Display device and electronic apparatus

Abstract

The embodiment of the invention provides a display device and electronic equipment. According to the display device, a display panel comprises a first binding part and a second binding part, one end of a driving chip is in binding connection with the first binding part, a flexible circuit board is connected with the other end of the driving chip through the second binding part, and the first binding part comprises at least one first invalid pin and at least one test line; the first invalid pin is connected with the test line, so that detection can be performed through the test line when a signal transmitted by the display device is detected, the test line is a routing line in the display panel, the accuracy of the detected signal is relatively high, the display device can be directly detected, a flexible circuit board does not need to be tested, the detection period is relatively short, and the detection efficiency is relatively high. And the detection efficiency and accuracy are improved.

Description

Technical Field

[0001] The present application relates to the field of display technology, and in particular to a display device and an electronic device. Background Art

[0002] With the development of display technology, display panels are applied to different electronic products, such as mobile phones, tablets, laptops, and car displays. In the use of various display devices, the mobile industry processor interface (MIPI), low-voltage differential signal (LVDS), standard protocol in the field of digital display technology (Embedded DisplayPort, EDP), integrated serial port protocol (ISP), point-to-point high-speed interface (PHI) and other protocols are mainly used for signal transmission. In the actual display process, these signals will be transmitted from the whole machine to the display panel. Due to the long signal transmission distance and high transmission bit rate, these signals will be affected by factors such as noise, distortion, insertion / loop loss and crosstalk, resulting in signal distortion, errors and even system failures, resulting in abnormal display images. In order to prevent abnormal signals from causing abnormal display, the display device will be tested, but the existing detection process has a long cycle, a low success rate, and inaccurate detection results, resulting in the problem of abnormal display caused by abnormal signals.

[0003] Therefore, the existing display device has a technical problem of inaccurate detection results in the way of detecting the transmission signal. Summary of the invention

[0004] Embodiments of the present application provide a display device and an electronic device to solve the technical problem that the existing display device detects transmission signals in an inaccurate manner.

[0005] In order to achieve the above object, according to a first aspect of the present application, a display device is provided, comprising:

[0006] The display panel comprises a display area and a non-display area, wherein a first binding portion and a second binding portion are provided in the non-display area;

[0007] A driving chip, one end of which is bound and connected to the first binding portion;

[0008] A flexible circuit board, wherein the flexible circuit board is connected to the other end of the driving chip through the second binding portion;

[0009] The first binding portion includes at least one first invalid pin and at least one test line, the test line is arranged on a side close to the display area, and the first invalid pin is connected to the test line.

[0010] Optionally, the first binding portion includes a first connection line group and a first binding pin group, the second binding portion includes a second binding pin group, a second connection line group and a third binding pin group, the first connection line group is connected to the first binding pin group, and the second connection line group is connected to the second binding pin group and the third binding pin group;

[0011] The driving chip comprises an input pin group and an output pin group, the output pin group is bound and connected with the first binding pin group, and the input pin group is bound and connected with the second binding pin group;

[0012] The flexible circuit board comprises a fourth binding pin group, and the fourth binding pin group is bound and connected with the third binding pin group;

[0013] The first binding pin group includes the first invalid pin, and the first connecting line group includes the test line.

[0014] Optionally, the first binding pin group also includes multiple first valid pins, the output pin group includes multiple second valid pins and at least one second invalid pin, the first connecting line group also includes multiple signal transmission lines, the first valid pin is bound and connected to the second valid pin, the first invalid pin is bound and connected to the second invalid pin, and the signal transmission line is connected to the first valid pin.

[0015] Optionally, the first connection line group includes at least two test lines, the first binding pin group includes at least two first invalid pins, and each of the test lines is connected to one of the first invalid pins.

[0016] Optionally, the test line includes connecting wires and binding terminals, each of the connecting wires is connected to one of the first invalid pins, each of the binding terminals is connected to one of the connecting wires, and a width of the binding terminals is greater than a width of the connecting wires.

[0017] Optionally, when the display device is configured in a test state, the binding terminal inputs different signals at different times.

[0018] Optionally, the number of the first invalid pins is equal to the number of the second invalid pins, the number of the test lines is equal to the number of the first invalid pins, the first invalid pins are bound to the second invalid pins in a one-to-one correspondence, and the first invalid pins are connected to the test lines in a one-to-one correspondence.

[0019] Optionally, the number of the first invalid pins is equal to the number of the second invalid pins, the number of the test lines is less than the number of the first invalid pins, the first invalid pins are bound to the second invalid pins in a one-to-one correspondence, and some of the first invalid pins are connected to the test lines accordingly.

