction according to the received data pair and the frequency of the quartz crystal oscillator, the circuit adjustment instruction is bound to the chip ID, and is stored in a database; S6: a second manipulator 5 takes out the tested quartz crystal oscillator and chip, puts them into a braid, and packages them through a packaging mechanism 7. The braid is provided with a quartz crystal oscillator box and a chip box, and the quartz crystal oscillator box and the chip box are alternately arranged along the length direction of the braid. The database is a cloud database.

[0036] Through the above technical scheme, the present invention takes out the quartz crystal oscillator and the chip from the feeding mechanism 6 through the first manipulator 4. At this time, the quartz crystal oscillator and the chip are a pair of bound test units, which are placed on the test seat 11. The frequency of the quartz crystal oscillator and the ID of the chip are tested through the circuit module on the circuit. According to the frequency of the quartz crystal oscillator, the circuit adjustment instruction is extended and stored in the database with the chip ID binding. The tested quartz crystal oscillator and chip are taken out by the second manipulator 5 and placed in the packaging mechanism 7 for packaging, so that the quartz crystal oscillator and the chip are physically bound, and the chip ID is bound with the data layer of the circuit adjustment instruction to quickly complete the test process of the quartz crystal oscillator. The data storage process eliminates the use of IC chips, reduces production costs, and improves economic benefits.

[0037] Embodiment 2:

[0038] like Figure 1-Figure 7As shown, a support plate 2 is fixedly mounted on the frame 1 of the present invention, and a rotating device 3, a first manipulator 4, a second manipulator 5, a feeding mechanism 6 and a packaging mechanism 7 are mounted on the support plate 2. The rotating device 3 is the core part of the device, which is composed of a driving device 8 and a rotating disk 9. The driving device 8 is connected to the rotating disk 9 through a main shaft 10 to ensure the stable rotation of the rotating disk 9. A test seat 11 is fixedly mounted on the end surface of the rotating disk 9, and a chip connection seat 12 and an oscillator connection seat 13 are provided on the test seat 11 for placing the quartz crystal oscillator and chip to be tested. A clamping motor 14 is also fixedly mounted on the end surface of the test seat 11, and the clamping motor 14 is connected to the first clamping arm 15 and the second clamping arm 16 by driving to ensure the stable fixation of the quartz crystal oscillator and the chip during the test process. During the operation of the equipment, the first manipulator 4 first takes out the quartz crystal oscillator and the chip from the feeding mechanism 6, and then accurately places them on the test seat 11. The quartz crystal oscillator is placed in the oscillator connection seat 13, and the chip is placed in the chip connection seat 12. The clamping motor 14 is then started, driving the first clamping arm 15 and the second clamping arm 16 to clamp the chip and the quartz crystal oscillator respectively, ensuring that they will not be displaced during the test process. The rotating device 3 is then started, and the switching of the test seat 11 is realized by driving the rotating disk 9 to rotate 90 degrees. The present invention enables continuous testing of multiple quartz crystal oscillators and chips, thereby improving the test efficiency. The circuit board 18 obtains the frequency of the quartz crystal oscillator and the ID of the chip, produces a data pair, and sends the data to the main controller through the wireless communication module. After receiving the data pair, the main controller generates a circuit adjustment instruction according to the frequency of the quartz crystal oscillator, which is bound to the ID of the chip and stored in the database for subsequent circuit adjustment work. The function of the second manipulator 5 is to take out the tested quartz crystal oscillator and chip after the test is completed, and put them into the braid. The quartz crystal oscillator and the chip are placed in the same braid, which is convenient for subsequent application and prevents the quartz crystal oscillator and the chip from being confused. Subsequently, the packaging mechanism 7 packages the quartz crystal oscillator and chip in the braided tape to complete the entire test and adjustment process. This process not only improves production efficiency, but also reduces errors caused by manual operation, ensuring the adjustment accuracy of the quartz crystal oscillator. When used, the circuit adjustment instructions of the quartz crystal oscillator can be accurately adjusted by reading the chip ID and then querying the database with the ID.

[0039] A protective shell 17 is fixedly installed at the bottom of the rotating disk 9 of the present invention, and a circuit board 18 is fixedly installed in the protective shell 17. The circuit board 18 is provided with a CPU and a control program, which automatically measures the frequency of the quartz crystal oscillator and the ID of the chip, and generates a data pair. The circuit board 18 is provided with a wireless communication module, which is a 2-4G WIFI module, and the data pair is sent to the main controller through the wireless communication module. The protective circuit board 18 of the protective shell 17 ensures the reliability and stability of the test adjustment device. The CPU on the circuit board 18 is responsible for executing the control program, which can accurately measure the frequency of the quartz crystal oscillator and the ID of the chip, which is a key step in the test adjustment process. Through automated measurement and data generation, the efficiency and accuracy of the test are greatly improved. The wireless communication module adopts a 2-4G WIFI module, which has a high transmission rate and a long transmission distance, and can ensure fast and stable transmission of data. Through the wireless communication module, the test adjustment device can send the measured data pairs to the main controller in real time. The main controller generates circuit adjustment instructions based on these data pairs, binds the instructions with the chip ID, and stores them in the database.

