Method and device for testing radiation of optical module monomer

Abstract

The invention discloses an optical module monomer radiation test method and device, and the method comprises the steps: 1, inserting a to-be-tested optical module monomer into an EMC test tool, and enabling the EMC test tool and a receiving antenna for receiving a radiation signal to be located in a darkroom provided with a wave-absorbing material; 2, measuring the bit error rate of the to-be-tested optical module during working through a bit error tester, and receiving a radiation signal of the to-be-tested optical module monomer when the bit error rate is within a preset range through a receiving antenna; and step 3, judging the radiation performance of the optical module monomer through the radiation signal. According to the testing method, external environment interference is eliminated through darkroom environment shielding and testing tool shielding, the accuracy and consistency of testing results are improved, and the testing method is easy to operate, short in testing time, high in reusability and convenient for environment building, and an engineer can conveniently and rapidly know the monomer radiation performance of a product.

Description

Technical Field

[0001] The present invention relates to the field of optical module testing, and in particular to a method and device for testing radiation of an optical module monomer. Background Art

[0002] Due to the rapid development of the optoelectronic industry, more and more attention is paid to the electromagnetic compatibility performance of optical modules. In order to ensure that the electromagnetic compatibility performance of optical modules meets the standard requirements, the electromagnetic radiation of optical modules needs to be tested and controlled according to the EMC protocol requirements. At present, the electromagnetic radiation evaluation of optical modules is mainly based on the whole machine test of optical modules in switches. The full configuration of optical modules on switches generally has specifications such as 24 / 32 / 48 / 56 / 128. In order to better control the electromagnetic radiation of optical modules, it is necessary to conduct electromagnetic radiation tests on the monomers of optical modules in advance to ensure that the monomer radiation of optical modules is within the limit of the protocol standard, so as to facilitate the evaluation of the electromagnetic radiation of optical modules when the whole switch is working. Summary of the invention

[0003] In view of the technical defects and technical drawbacks in the prior art, the embodiment of the present invention provides a method for testing radiation of an optical module monomer that overcomes the above problems or at least partially solves the above problems. The specific scheme is as follows:

[0004] As a first aspect of the present invention, a method for testing radiation of an optical module monomer is provided, the method comprising:

[0005] Step 1, inserting the optical module to be tested into the EMC test fixture, and placing the EMC test fixture and a receiving antenna for receiving radiation signals in a darkroom provided with an absorbing material;

[0006] Step 2, measuring the bit error rate of the optical module to be tested when it is working by using a bit error meter, and receiving the radiation signal of the optical module to be tested when the bit error rate is within a preset range by using a receiving antenna;

[0007] Step 3: determining the radiation performance of the optical module unit according to the radiation signal.

[0008] Furthermore, the bit error rate of the optical module to be tested is measured by the following method:

[0009] Step 1.1, an electrical signal is sent out by the bit error meter, and the electrical signal sent out by the bit error meter is converted into an optical signal by the light source module and then sent to the optical module to be tested;

[0010] Step 1.2, after the optical module to be tested receives the optical signal, it converts the received optical signal into an electrical signal and then converts the electrical signal into an optical signal after looping it back and sends it to the light source module;

[0011] Step 1.3, after the light source module receives the optical signal emitted by the optical module to be tested, it converts the optical signal into an electrical signal and transmits it to the bit error tester;

[0012] In step 1.4, the bit error meter calculates the bit error rate of the optical module when it is working by sending and receiving electrical signals.

[0013] Furthermore, an optical attenuator is arranged between the light source module and the optical module to be tested. In step 1.1, the optical signal sent by the light source module to the optical module to be tested is an optical signal attenuated by the optical attenuator; in step 1.2, the optical signal sent by the optical module to be tested to the light source module is also an optical signal attenuated by the optical attenuator.

[0014] Furthermore, the shell of the EMC test tool is an electromagnetic shielding cover, and the interior of the EMC test tool is designed as a test board for self-looping of electrical signals.

[0015] Furthermore, the method also includes placing the EMC test tool on a turntable, and during the test, driving the EMC test tool to rotate 360° via the turntable.

[0016] Furthermore, the height of the EMC test tool from the ground is 0.8m, the height of the receiving antenna is between 1m and 1.5m, and the horizontal distance from the center of the optical module to be tested to the receiving antenna is 3m.

