In-situ atmosphere control device for photoluminescence spectrum test and photoluminescence spectrometer

Abstract

The invention provides an in-situ atmosphere control device for a photoluminescence spectrum test and a photoluminescence spectrometer. The in-situ atmosphere control device comprises a sample bin and a gas supply pipe group, a sample containing cavity is formed in the sample bin, a sample limiting structure is arranged in the sample containing cavity, and a sample taking and placing opening capable of being opened and closed, an air inlet connector and an air exhaust connector are arranged on the sample bin. And the gas supply pipe group is connected with the gas inlet joint. According to the in-situ atmosphere control device for the photoluminescence spectrum test, provided by the invention, before the test is carried out, a prepared sample can be put into the sample accommodating cavity, then the sample bin is fixed on a test instrument, and gas required by an experiment is injected into the sample accommodating cavity by utilizing the gas supply pipe group; the exhaust connector is used for exhausting original gas in the sample containing cavity. The in-situ atmosphere control device for the photoluminescence spectrum test, provided by the invention, can keep the position of the sample unchanged, and the atmosphere in the sample bin is changed through the gas supply pipe group, so that the effect of in-situ test of the photoluminescence spectrum of the sample is realized.

Description

Technical Field

[0001] The invention relates to the technical field of spectrum testing equipment, and in particular to an in-situ atmosphere control device and a photoluminescence spectrometer for photoluminescence spectrum testing. Background Art

[0002] In the fields of materials science, chemical engineering, and biomedical research, photoluminescence spectroscopy (PL) technology, as a non-contact, non-destructive analytical method, has demonstrated its unique advantages and potential. This technology can reveal the intrinsic structure, electronic state, and optical properties of materials by stimulating electron transitions in materials and observing the energy distribution of the photons subsequently released. However, the luminescence properties of materials are often highly dependent on the environmental atmosphere in which they are located, such as oxygen, nitrogen, vacuum, or a specific gas environment. Changes in these environmental factors will directly affect key parameters such as the luminescence intensity, peak position shift, and luminescence lifetime of the material, thereby affecting the accurate evaluation and optimization of material performance.

[0003] Currently, some technologies have been used to try to solve the problem of photoluminescence spectroscopy testing in different atmospheres, but there are still significant shortcomings. For example, the non-in-situ test method requires that the sample be sealed in different atmospheres before testing. This method is not only cumbersome, time-consuming and labor-intensive, but also easily leads to differences in test conditions between different atmospheres or different samples. These differences may be due to slight changes in factors such as sample position, thickness, surface state, etc., but may have a significant impact on the experimental results. Summary of the invention

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention provides an in-situ atmosphere control device and a photoluminescence spectrometer for photoluminescence spectrum testing, aiming to solve the problem that the method of non-in-situ testing of photoluminescence spectra of materials under different atmospheres in the related art is cumbersome to operate, time-consuming and labor-intensive, and there are differences between the test conditions of different atmospheres or different samples, which affects the experimental results.

[0005] The present invention provides an in-situ atmosphere control device for photoluminescence spectrum testing, comprising: A sample compartment, wherein a sample holding cavity is disposed inside the sample compartment, a sample limiting structure is disposed inside the sample holding cavity, and an openable and closable sample access port, an air inlet connector and an air outlet connector are disposed on the sample compartment, wherein the air inlet connector and the air outlet connector are both connected to the inner and outer sides of the sample holding cavity; A gas supply pipe group is connected to the gas inlet joint.

[0006] According to the in-situ atmosphere control device for photoluminescence spectroscopy testing provided by the present invention, when the sample chamber is in the working position, the rear side surface of the sample holding cavity extends upward and backward, the angle between the bottom surface of the sample holding cavity and the horizontal plane is greater than or equal to 0 degrees and less than or equal to 20 degrees, the angle between the bottom surface of the sample holding cavity and the rear side surface is greater than or equal to 90 degrees and less than or equal to 120 degrees, and the bottom surface and the rear side surface of the sample holding cavity form the sample limiting structure.

[0007] According to the in-situ atmosphere control device for photoluminescence spectrum testing provided by the present invention, the sample containing cavity is a rectangular or cube-shaped cavity.

