Method, device and equipment for testing read-write performance of solid state disk in heve thermal mode and medium
By adjusting the overheating temperature information of the solid state hard disk and performing high-pressure read and write tests, the problem of difficulty in triggering and monitoring the heavy thermal throttling mode in the prior art is solved, and efficient and accurate performance testing is achieved, reducing costs.
Patent Information
- Application Number
- CN202411618622.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-13
- Publication Date
- 2025-03-04
AI Technical Summary
The existing solid-state drive testing methods are difficult to effectively trigger and monitor the heavy thermal throttling mode, and are costly.
By adjusting the minimum overheating temperature information of the SSD, it is easier to enter heavy thermal mode and perform high pressure read and write tests to evaluate performance.
It realizes rapid and accurate testing of the performance of SSDs in heavy thermal mode, reducing testing costs and improving testing flexibility and accuracy.
Smart Images
Figure CN119559993A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of solid state drive testing, and in particular to a method, device, equipment and medium for testing the read and write performance of a solid state drive in a heavy thermal mode. Background Art
[0002] During the data reading process of SSD (Solid state drive, hereinafter referred to as SSD), a series of actions will affect the performance of SSD, such as the thermal throttling mechanism in the firmware, the wear leveling mechanism and the firmware upgrade and downgrade.
[0003] Thermal Throttling of SSD is a protection mechanism adopted by the solid-state drive when the temperature is too high. It requires the hardware and firmware of the SSD to work together. When the SSD hardware reaches the specified threshold temperature, it will reduce the frequency to reduce performance and reduce heat. Its purpose is to enable the SSD to provide stable and reliable performance and prevent overheating from causing SSD damage, shortened life, data integrity problems, or performance remaining at an unexpectedly low level. If the SSD continues to heat up, it will also trigger a thermal shutdown. Through the trigger simulation of thermal throttling, you can find a balance between temperature, performance, and power consumption.
[0004] The general practice in the industry is to place the SSD and the test platform in a high-temperature incubator to increase the ambient temperature of the SSD, and then use a fixed read and write pattern to slowly increase the operating temperature of the SSD until it reaches the light and heavy trigger values in the thermal throttling mechanism inside the SSD firmware. After the trigger conditions are met, the SSD will be frequency-reduced to reduce the temperature of the SSD. However, this method is not flexible enough for triggering and monitoring heavy thermal throttling, and can only observe performance and temperature. It is not friendly to moving test equipment such as power consumption into a high-temperature incubator, and a high-temperature incubator is also a high cost. Summary of the invention
[0005] The embodiments of the present invention provide a method, device, equipment and medium for testing the read and write performance of a solid-state hard disk in heavy thermal mode, aiming to solve the problem that thermal throttling is difficult to trigger and is costly in existing solid-state hard disk testing.
[0006] In a first aspect, an embodiment of the present invention provides a method for testing the read and write performance of a solid state drive in heavy thermal mode, comprising:
[0007] Preparatory steps before testing the SSD to be tested;
[0008] Obtaining the minimum overheat temperature information preset in the controller of the solid state drive to be tested;
[0009] Adjusting the minimum overheat temperature information to preset easily-triggered overheat temperature information;
[0010] Performing a preset high-stress read-write test on the solid-state hard disk to be tested;
[0011] Obtaining performance data of the solid state drive to be tested during a high-pressure read and write test;
[0012] Determine whether to trigger the heavy thermal mode of the solid state drive to be tested;
[0013] If the heavy thermal mode of the solid state drive to be tested is triggered, it is determined whether the performance of the solid state drive to be tested in the heavy thermal mode meets the set requirements.
[0014] A further technical solution is that the preparation steps before testing the solid state drive to be tested include:
[0015] Performing secure erasure on the solid state hard disk to be tested;
[0016] Turn off the autonomous power state switching function of the solid state drive to be tested;
[0017] Turn off the fan of the solid state drive to be tested;
[0018] Set the read / write state of the solid state drive to be tested to PS0;
[0019] Obtain and save the default value of the host control overheating management and control strategy of the solid state drive to be tested.
[0020] A further technical solution is that the step of obtaining the minimum overheat temperature information preset in the controller of the solid state hard disk to be tested includes:
[0021] A mild overheating temperature setting value and a severe overheating temperature setting value preset in a controller of the solid state hard disk to be tested are obtained.
