Probe sleeve for testing probe and testing system

Abstract

The invention provides a probe sleeve for a test probe and a test system, the probe sleeve for the test probe comprises a fusing inner tube and two conductive sleeves, the two ends of the fusing inner tube in the extension direction are provided with first openings, and the outer diameter of the conductive sleeves is matched with the fusing inner tube; the two conductive sleeves are inserted from the first openings in the two ends of the fusing inner tube respectively, a spacer is arranged between the ends, close to each other, of the two conductive sleeves in the fusing inner tube, the two conductive sleeves are electrically connected with the fusing inner tube respectively, and the ends, away from each other, of the two conductive sleeves are provided with second openings respectively. The two test probes are respectively inserted into the two conductive sleeves through the second openings and are respectively electrically connected with the corresponding conductive sleeves, and the fusing inner tube is used for expanding and breaking circuit during overcurrent and recovering at a preset temperature. According to the application, the fusing inner tube and the conductive sleeves are arranged, so that overcurrent expansion and breaking circuit and preset temperature recovery are realized; therefore, the electrical safety of the tested electronic product is protected, and the detection efficiency of the test probe is improved.

Description

Technical Field

[0001] The present application relates to the technical field of probes, and further to a needle sleeve and a testing system for testing probes. Background Art

[0002] The test probe is actually a kind of precision electronic component, which is mainly used in the test of electronic products such as PCBA and wafers, and plays a connecting role. It takes out the signal and provides it to the corresponding test component for integrated analysis. It can also transfer the function of the tested electronic product to the test fixture to achieve functional testing, thereby achieving quality testing of electronic products. Test probes have been widely used in recent years due to their high reliability, high precision and strong versatility.

[0003] However, electronic products such as PCBA and wafers have a certain failure rate. When they are tested by test probes, short circuits and other phenomena are likely to occur, which will cause irreversible effects on test components and electronic products, resulting in waste and affecting test efficiency.

[0004] Therefore, the present invention is dedicated to providing a needle sleeve for a test probe and a test system to solve the above technical problems. Summary of the invention

[0005] In response to the above technical problems, the purpose of this application is to provide a needle sleeve and a test system for a test probe, which aims to achieve the signal transfer function while also playing a role in circuit protection by cooperating with the fuse inner tube, the conductive sleeve and the conductive connector, thereby ensuring the stability and reliability of the test probe.

[0006] In order to achieve the above object, the present application provides a needle sleeve for a test probe, comprising:

[0007] A fuse inner tube, wherein the fuse inner tube is provided with first openings at both ends of the extension direction;

[0008] Two conductive sleeves, the outer diameter of the conductive sleeves matches the fuse inner tube, the two conductive sleeves are respectively inserted from the first openings at both ends of the fuse inner tube, and a spacer is provided between the ends of the two conductive sleeves close to each other in the fuse inner tube, and the two conductive sleeves are respectively electrically connected to the fuse inner tube;

[0009] Among them, the two conductive sleeves are respectively provided with a second opening at one end away from each other, and the two test probes are respectively inserted into the two conductive sleeves through the second openings and are respectively electrically connected to the corresponding conductive sleeves. The fuse inner tube is used to expand and break the circuit when overcurrent occurs, and to recover at a preset temperature.

[0010] In some embodiments, the fuse inner tube has a first conductive end and a second conductive end that are oppositely disposed, and the first conductive end and the second conductive end are electrically connected to the two conductive sleeves respectively through a conductive member.

[0011] In some embodiments, a conductive bottom plate is disposed in the conductive sleeve, and the conductive bottom plate is disposed at an end of the conductive sleeve away from the second opening and connected to the conductive sleeve.

[0012] In some embodiments, the spacer disposed in the fusible inner tube is a fusible baffle, and the fusible baffle is connected to the inner wall of the fusible inner tube;

[0013] The fuse baffle is arranged between the two conductive sleeves and contacts one end of the conductive sleeve away from the second opening. The fuse baffle is used to expand and break the circuit when there is an overcurrent and to recover at a preset temperature.