[0020] Optionally, the line width of the test line is equal to the width of the signal transmission line.

[0021] Optionally, the driving chip further includes a thin film transistor and a control line, a gate of the thin film transistor is connected to the control line, an electrode of the thin film transistor is electrically connected to the input pin group, and another electrode of the thin film transistor is electrically connected to the second invalid pin.

[0022] Optionally, when the display device is in a test state, the control line outputs a valid level; when the display device is in a non-test state, the control line outputs an invalid level.

[0023] According to a second aspect of the present application, an electronic device is provided, which includes a display device as described in any one of the above embodiments.

[0024] The embodiments of the present application provide a display device and an electronic device; the display device is configured such that a display panel includes a first binding portion and a second binding portion, one end of a driving chip is bound and connected to the first binding portion, a flexible circuit board is connected to the other end of the driving chip through the second binding portion, the first binding portion includes at least one first invalid pin and at least one test line, the first invalid pin is connected to the test line, so that when a signal transmitted by the display device is detected, the test line can be used for detection, and since the test line is a wiring line within the display panel, the accuracy of the detected signal is high, and the display device can be directly detected without testing the flexible circuit board, the detection cycle is short, and the efficiency and accuracy of the detection are improved.

[0025] Other features and advantages of the present application will be described in detail in the subsequent detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application, and those skilled in the art can obtain other drawings based on these drawings without creative work.

[0027] In order to more completely understand the present application and its beneficial effects, the following description will be given in conjunction with the accompanying drawings, wherein the same figure numbers represent the same parts in the following description.

[0028] Figure 1 A schematic diagram of the structure of a comparative display device provided in an embodiment of the present application.

[0029] Figure 2 for Figure 1 The comparison in the figure shows the signal transmission diagram of the device.

[0030] Figure 3 for Figure 1 The comparison in the figure shows the specific structural diagram of the circuit board, chip and panel of the device.

[0031] Figure 4 A schematic plan view of a display device provided in an embodiment of the present application.

[0032] Figure 5 A schematic diagram of a first stacking method of a display panel, a flexible circuit board and a driving chip in a display device provided in an embodiment of the present application.

[0033] Figure 6 for Figure 5 An exploded view of a display panel, a flexible circuit board and a driving chip in a display device.

[0034] Figure 7 A second schematic diagram of stacking of a display panel, a flexible circuit board and a driving chip in a display device provided in an embodiment of the present application.

[0035] Figure 8 for Figure 7 An exploded view of a display panel, a flexible circuit board and a driving chip in a display device.

[0036] Fig. 9 A schematic diagram of a driver chip provided in an embodiment of the present application.

[0037] Fig.10 A third stacking diagram of a display panel, a flexible circuit board and a driving chip in a display device provided in an embodiment of the present application.

[0038] Fig.11 A first schematic diagram of using a differential probe provided in an embodiment of the present application to detect a display device.

[0039] Fig.12 A second schematic diagram of using a differential probe provided in an embodiment of the present application to detect a display device.

[0040] Fig.13 A schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0041] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0042] In the embodiments of the present application, it should be noted that, unless otherwise clearly specified and limited, the term "connection" means that the two are directly connected, and "electrical connection" means that the two can be directly connected or indirectly connected through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0043] In order to explain the principle of the technical problem of the present application, the present application embodiment provides a comparative display device. It is understandable that the comparative display device cannot be used as the prior art of the present application. Figure 1 As shown, the comparative display device includes a whole machine 11, a circuit board 12, a chip 13 and a panel 14. The whole machine 11 may be a system motherboard, the circuit board 12 may be a flexible circuit board, the chip 13 may be a driver chip, and the panel 14 may be a display panel. The whole machine 11 is connected to the panel 14 through the circuit board 12, and the chip 13 is bound to the panel 14. When the comparative display device is working, Figure 2 As shown, taking the comparison display device using the mobile industry processor interface for data transmission as an example, the whole machine 11 will send a high-speed signal to the circuit board 12, and the circuit board 12 will transmit the high-speed signal to the chip 13. The chip 13 is bound together with the panel 14, so the signal can be transmitted to the panel 14 to make the panel display.