[0022] A further technical solution thereof is that the minimum overheat temperature information is adjusted to preset easily-triggered overheat temperature information;
[0023] Adjusting the mild overheating temperature setting value to a preset first easy-trigger temperature setting value;
[0024] Adjust the severe overheating temperature setting value to a preset second easy-trigger temperature setting value; wherein the second easy-trigger temperature setting value is 1°C greater than the first easy-trigger temperature setting value;
[0025] Determining whether the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective;
[0026] If the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are not effective, increase the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value by 1°C, and go to the step of determining whether the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are effective;
[0027] If the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective, proceed to the step of performing a preset high-stress read-write test on the solid state drive to be tested.
[0028] A further technical solution is that the adjusting the minimum overheating temperature information to the preset easily triggered overheating temperature information further includes:
[0029] Determine whether the setting times of the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are greater than a preset times threshold;
[0030] If the setting times of the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are greater than the preset times threshold, the test is ended.
[0031] A further technical solution is that the preset high-stress read-write test is performed on the solid state drive to be tested, including:
[0032] Use the FIO tool to initiate a preset high-stress sequential write test on the solid-state drive to be tested;
[0033] After the high-stress sequential write test is completed, turning on the fan of the solid state drive to be tested and leaving it idle for a preset time;
[0034] Use the FIO tool to initiate a preset high-stress sequential read test on the solid-state drive to be tested.
[0035] A further technical solution is that the step of obtaining the performance data of the solid state drive to be tested during a high-pressure read-write test includes:
[0036] The bandwidth data, temperature data and power consumption data of the solid state drive to be tested in the high-stress sequential write test and the high-stress sequential read test are obtained.
[0037] In a second aspect, an embodiment of the present invention further provides a device for testing the read and write performance of a solid state hard disk in heavy thermal mode, which includes a unit for executing the above method.
[0038] In a third aspect, an embodiment of the present invention further provides a computer device, which includes a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the above method when executing the computer program.
[0039] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium, wherein the storage medium stores a computer program, and the computer program can implement the above method when executed by a processor.
[0040] The embodiment of the present invention provides a method, device, equipment and medium for testing the read and write performance of a solid-state hard disk in heavy thermal mode. The method includes: a preparation step before testing the solid-state hard disk to be tested; obtaining the minimum overheat temperature information pre-set in the controller of the solid-state hard disk to be tested; adjusting the minimum overheat temperature information to the preset easy-to-trigger overheat temperature information; performing a preset high-pressure read and write test on the solid-state hard disk to be tested; obtaining the performance data of the solid-state hard disk to be tested during the high-pressure read and write test; judging whether to trigger the heavy thermal mode of the solid-state hard disk to be tested; if the heavy thermal mode of the solid-state hard disk to be tested is triggered, judging whether the performance of the solid-state hard disk to be tested in the heavy thermal mode meets the set requirements. It can be seen that by adjusting the minimum overheat temperature information in the heavy thermal mode of the solid-state hard disk to be tested, it is easier for the solid-state hard disk to be tested to enter the heavy thermal mode during the test, so that the performance of the solid-state hard disk to be tested in the heavy thermal mode can be accurately evaluated.
[0041] The method of the present invention can quickly and accurately test and verify, through a Shell script, whether the heavy thermal throttling mechanism in the firmware of the solid-state drive has an expected impact on the read and write performance of the SSD, whether heavy thermal throttling is triggered when the temperature of the SSD is too high, and whether the read and write performance after triggering is lower than the minimum required value, and has significant technical progress and application prospects. BRIEF DESCRIPTION OF THE DRAWINGS
[0042] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying any creative work.
[0043] Figure 1 A schematic diagram of a flow chart of a method for testing the read and write performance of a solid state drive in heavy thermal mode provided by an embodiment of the present invention;
[0044] Figure 2 Another schematic diagram of a flow chart of a method for testing the read and write performance of a solid state drive in heavy thermal mode provided by an embodiment of the present invention;
[0045] Figure 3 The performance evaluation diagram for sequential write from normal mode to heavy thermal temperature trigger is shown;
[0046] Figure 4 Performance evaluation of sequential reads from normal mode to heavy thermal temperature triggers
[0047] Figure 5 A schematic block diagram of a computer device provided in an embodiment of the present invention. DETAILED DESCRIPTION
[0048] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0049] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.
