Aging test method and system for sound power amplifier equipment, electronic equipment and medium

Abstract

The invention provides an audio power amplifier equipment aging test method and system, electronic equipment and a medium, and belongs to the technical field of equipment test. The method is applied to an aging production line provided with a power supply main circuit, an alternating current contactor, a timer and a plurality of sound power amplifier devices, and the alternating current contactor is used for controlling the on-off of the power supply main circuit; the method comprises the following steps: carrying out time calibration on a timer according to current time; generating a plurality of aging test time periods according to the current time and a preset aging test strategy; controlling a timer to trigger an alternating current contactor to be in a closed state when timing to a starting time point of each aging test time period so as to enable each sound power amplifier device to be electrified and started through a power supply main line, and then the timer is controlled to trigger the alternating current contactor to be switched from the closed state to the open state when the timer continues to time to the end time point of the aging test time period, so that each sound power amplifier is powered off and shut down. The equipment aging test efficiency can be improved, and the labor cost is saved.

Description

Technical Field

[0001] The present application relates to the technical field of equipment testing, and in particular to an aging test method, system, electronic equipment and medium for audio power amplifier equipment. Background Art

[0002] In the prior art, a manual testing method is usually used to perform manual power on and off operations on an audio power amplifier device for multiple consecutive times to complete an aging test task on the audio power amplifier device. When a tester is responsible for performing an aging test on a small batch of audio power amplifier devices, it is necessary to perform power on and off operations on each audio power amplifier device one by one, resulting in low overall test efficiency. Summary of the invention

[0003] The main purpose of the present application is to propose an aging test method, system, electronic equipment and medium for audio power amplifier equipment, which can simultaneously perform automatic aging test operations on multiple audio power amplifier equipment provided on an aging production line, improve test efficiency and save labor costs, and avoid irregular operations that are prone to occur in manual testing.

[0004] To achieve the above-mentioned purpose, one aspect of the present application provides an aging test method for an audio power amplifier device, which is applied to an aging production line provided with a main power supply line, an AC contactor, a timer, and a plurality of audio power amplifier devices, wherein the timer is used to control the on and off of the AC contactor, and the AC contactor is used to control the on and off of the main power supply line, and each of the audio power amplifier devices serves as a load of the main power supply line; the method comprises:

[0005] Calibrate the timer according to the current time;

[0006] Generate a number of aging test time periods according to the current time and the preset aging test strategy;

[0007] For each of the aging test time periods, the timer is controlled to trigger the AC contactor to be in a closed state when the timer counts to the starting time point of the aging test time period so that each of the audio power amplifier devices is powered on and started via the main power supply line, and then the timer is controlled to trigger the AC contactor to switch from the closed state to the open state when the timer continues to count to the end time point of the aging test time period so that each of the audio power amplifier devices is powered off and shut down.

[0008] Furthermore, the preset aging test strategy includes a first aging test strategy and a second aging test strategy, the first aging test strategy records multiple equipment test time periods set within a day, each of the equipment test time periods being one hour long, and the second aging test strategy records multiple equipment aging test time periods set within an hour.

[0009] Furthermore, the plurality of device test time periods are continuous.

[0010] Furthermore, the time period between each two adjacent equipment aging test time periods is recorded as a non-test time period, the lengths of all the non-test time periods included between multiple equipment aging test time periods are equal, and the lengths of multiple equipment aging test time periods are not equal.

[0011] Further, the device aging test time period with the shortest length among the multiple device aging test time periods is recorded as the minimum device aging test time period, and the length of each of the non-test time periods is less than the length of the minimum device aging test time period.

[0012] Further, the number of the plurality of equipment aging test time periods is three, the equipment aging test time period in the middle has the shortest length, and the equipment aging test time period at the end has the longest length.

