Novel electromagnetic sensitive device damage effect analysis method
By alternately inputting narrow pulse width and high power pulse signals and wide pulse large bandwidth signals, and performing spectrum data fusion and superposition processing, the problem of incomplete excitation of electromagnetic sensitive devices caused by a single excitation signal type in the prior art is solved, and the problem of incomplete excitation mode of electromagnetic sensitive devices is realized. More accurate analysis of damage effects.
Patent Information
- Application Number
- CN202411639212.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-15
- Publication Date
- 2025-02-18
AI Technical Summary
The existing methods for damage effect analysis of electromagnetic sensitive devices cannot fully stimulate all damage modes of electromagnetic sensitive devices due to the single type of excitation signal, resulting in inaccurate analysis results.
By alternately inputting narrow pulse width high power pulse signals and wide pulse large bandwidth signals to the input end of the electromagnetic sensitive device to be tested, multiple sets of spectrum data of the output response are extracted and fused and superimposed processing is performed to determine the damage mode of the electromagnetic sensitive device.
It achieves complete excitation of all damage modes of electromagnetically sensitive devices, improves the accuracy of damage effect analysis, and solves the problem of inaccurate analysis results caused by a single signal type in traditional methods.
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Figure CN119471070A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of damage effect analysis of electromagnetic sensitive devices, and in particular to a new damage effect analysis method for electromagnetic sensitive devices. Background Art
[0002] At present, the existing damage effect analysis methods for electromagnetic sensitive devices usually use high-power narrow pulse signals to excite the damage modes of electromagnetic sensitive devices by injection. However, due to the single type of excitation signal used, this method cannot completely excite all damage modes of electromagnetic sensitive devices, resulting in inaccurate damage effect analysis results of electromagnetic sensitive devices.
[0003] Based on this, how to provide a new damage effect analysis method for electromagnetic sensitive devices to fully stimulate all damage modes of electromagnetic sensitive devices, thereby improving the accuracy of damage effect analysis of electromagnetic sensitive devices, has become a technical problem that needs to be urgently solved in this field. Summary of the invention
[0004] The purpose of this application is to provide a new damage effect analysis method for electromagnetic sensitive devices, which can fully stimulate all damage modes of electromagnetic sensitive devices and improve the accuracy of damage effect analysis of electromagnetic sensitive devices.
[0005] To achieve the above objectives, this application provides the following solutions:
[0006] The present application provides a new electromagnetic sensitive device damage effect analysis method, the new electromagnetic sensitive device damage effect analysis method comprising the following steps:
[0007] A first electromagnetic excitation signal and a second electromagnetic excitation signal are alternately input to an input end of an electromagnetic sensitive device to be tested, and a plurality of groups of output responses are obtained at output ends of the electromagnetic sensitive device to be tested, each group of output responses comprising a first output response corresponding to the first electromagnetic excitation signal and a second output response corresponding to the second electromagnetic excitation signal within the same alternating input cycle; wherein the first electromagnetic excitation signal and the second electromagnetic excitation signal are both emitted by a signal source, the signal source is connected to the input end of the electromagnetic sensitive device to be tested, the first electromagnetic excitation signal is a narrow pulse width high power pulse signal, and the second electromagnetic excitation signal is a wide pulse large bandwidth signal.
[0008] Based on the multiple groups of output responses, a first spectrum corresponding to each of the first output responses is extracted respectively, and a second spectrum corresponding to each of the second output responses is extracted respectively, so as to obtain multiple groups of spectrum data.
[0009] The first spectrum and the second spectrum in each group of the spectrum data are fused and superimposed to obtain a plurality of fused and superimposed spectrums.
[0010] The damage mode of the electromagnetic sensitive device to be tested is determined according to the multiple fused and superimposed frequency spectra.
[0011] Optionally, the first electromagnetic excitation signal is represented by the following formula:
[0012] s1=a1·exp[jω0t]·g(t);
[0013] Wherein, s1 represents the first electromagnetic excitation signal, a1 is the signal amplitude of the first electromagnetic excitation signal, ω0 is the carrier frequency, g(t) is the modulation pulse, t is the pulse duration, and j is the imaginary part.