[0040] The first manipulator 4 and the second manipulator 5 of the present invention are both driven and connected with a synchronous grasping mechanism 19, and the synchronous grasping mechanism 19 includes a moving seat 20 and a driving cylinder 21, and the driving cylinder 21 is driven and connected to the moving seat 20, and the moving seat 20 is fixedly installed with a first suction nozzle 22 and a second suction nozzle 23, which can take the chip and the quartz crystal oscillator at the same time. The design of the synchronous grasping mechanism 19 enables the first manipulator 4 and the second manipulator 5 to perform the taking operation efficiently. The driving cylinder 21 drives the moving seat 20 to move. The first suction nozzle 22 and the second suction nozzle 23 fixedly installed on the moving seat 20 correspond to the chip and the quartz crystal oscillator respectively, and they can stably grasp and carry the chip and the quartz crystal oscillator by vacuum adsorption. The design of this synchronous grasping mechanism 19 not only improves the taking efficiency of the manipulator, but also ensures the stability of the taking process. Since the first suction nozzle 22 and the second suction nozzle 23 can work simultaneously, the quartz crystal oscillator and the chip can be taken out of the feeding mechanism 6 at one time, which reduces the number of movements of the manipulator and improves the working efficiency of the entire testing and adjusting device.

[0041] The feeding mechanism 6 of the present invention includes a first guide 25, a quartz crystal oscillator reel 26 and a chip reel 27. The first guide 25 is provided with a quartz crystal oscillator tape guide groove 28 and a chip tape guide groove 29. The tapes of the quartz crystal oscillator reel 26 and the chip reel 27 are respectively transported in the quartz crystal oscillator tape guide groove 28 and the chip tape guide groove 29, which facilitates the first manipulator 4 to take the quartz crystal oscillator and the chip and improves the feeding speed. The design of the first guide 25 is to ensure that the tapes of the quartz crystal oscillator and the chip are transported in an orderly manner. The quartz crystal oscillator tape guide groove 28 and the chip tape guide groove 29 are respectively used to guide the tapes on the quartz crystal oscillator reel 26 and the chip reel 27 to ensure that they can be accurately transported to the working position of the first manipulator 4. This design allows the quartz crystal oscillator and the chip to remain stable during the feeding process, reducing damage or difficulty in taking due to improper transportation.

[0042] The packaging mechanism 7 of the present invention includes a winding mechanism 30, a second guide 31 and an empty braid reel 32. The winding mechanism 30 is the core part of the packaging mechanism 7, and it includes a hot melt roller 33, a packaging reel 34 and a film reel 35. The function of the hot melt roller 33 is to heat the adhesive film of the film reel 35 so that the adhesive film is bonded to the braid, thereby packaging the quartz crystal oscillator and the chip into a roll. This bonding method ensures the stability and reliability of packaging, and is also convenient for subsequent storage and transportation. The second guide 31 is designed to ensure the stable conveying of the braid. It is provided with a braid guide groove 36, which is used to guide the stable conveying of the braid, so that the second manipulator 5 can accurately position it. Guided by the braid guide groove 36, the braid can be smoothly moved to the specified position, so that the second manipulator 5 can accurately put the quartz crystal oscillator and the chip into the braid. This design not only improves the efficiency of packaging, but also reduces the error caused by unstable braid conveying. The empty braid reel 32 is used to store the braid to be used, which provides a continuous supply of braid for the packing mechanism 7. When the braid on the packing reel 34 is used up, the empty braid reel 32 can be replaced quickly, which ensures the continuity and efficiency of the packing process.

[0043] Embodiment three:

[0044] like Figure 1-Figure 7As shown, the present invention provides a test and adjustment method for a quartz crystal oscillator, which is applied to a test and adjustment device for a quartz crystal oscillator of the present invention to improve production efficiency. First, the quartz crystal oscillator and the chip are taken out from the feeding mechanism 6 at the same time by the first manipulator 4. The first guide of the feeding mechanism 6 is provided with a quartz crystal oscillator belt guide groove 28 and a chip belt guide groove 29. The tape with the quartz crystal oscillator is transported in the quartz crystal oscillator belt guide groove 28, and the tape with the chip is transported in the chip belt guide groove 29. The transport speeds of the two are consistent, which is convenient for the first manipulator 4 to take the quartz crystal oscillator and the chip at the same time. The first manipulator 4 accurately places the quartz crystal oscillator and the chip on the test seat 11. The test seat 11 is provided with a chip connection seat 12 and an oscillator connection seat 13. The quartz crystal oscillator is placed in the oscillator connection seat 13, and the chip is placed in the chip connection seat 12; the clamping motor 14 is started and driven The first clamping arm 15 and the second clamping arm 16 clamp the chip and the quartz crystal oscillator respectively, so that the electrical connection between the first beat, the quartz crystal oscillator and the test socket 11 is stable; the rotating device 3 is started, driving the rotating disk 9 to rotate 90 degrees, switching the test socket 11 on the rotating disk 9, and 4 test sockets are installed on the rotating disk 9. Through cyclic testing to improve the test efficiency, the circuit board 18 obtains the frequency of the quartz crystal oscillator and the ID of the chip, and produces a data pair, that is, the ID is bound to the frequency, which is convenient for subsequent query of circuit adjustment instructions, and sends the data to the main controller through the wireless communication module; the main controller generates a circuit adjustment instruction based on the received data pair and the frequency of the quartz crystal oscillator. The circuit adjustment instruction is bound to the chip ID and stored in the database, which is a cloud database; the second manipulator 5 takes out the tested quartz crystal oscillator and chip, puts them into the braid, and packages them through the packaging mechanism 7. The tape is provided with a quartz crystal oscillator box body and a chip box body, and the quartz crystal oscillator box body and the chip box body are alternately arranged along the length direction of the tape, so that the quartz crystal oscillator and the chip are paired and bound for packaging. In the later circuit production and manufacturing process, by reading the chip ID of the paired quartz crystal oscillator and chip pair, the circuit adjustment instruction can be quickly obtained from the database to complete the production.

