Multi-channel aging test device

Abstract

The invention relates to the technical field of electronic engineering, and particularly discloses a multi-channel aging test device, which comprises a box body, a mounting bracket, an auxiliary plate bracket, an auxiliary plate, PCB mounting plates and a mainboard, and is characterized in that the mounting bracket is fixedly connected with the box body and is located in the box body, and the two groups of PCB mounting plates are fixedly connected with the mounting bracket and are located at the upper end of the mounting bracket respectively; each group of auxiliary board supports are fixedly connected with the mounting support and located on the inner side of the mounting support, each group of main boards are arranged at the upper ends of the corresponding PCB mounting boards, and each group of auxiliary boards are embedded in the corresponding auxiliary board supports. The aging cabinet is small in space and low in cost, can actively adjust the height, brightness, projection, control and unlocking functions, can greatly save the space occupied by a control box and a communication box in the aging cabinet, reduces the equipment cost, and can know the aging state in real time by monitoring the test LOG in the aging process.

Description

Technical Field

[0001] The invention relates to the technical field of electronic engineering, and in particular to a multi-channel aging test device. Background Art

[0002] At present, many products on the market need to complete some test items during the aging process, such as height brightness adjustment, projection and cutting, voltage and current acquisition, etc., and the product itself has a communication function. The existing technology is to use a hardware control box to complete the test function and add a communication box to complete the communication connection, with a ratio of 1:1.

[0003] However, the prior art has high costs, large space occupation, complex equipment wiring, and the need to use multiple communication boxes, which increases the difficulty of equipment wiring, program control, and equipment costs. Summary of the invention

[0004] The purpose of the present invention is to provide a multi-channel aging test device, aiming to solve the technical problems in the prior art of high cost, large space occupation, complex equipment wiring, and the need to match multiple communication boxes, which increases the difficulty of equipment wiring, program control and increased equipment cost.

[0005] To achieve the above-mentioned purpose, the present invention adopts a multi-channel aging test device, including a box, a mounting bracket, a sub-board bracket, a sub-board, a PCB mounting board and a main board, the mounting bracket is fixedly connected to the box and is located inside the box, the number of the PCB mounting boards is two groups, the two groups of PCB mounting boards are respectively fixedly connected to the mounting bracket and are located at the upper end of the mounting bracket, the number of the sub-board brackets is multiple groups, each group of the sub-board brackets is respectively fixedly connected to the mounting bracket and is located on the inner side of the mounting bracket, the number of the main boards is multiple groups, each group of the main boards is respectively arranged at the upper end of the corresponding PCB mounting board, the number of the sub-boards is multiple groups, each group of the sub-boards is respectively embedded in the corresponding sub-board bracket.

[0006] Among them, each group of the mainboards includes a main substrate, a CPU, a power module, a network card module, a communication module, a storage module, a GPU, a power connector, a USB Device interface and a USB Host interface, and the CPU, the power module, the network card module, the communication module, the storage module, the GPU, the power connector, the USB Device interface and the USB Host interface are respectively integrated at the upper end of the main substrate.

[0007] Each group of sub-boards includes a sub-baseboard, a power management module, a video serializer, a video conversion chip and an LVDS connector, and the power management module, the video serializer, the video conversion chip and the LVDS connector are respectively integrated at the upper end of the sub-baseboard.

[0008] The beneficial effects of a multi-channel aging test device of the present invention are: small space, low cost, active adjustment of height, brightness, projection, control function, unlocking function, and real-time uploading of test LOG products, and integrated communication, power supply, projection and integrated aging test device, which can greatly save the space occupied by the control box and communication box in the aging cabinet, while reducing equipment costs. The aging status can be understood in real time by monitoring the test LOG during the aging process, solving the problem that abnormalities cannot be recorded in time and cannot be tracked during the product load aging process. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0010] Figure 1 It is a structural schematic diagram of a multi-channel aging test device of the present invention.

[0011] Figure 2 It is a partial structural schematic diagram of a multi-channel aging test device of the present invention.

[0012] Figure 3 It is a top view of the main board of the present invention.

[0013] Figure 4 It is a top view of the sub-plate of the present invention.

[0014] 1- box, 2- mounting bracket, 3- sub-board bracket, 4- sub-board, 5-PCB mounting plate, 6- main board, 7- main base board, 8- CPU, 9- power module, 10- network card module, 11- communication module, 12- storage module, 13- GPU, 14- power connector, 15- USB Device interface, 16- USB Host interface, 17- sub-base board, 18- power management module, 19- video serializer, 20- video conversion chip, 21- LVDS connector. DETAILED DESCRIPTION

[0015] See also Figures 1 to 4The present invention provides a multi-channel aging test device, comprising a box body 1, a mounting bracket 2, a sub-board bracket 3, a sub-board 4, a PCB mounting board 5 and a main board 6, wherein the mounting bracket 2 is fixedly connected to the box body 1 and is located inside the box body 1, the number of the PCB mounting boards 5 is two groups, and the two groups of PCB mounting boards 5 are respectively fixedly connected to the mounting bracket 2 and are located at the upper end of the mounting bracket 2, the number of the sub-board bracket 3 is multiple groups, and each group of the sub-board bracket 3 is respectively fixedly connected to the mounting bracket 2 and is located on the inner side of the mounting bracket 2, the number of the main board 6 is multiple groups, and each group of the main board 6 is respectively arranged at the upper end of the corresponding PCB mounting board 5, and the number of the sub-board 4 is multiple groups, and each group of the sub-board 4 is respectively embedded in the corresponding sub-board bracket 3.