[0044] Specifically, Figure 3 As shown, a circuit pin 121 is provided on the circuit board 12, a receiving pin 131 and a driving pin are provided on the chip 13, the driving pin includes a valid driving pin 132a and an invalid driving pin 132b, the circuit pin 121, the receiving pin 131, and the driving pin are all bound to the terminals on the panel, and the first wiring 141 is connected to the terminals on the panel to realize the connection between the circuit pin 121 and the receiving pin 131, and the second wiring 142 is connected to the valid driving pin 132a to realize signal transmission.

[0045] However, during the transmission of high-speed signals, there will be noise, distortion, insertion / loop loss and crosstalk, which will cause signal distortion, errors and even system failures, resulting in abnormal screen display. In order to solve this problem, during the preparation of the comparative display device, detection will be carried out. Specifically, the circuit pin 121 on the circuit board 12 will be scraped off, and the gold wire will be led out for signal measurement. However, this method has a high cost, a low success rate, and cannot be measured in the factory, and the cycle is long. And because the signal detected is at the circuit board end, and the signal needs to pass through the wiring and chip on the panel to reach the signal line of the display panel, these processes will also be affected by noise, distortion, insertion / loop loss and crosstalk. Even if the test results obtained at the circuit board end are normal, it is still possible that the signal received by the panel is abnormal, resulting in abnormal display. Therefore, there is a technical problem that the existing display device has an inaccurate detection result in the way of detecting the transmission signal.

[0046] In view of the above technical problems, the embodiments of the present application provide a display device and an electronic device to solve the above technical problems.

[0047] Figure 4 A schematic plan view of a display device provided in an embodiment of the present application. Figure 5 A schematic diagram of a first stacking method of a display panel, a flexible circuit board and a driving chip in a display device provided in an embodiment of the present application. Figure 6 for Figure 5 An exploded view of a display panel, a flexible circuit board and a driving chip in a display device; Figure 6 (a) in Figure 5 An exploded view of a flexible circuit board in a display device; Figure 6 (b) in Figure 5 An exploded view of a display panel in a display device; Figure 6 (c) in Figure 5 An exploded view of a driver chip in a display device. Figure 7 A second schematic diagram of stacking of a display panel, a flexible circuit board and a driving chip in a display device provided in an embodiment of the present application. Figure 8 for Figure 7 An exploded view of a display panel, a flexible circuit board and a driving chip in a display device; Figure 8 (a) in Figure 7 An exploded view of a flexible circuit board in a display device; Figure 8 (b) in Figure 7 An exploded view of a display panel in a display device; Figure 8 (c) in Figure 7 An exploded view of a driver chip in a display device. Fig. 9 A schematic diagram of a driver chip provided in an embodiment of the present application. Fig.10A third stacking diagram of a display panel, a flexible circuit board and a driving chip in a display device provided in an embodiment of the present application. Fig.11 A first schematic diagram of using a differential probe provided in an embodiment of the present application to detect a display device. Fig.12 A second schematic diagram of using a differential probe provided in an embodiment of the present application to detect a display device. Fig.13 A schematic diagram of an electronic device provided in an embodiment of the present application.

[0048] like Figures 4 to 9 As shown, an embodiment of the present application provides a display device, which includes a display panel 21, a driver chip 22 and a flexible circuit board 23. The display panel 21 includes a display area 201 and a non-display area 202. A first binding portion 21a and a second binding portion 21b are provided in the non-display area 202. One end of the driver chip 22 is bound and connected to the first binding portion 21a, and the flexible circuit board 23 is connected to the other end of the driver chip 22 through the second binding portion 21b, wherein the first binding portion 21a includes at least one first invalid pin 213b and at least one test line 211b, and the test line 211b is arranged on a side close to the display area 201, and the first invalid pin 213b is connected to the test line 211b.

[0049] An embodiment of the present application provides a display device, wherein the display panel includes a first binding portion and a second binding portion, one end of a driving chip is bound and connected to the first binding portion, and a flexible circuit board is connected to the other end of the driving chip through the second binding portion, the first binding portion includes at least one first invalid pin and at least one test line, and the first invalid pin is connected to the test line, so that when a signal transmitted by the display device is detected, the test line can be used for detection, and since the test line is a wiring line in the display panel, the accuracy of the detected signal is high, and the display device can be directly detected without testing the flexible circuit board, and the detection cycle is short, thereby improving the efficiency and accuracy of the detection.