[0013] Furthermore, generating a plurality of aging test time periods according to the current time and the preset aging test strategy includes:

[0014] According to the second aging test strategy, each of the device test time periods recorded in the first aging test strategy is divided to obtain a plurality of first device aging test time periods;

[0015] According to the current time, updating a plurality of the first device aging test time periods contained in each of the device test time periods to obtain a corresponding plurality of the aging test time periods;

[0016] A plurality of the aging test time periods corresponding to each of the device test time periods recorded in the first aging test strategy are statistically summarized to obtain a plurality of the aging test time periods.

[0017] To achieve the above-mentioned purpose, another aspect of the present application provides an audio power amplifier device aging test system, which is applied to an aging production line provided with a power supply main circuit, an AC contactor, a timer and a plurality of audio power amplifier devices, wherein the timer is used to control the on and off of the AC contactor, and the AC contactor is used to control the on and off of the power supply main circuit, and each of the audio power amplifier devices serves as a load of the power supply main circuit; the system comprises:

[0018] A calibration module, used for calibrating the timer according to the current time;

[0019] A generating module, used for generating a plurality of aging test time periods according to the current time and a preset aging test strategy;

[0020] The test module is used to control the timer to trigger the AC contactor to be in a closed state when the timer counts to the starting time point of the aging test time period, so that each of the audio power amplifier devices is powered on and started via the main power supply line, and then control the timer to trigger the AC contactor to switch from the closed state to the open state when the timer continues to count to the end time point of the aging test time period, so that each of the audio power amplifier devices is powered off and shut down.

[0021] To achieve the above objective, another aspect of the present application provides an electronic device, the electronic device comprising a memory and a processor, the memory storing a computer program, and the processor implementing the above method when executing the computer program.

[0022] To achieve the above objective, another aspect of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and the computer program implements the above method when executed by a processor.

[0023] The present application includes at least the following beneficial effects: by arranging a main power supply line, an AC contactor, a timer and multiple audio power amplifier devices on an aging production line, using a timer to control the on and off of the AC contactor, and using the AC contactor to control the on and off of the main power supply line, each audio power amplifier device can rely on the connected main power supply line to power on and start. After this hardware foundation is laid out, a preset aging test strategy is introduced and a number of reasonable and orderly aging test time periods are formulated in conjunction with the current time. The timer then responds to each aging test time period in a timely manner, thereby achieving simultaneous automatic aging test operations on multiple audio power amplifier devices, which can improve test efficiency and save labor costs, and avoid irregular operations that were prone to occur when manual testing was used. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a flow chart of an aging test method for an audio power amplifier device provided in an embodiment of the present application;

[0025] Figure 2 It is a structural schematic diagram of an audio power amplifier device aging test system provided in an embodiment of the present application;

[0026] Figure 3 It is a schematic diagram of the hardware structure of the electronic device provided in the embodiment of the present application. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solutions and advantages of the present application clearer, the present application is further described in detail below in conjunction with the accompanying drawings and examples. It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the embodiments of the present application. They are only examples of systems and methods consistent with some aspects of the embodiments of the present application as detailed in the attached claims.

[0028] It is understood that the terms "first", "second", etc. used in this application can be used to describe various concepts in this article, but unless otherwise specified, these concepts are not limited by these terms. These terms are only used to distinguish one concept from another concept. For example, without departing from the scope of the embodiment of the present application, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Depending on the context, the words "if" and "if" as used herein can be interpreted as "at the time of" or "when" or "in response to determination".

[0029] The terms "at least one", "multiple", "each", "any", etc. used in this application, at least one includes one, two or more, multiple includes two or more, each refers to each of the corresponding multiple, and any refers to any one of the multiple.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein are only for the purpose of describing the embodiments of this application and are not intended to limit this application.

[0031] The audio power amplifier equipment is in an unstable working state when it is just powered on, and it takes a certain amount of time to enter a stable working state. During this process, the probability of the audio power amplifier equipment being abnormal or damaged is relatively high. Therefore, during the aging process, the audio power amplifier equipment needs to be powered on and off (turned on and off) many times to test the impact resistance and stability of the audio power amplifier equipment.

