Vehicle gauge chip-oriented fault injection simulation processing method, device and equipment

Abstract

The invention provides a fault injection simulation processing method, device and equipment for a vehicle gauge chip, and the method comprises the steps: determining a target fault point on the chip, injecting a fault signal at the target fault point in a fault injection simulation process for the chip, and obtaining the simulation data of each observation point on the chip in the fault injection simulation process; the simulation data is compared with the simulation reference data of the fault-free simulation, fault classification of the target fault point on the target chip is realized, simulation and monitoring are carried out simultaneously, fault classification of the fault point is completed, a large amount of simulation time can be saved in large-scale random fault injection simulation, and the simulation efficiency is improved. And the development of the chip and the convergence speed of the safety index are accelerated.

Description

Technical Field

[0001] The present invention relates to the field of chip design technology, and in particular to a fault injection simulation processing method, device, equipment and medium for automotive chips. Background Art

[0002] In the past few decades, the application of semiconductor products in automobiles has continued to expand, especially with the vigorous development of new energy vehicles, automotive electronics has become one of the fastest growing market segments. According to statistics, the number of chips required for traditional fuel vehicles is between 600 and 700, and the number of car wash chips for new energy vehicles has increased to more than 1,600. With the continuous implementation of hot fields such as intelligent driving, the number of chips on advanced smart cars is expected to increase to more than 3,000. Therefore, unlike traditional commercial chips, the industrial standard requirements and development processes of automotive-grade chips are becoming more and more perfect.

[0003] Before automotive-grade chips are put into production and ultimately sold to users, they must first be verified to be fully functional, just like commercial chips. On this basis, automotive-grade chip engineers must also design special mechanisms and conduct corresponding verification for the functional safety of the chip, i.e., functional safety verification of automotive-grade chips.

[0004] Semiconductor developers use fault injection at the simulation level to evaluate safety mechanisms when developing chips. Compared with traditional fault injection after silicon or at the FPGA (field programmable gate array) level, it takes a lot of time to simulate the behavior of the fault model in specific hardware. At the same time, safety assessment can often only be performed after the chip is completed, which greatly increases the assessment cost. Therefore, simulation-level fault injection has become the most mainstream fault injection method in the industry.

[0005] For simulation-level fault injection technology, early chip engineers would conduct simulation-level functional safety verification by constructing fault injection cases in test cases and manually injecting faults into each fault node based on the original functional verification platform.

[0006] For the functional safety verification link, how to quickly converge safety indicators and quickly complete functional safety simulation has always been the most concerned problem in the industry. For a medium-sized or large-scale SOC (system-on-chip), the fault space, that is, the nodes in the circuit where failures may occur, often exceeds hundreds of thousands. In order to completely classify all these nodes, the number of error injection simulations required is also hundreds of thousands or millions. Such large-scale fault simulations take up a lot of time in the chip development process, often taking months, which greatly slows down the development speed and process of automotive chips.

[0007] SUMMARY OF THE INVENTION

[0008] In view of the problems existing in the prior art, the present invention provides a fault injection simulation processing method, device, equipment and medium for automotive chips.

[0009] The present invention provides a fault injection simulation processing method for automotive chips, comprising: Determine a target fault point on the chip, inject a fault signal into the target fault point during a fault injection simulation process for the chip, and obtain simulation data of each observation point on the chip during the fault injection simulation process; Comparing the simulation data with simulation reference data to obtain a comparison result, wherein the simulation reference data represents simulation data of each observation point on the target chip during a fault-free injection simulation process; Based on the comparison result, fault classification is performed on the target fault point on the target chip.

[0010] According to a fault injection simulation processing method for automotive-grade chips provided by the present invention, the method also includes: before the fault injection simulation process for the chip, dividing the fault simulation time for the target chip into multiple time slices, and at the end of each time slice, comparing the simulation data of each observation point on the chip during the fault simulation injection process with the simulation reference data to obtain a comparison result.

[0011] According to a fault injection simulation processing method for automotive chips provided by the present invention, the simulation data includes a signal value, and accordingly, the simulation data is compared with simulation reference data to obtain a comparison result, including: The signal value of each observation point is compared with the reference signal value of the corresponding observation point in the simulation reference data, and a consistency result between the signal value and the reference signal value is determined, and the consistency result is used as the comparison result.

