Processing quality monitoring method and system based on injection molding production line

Abstract

The invention is suitable for the technical field of intelligent production, and provides a processing quality monitoring method and system based on an injection molding production line, and the method comprises the steps: firstly, rapidly obtaining the to-be-detected image information of a target mold cavity based on a camera, then effectively generating the to-be-detected contour information according to the to-be-detected image information and a contour extraction algorithm, and carrying out the detection of the to-be-detected contour information. And according to the to-be-detected contour information and the reference contour information, accurately generating plastic residual area information, and finally, based on the plastic residual area information, timely generating optimized production parameter set information. The processing quality of the injection molding production line can be monitored in real time, when residues are detected in the mold, the injection molding process parameters are intelligently and automatically adjusted, it is guaranteed that the residues in the mold are thoroughly discharged, the reliability of the injection molding production line is effectively improved, the stability of the production process is remarkably improved, and the production efficiency is improved. And the material waste condition and the generation of unqualified plastic products are reduced, and the sustainable development transformation of an injection molding production line is facilitated.

Description

Technical Field

[0001] The present application relates to the technical field of intelligent production, and in particular to a processing quality monitoring method and system based on an injection molding production line. Background Art

[0002] Injection molding production line is an industrial equipment used to manufacture plastic products. Its main working principle is to heat the plastic raw materials to a molten state, then inject it into the mold, and form a plastic product of the desired shape after cooling. Since injection molding production lines can quickly produce a large number of plastic products, injection molding production lines are more widely used.

[0003] At present, injection molding production lines usually produce according to fixed production parameters and lack automatic adjustment mechanisms. During large-scale continuous production, residues may gradually accumulate on the mold surface, resulting in a decrease in yield rate and low reliability, which needs further improvement. Summary of the invention

[0004] Based on this, the embodiment of the present application provides a processing quality monitoring method and system based on an injection molding production line to solve the problem of low reliability in the prior art.

[0005] In a first aspect, an embodiment of the present application provides a processing quality monitoring method based on an injection molding production line, the method comprising:

[0006] Based on the preset camera, the image information to be inspected of the target mold cavity is obtained;

[0007] Generate contour information to be detected according to the image information to be detected and a preset contour extraction algorithm;

[0008] Generate plastic residual area information according to the to-be-detected contour information and the preset reference contour information;

[0009] Based on the plastic residual area information, optimized production parameter set information is generated, wherein the optimized production parameter set information includes optimized temperature information, optimized pressure information and optimized injection speed information.

[0010] Compared with the prior art, the beneficial effects are as follows: the processing quality monitoring method based on the injection molding production line provided by the embodiment of the present application, the terminal device can first quickly obtain the image information to be detected of the target mold cavity based on the camera, and then effectively generate the contour information to be detected based on the image information to be detected and the contour extraction algorithm, and then accurately generate the plastic residual area information based on the contour information to be detected and the reference contour information, and finally, based on the plastic residual area information, timely generate the optimized production parameter set information, so as to monitor the processing quality of the injection molding production line in real time, and when it is detected that there is residue in the target mold cavity, the injection molding process parameters are automatically adjusted to ensure that the residue in the mold is completely discharged, thereby effectively improving the reliability and solving the current low reliability problem to a certain extent.

[0011] In a second aspect, an embodiment of the present application provides a processing quality monitoring system based on an injection molding production line, the system comprising:

[0012] The module for acquiring the image information to be detected is used to acquire the image information to be detected of the target mold cavity based on a preset camera;

[0013] A module for generating contour information to be detected: used to generate contour information to be detected according to the image information to be detected and a preset contour extraction algorithm;

[0014] A plastic residue area information generating module is used to generate plastic residue area information according to the contour information to be detected and the preset reference contour information;

[0015] Optimized production parameter set information generation module: used to generate optimized production parameter set information based on the plastic residual area information, wherein the optimized production parameter set information includes optimized temperature information, optimized pressure information and optimized injection speed information.

[0016] In a third aspect, an embodiment of the present application provides a terminal device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the method of the first aspect described above when executing the computer program.

[0017] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method of the first aspect described above are implemented.

[0018] It can be understood that the beneficial effects of the second to fourth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art are briefly introduced below.