[0032] In the prior art, a manual testing method is usually used to perform manual power on and off operations on an audio power amplifier device for multiple consecutive times to complete an aging test task on the audio power amplifier device. When a tester is responsible for performing an aging test on a small batch of audio power amplifier devices, it is necessary to perform power on and off operations on each audio power amplifier device one by one, resulting in low overall test efficiency.

[0033] In view of this, the embodiments of the present application provide an aging test method, system, electronic device and medium for an audio power amplifier device. The scheme arranges a main power supply line, an AC contactor, a timer and multiple audio power amplifier devices on an aging production line, uses a timer to control the on and off of the AC contactor, and uses the AC contactor to control the on and off of the main power supply line, so that each audio power amplifier device can rely on the connected main power supply line to power on and start. After this hardware foundation is laid out, a preset aging test strategy is introduced and a number of reasonable and orderly aging test time periods are formulated in conjunction with the current time. The timer then responds to each aging test time period in a timely manner, thereby realizing simultaneous automatic aging test operations on multiple audio power amplifier devices, which can improve test efficiency and save labor costs, and avoid irregular operations that are prone to occur when manual testing is used.

[0034] Figure 1 It is an optional flow chart of an aging test method for an audio power amplifier device provided in an embodiment of the present application. The method is mainly applied to an aging production line provided with a timer, an AC contactor, a main power supply line and a plurality of audio power amplifier devices. The timer is connected to the AC contactor, which is connected in series to the main power supply line. Each audio power amplifier device serves as a load of the main power supply line. The timer is used to control the on and off of the AC contactor, which is used to control the on and off of the main power supply line. On this basis, Figure 1 The method may include but is not limited to steps S101 to S103:

[0035] Step S101, calibrating the timer according to the current time;

[0036] Step S102, generating a plurality of aging test time periods according to the current time and a preset aging test strategy;

[0037] Step S103, for each aging test time period, the control timer is triggered to trigger the AC contactor to be in a closed state when the timer counts to the starting time point of the aging test time period so that each audio power amplifier device is powered on and started via the main power supply line, and then the control timer is triggered to switch the AC contactor from the closed state to the open state when the timer continues to count to the end time point of the aging test time period so that each audio power amplifier device is powered off and shut down.

[0038] Steps S101 to S103 shown in the embodiment of the present application can improve test efficiency and save labor costs by synchronously performing automatic aging test operations on multiple audio power amplifier devices provided on the aging production line, and avoid irregular operations that are prone to occur in manual testing.

[0039] In step S101 of some embodiments, the timer is calibrated, which actually adjusts the starting recording time of the timer when it is officially started to complete the aging test operation to the current time, so that the entire subsequent aging test process can be reasonable and orderly.

[0040] In step S102 of some embodiments, the preset aging test strategy includes a first aging test strategy and a second aging test strategy. The first aging test strategy mainly records multiple device test time periods set within one day, and the length of each device test time period is one hour. The second aging test strategy mainly records multiple device aging test time periods set within one hour.

[0041] In the first aging test strategy, the multiple device test time periods recorded are continuous, and the setting number of the multiple device test time periods can be 8, 12, or 24, that is, each audio power amplifier device needs to be tested continuously for 8 hours, 12 hours, or 24 hours, thereby simulating the long-term operation of the audio power amplifier device in actual use, and ensuring the reliability and stability of the audio power amplifier device.

[0042] Exemplarily, assuming that the number of setting time periods for multiple device tests is 8, and the test starts at 09:00 in a day, the first test needs to be performed in the time period of 09:00-10:00, the second test in the time period of 10:00-11:00, the third test in the time period of 11:00-12:00, the fourth test in the time period of 12:00-13:00, the fifth test in the time period of 13:00-14:00, the sixth test in the time period of 14:00-15:00, the seventh test in the time period of 15:00-16:00, and the eighth test in the time period of 16:00-17:00, thereby achieving 8 hours of continuous testing of each audio power amplifier device.