[0016] In this embodiment, the box 1 is used to install and fix the mounting bracket 2, and the PCB mounting board 5 is installed and fixed by using the mounting bracket 2. Eight groups of the main boards 6 are installed on the PCB mounting board 5. The main boards 6 are fixed on the PCB mounting board 5, and the sides are installed on the mounting bracket 2 by means of slide rail connection. The sub-board 4 is installed in the sub-board bracket 3 by means of locking screws, and the sub-board bracket 3 is fixed on the mounting bracket 2 by screws, so that eight external products can be docked at the same time, saving space and cost.

[0017] The product takes up little space and has low cost. It can actively adjust height, brightness, projection, control functions, unlock messages, and upload test LOGs in real time. It is an aging test device that integrates communication, power supply, and projection. It can greatly save the space occupied by the control box and communication box in the aging cabinet, while reducing equipment costs. The aging status can be understood in real time through the test LOG.

[0018] Furthermore, each group of the mainboard 6 includes a main substrate 7, a CPU 8, a power module 9, a network card module 10, a communication module 11, a storage module 12, a GPU 13, a power connector 14, a USB Device interface 15 and a USB Host interface 16, and the CPU 8, the power module 9, the network card module 10, the communication module 11, the storage module 12, the GPU 13, the power connector 14, the USB Device interface 15 and the USB Host interface 16 are respectively integrated at the upper end of the main substrate 7.

[0019] In this embodiment, the main substrate 7 is adapted to the CPU 8, and the power module 9 replaces the programmable power supply. The power module 9 can realize automatic voltage rise and fall in function to supply power to the device under test, and the power supply range is 9-25V. At the same time, the communication module 11 is designed to support multiple communication modes, including CAN, CANFD, LIN and I2C. The network card module 10 can communicate with the host computer to realize the aging tester system upgrade and LOG transmission during the aging process, and the host computer custom control HUD function. The storage module 12 is also integrated on the main substrate 7, which can replace the U disk to store pictures and LOGs. The GPU 13 can realize the function of constantly refreshing pictures. The power connector 14 is used for an external power cord and is responsible for lighting up the product under test. The USB Device interface 15 can be used as a real-time test LOG data transmission channel to transmit the LOG to the host computer, and the data and LOG of the storage module 12 in the mainboard 6 data can also be copied out with a U disk and stored in other locations. The USB Host interface can be connected to an external U disk to record the test LOG.

[0020] Furthermore, each group of the sub-boards 4 includes a sub-baseboard 17, a power management module 18, a video serializer 19, a video conversion chip 20 and a LVDS connector 21, and the power management module 18, the video serializer 19, the video conversion chip 20 and the LVDS connector 21 are respectively integrated at the upper end of the sub-baseboard 17.

[0021] In this embodiment, the power management module 18 and the video serializer 19 are designed on the sub-base board 17. The video serializer 19 is an interface circuit in high-speed data communication, and its main function is to realize the conversion of data transmission mode, that is, the conversion of parallel data to serial data, and the video conversion chip 20 supports video format conversion. The LVDS connector 21 is connected to the external LVDS wiring harness, and the other end of the LVDS wiring harness is connected to the product under test to receive the LVDS signal.

[0022] What is disclosed above is only a preferred embodiment of the present invention, and it certainly cannot be used to limit the scope of rights of the present invention. Ordinary technicians in this field can understand that all or part of the processes of the above embodiment and equivalent changes made according to the claims of the present invention still fall within the scope of the invention.

Claims

1. A multi-channel aging test device, characterized in that: It includes a box body, a mounting bracket, a sub-board bracket, a sub-board, a PCB mounting board and a main board. The mounting bracket is fixedly connected to the box body and is located inside the box body. The number of PCB mounting boards is two groups, and the two groups of PCB mounting boards are respectively fixedly connected to the mounting bracket and are located at the upper end of the mounting bracket. The number of sub-board brackets is multiple groups, and each group of sub-board brackets is respectively fixedly connected to the mounting bracket and is located on the inner side of the mounting bracket. The number of main boards is multiple groups, and each group of main boards is respectively arranged at the upper end of the corresponding PCB mounting board. The number of sub-boards is multiple groups, and each group of sub-boards is respectively embedded in the corresponding sub-board bracket.

2. The multi-channel aging test device according to claim 1, characterized in that: Each group of the mainboards includes a main substrate, a CPU, a power module, a network card module, a communication module, a storage module, a GPU, a power connector, a USB Device interface and a USB Host interface. The CPU, the power module, the network card module, the communication module, the storage module, the GPU, the power connector, the USB Device interface and the USB Host interface are respectively integrated at the upper end of the main substrate.

3. The multi-channel aging test device according to claim 2, characterized in that: Each group of the sub-boards includes a sub-baseboard, a power management module, a video serializer, a video conversion chip and an LVDS connector. The power management module, the video serializer, the video conversion chip and the LVDS connector are respectively integrated on the upper end of the sub-baseboard.

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