[0050] In some embodiments, Figures 4 to 9As shown, the first binding part 21a includes a first connecting wire group 211 and a first binding pin group 213, the second binding part 21b includes a second binding pin group 214, a second connecting wire group 212 and a third binding pin group 215, the first connecting wire group 211 is connected to the first binding pin group 213, the second connecting wire group 212 is connected to the second binding pin group 214 and the third binding pin group 215; the driving chip 22 includes an input pin group 221 and an output pin group 222, the output pin group 222 is bound and connected to the first binding pin group 213, the input pin group 221 is bound and connected to the second binding pin group 214, the flexible circuit board 23 includes a fourth binding pin group 231, and the fourth binding pin group 231 is bound and connected to the third binding pin group 215;

[0051] The first binding pin group 213 includes the first invalid pin 213b, and the first connecting wire group 211 includes the test wire 211b. By making the first binding pin group include the first invalid pin and the first connecting wire group include the test wire, when detecting the signal transmitted by the display device, the test wire can be used for detection, and since the test wire is a wiring in the display panel, the accuracy of the detected signal is high, and the display device can be directly detected without testing the flexible circuit board, the detection cycle is short, and the efficiency and accuracy of the detection are improved.

[0052] In some embodiments, Figures 4 to 9 As shown, the first binding pin group 213 also includes a plurality of first valid pins 213a, the output pin group 222 includes a plurality of second valid pins 222a and at least one second invalid pin 222b, the first connecting line group 211 also includes a plurality of signal transmission lines 211a, the first valid pin 213a is bound and connected with the second valid pin 222a, the first invalid pin 213b is connected with the second invalid pin 222b, and the signal transmission line 211a is connected with the first valid pin 213a. By making the output pin group of the driving chip include the second valid pin and the second invalid pin, the first valid pin is bound and connected with the second valid pin, the first invalid pin is bound and connected with the second invalid pin, the test line is connected with the first invalid pin, and the signal transmission line is connected with the first valid pin, so that when the signal transmitted by the display device is detected, the test line can be used for detection, and because the test line is a wiring in the display panel, the accuracy of the detected signal is high, and the display device can be directly detected without testing the flexible circuit board, and the detection cycle is short, thereby improving the efficiency and accuracy of the detection.

[0053] Specifically, Figure 4As shown, the display device 2 further includes a printed circuit board 24 , and the printed circuit board 24 is connected to the flexible circuit board 23 .

[0054] Specifically, Figure 4 As shown, the display panel 21 includes a display area 201 and a non-display area 202, the non-display area includes a binding area 202a, the display panel 21 is bound to the driving chip 22 in the binding area 202a, and the display panel 21 is bound to the flexible circuit board 23 in the binding area 202a.

[0055] Specifically, it can be understood that, in the embodiment of the present application, the non-display area is shown to have only the binding area 202a, and the non-display area is located on one side of the display area 201, but the embodiment of the present application is not limited thereto, and the non-display area can be provided around the display area 201. Specifically, the number of pins in the output pin group is greater than the number of pins in the input pin group. By making the number of pins in the output pin group greater than the number of pins in the input pin group, when transmitting signals to the display panel, each pin in the output pin group can be connected to each routing line, so as to achieve separate output of signals of each routing line.

[0056] Specifically, it can be understood that the pins in the input pin group may not be connected one-to-one with the pins in the output pin group. After receiving the signal, the driving chip processes it and sends it to the pins in the output pin group. The signal of the pin in the input pin group may not be directly transmitted to the pin in the output pin group.

[0057] It can be understood that since the pins in the input pin group are pins that receive signals transmitted from the flexible circuit board to the driver chip, these signals are unprocessed signals, such as some voltage signals, and the pins in the output pin group are pins that transmit signals to the display panel. Each pin can be connected to a trace, so that the number of pins in the output pin group is large. When setting the pins in the output pin group and the traces electrically connected to the pins in the output pin group, in order to prevent the traces from being too closely spaced, a part of the pins in the output pin group will not transmit signals (i.e., the second invalid pins), and the pins in the output pin group that transmit signals (i.e., the second valid pins) will be separated, so that the spacing between each trace is larger. In the embodiment of the present application, the second invalid pin is bound and connected to the first invalid pin, and the first invalid pin is connected to the test line, so that the display device can be detected through the test line.

[0058] Specifically, the input pin group includes 500 to 600 pins arranged at intervals; the output pin group includes at least 2000 pins.

[0059] Specifically, it can be understood that in order to illustrate the design and connection relationship of each structure in the embodiment of the present application, different names will be used to describe different parts of the same structure. In fact, this structure can use the same name. For example, the structure marked by the first connecting line group and the first binding pin group can be formed at the same time in practice, and the two are connected together. The first connecting line group and the first binding pin group actually mark multiple parts of the same structure, and the same name can be used to mark the structure. For example, this structure can be named the first structure, a part of the first structure is named the first connecting line group, and the other part is named the first binding pin group. Similarly, other markings can also refer to this description.