[0017] As a second aspect of the present invention, a test device for radiation of an optical module monomer is provided, the device comprising: an EMC test tool, a bit error meter, an EMI receiver, a darkroom provided with an absorbing material, and a receiving antenna for receiving a radiation signal, the optical module monomer to be tested is inserted into the EMC test tool, and the EMC test tool and the receiving antenna are located in the darkroom provided with the absorbing material;

[0018] The device is used to measure the bit error rate of the optical module to be tested when it is working. The receiving antenna is used to receive the radiation signal of the optical module to be tested when the bit error rate is within a preset range; the EMI receiver is used to determine the radiation performance of the optical module through the radiation signal.

[0019] Furthermore, a light source module is provided between the bit error meter and the optical module to be measured, and the bit error rate of the optical module to be measured when working is measured by the following method;

[0020] The bit error meter sends an electrical signal, and the light source module converts the electrical signal sent by the bit error meter into an optical signal and then sends it to the optical module to be tested;

[0021] After receiving the optical signal, the optical module to be tested converts the received optical signal into an electrical signal and then converts it into an optical signal after looping the electrical signal and sends it to the light source module;

[0022] After receiving the optical signal from the optical module to be tested, the light source module converts the optical signal into an electrical signal and transmits it to the bit error tester;

[0023] The bit error meter calculates the bit error rate of the optical module when it is working by sending and receiving electrical signals;

[0024] Among them, an optical attenuator is arranged between the light source module and the optical module to be tested. The optical signal sent by the light source module to the optical module to be tested is the optical signal attenuated by the optical attenuator; the optical signal sent by the optical module to be tested to the light source module is also the optical signal attenuated by the optical attenuator.

[0025] Furthermore, the shell of the EMC test tool is an electromagnetic shielding cover, the interior of the EMC test tool is designed as a test board for self-looping of electrical signals, the height of the EMC test tool from the ground is 0.8m, the height of the receiving antenna is between 1m-1.5m, and the horizontal distance from the center of the optical module to be tested to the receiving antenna is 3m.

[0026] Furthermore, the device also includes a turntable, and the EMC test tool is placed on the turntable. During the test, the EMC test tool is driven by the turntable to rotate 360°.

[0027] The present invention has the following beneficial effects:

[0028] 1. This test method is simple to operate, highly reusable, and easy to set up the environment.

[0029] 2. This test method requires less time, allowing engineers to quickly understand the single-unit radiation performance of the product.

[0030] 3. This test method can replace test fixtures with different packages and can be adapted to the single-unit testing of optical modules of various products.

[0031] 4. This test method eliminates external environmental interference through darkroom environment shielding and test tooling shielding, thereby improving the accuracy and consistency of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 A schematic flow chart of a method for testing radiation of an optical module monomer provided in an embodiment of the present invention.

[0033] Figure 2 A schematic diagram of the structure of a test device for radiation of an optical module monomer provided in an embodiment of the present invention;

[0034] Figure 3 A schematic diagram of a darkroom environment provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0036] like Figure 1 As shown, a method for testing radiation of an optical module monomer provided by an embodiment of the present invention includes:

[0037] Step 1, inserting the optical module to be tested into the EMC test fixture, placing the EMC test fixture and the receiving antenna for receiving the radiation signal in a darkroom provided with an absorbing material, wherein the absorbing material is evenly arranged on all walls in the darkroom so that the single radiation of the optical module to be tested will not be reflected in the darkroom;

[0038] Step 2, measuring the bit error rate of the optical module to be tested when it is working by using a bit error meter, and receiving the radiation signal of the optical module to be tested when the bit error rate is within a preset range by using a receiving antenna;

[0039] Step 3: determining the radiation performance of the optical module unit according to the radiation signal.

[0040] The present invention confirms that the optical module is working normally by observing the bit error rate displayed after comparing the received and transmitted code streams detected by the bit error meter, and the radiation intensity of the optical module monomer when the receiving antenna tests the normal operation. Whether the optical module monomer meets the requirements is determined by whether the final test data exceeds the standard limit.

[0041] The EMC test tooling shell of the optical module to be tested is an electromagnetic shielding cover, which can shield external radiation interference. The internal design is a test board for electrical signal self-looping, which can loop the electrical signal transmitted by the optical module back to the optical module body. Different test boards can be replaced according to the different packages of the optical module, which can flexibly adapt to optical module products with various packages.