[0012] According to a fault injection simulation processing method for automotive-grade chips provided by the present invention, based on the comparison result, fault classification is performed on the target fault point on the target chip, including: Create a list containing the states of all fault points, and the initial state of each fault point in the list is set to unclassified fault; If the consistency result is that the signal is inconsistent, the state of the corresponding target fault point in the list is updated from unclassified fault to the matched classification type; If the consistency result is that the signals are consistent, the state of the corresponding target fault point in the list remains as unclassified fault.

[0013] According to a fault injection simulation processing method for automotive-grade chips provided by the present invention, after fault classification of target fault points on the target chip, the method further includes: When it is determined that the ending time slice is not the last time slice, and after the state of the target fault point on the target chip is updated from unclassified fault to detected fault, the fault injection simulation process of the chip is ended, and the target fault point is recorded, so as to skip the fault classification process of the target fault point in the next fault injection simulation process; After determining that the fault injection simulation process is finished, if there is a target fault point whose state remains in unclassified fault, and the number of fault injection simulations of the target fault point does not reach the preset number, the fault classification process of the target fault point of the target chip is executed again.

[0014] According to a fault injection simulation processing method for automotive chips provided by the present invention, the method further includes: A timer is set. If the fault injection simulation time exceeds the configured maximum time and it is determined that the chip fails, causing deadlock or system failure, the fault injection simulation process is forced to end, so that the status of the corresponding target fault point in the list is updated to exit due to timeout.

[0015] According to a fault injection simulation processing method for automotive chips provided by the present invention, the method further includes: Read and parse the XML configuration file to obtain the defined fault points and observation points; Based on the extracted fault points and observation points, they are generated into a Verilog module in the form of dumpvars function in the Verilog system. The Verilog module includes the module name and port, and the corresponding signal defined by each observation point. The Verilog module is called to perform fault-free injection simulation to obtain simulation data of each observation point on the target chip during the fault-free injection simulation.

[0016] The present invention also provides a fault injection simulation processing device for automotive chips, comprising: A simulation module, used to determine a target fault point on a chip, inject a fault signal into the target fault point during a fault injection simulation process for the chip, and obtain simulation data of each observation point on the chip during the fault injection simulation process; A comparison module, used for comparing the simulation data with simulation reference data to obtain a comparison result, wherein the simulation reference data represents simulation data of each observation point on the target chip during a fault-free injection simulation process; A classification module is used to classify the target fault point on the target chip based on the comparison result.

[0017] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, it implements any of the above-mentioned fault injection simulation processing methods for automotive-grade chips.

[0018] The present invention also provides a non-transitory computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, it implements any of the above-mentioned fault injection simulation processing methods for automotive-grade chips.

[0019] The present invention also provides a computer program product, including a computer program, which, when executed by a processor, implements any of the above-mentioned fault injection simulation processing methods for automotive-grade chips.

[0020] The present invention provides a fault injection simulation processing method, device, equipment and medium for automotive-grade chips. By determining the target fault point on the chip, a fault signal is injected into the target fault point during the fault injection simulation process for the chip, and simulation data of each observation point on the chip during the fault injection simulation process is obtained. The simulation data is compared with the simulation reference data of the fault-free injection simulation process, and the target fault point on the target chip is classified. Simultaneous monitoring is achieved to complete the fault classification of the fault point, which can save a lot of simulation time in large-scale random fault injection simulation and accelerate the development of the chip and the convergence speed of safety indicators. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0022] Figure 1 It is a flow chart of the fault injection simulation processing method for automotive-grade chips provided by the present invention.

[0023] Figure 2 It is a structural schematic diagram of the fault injection simulation processing device for automotive-grade chips provided by the present invention.

[0024] Figure 3 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0026] Combine the following Figure 1-Figure 3 The present invention describes the fault injection simulation processing method, device, equipment and medium for automotive chips.

[0027] Figure 1 A schematic diagram of a fault injection simulation processing method for automotive chips provided by the present invention is shown, see Figure 1 , the method comprises the following steps: Step 11: determine the target fault point on the chip, inject a fault signal at the target fault point during the fault injection simulation process for the chip, and obtain simulation data of each observation point on the chip during the fault injection simulation process.