[0060] It is understandable that different parts of the same structure may actually be different. For example, the thickness or width of the first binding pin group and the first connecting wire group may be different, so that the first binding pin group and the first connecting wire group may be different.

[0061] Specifically, in contrast to the display device, an invalid driving pin is set on the chip, and the display panel does not set a wiring connected to the invalid driving pin, so that when the second wiring is set, the spacing between the second wirings is larger, avoiding the problem of short circuit between the second wirings. In the embodiment of the present application, a test line is set, the test line is connected to the first invalid pin, and the first invalid pin is connected to the second invalid pin, so that the signal of the display device can be tested through the test line, and the test line is a wiring on the display panel side, the signal will no longer pass through other devices, and the signal obtained by the test is more accurate. Since detection can be performed through the wiring on the display panel, detection can be performed directly in the factory, shortening the detection cycle, and the test line may not extend into the display area, and only a part of the test line is retained in the binding area for testing, so that the test line does not take up too much space, and the signal transmission line can still maintain a large spacing to avoid short circuit between signal transmission lines.

[0062] Specifically, the first invalid pin is only bound and connected to the second invalid pin, and the first invalid pin and the second invalid pin are only used for testing, transmitting display signals for testing when the display device is tested, and not transmitting display signals when the display device is not tested, or even not transmitting signals. The test line can be only set in the binding area and not connected to the signal line in the display panel. The test line is only used for testing. When not testing, for example, when the display panel is displaying, the test line does not transmit display signals (including but not limited to data signals). The signal transmission line can extend into the display area of ​​the display panel, and the signal transmission line can be connected to the signal line to transmit the display signal. For example, the signal transmission line can be connected to the data line to transmit the data signal through the signal transmission line.

[0063] In some embodiments, when the display device is configured as a test phase, the second invalid pin inputs a display signal, and when the display device is configured as a non-test phase, the second invalid pin does not input a signal. By making the second invalid pin input a display signal during the test phase, the display device can be tested during the test phase to avoid abnormal transmission of signals by the display device resulting in poor display, and when the display device is in a non-test phase, the second invalid pin does not input a signal, so that the second invalid pin does not affect the display.

[0064] Specifically, the test phase refers to the phase in which the display device is tested, during which a test signal can be input through the flexible circuit board and the driver chip, and the test signal can be the same as the normal display signal. The non-test phase refers to the phase in which the display device is not tested, which can be the normal display phase or the shutdown phase of the display device.

[0065] Specifically, the above embodiment is described by taking the example that the second invalid pin does not input a signal when the display device is configured in a non-test phase, but the embodiment of the present application is not limited to this. When the display device is configured in a non-test phase, the second invalid pin can input a signal.

[0066] In some embodiments, the first binding pin group includes multiple first invalid pins, the output pin group includes multiple second invalid pins, the number of the first invalid pins is equal to the number of the second invalid pins, and the first invalid pins are bound and connected one-to-one.

[0067] In some embodiments, Figures 5 to 8 As shown, the first connection line group 211 includes at least two test lines 211b, the first binding pin group 213 includes at least two first invalid pins 213b, and each test line 211b is connected to one of the first invalid pins 213b. By making the first connection line group include at least two test lines, the first binding pin group includes at least two first invalid pins, and each test line is connected to one of the invalid pins, the probes of the differential probe can be connected to the two test lines respectively, so as to realize the detection of the signal of the display device.

[0068] In some embodiments, Figure 7 , Figure 8As shown, the test line 211b includes a connection line 217 and a binding terminal 216, each of the connection lines 217 is connected to a first invalid pin 213b, each of the binding terminals 216 is connected to a connection line 217, and the width L3 of the binding terminal 216 is greater than the width L4 of the connection line 217. By making the test line include connection lines and binding terminals, each of the connection lines is connected to a first invalid pin, each of the binding terminals is connected to a connection line, and the width of the binding terminal is greater than the width of the connection line, when the display device is tested, the probe is easy to contact the binding terminal, so as to avoid poor display caused by misalignment between the probe and the test line.

[0069] Specifically, due to the large number of output terminals, the corresponding number of first invalid pins and the number of test lines are large, when testing directly through the test lines, there may be a problem that the width of the test lines is small and it is difficult for the probe to accurately align with the test lines, resulting in inaccurate test results. By making the width of the output terminal larger than the width of the connecting line, the difficulty of aligning the probe with the binding terminal can be reduced, and the test accuracy can be improved.