[0042] This test method eliminates external environmental interference through darkroom environment shielding and test tooling shielding, thereby improving the accuracy and consistency of the test results. This test method is also simple to operate, requires less testing time, is highly reusable, and is easy to set up the environment, allowing engineers to quickly understand the single-unit radiation performance of the product.

[0043] In some specific embodiments, the bit error rate of the optical module to be tested when it is working is measured by the following method:

[0044] Step 1.1, the bit error meter sends an electrical signal, and the light source module converts the electrical signal sent by the bit error meter into an optical signal and then sends it to the optical module to be tested;

[0045] Step 1.2, after the optical module to be tested receives the optical signal, it converts the received optical signal into an electrical signal and then converts the electrical signal into an optical signal after looping it back and sends it to the light source module;

[0046] Step 1.3, after the light source module receives the optical signal emitted by the optical module to be tested, it converts the optical signal into an electrical signal and transmits it to the bit error tester;

[0047] In step 1.4, the bit error meter calculates the bit error rate of the optical module when it is working by sending and receiving electrical signals.

[0048] like Figure 2 As shown, a test device for radiation of an optical module monomer provided by an embodiment of the present invention comprises: an EMC test tool, a bit error meter, an EMI receiver, a darkroom provided with absorbing materials, and a receiving antenna for receiving radiation signals. The optical module monomer to be tested is inserted into the EMC test tool, and the EMC test tool and the receiving antenna are located in the darkroom provided with absorbing materials.

[0049] The device is used to measure the bit error rate of the optical module to be tested when it is working. The receiving antenna is used to receive the radiation signal of the optical module to be tested when the bit error rate is within a preset range; the EMI receiver is used to determine the radiation performance of the optical module through the radiation signal.

[0050] Wherein, a light source module is arranged between the bit error meter and the optical module to be measured, and the bit error rate of the optical module to be measured when working is measured by the following method;

[0051] The bit error meter sends an electrical signal, and the light source module converts the electrical signal sent by the bit error meter into an optical signal and then sends it to the optical module to be tested;

[0052] After receiving the optical signal, the optical module to be tested converts the received optical signal into an electrical signal and then converts it into an optical signal after looping the electrical signal and sends it to the light source module;

[0053] After receiving the optical signal from the optical module to be tested, the light source module converts the optical signal into an electrical signal and transmits it to the bit error tester;

[0054] The bit error meter calculates the bit error rate of the optical module when it is working by sending and receiving electrical signals;

[0055] Among them, an optical attenuator is arranged between the light source module and the optical module to be tested, and the optical signal sent by the light source module to the optical module to be tested is an optical signal attenuated by the optical attenuator; the optical signal sent by the optical module to be tested to the light source module is also an optical signal attenuated by the optical attenuator;

[0056] The test environment layout of the optical module monomer radiation in the darkroom is as follows: Figure 3As shown in the figure, the optical module to be tested is inserted into the EMC test fixture, and the test fixture needs to be well grounded; the test fixture is installed above the table on the turntable, the turntable can rotate 360°, the table is 0.8m above the ground, the center of the optical module to be tested is 3m away from the receiving antenna, and the receiving antenna is installed on the top of the antenna tower with variable height (1-4m), and is connected to the EMI receiver outside the darkroom through a coaxial cable. The signal spectrum analysis function of the EMI receiver can know the radiation interference intensity received by the receiving antenna. The entire darkroom is made of steel and is surrounded by absorbing materials to ensure that external radiation interference will not enter the darkroom, and the single radiation of the optical module will not be reflected in the darkroom.

[0057] In some embodiments, for the test of optical module monomers, when the height of the receiving antenna is between 1m and 1.5m, the radiation disturbance intensity received by the receiving antenna is the maximum. The height of the antenna is adjusted to this height range, and the EMC test software is controlled to rotate the turntable 360°. By adjusting the rotation of the turntable, the height of the receiving antenna, and the polarity of the receiving antenna, the maximum external radiation field intensity reading of the EUT when it is working normally can be measured, and this reading is the radiation value of the optical module monomer.

[0058] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for testing radiation of an optical module monomer, characterized in that: The method comprises: Step 1, inserting the optical module to be tested into an EMC test fixture, and placing the EMC test fixture and a receiving antenna for receiving radiation signals in a darkroom provided with an absorbing material; Step 2, measuring the bit error rate of the optical module to be tested when it is working by using a bit error meter, and receiving the radiation signal of the optical module to be tested when the bit error rate is within a preset range by using a receiving antenna; Step 3: determining the radiation performance of the optical module unit according to the radiation signal.