[0043] It should be noted that the one-day time mentioned in the first aging test strategy emphasizes only 24 hours. It can be counted from 00:00 on a certain day until it reaches 24 hours, or it can be counted from other times of the day until it reaches 24 hours, such as starting from 09:00 on the first day and ending at 09:00 on the next adjacent day. This application does not limit this.

[0044] In the second aging test strategy, the lengths of the multiple device aging test time periods recorded therein are not equal. The device aging test time period with the shortest length among the multiple device aging test time periods is defined as the minimum device aging test time period, and the time period between each two adjacent device aging test time periods is recorded as a non-test time period. The lengths of all non-test time periods included between the multiple device aging test time periods are equal, and it is specified that the length of each non-test time period should be less than the length of the minimum device aging test time period.

[0045] As a preferred implementation, the number of settings for multiple device aging test time periods is 3, the length of the device aging test time period in the middle is the smallest, the length of the device aging test time period at the end is the largest, and the length of the non-test time period between each two adjacent device aging test time periods is set to two minutes; by setting different working cycles for the audio power amplifier device to perform repeated tests in stages, it is possible to observe whether the working performance of the audio power amplifier device remains stable under different temperature changes, and try to shorten the length of each non-test time period to ensure that the audio power amplifier device is started and operated next time with residual temperature, thereby testing the timely response of the audio power amplifier device when it resumes work in a short time.

[0046] By setting the length of the aging test time period for the device at the front to be greater than the length of the aging test time period for the device at the middle but less than the length of the aging test time period for the device at the back, it is mainly because the audio power amplifier device needs to increase its operating temperature to a certain level when it is initially started up, so as to complete the subsequent test of whether the audio power amplifier device responds to restart in a timely manner under relatively high temperature conditions; by setting the length of the aging test time period for the device at the middle to be the smallest, it is possible to complete the short-term continuous operation performance test of the audio power amplifier device; by setting the length of the aging test time period for the device at the back to be the largest, it is possible to complete the long-term continuous operation performance test of the audio power amplifier device; thereby achieving regular interval testing of the audio power amplifier device.

[0047] Exemplarily, the test starts at the 0th minute in an hour, at which time each audio power amplifier device is controlled to power on and start at the 0th minute, to power off and shut down at the 15th minute, to power on and start at the 17th minute, to power off and shut down at the 25th minute, to power on and start at the 27th minute, and to power off and shut down at the 58th minute, i.e., the length of the first device aging test time period (i.e., the time period from the 0th minute to the 15th minute) is 15 minutes, the length of the second device aging test time period (i.e., the time period from the 17th minute to the 25th minute) is 8 minutes, the length of the third device aging test time period (i.e., the time period from the 27th minute to the 58th minute) is 31 minutes, and the lengths of the two non-test time periods (i.e., the time period from the 15th minute to the 17th minute and the time period from the 25th minute to the 27th minute) are both 2 minutes.

[0048] It should be noted that the one hour mentioned in the second aging test strategy emphasizes only 60 minutes. It can be counted from the 0th minute of a certain hour to 60 minutes, or from other minutes of a certain hour to 60 minutes, for example, starting from the 20th minute of the first hour and ending at the 20th minute of the adjacent second hour. This application does not limit this.

[0049] In step S102 of some embodiments, the process of generating several aging test time periods specifically includes the following steps: according to the second aging test strategy, each device test time period recorded by the first aging test strategy is divided to obtain multiple first device aging test time periods; according to the current time, the multiple first device aging test time periods included in each device test time period are updated to obtain corresponding multiple aging test time periods; and the multiple aging test time periods corresponding to each device test time period recorded by the first aging test strategy are statistically summarized to obtain several aging test time periods.