[0028] Step 12: Compare the simulation data with the simulation reference data to obtain a comparison result, wherein the simulation reference data represents the simulation data of each observation point on the target chip during the fault-free injection simulation process.

[0029] Step 13: Based on the comparison result, fault classification is performed on the target fault point on the target chip.

[0030] Regarding the above steps 11 to 13, it should be noted that in the present invention, in chip design, it is necessary to verify the chip's safety functions before mass production to eliminate faults. The chip may detect many faults, and different faults occur at different fault points on the chip structure. To this end, fault injection simulation troubleshooting is required for different faults. The fault injection simulation troubleshooting of the present invention requires injecting a fault signal at a certain fault point, and then collecting the signal generated at the observation point on the chip for monitoring fault events. The collected signal here is used as simulation data in the fault injection simulation process.

[0031] In the present invention, the collected simulation data and simulation reference data are compared to obtain a comparison result, wherein the simulation reference data characterizes the simulation data of each observation point on the target chip during the fault-free injection simulation process. The present invention utilizes the callback mechanism provided by the VPI interface to perform a real-time synchronous comparison between the simulation data monitored in real time during the entire fault injection simulation time and the simulation data of the fault-free injection simulation, thereby achieving monitoring while simulating, determining whether the fault point is faulty, and completing the fault classification of the fault point, which can save a lot of simulation time in large-scale random fault injection simulation and accelerate the development of chips and the convergence speed of safety indicators.

[0032] In a further method of the above method, it is mainly stated that before the fault injection simulation process for the chip, the fault injection simulation time for the target chip is divided into multiple time slices. At the end of each time slice, the simulation data of each observation point on the chip during the fault injection simulation process is compared with the simulation reference data to obtain a comparison result.

[0033] It should be noted that in order to terminate the current simulation process in time after a fault is detected at a fault point during the fault injection simulation process, and quickly enter the fault injection simulation process at the next fault point, the fault injection simulation time of the target chip is divided into multiple time slices, and at the end of each time slice, the simulation data and the simulation reference data are compared in time to obtain the comparison result.

[0034] Based on the user's setting requirements, when it is determined that the ending time slice is not the last time slice, and after the state of the target fault point on the target chip is updated from unclassified fault to the classification type of the matched fault, the fault injection simulation process of the chip is ended in time, and the target fault point is recorded, so as to skip the fault classification process of the target fault point during the next fault injection simulation process.

[0035] For the fault injection simulation process with a set time slice, it is still necessary to maintain synchronous comparison during the simulation data comparison process. The present invention uses the callback mechanism provided by the VPI interface to perform real-time synchronous comparison between the simulation data monitored in real time during the entire fault injection simulation time and the simulation data of the fault-free injection simulation, thereby realizing monitoring while simulating. Once the comparison result does not meet the preset conditions, it is timely determined whether the fault point is faulty, and the fault classification of the fault point is completed.

[0036] In the present invention, the classification types of fault injection simulation may include: DD—fault detected and diagnosed, DU—fault detected but diagnosis failed, UD—fault not detected but successfully diagnosed, and UU—fault not detected and not diagnosed.

[0037] To achieve the functional feature of real-time synchronous comparison, that is, to monitor in real time whether the fault impact has been transmitted to the observation point, it is necessary to be able to perform synchronous intervention in the external function during the fault injection simulation process. In order to maintain synchronization, the present invention uses the characteristics of the callback function in the algorithm. The callback function mechanism of VPI mainly includes the following:

[0038] The present invention is based on a flexible callback mechanism, writes and registers the corresponding callback function, obtains the handle of the simulation data of the observation point saved in the previous fault-free injection simulation process in the VPI and registers it, and uses the cbValueChange callback constant for setting to ensure that an event call is made every time the signal of the observation point changes, records the event of the signal value change in the event queue, and records the change of the observation point signal in each time slice.

[0039] It should also be noted that after determining that the fault injection simulation process is over, if there is a target fault point that continues to remain in the state of unclassified fault, and the number of fault injection simulations of the target fault point has not reached the preset number, the fault classification process for the target fault point of the target chip will be executed again. In other words, it cannot be simply considered that the fault point is not prone to failure based on whether the fault monitoring of the fault point is successful in one fault injection simulation process. Multiple simulation processes are required to determine whether the fault point that may fail is a safer location point.