[0050] It should also be understood that the terms used in this specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.
[0051] It should be further understood that the term "and / or" used in the present description and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
[0052] As used in this specification and the appended claims, the term "if" may be interpreted as "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrases "if it is determined" or "if [described condition or event] is detected" may be interpreted as meaning "upon determination" or "in response to determining" or "upon detection of [described condition or event]" or "in response to detecting [described condition or event]," depending on the context.
[0053] See also Figure 1 Combined with Figure 2 , Figure 1 A schematic flow chart of a method for testing the read and write performance of a solid state drive in heavy thermal mode provided by an embodiment of the present invention. Figure 1 As shown, the method comprises the following steps:
[0054] S1, a preparation step before testing the solid state drive to be tested.
[0055] In a specific implementation, in order to smoothly carry out the test, it is necessary to carry out preparatory steps for the solid state drive to be tested before the test to ensure the accuracy of the subsequent test process.
[0056] For example, in one embodiment, the above step “preparation step before testing the solid state drive to be tested” specifically includes the following steps:
[0057] S11, securely erasing the solid state hard disk to be tested.
[0058] In a specific implementation, the solid-state hard disk to be tested is securely erased, that is, the data stored in the solid-state hard disk to be tested is deleted.
[0059] S12, disabling the autonomous power state switching function of the solid state drive to be tested.
[0060] In a specific implementation, the autonomous power state switching function of the solid state drive to be tested is turned off. The autonomous power state switching function is APST, which is the full name of autonomous power state transfer in English.
[0061] S13, turning off the fan of the solid state drive to be tested.
[0062] In a specific implementation, the fan of the solid state drive to be tested is turned off, so that the temperature rise rate of the solid state drive is accelerated during subsequent tests.
[0063] S14, setting the read / write state of the solid state hard disk to be tested to PS0.
[0064] In a specific implementation, the read / write state of the solid state drive to be tested is set to PS0. It should be noted that PS0 is an IO read / write power state that supports maximum power consumption.
[0065] S15, obtaining and saving a default value of the host-controlled overheating management and control strategy of the solid-state drive to be tested.
[0066] In a specific implementation, the default value of the host-controlled overheating management strategy of the solid state drive to be tested, that is, the default value of HCTM, is obtained and saved, wherein the full name of HCTM in English is Host Controlled Thermal Management, and the default value of HCTM is used as the reference value for subsequent temperature adjustment.
[0067] S2, obtaining the minimum overheat temperature information preset in the controller of the solid state drive to be tested.
[0068] In a specific implementation, the minimum overheat temperature information preset in the controller of the solid state drive to be tested, namely, MNTMT, is obtained. The full name of MNTMT in English is Minimum Thermal Management Temperature.
[0069] Specifically, a light thermal temperature setting value (TMT1) and a heavy thermal temperature setting value (TMT2) pre-set in the controller of the solid state drive to be tested are obtained, and TMT1 and TMT2 are converted into hexadecimal.
[0070] It can be understood that the mild overheating temperature setting value (TMT1) and the severe overheating temperature setting value (TMT2) preset in the controller of the solid state drive to be tested are in decimal and need to be converted into hexadecimal for calculation.
[0071] S3, adjusting the minimum overheating temperature information to preset easily-triggered overheating temperature information.
[0072] In a specific implementation, the minimum overheating temperature information is adjusted to preset easily triggered overheating temperature information, so that the heavy thermal mode of the solid state drive is more easily triggered.
[0073] For example, in one embodiment, the above step of “adjusting the mild overheating temperature setting value to a preset first easy-trigger temperature setting value” specifically includes the following steps:
[0074] S31, adjusting the mild overheating temperature setting value to a preset first easy-trigger temperature setting value.
[0075] In one embodiment, the mild overheating temperature setting value is adjusted to a preset first easy-trigger temperature setting value. For example, in one embodiment, the first easy-trigger temperature setting value is set to 0x12F(303)°C.
[0076] S32, adjusting the severe overheating temperature setting value to a preset second easy-to-trigger temperature setting value; wherein the second easy-to-trigger temperature setting value is 1°C greater than the first easy-to-trigger temperature setting value.