[0020] Figure 1 is a flow chart of a processing quality monitoring method provided by an embodiment of the present application;

[0021] Figure 2 is a flow chart of step S300 in the processing quality monitoring method provided in one embodiment of the present application;

[0022] Figure 3 It is a first flow chart after step S300 in the processing quality monitoring method provided in one embodiment of the present application;

[0023] Figure 4 is a flow chart of step S400 in the processing quality monitoring method provided in one embodiment of the present application;

[0024] Figure 5 It is a second flow chart after step S300 in the processing quality monitoring method provided in one embodiment of the present application;

[0025] Figure 6 It is a module block diagram of a processing quality monitoring system provided by an embodiment of the present application;

[0026] Figure 7 It is a schematic diagram of a terminal device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0027] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0028] In the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0029] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0030] In order to illustrate the technical solution described in this application, a specific embodiment is provided below for illustration.

[0031] See also Figure 1 , Figure 1 : is a flow chart of a processing quality monitoring method based on an injection molding production line provided in an embodiment of the present application. In this embodiment, the execution subject of the processing quality monitoring method is a terminal device. It is understandable that the types of terminal devices include but are not limited to mobile phones, tablet computers, laptop computers, ultra-mobile personal computers (Ultra-Mobile Personal Computer, UMPC), netbooks, personal digital assistants (Personal Digital Assistant, PDA), etc., and the embodiments of the present application do not impose any restrictions on the specific types of terminal devices.

[0032] See also Figure 1 The processing quality monitoring method provided in the embodiment of the present application includes but is not limited to the following steps:

[0033] In S100, based on a preset camera, image information to be inspected of a target mold cavity is obtained.

[0034] Specifically, the terminal device can first obtain the image information to be inspected of the target mold cavity based on a preset camera, wherein the camera lens is facing the target mold cavity, and the target mold cavity is used to describe the mold to be inspected; the image information to be inspected is used to describe the real-time image obtained by the camera shooting the target mold cavity.

[0035] In S200, contour information to be detected is generated according to the image information to be detected and a preset contour extraction algorithm.

[0036] Specifically, after the terminal device obtains the image information to be detected, the terminal device can use a preset contour extraction algorithm to perform edge contour line extraction processing on the image information to be detected to generate contour information to be detected, wherein the contour information to be detected is used to describe the edge contour line corresponding to the target mold cavity in the image information to be detected.

[0037] In S300, plastic residual area information is generated according to the contour information to be detected and the preset reference contour information.

[0038] Specifically, after the terminal device generates the contour information to be detected, the terminal device can effectively generate plastic residual area information based on the contour information to be detected and the preset reference contour information, thereby accurately determining the residue in the target mold cavity, which will have an adverse effect on the plastic product.

[0039] In some possible implementations, in order to generate plastic residue area information, see Figure 2 Step S300 includes but is not limited to the following steps:

[0040] In S310, difference contour information is generated according to the contour information to be detected and the preset reference contour information.

[0041] Specifically, the terminal device can generate difference contour information based on the contour information to be detected and the preset reference contour information, wherein the reference contour information is used to describe the edge contour line of the target mold cavity before it starts to participate in production, and the difference contour information is used to describe the contour in the contour information to be detected other than the reference contour information, that is, the area in the contour information to be detected that differs from the reference contour information.

[0042] In S320, plastic residual area information is generated according to the difference contour information.

[0043] Specifically, after the terminal device generates the difference contour information, the terminal device can quickly generate plastic residue area information according to the difference contour information, wherein the plastic residue area information is used to describe the closed area surrounded by the difference contour information.

[0044] In some possible implementations, in order to facilitate the inspection personnel to analyze the cause of the accumulation of residues and carry out targeted repairs on the injection molding production line, please refer to Figure 3 After step S300, the method further includes but is not limited to the following steps:

[0045] In S301, for any two adjacent plastic residue area information: based on a preset distance calculation formula, generate interval distance information.

[0046] Specifically, after the terminal device generates the plastic residual area information, the terminal device can calculate the shortest distance between any two adjacent plastic residual area information based on a preset distance calculation formula, and generate interval distance information, wherein the interval distance information is used to describe the shortest distance between the two adjacent plastic residual area information. The distance calculation formula is an existing technology, so it is not repeated here.

[0047] In S302, the interval distance information is compared with the preset distance threshold information.