[0008] According to the in-situ atmosphere control device for photoluminescence spectroscopy testing provided by the present invention, the sample chamber includes a chamber body and a chamber cover, the sample holding cavity is arranged in the chamber body, and at least one end of the sample holding cavity passes through the chamber body, one end of the sample holding cavity forms the sample access port, and the chamber cover is detachably connected to the chamber body for closing or opening the sample holding cavity.

[0009] According to the in-situ atmosphere control device for photoluminescence spectroscopy testing provided by the present invention, one of the air inlet connector and the exhaust connector is arranged on the chamber cover, and the other is arranged on the chamber body, or both the air inlet connector and the exhaust connector are arranged on the chamber cover, or both the air inlet connector and the exhaust connector are arranged on the chamber body.

[0010] According to the in-situ atmosphere control device for photoluminescence spectrum testing provided by the present invention, the bin body is threadedly connected to the bin cover.

[0011] According to the in-situ atmosphere control device for photoluminescence spectrum testing provided by the present invention, a sealing ring is provided between the chamber cover and the chamber body.

[0012] According to the in-situ atmosphere control device for photoluminescence spectrum testing provided by the present invention, the gas supply pipe group includes at least one gas supply pipeline, each of the gas supply pipelines is sequentially connected in series with a gas storage device, a ball valve and a flow meter, the flow meter is arranged on the downstream side of the ball valve, and the downstream end of the gas supply pipeline is connected to the air intake structure.

[0013] According to the in-situ atmosphere control device for photoluminescence spectrum testing provided by the present invention, when the number of the gas supply pipelines is greater than or equal to two, the downstream ends of the multiple gas supply pipelines are connected to the gas inlet joint through a gas mixing device.

[0014] The present invention also provides a photoluminescence spectrometer, comprising the above-mentioned in-situ atmosphere control device for photoluminescence spectrum testing.

[0015] The present invention adopts the above technical solution, which has the following advantages: The in-situ atmosphere control device for photoluminescence spectrum testing provided by the present invention comprises a sample bin and a gas supply pipe group. A sample holding cavity is provided inside the sample bin, a sample limiting structure is provided inside the sample holding cavity, and an openable and closable sample access port, an air inlet connector and an exhaust connector are provided on the sample bin, and the sample access port, the air inlet connector and the exhaust connector are all connected to the inside and outside of the sample holding cavity. The gas supply pipe group is connected to the air inlet connector. The sample fixing device for photoluminescence spectrum testing provided by the present invention can, before the test, place the prepared sample into the sample holding cavity of the sample bin through the sample access port, and close the sample bin, the sample limiting structure can limit the movement of the sample, and then fix the sample bin on the test instrument. Finally, the gas required for the experiment is injected into the sample holding cavity through the air inlet connector by using the gas supply pipe group, and the exhaust connector is used to discharge the original gas in the sample holding cavity. The sample fixing device for photoluminescence spectrum testing provided by the present invention can keep the sample position fixed, change the atmosphere in the sample chamber through the gas supply pipe group, and achieve the effect of in-situ testing of the photoluminescence spectrum of the sample. The operation is simple and can ensure that the test conditions of the same sample in different atmospheres or different samples in the same atmosphere are consistent.

[0016] Furthermore, in the photoluminescence spectrometer provided by the present invention, since the in-situ atmosphere control device for photoluminescence spectrum testing as described above is provided, it has the same advantages as described above. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 It is a schematic structural diagram of an in-situ atmosphere control device for photoluminescence spectrum testing provided by one embodiment of the present invention; Figure 2 is an exploded view of an in-situ atmosphere control device for photoluminescence spectrum testing provided by one embodiment of the present invention; Figure 3 The figure is a schematic diagram of the working state of an in-situ atmosphere control device for photoluminescence spectrum testing provided by one embodiment of the present invention.

[0019] Reference numerals: 110: chamber body; 111: sample holding chamber; 120: chamber cover; 130: air inlet connector; 140: air exhaust connector; 210: gas supply pipeline; 220: ball valve; 230: flow meter; 240: gas mixing device; 250: gas cylinder. DETAILED DESCRIPTION

[0020] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0021] In the description of the present invention, it is to be understood that the terms “center”, “longitudinal”, “lateral”, “length”, “width”, “thickness”, “up”, “down”, “front”, “back”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, “clockwise”, “counterclockwise”, “axial”, “radial”, “circumferential”, etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0022] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is more than two, unless otherwise clearly and specifically defined.