[0014] In some embodiments, a notch groove is provided in the side wall of the conductive sleeve, and the notch groove is provided along the circumference of the conductive sleeve;

[0015] The notch of the notch groove is provided at one end of the conductive sleeve away from the second opening, so as to separate the side wall of the conductive sleeve into a first tube and a second tube sleeved outside the first tube, and the conductive bottom plate is provided at one end of the first tube away from the second opening;

[0016] The two ends of the fuse inner tube in the extension direction are respectively arranged in the two notches of the two conductive sleeves, and the two second pipes are arranged at intervals, and the first conductive end and the second conductive end are respectively electrically connected to the two first pipes.

[0017] In some embodiments, a first through hole is formed on the conductive bottom plate, and a second through hole is formed on the fuse baffle plate coaxially with the first through hole;

[0018] An inner diameter of the first through hole is greater than an inner diameter of the second through hole.

[0019] In some embodiments, the fuse inner tube is formed by a film assembly surrounding one end of the two conductive sleeves close to each other, and the first conductive end and the second conductive end are respectively arranged at two opposite ends of the film assembly;

[0020] The material of the film component includes high molecular polymer.

[0021] In some embodiments, the material of the fuse baffle includes a high molecular polymer.

[0022] In some embodiments, it also includes an insulating ring sleeved on the outside of the fuse inner tube, the insulating ring connects the ends of the two conductive sleeves that are close to each other, and the insulating ring protrudes from the outer surface of the conductive sleeve.

[0023] A test system comprises a carrier board, a test element, a first test probe and a second test probe, and a needle sleeve for the test probe as described in any one of the above items;

[0024] The ends of the two conductive sleeves close to each other are connected by an insulating ring, and the insulating ring is protruding from the outer surface of the conductive sleeve:

[0025] The carrier is provided with a plurality of through holes, and the inner wall of the through hole is provided with a limiting groove arranged along the circumference of the through hole, and the limiting groove is suitable for limiting cooperation with the insulating ring so that the needle sleeve for the test probe is arranged on the carrier through the through hole;

[0026] a first test probe, the first test probe being electrically connected to the test element, the first test probe being adapted to be inserted into one of the conductive sleeves and connected to the corresponding conductive sleeve;

[0027] A second test probe, the second test probe is electrically connected to the electronic product under test, and the second test probe is suitable for being inserted into another of the conductive sleeves and connected to the corresponding conductive sleeve.

[0028] Compared with the prior art, the needle sleeve and test system for testing probes provided in the present application have the following beneficial effects:

[0029] 1. A needle sleeve for a test probe provided by the present invention is provided with a fuse inner tube and two conductive sleeves for detecting an electronic product under test by the test probe. When in use, the two test probes are respectively inserted into the two conductive sleeves through the second opening, and the test probes are electrically connected to the conductive sleeves, so as to realize signal conversion of the two test probes, thereby realizing functional and electrical characteristic testing of the product under test. In this process, the fuse inner tube can make the two conductive sleeves electrically connected through the fuse inner tube at a preset temperature (that is, no current interruption occurs and the temperature is within the preset temperature), and can also expand and break the circuit when there is an overcurrent (short circuit), so that the circuit between the two conductive sleeves is broken, thereby protecting the test probes and other components from being damaged, ensuring the working efficiency of the test probes, and reducing the cost of consumables and labor costs.

[0030] 2. The present invention provides a needle sleeve for a test probe, wherein a conductive bottom plate is arranged inside a conductive sleeve, and the conductive bottom plate can increase the conductive area of ​​the conductive sleeve, thereby improving the conductive performance of the needle sleeve. The spacer in the fuse inner tube can be arranged as a fuse baffle, and the fuse baffle serves to separate the two conductive bottom plates. The fuse baffle can expand and break the circuit when overcurrent occurs, and recover at a preset temperature, thereby increasing the conductive area of ​​the fuse inner tube. Moreover, the spacer is arranged as a fuse baffle to reduce the impedance performance of the needle sleeve, thereby further improving the protective effect of the needle sleeve on the test probe and other components when overcurrent occurs.