[0040] To further explain this, a timer can be set. If the fault injection simulation time exceeds the configured maximum time, it is determined that the chip has a fault that causes deadlock or system failure. At this time, the fault injection simulation process is forced to end, so that the status of the corresponding target fault point in the list is updated to exit due to timeout. In other words, when the fault injection simulation process fails to stop at the end, it can be determined that the chip has a major overall problem, and the fault injection simulation process needs to be forced to end, and a special type of fault point status classification is divided, that is, exit due to timeout.

[0041] In a further method of the above method, the process of comparing the simulation data with the simulation reference data to obtain the comparison result is mainly explained, as follows: The signal value of each observation point is compared with the reference signal value of the corresponding observation point in the simulation reference data to determine the consistency result between the signal value and the reference signal value; the consistency result is used as the comparison result.

[0042] It should be noted that the simulation information collected at the observation point can be displayed as a waveform, and then the signal values ​​represented on the waveforms in the two simulation processes are compared to determine whether there is consistency. The waveform here can be displayed as a potential signal, such as a high level is 1 and a low level is 0. Then, to determine the consistency, the value of the signal without fault injection is 1, and when the value of the signal after fault injection is 0, it indicates inconsistency.

[0043] Furthermore, based on the comparison results, the target fault points on the target chip are classified into the following categories: Create a list containing the states of all fault points, and the initial state of each fault point in the list is set to unclassified fault; If the consistency result is that the signal is inconsistent, the state of the corresponding target fault point in the list is updated from unclassified fault to the matched classification type; If the consistency result is that the signals are consistent, the state of the corresponding target fault point in the list remains as unclassified fault.

[0044] In a further method of the above method, it is also necessary to explain the acquisition of simulation data in the fault-free injection simulation process, as follows: Read and parse the XML configuration file to obtain the defined fault points and observation points; Based on the extracted fault points and observation points, they are generated into a Verilog module in the form of dumpvars function in the Verilog system. The Verilog module includes the module name and port, and the corresponding signal defined by each observation point. The Verilog module is called to perform fault-free injection simulation to obtain simulation data of each observation point on the target chip during the fault-free injection simulation.

[0045] In this way, the user-specified observation points are converted into the form of Verilog system function dumpvars and packaged into a module that can be automatically attached to the simulation process to obtain trouble-free simulation waveforms.

[0046] The present invention supports batch random fault injection simulation. When performing fault injection simulation on large-scale fault points, a hierarchical structure is used to store the fault classification report of each fault point, and a script is provided to perform automatic analysis based on this hierarchy, analyze the result.xml results under each path, merge them, and calculate the diagnostic coverage index of the final fault injection simulation.

[0047] The fault injection simulation processing method for automotive-grade chips provided by the present invention determines the target fault point on the chip, injects a fault signal at the target fault point during the fault injection simulation process for the chip, obtains simulation data of each observation point on the chip during the fault injection simulation process, and compares the simulation data with the simulation reference data of the fault-free injection simulation process to complete fault classification of the target fault point on the target chip, realizes monitoring while simulating, and completes fault classification of the fault point, which can save a lot of simulation time in large-scale random fault injection simulation and accelerate chip development and the convergence speed of safety indicators.

[0048] The fault injection simulation processing device for automotive-grade chips provided by the present invention is described below. The fault injection simulation processing device for automotive-grade chips described below and the fault injection simulation processing method for automotive-grade chips described above can be referenced to each other.

[0049] Figure 2 A schematic diagram of the structure of a fault injection simulation processing device for automotive chips provided by the present invention is shown in FIG. Figure 2 The device comprises a simulation module 21, a comparison module 22 and a classification module 23, wherein: The simulation module 21 is used to determine the target fault point on the chip, inject a fault signal at the target fault point during the fault injection simulation process for the chip, and obtain simulation data of each observation point on the chip during the fault injection simulation process; A comparison module 22 is used to compare the simulation data with the simulation reference data to obtain a comparison result, wherein the simulation reference data represents the simulation data of each observation point on the target chip during the fault-free injection simulation process; The classification module 23 is used to classify the target fault points on the target chip based on the comparison result.

[0050] In a further embodiment of the above device, the simulation module is further used for: Before the fault simulation process for the chip, the fault injection simulation time for the target chip is divided into multiple time slices. At the end of each time slice, the simulation data of each observation point on the chip during the fault injection simulation process is compared with the simulation reference data to obtain a comparison result.

