Vacuum arc-extinguishing chamber dynamic on-off aging method based on multiple rebreakdown

Abstract

The invention provides a vacuum arc-extinguishing chamber dynamic on-off aging method based on multiple re-breakdown, and the method comprises the following steps: multiple re-breakdown continuously occurs on the surface of a contact in the on-off process, so that weak points on the surface of the contact are eliminated, and the gradual improvement of the medium recovery strength is realized; establishing a simulation platform to obtain breaking rebreakdown waveforms of the fracture at different rising times; building a dynamic on-off aging test platform of the vacuum arc-extinguishing chamber; and obtaining a vertex envelope line of the restrike waveform of the vacuum arc-extinguishing chamber at the moment after obtaining the restrike waveform. According to the vacuum arc-extinguishing chamber dynamic on-off aging method based on multiple restrike, aging of the vacuum circuit breaker can be completed by utilizing multiple restrike, and a withstand voltage recovery curve of the vacuum circuit breaker can be described through the breakdown voltage, so that the aging degree and the restrike resistance of the vacuum circuit breaker are evaluated; finally, the method can be used as a means for evaluating the anti-restrike performance of the vacuum circuit breaker.

Description

Technical Field

[0001] The invention relates to the technical field of vacuum circuit breakers, in particular to a dynamic breaking and aging method of a vacuum interrupter based on multiple re-breakdowns. Background Art

[0002] The insulation characteristics of vacuum circuit breakers have a great influence on the successful disconnection of capacitor banks to a certain extent, and the aging effect can greatly help improve the insulation performance of vacuum circuit breakers. It is a major process treatment measure to improve the voltage tolerance level of vacuum interrupters and stabilize them. For newly produced vacuum interrupters, they must be aged before leaving the factory to meet the use requirements. Most manufacturers use voltage aging technology. Traditional power frequency high voltage aging is to apply power frequency high voltage at both ends of the fracture to cause multiple spark discharges at the fracture. Due to the small discharge current, each discharge lasts about 500ns, the number of discharges is small and the distribution is uneven, and the aging effect is poor.

[0003] The use of high-frequency pulses to perform high-voltage discharge aging on a single arc extinguishing chamber has improved efficiency and effect compared with traditional spark discharge aging and low-current DC aging, but the test power supply is complex and is only suitable for static aging of arc extinguishing chambers before leaving the factory.

[0004] At present, the key technical issues such as parameter configuration of recovery voltage waveform during breaking and aging and evaluation of circuit breaker's anti-breakdown performance have not been studied at home and abroad. The current voltage aging is generally a static aging process, and it is impossible to formulate a corresponding aging plan according to the anti-breakdown performance of each arc extinguishing chamber, and it is even more impossible to quantitatively evaluate the anti-breakdown performance after aging. Summary of the invention

[0005] In view of the shortcomings of the prior art, the purpose of the present invention is to provide a dynamic breaking aging method for a vacuum interrupter based on multiple heavy breakdowns to solve the problems raised in the above-mentioned background technology. The present invention can synchronously obtain the dynamic breaking breakdown voltage curve of the vacuum circuit breaker, and based on this, a means for evaluating the anti-heavy breakdown performance of the vacuum circuit breaker can be obtained.

[0006] In order to achieve the above-mentioned purpose, the present invention is implemented through the following technical scheme: a dynamic breaking and aging method for a vacuum interrupter based on multiple re-breakdowns, the method comprising the following contents: multiple re-breakdowns continuously occur on the contact surface during the breaking process, thereby eliminating the weak points on the contact surface and realizing the gradual improvement of the dielectric recovery strength; building a simulation platform to obtain the breaking and re-breakdown waveforms under different rise times of the fracture; building a dynamic breaking and aging test platform for the vacuum interrupter; after obtaining the re-breakdown waveform, the vertex envelope of the re-breakdown waveform of the vacuum interrupter at this moment is obtained, and combined with the stroke curve, the cold medium recovery characteristic curve at this moment is obtained; the performance change trend of the vacuum interrupter is obtained through the obtained envelope.

[0007] Furthermore, the dynamic breakdown voltage of the circuit breaker is measured by applying a dynamic recovery voltage. During the circuit breaker opening process, a recovery voltage with a certain rise time is generated at both ends of the break. This dynamic recovery voltage application method is applied to the vacuum circuit breaker opening process.