[0077] In one embodiment, the mild overheating temperature setting value is adjusted to a preset first easy-triggering temperature setting value. In this embodiment, the second easy-triggering temperature setting value is 1° C. greater than the first easy-triggering temperature setting value.
[0078] S33, determining whether the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are effective.
[0079] In a specific implementation, after the setting is completed, it is determined whether the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are normally effective.
[0080] S34, if the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are not effective, increase the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value by 1°C, and go to the step of determining whether the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are effective.
[0081] In a specific implementation, if the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are not effective, the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are increased by 1°C, and the process proceeds to the step of determining whether the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective.
[0082] Further, it is determined whether the setting times of the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are greater than a preset times threshold; if the setting times of the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are greater than the preset times threshold, the test is terminated, thereby avoiding the test being repeated in the temperature setting link and wasting time. At the same time, an error is reported to prompt the tester to come and handle it.
[0083] S35, if the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective, go to the step of performing a preset high-stress read-write test on the solid state drive to be tested.
[0084] In a specific implementation, if the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective, the process proceeds to the step of performing a preset high-stress read-write test on the solid-state hard disk to be tested.
[0085] S4, performing a preset high-stress read-write test on the solid state drive to be tested.
[0086] In a specific implementation, a preset high-stress read-write test is performed on the solid-state hard disk to be tested, so that the solid-state hard disk can quickly enter the heavy thermal mode, thereby testing the performance of the solid-state hard disk in the heavy thermal mode.
[0087] For example, in one embodiment, the above step of "performing a preset high-stress read-write test on the solid-state drive to be tested" specifically includes the following steps:
[0088] S41 uses the FIO tool to initiate a preset high-stress sequential write test on the solid state drive to be tested.
[0089] In the specific implementation, the FIO tool is used to initiate a preset high-pressure sequential write test on the solid-state drive to be tested. The test parameters are rw=write, bs=1M, Q=8, T=1, runtime=180s, size=1g, time_based, offset=10%. During the test, the bandwidth MB / s, Smart temperature and power consumption per second are collected. The stage corresponding to power consumption is named normal-2-heavy-power consumption; the stage corresponding to performance is named normal-2-heavy-performance, and the stage corresponding to temperature is named normal-2-heavy-Smart temperature; the action corresponds to sequential write.
[0090] Understandably, FIO is a commonly used SSD testing tool.
[0091] S42: After the high-stress sequential write test is completed, the fan of the solid state drive to be tested is turned on and left idle for a preset time.
[0092] In a specific implementation, after the high-stress sequential write test is completed, the fan of the solid state drive to be tested is turned on and left idle for a preset time. Specifically, the idle time is 5 minutes, which is not specifically limited in the present invention.
[0093] S43 uses the FIO tool to initiate a preset high-stress sequential read test on the solid state drive to be tested.
[0094] In a specific implementation, after the idle state ends, the FIO tool is used to initiate a preset high-stress sequential read test on the solid state drive to be tested.
[0095] S5, obtaining performance data of the solid state drive to be tested during a high-pressure read and write test.
[0096] In a specific implementation, the performance data of the solid state drive to be tested during a high-pressure read and write test is obtained.
[0097] Specifically, the bandwidth data, temperature data and power consumption data of the solid-state drive to be tested in the high-pressure sequential write test and the high-pressure sequential read test are obtained. For example, during the high-pressure sequential write test, the bandwidth MB / s, Smart temperature and power consumption per second are collected. The stage name corresponding to power consumption is normal-2-heavy-power consumption; the stage name corresponding to performance is normal-2-heavy-performance, and the stage name corresponding to temperature is normal-2-heavy-Smart temperature; the action corresponds to sequential write.
[0098] Further, a test chart is generated based on the collected performance data.
[0099] For example, see Figure 3-Figure 4 , Figure 3 The performance evaluation display effect diagram for sequential writing from normal mode to heavy thermal temperature trigger; Figure 4 The following graph shows the performance evaluation of sequential reads from normal mode to heavy thermal temperature trigger.
[0100] Furthermore, after the test is completed, the controller of the solid state drive to be tested is reset and left idle for 30 seconds to avoid affecting other test modules.
[0101] S6, determining whether to trigger the heavy thermal mode of the solid state drive to be tested.
[0102] In a specific implementation, it is determined whether the heavy thermal mode of the solid state drive to be tested is triggered, that is, whether the solid state drive to be tested enters the heavy thermal mode.