[0070] Specifically, the area of ​​the binding terminal may be larger than the area of ​​the connecting wire, thereby reducing the difficulty of aligning the probe with the binding terminal and improving the test accuracy.

[0071] Specifically, the number of connecting wires may be the same as the number of binding terminals, and the number of binding terminals may be less than the number of second invalid pins, thereby saving space and reducing the risk of short circuit of the signal transmission line.

[0072] Specifically, the distance between the left side of the leftmost binding terminal and the right side of the rightmost binding terminal is smaller than the distance between the left side of the leftmost second invalid pin and the right side of the rightmost second invalid pin, thereby avoiding the binding terminals from occupying too much space, reducing the space occupied by the binding terminals, increasing the spacing between signal transmission lines, and reducing the risk of short circuit of signal transmission lines.

[0073] Specifically, the above embodiment is described by taking the test line including a binding terminal and a connecting line as an example, but the embodiments of the present application are not limited to this. The test line may only include a binding terminal, and the binding terminal is directly connected to the first invalid pin. At this time, the width of the binding terminal is greater than the width of the first invalid pin.

[0074] Specifically, Figure 8 As shown, from Figure 8 (a) Figure 8 (b) and Figure 8 In (c), the locations of the structures on the flexible circuit board, display panel and driver chip can be seen.

[0075] In some embodiments, when the display device is configured in a test state, the binding terminal inputs different signals at different times. By inputting different signals at different times when the display device is in a test state, each signal transmitted by the display device can be detected to prevent abnormal display caused by abnormal signals.

[0076] Specifically, it can be understood that since the driver chip can transmit different signals, such as different data signals or different types of signals, such as power signals and data signals, when detecting the signals transmitted by the display device, since the number of binding terminals is relatively small, it is impossible to make different binding terminals transmit different signals respectively. In this case, the binding terminals can input different signals at different times, and different signals can be detected at different times through differential probes to determine whether each signal is abnormal, so as to prevent poor display due to some signals being normal and some signals being abnormal.

[0077] In some embodiments, Figure 5 , Figure 6 As shown, the number of the first invalid pins 213b is equal to the number of the second invalid pins 222b, the number of the test lines 211b is equal to the number of the first invalid pins 213b, the first invalid pins 213b are bound to the second invalid pins 222b in a one-to-one correspondence, and the first invalid pins 213b are connected to the test lines 211b in a one-to-one correspondence. By making the number of the first invalid pins equal to the number of the second invalid pins, the number of the test lines equal to the number of the first invalid pins, the first invalid pins are bound to the second invalid pins in a one-to-one correspondence, and the first invalid pins are connected to the test lines in a one-to-one correspondence, different test lines can transmit different signals, and different signals can be detected by connecting the probes to different test lines, so as to prevent abnormal signals from causing poor display.

[0078] Specifically, Figure 6 As shown, from Figure 6 (a) Figure 6 (b) and Figure 6 In (c), the locations of the structures on the flexible circuit board, display panel and driver chip can be seen.

[0079] In some embodiments, Fig.10As shown, the number of the first invalid pins 213b is equal to the number of the second invalid pins 222b, the number of the test lines 211b is less than the number of the first invalid pins 213b, the first invalid pins 213b are bound to the second invalid pins 222b in a one-to-one correspondence, and some of the first invalid pins 213b are connected to the test lines 211b in a corresponding manner. By making the number of test lines less than the number of first invalid pins, while different signals are detected through the test lines, the test lines occupy less space, so that the setting space of the signal transmission lines is larger, thereby avoiding poor display.

[0080] Specifically, when detecting the signal of the display device through the test line, different test lines can be made to transmit different signals, or the test lines can be made to transmit different signals at different times, so as to transmit different signals and detect different signals to prevent poor display caused by abnormal signals.

[0081] Specifically, Fig.10 The design of the flexible circuit board, display panel and driving chip of the display device can refer to Figure 6 .

[0082] In some embodiments, Figure 5 As shown, the line width L1 of the test line 211b is equal to the line width L2 of the signal transmission line 211a. By making the line width of the test line equal to the line width of the signal transmission line, when setting the test line and the signal transmission line, it is avoided that the test line occupies too much space, resulting in too small line width or line spacing of the signal transmission line, resulting in excessive signal voltage drop or short circuit, thereby improving the yield of the display panel.