[0031] 3. The present invention provides a needle sleeve for a test probe, wherein the notch groove is used to separate the side wall of the conductive sleeve into a first tube and a second tube, and the two ends of the fuse inner tube are respectively arranged in the notches of the two conductive sleeves. The first tube can be electrically connected to the first conductive end and the second conductive end, and the second tube is arranged on the outside of the fuse inner tube to support the needle sleeve to ensure the strength of the needle sleeve.

[0032] 4. The present invention provides a needle sleeve and a test system for testing probes, wherein the ends of two conductive sleeves close to each other are connected by an insulating ring. The insulating ring can not only achieve the limiting cooperation between the needle sleeve and the limiting hole on the carrier plate, but also reduce the possibility of deformation of the needle sleeve, thereby ensuring the stability and reliability of the needle sleeve. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] The preferred implementation scheme will be described below in a clear and understandable manner with reference to the accompanying drawings to further illustrate the above-mentioned characteristics, technical features, advantages and implementation methods of the present application.

[0034] Figure 1 It is a structural schematic diagram of a needle sleeve for testing a probe provided by the present invention;

[0035] Figure 2 It is a schematic diagram of the internal structure of a needle sleeve for testing a probe provided by the present invention;

[0036] Figure 3 is a front view of a needle sleeve for a test probe provided by the present invention;

[0037] Figure 4 It is a top view of a needle sleeve for a test probe provided by the present invention;

[0038] Figure 5 The present invention provides Figure 2 A partial enlarged schematic diagram of A;

[0039] Figure 6 It is a schematic diagram of the internal structure of the fuse inner tube provided by the present invention.

[0040] Description of the accompanying drawings: fuse inner tube 1, first opening 11, fuse baffle 12, second through hole 121, conductive sleeve 2, second opening 21, conductive bottom plate 22, first through hole 221, first pipe fitting 231, second pipe fitting 232, insulating ring 3. DETAILED DESCRIPTION

[0041] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the specific implementation methods of the present application will be described below with reference to the accompanying drawings. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings and other implementation methods can be obtained based on these drawings without creative work.

[0042] In order to simplify the drawings, only the parts related to the application are schematically shown in each figure, and they do not represent the actual structure of the product. In addition, in order to simplify the drawings and facilitate understanding, in some figures, only one of the parts with the same structure or function is schematically drawn or marked. In this article, "one" not only means "only one", but also means "more than one".

[0043] It should be further understood that the term “and / or” used in the specification and appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0044] In this document, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0045] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0046] In addition, in the description of the present application, the terms "first", "second", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0047] In one embodiment, a needle sleeve for a test probe is described, which provides a fuse inner tube 1 and two conductive sleeves 2 so that the two test probes are disconnected when overcurrent occurs and the electrical connection is restored at a preset temperature, thereby achieving the purpose of protecting the test probes, the product under test and the test element, thereby improving the safety factor and test efficiency of the circuit when the test probe detects the product under test.

[0048] It is understandable that in the prior art, the detection of electronic products is an important process in production, which can timely reflect the production and manufacturing status and is conducive to process improvement and improvement. The test probe is one of the important parts for detecting electronic products. Because of its specific test items, it is one of the important test means for modern production quality assurance, which can greatly improve production efficiency and reduce maintenance costs. The test probe can realize the voltage, current and other electrical characteristics testing of the electronic product under test, and transfer the function of the electronic product under test to other test components. In order to achieve the above purpose, the test probe needs to be electrically connected to the electronic product under test. If there is a fault in the electronic product under test itself, it is easy to cause the test probe, the electronic product under test and the test component circuit short circuit problem, which may cause the circuit board to burn or other components to be damaged in severe cases, thereby causing serious inconvenience to the test.

[0049] For this, see the Appendix Figures 1 to 6 The present application provides a needle sleeve for a test probe, which specifically includes a fuse inner tube 1 and a conductive sleeve 2, and the conductive sleeve 2 is provided in two. Among them, the two ends of the extension direction of the fuse inner tube 1 are provided with a first opening 11 connected to the fuse inner tube 1, and a second opening 21 is provided at one end of the conductive sleeve 2, and the second opening 21 is connected to the conductive sleeve 2. The outer diameter of the conductive sleeve 2 matches the fuse inner tube 1, so that the ends of the two conductive sleeves 2 away from the second opening 21 are arranged at the two ends of the fuse inner tube 1 through the first opening 11. In addition, although the two conductive sleeves 2 are arranged in the fuse inner tube 1 at the same time, a spacer is arranged between the ends of the two conductive sleeves 2 close to each other in the fuse inner tube 1, so that the two conductive sleeves 2 are arranged at intervals and do not contact each other.