[0048] Specifically, after the terminal device generates the interval distance information, the terminal device may compare the interval distance information with preset distance threshold information, wherein the distance threshold information may be a preset custom value.

[0049] In S303, if the interval distance information is less than the distance threshold information, two adjacent plastic residue area information are determined to be associated area information.

[0050] Specifically, if the interval distance information is less than the distance threshold information, it means that there is a correlation between the two adjacent plastic residual area information. The terminal device can determine that the two adjacent plastic residual area information is associated area information, thereby facilitating the inspection personnel to carry out targeted repairs on the injection molding production line.

[0051] In S400, based on the plastic residual area information, optimized production parameter set information is generated.

[0052] Specifically, after the terminal device generates the plastic residual area information, the terminal device can effectively generate the optimized production parameter set information based on the plastic residual area information, wherein the optimized production parameter set information includes optimized temperature information, optimized pressure information and optimized injection speed information, and the optimized temperature information is used to describe the optimized temperature of the molten plastic, that is, the temperature at which the plastic particles are heated to a molten state; the optimized pressure information is used to describe the optimized injection pressure, that is, the pressure applied by the injection machine to inject the molten plastic into the mold cavity through the screw; the optimized injection speed information is used to describe the optimized injection speed, that is, the speed at which the molten plastic is injected into the mold.

[0053] In some possible implementations, in order to automatically adjust the injection molding process parameters when there are residues in the mold, optimize the fluidity of the plastic, ensure that the residues in the mold are completely discharged, and improve the processing quality of plastic products, please refer to Figure 4 Step S400 includes but is not limited to the following steps:

[0054] In S410, initial production parameter set information, preset first adjustment value set information, and preset second adjustment value set information are obtained.

[0055] Specifically, the terminal device can obtain the initial production parameter set information, the preset first adjustment value set information and the preset second adjustment value set information, wherein the initial production parameter set information is used to describe the set corresponding to the initial production parameters of the injection molding production line, and the initial production parameter set information includes initial temperature information, initial pressure information and initial injection speed information, and the initial temperature information is used to describe the initial temperature of the molten plastic; the initial pressure information is used to describe the initial injection pressure; and the initial injection speed information is used to describe the initial injection speed. The first adjustment value set information includes the first temperature information, the first pressure information and the first injection speed information, wherein the first temperature information, the first pressure information and the first injection speed information are all positive values. The second adjustment value set information includes the second temperature information, the second pressure information and the second injection speed information, wherein the second temperature information, the second pressure information and the second injection speed information are all positive values, the second temperature information is greater than the first temperature information, the second pressure information is greater than the first pressure information, and the second injection speed information is greater than the first injection speed information.

[0056] In S420, the residual area information is generated according to the plastic residual area information and a preset area calculation formula.

[0057] Specifically, after the terminal device obtains the initial production parameter set information, the first adjustment value set information and the second adjustment value set information, the terminal device can divide the plastic residual area information into multiple regular geometric shapes, such as rectangles or triangles, and then use a preset area calculation formula to calculate the area of ​​each geometric shape, and then calculate the sum of the areas corresponding to each geometric shape to generate the residual area information, wherein the area calculation formula is an existing technology, so it will not be repeated.

[0058] In S430, the residual region area information is compared with the preset region area threshold information.

[0059] Specifically, after the terminal device generates the residual region area information, the terminal device may compare the residual region area information with preset region area threshold information, wherein the region area threshold information may be a preset custom value.

[0060] In S440, if the residual region area information is less than or equal to the region area threshold information, the optimized temperature information is generated according to the sum of the initial temperature information and the first temperature information, and the optimized pressure information is generated according to the sum of the initial pressure information and the first pressure information, and the optimized injection speed information is generated according to the sum of the initial injection speed information and the first injection speed information.

[0061] Specifically, if the residual area information is less than or equal to the area threshold information, it indicates that the residual situation is relatively mild. The terminal device can generate optimized temperature information based on the sum of the initial temperature information and the first temperature information, and generate optimized pressure information based on the sum of the initial pressure information and the first pressure information, and generate optimized injection speed information based on the sum of the initial injection speed information and the first injection speed information.