[0008] Furthermore, it also includes a process of measuring the circuit of the circuit breaker dynamic breakdown voltage, which includes the following steps: the circuit breaker is in the open state before the test, and the energy storage capacitor C1 and the impulse divider C2 are charged with a DC high-voltage source. During the operation, the circuit breaker is closed-opened. After the closing operation is completed, the voltage across the impulse divider C2 drops to the minimum, and then the circuit breaker starts the opening operation.

[0009] Furthermore, the opening operation includes the following steps:

[0010] S1. When the circuit breaker contacts are separated, the experimental circuit breaker CB is open, and the energy storage capacitor C1 charges the impulse voltage divider C2 again, and the voltage across the impulse voltage divider C2 rises rapidly;

[0011] S2, when the voltage across the impulse voltage divider C2 is greater than the breakout voltage, the break breaks down, the impulse voltage divider C2 is short-circuited to the ground, and the voltage across the two ends drops rapidly;

[0012] S3. After the arc between the circuit breaker breaks is extinguished, the impulse voltage divider C2 is opened again, and the above process is repeated until the energy storage capacitor C1 charges the impulse voltage divider C2 and can no longer cause the break to break.

[0013] Furthermore, during the breaking process, when the fracture withstand voltage recovery strength is higher than the recovery voltage, the fracture does not undergo a restriking breakdown.

[0014] Furthermore, during the breaking process, when the break voltage is quickly charged to the recovery voltage and reaches the withstand voltage recovery strength, the break will be severely broken down. The break capacitance is very small and the arc is extinguished quickly. The break will be quickly charged to the recovery voltage again and will be severely broken down again when it reaches the withstand voltage recovery strength again.

[0015] Furthermore, the re-breakdown is repeated multiple times until the withstand voltage recovery strength exceeds the recovery voltage.

[0016] Furthermore, the performance of the arc extinguishing chamber at different times can be judged according to the rising speed of the vertex envelope of the vacuum arc extinguishing chamber. The faster the rising speed of the vertex envelope, the higher the curve, which indicates that the performance of the arc extinguishing chamber is better; otherwise, it indicates that the performance of the vacuum arc extinguishing chamber is worse.

[0017] Furthermore, the method also includes a special dynamic breaking test platform with adjustable rise time, in which a DC high-voltage power supply charges the energy storage capacitor Cs2 through a charging resistor Rs2, and a resistor divider FY2 is used to monitor the voltage of Cs2.

[0018] Furthermore, after the breaking circuit control switch GK2 is closed, the test circuit breaker SP is broken at no-load, and Cs2 charges the recovery voltage capacitor Ck through the recovery voltage regulating resistor R1 to form an exponentially rising recovery voltage. After each arc extinguishing of the break, Ck can quickly charge the break capacitor through the break charging resistor R2 to synchronize with the recovery voltage. When the insulation of the break is insufficiently recovered, multiple re-breakdowns will occur. The insulation of the break can be broken and aged by utilizing multiple re-breakdown discharges.

[0019] Beneficial effects of the present invention:

[0020] 1. The dynamic breaking aging method of vacuum interrupter based on multiple heavy breakdowns can not only use multiple heavy breakdowns to complete the aging of vacuum circuit breakers, but also describe the withstand voltage recovery curve of vacuum circuit breakers through breakdown voltage, and then evaluate the aging degree and heavy breakdown resistance performance of vacuum circuit breakers.

[0021] 2. The dynamic breaking aging method of vacuum interrupter based on multiple heavy breakdowns will have a better aging effect on the newly-produced vacuum interrupter. Combined with the above simulation analysis results, the subsequent test voltage is 40kV, which can not only obtain a better aging effect, but also will not cause damage to the vacuum interrupter.

[0022] 3. The dynamic breaking aging method of the vacuum interrupter based on multiple heavy strikes can also obtain the cold medium recovery characteristic curve of the vacuum interrupter in the later stage by combining the stroke curve. In addition, according to the rising speed of the vertex envelope of the vacuum interrupter, the performance of the interrupter at different times can also be judged. The faster the rising speed, that is, the higher the curve, the better the performance of the interrupter; conversely, the worse the performance of the vacuum interrupter. The envelope curve is improved after aging. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a schematic diagram of a dynamic breakdown voltage measurement circuit for an SF6 circuit breaker of the present invention;