[0014] Optionally, the second electromagnetic excitation signal is represented by the following formula:
[0015] s2=a2·exp[j(ω0+0.5μt)t]·g(t);
[0016] Wherein, s2 represents the second electromagnetic excitation signal, a2 is the signal amplitude of the second electromagnetic excitation signal, ω0 is the carrier frequency, g(t) is the modulation pulse, μ is the frequency modulation slope, and abs(·) represents absolute value operation, a1 is the signal amplitude of the first electromagnetic excitation signal, T1 is the pulse width of the first electromagnetic excitation signal, T2 is the pulse width of the first electromagnetic excitation signal, t is the pulse duration, and j is the imaginary part.
[0017] Optionally, the first spectrum is represented by the following formula:
[0018] f so1 = abs(fft(s o1 ));
[0019] Among them, f so1 represents the first spectrum, s o1 represents the first output response, abs(·) represents absolute value operation, and fft(·) represents fast Fourier transform.
[0020] Optionally, the second spectrum is represented by the following formula:
[0021] f so2 = abs(fft(s o2 ));
[0022] Among them, f so2 represents the second spectrum, s o2 represents the second output response, abs(·) represents absolute value operation, and fft(·) represents fast Fourier transform.
[0023] Optionally, the fused superposition spectrum is calculated using the following formula:
[0024] f=0.6f so1 +0.4f so2 ;
[0025] Among them, f represents the fused superposition spectrum, f so1 represents the first spectrum, f so2 represents the second spectrum.
[0026] Optionally, determining the damage mode of the electromagnetic sensitive device to be tested according to the fused superimposed spectrum specifically includes the following steps:
[0027] The magnitude relationship between each of the fused superimposed frequency spectrum and a preset threshold is compared respectively, and the damage mode of the electromagnetic sensitive device to be tested is determined according to the comparison result.
[0028] Optionally, comparing the magnitude relationship between each of the fused superimposed spectrum and a preset threshold, and judging the damage mode of the electromagnetic sensitive device to be tested according to the comparison result, specifically includes:
[0029] When f>λ1, it is determined that the amplifying portion of the electromagnetic sensitive device to be tested is damaged.
[0030] When λ2<f≤λ1, it is determined that the input part of the electromagnetic sensitive device to be tested is damaged.
[0031] When f≤λ2, it is determined that the output part of the electromagnetic sensitive device to be tested is damaged.
[0032] Wherein, f represents a fused superimposed spectrum, λ1 and λ2 are respectively a first preset threshold and a second preset threshold, and λ1>λ2.
[0033] Optionally, the power of the narrow pulse width high power pulse signal is greater than 10 watts, and the pulse width is less than 10 microseconds.
[0034] Optionally, the pulse width of the wide-pulse large-bandwidth signal is greater than 100 microseconds, and the bandwidth is greater than 60% of the operating center frequency.
[0035] According to the specific embodiments provided in this application, this application discloses the following technical effects:
[0036] The present application provides a new method for analyzing damage effects of electromagnetic sensitive devices. By alternately inputting two electromagnetic excitation signals (i.e., a narrow pulse width high-power pulse signal and a wide pulse large bandwidth signal) to the input end of the electromagnetic sensitive device to be tested, multiple sets of spectrum data can be extracted according to the output response corresponding to the output end of the electromagnetic sensitive device to be tested, and then by fusing and superimposing the two spectra corresponding to the two electromagnetic excitation signals to obtain multiple fused superimposed spectra, the damage mode of the electromagnetic sensitive device to be tested can be accurately analyzed on the basis of the fused superimposed spectra. Compared with the traditional method of only using a high-power narrow pulse signal to excite the damage mode of the electromagnetic sensitive device, the present application combines two electromagnetic excitation signals with different characteristics to excite the damage mode of the electromagnetic sensitive device in an alternating input manner, so that all damage modes of the electromagnetic sensitive device can be fully excited, thereby improving the accuracy of the damage effect analysis of the electromagnetic sensitive device, and effectively solving the problem that the traditional method has a single type of excitation signal and cannot fully excite all damage modes of the electromagnetic sensitive device, resulting in inaccurate damage effect analysis results. BRIEF DESCRIPTION OF THE DRAWINGS
[0037] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0038] Figure 1 A flowchart of a new method for analyzing damage effects of electromagnetic sensitive devices provided in one embodiment of the present application. DETAILED DESCRIPTION
[0039] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0040] like Figure 1 As shown, this embodiment provides a new method for analyzing damage effects of electromagnetic sensitive devices. The method is mainly used in detection scenarios after electromagnetic sensitive devices are attacked by electromagnetic attacks, etc., and the damage mode of the electromagnetic sensitive devices to be tested is determined by detecting and analyzing the damage effects of the electromagnetic sensitive devices to be tested. The damage mode here refers to clearly determining the damaged part or damaged position of the electromagnetic sensitive devices to be tested after being attacked by electromagnetic attacks, etc., including input parts, amplification parts, and output parts. The method specifically includes the following steps:
[0041] Step S1, alternately inputting a first electromagnetic excitation signal and a second electromagnetic excitation signal to an input end of the electromagnetic sensitive device to be tested, and obtaining a plurality of groups of output responses at the output end of the electromagnetic sensitive device to be tested, each group of output responses including a first output response corresponding to the first electromagnetic excitation signal and a second output response corresponding to the second electromagnetic excitation signal in the same alternating input cycle.
