Collector design method and device and nonvolatile storage medium

Abstract

The invention provides a design method and device of a collector and a nonvolatile storage medium. The design method of the collector comprises the following steps: acquiring effective sample information of a sample collector; the effective sample information comprises at least one of the following information: structure parameter information of the sample collector and voltage parameter information of the sample collector; obtaining an importance sequence of each piece of parameter information in the effective sample information and determining a parameter design sequence; and designing the target collector according to the parameter design sequence. Through the technical scheme provided by the invention, the technical problem of low design efficiency in the design process of the collector in the prior art can be solved.

Description

Technical Field

[0001] The present invention relates to the technical field of vacuum electronic devices, and in particular to a collector design method, device, and non-volatile storage medium. Background Art

[0002] At present, in the field of vacuum electronic devices, especially in the design process of traveling wave tubes (TWT), the collector is a key component for recovering the unused electron energy in the TWT. The efficiency and accuracy of its design directly affect the performance and reliability of the entire TWT. Traditional collector design methods are often based on empirical formulas and limited experimental data, and involve a lot of manual trial and error and parameter adjustments. This method is not only time-consuming and labor-intensive, but also often difficult to achieve the optimal design, especially when designing high-efficiency collectors required for high-power continuous wave TWTs, the complexity is greatly increased. Under high-frequency working conditions, the interaction between the electron beam and the slow-wave structure becomes more subtle and complex, requiring the collector to not only be able to efficiently recover energy, but also be able to handle the fine dynamic characteristics of the electron beam, reduce electron reflux, and improve energy conversion efficiency, while ensuring the stability and safety of the equipment.

[0003] However, the collector design methods in the prior art have obvious limitations, low design efficiency, and difficulty in quickly feeding back and adjusting the design scheme. Designers usually need to conduct a large number of simulation tests to find the best design point by scanning and optimizing parameters one by one. This process is not only inefficient, but also easy to miss key parameters that have a significant impact on the collection efficiency. Summary of the invention

[0004] The main purpose of the present invention is to provide a collector design method, device, and non-volatile storage medium to solve the technical problem of low design efficiency in the collector design process in the prior art.

[0005] In order to achieve the above object, according to one aspect of the present invention, a design method of a collector is provided, comprising:

[0006] Acquire effective sample information of the sample collecting electrode; the effective sample information includes at least one of the following: structural parameter information of the sample collecting electrode and voltage parameter information of the sample collecting electrode;

[0007] Obtain the importance order of each parameter information in the valid sample information and determine the parameter design order;

[0008] The target collector is designed according to the parameter design sequence.

[0009] Furthermore, valid sample information of the sample collector is obtained, including:

[0010] Obtaining the electron beam collection situation in the sample collecting electrode;

[0011] Obtain the electron beam energy space domain spectrum according to the electron beam collection situation;

[0012] Determine whether the electron beam energy spatial domain spectrum is abnormal;

[0013] When the electron beam energy space domain spectrum is normal, the sample collection pole corresponding to the electron beam energy space domain spectrum is taken as a valid sample, and the valid sample information of the valid sample is obtained; when the electron beam energy space domain spectrum is abnormal, the sample collection pole corresponding to the electron beam energy space domain spectrum is taken as an invalid sample.

[0014] Further, the electron beam collection situation includes energy information of the electron beam at the entrance of the sample collecting electrode within a preset time period; and obtaining the electron beam energy spatial domain spectrum according to the electron beam collection situation includes:

[0015] Obtaining the particle density information of the electron beam according to the electron beam collection situation;

[0016] The electron beam energy spatial domain spectrum is obtained based on the particle density information.

[0017] Furthermore, the electron beam energy spatial domain spectrum is obtained according to the particle density information, including:

[0018] Obtaining the electron beam energy spatial distribution diagram according to the momentum information of the particles on the three-dimensional coordinate axis in the particle density information;

[0019] Performing pooling processing on the electron beam energy spatial distribution map to obtain a quantitative feature map;

[0020] The quantized feature map is processed by two-dimensional Fourier transform to obtain the electron beam energy spatial domain spectrum.

[0021] Further, judging whether the electron beam energy spatial domain spectrum is abnormal includes:

[0022] Obtaining the median of the amplitude values ​​of the electron beam energy spatial domain spectrum, and taking the median of the amplitude values ​​of the electron beam energy spatial domain spectrum as a threshold;

[0023] Performing image processing on the electron beam energy spatial domain spectrum, distinguishing a high energy spectrum segment image corresponding to a portion of the electron beam energy spatial domain spectrum whose amplitude is greater than a threshold value from a low energy spectrum segment image corresponding to a portion of the electron beam energy spatial domain spectrum whose amplitude is less than or equal to the threshold value;

[0024] Whether the electron beam energy spatial domain spectrum is abnormal is determined based on the spectrum energy distribution of the high-energy spectrum segment image.