[0103] S7: If the heavy thermal mode of the solid state drive to be tested is triggered, determine whether the performance of the solid state drive to be tested in the heavy thermal mode meets the set requirements.
[0104] In a specific implementation, if the heavy thermal mode of the solid state drive to be tested is triggered, it is further determined whether the performance of the solid state drive to be tested in the heavy thermal mode meets the set requirements and meets the expectations set in advance, thereby reliably evaluating the performance of the solid state drive to be tested in the heavy thermal mode.
[0105] By applying the technical solution of the embodiment of the present invention, the preparation steps before testing the solid-state hard disk to be tested are performed; the minimum overheat temperature information pre-set in the controller of the solid-state hard disk to be tested is obtained; the minimum overheat temperature information is adjusted to the preset easy-to-trigger overheat temperature information; the solid-state hard disk to be tested is subjected to a preset high-pressure read-write test; the performance data of the solid-state hard disk to be tested during the high-pressure read-write test is obtained; it is determined whether the heavy thermal mode of the solid-state hard disk to be tested is triggered; if the heavy thermal mode of the solid-state hard disk to be tested is triggered, it is determined whether the performance of the solid-state hard disk to be tested in the heavy thermal mode meets the set requirements. It can be seen that by adjusting the minimum overheat temperature information in the heavy thermal mode of the solid-state hard disk to be tested, the solid-state hard disk to be tested can be more easily entered into the heavy thermal mode during the test, so that the performance of the solid-state hard disk to be tested in the heavy thermal mode can be accurately evaluated.
[0106] The method of the present invention can quickly and accurately test and verify, through a Shell script, whether the heavy thermal throttling mechanism in the firmware of the solid-state drive has an expected impact on the read and write performance of the SSD, whether heavy thermal throttling is triggered when the temperature of the SSD is too high, and whether the read and write performance after triggering is lower than the minimum required value, and has significant technical progress and application prospects.
[0107] Corresponding to the above-mentioned solid-state hard disk heavy thermal mode read-write performance test method, the present invention also provides a solid-state hard disk heavy thermal mode read-write performance test device. The solid-state hard disk heavy thermal mode read-write performance test device includes a unit for executing the above-mentioned solid-state hard disk heavy thermal mode read-write performance test method, and the solid-state hard disk heavy thermal mode read-write performance test device can be configured in a terminal such as a desktop computer, a tablet computer, and a laptop computer. Specifically, the solid-state hard disk heavy thermal mode read-write performance test device includes:
[0108] A preparation unit, used for performing preparation steps before testing the solid state drive to be tested;
[0109] A first acquisition unit, used to acquire minimum overheat temperature information preset in the controller of the solid state hard disk to be tested;
[0110] An adjustment unit, used for adjusting the minimum overheat temperature information to preset easily-triggered overheat temperature information;
[0111] A test unit, used for performing a preset high-stress read-write test on the solid-state hard disk to be tested;
[0112] Second, obtaining performance data of the solid state drive to be tested during a high-pressure read and write test;
[0113] A first judgment unit, used for judging whether to trigger the heavy thermal mode of the solid state hard disk to be tested;
[0114] The second judgment unit is used to judge whether the performance of the solid state hard disk to be tested in the heavy thermal mode meets the set requirements if the heavy thermal mode of the solid state hard disk to be tested is triggered.
[0115] In one embodiment, the preparation steps before testing the solid state drive to be tested include:
[0116] Performing secure erasure on the solid state hard disk to be tested;
[0117] Turn off the autonomous power state switching function of the solid state drive to be tested;
[0118] Turn off the fan of the solid state drive to be tested;
[0119] Set the read / write state of the solid state drive to be tested to PS0;
[0120] Obtain and save the default value of the host control overheating management and control strategy of the solid state drive to be tested.
[0121] In one embodiment, the step of obtaining the minimum overheat temperature information preset in the controller of the solid state drive to be tested includes:
[0122] A mild overheating temperature setting value and a severe overheating temperature setting value preset in a controller of the solid state hard disk to be tested are obtained.