[0042] In this embodiment, the first electromagnetic excitation signal and the second electromagnetic excitation signal are both sent by a signal source, and the signal source is connected to the normally operating circuit of the electromagnetic sensitive device to be tested. Specifically, the signal source is connected to the input end of the electromagnetic sensitive device to be tested. In addition, a detection device, such as an oscilloscope, can also be connected to the output end of the electromagnetic sensitive device to be tested. After the first electromagnetic excitation signal and the second electromagnetic excitation signal are alternately input to the input end of the electromagnetic sensitive device to be tested, the first output response and the second output response of the output end of the electromagnetic sensitive device to be tested are detected and identified by the detection device such as an oscilloscope, so as to conveniently and quickly obtain the first frequency spectrum corresponding to the first output response and the second frequency spectrum corresponding to the second output response.
[0043] In this embodiment, the same alternating input cycle refers to the time corresponding to the input of a first electromagnetic excitation signal and a second electromagnetic excitation signal to the input end of the electromagnetic sensitive device to be tested, that is, the first electromagnetic excitation signal and the second electromagnetic excitation signal are inputted sequentially as an alternating input cycle. In practical application, the alternating input method is adopted to cyclically input the first electromagnetic excitation signal and the second electromagnetic excitation signal in sequence. After the first electromagnetic excitation signal is input, an output response, that is, the first output response, is immediately obtained, so that the first spectrum can be correspondingly extracted. Then, the second electromagnetic excitation signal is input to obtain the second output response, and the second spectrum can be correspondingly extracted. This is an alternating input cycle, and then the first electromagnetic excitation signal is cyclically input again to obtain the first output response, and then the second electromagnetic excitation signal is input again to obtain the second output response, and so on, until the preset number of alternating input cycles is reached, the output response can be stopped. In this embodiment, the alternating input cycle is 5 times, that is, the first electromagnetic excitation signal and the second electromagnetic excitation signal are alternately input 5 times in total.
[0044] In this embodiment, the first electromagnetic excitation signal is a narrow pulse width high power pulse signal, and the second electromagnetic excitation signal is a wide pulse large bandwidth signal. Among them, the narrow pulse width high power pulse signal refers to an electromagnetic excitation signal with a power greater than 10 watts and a pulse width less than 10 microseconds. The wide pulse large bandwidth signal refers to an electromagnetic excitation signal with a pulse width greater than 100 microseconds and a bandwidth greater than 60% of the working center frequency. In actual application, the above specific values can be set according to actual conditions.
[0045] In this embodiment, the signal sources of the narrow pulse width high-power pulse signal and the wide pulse large bandwidth signal are both high-power microwave signal sources, which is equivalent to setting up an independent high-power microwave signal source outside the circuit in which the electromagnetic sensitive device to be tested works normally, and alternately generating the required narrow pulse width high-power pulse signal and the wide pulse large bandwidth signal through the high-power microwave signal source, and alternately inputting them into the electromagnetic sensitive device to be tested.
[0046] In this embodiment, the first electromagnetic excitation signal is represented by the following formula:
[0047] s1=a1·exp[jω0t]·g(t).
[0048] Wherein, s1 represents the first electromagnetic excitation signal, a1 is the signal amplitude of the first electromagnetic excitation signal, ω0 is the carrier frequency, g(t) is the modulation pulse, t is the pulse duration, and j is the imaginary part.