[0050] Exemplarily, assuming that the number of the multiple device test time periods recorded by the first aging test strategy is 8, the three device aging test time periods recorded by the second aging test strategy are respectively the time period from the 0th minute to the 15th minute, the time period from the 17th minute to the 25th minute, and the time period from the 27th minute to the 58th minute;

[0051] In the first aging test strategy, it is set to start the test at 00:00 in one day. The three first equipment aging test time periods divided in the first equipment test time period (i.e., the time period of 00:00-01:00) are respectively the time period of 00:00-00:15, the time period of 00:17-00:25 and the time period of 00:27-00:58. The three first equipment aging test time periods divided in the second equipment test time period (i.e., the time period of 01:00-02:00) are respectively the time period of 01:00-01:15, the time period of 01:17-01:25 and the time period of 01:27-01:58. And so on, all the first equipment aging test time periods corresponding to the remaining six equipment test time periods are obtained;

[0052] If the current time is 10:30, then the three first device aging test time periods included in the first device test time period are updated to obtain the corresponding three aging test time periods, which are 10:30-10:45, 10:47-10:55 and 10:57-11:28 respectively; the three first device aging test time periods included in the second device test time period are updated to obtain the corresponding three aging test time periods, which are 11:30-11:45, 11:47-11:55 and 11:57-12:28 respectively; and so on to obtain all aging test time periods corresponding to the remaining six device test time periods.

[0053] In some embodiments, during the execution of the above step S103, the following operations may also be performed simultaneously:

[0054] Taking any audio power amplifier device as an example, when the audio power amplifier device is tested in each aging test time period, the response of the audio power amplifier device is synchronously detected, and the test results corresponding to the audio power amplifier device in the aging test time period are generated. The test results mainly record whether the audio power amplifier device can be started normally at the starting time point of the aging test time period, whether the audio power amplifier device can be shut down normally at the end time point of the aging test time period, and whether the audio power amplifier device can be stably maintained in the operating state during the aging test time period, thereby obtaining several test results corresponding to the audio power amplifier device in several aging test time periods, and then summarizing the several test results into an equipment test report named with the product number of the audio power amplifier device for staff to review.

[0055] An aging test method for audio power amplifier equipment proposed in an embodiment of the present application arranges a main power supply line, an AC contactor, a timer and multiple audio power amplifier equipment on an aging production line, uses a timer to control the on and off of the AC contactor, and uses the AC contactor to control the on and off of the main power supply line, so that each audio power amplifier equipment can rely on the connected main power supply line to power on and start. After this hardware foundation is laid out, a preset aging test strategy is introduced and a number of reasonable and orderly aging test time periods are formulated in conjunction with the current time. The timer then responds to each aging test time period in a timely manner, thereby realizing simultaneous automatic aging test operations on multiple audio power amplifier equipment, which can improve test efficiency and save labor costs, and avoid irregular operations that are prone to occur when manual testing is used.

[0056] See also Figure 2 The embodiment of the present application also provides a structural schematic diagram of an audio power amplifier device aging test system, which is mainly applied to an aging production line provided with a timer, an AC contactor, a power supply main line and multiple audio power amplifier devices. The timer is connected to the AC contactor, which is connected in series to the power supply main line. Each audio power amplifier device serves as a load of the power supply main line. The timer is used to control the on and off of the AC contactor, and the AC contactor is used to control the on and off of the power supply main line. On this basis, the system includes:

[0057] The calibration module 201 is used to calibrate the timer according to the current time;

[0058] A generating module 202, configured to generate a plurality of aging test time periods according to a preset aging test strategy and the current time;

[0059] The test module 203 is used to control the timer to trigger the AC contactor to be in a closed state when the timer counts to the starting time point of each aging test time period, so that each audio power amplifier device is powered on and started via the main power supply line, and then control the timer to trigger the AC contactor to switch from the original closed state to the open state when the timer continues to count to the end time point of the aging test time period, so that each audio power amplifier device is powered off and shut down.