[0025] Furthermore, judging whether the electron beam energy space domain spectrum is abnormal according to the spectrum energy distribution of the high energy spectrum segment image includes:

[0026] When the spectrum energy distribution of the high-energy spectrum band image presents the expected distribution, it is determined that the electron beam energy space domain spectrum is normal; when the spectrum energy distribution of the high-energy spectrum band image does not present the expected distribution, it is determined that the electron beam energy space domain spectrum is abnormal;

[0027] The expected distribution is that the frequency of occurrence of high-energy spectrum images gradually decreases along the direction from the edge of the electron beam energy space domain spectrum to the middle of the electron beam energy space domain spectrum.

[0028] Furthermore, a large number of samples are collected, and the importance order of each parameter information in the valid sample information is obtained and the parameter design order is determined, including:

[0029] Input valid sample information from multiple sample collection poles into the random forest model for training;

[0030] Determine whether the error of the output result of the random forest model is within the preset range;

[0031] When the error of the output result of the random forest model is within a preset range, the output result of the random forest model is subjected to feature importance calculation, and the importance order of each parameter information in the valid sample information is obtained according to the result of the feature importance calculation;

[0032] The parameter design order is determined according to the order of importance of each parameter information in the valid sample information.

[0033] Further, the target collector is designed according to the parameter design sequence, including:

[0034] According to the parameter design sequence, the parameter information of the target collector corresponding to the current parameter design sequence is adjusted in sequence, and the power of the collector corresponding to each adjustment is output;

[0035] Compare the power of the collector corresponding to each adjustment, and determine the parameter information corresponding to the collector with the largest power as the optimal design parameter;

[0036] Designing the target collector according to the optimal design parameters;

[0037] Among them, in the parameter design sequence, the number of adjustments of the first one of the two adjacent parameters is greater than that of the last one of the two adjacent parameters.

[0038] According to another aspect of the present invention, a collector design device is provided, which is used to perform the collector design method provided above, and the collector design device includes:

[0039] An acquisition unit, used for acquiring effective sample information of a sample collector;

[0040] A determination unit, used to obtain the importance order of each parameter information in the valid sample information and determine the parameter design order;

[0041] The design unit is used to design the target collector according to a parameter design sequence.

[0042] According to another aspect of the present invention, a nonvolatile storage medium is provided, the nonvolatile storage medium including a stored program, wherein when the program is running, the device where the nonvolatile storage medium is located is controlled to execute the collector design method provided above.

[0043] By applying the technical solution of the present invention, the design process is first optimized. By obtaining the effective sample information of the sample collector, including structural parameters and voltage parameters, the method can determine the order of importance of parameters based on this information, so that the parameters that have a significant impact on the collection efficiency are given priority in the design. This effectively simplifies the design process, avoids blind adjustment of all parameters, and saves design time and cost. Secondly, the traditional collector design often requires a lot of parameter scanning and optimization, which is time-consuming and resource-consuming. By preprocessing data and screening the importance of parameters, this solution can quickly identify several parameters that have the greatest impact on the performance of the collector, so as to focus on the adjustment of these parameters in the early stage of design, significantly improving the design efficiency. Thirdly, through the effectiveness of the sample information of the sample collector, the effectiveness of the importance order of the obtained parameter information can be more accurately evaluated, providing more reliable data support for the design of the collector. This helps to design a collection structure that is more in line with the characteristics of electron injection, improves the collection efficiency, and reduces energy loss. Therefore, through the technical solution of the present invention, the technical problem of low design efficiency in the design process of the collector in the prior art can be solved. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] The drawings constituting a part of the present application are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0045] Figure 1 A schematic diagram showing the steps of a design method for a collector provided in accordance with the first embodiment of the present invention is shown;

[0046] Figure 2 A partial logic schematic diagram of a collector design method provided according to the first embodiment of the present invention is shown;

[0047] Figure 3 A schematic diagram showing a spatial domain spectrum of electron injection energy obtained by the collector design method provided in the first embodiment of the present invention;

[0048] Figure 4 A schematic diagram showing the image processing of the electron beam energy spatial domain spectrum obtained by the collector design method provided in the first embodiment of the present invention;

[0049] Figure 5 A logic schematic diagram showing another part of the collector design method provided in accordance with the first embodiment of the present invention;

[0050] Figure 6 A schematic diagram showing the structure of a sample collector according to a collector design method provided in Embodiment 1 of the present invention is shown;

[0051] Figure 7 A schematic diagram showing the order of importance of each parameter information in the valid sample information of the collector design method provided in the first embodiment of the present invention is shown;

[0052] Figure 8 The electron trajectory diagram of the internal electron beam of the collector provided by the fourth embodiment of the present invention is shown;

[0053] Fig. 9 A schematic cross-sectional structure diagram of a collector provided according to a fourth embodiment of the present invention is shown.