[0051] In a further device of the above device, the simulation data includes a signal value, and the comparison module is specifically used for: The signal value of each observation point is compared with the reference signal value of the corresponding observation point in the simulation reference data to determine the consistency result between the signal value and the reference signal value; the consistency result is used as the comparison result.

[0052] In a further device of the above device, the classification module is specifically used for: Create a list containing the states of all fault points, and the initial state of each fault point in the list is set to unclassified fault; If the consistency result is that the signal is inconsistent, the state of the corresponding target fault point in the list is updated from unclassified fault to the matched classification type; If the consistency result is that the signals are consistent, the state of the corresponding target fault point in the list remains as unclassified fault.

[0053] In a further embodiment of the above device, the classification module is further used for: After fault classification is performed on the target fault point on the target chip, when it is determined that the ending time slice is not the last time slice, and the state of the target fault point on the target chip is updated from unclassified fault to detected fault, the fault injection simulation process of the chip is ended, and the target fault point is recorded for skipping the fault classification process of the target fault point in the next fault injection simulation process; After determining that the fault injection simulation process is finished, if there is a target fault point whose state remains in unclassified fault, and the number of fault injection simulations of the target fault point does not reach the preset number, the fault classification process of the target fault point of the target chip is executed again.

[0054] In a further embodiment of the above device, the classification module is further used for: A timer is set. If the fault injection simulation time exceeds the configured maximum time and it is determined that a chip fault has occurred, causing deadlock or system failure, the fault injection simulation process is forced to end, so that the status of the corresponding target fault point in the list is updated to exit due to timeout.

[0055] In a further embodiment of the above device, the device further comprises a configuration module, which is used to: Read and parse the XML configuration file to obtain the defined fault points and observation points; Based on the extracted fault points and observation points, they are generated into a Verilog module in the form of dumpvars function in the Verilog system. The Verilog module includes the module name and port, and the corresponding signal defined by each observation point. The Verilog module is called to perform fault-free injection simulation to obtain simulation data of each observation point on the target chip during the fault-free injection simulation.

[0056] The present invention provides a fault injection simulation processing device for automotive chips. The target fault point on the chip is determined, and a fault signal is injected into the target fault point during the fault injection simulation process for the chip. Simulation data of each observation point on the chip during the fault injection simulation process is obtained, and the simulation data is compared with simulation reference data of a fault-free injection simulation process to complete fault classification of the target fault point on the target chip, achieve monitoring while simulating, and complete fault classification of the fault point. In large-scale random fault injection simulation, a large amount of simulation time can be saved, and the development of the chip and the convergence speed of safety indicators are accelerated.

[0057] Figure 3 An example of a physical structure diagram of an electronic device is shown in FIG. Figure 3 As shown, the electronic device may include: a processor 31, a communication interface 32, a memory 33 and a communication bus 34, wherein the processor 31, the communication interface 32 and the memory 33 communicate with each other through the communication bus 34. The processor 31 may call the logic instructions in the memory 33 to execute a fault injection simulation processing method for automotive chips, the method comprising: determining a target fault point on the chip, injecting a fault signal at the target fault point during a fault injection simulation process for the chip, and obtaining simulation data of each observation point on the chip during the fault injection simulation process. The simulation data is compared with the simulation reference data to obtain a comparison result, wherein the simulation reference data represents the simulation data of each observation point on the target chip during a fault-free injection simulation process. Based on the comparison result, the target fault point on the target chip is fault classified.

[0058] In addition, the logic instructions in the above-mentioned memory 33 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0059] On the other hand, the present invention also provides a computer program product, which includes a computer program. The computer program can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the fault injection simulation processing method for automotive-grade chips provided by the above methods. The method includes: determining the target fault point on the chip, injecting a fault signal at the target fault point during the fault injection simulation process for the chip, and obtaining simulation data of each observation point on the chip during the fault injection simulation process. Compare the simulation data with the simulation reference data to obtain a comparison result, wherein the simulation reference data represents the simulation data of each observation point on the target chip during the fault-free injection simulation process. Based on the comparison result, the target fault point on the target chip is fault-classified.