[0062] In S450, if the residual area information is greater than the area threshold information, the optimized temperature information is generated according to the sum of the initial temperature information, the first temperature information and the second temperature information, and the optimized pressure information is generated according to the sum of the initial pressure information, the first pressure information and the second pressure information, and the optimized injection speed information is generated according to the sum of the initial injection speed information, the first injection speed information and the second injection speed information.

[0063] Specifically, if the residual area information is greater than the area threshold information, it indicates that the residual situation is serious. The terminal device can generate optimized temperature information based on the sum of the initial temperature information, the first temperature information, and the second temperature information, and generate optimized pressure information based on the sum of the initial pressure information, the first pressure information, and the second pressure information. At the same time, it generates optimized injection speed information based on the sum of the initial injection speed information, the first injection speed information, and the second injection speed information.

[0064] In some possible implementations, in order to help ensure complete discharge of residues, please refer to Figure 5 After step S300, the method further includes but is not limited to the following steps:

[0065] In S304, historical residual area information is obtained.

[0066] Specifically, the terminal device may obtain historical residual area information, wherein the historical residual area information may be an area corresponding to the residue of the mold after the last injection molding process.

[0067] In S305, overlapping area information is generated based on the plastic residual area information and the historical residual area information.

[0068] Specifically, after the terminal device obtains the historical residual area information, the terminal device can generate overlapping area area information based on the plastic residual area information and the historical residual area information, wherein the overlapping area area information is used to describe the overlapping area between the plastic residual area information and the historical residual area information.

[0069] In S306, the region overlap ratio information is generated according to the quotient of the overlap region area information divided by the plastic residue region information.

[0070] Specifically, after the terminal device generates the overlapping area information, the terminal device can generate the regional overlap rate information based on the quotient of the overlapping area information divided by the plastic residue area information, wherein the regional overlap rate information is used to describe the overlap rate between the plastic residue area information and the historical residue area information.

[0071] In S307, the area overlap rate information is compared with the preset overlap rate threshold information.

[0072] Specifically, after the terminal device generates the area overlap rate information, the terminal device may compare the area overlap rate information with the preset overlap rate threshold information, wherein the overlap rate threshold information may be a preset custom value.

[0073] In S308, if the area overlap rate information is greater than or equal to the overlap rate threshold information, manual cleaning information is generated.

[0074] Specifically, if the regional overlap rate information is greater than or equal to the overlap rate threshold information, it indicates that the residue situation this time is similar to the residue situation last time, and manual intervention is required for cleaning. Therefore, the terminal device can generate manual cleaning information, where the manual cleaning information is used to describe that adjusting the production parameters alone is not enough to completely eliminate the residue in the mold, and the mold requires manual intervention for cleaning.

[0075] The implementation principle of the processing quality monitoring method based on the injection molding production line in the embodiment of the present application is as follows: the terminal device can first quickly obtain the image information to be detected of the target mold cavity based on the camera, and then effectively generate the contour information to be detected based on the image information to be detected and the contour extraction algorithm, and then accurately generate the plastic residual area information based on the contour information to be detected and the reference contour information, and finally, based on the plastic residual area information, timely generate the optimized production parameter set information, so as to monitor the processing quality of the injection molding production line in real time, and automatically adjust the injection molding process parameters when there are residues in the mold to ensure that the residues in the mold are completely discharged, thereby effectively improving reliability.

[0076] It should be noted that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0077] The embodiment of the present application also provides a processing quality monitoring system based on an injection molding production line. For ease of description, only the parts related to the present application are shown, such as Figure 6 As shown, the system 60 includes:

[0078] The image information acquisition module 61 is used to acquire the image information to be detected of the target mold cavity based on a preset camera;

[0079] The to-be-detected contour information generating module 62 is used to generate the to-be-detected contour information according to the to-be-detected image information and a preset contour extraction algorithm;

[0080] The plastic residue area information generating module 63 is used to generate the plastic residue area information according to the contour information to be detected and the preset reference contour information;

[0081] The optimized production parameter set information generating module 64 is used to generate the optimized production parameter set information based on the plastic residual area information, wherein the optimized production parameter set information includes the optimized temperature information, the optimized pressure information and the optimized injection speed information.

[0082] Optionally, the above-mentioned plastic residue area information generating module 63 includes:

[0083] The difference contour information generating submodule is used to generate difference contour information according to the contour information to be detected and the preset reference contour information, wherein the difference contour information is used to describe the contours other than the reference contour information in the contour information to be detected;

[0084] Plastic residue area information generation submodule: used to generate plastic residue area information according to the difference contour information, wherein the plastic residue area information is used to describe the closed area surrounded by the difference contour information.