2. The method for testing radiation of an optical module monomer according to claim 1, characterized in that: The bit error rate of the optical module to be tested is measured by the following method: Step 1.1, an electrical signal is sent out by the bit error meter, and the electrical signal sent out by the bit error meter is converted into an optical signal by the light source module and then sent to the optical module to be tested; Step 1.2, after the optical module to be tested receives the optical signal, it converts the received optical signal into an electrical signal and then converts the electrical signal into an optical signal after looping it back and sends it to the light source module; Step 1.3, after the light source module receives the optical signal emitted by the optical module to be tested, it converts the optical signal into an electrical signal and transmits it to the bit error tester; In step 1.4, the bit error meter calculates the bit error rate of the optical module when it is working by sending and receiving electrical signals.

3. The method for testing radiation of an optical module monomer according to claim 2, characterized in that: An optical attenuator is arranged between the light source module and the optical module to be tested. In step 1.1, the optical signal sent by the light source module to the optical module to be tested is an optical signal attenuated by the optical attenuator; in step 1.2, the optical signal sent by the optical module to be tested to the light source module is also an optical signal attenuated by the optical attenuator.

4. The method for testing radiation of an optical module monomer according to claim 1, characterized in that: The shell of the EMC test tool is an electromagnetic shielding cover, and the interior of the EMC test tool is designed as a test board for self-looping of electrical signals.

5. The method for testing radiation of an optical module monomer according to claim 1, characterized in that: The method further includes placing the EMC test tool on a turntable, and during the test, driving the EMC test tool to rotate 360 ​​degrees via the turntable.

6. The method for testing radiation of an optical module monomer according to claim 1, characterized in that: The height of the EMC test tool from the ground is 0.8m, the height of the receiving antenna is between 1m and 1.5m, and the horizontal distance from the center of the optical module to be tested to the receiving antenna is 3m.

7. A test device for radiation of an optical module monomer, characterized in that: The device comprises: an EMC test tool, a bit error meter, an EMI receiver, a darkroom provided with absorbing materials, and a receiving antenna for receiving radiation signals. The optical module to be tested is inserted into the EMC test tool, and the EMC test tool and the receiving antenna are located in the darkroom provided with absorbing materials. The device is used to measure the bit error rate of the optical module to be tested when it is working. The receiving antenna is used to receive the radiation signal of the optical module to be tested when the bit error rate is within a preset range; the EMI receiver is used to determine the radiation performance of the optical module through the radiation signal.

8. The optical module monomer radiation testing device according to claim 7, characterized in that: A light source module is arranged between the bit error meter and the optical module to be measured, and the bit error rate of the optical module to be measured when working is measured by the following method; The bit error meter sends an electrical signal, and the light source module converts the electrical signal sent by the bit error meter into an optical signal and then sends it to the optical module to be tested; After receiving the optical signal, the optical module to be tested converts the received optical signal into an electrical signal and then converts it into an optical signal after looping the electrical signal and sends it to the light source module; After receiving the optical signal from the optical module to be tested, the light source module converts the optical signal into an electrical signal and transmits it to the bit error tester; The bit error meter calculates the bit error rate of the optical module when it is working by sending and receiving electrical signals; Among them, an optical attenuator is arranged between the light source module and the optical module to be tested. The optical signal sent by the light source module to the optical module to be tested is the optical signal attenuated by the optical attenuator; the optical signal sent by the optical module to be tested to the light source module is also the optical signal attenuated by the optical attenuator.

9. The optical module monomer radiation testing device according to claim 7, characterized in that: The shell of the EMC test tool is an electromagnetic shielding cover, the interior of the EMC test tool is designed as a test board for self-looping of electrical signals, the height of the EMC test tool from the ground is 0.8m, the height of the receiving antenna is between 1m and 1.5m, and the horizontal distance from the center of the optical module to be tested to the receiving antenna is 3m.

10. The optical module monomer radiation testing device according to claim 7, characterized in that: The device also includes a turntable, and the EMC test tool is placed on the turntable. During the test, the EMC test tool is driven by the turntable to rotate 360 ​​degrees.

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