[0054] The above drawings include the following reference numerals:

[0055] 10. Shell part;

[0056] 11. Outer peripheral wall;

[0057] 12. Inner end wall;

[0058] 13. Outer end wall;

[0059] 20. Voltage interface;

[0060] 30. Collecting electrode;

[0061] 31. a first electrode portion;

[0062] 311, first cavity;

[0063] 32. a second electrode portion;

[0064] 321, second cavity;

[0065] 33. Access;

[0066] 40. A first supporting portion;

[0067] 50. Heat transfer part;

[0068] 60. A second supporting portion;

[0069] 70. Heat dissipation unit;

[0070] 80. Vacuum interface;

[0071] 90, cone;

[0072] 1. Slow wave structure. DETAILED DESCRIPTION

[0073] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0074] like Figures 1 to 7 As shown, embodiment 1 of the present invention provides a design method for a collector, and the design method for a collector includes: obtaining effective sample information of a sample collector; the effective sample information includes at least one of the following: structural parameter information of the sample collector and voltage parameter information of the sample collector; obtaining the order of importance of each parameter information in the effective sample information and determining the parameter design order; and designing a target collector according to the parameter design order.

[0075] The design method of the collector provided by the first embodiment of the present invention is adopted. First, the design process is optimized. By obtaining the effective sample information of the sample collector, including structural parameters and voltage parameters, the method can determine the order of importance of the parameters based on this information, so that the parameters that have a significant impact on the collection efficiency are given priority in the design. This effectively simplifies the design process, avoids blind adjustment of all parameters, and saves design time and cost. Secondly, the traditional collector design often requires a lot of parameter scanning and optimization, which is time-consuming and resource-consuming. This solution can quickly identify several parameters that have the greatest impact on the performance of the collector by preprocessing data and screening parameter importance, so as to focus on the adjustment of these parameters in the early stage of design, significantly improving the design efficiency. Thirdly, through the effectiveness of the sample information of the sample collector, the effectiveness of the importance order of the obtained parameter information can be more accurately evaluated, providing more reliable data support for the design of the collector. This helps to design a collection structure that is more in line with the characteristics of electron injection, improves collection efficiency, and reduces energy loss. Therefore, the design method of the collector provided by this embodiment can solve the technical problem of low design efficiency in the design process of the collector in the prior art.

[0076] Specifically, the design method of the collector is applicable to the design of a multi-stage collector. Specifically, the design method of the collector is applicable to the collector of a 30W continuous wave traveling wave tube operating in the G band.

[0077] Specifically, there are multiple structural parameter information and voltage parameter information. Figure 6As shown, the structural parameter information includes: the inlet diameter R1 of the first-stage collector electrode 30, the inlet diameter R2 of the second-stage collector electrode 30, the inlet diameter R3 of the third-stage collector electrode 30, the length L1 of the first-stage collector electrode 30, the length L2 of the second-stage collector electrode 30, the length L3 of the third-stage collector electrode 30, the height H1 of the collector electrode 30, the distance D1 between the tail of the first-stage collector electrode 30 and the head of the second-stage collector electrode 30, the distance D2 between the tail of the second-stage collector electrode 30 and the head of the third-stage collector electrode 30, and the protruding length H-cone of the cone portion 90 of the third-stage collector electrode 30. The voltage parameter information includes: the voltage U1 of the first-stage collector electrode 30, the voltage U2 of the second-stage collector electrode 30, and the voltage U3 of the third-stage collector electrode 30. Specifically, the length of the collector electrode 30 is less than or equal to 30 mm, the inlet diameter is less than or equal to 15 mm, and the voltage U1 of the first-stage collector electrode 30, the voltage U2 of the second-stage collector electrode 30, and the voltage U3 of the third-stage collector electrode 30 show a trend of increasing successively. The voltage U1 of the first-stage collector electrode 30 is between -18000V and -19000V (including -18000V and -19000V).

[0078] Specifically, the method for obtaining valid sample information of the sample collector includes: obtaining the electron beam collection situation in the sample collector; obtaining the electron beam energy space domain spectrum according to the electron beam collection situation; judging whether the electron beam energy space domain spectrum is abnormal; when the electron beam energy space domain spectrum is normal, taking the sample collector corresponding to the electron beam energy space domain spectrum as a valid sample, and obtaining valid sample information of the valid sample; when the electron beam energy space domain spectrum is abnormal, taking the sample collector corresponding to the electron beam energy space domain spectrum as an invalid sample. With such a setting, normal collector samples can be screened out, providing reliable reference data for subsequent design, avoiding the use of inefficient or defective samples in the design process, thereby ensuring that the collector of the final design achieves the best performance.