[0049] In this embodiment, the second electromagnetic excitation signal is represented by the following formula:
[0050] s2=a2·exp[j(ω0+0.5μt)t]·g(t).
[0051] Wherein, s2 represents the second electromagnetic excitation signal, a2 is the signal amplitude of the second electromagnetic excitation signal, ω0 is the carrier frequency, g(t) is the modulation pulse, μ is the frequency modulation slope, and abs(·) represents absolute value operation, a1 is the signal amplitude of the first electromagnetic excitation signal, T1 is the pulse width of the first electromagnetic excitation signal, T2 is the pulse width of the first electromagnetic excitation signal, t is the pulse duration, and j is the imaginary part.
[0052] In this embodiment, the electromagnetic sensitive device to be tested may be a device such as a microwave amplifier, and the model of the microwave amplifier may be ADPA005 or HMC998A-Die.
[0053] In practical applications, the electromagnetic excitation signal can be connected to the electromagnetic sensitive device to be tested by radiation and injection. Therefore, the alternating input can be an alternating radiation input or an alternating injection input. When the electromagnetic sensitive device to be tested is connected by radiation, the input end of the electromagnetic sensitive device to be tested does not require a special interface. When the electromagnetic sensitive device to be tested is connected by injection, different connection forms need to be used according to the microwave frequency. There are no special requirements for the output end of the electromagnetic sensitive device to be tested.
[0054] Step S2: based on the multiple groups of output responses, extract the first spectrum corresponding to each first output response respectively, and extract the second spectrum corresponding to each second output response respectively, to obtain multiple groups of spectrum data, each group of spectrum data includes the first spectrum and the second spectrum in the same alternating input period.
[0055] In this embodiment, the first spectrum is represented by the following formula:
[0056] f so1 = abs(fft(s o1 )).
[0057] Among them, f so1 represents the first spectrum, s o1 represents the first output response, abs(·) represents absolute value operation, and fft(·) represents fast Fourier transform.
[0058] In this embodiment, the second spectrum is represented by the following formula:
[0059] f so2 = abs(fft(s o2 )).
[0060] Among them, f so2 represents the second spectrum, s o2 represents the second output response, abs(·) represents absolute value operation, and fft(·) represents fast Fourier transform.
[0061] Step S3, respectively fusing and superimposing the first spectrum and the second spectrum in each group of spectrum data, that is, the first spectrum and the second spectrum of the same group are fused and superimposed to obtain multiple fused and superimposed spectrums, each of which corresponds to an alternating input period.
[0062] In this embodiment, the fused superposition spectrum is calculated using the following formula:
[0063] f=0.6f so1 +0.4f so2 .
[0064] Among them, f represents the fused superposition spectrum, f so1 represents the first spectrum, f so2 represents the second spectrum.
[0065] It should be noted that 0.6 and 0.4 in the calculation formula of the fused superimposed spectrum are the weights of the first spectrum and the second spectrum respectively. These two data are determined based on historical experience data and can be set according to actual conditions in actual applications.
[0066] Step S4: determining the damage mode of the electromagnetic sensitive device to be tested according to the multiple fused and superimposed frequency spectra.
[0067] In this embodiment, step S4 determines the damage mode of the electromagnetic sensitive device to be tested according to the multiple fused superimposed frequency spectra, and specifically includes the following steps:
[0068] Compare the size relationship between each fused superimposed spectrum and the preset threshold, and judge the damage mode of the electromagnetic sensitive device to be tested according to the comparison results, which includes the following three situations:
[0069] (1) When f>λ1, it is determined that the amplification part of the electromagnetic sensitive device to be tested is damaged.
[0070] (2) When λ2<f≤λ1, it is determined that the input part of the electromagnetic sensitive device to be tested is damaged.
[0071] (3) When f≤λ2, it is determined that the output part of the electromagnetic sensitive device to be tested is damaged.
[0072] Wherein, f represents a fused superimposed spectrum, λ1 and λ2 are respectively a first preset threshold and a second preset threshold, and λ1>λ2.
[0073] In this embodiment, since multiple fused and superimposed frequency spectra are obtained, as long as one fused and superimposed frequency spectrum meets the above three judgment conditions, the corresponding judgment result can be obtained.