[0023] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0024] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0025] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0026] The present invention provides an in-situ atmosphere control device for photoluminescence spectrum testing, including a sample bin and a gas supply pipe group, wherein a sample holding cavity is provided inside the sample bin, and a sample limiting structure is provided inside the sample holding cavity, and an openable and closable sample access port, an air inlet joint and an exhaust joint are provided on the sample bin, and the gas supply pipe group is connected to the air inlet joint. During testing, the sample can be placed into the sample holding cavity through the sample access port, and then the sealed sample bin is fixed on the testing instrument, and the position of the sample is fixed at this time. Then, the atmosphere in the sample holding cavity is changed through the gas supply pipe group, so as to realize in-situ photoluminescence spectrum testing of the sample under different atmospheres.

[0027] Combine the following Figures 1 to 3 The in-situ atmosphere control device for photoluminescence spectroscopy testing of the present invention is described.

[0028] An embodiment of the present invention provides an in-situ atmosphere control device for photoluminescence spectrum testing, comprising a sample chamber and a gas supply pipe group.

[0029] The sample chamber is provided with a sample holding cavity 111 for placing the sample, a sample limiting structure is provided in the sample holding cavity 111, and the sample chamber is also provided with an openable and closable sample taking and putting port, an air inlet connector 130 and an air exhaust connector 140, which are connected to the inside and outside of the sample holding cavity 111. The gas supply pipe group is connected to the air inlet connector 130.

[0030] Specifically, the sample holding chamber 111 provided inside the sample chamber is used to place the sample, and the sample limiting structure can be used to ensure that the sample in the sample holding chamber 111 remains motionless when the sample chamber is fixed on the test instrument, so as to achieve the requirements of in-situ detection. The sample chamber is provided with a sample taking and placing port that can be opened and closed. When the sample needs to be placed, the sample taking and placing port is opened. After the sample is placed, the sample taking and placing port is closed to ensure that the sample holding chamber 111 is a closed space. The air inlet connector 130 is used to introduce the gas required by the experiment into the sample holding chamber 111. The exhaust connector 140 can be used to exhaust the gas in the sample holding chamber 111. For example, before the test, when the gas required by the experiment is injected into the sample holding chamber 111, the exhaust connector 140 can be turned on at the same time, and the exhaust connector 140 can be closed after the original gas in the sample holding chamber 111 is completely discharged, so that the sample holding chamber 111 contains only the gas required by the experiment. The gas supply pipe group is used to introduce the gas required for the experiment into the sample holding chamber 111 through the air inlet connector 130.

[0031] The in-situ atmosphere control device for photoluminescence spectrum testing provided by the present invention can fix the sample through the sample chamber, and introduce different gases into the sample chamber through the gas supply pipe group to achieve the effect of in-situ changing the atmosphere in the sample chamber, so as to perform in-situ photoluminescence spectrum testing on the sample under different atmospheres. The sample fixing device is easy to operate and can ensure that the test conditions of the same sample in different atmospheres or different samples in the same atmosphere are consistent.

[0032] In some embodiments, when the sample compartment is in the working position, the rear side surface of the sample holding cavity 111 extends upward and backward, the angle between the bottom surface of the sample holding cavity 111 and the horizontal plane is greater than or equal to 0 degrees and less than or equal to 20 degrees, and the angle between the bottom surface and the rear side surface of the sample holding cavity 111 is greater than or equal to 90 degrees and less than or equal to 120 degrees. At this time, the bottom surface and the rear side surface of the sample holding cavity 111 form a sample limiting structure.

[0033] It should be noted that for powdered samples, the experimenter needs to process the samples. The powdered samples can be smeared on a quartz plate and then placed in the sample holding chamber 111 . For thin film samples, they can be directly placed in the sample holding chamber 111 .

[0034] For example, after the quartz plate is placed in the sample holding chamber 111, the side of the quartz plate opposite to the sample smeared can lean against the inclined rear side of the sample holding chamber 111, and the bottom of the quartz plate is supported on the bottom surface of the sample holding chamber 111. In this way, the quartz plate can be stably supported in the sample holding chamber 111 without moving.

[0035] In a preferred embodiment, the sample holding chamber 111 can be a rectangular or cube-shaped cavity. When the sample chamber is fixed on the test device, the rear side of the sample holding chamber 111 can extend upward and tilt backward by 30 degrees, and the bottom surface of the sample holding chamber 111 is perpendicular to the rear side of the sample holding chamber 111. When a quartz sheet or film-shaped sample is placed in the sample holding chamber 111, the quartz sheet or film-shaped sample can fit with the rear side and bottom surface of the sample holding chamber 111, making the limit more stable.