[0123] In one embodiment, the adjusting the minimum overheat temperature information is adjusted to preset easily-triggered overheat temperature information;
[0124] Adjusting the mild overheating temperature setting value to a preset first easy-trigger temperature setting value;
[0125] Adjust the severe overheating temperature setting value to a preset second easy-trigger temperature setting value; wherein the second easy-trigger temperature setting value is 1°C greater than the first easy-trigger temperature setting value;
[0126] Determining whether the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective;
[0127] If the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are not effective, increase the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value by 1°C, and go to the step of determining whether the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are effective;
[0128] If the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective, proceed to the step of performing a preset high-stress read-write test on the solid state drive to be tested.
[0129] In one embodiment, the adjusting the minimum overheat temperature information to preset easy-to-trigger overheat temperature information further includes:
[0130] Determine whether the setting times of the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are greater than a preset times threshold;
[0131] If the setting times of the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are greater than the preset times threshold, the test is ended.
[0132] In one embodiment, performing a preset high-stress read-write test on the solid-state drive to be tested includes:
[0133] Use the FIO tool to initiate a preset high-stress sequential write test on the solid-state drive to be tested;
[0134] After the high-stress sequential write test is completed, turning on the fan of the solid state drive to be tested and leaving it idle for a preset time;
[0135] Use the FIO tool to initiate a preset high-stress sequential read test on the solid-state drive to be tested.
[0136] In one embodiment, obtaining the performance data of the solid state drive to be tested during a high-stress read-write test includes:
[0137] The bandwidth data, temperature data and power consumption data of the solid state drive to be tested in the high-stress sequential write test and the high-stress sequential read test are obtained.
[0138] It should be noted that technical personnel in the relevant field can clearly understand that the specific implementation process of the above-mentioned solid-state hard disk heavy thermal mode read and write performance test device and each unit can refer to the corresponding description in the aforementioned method embodiment, and for the convenience and conciseness of the description, it will not be repeated here.
[0139] The above-mentioned solid state hard disk heavy thermal mode read and write performance test device can be implemented in the form of a computer program. The computer program can be used in the following example: Figure 5Runs on the computer device shown.
[0140] See also Figure 5 , Figure 5 5 is a schematic block diagram of a computer device provided in an embodiment of the present application. The computer device 500 may be a terminal or a server, wherein the terminal may be an electronic device with communication functions such as a smart phone, a tablet computer, a laptop computer, a desktop computer, a personal digital assistant, and a wearable device. The server may be an independent server or a server cluster composed of multiple servers.
[0141] The computer device 500 includes a processor 502 , a memory, and a network interface 505 connected via a system bus 501 , wherein the memory may include a non-volatile storage medium 503 and an internal memory 504 .
[0142] The non-volatile storage medium 503 can store an operating system 5031 and a computer program 5032. When the computer program 5032 is executed, the processor 502 can execute a method for testing the read and write performance of a solid state hard disk in a heavy thermal mode.
[0143] The processor 502 is used to provide computing and control capabilities to support the operation of the entire computer device 500 .
[0144] The internal memory 504 provides an environment for the operation of the computer program 5032 in the non-volatile storage medium 503. When the computer program 5032 is executed by the processor 502, the processor 502 can execute a method for testing the read and write performance of a solid state hard disk in a heavy thermal mode.
[0145] The network interface 505 is used to communicate with other devices over the network. Those skilled in the art will appreciate that the above structure is only a block diagram of a portion of the structure related to the present application solution, and does not constitute a limitation on the computer device 500 to which the present application solution is applied. The specific computer device 500 may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.
[0146] The processor 502 is used to run a computer program 5032 stored in the memory to implement the steps of a method for testing the read and write performance of a solid state hard disk in heavy thermal mode provided in any of the above method embodiments.
[0147] It should be understood that in the embodiment of the present application, the processor 502 may be a central processing unit (CPU), and the processor 502 may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.
[0148] It is understood by those skilled in the art that all or part of the processes in the method for implementing the above embodiment can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a storage medium, which is a computer-readable storage medium. The computer program is executed by at least one processor in the computer system to implement the process steps of the embodiment of the above method.
[0149] Therefore, the present invention also provides a storage medium. The storage medium may be a computer-readable storage medium. The storage medium stores a computer program. When the computer program is executed by a processor, the processor executes the steps of a method for testing the read and write performance of a solid-state hard disk in heavy thermal mode provided in any of the above method embodiments.