[0079] Specifically, the electron beam collection situation includes the energy information of the electron beam at the entrance of the sample collector within a preset period of time; the method for obtaining the electron beam energy space domain spectrum according to the electron beam collection situation includes: obtaining the particle density information of the electron beam according to the electron beam collection situation; obtaining the electron beam energy space domain spectrum according to the particle density information. With such a setting, by analyzing the energy information of the electron beam at the entrance, the technology can capture the real-time dynamic characteristics of the electron beam when it enters the collector. This includes the energy distribution of the electron beam, the degree of diffusion, and the rate of energy change with space, which helps to more comprehensively evaluate the health status of the electron beam.

[0080] Specifically, the method for obtaining the electron beam energy space domain spectrum according to the particle density information includes: obtaining the electron beam energy space distribution map according to the momentum information of the particles on the three-dimensional coordinate axis in the particle density information; performing pooling processing on the electron beam energy space distribution map to obtain a quantitative feature map; performing two-dimensional Fourier transform processing on the quantitative feature map to obtain the electron beam energy space domain spectrum. In this way, by converting the momentum information of the particles on the three-dimensional coordinate axis into energy information, the method can generate a space distribution map of the electron beam energy, which provides an intuitive and accurate electron beam energy distribution image for the collector design. This helps designers to have a deeper understanding of the dynamic characteristics of the electron beam in space and lays a solid foundation for subsequent design optimization. Pooling processing is performed on the electron beam energy space distribution map to generate a quantitative feature map, and then the electron beam energy space domain spectrum is obtained through two-dimensional Fourier transform processing. This process realizes the quantization and frequency domain conversion of the electron beam energy distribution characteristics, which helps to more clearly identify the energy change rate in the spatial domain and provides a powerful technical means for anomaly detection.

[0081] like Figure 2 As shown, Figure 2 The paper provides a partial logical process of extracting and analyzing the electron beam energy space domain spectrum in the collector design method. This process first obtains the electron beam information of a certain period of time by setting a regional particle (PIC) particle monitoring surface at the tail of the slow wave structure 1. The tail of the slow wave structure 1 refers to the output port of the high-frequency structure electron beam, which is interconnected with the entrance of the collector. Secondly, the partition information table (PIT) file originally directly obtained is converted into the particle density information (PID) file format so that it can be successfully input into the collector. The fourth to sixth columns of the PID file are the momentum components of the particles in the three directions of the X-axis, Y-axis, and Z-axis. Since only the energy distribution information of the electron beam is needed, the fourth to sixth columns of the PID file are converted into energy information, and correspond to the position information of the first few columns of the PID file to obtain the energy space distribution map of the electron beam. The obtained energy distribution map is averaged and pooled to achieve quantization, which is convenient for subsequent processing. The obtained quantized feature map is subjected to 2D-DFT (two-dimensional Fourier transform processing) to realize the extraction of the energy distribution space domain spectrum. Figure 3 The obtained energy distribution spatial domain spectrum (equivalent to the electron beam energy spatial domain spectrum) is shown, which is specifically the amplitude spectrum.

[0082] Specifically, the main steps for the quantification of the electron beam energy map are: converting the momentum information in the original PID file into the required energy information, and obtaining the energy space distribution map of the electron beam using the formula shown below:

[0083]

[0084] Where M is the momentum of the particle, M x is the momentum of the particle on the x-axis, M y is the momentum of the particle on the y-axis, M z is the momentum of the particle on the z axis, m e is the mass of the electron, c is the speed of light, and E is the energy of the particle required. The particle here refers to the macroparticle required for simulation in CST (Computer Microwave Simulation Technology).

[0085] After obtaining the energy space distribution map of the electron beam, in order to obtain image-like data that can be used for two-dimensional Fourier transform, it is necessary to perform pooling on the obtained energy space distribution map. Pooling is generally divided into maximum pooling and average pooling. Here, average pooling is used, which is selected to make full use of all particle information in the partial spatial domain. Here, the entire energy space distribution map is divided into feature images of size 100*100 (unit is 1), and then converted into a format that can be used for 2D-DFT.

[0086] After that, the obtained image needs to be subjected to a two-dimensional Fourier transform. The formula for the two-dimensional Fourier transform is as follows:

[0087]

[0088] Where M is the horizontal length of the image, N is the vertical length of the image, u and v are the horizontal and vertical frequency components after Fourier transform, and f is the spatial domain image.

[0089] After completing the above transformation, a spatial spectrum diagram (equivalent to the electron beam energy spatial domain spectrum) that can be used for the spatial transformation of energy along the x-axis and y-axis will be obtained.

[0090] In this embodiment, the method for judging whether the electron beam energy space domain spectrum is abnormal includes: obtaining the median of the amplitude value of the electron beam energy space domain spectrum, and taking the median of the amplitude value of the electron beam energy space domain spectrum as a threshold; performing image processing on the electron beam energy space domain spectrum, distinguishing the high energy spectrum segment image corresponding to the part of the electron beam energy space domain spectrum whose amplitude is greater than the threshold and the low energy spectrum segment image corresponding to the part of the electron beam energy space domain spectrum whose amplitude is less than or equal to the threshold; judging whether the electron beam energy space domain spectrum is abnormal according to the spectrum energy distribution of the high energy spectrum segment image. With such a setting, by setting a threshold to distinguish the high energy spectrum segment from the low energy spectrum segment in the electron beam energy space domain spectrum, the method can accurately judge whether the electron beam energy distribution is abnormal. This threshold setting based on the median of the spectrum amplitude can effectively identify those electron beams with uneven energy distribution or abnormal rate of change, which helps designers to adjust the collector design in time to avoid the degradation of traveling wave tube performance caused by abnormal electron beam.