[0083] Specifically, the spacing between two adjacent test lines can be equal to the spacing between two adjacent signal transmission lines, and the distance between the test line and the signal transmission line can be equal to the spacing between two adjacent signal transmission lines, thereby avoiding short circuits caused by too small spacing between the lines and improving the yield of the display panel.

[0084] In some embodiments, Fig. 9 As shown, the driving chip 22 further includes a thin film transistor T0 and a control line 223, the gate of the thin film transistor T0 is connected to the control line 223, one electrode of the thin film transistor T0 is electrically connected to the input pin group 221, and the other electrode of the thin film transistor T0 is electrically connected to the second invalid pin 222b. By connecting the gate of the thin film transistor to the control line, one electrode of the thin film transistor is electrically connected to the input pin group, and the other electrode of the thin film transistor is electrically connected to the second invalid pin, the control line can be used to control the second invalid pin to input a signal or not input a signal, thereby testing or not testing the display device.

[0085] Specifically, it can be understood that after the signal is transmitted to the input pin group of the driver chip, the driver chip will process the signal and may not transmit it directly to the output pin group. Therefore, the connection method of the thin film transistor here is only a schematic diagram. The thin film transistor can realize the control signal transmission to the second invalid pin or not transmission to the second invalid pin. The specific connection method can be set according to needs.

[0086] Specifically, the input pin group includes multiple signal pins, and the multiple signal pins can be connected to one electrode of multiple thin film transistors respectively, and the other electrodes of the multiple thin film transistors are respectively connected to multiple second invalid pins, so that each thin film transistor controls one signal pin and one second invalid pin. The multiple signal pins can also be connected to one electrode of a thin film transistor, and the other electrode of the thin film transistor is connected to multiple second invalid pins, so that one thin film transistor controls multiple signal pins and multiple second invalid pins; the multiple signal pins can also be connected to one electrode of multiple thin film transistors respectively, and the other electrodes of the multiple thin film transistors are connected to a second invalid pin, so that one thin film transistor controls multiple signal pins and one second invalid pin.

[0087] In some embodiments, when the display device 2 is in a test state, the control line 223 outputs a valid level; when the display device 2 is in a non-test state, the control line 223 outputs an invalid level. By making the control line output a valid level in the test state, the thin film transistor is turned on, so that a signal is transmitted on the second invalid pin, the signal of the display device can be detected, and the control line outputs an invalid level in the non-test state, so that the thin film transistor is turned off, and then when the display device is in the non-test state, no signal is input to the second invalid pin to avoid affecting the display.

[0088] Specifically, it can be understood that the effective level refers to the level that can turn on the thin film transistor, and the invalid level refers to the level that cannot turn on the thin film transistor. Due to the different types of thin film transistors, the levels required for their on state are also different, and accordingly, the effective levels are also different. For example, when a low-level signal is input to the gate of a P-type thin film transistor, the P-type thin film transistor is turned on, and when a high-level signal is input to the gate of the P-type thin film transistor, the P-type thin film transistor is turned off, then the low-level signal is the effective level, and the high-level signal is the invalid level, and when a high-level signal is input to the gate of an N-type thin film transistor, the N-type thin film transistor is turned on, and when a low-level signal is input to the gate of the N-type thin film transistor, the N-type thin film transistor is turned off, then the high-level signal is the effective level, and the low-level signal is the invalid level.

[0089] Specifically, the orthographic projection of the first binding pin group may coincide with the orthographic projection of the output pin group.

[0090] Specifically, the orthographic projection of the second binding pin group may coincide with the orthographic projection of the input pin group.

[0091] Specifically, the orthographic projection of the third binding pin group may coincide with the orthographic projection of the fourth binding pin group.

[0092] Specifically, the number of pins in the fourth binding pin group may be equal to the number of pins in the input pin group.

[0093] Specifically, the above embodiments provide a detailed description of the display device from aspects of the setting position and connection relationship of each structure. It can be understood that when there is no conflict between the embodiments, the embodiments can be combined. For example, the line width of the test line is equal to the width of the signal transmission line. The driving chip also includes a thin film transistor and a control line. The gate of the thin film transistor is connected to the control line, one electrode of the thin film transistor is electrically connected to the input pin group, and the other electrode of the thin film transistor is electrically connected to the second invalid pin.

[0094] Specifically, the display panel may be a liquid crystal display panel, an organic light emitting diode display panel, a micro light emitting diode display panel, or a quantum dot display panel.

[0095] Specifically, the driving chip may be a source driving chip, and the driving chip transmits a data signal.