[0085] Optionally, the above-mentioned optimized production parameter set information generating module 64 includes:

[0086] Initial production parameter set information acquisition submodule: used to acquire initial production parameter set information, preset first adjustment value set information and preset second adjustment value set information, wherein the initial production parameter set information includes initial temperature information, initial pressure information and initial injection speed information, the first adjustment value set information includes first temperature information, first pressure information and first injection speed information, and the second adjustment value set information includes second temperature information, second pressure information and second injection speed information;

[0087] Residual area area information generation submodule: used to generate residual area area information according to the plastic residual area information and a preset area calculation formula;

[0088] Residual area information comparison submodule: used to compare the residual area information with the preset area threshold information;

[0089] The first generation submodule of optimized temperature information is used for generating optimized temperature information according to the sum of the initial temperature information and the first temperature information if the residual area information is less than or equal to the area threshold information, generating optimized pressure information according to the sum of the initial pressure information and the first pressure information, and generating optimized injection speed information according to the sum of the initial injection speed information and the first injection speed information;

[0090] The second submodule for generating optimized temperature information is used to generate optimized temperature information according to the sum of the initial temperature information, the first temperature information and the second temperature information if the residual area information is greater than the area threshold information, and to generate optimized pressure information according to the sum of the initial pressure information, the first pressure information and the second pressure information, and to generate optimized injection speed information according to the sum of the initial injection speed information, the first injection speed information and the second injection speed information.

[0091] Optionally, the system 60 further includes:

[0092] Interval distance information generation module: used for generating interval distance information for any two adjacent plastic residue area information based on a preset distance calculation formula;

[0093] Interval distance information comparison module: used to compare the interval distance information with the preset distance threshold information;

[0094] Associated area information determination module: used to determine that two adjacent plastic residue area information are associated area information if the interval distance information is less than the distance threshold information.

[0095] Optionally, the system 60 further includes:

[0096] Historical residual area information acquisition module: used to obtain historical residual area information;

[0097] Overlapping area information generation module: used to generate overlapping area information based on plastic residue area information and historical residue area information;

[0098] A regional overlap rate information generating module: used to generate regional overlap rate information according to a quotient value of the overlap area information divided by the plastic residue area information;

[0099] Regional overlap rate information comparison module: used to compare regional overlap rate information with preset overlap rate threshold information;

[0100] Manual cleaning information generation module: used to generate manual cleaning information if the area overlap rate information is greater than or equal to the overlap rate threshold information.

[0101] It should be noted that the information interaction, execution process and other contents between the above-mentioned modules are based on the same concept as the method embodiment of the present application. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0102] The present application also provides a terminal device, such as Figure 7 As shown, the terminal device 70 of this embodiment includes: a processor 71, a memory 72, and a computer program 73 stored in the memory 72 and executable on the processor 71. When the processor 71 executes the computer program 73, the steps in the above-mentioned processing quality monitoring method embodiment are implemented, such as Figure 1 Steps S100 to S400 shown; or, when the processor 71 executes the computer program 73, the functions of each module in the above device are realized, for example Figure 6 The functions of modules 61 to 64 are shown.

[0103] The terminal device 70 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server, and the terminal device 70 includes but is not limited to a processor 71 and a memory 72. Those skilled in the art will appreciate that Figure 7 It is only an example of the terminal device 70 and does not constitute a limitation of the terminal device 70. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the terminal device 70 may also include input and output devices, network access devices, buses, etc.

[0104] Among them, the processor 71 can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc.; the general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc.

[0105] The memory 72 may be an internal storage unit of the terminal device 70, such as a hard disk or memory of the terminal device 70, or the memory 72 may be an external storage device of the terminal device 70, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the terminal device 70; further, the memory 72 may also include both an internal storage unit and an external storage device of the terminal device 70, and the memory 72 may also store a computer program 73 and other programs and data required by the terminal device 70, and the memory 72 may also be used to temporarily store data that has been output or is to be output.

[0106] One embodiment of the present application also provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the steps of each of the above method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form, etc.; the computer-readable medium may include: any entity or device that can carry computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc.