[0091] Specifically, "distinguishing between the high-energy spectrum segment image corresponding to the portion of the electron beam energy spatial domain spectrum whose amplitude is greater than a threshold and the low-energy spectrum segment image corresponding to the portion of the electron beam energy spatial domain spectrum whose amplitude is less than or equal to the threshold" means distinguishing by the depth of the image color blocks or by different color areas.

[0092] Specifically, the method for judging whether the electron beam energy space domain spectrum is abnormal according to the spectrum energy distribution of the high energy spectrum band image includes: when the spectrum energy distribution of the high energy spectrum band image presents the expected distribution, determining that the electron beam energy space domain spectrum is normal; when the spectrum energy distribution of the high energy spectrum band image does not present the expected distribution, determining that the electron beam energy space domain spectrum is abnormal; wherein the expected distribution is that the frequency of occurrence of the high energy spectrum band image gradually decreases along the edge of the electron beam energy space domain spectrum to the middle of the electron beam energy space domain spectrum. In this way, it is possible to accurately judge whether the electron beam energy space domain spectrum is abnormal. The setting of the expected distribution is based on the energy distribution law of the electron beam under the ideal state, which helps the designer to identify the electron beam behavior that deviates from the normal state and adjust the collector design parameters in time to ensure the stable operation of the traveling wave tube and efficient energy recovery.

[0093] Figure 4 The figure shows the spectrum after being divided by the median of the spectrum amplitude value as the threshold. The amplitude above the threshold is set to 0. The purpose of this measure is to detect the distribution frequency band of the main energy of the spectrum. Figure 4 It can be seen that after the above series of spatial domain spectrum mining, the observable two-dimensional spectrum of the electron beam energy in the spatial domain is successfully obtained. After suppressing the low-energy spectrum area (equivalent to the low-energy spectrum segment image), it can be seen that in both the x-axis and y-axis directions, the spectrum energy is mainly concentrated in the middle diamond area. For the results of 2D-DFT, the closer to the middle part, the lower the corresponding frequency. Therefore, this shows that the rate of change of the electron beam energy with the spatial domain is generally low, indicating that the energy distribution of the electron beam is normal (equivalent to the normal spectrum of the electron beam energy in the spatial domain).

[0094] Specifically, there are multiple sample collection poles, and the method for obtaining the importance order of each parameter information in the valid sample information and determining the parameter design order includes: inputting the valid sample information of multiple sample collection poles into the random forest model for training; judging whether the error of the output result of the random forest model is within a preset range; when the error of the output result of the random forest model is within the preset range, performing feature importance calculation on the output result of the random forest model, and obtaining the importance order of each parameter information in the valid sample information according to the result of the feature importance calculation; determining the parameter design order according to the importance order of each parameter information in the valid sample information. With such a setting, the accuracy of model creation can be guaranteed by judging whether the error of the output result of the random forest model is within the preset range, thereby ensuring the reliability of the output result. Determining the parameter design order according to the importance order of the parameter information enables the designer to give priority to adjusting the parameters that have the greatest impact on the performance of the collection pole. This method simplifies the design process, avoids indiscriminate optimization of all parameters, greatly improves the design efficiency, and shortens the time from concept to finished product.

[0095] In this embodiment, the method for designing the target collector according to the parameter design sequence includes: adjusting the parameter information of the target collector corresponding to the current parameter design sequence in sequence according to the parameter design sequence, and outputting the power of the collector corresponding to each adjustment; comparing the power of the collector corresponding to each adjustment, and determining the parameter information corresponding to the collector with the largest power as the optimal design parameter; designing the target collector according to the optimal design parameter; wherein, in the parameter design sequence, the number of adjustments of the first one of the two adjacent parameters is greater than the second one of the two adjacent parameters. In this way, by adjusting the parameters in sequence and comparing the power of the collector after each adjustment, the method can quickly determine the optimal design parameters. This parameter optimization strategy based on power comparison ensures the maximization of the performance of the design result and helps to design a more efficient and reliable collector. In the parameter design sequence, the first one of the two adjacent parameters is adjusted more times than the second one. This strategy ensures that the key parameters are fully explored and optimized in the early stage of the design, reduces the number of later design iterations, saves design resources, and accelerates the design process.

[0096] Specifically, “the error is within a preset range” means that the root mean square error (RMSE) value is less than or equal to 15.