[0060] It can be understood that the contents of the above method embodiments are all applicable to the present system embodiments, the functions specifically implemented by the present system embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0061] The embodiment of the present application also provides an electronic device, which includes a memory and a processor, wherein the memory stores a computer program, and the processor implements the above-mentioned audio power amplifier device aging test method when executing the computer program. The electronic device may include any intelligent terminal such as a tablet computer and a car computer.

[0062] It can be understood that the contents of the above method embodiments are all applicable to the present device embodiments, the functions specifically implemented by the present device embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0063] See also Figure 3 , Figure 3 The hardware structure of an electronic device according to another embodiment is shown. The electronic device includes:

[0064] The processor 301 may be implemented by a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of the present application.

[0065] The memory 302 can be implemented in the form of a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 302 can store an operating system and other application programs. When the technical solution provided in the embodiment of the present application is implemented by software or firmware, the relevant program code is stored in the memory 302, and the processor 301 calls and executes the technical solution provided in the embodiment of the present application;

[0066] Input / output interface 303, used to implement information input and output;

[0067] The communication interface 304 is used to realize the communication interaction between the device and other devices. The communication can be realized through a wired manner (such as USB, network cable, etc.) or a wireless manner (such as mobile network, WI FI, Bluetooth, etc.);

[0068] A bus 305 that transmits information between the various components of the device (e.g., the processor 301, the memory 302, the input / output interface 303, and the communication interface 304);

[0069] The processor 301 , the memory 302 , the input / output interface 303 and the communication interface 304 are connected to each other in communication within the device via the bus 305 .

[0070] An embodiment of the present application also provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the above-mentioned audio power amplifier device aging test method is implemented.

[0071] It can be understood that the contents of the above method embodiments are all applicable to the present storage medium embodiments, the functions specifically implemented by the present storage medium embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0072] The memory, as a non-transient computer-readable storage medium, can be used to store non-transient software programs and non-transient computer executable programs. In addition, the memory may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some embodiments, the memory may optionally include a memory remotely disposed relative to the processor, and these remote memories may be connected to the processor via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0073] The embodiments described in the embodiments of the present application are intended to more clearly illustrate the technical solutions of the embodiments of the present application and do not constitute a limitation on the technical solutions provided in the embodiments of the present application. Those skilled in the art will appreciate that with the evolution of technology and the emergence of new application scenarios, the technical solutions provided in the embodiments of the present application are also applicable to similar technical problems.

[0074] Those skilled in the art will appreciate that the technical solutions shown in the figures do not constitute a limitation on the embodiments of the present application, and may include more or fewer steps than shown in the figures, or a combination of certain steps, or different steps.

[0075] The system embodiments described above are merely illustrative, and the units described as separate components may or may not be physically separated, that is, they may be located in one place or distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the present embodiment.

[0076] Those skilled in the art will appreciate that all or some of the steps in the methods disclosed above, and the functional modules / units in the systems and devices may be implemented as software, firmware, hardware, or a suitable combination thereof.

[0077] The terms "first", "second", "third", "fourth", etc. (if any) in the specification of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0078] It should be understood that in the present application, "at least one (item)" means one or more, and "plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" can mean: only A exists, only B exists, and A and B exist at the same time, where A and B can be singular or plural. The character " / " generally indicates that the objects associated before and after are in an "or" relationship. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0079] In the several embodiments provided in the present application, it should be understood that the disclosed systems and methods can be implemented in other ways. For example, the system embodiments described above are only schematic. For example, the division of the above units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of systems or units, which can be electrical, mechanical or other forms.

[0080] The units described above as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0081] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0082] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including multiple instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of various embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory, referred to as ROM), random access memory (Random Access Memory, referred to as RAM), disk or optical disk and other media that can store programs.

[0083] The preferred embodiments of the present invention are described above with reference to the accompanying drawings, but the scope of the rights of the present invention is not limited thereto. Any modification, equivalent substitution and improvement made by a person skilled in the art without departing from the scope and essence of the present invention should be within the scope of the rights of the present invention.