[0107] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, all equivalent changes made according to the methods, principles, and structures of the present application should be included in the protection scope of the present application.

Claims

1. A processing quality monitoring method based on an injection molding production line, characterized in that: The method comprises: Based on the preset camera, the image information to be inspected of the target mold cavity is obtained; Generate contour information to be detected according to the image information to be detected and a preset contour extraction algorithm; Generate plastic residual area information according to the to-be-detected contour information and the preset reference contour information; Based on the plastic residual area information, optimized production parameter set information is generated, wherein the optimized production parameter set information includes optimized temperature information, optimized pressure information and optimized injection speed information.

2. The method according to claim 1, characterized in that The step of generating plastic residual area information according to the to-be-detected contour information and the preset reference contour information includes: Generate difference contour information according to the contour information to be detected and preset reference contour information, wherein the difference contour information is used to describe the contour of the contour information to be detected except the reference contour information; The plastic residue area information is generated according to the difference contour information, wherein the plastic residue area information is used to describe a closed area surrounded by the difference contour information.

3. The method according to claim 2, characterized in that The step of generating optimized production parameter set information based on the plastic residual area information includes: Acquire initial production parameter set information, preset first adjustment value set information and preset second adjustment value set information, wherein the initial production parameter set information includes initial temperature information, initial pressure information and initial injection speed information, the first adjustment value set information includes first temperature information, first pressure information and first injection speed information, and the second adjustment value set information includes second temperature information, second pressure information and second injection speed information; Generate residual area information according to the plastic residual area information and a preset area calculation formula; Comparing the residual region area information with preset region area threshold information; If the residual region area information is less than or equal to the region area threshold information, the optimized temperature information is generated according to the sum of the initial temperature information and the first temperature information, the optimized pressure information is generated according to the sum of the initial pressure information and the first pressure information, and the optimized injection speed information is generated according to the sum of the initial injection speed information and the first injection speed information; If the residual area information is greater than the area threshold information, the optimized temperature information is generated according to the sum of the initial temperature information, the first temperature information and the second temperature information, and the optimized pressure information is generated according to the sum of the initial pressure information, the first pressure information and the second pressure information, and the optimized injection speed information is generated according to the sum of the initial injection speed information, the first injection speed information and the second injection speed information.

4. The method according to claim 2, characterized in that: After generating the plastic residual area information according to the to-be-detected contour information and the preset reference contour information, the method further includes: For any two adjacent plastic residue area information: generating interval distance information based on a preset distance calculation formula; Comparing the interval distance information with preset distance threshold information; If the interval distance information is less than the distance threshold information, it is determined that the two adjacent plastic residue area information are associated area information.

5. The method according to claim 1, characterized in that After generating the plastic residual area information according to the to-be-detected contour information and the preset reference contour information, the method further includes: Obtain historical residual area information; Generate overlapping area information according to the plastic residue area information and the historical residue area information; Generate regional overlap rate information according to a quotient value of the overlap region area information divided by the plastic residue region information; Comparing the regional overlap rate information with preset overlap rate threshold information; If the area overlap rate information is greater than or equal to the overlap rate threshold information, manual cleaning information is generated.

6. A processing quality monitoring system based on an injection molding production line, characterized in that: The system comprises: The module for acquiring the image information to be detected is used to acquire the image information to be detected of the target mold cavity based on a preset camera; A module for generating contour information to be detected: used to generate contour information to be detected according to the image information to be detected and a preset contour extraction algorithm; A plastic residue area information generating module is used to generate plastic residue area information according to the contour information to be detected and the preset reference contour information; Optimized production parameter set information generation module: used to generate optimized production parameter set information based on the plastic residual area information, wherein the optimized production parameter set information includes optimized temperature information, optimized pressure information and optimized injection speed information.

7. The system according to claim 6, characterized in that The plastic residue area information generation module includes: The difference contour information generating submodule is used to generate difference contour information according to the contour information to be detected and the preset reference contour information, wherein the difference contour information is used to describe the contour of the contour information to be detected except the reference contour information; Plastic residue area information generation submodule: used to generate the plastic residue area information according to the difference contour information, wherein the plastic residue area information is used to describe the closed area surrounded by the difference contour information.

8. A terminal device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 5 are implemented.

9. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

Images