[0097] Specifically, Figure 5As shown in the figure, the design process based on the feature screening of the random forest algorithm includes: first, according to the gridded parameter scanning method, a certain number of sample collector parameter results are obtained, including the specific values ​​of each result, the specific values ​​of each voltage, and the efficiency results (or recovered energy). The sample set is divided into a training set and a test set according to the number ratio of 7:3. The random forest is trained to observe the training effect of the random forest. Once the error of the output result of the random forest model is within a reasonable range, it means that the model creation of the random forest for the collector target is accurate. Record the importance distribution of each parameter feature and determine which features should be given priority.

[0098] Specifically, Figure 7 As shown in the figure, the order of importance obtained after calculation by the random forest model is: the voltage U2 of the second-stage collector electrode 30, the voltage U3 of the third-stage collector electrode 30, the inlet diameter R2 of the second-stage collector electrode 30, and the length L3 of the third-stage collector electrode 30. These features show higher feature importance in the model established by the random forest algorithm and can be used as a reference and designed first. However, this does not mean that the remaining features will not participate in the design, but are designed as less important parts.

[0099] Embodiment 2 of the present invention provides a collector design device, which is used to execute the collector design method in embodiment 1, and the collector design device includes an acquisition unit, a determination unit and a design unit. The acquisition unit is used to acquire effective sample information of the sample collector; the determination unit is used to acquire the importance order of each parameter information in the effective sample information and determine the parameter design order; the design unit is used to design the target collector according to the parameter design order.

[0100] By using the collector design device provided by the second embodiment of the present invention, the design process is first optimized. By obtaining the effective sample information of the sample collector, including structural parameters and voltage parameters, the method can determine the order of importance of parameters based on this information, so that the parameters that have a significant impact on the collection efficiency are given priority during the design. This effectively simplifies the design process, avoids blind adjustment of all parameters, and saves design time and cost. Secondly, the traditional collector design often requires a large amount of parameter scanning and optimization, which is time-consuming and resource-consuming. The present invention can quickly identify several parameters that have the greatest impact on the performance of the collector by preprocessing data and screening parameter importance, so as to focus on the adjustment of these parameters in the early stage of design, significantly improving the design efficiency. Thirdly, through the effectiveness of the sample information of the sample collector, the effectiveness of the importance order of the obtained parameter information can be more accurately evaluated, providing more reliable data support for the design of the collector. This helps to design a collection structure that is more in line with the characteristics of electron injection, improves collection efficiency, and reduces energy loss. Therefore, the collector design device provided by this embodiment can solve the technical problem of low design efficiency in the design process of the collector in the prior art.

[0101] A third embodiment of the present invention provides a nonvolatile storage medium, wherein the nonvolatile storage medium includes a stored program, wherein when the program is running, the device where the nonvolatile storage medium is located is controlled to execute the collector design method in the first embodiment.

[0102] like Figure 8 and Fig. 9 As shown, the fourth embodiment of the present invention provides a collector, which is designed by the design method of the collector in the first embodiment, and the collector includes a shell 10 and a plurality of collector electrodes 30. The shell 10 encloses a mounting cavity; a plurality of voltage interfaces 20 are arranged on the shell 10. The plurality of collector electrodes 30 are arranged in the mounting cavity at intervals along the extension direction of the mounting cavity; the plurality of collector electrodes 30 are arranged one by one corresponding to the plurality of voltage interfaces 20; and the collector electrodes 30 are electrically connected to the voltage interfaces 20.

[0103] By adopting the collector provided by Example 4 of the present invention, through the optimization design process in Example 1, the designed collector can efficiently recover the electron beam entering the installation cavity. During the design process, the abnormal detection of the spatial distribution of the electron beam energy and the ranking of the feature importance are taken into account to ensure that the collector structure parameters and voltage configuration can accurately match the dynamic characteristics of the electron beam, maximize the energy recovery efficiency, and reduce energy loss. The installation cavity surrounded by the shell portion 10 provides a stable and optimized installation environment for the collector electrode 30. During the design process, by considering the shell size, material and internal structure, the shell portion 10 can effectively support and protect the collector electrode 30, while optimizing the trajectory of the electron beam, reducing electron reflux, and improving the overall collection efficiency. Therefore, the collector provided by this embodiment can solve the technical problem of low electron energy recovery efficiency of the collector in the prior art.

[0104] Specifically, the collector electrode 30 includes a first electrode portion 31 and a second electrode portion 32 that are connected to each other. The first electrode portion 31 encloses a first cavity 311, and the second electrode portion 32 encloses a second cavity 321 that is connected to the first cavity 311. A passage 33 for allowing electrons to enter is provided on the side of the first electrode portion 31 away from the second electrode portion 32, and the passage 33 is connected to the first cavity 311; along the extension direction from the first electrode portion 31 to the second electrode portion 32, the first electrode portion 31 is gradually expanded.