[0024] Figure 2 This is a schematic diagram of the fracture re-breakdown principle of the breaking aging test of the present invention, wherein: (a): when the fracture withstand voltage recovery curve is higher than the recovery voltage, there is no re-breakdown; (b): when the fracture withstand voltage recovery curve is lower than the recovery voltage, there are multiple re-breakdowns;

[0025] Figure 3 To disconnect the aging test circuit in the embodiment of the present invention;

[0026] Figure 4This is a simplified circuit diagram in an embodiment of the present invention;

[0027] Figure 5 The waveforms of the breaking aging test simulation in the embodiment of the present invention are shown in Figure 1, wherein: (a): the recovery voltage rise time is 7ms; (b): the recovery voltage rise time is 3.5ms; (c): the recovery voltage rise time is about 1.8ms; (d): the recovery voltage rise time is about 1ms; (e): the recovery voltage rise time is about 0.5ms;

[0028] Figure 6 It is a typical waveform and vertex envelope curve diagram;

[0029] Figure 7 is a changing trend diagram of the number of re-breakdowns in an embodiment of the present invention;

[0030] Figure 8 4 is a comparison diagram of vertex envelopes in an embodiment of the present invention. DETAILED DESCRIPTION

[0031] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further explained below in conjunction with specific implementation methods.

[0032] See also Figures 1 to 8 The present invention provides the following technical solutions: a dynamic breaking and aging method for vacuum interrupter based on multiple re-strikes. The post-arc withstand voltage recovery process of vacuum circuit breaker refers to the process in which the gap of vacuum interrupter gradually recovers from the high conductive state during arcing to the high resistance insulation state after the current passes through zero and the arc is extinguished. The process of post-arc withstand voltage recovery is mainly divided into three stages. The initial stage of withstand voltage recovery is mainly based on the development of sheath. The enhanced field-induced electron emission of sheath and cathode surface mainly affects the early withstand voltage recovery speed. The main influencing factor in the middle stage of withstand voltage recovery is the diffusion and attenuation of metal vapor density, which is the key stage in the withstand voltage recovery process. The vacuum gap reaches full recovery to the static withstand voltage in the late stage of withstand voltage recovery.

[0033] In actual operation, both ends of the circuit breaker break will be affected by the transient recovery voltage (TRV). At this time, the gap withstand voltage recovery process is called the dynamic withstand voltage recovery process. In the withstand voltage recovery process, the vacuum gap is electrically broken down because the ion sheath is difficult to withstand the rapidly rising transient recovery voltage after the arc. Therefore, in the opening process of the vacuum circuit breaker, when the arc gap withstand voltage recovery speed after the arc current passes zero is continuously greater than the rising speed of the system transient recovery voltage, the opening is successful, otherwise a heavy breakdown will occur.

[0034] In this embodiment, a dynamic recovery voltage application method is used to measure the dynamic breakdown voltage of the SF6 circuit breaker. The principle is as follows: Figure 2As shown in the figure, during the breaking process, a recovery voltage with a certain rise time will be generated at both ends of the break. When this dynamic recovery voltage application method is applied to the breaking process of the vacuum circuit breaker, from one perspective, multiple break re-break phenomena can occur during the breaking process. In this case, a certain number of re-break discharges can be used to perform multiple high-voltage aging treatments on the contacts at different opening distances; from another perspective, the voltage value of the re-break during the breaking process reflects the withstand voltage recovery characteristics of the vacuum circuit breaker. If no re-breakdown occurs at a certain recovery voltage rise rate and a certain voltage value, that is, the anti-re-breakdown performance of the vacuum circuit breaker exceeds this voltage rise rate and voltage value, this directly reflects the anti-re-breakdown performance of the vacuum circuit breaker. Therefore, this breaking method can not only use multiple re-breakdowns to complete the aging of the vacuum circuit breaker, but also use the breakdown voltage to depict the withstand voltage recovery curve of the vacuum circuit breaker, and then evaluate the aging degree and anti-re-breakdown performance of the vacuum circuit breaker.

[0035] Before the test, the circuit breaker is in the open state, and the DC high voltage source is used to charge the energy storage capacitor C1 and the impulse voltage divider C2. During the test, the circuit breaker performs a closing-opening operation. After the closing operation is completed, the voltage across C2 drops to the minimum, and then the circuit breaker starts the opening operation. During the opening process:

[0036] 1. When the circuit breaker contacts are separated, CB is open, the energy storage capacitor C1 charges C2 again, and the voltage across C2 rises rapidly.