[0050] Correspondingly, the two conductive sleeves 2 are electrically connected to the fuse inner tube 1 respectively, so that the current can flow through one conductive sleeve 2, fuse inner tube 1 and another conductive sleeve 2 in sequence. It should be pointed out that the setting of the spacer prevents the two conductive sleeves 2 from being directly in contact and electrically connected, and the two second openings 21 are used for the test probes to be inserted into the conductive sleeve 2 and connected to the conductive sleeve 2, that is, the two test probes are respectively inserted into the two conductive sleeves 2 through the two second openings 21, and the two test probes are electrically connected through the fuse inner tube 1 and the two conductive sleeves 2. It is worth noting that the fuse inner tube 1 is used to expand and break the circuit when there is an overcurrent (short circuit), so that the two test probes are disconnected, and recover at a preset temperature, so that the two test probes are electrically connected.

[0051] This embodiment realizes the electrical connection of two test probes through the fuse inner tube 1 and two conductive sleeves 2. While realizing the electrical characteristic test and functional test of the electronic product under test and the test element, it can also play a good protective role on the circuit to avoid overcurrent damage to the circuit. The specific implementation principle is: the two test probes are respectively inserted into the two conductive sleeves 2. If the electronic product under test has no fault, the resistance of the fuse inner tube 1 is normal, and the fuse inner tube 1 has conductivity, so that the two test probes pass through one conductive sleeve 2, and the fuse inner tube 1 is electrically connected to the other conductive sleeve 2, thereby detecting the electronic product under test. If the electronic product under test fails and causes overcurrent, the resistance of the fuse inner tube 1 increases, and the fuse inner tube 1 expands and cuts off the current without conductivity, thereby realizing the automatic disconnection of the circuit, thereby limiting the passage of large current and playing an overcurrent protection role.

[0052] In one embodiment, this embodiment further describes the fuse inner tube 1. The fuse inner tube 1 has a first conductive end and a second conductive end that are arranged opposite to each other, the first conductive end is electrically connected to a conductive sleeve 2 through a conductive member, and the second conductive end is electrically connected to another conductive sleeve 2 through a conductive member.

[0053] It should be noted that the fuse inner tube 1 is configured as a thin film assembly, which is arranged outside the ends of the two conductive sleeves 2 close to each other to form the fuse inner tube 1. The two ends of the extended direction of the unfolded thin film assembly are respectively configured as a first conductive end and a second conductive end.

[0054] In actual production applications, the conductive member is set as a wire. For the convenience of explanation, the two conductive sleeves 2 are respectively set as an upper conductive sleeve and a lower conductive sleeve. The first conductive end is electrically connected to one end of a wire, and the other end of the wire is electrically connected to the upper conductive sleeve. After the film assembly is surrounded on the outside of the two conductive sleeves 2, the second conductive end is electrically connected to one end of another wire, and the other end of the wire is electrically connected to the lower conductive sleeve. Therefore, the two conductive sleeves 2 can be electrically connected by fusing the inner tube 1.

[0055] In addition, in order to achieve the function of expansion and circuit breaking when the inner tube 1 is blown due to overcurrent, and recovery at a preset temperature, the material of the film component includes a high molecular polymer. High molecular polymers exhibit low resistance under normal current conditions. Under overcurrent (overcurrent, short circuit) faults, the resistance increases sharply, thereby protecting the back-end circuit. After the fault is eliminated, the circuit can automatically return to the on state. Accordingly, the material of the conductive sleeve 2 can be set to a material with conductive ability such as metal or metal alloy. In actual production applications, the conductive sleeve 2 is generally made of copper alloy, which has good strength while ensuring good conductive properties.