[0045] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0046] The above description is only used to illustrate the technical solution of the present invention rather than to limit it. Other modifications or equivalent substitutions made to the technical solution of the present invention by ordinary technicians in this field should be included in the scope of the claims of the present invention as long as they do not depart from the spirit and scope of the technical solution of the present invention.

Claims

1. A quartz crystal oscillator test and adjustment device, comprising a frame, the frame having a support plate fixedly mounted thereon, characterized in that: The carrier plate is fixedly mounted with a rotating device, a first manipulator, a second manipulator, a feeding mechanism and a packaging mechanism; the rotating device includes a driving device and a rotating disk; the driving device is connected to the rotating disk through a main shaft drive; a test seat is fixedly mounted on the end surface of the rotating disk; the test seat is provided with a chip connecting seat and an oscillator connecting seat; a clamping motor is fixedly mounted on the end surface of the test seat; the clamping motor is driven to connect the first clamping arm and the second clamping arm.

2. The test and adjustment device for a quartz crystal oscillator according to claim 1, characterized in that: A protective shell is fixedly installed at the bottom of the rotating disk, and a circuit board is fixedly installed in the protective shell.

3. The test and adjustment device for a quartz crystal oscillator according to claim 2, characterized in that: The circuit board is provided with a wireless communication module, and the wireless communication module is a 2-4G WIFI module.

4. The test and adjustment device for a quartz crystal oscillator according to claim 1, characterized in that: The first manipulator and the second manipulator are both driven and connected to a synchronous grasping mechanism, and the synchronous grasping mechanism includes a moving seat and a driving cylinder. The driving cylinder is driven and connected to the moving seat, and the moving seat is fixedly mounted with a first suction nozzle and a second suction nozzle.

5. The test and adjustment device for a quartz crystal oscillator according to claim 1, characterized in that: The first pressing arm and the second pressing arm are both fixedly mounted with a silicone top block.

6. The test and adjustment device for a quartz crystal oscillator according to claim 1, characterized in that: The feeding mechanism comprises a first guide, a quartz crystal oscillator reel and a chip reel, wherein the first guide is provided with a quartz crystal oscillator belt guide groove and a chip belt guide groove.

7. The test and adjustment device for a quartz crystal oscillator according to claim 1, characterized in that: The packaging mechanism comprises a winding mechanism, a second guide and an empty braiding reel, the winding mechanism comprises a hot melt roller, a packaging reel and a film reel, and the second guide is provided with a braiding guide groove.

8. A method for testing and adjusting a quartz crystal oscillator, comprising the test and adjustment device for a quartz crystal oscillator according to claims 1 to 7, characterized in that: include: S1: The first manipulator takes out the quartz crystal oscillator and the chip from the feeding mechanism at the same time and places them accurately on the test seat. The quartz crystal oscillator is placed in the oscillator connection seat, and the chip is placed in the chip connection seat; S2: The clamping motor starts to drive the first clamping arm and the second clamping arm to clamp the chip and the quartz crystal oscillator respectively; S3: The rotating device starts, drives the rotating disk to rotate 90 degrees, and switches the test seat on the rotating disk; S4: The circuit board obtains the frequency of the quartz crystal oscillator and the ID of the chip, produces a data pair, and sends the data to the main controller through the wireless communication module; S5: The main controller generates a circuit adjustment instruction according to the received data pair and the frequency of the quartz crystal oscillator. The circuit adjustment instruction is bound to the chip ID and stored in the database; S6: The second robot takes out the tested quartz crystal oscillator and chip, puts them into the tape, and packs them through the packaging mechanism.

9. The test and adjustment method of a quartz crystal oscillator according to claim 6, characterized in that: The braid is provided with a quartz crystal oscillator box body and a chip box body, and the quartz crystal oscillator box body and the chip box body are alternately arranged along the length direction of the braid.

10. The test and adjustment method of a quartz crystal oscillator according to claim 6, characterized in that: The database is a cloud database.

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