[0150] The storage medium is a physical, non-transient storage medium, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a magnetic disk, or an optical disk, etc., which can store program codes. The computer-readable storage medium can be non-volatile or volatile.
[0151] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in terms of function in the above description. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.
[0152] In the several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of each unit is only a logical function division, and there may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.
[0153] The steps in the method of the embodiment of the present invention can be adjusted in order, combined and deleted according to actual needs. The units in the device of the embodiment of the present invention can be combined, divided and deleted according to actual needs. In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.
[0154] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, terminal, or network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention.
[0155] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0156] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.
[0157] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present invention, and these modifications or replacements should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.
Claims
1. A method for testing the read and write performance of a solid state drive in heavy thermal mode, characterized in that: include: Preparatory steps before testing the SSD to be tested; Obtaining the minimum overheat temperature information preset in the controller of the solid state drive to be tested; Adjusting the minimum overheat temperature information to preset easily-triggered overheat temperature information; Performing a preset high-stress read-write test on the solid-state hard disk to be tested; Obtaining performance data of the solid state drive to be tested during a high-pressure read and write test; Determine whether to trigger the heavy thermal mode of the solid state drive to be tested; If the heavy thermal mode of the solid state drive to be tested is triggered, it is determined whether the performance of the solid state drive to be tested in the heavy thermal mode meets the set requirements.
2. The method for testing the read and write performance of a solid state hard disk in heavy thermal mode according to claim 1, characterized in that: The preparation steps before testing the solid state drive to be tested include: Performing secure erasure on the solid state hard disk to be tested; Turn off the autonomous power state switching function of the solid state drive to be tested; Turn off the fan of the solid state drive to be tested; Set the read / write state of the solid state drive to be tested to PS0; Obtain and save the default value of the host control overheating management and control strategy of the solid state drive to be tested.
3. The method for testing the read and write performance of a solid state hard disk in heavy thermal mode according to claim 1, characterized in that: The step of obtaining the minimum overheat temperature information preset in the controller of the solid state hard disk to be tested includes: A mild overheating temperature setting value and a severe overheating temperature setting value preset in a controller of the solid state hard disk to be tested are obtained.
4. The method for testing the read and write performance of a solid state hard disk in heavy thermal mode according to claim 3, characterized in that: The adjusting the minimum overheat temperature information is adjusted to preset easy-to-trigger overheat temperature information; Adjusting the mild overheating temperature setting value to a preset first easy-trigger temperature setting value; Adjust the severe overheating temperature setting value to a preset second easy-trigger temperature setting value; wherein the second easy-trigger temperature setting value is 1°C greater than the first easy-trigger temperature setting value; Determining whether the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective; If the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are not effective, increase the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value by 1°C, and go to the step of determining whether the first easy-to-trigger temperature setting value and the second easy-to-trigger temperature setting value are effective; If the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are effective, proceed to the step of performing a preset high-stress read-write test on the solid state drive to be tested.
5. The method for testing the read and write performance of a solid state hard disk in heavy thermal mode according to claim 4, characterized in that: The step of adjusting the minimum overheat temperature information to preset easily triggerable overheat temperature information further includes: Determine whether the setting times of the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are greater than a preset times threshold; If the setting times of the first easy-trigger temperature setting value and the second easy-trigger temperature setting value are greater than the preset times threshold, the test is ended.
6. The method for testing the read and write performance of a solid state hard disk in heavy thermal mode according to claim 1, characterized in that: The step of performing a preset high-stress read-write test on the solid state drive to be tested includes: Use the FIO tool to initiate a preset high-stress sequential write test on the solid-state drive to be tested; After the high-stress sequential write test is completed, turning on the fan of the solid state drive to be tested and leaving it idle for a preset time; Use the FIO tool to initiate a preset high-stress sequential read test on the solid-state drive to be tested.
7. The method for testing the read / write performance of a solid state hard disk in heavy thermal mode according to claim 6, characterized in that: The obtaining of the performance data of the solid state drive to be tested during a high-pressure read and write test includes: The bandwidth data, temperature data and power consumption data of the solid state drive to be tested in the high-stress sequential write test and the high-stress sequential read test are obtained.
8. A solid state hard disk heavy thermal mode read and write performance test device, characterized in that: The method comprises a unit for executing the method according to any one of claims 1 to 7.
9. A computer device, characterized in that: The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the method according to any one of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 7 can be implemented.