[0036] In some embodiments, the sample chamber may include a chamber body 110 and a chamber cover 120, wherein a sample holding chamber 111 is disposed in the chamber body 110, and at least one end of the sample holding chamber 111 passes through the chamber body 110, and one end of the sample holding chamber 111 forms a sample access port, and the chamber cover 120 is openably connected to the chamber body 110 for closing or opening the sample holding chamber 111.

[0037] In a specific embodiment, the chamber body 110 may also be a rectangular parallelepiped structure, and the sample holding chamber 111 inside the chamber body 110 is also a rectangular parallelepiped structure, and the left end of the sample holding chamber 111 passes through the chamber body 110, and the left end of the sample holding chamber 111 forms a sample access opening. The chamber cover 120 is detachably connected to the left side of the chamber body 110 to open or close the sample holding chamber 111.

[0038] In another specific embodiment, the chamber body 110 is also a rectangular parallelepiped structure, and the internal sample holding cavity 111 is also a rectangular parallelepiped structure. Different from the previous embodiment, in this embodiment, the left and right ends of the sample holding cavity 111 both penetrate the chamber body 110. The size of the sample holding cavity 111 can be 40 mm to 50 mm long in the left-right direction, 20 mm to 50 mm wide in the front-back direction, and 3 mm to 5 mm high in the up-down direction. A chamber cover 120 is detachably connected to the left and right ends of the chamber body 110, respectively.

[0039] In some embodiments, one of the air inlet connector 130 and the exhaust connector 140 is disposed on the bin cover 120 and the other is disposed on the bin body 110 , or both the air inlet connector 130 and the exhaust connector 140 are disposed on the bin cover 120 , or both the air inlet connector 130 and the exhaust connector 140 are disposed on the bin body 110 .

[0040] For example, when both ends of the sample holding cavity 111 pass through the storage body 110, both ends of the storage body 110 are provided with a detachable storage cover 120. At this time, the air inlet connector 130 can be set on the left storage cover 120, and the exhaust connector 140 can be set on the right storage cover 120.

[0041] In some embodiments, the bin body 110 is threadedly connected to the bin cover 120 .

[0042] For example, when both ends of the sample holding chamber 111 pass through the chamber body 110, cylindrical joints are provided at the left and right ends of the chamber body 110, the inner diameter of the cylindrical joint is larger than the size of the opening of the sample holding chamber 111, an external thread is provided on the outer side of the cylindrical joint, and an internal thread is provided on the inner side of the chamber cover 120, the chamber cover 120 and the cylindrical joint are threadedly connected to realize the connection between the chamber cover 120 and the chamber body 110, thereby sealing the sample holding chamber 111.

[0043] The air inlet connector 130 and the air outlet connector 140 may be respectively arranged on the two bin covers 120 . Taking the bin cover 120 on the left end as an example, the air inlet connector 130 may be arranged at the center of the end surface of the bin cover 120 away from the bin body 110 .

[0044] Alternatively, in other embodiments, the bin body 110 and the bin cover 120 may be connected via a flange, wherein flanges are provided at the open end of the bin body 110 and at a side of the bin cover 120 close to the bin body 110, and the two are detachably connected via the flange.

[0045] In some embodiments, in order to improve the sealing performance between the bin body 110 and the bin cover 120 , a sealing ring 300 may be disposed between the bin body 110 and the bin cover 120 .

[0046] In some embodiments, the gas supply pipe group may include at least one gas supply pipeline 210, each gas supply pipeline 210 is sequentially connected in series with a gas storage device and a gas volume control component, and the downstream end of the gas supply pipeline 210 may be directly connected to the gas inlet connector 130, or when the number of gas supply pipelines 210 is greater than or equal to two, the downstream ends of multiple gas supply pipelines 210 are connected to the gas inlet connector 130 through a gas mixing device 240. The gas volume control component is used to adjust the gas intake volume of each gas supply pipeline 210 individually.