[0037] 2. When the voltage across C2 is greater than the breakdown voltage of the fracture, the fracture breaks down, C2 is short-circuited to ground, and the voltage across the two ends drops rapidly.

[0038] 3. After the arc between the circuit breaker breaks is extinguished, C2 is opened again, and the above process is repeated until C1 charges C2 and can no longer cause the break to break.

[0039] When breaking capacitor banks, the re-breakdown phenomenon often occurs under short arcing conditions, when the breaking current is small (about 400A), the arc duration is short (less than 1ms), and the arc energy is very low, which is very close to no-load breaking. The method of applying dynamic recovery voltage during dynamic breaking simulates the most severe conditions of actual breaking and facilitates horizontal comparison of circuit breaker breaking performance.

[0040] Figure 2 The red part is the transient recovery voltage of the fracture, and the black part is the withstand voltage recovery strength. During the breaking process of the test piece, when the withstand voltage recovery strength of the fracture is higher than the recovery voltage, the fracture will not be re-broken. Figure 2(a) As shown. During the breaking process of the test piece, when the break voltage is quickly charged to the recovery voltage and reaches the withstand voltage recovery strength, the break will be re-breakdown. The break capacitance is very small and the arc is extinguished quickly. The break will be quickly charged to the recovery voltage again and will be re-breakdown again when the withstand voltage recovery strength is reached again. This re-breakdown will be repeated many times until the withstand voltage recovery strength exceeds the recovery voltage. Figure 2 (b) as shown.

[0041] This embodiment also provides a simulation and experimental process based on the above method, which specifically includes the following contents:

[0042] (1) Basic principles of dynamic breaking test platform

[0043] According to the preliminary research of the project and the principle diagram of the dynamic breakdown voltage measurement circuit of the SF6 circuit breaker, a special dynamic breaking test platform with adjustable rise time is designed. Figure 3 As shown. The DC high-voltage power supply charges the energy storage capacitor Cs2 through the charging resistor Rs2, and the resistor divider FY2 is used to monitor the voltage of Cs2. After the breaking circuit control switch GK2 is closed, the test circuit breaker SP is disconnected without load. Cs2 charges the recovery voltage capacitor Ck through the recovery voltage adjustment resistor R1 to form an exponentially rising recovery voltage. After each arc extinguishing of the break, Ck can quickly charge the break capacitor through the break charging resistor R2 to synchronize with the recovery voltage. When the insulation of the break is not fully recovered, multiple re-breakdowns will occur. The insulation of the break can be broken and aged by using multiple re-breakdown discharges. The multiple re-breakdown voltage curve can also represent the withstand voltage recovery capability of the SP capacitor group with small current and zero arcing time, which is used to quantitatively evaluate the anti-re-breakdown performance. The resistor-capacitor dividers FY3 and FY4 are used to measure the recovery voltage and the break voltage waveform respectively, and the metal oxide voltage limiter MOA is used to limit the overvoltage generated by the test abnormality.

[0044] During the break voltage recovery process, R2 is used to restore the voltage capacitor Ck to charge the break in a non-oscillating manner and quickly apply the recovery voltage. During the break re-breakdown process, R2 can limit the discharge current of Ck to the break, which can not only reduce the energy injection of the re-breakdown arc to facilitate the rapid arc extinguishing of the break, but also reduce the amplitude of the instantaneous reduction of the recovery voltage during the re-breakdown process. According to the current carrying and breaking capacity of the vacuum circuit breaker contacts, during the re-breakdown process, the arc will not damage the contacts, the break can extinguish the arc within a few microseconds, and the recovery voltage will be instantly lowered. The higher the re-breakdown voltage, the longer the arc extinguishing time, and the greater the amplitude of the instantaneous reduction of the recovery voltage. Figure 3 After simplification, we can get Figure 4 The circuit shown.

[0045] After Laplace transformation, the recovery voltage equation applied by the moving and static contacts at both ends of the break during the breaking process can be obtained:

[0046]

[0047] According to the fact that Cs2 is much larger than Ck, and Ck is much larger than the sum of the circuit breaker capacitance and the arrester capacitance, the influence of the above capacitance and its voltage change on the recovery voltage during the breaking and aging process can be minimized. Then, formula (3-2) can be obtained:

[0048]

[0049] After the inverse Laplace transform, the recovery voltage between the fractures is obtained as follows:

[0050]

[0051] (2) Analysis of simulation results

[0052] Based on the TRV waveform of the capacitor bank current breaking type test in GB1984, the parameters are increased and the fracture withstand voltage recovery curve is assumed to be During the heavy breakdown process of the breaking, it is assumed that the breaking current decays to a very small value before the arc is extinguished. Figure 5 As shown, the blue is the vacuum interrupter withstand voltage recovery curve, and the red is the actual voltage curve of the break.