[0105] Specifically, at least a portion of the first electrode portion 31 of one of two adjacent collector electrodes 30 extends into the second cavity 321 of the other one.

[0106] Specifically, the collector further includes a first support portion 40, which is sleeved on at least part of the collector electrode 30 and is arranged in affixed with at least part of the collector electrode 30. The collector further includes a heat conducting portion 50, which is sleeved on the first support portion 40 and is arranged in affixed with at least part of the first support portion 40. The collector further includes a second support portion 60, which is sleeved on the heat conducting portion 50 and is arranged in affixed with the heat conducting portion 50. The collector further includes a heat dissipation portion 70, which is sleeved on the second support portion 60 and is arranged in affixed with the second support portion 60. Among them, the first support portion 40 and the heat conducting portion 50 are both arranged to match the size of at least part of the collector electrode 30; the second support portion 60 and the heat dissipation portion 70 are both arranged to match the size of multiple collector electrodes 30. With such a structural arrangement, the first support portion 40 is sleeved on at least part of the collector electrode 30 and is in affixed with the electrode, ensuring the stability and structural accuracy of the electrode in the high-frequency structure. This design can prevent the displacement of the electrode due to mechanical vibration or thermal expansion, thereby maintaining the stable performance of the collector under high-power and high-frequency working conditions. The heat-conducting part 50 is sleeved on the first support part 40, and the fitting design promotes the effective conduction of heat from the collector electrode 30 to the heat-conducting part 50. The material selection of the heat-conducting part 50 (such as high thermal conductivity material) can quickly remove the heat generated by the electrode during operation, avoiding performance degradation or equipment damage caused by heat accumulation. The second support part 60 is sleeved on the heat-conducting part 50 and fits with the heat-conducting part 50, further enhancing the overall structural stability of the collector. The design of the second support part 60 takes into account the comprehensive size of the electrode and the heat-conducting part 50, ensures the integrity of the structure under complex thermal environments, and improves the fatigue resistance and thermal stability of the collector. The heat dissipation part 70 is sleeved on the second support part 60 and fits with the second support part 60, realizing the effective dissipation of the overall heat of the collector. The heat dissipation part 70 can effectively dissipate the internal heat of the collector to the external environment through the optimized heat dissipation structure and material, relieve thermal pressure, and ensure the long-term stable operation of the collector. The first support part 40, the heat conducting part 50, the second support part 60 and the heat dissipating part 70 are arranged with matching sizes, thus realizing the coordinated optimization among the multi-layer structures. This design ensures the continuous and efficient transfer of heat from the electrode to the external environment, while maintaining the compactness and lightness of the structure, thus improving the overall performance of the collector.

[0107] Specifically, at least a portion of the collector electrode 30 is the second electrode portion 32 .

[0108] Specifically, the voltage interface 20 is disposed on the outer peripheral wall 11 of the housing portion 10 .

[0109] Specifically, one of the plurality of collector electrodes 30 that is close to the inner end wall 12 of the shell portion 10 is disposed at a distance from the inner end wall 12 .

[0110] Specifically, the collector further includes a vacuum interface 80 , which is disposed at the outer end wall 13 of the shell portion 10 . The vacuum interface 80 is used to connect to a vacuum pump to make the installation cavity a vacuum state.

[0111] like Figure 8 As shown, the electron trajectory in the trajectory diagram shows that the collector successfully achieves graded deceleration of electrons in the electron beam. Calculation results show that the recovery efficiency of the collector for the continuous wave electron beam exceeds 90%, approximately 95%.

[0112] Specifically, the first support part 40 is made of alumina ceramic. Specifically, the first support part 40 is 95 alumina ceramic, which has the advantages of high corrosion resistance, high hardness, and thermal insulation, and is very suitable for fixed support around the collector. Specifically, the heat conducting part 50 is made of copper. The second support part 60 is made of alumina ceramic. The heat dissipation part 70 is made of copper.

[0113] From the above description, it can be seen that the above embodiments of the present invention achieve the following technical effects: significantly improve the collection efficiency of electron beams, and effectively reduce the trial and error cost in the design process. Improve the reliability and stability of the collector, and meet the strict requirements of different fields for high-precision electron beam collection.

[0114] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0115] Unless otherwise specifically stated, the relative arrangement, numerical expressions and numerical values ​​of the parts and steps set forth in these embodiments do not limit the scope of the application. Meanwhile, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to actual proportional relationships. The technology, methods and equipment known to those of ordinary skill in the relevant art may not be discussed in detail, but in appropriate cases, the technology, methods and equipment should be considered as a part of the specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, and therefore, once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0116] In the description of the present application, it should be understood that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present application and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction, and therefore cannot be understood as limiting the scope of protection of the present application; the directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.

[0117] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0118] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of this application.