[0056] It is understandable that in order to better surround the film assembly on the outside of the two conductive sleeves 2, the film assembly includes an inner core and two correspondingly arranged films, and the material of the inner core is set to a high molecular polymer and is arranged between the two films. The film can play a role in blocking the conductive sleeve 2 and the fuse inner tube 1, and the wire passes through the film and connects to the high molecular polymer, thereby realizing the electrical connection between the conductive sleeve 2 and the fuse inner tube 1.

[0057] In one embodiment, see the attached specification Figure 2 and Figure 5 A notch groove is provided in the conductive sleeve 2, and the notch groove is provided in the side wall of the conductive sleeve 2 and is provided along the circumference of the conductive sleeve 2. The notch of the notch groove is provided at one end of the conductive sleeve 2 away from the second opening 21, so as to separate the side wall of the conductive sleeve 2 into a first pipe 231 and a second pipe 232, and the second pipe 232 is sleeved on the outside of the first pipe 231. The two ends of the extension direction of the fuse inner tube 1 are respectively provided in the two notches of the two conductive sleeves 2, so that the first pipe 231 is inserted into the fuse inner tube 1, and the second pipe 232 is sleeved on the outside of the fuse inner tube 1.

[0058] In addition, the first conductive end and the second conductive end are electrically connected to the first pipe fittings 231 of the two conductive sleeves 2 respectively, the two first pipe fittings 231 are arranged at intervals, and the two second pipe fittings 232 are arranged so that the two conductive sleeves 2 do not contact each other, so that the two conductive sleeves 2 can only be electrically connected by fusing the inner tube 1.

[0059] In this embodiment, the side wall of the conductive sleeve 2 is separated into a first tube 231 and a second tube 232 by an inner groove. The first tube 231 realizes circuit connectivity, and the second tube 232 can not only provide good protection for the fuse inner tube 1, but also improve the strength of the needle sleeve.

[0060] Furthermore, a conductive bottom plate 22 is provided in the conductive sleeve 2, and the conductive bottom plate 22 is provided at one end of the conductive sleeve 2 away from the second opening 21, and is electrically connected to the inner wall of the conductive sleeve 2. It can be understood that the provision of the conductive bottom plate 22 can increase the conductive area between the test probe and the conductive sleeve 2, and improve the conductive performance of the conductive sleeve 2.

[0061] Specifically, the second opening 21 is disposed at one end of the first tube 231 , and the conductive bottom plate 22 is disposed at one end of the first tube 231 away from the second opening 21 and inside the first tube 231 to be electrically connected to the inner wall of the first tube 231 .

[0062] Furthermore, the spacer in the fuse inner tube 1 is set as a fuse baffle 12, and the fuse baffle 12 is connected to the inner wall of the fuse inner tube 1. The fuse baffle 12 is set between the two conductive sleeves 2 and contacts with one end of the conductive sleeve 2 away from the second opening 21, that is, contacts with the conductive bottom plate 22 of the conductive sleeve 2.

[0063] It should be noted that the fuse baffle 12 can expand and break the circuit when overcurrent occurs, and recover at a preset temperature. Accordingly, the fuse baffle 12 is in contact with the fuse inner tube 1, which can increase the conductive area. When in use, the fuse baffle 12 and the fuse inner tube 1 cooperate with each other to protect the back-end circuit, thereby achieving the purpose of improving the conductive performance of the needle sleeve. In addition, the setting of the fuse baffle 12 can reduce the impedance performance of the needle sleeve, further improving the protective effect of the needle sleeve on the test probe and other components when overcurrent occurs.

[0064] In actual applications, when the test probe is inserted into the conductive sleeve 2, the test probe may cause the conductive bottom plate 22 to deform, thereby causing the upper and lower conductive bottom plates 22 to contact and electrically connect, resulting in the failure of the fuse inner tube 1 to play a corresponding role. Therefore, the fuse baffle 12 is set between the two conductive bottom plates 22. Even if the conductive bottom plate 22 is deformed under the action of the test probe, the fuse baffle 12 can play a blocking role to ensure the effect of the fuse inner tube 1. In addition, it should be pointed out that in addition to being set as a fuse baffle 12, the spacer can also be made of insulating material. The spacer made of insulating material can also play the role of blocking the conductive bottom plates 22 of the two conductive sleeves 2. At this time, the two conductive bottom plates 22 cannot be electrically connected through the two conductive bottom plates 22.