[0047] Specifically, the gas supply pipeline 210 may include two routes, and of course it can also be one route, three routes, four routes or more routes. The downstream ends of the multiple gas supply pipelines 210 are all connected to the gas mixing device 240, and the gas mixing device 240 is connected to the air inlet connector 130. Each gas supply pipeline 210 is provided with a gas storage device and a gas volume control component. The gas storage device is arranged at the upstream end of the gas supply pipeline 210, and the gas volume control component includes a ball valve 220 and a flow meter 230. The ball valve 220 and the flow meter are both arranged on the downstream side of the gas storage device, and the flow meter 230 is arranged on the downstream side of the ball valve 220.

[0048] When in use, according to the experimental requirements, the switch of the ball valve 220 of the multi-channel gas supply pipeline 210 is adjusted, and the opening of the gas circuit is adjusted by adjusting the flow meter 230 to change the content of each gas entering the gas mixing device 240, thereby changing the gas components of the mixed gas. After being mixed by the gas mixing device 240, the mixed gas enters the sample holding chamber 111 through the air inlet connector 130, thereby changing the gas environment in which the sample is located.

[0049] In a specific embodiment, the sample bin includes a bin body 110 and two bin covers 120. The interior of the bin body 110 is a hollow rectangular parallelepiped structure, and the internal hollow portion forms a sample holding cavity 111. The sample holding cavity 111 is also a rectangular parallelepiped structure. The left and right ends of the sample holding cavity 111 are open, and the open ends form sample access ports. Cylindrical joints are respectively provided at the left and right ends of the bin body 110. The cylindrical joints are axially penetrated, and the end of the cylindrical joint close to the bin body 110 is connected to the bin body 110, and the outer side of the joint is provided with an external thread. The bin cover 120 is a cylinder with one end open and the other end closed. The inner side of the bin cover 120 is provided with an internal thread. The bin cover 120 is threadedly connected to the bin body 110. When the bin cover 120 is connected to the two ends of the bin body 110, a closed space is formed inside the bin body 110. The air inlet connector 130 is connected to the left center of the left compartment cover 120 , and the air outlet connector 140 is connected to the right center of the right compartment cover 120 .

[0050] The gas supply pipe group includes two gas supply pipelines 210 and a gas mixing device 240. Each gas supply pipeline 210 includes a gas cylinder 250, a ball valve 220 and a flow meter 230, and the gas cylinder 250, the ball valve 220 and the flow meter 230 are connected in series in sequence along the gas path direction. The downstream end of the gas supply pipeline 210 is connected to the gas mixing device 240, and the downstream end of the gas mixing device 240 is connected to the gas inlet connector 130.

[0051] When performing a photoluminescence spectrum test, first open the left compartment cover 120 and place the sample in the sample holding chamber 111. For powdery samples, the sample needs to be smeared on a quartz plate. For thin film samples, the sample can be directly placed in the sample holding chamber 111. The rear side of the quartz plate or thin film sample leans against the rear side of the sample holding chamber 111 and is supported on the bottom of the sample holding chamber 111. Then close the compartment cover 120 and fix the assembled sample compartment on the fixture of the solid support of the test instrument. At this time, the rear side of the sample holding chamber 111 is tilted backwards, so that the sample is kept stable and immobile, so as to achieve the effect of in-situ testing.

[0052] Then, according to the experimental requirements, the ball valves 220 on the gas supply pipelines 210 are adjusted to control the switch of the gas, and the flowmeter 230 is adjusted to adjust the intake amount of different gases. After the gases are mixed in the gas mixing device 240, they enter the sample holding chamber 111 through the gas intake connector 130. When the gas supply starts, the exhaust connector 140 is opened at the same time, or a gas collection device is connected to the exhaust connector 140, so that the gas introduced can exhaust the original gas in the sample holding chamber 111 to prevent the original gas from affecting the gas environment. When the original gas is completely exhausted, the exhaust connector 140 can be closed, or the online continuous ventilation state can be maintained.

[0053] Then adjust the position of the solid bracket for focusing so that the incident light of the test instrument enters the sample at a 30-degree angle. This can effectively reduce the interference of scattered light and stray light, ensure the accuracy and authenticity of the test results, and protect the spectrometer detector from damage by strong light.

[0054] The sample fixing device for photoluminescence spectrum testing provided by the present invention has the following advantages: First, a gas supply pipe group is set up to achieve precise control and rapid switching of the atmosphere around the sample during the test, ensuring high consistency and repeatability of the test conditions, fundamentally solving the problem of data incomparability caused by non-in-situ testing.