Claims

1. A method for testing aging of an audio power amplifier device, characterized in that: The method is applied to an aging production line provided with a main power supply line, an AC contactor, a timer and a plurality of audio power amplifier devices, wherein the timer is used to control the on and off of the AC contactor, the AC contactor is used to control the on and off of the main power supply line, and each of the audio power amplifier devices serves as a load of the main power supply line; the method comprises: Calibrate the timer according to the current time; Generate a number of aging test time periods according to the current time and the preset aging test strategy; For each of the aging test time periods, the timer is controlled to trigger the AC contactor to be in a closed state when the timer counts to the starting time point of the aging test time period so that each of the audio power amplifier devices is powered on and started via the main power supply line, and then the timer is controlled to trigger the AC contactor to switch from the closed state to the open state when the timer continues to count to the end time point of the aging test time period so that each of the audio power amplifier devices is powered off and shut down.

2. The aging test method for audio power amplifier equipment according to claim 1, characterized in that: The preset aging test strategy includes a first aging test strategy and a second aging test strategy. The first aging test strategy records multiple equipment test time periods set within a day, each of which is one hour long. The second aging test strategy records multiple equipment aging test time periods set within an hour.

3. The aging test method for audio power amplifier equipment according to claim 2, characterized in that: A plurality of the device testing time periods are continuous.

4. The aging test method for audio power amplifier equipment according to claim 2, characterized in that: The time period between each two adjacent equipment aging test time periods is recorded as a non-test time period, the lengths of all the non-test time periods included between multiple equipment aging test time periods are equal, and the lengths of multiple equipment aging test time periods are not equal.

5. The aging test method for audio power amplifier equipment according to claim 4, characterized in that: The device aging test time period with the smallest length among the multiple device aging test time periods is recorded as the minimum device aging test time period, and the length of each of the non-test time periods is less than the length of the minimum device aging test time period.

6. The aging test method for audio power amplifier equipment according to claim 4, characterized in that: The number of the plurality of equipment aging test time periods is three, the equipment aging test time period in the middle has the shortest length, and the equipment aging test time period at the end has the longest length.

7. The aging test method for audio power amplifier equipment according to claim 2, characterized in that: The generating of a plurality of aging test time periods according to the current time and the preset aging test strategy comprises: According to the second aging test strategy, each of the device test time periods recorded in the first aging test strategy is divided to obtain a plurality of first device aging test time periods; According to the current time, updating a plurality of the first device aging test time periods contained in each of the device test time periods to obtain a corresponding plurality of the aging test time periods; A plurality of the aging test time periods corresponding to each of the device test time periods recorded in the first aging test strategy are statistically summarized to obtain a plurality of the aging test time periods.

8. An audio power amplifier equipment aging test system, characterized in that: Applicable to an aging production line provided with a main power supply line, an AC contactor, a timer and a plurality of audio power amplifier devices, wherein the timer is used to control the on and off of the AC contactor, the AC contactor is used to control the on and off of the main power supply line, and each of the audio power amplifier devices serves as a load of the main power supply line; the system comprises: A calibration module, used for calibrating the timer according to the current time; A generating module, used for generating a plurality of aging test time periods according to the current time and a preset aging test strategy; The test module is used to control the timer to trigger the AC contactor to be in a closed state when the timer counts to the starting time point of the aging test time period, so that each of the audio power amplifier devices is powered on and started via the main power supply line, and then control the timer to trigger the AC contactor to switch from the closed state to the open state when the timer continues to count to the end time point of the aging test time period, so that each of the audio power amplifier devices is powered off and shut down.

9. An electronic device, characterized in that: The electronic device comprises a memory and a processor, the memory stores a computer program, and the processor implements the method according to any one of claims 1 to 7 when executing the computer program.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 7 is implemented.

Images