[0065] See the instruction manual Figure 2 and Figure 5A first through hole 221 is provided on the conductive bottom plate 22, and a second through hole 121 is provided on the fuse baffle 12, and the second through hole 121 is coaxially arranged with the first through hole 221. The arrangement of the first through hole 221 and the second through hole 121 can play a role in exhausting air, thereby ensuring that the test probe is smoothly inserted into the first pipe 231 of the conductive sleeve 2.

[0066] Preferably, the inner diameter of the first through hole 221 is larger than the inner diameter of the second through hole 121 to reduce the possibility of direct contact between the two test probes.

[0067] It should be noted that the material of the fuse baffle 12 includes a polymer. Similarly, the fuse baffle 12 also includes two films arranged opposite to each other and a polymer arranged between the two films. In the energized state, the polymer of the fuse baffle 12 can be electrically connected to the polymer of the fuse inner tube 1. In addition, the fuse baffle 12 and the fuse inner tube 1 are supported by the same polymer to ensure the consistency of the needle sleeve, so that the fuse baffle 12 and the fuse inner tube 1 can be electrically connected and disconnected under the same conditions.

[0068] In one embodiment, see the attached specification Figure 1 and Figure 2 A needle sleeve for a test probe further includes an insulating ring 3, which is sleeved on the outer side of the fuse inner tube 1 to connect two oppositely disposed conductive sleeves 2 to connect with the ends of the two second tubes 232 that are close to each other. In addition, the insulating ring 3 is protruding from the outer surface of the conductive sleeve 2.

[0069] The two conductive sleeves 2 are respectively arranged at the two ends of the fuse inner tube 1, and the two second pipes 232 are arranged at intervals at the ends close to each other, so that the test probe can only be electrically connected to the fuse inner tube 1 through the first pipe 231 and the wire, but cannot be electrically connected to another test probe through the second pipe 232. In addition to connecting the two conductive sleeves 2, the setting of the insulating ring can further ensure the disconnection of the two conductive sleeves 2.

[0070] In one embodiment, this embodiment provides a test system, including a needle sleeve for a test probe as described in any of the above embodiments, and also including a carrier, a test element, a first test probe and a second test probe. In one embodiment, the needle sleeve for a test probe has two conductive sleeves 2 that are close to each other and are connected by an insulating ring 3, and the insulating ring 3 is protruding from the outer surface of the two conductive sleeves 2.

[0071] A plurality of via holes are arranged on the carrier board, and a limiting groove is arranged on the inner wall of the via hole. The limiting groove is arranged along the circumference of the via hole, and the limiting groove is suitable for limiting with the insulating ring. When in use, the needle sleeve for the test probe is inserted in the via hole and installed on the carrier board through the insulating ring 3. The test element can be set as a device for testing the electronic product under test. The first test probe is arranged in the test element and electrically connected to the test element. The first test probe can be inserted into a conductive sleeve 2 under the action of the driving member and connected to the conductive sleeve 2. Correspondingly, the second test probe is arranged on the electronic product under test and electrically connected to the electronic product under test. The second probe is suitable for being inserted into another conductive sleeve 2 through the driving member and connected to the conductive sleeve 2.

[0072] It can be understood that in this embodiment, the first test probe and the second test probe can be respectively inserted into the two conductive sleeves 2 through the driving member. When there is no fault in the circuit, the circuit of the fuse inner tube 1 is connected, and the test of the electronic product under test can be achieved through the test element. When a circuit fault occurs and causes overcurrent, the circuit of the fuse inner tube 1 is interrupted, thereby protecting the test probe, the electronic product under test and the test element.

[0073] It should be noted that the above embodiments can be freely combined as needed. The above are only preferred implementations of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application, and these improvements and modifications should also be regarded as the protection scope of the present application.