[0053] From the simulation results, it can be seen that the slower the recovery voltage rises, the less likely it is that a high potential area will be re-breakdowned; the faster the recovery voltage rises, the more likely it is that a high potential area will be re-breakdowned; and as the number and duration of re-breakdowns increase, the maximum re-breakdown voltage also increases.

[0054] When the rise time is 0.5ms, after the re-breakdown of the fracture occurs, the fracture capacitor is quickly short-circuited and discharged, and the recovery voltage is also instantly pulled down. The energy of the fracture discharge arc is very small and the arc is quickly extinguished. The fracture voltage is quickly charged to the recovery voltage and rises exponentially. In addition, the re-breakdown voltage of the fracture will also increase. The more re-breakdown times there are, the greater the amplitude of the reduction of the recovery voltage.

[0055] The initial performance of the finished 12kV vacuum interrupter after leaving the factory is low, the withstand voltage level is insufficient, and the number of re-breakdowns during breaking is high, so this method will have a better aging effect on the newly shipped vacuum interrupter. Combined with the above simulation analysis results, the subsequent test voltage is 40kV, which can not only obtain a better aging effect, but also will not cause damage to the vacuum interrupter.

[0056] (3) Experimental results

[0057] When the breaking speed is 0.89m / s, as the contacts are continuously pulled apart, multiple re-breakthroughs will occur between the fractures, thereby obtaining a continuous multiple spark aging effect.

[0058] For the convenience of statistics, in this embodiment, five breaking tests are used as one round, and the heavy breakdown area with a breakdown voltage greater than 15kV is called the high potential area heavy breakdown area, and the number of heavy breakdowns is the total number of breakdowns in the high potential area. Figure 7 The changing trend of the number of restrikes after 10 rounds of k-breaking aging is shown. The test results show that during the test, the number of restrikes of the vacuum interrupter gradually decreased with the increase of the number of breaking times, from the initial 34 times to the final 23 times, and the power frequency withstand voltage increased from the initial 52kV to 60kV, which played a certain breaking aging effect.

[0059] In addition, the cold medium recovery characteristic curve of the vacuum interrupter can be obtained by combining the stroke curve later. In addition, according to the rising speed of the vertex envelope of the vacuum interrupter, the performance of the interrupter at different times can also be judged. The faster the rising speed, that is, the higher the curve, the better the performance of the interrupter; conversely, the worse the performance of the vacuum interrupter. Figure 8 As shown, the envelope curve is improved after aging.

[0060] It can be seen from the above embodiments that

[0061] 1) A simulation model is built in the dynamic breaking and aging method provided by the present invention. By studying the breaking and re-breakdown waveforms under different rise times, it is found that the faster the rise time, the more breaking and re-breakdown times of the vacuum interrupter, and the greater the maximum re-breakdown voltage.

[0062] 2) An experimental platform was built. During the breaking process, the multiple re-breakthrough phenomena will produce multiple continuous electric sparks, which will play the role of dynamic breaking aging. After the aging is completed, the number of re-breakthroughs is reduced and the withstand voltage is improved.

[0063] 3) According to the actual breaking waveform of the vacuum interrupter, the peak envelope of the heavy breakdown waveform can be obtained. Combined with the breaking stroke curve, the cold medium recovery curve of the interrupter can be obtained. And according to the speed of the envelope rise time, the performance of the interrupter can also be analyzed. The envelope has also been significantly improved after aging.

[0064] The basic principles and main features of the present invention and the advantages of the present invention are shown and described above. For those skilled in the art, it is obvious that the present invention is not limited to the details of the above exemplary embodiments, and the present invention can be implemented in other specific forms without departing from the spirit or basic characteristics of the present invention.