[0074] In order to make the technical solution of this embodiment clearer, the following examples are given to illustrate the specific implementation steps of the technical solution of this embodiment in detail, which specifically include the following steps:
[0075] (1) Inject the first electromagnetic excitation signal s1 (i.e., a narrow pulse width high power pulse signal) into the input end of the electromagnetic sensitive device to be tested, and obtain the first response output s at the output end. o1 .
[0076] (2) The second electromagnetic excitation signal s2 (i.e., a wide pulse and large bandwidth signal) is injected into the input end of the electromagnetic sensitive device to be tested, and a second response output s is obtained at the output end. o2 .
[0077] (3) After multiple cycles of alternating input according to (1) and (2), extract each first response output s o1 and each second response output s o2 The spectrum of the first spectrum f so1 and the second spectrum f so2 , and the first spectrum f of each group so1 and the second spectrum f so2 The fused superposition processing is performed to obtain the fused superposition spectrum f. By fusion superposition spectrum f, the damage mode of the electromagnetic sensitive device to be tested is determined to complete the damage effect analysis.
[0078] The specific steps are as follows:
[0079] In this embodiment, when analyzing and determining the damage mode, the first preset threshold λ1 is set to 10 and the second preset threshold λ2 is set to 6 for example, and there are the following three situations.
[0080] 1) When the value of f in all fused superimposed spectra is greater than 10 (ie, f>λ1), it is determined that the amplified part of the electromagnetic sensitive device to be tested is damaged, that is, the amplified part damage mode.
[0081] 2) When the value of f in all fused superimposed spectra is greater than 6 and less than or equal to 10 (ie, λ2<f≤λ1), it is determined that the input part of the electromagnetic sensitive device to be tested is damaged, that is, the input part damage mode.
[0082] 3) When the value of f in all fused superimposed spectra is less than or equal to 6 (ie, f≤λ2), it is determined that the output part of the electromagnetic sensitive device to be tested is damaged, that is, the output part is in damage mode.
[0083] This embodiment optimizes and adjusts the electromagnetic excitation signal input to the electromagnetic sensitive device to be tested so that data greater than 10 appear in the fused superposition spectrum f, that is, the damage of the amplification part of the electromagnetic sensitive device to be tested is stimulated, while the current method can only stimulate the damage of the input part and the output part of the electromagnetic sensitive device to be tested, and cannot stimulate the damage of the amplification part of the electromagnetic sensitive device to be tested. Therefore, this embodiment can completely stimulate all damage modes of the electromagnetic sensitive device (including the amplification part damage mode, the input part damage mode and the output part damage mode).
[0084] Compared with the current situation that the traditional electromagnetic sensitive device damage effect analysis method only injects high-power narrow pulse signals into the electromagnetic sensitive device, but cannot fully stimulate all damage modes of the electromagnetic sensitive device. This embodiment combines the wide pulse large bandwidth signal with the narrow pulse high power signal, and adopts an alternating input method to alternately input the wide pulse large bandwidth signal and the narrow pulse high power signal into the electromagnetic sensitive device to be tested. Under the alternating excitation of two signals with different characteristics, all damage modes of the electromagnetic sensitive device can be stimulated, thereby achieving more comprehensive and accurate electromagnetic sensitive device damage effect detection and analysis, and improving the accuracy of electromagnetic sensitive device damage effect analysis. At the same time, this embodiment adaptively optimizes the frequency modulation parameters of the wide pulse large bandwidth signal, shortens the time required to stimulate the damage mode, improves the efficiency of damage mode excitation, and thus improves the efficiency of electromagnetic sensitive device damage effect analysis.
[0085] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0086] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.
Claims
1. A new method for analyzing damage effects of electromagnetic sensitive devices, characterized in that: The new electromagnetic sensitive device damage effect analysis method comprises: A first electromagnetic excitation signal and a second electromagnetic excitation signal are alternately input to an input terminal of an electromagnetic sensitive device to be tested, and a plurality of groups of output responses are obtained at output terminals of the electromagnetic sensitive device to be tested, each group of output responses comprising a first output response corresponding to the first electromagnetic excitation signal and a second output response corresponding to the second electromagnetic excitation signal within the same alternating input cycle; wherein the first electromagnetic excitation signal and the second electromagnetic excitation signal are both emitted by a signal source, the signal source is connected to the input terminal of the electromagnetic sensitive device to be tested, the first electromagnetic excitation signal is a narrow pulse width high power pulse signal, and the second electromagnetic excitation signal is a wide pulse large bandwidth signal; Based on the multiple groups of output responses, respectively extract the first spectrum corresponding to each of the first output responses, and respectively extract the second spectrum corresponding to each of the second output responses, to obtain multiple groups of spectrum data; respectively fusing and superimposing the first spectrum and the second spectrum in each group of the spectrum data to obtain a plurality of fused and superimposed spectrums; The damage mode of the electromagnetic sensitive device to be tested is determined according to the multiple fused and superimposed frequency spectra.