Claims

1. A needle cover for a test probe, characterized in that: include: A fuse inner tube, wherein the fuse inner tube is provided with first openings at both ends of the extension direction; Two conductive sleeves, the outer diameter of the conductive sleeves matches the fuse inner tube, the two conductive sleeves are respectively inserted from the first openings at both ends of the fuse inner tube, and a spacer is provided between the ends of the two conductive sleeves close to each other in the fuse inner tube, and the two conductive sleeves are respectively electrically connected to the fuse inner tube; Among them, the two conductive sleeves are respectively provided with a second opening at one end away from each other, and the two test probes are respectively inserted into the two conductive sleeves through the second openings and are respectively electrically connected to the corresponding conductive sleeves. The fuse inner tube is used to expand and break the circuit when overcurrent occurs, and to recover at a preset temperature.

2. A needle cover for a test probe according to claim 1, characterized in that: The fuse inner tube has a first conductive end and a second conductive end that are arranged opposite to each other, and the first conductive end and the second conductive end are electrically connected to the two conductive sleeves respectively through conductive members.

3. A needle cover for a test probe according to claim 2, characterized in that: A conductive bottom plate is arranged in the conductive sleeve. The conductive bottom plate is arranged at an end of the conductive sleeve away from the second opening and is connected to the conductive sleeve.

4. A needle cover for a test probe according to claim 3, characterized in that: The spacer disposed in the fusible inner tube is a fusible baffle, and the fusible baffle is connected to the inner wall of the fusible inner tube; The fuse baffle is arranged between the two conductive sleeves and contacts one end of the conductive sleeve away from the second opening. The fuse baffle is used to expand and break the circuit when there is an overcurrent and to recover at a preset temperature.

5. A needle cover for a test probe according to claim 4, characterized in that: A notch groove is arranged in the side wall of the conductive sleeve, and the notch groove is arranged along the circumference of the conductive sleeve; The notch of the notch groove is provided at one end of the conductive sleeve away from the second opening, so as to separate the side wall of the conductive sleeve into a first tube and a second tube sleeved outside the first tube, and the conductive bottom plate is provided at one end of the first tube away from the second opening; The two ends of the fuse inner tube in the extension direction are respectively arranged in the two notches of the two conductive sleeves, and the two second pipes are arranged at intervals, and the first conductive end and the second conductive end are respectively electrically connected to the two first pipes.

6. A needle cover for a test probe according to claim 4 or 5, characterized in that: The conductive bottom plate is provided with a first through hole, and the fuse baffle is provided with a second through hole coaxially arranged with the first through hole; An inner diameter of the first through hole is greater than an inner diameter of the second through hole.

7. A needle cover for a test probe according to claim 6, characterized in that: The fuse inner tube is formed by a film component surrounding one end of the two conductive sleeves close to each other, and the first conductive end and the second conductive end are respectively arranged at two opposite ends of the film component; The material of the film component includes high molecular polymer.

8. A needle cover for a test probe according to claim 7, characterized in that: The material of the fuse baffle includes high molecular polymer.

9. A needle cover for a test probe according to any one of claims 1 to 5, characterized in that: It also includes an insulating ring sleeved on the outer side of the fuse inner tube, the insulating ring connects the ends of the two conductive sleeves that are close to each other, and the insulating ring protrudes from the outer surface of the conductive sleeve.

10. A testing system, characterized in that: It comprises a carrier board, a test element, a first test probe and a second test probe, and a needle sleeve for the test probe according to any one of claims 1 to 9; The ends of the two conductive sleeves close to each other are connected by an insulating ring, and the insulating ring is protruding from the outer surface of the conductive sleeve: The carrier is provided with a plurality of through holes, and the inner wall of the through hole is provided with a limiting groove arranged along the circumference of the through hole, and the limiting groove is suitable for limiting cooperation with the insulating ring so that the needle sleeve for the test probe is arranged on the carrier through the through hole; a first test probe, the first test probe being electrically connected to the test element, the first test probe being adapted to be inserted into one of the conductive sleeves and connected to the corresponding conductive sleeve; A second test probe, the second test probe is electrically connected to the electronic product under test, and the second test probe is suitable for being inserted into another of the conductive sleeves and connected to the corresponding conductive sleeve.

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