[0060] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which is implemented when the processor executes the fault injection simulation processing method for automotive-grade chips provided by the above methods, the method comprising: determining the target fault point on the chip, injecting a fault signal at the target fault point during the fault injection simulation process for the chip, and obtaining simulation data of each observation point on the chip during the fault injection simulation process. The simulation data is compared with the simulation reference data to obtain a comparison result, wherein the simulation reference data represents the simulation data of each observation point on the target chip during the fault-free injection simulation process. Based on the comparison result, the target fault point on the target chip is fault-classified.

[0061] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0062] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0063] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A fault injection simulation processing method for automotive chips, characterized in that: include: Determine a target fault point on the chip, inject a fault signal into the target fault point during a fault injection simulation process for the chip, and obtain simulation data of each observation point on the chip during the fault injection simulation process; Comparing the simulation data with simulation reference data to obtain a comparison result, wherein the simulation reference data represents simulation data of each observation point on the target chip during a fault-free injection simulation process; Based on the comparison result, fault classification is performed on the target fault point on the target chip.

2. The fault injection simulation processing method for automotive chips according to claim 1 is characterized in that: The method also includes: before the fault injection simulation process for the chip, dividing the fault simulation time for the target chip into multiple time slices, and at the end of each time slice, comparing the simulation data of each observation point on the chip during the fault injection simulation process with the simulation reference data to obtain a comparison result.

3. The fault injection simulation processing method for automotive chips according to claim 2 is characterized in that: The simulation data includes a signal value. Accordingly, the simulation data is compared with simulation reference data to obtain a comparison result, including: The signal value of each observation point is compared with the reference signal value of the corresponding observation point in the simulation reference data to determine the consistency result between the signal value and the reference signal value; and the consistency result is used as the comparison result.

4. The fault injection simulation processing method for automotive chips according to claim 3 is characterized in that: Based on the comparison result, fault classification is performed on the target fault point on the target chip, including: Create a list containing the states of all fault points, and the initial state of each fault point in the list is set to unclassified fault; If the consistency result is that the signal is inconsistent, the state of the corresponding target fault point in the list is updated from unclassified fault to the matched classification type; If the consistency result is that the signals are consistent, the state of the corresponding target fault point in the list remains as unclassified fault.

5. The fault injection simulation processing method for automotive chips according to claim 4 is characterized in that: After classifying the target fault points on the target chip, the method further includes: When it is determined that the ending time slice is not the last time slice, and after the state of the target fault point on the target chip is updated from unclassified fault to detected fault, the fault injection simulation process of the chip is ended, and the target fault point is recorded, so as to skip the fault classification process of the target fault point in the next fault injection simulation process; After determining that the fault injection simulation process is finished, if there is a target fault point whose state remains in unclassified fault, and the number of fault injection simulations of the target fault point does not reach the preset number, the fault classification process of the target fault point of the target chip is executed again.

6. The fault injection simulation processing method for automotive chips according to claim 5 is characterized in that: The method further comprises: A timer is set. If the fault injection simulation time exceeds the configured maximum time and it is determined that the chip fails, causing deadlock or system failure, the fault injection simulation process is forced to end, so that the status of the corresponding target fault point in the list is updated to exit due to timeout.

7. The fault injection simulation processing method for automotive chips according to claim 5 is characterized in that: The method further comprises: Read and parse the XML configuration file to obtain the defined fault points and observation points; Based on the extracted fault points and observation points, they are generated into a Verilog module in the form of dumpvars function in the Verilog system. The Verilog module includes the module name and port, and the corresponding signal defined by each observation point. The Verilog module is called to perform fault-free injection simulation to obtain simulation data of each observation point on the target chip during the fault-free injection simulation.

8. A fault injection simulation processing device for automotive chips, characterized in that: include: A simulation module, used to determine a target fault point on a chip, inject a fault signal into the target fault point during a fault injection simulation process for the chip, and obtain simulation data of each observation point on the chip during the fault injection simulation process; A comparison module, used for comparing the simulation data with simulation reference data to obtain a comparison result, wherein the simulation reference data represents simulation data of each observation point on the target chip during a fault-free injection simulation process; A classification module is used to classify the target fault point on the target chip based on the comparison result.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, it implements the fault injection simulation processing method for automotive-grade chips as described in any one of claims 1-7.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, it implements the fault injection simulation processing method for automotive-grade chips as described in any one of claims 1 to 7.

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