[0065] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A dynamic breaking and aging method for vacuum interrupter based on multiple re-breakdowns, characterized in that: The method includes the following contents: multiple re-breakdowns occur continuously on the contact surface during the breaking process, thereby eliminating the weak points on the contact surface and realizing the gradual improvement of the dielectric recovery strength; building a simulation platform to obtain the breaking re-breakdown waveforms under different rise times of the fracture; building a dynamic breaking and aging test platform for the vacuum interrupter; after obtaining the re-breakdown waveform, the vertex envelope of the re-breakdown waveform of the vacuum interrupter at this moment is obtained, and combined with the stroke curve, the cold-state dielectric recovery characteristic curve at this moment is obtained; and the performance change trend of the vacuum interrupter is obtained through the obtained envelope.

2. A vacuum interrupter dynamic breaking aging method based on multiple re-breakdowns according to claim 1, characterized in that: The dynamic breakdown voltage of the circuit breaker is measured by applying a dynamic recovery voltage. During the circuit breaker opening process, a recovery voltage with a certain rise time is generated at both ends of the break. This dynamic recovery voltage application method is applied to the vacuum circuit breaker opening process.

3. A vacuum interrupter dynamic breaking aging method based on multiple re-breakdowns according to claim 1, characterized in that: It also includes a process for measuring the dynamic breakdown voltage circuit of the circuit breaker, which includes the following steps: the circuit breaker is in an open state before the test, and a DC high-voltage source is used to charge the energy storage capacitor C1 and the impulse divider C2. During the operation, the circuit breaker is closed and opened. After the closing operation is completed, the voltage across the impulse divider C2 drops to the minimum, and then the circuit breaker starts the opening operation.

4. A vacuum interrupter dynamic breaking aging method based on multiple re-breakdowns according to claim 3, characterized in that: The opening operation comprises the following steps: S1. When the circuit breaker contacts are separated, the experimental circuit breaker CB is open, and the energy storage capacitor C1 charges the impulse voltage divider C2 again, and the voltage across the impulse voltage divider C2 rises rapidly; S2, when the voltage across the impulse voltage divider C2 is greater than the breakout voltage, the break breaks down, the impulse voltage divider C2 is short-circuited to the ground, and the voltage across the two ends drops rapidly; S3. After the arc between the circuit breaker breaks is extinguished, the impulse voltage divider C2 is opened again, and the above process is repeated until the energy storage capacitor C1 charges the impulse voltage divider C2 and can no longer cause the break to break.

5. A vacuum interrupter dynamic breaking aging method based on multiple re-breakdowns according to claim 4, characterized in that: During the breaking process, when the fracture withstand voltage recovery strength is higher than the recovery voltage, the fracture will not be re-breakdown.

6. A vacuum interrupter dynamic breaking aging method based on multiple re-breakdowns according to claim 5, characterized in that: During the breaking process, when the break voltage is quickly charged to the recovery voltage and reaches the withstand voltage recovery strength, the break will be severely broken down. The break capacitance is very small and the arc is extinguished quickly. The break will be quickly charged to the recovery voltage again and will be severely broken down again when it reaches the withstand voltage recovery strength again.

7. A vacuum interrupter dynamic breaking aging method based on multiple re-breakdowns according to claim 6, characterized in that: Repeat the re-breakdown several times until the voltage recovery strength exceeds the recovery voltage.

8. The method for dynamic breaking and aging of vacuum interrupter based on multiple re-breakdowns according to claim 1 is characterized in that: The performance of the arc extinguishing chamber at different times can be judged according to the rising speed of the vertex envelope of the vacuum arc extinguishing chamber. The faster the rising speed of the vertex envelope, the higher the curve, which means the better the performance of the arc extinguishing chamber; otherwise, it means the worse the performance of the vacuum arc extinguishing chamber.

9. The vacuum interrupter dynamic breaking aging method based on multiple re-breakdowns according to claim 1 is characterized in that: The method also includes a special dynamic breaking test platform with adjustable rise time, in which a DC high voltage power supply charges the energy storage capacitor Cs2 through a charging resistor Rs2, and a resistor divider FY2 is used to monitor the voltage of Cs2.

10. A vacuum interrupter dynamic breaking aging method based on multiple re-breakdowns according to claim 9, characterized in that: After the breaking circuit control switch GK2 is closed, the test circuit breaker SP is broken without load. Cs2 charges the recovery voltage capacitor Ck through the recovery voltage regulating resistor R1 to form an exponentially rising recovery voltage. After each arc extinguishing of the break, Ck can quickly charge the break capacitor through the break charging resistor R2 to synchronize with the recovery voltage. When the insulation of the break is insufficiently recovered, multiple re-breakdowns will occur. The insulation of the break can be broken and aged by using multiple re-breakdown discharges.

Images