[0055] Second, the design of the sample holding chamber 111 is optimized to expand the sample holding range to meet the testing requirements of samples of different shapes and sizes, while reducing the impact of factors such as sample position and thickness on the test results.

[0056] Third, the incident direction of the light is at an angle of 30 or 60 degrees to the sample, which can effectively reduce the interference of scattered light and stray light, ensure the accuracy and authenticity of the test results, and protect the spectral detector from damage by strong light. In addition, the device can achieve flexible adjustment and precise focusing of the sample position, effectively improving the signal-to-noise ratio of the fluorescence signal.

[0057] An embodiment of the present invention further provides a photoluminescence spectrometer, which has the same advantages as described above because it is provided with the in-situ atmosphere control device for photoluminescence spectrum testing as described above.

[0058] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and they should all be included in the scope of the claims and specification of the present application. In particular, as long as there is no structural conflict, the various technical features mentioned in the various embodiments can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

Claims

1. An in-situ atmosphere control device for photoluminescence spectrum testing, characterized in that: include: A sample chamber, wherein a sample containing cavity (111) is provided inside the sample chamber, a sample limiting structure is provided inside the sample containing cavity (111), and an openable and closable sample taking and releasing port, an air inlet connector (130) and an air exhaust connector (140) are provided on the sample chamber, and the air inlet connector (130) and the air exhaust connector (140) are both connected to the inside and outside of the sample containing cavity (111); A gas supply pipe group, wherein the gas supply pipe group is connected to the gas inlet joint (130).

2. The in-situ atmosphere control device for photoluminescence spectrum testing according to claim 1, characterized in that: When the sample chamber is in the working position, the rear side surface of the sample holding cavity (111) extends upward and backward in an inclined manner, the angle between the bottom surface of the sample holding cavity (111) and the horizontal plane is greater than or equal to 0 degrees and less than or equal to 20 degrees, the angle between the bottom surface of the sample holding cavity (111) and the rear side surface is greater than or equal to 90 degrees and less than or equal to 120 degrees, and the bottom surface and the rear side surface of the sample holding cavity (111) form the sample limiting structure.

3. The in-situ atmosphere control device for photoluminescence spectrum testing according to claim 2, characterized in that: The sample containing cavity (111) is a cavity in the shape of a rectangular parallelepiped or a cube.

4. The in-situ atmosphere control device for photoluminescence spectrum testing according to claim 3, characterized in that: The sample chamber comprises a chamber body (110) and a chamber cover (120); the sample holding chamber (111) is arranged in the chamber body (110), and at least one end of the sample holding chamber (111) passes through the chamber body (110); one end of the sample holding chamber (111) forms the sample access opening; and the chamber cover (120) is detachably connected to the chamber body (110) and is used to close or open the sample holding chamber (111).

5. The in-situ atmosphere control device for photoluminescence spectrum testing according to claim 4, characterized in that: One of the air inlet connector (130) and the air outlet connector (140) is arranged on the bin cover (120), and the other is arranged on the bin body (110); or both the air inlet connector (130) and the air outlet connector (140) are arranged on the bin cover (120); or both the air inlet connector (130) and the air outlet connector (140) are arranged on the bin body (110).

6. The in-situ atmosphere control device for photoluminescence spectrum testing according to claim 4, characterized in that: The bin body (110) is threadably connected to the bin cover (120).

7. The in-situ atmosphere control device for photoluminescence spectrum testing according to claim 4 or 6, characterized in that: A sealing ring is provided between the bin cover (120) and the bin body (110).

8. The in-situ atmosphere control device for photoluminescence spectrum testing according to claim 1, characterized in that: The gas supply pipe group comprises at least one gas supply pipeline (210), each of the gas supply pipelines (210) being sequentially connected in series with a gas storage device, a ball valve (220) and a flow meter (230), the flow meter (230) being arranged on the downstream side of the ball valve (220), and the downstream end of the gas supply pipeline (210) being connected to the air intake structure.

9. The in-situ atmosphere control device for light luminescence spectrum testing according to claim 8, characterized in that: When the number of the gas supply pipelines (210) is greater than or equal to two, the downstream ends of the multiple gas supply pipelines (210) are connected to the gas inlet connector (130) via a gas mixing device (240).

10. A photoluminescence spectrometer, characterized in that: It comprises an in-situ atmosphere control device for photoluminescence spectrum testing as described in any one of claims 1 to 9.

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