2. The new electromagnetic sensitive device damage effect analysis method according to claim 1 is characterized in that: The first electromagnetic excitation signal is represented by the following formula: s1=a1·exp[jω0t]·g(t); Wherein, s1 represents the first electromagnetic excitation signal, a1 is the signal amplitude of the first electromagnetic excitation signal, ω0 is the carrier frequency, g(t) is the modulation pulse, t is the pulse duration, and j is the imaginary part.
3. The new electromagnetic sensitive device damage effect analysis method according to claim 1 is characterized in that: The second electromagnetic excitation signal is represented by the following formula: s2=a2·exp[j(ω0+0.5μt)t]·g(t); Wherein, s2 represents the second electromagnetic excitation signal, a2 is the signal amplitude of the second electromagnetic excitation signal, ω0 is the carrier frequency, g(t) is the modulation pulse, μ is the frequency modulation slope, and abs(·) represents absolute value operation, a1 is the signal amplitude of the first electromagnetic excitation signal, T1 is the pulse width of the first electromagnetic excitation signal, T2 is the pulse width of the first electromagnetic excitation signal, t is the pulse duration, and j is the imaginary part.
4. The new electromagnetic sensitive device damage effect analysis method according to claim 1 is characterized in that: The first spectrum is represented by the following formula: f so1 =abs(fft(s o1 )); Among them, f so1 represents the first spectrum, s o1 represents the first output response, abs(·) represents absolute value operation, and fft(·) represents fast Fourier transform.
5. The new electromagnetic sensitive device damage effect analysis method according to claim 1 is characterized in that: The second spectrum is represented by the following formula: f so2 =abs(fft(s o2 )); Among them, f so2 represents the second spectrum, s o2 represents the second output response, abs(·) represents absolute value operation, and fft(·) represents fast Fourier transform.
6. The new electromagnetic sensitive device damage effect analysis method according to claim 1 is characterized in that: The fused superposition spectrum is calculated using the following formula: f=0.6f so1 +0.4f so2 ; Among them, f represents the fused superposition spectrum, f so1 represents the first spectrum, f so2 represents the second spectrum.
7. The new electromagnetic sensitive device damage effect analysis method according to claim 1 is characterized in that: Determining the damage mode of the electromagnetic sensitive device to be tested according to the multiple fused superimposed frequency spectra specifically includes: The magnitude relationship between each of the fused superimposed frequency spectrum and a preset threshold is compared respectively, and the damage mode of the electromagnetic sensitive device to be tested is determined according to the comparison result.
8. The new electromagnetic sensitive device damage effect analysis method according to claim 7 is characterized in that: Comparing the magnitude relationship between each of the fused superimposed spectrum and the preset threshold respectively, and judging the damage mode of the electromagnetic sensitive device to be tested according to the comparison result, specifically includes: When f>λ1, it is determined that the amplification part of the electromagnetic sensitive device to be tested is damaged; When λ2<f≤λ1, it is determined that the input part of the electromagnetic sensitive device to be tested is damaged; When f≤λ2, it is determined that the output part of the electromagnetic sensitive device to be tested is damaged; Wherein, f represents a fused superimposed spectrum, λ1 and λ2 are respectively a first preset threshold and a second preset threshold, and λ1>λ2.
9. The new electromagnetic sensitive device damage effect analysis method according to claim 1 is characterized in that: The power of the narrow pulse width high power pulse signal is greater than 10 watts, and the pulse width is less than 10 microseconds.
10. The new electromagnetic sensitive device damage effect analysis method according to claim 1, characterized in that: The pulse width of the wide pulse and large bandwidth signal is greater than 100 microseconds, and the bandwidth is greater than 60% of the working center frequency.