[0119] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A design method for a collector, characterized in that: include: Obtaining effective sample information from the sample collector; The effective sample information includes at least one of the following: structural parameter information of the sample collecting electrode and voltage parameter information of the sample collecting electrode; Obtaining the importance order of each parameter information in the valid sample information and determining the parameter design order; The target collector is designed according to the parameter design sequence.

2. The design method of the collector according to claim 1, characterized in that: The obtaining of valid sample information of the sample collector includes: Obtaining electron beam collection conditions in the sample collecting electrode; Acquire the electron beam energy space domain spectrum according to the electron beam collection situation; Determining whether the electron beam energy spatial domain spectrum is abnormal; When the electron injection energy spatial domain spectrum is normal, the sample collection pole corresponding to the electron injection energy spatial domain spectrum is taken as a valid sample, and the valid sample information of the valid sample is obtained; when the electron injection energy spatial domain spectrum is abnormal, the sample collection pole corresponding to the electron injection energy spatial domain spectrum is taken as an invalid sample.

3. The design method of the collector according to claim 2, characterized in that: The electron beam collection condition includes energy information of the electron beam at the entrance of the sample collecting electrode within a preset time period; The obtaining of the electron beam energy space domain spectrum according to the electron beam collection situation includes: Acquire particle density information of the electron beam according to the electron beam collection situation; The electron beam energy spatial domain spectrum is acquired according to the particle density information.

4. The design method of the collector according to claim 3, characterized in that: The obtaining of the electron beam energy spatial domain spectrum according to the particle density information comprises: Acquire the electron beam energy spatial distribution diagram according to the momentum information of the particles on the three-dimensional coordinate axis in the particle density information; Performing pooling processing on the electron beam energy spatial distribution map to obtain a quantitative feature map; The quantized feature map is subjected to two-dimensional Fourier transform processing to obtain the electron beam energy spatial domain spectrum.

5. The design method of the collector according to claim 2, characterized in that: The determining whether the electron beam energy spatial domain spectrum is abnormal includes: Acquire the median of the amplitude values ​​of the electron beam energy spatial domain spectrum, and use the median of the amplitude values ​​of the electron beam energy spatial domain spectrum as a threshold; Performing image processing on the electron beam energy spatial domain spectrum to distinguish a high-energy spectrum segment image corresponding to a portion of the electron beam energy spatial domain spectrum whose amplitude is greater than the threshold value from a low-energy spectrum segment image corresponding to a portion of the electron beam energy spatial domain spectrum whose amplitude is less than or equal to the threshold value; Whether the electron beam energy spatial domain spectrum is abnormal is determined according to the spectrum energy distribution of the high energy spectrum segment image.

6. The design method of the collector according to claim 5, characterized in that: The determining whether the electron beam energy spatial domain spectrum is abnormal according to the spectrum energy distribution of the high energy spectrum segment image includes: When the spectrum energy distribution of the high-energy spectrum band image presents the expected distribution, it is determined that the electron beam energy space domain spectrum is normal; when the spectrum energy distribution of the high-energy spectrum band image does not present the expected distribution, it is determined that the electron beam energy space domain spectrum is abnormal; The expected distribution is that the frequency of occurrence of the high-energy spectrum segment image gradually decreases along the direction from the edge of the electron beam energy space domain spectrum to the middle of the electron beam energy space domain spectrum.

7. The design method of the collector according to claim 1, characterized in that: The sample collection is very large, and the obtaining of the importance order of each parameter information in the valid sample information and determining the parameter design order includes: Inputting valid sample information of a plurality of sample collection poles into a random forest model for training; Determine whether the error of the output result of the random forest model is within a preset range; When the error of the output result of the random forest model is within the preset range, performing feature importance calculation on the output result of the random forest model, and obtaining the importance order of each parameter information in the valid sample information according to the result of the feature importance calculation; The parameter design order is determined according to the order of importance of each parameter information in the valid sample information.

8. The design method of the collector according to claim 1, characterized in that: The step of designing the target collector according to the parameter design sequence includes: According to the parameter design sequence, sequentially adjust the parameter information of the target collector corresponding to the current parameter design sequence, and output the power of the collector corresponding to each adjustment; Comparing the powers of the collectors corresponding to each adjustment, and determining the parameter information corresponding to the collector with the largest power as the optimal design parameter; Designing the target collector according to the optimal design parameters; Among them, in the parameter design sequence, the number of adjustments of the first one of the two adjacent parameters is greater than that of the last one of the two adjacent parameters.

9. A design device for a collector, characterized in that: Used to perform the collector design method according to any one of claims 1 to 8, the collector design device comprising: An acquisition unit, used for acquiring effective sample information of a sample collector; A determination unit, used to obtain the importance order of each parameter information in the valid sample information and determine the parameter design order; The design unit is used to design the target collector according to the parameter design sequence.

10. A non-volatile storage medium, characterized in that: The non-volatile storage medium includes a stored program, wherein when the program is executed, the device where the non-volatile storage medium is located is controlled to execute the collector design method according to any one of claims 1 to 8.

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