[0096] like Fig.11 , Fig.12 As shown, when detecting the signal of the display device, a differential probe 25 can be used to detect the display device. Specifically, Fig.11 As shown, the probes (eg, two probes) of the differential probe 25 can be brought into contact with the test lines (eg, two test lines) to detect the signal, or as shown in FIG. Fig.12 As shown, the differential probes 25 (eg, two probes) can be brought into contact with the bonding terminals (eg, two bonding terminals) to detect the signal.

[0097] At the same time, an embodiment of the present application provides an electronic device, which includes a display device as described in any of the above embodiments.

[0098] Specifically, Fig.13 As shown, the electronic device 3 includes a display device 2 and a system mainboard 31. The system mainboard 31 is connected to the display device 2 through wiring, and specifically can be connected to a printed circuit board through wiring.

[0099] In the description of this application, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0100] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0101] The embodiments, implementation methods and related technical features of the present application can be combined and replaced with each other without conflict.

[0102] The above are only preferred embodiments of the present application and do not constitute any form of limitation to the present application. However, any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present application without departing from the content of the technical solution of the present application are still within the scope of the technical solution of the present application.

Claims

1. A display device, characterized in that: include: The display panel comprises a display area and a non-display area, wherein a first binding portion and a second binding portion are provided in the non-display area; A driving chip, one end of which is bound and connected to the first binding portion; A flexible circuit board, wherein the flexible circuit board is connected to the other end of the driving chip through the second binding portion; The first binding portion includes at least one first invalid pin and at least one test line, the test line is arranged on a side close to the display area, and the first invalid pin is connected to the test line.

2. The display device according to claim 1, characterized in that The first binding part includes a first connecting wire group and a first binding pin group, the second binding part includes a second binding pin group, a second connecting wire group and a third binding pin group, the first connecting wire group is connected to the first binding pin group, and the second connecting wire group is connected to the second binding pin group and the third binding pin group; The driving chip comprises an input pin group and an output pin group, the output pin group is bound and connected with the first binding pin group, and the input pin group is bound and connected with the second binding pin group; The flexible circuit board comprises a fourth binding pin group, and the fourth binding pin group is bound and connected with the third binding pin group; The first binding pin group includes the first invalid pin, and the first connecting line group includes the test line.

3. The display device according to claim 2, characterized in that: The first binding pin group also includes multiple first valid pins, the output pin group includes multiple second valid pins and at least one second invalid pin, the first connecting line group also includes multiple signal transmission lines, the first valid pin is bound and connected to the second valid pin, the first invalid pin is bound and connected to the second invalid pin, and the signal transmission line is connected to the first valid pin.

4. The display device according to claim 3, characterized in that: The first connection line group includes at least two test lines, the first binding pin group includes at least two first invalid pins, and each of the test lines is connected to one of the first invalid pins.

5. The display device according to claim 4, characterized in that: The test line includes a connecting line and a binding terminal, each of the connecting lines is connected to one of the first invalid pins, each of the binding terminals is connected to one of the connecting lines, and the width of the binding terminal is greater than the width of the connecting line.

6. The display device according to claim 5, characterized in that: When the display device is configured in a test state, the binding terminal inputs different signals at different times.

7. The display device according to claim 4, characterized in that: The number of the first invalid pins is equal to the number of the second invalid pins, the number of the test lines is equal to the number of the first invalid pins, the first invalid pins are bound to the second invalid pins in a one-to-one correspondence, and the first invalid pins are connected to the test lines in a one-to-one correspondence.

8. The display device according to claim 4, characterized in that: The number of the first invalid pins is equal to the number of the second invalid pins, the number of the test lines is less than the number of the first invalid pins, the first invalid pins are bound to the second invalid pins in a one-to-one correspondence, and some of the first invalid pins are connected to the test lines in a corresponding manner.

9. The display device according to any one of claims 3 to 8, characterized in that: The line width of the test line is equal to the width of the signal transmission line.

10. The display device according to any one of claims 3 to 8, characterized in that: The driving chip further includes a thin film transistor and a control line, a gate of the thin film transistor is connected to the control line, an electrode of the thin film transistor is electrically connected to the input pin group, and another electrode of the thin film transistor is electrically connected to the second invalid pin.

11. The display device according to claim 10, characterized in that: When the display device is in a test state, the control line outputs a valid level; when the display device is in a non-test state, the control line outputs an invalid level.

12. An electronic device, characterized in that: The invention comprises a display device as claimed in any one of claims 1 to 11.

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