Test fixture, power supply test system, method, equipment and medium

Abstract

The invention provides a test fixture, a power supply test system, method, device and medium, the test fixture comprises a communication module connected with a processor module, the processor module is respectively connected with a data acquisition module, a capacitor bank module and a simulation module, a capacitor bank is connected with the simulation module, and the simulation module is connected with the communication module. And the data acquisition module is connected with the simulation module. Through the constructed test fixture, the to-be-tested power supply can be connected to an analog circuit with a variable test environment, the to-be-tested power supply in different environments can be tested, and the dynamic performance of the to-be-tested power supply can be tested by connecting the to-be-tested power supply to the analog circuit and electrifying the to-be-tested power supply.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to a testing fixture, a power supply testing system, a method, a device and a medium. Background Art

[0002] In the actual process of testing the power supply, the test environment is often built artificially. For example, an oscilloscope is needed to monitor the signal waveform, a power meter is used to read the power supply power, and a current gun is used to capture the output current of the power supply. The tester then judges whether the power supply function is normal based on the waveform and data, and finally outputs the test results. This process requires a lot of manpower.

[0003] At the same time, for different types of power supplies, it is necessary to design multiple test fixtures with different interfaces for replacement during testing. The test fixtures have low versatility, and different test fixtures need to be replaced to test different power supplies, resulting in a waste of testing costs. In addition, when the test requirements change, it is more troublesome to update the test fixtures.

[0004] Therefore, in view of the shortcomings of the prior art solutions, the present invention provides a test fixture, a power supply test system, a method, a device and a medium. Summary of the invention

[0005] Based on this, it is necessary to provide a test fixture, a power supply test system, a method, a device and a medium to address the above technical problems.

[0006] In a first aspect, a test fixture is provided, the test fixture comprising a communication module, a processor module, a data acquisition module, an analog module, a capacitor group module and a conversion module; the communication module is connected to the processor module, the processor module is respectively connected to the data acquisition module, the capacitor group module and the analog module, the capacitor group is connected to the analog module, and the data acquisition module is connected to the analog module; wherein:

[0007] The communication module is used to transmit test instructions and test results;

[0008] The processor module is used to process the test instructions and test data;

[0009] The data acquisition module is used to collect the test data generated by the simulation module and transmit it to the processor module;

[0010] The simulation module is connected to the capacitor group module and is used to simulate circuits corresponding to different power supply types;

[0011] The capacitor bank module is used to dynamically adjust the capacitance value of the circuit formed with the analog module;

[0012] The conversion module is used to connect different types of power supplies to be tested.

[0013] Optionally, the conversion module is detachably connected to the test fixture, and the conversion module includes a first connection port and a second connection port;

[0014] The interface of the power supply to be tested is connected to the first connection port of the conversion module;

[0015] The second connection port of the conversion module is connected to the test fixture.

[0016] Optionally, the test fixture further includes an alarm module and / or a protection circuit module;

[0017] The alarm module includes a plurality of alarm lights, one alarm light corresponds to a collection position of test data;

[0018] The protection circuit module is connected to the processor module and / or the data acquisition module in the test fixture.

[0019] In a second aspect, a power supply test system is provided, the power supply test system comprising a test fixture and a host computer; wherein:

[0020] The test fixture is connected to the host computer via a communication module;

[0021] The test fixture is connected to the power supply to be tested through a conversion module.

[0022] In a third aspect, a power supply testing method is provided, the method comprising: determining configuration information and test items of a power supply to be tested in the test instruction according to a test instruction received from a host computer;

[0023] Determine the configuration information of the analog module and the capacitor group module in the test fixture according to the configuration information of the power supply to be tested;

[0024] According to the configuration information of the analog module and the capacitor group module, configure the analog module and the capacitor group module in the test fixture;

[0025] Powering on the power supply to be tested, and running a test circuit in the test fixture, wherein the test circuit includes the power supply to be tested, the simulation module, and the capacitor group module;

[0026] According to the test items, test data is collected from the test circuit, and the test data is analyzed to obtain a test result of the power supply to be tested.

[0027] Optionally, after powering on the power supply to be tested and running the test circuit in the test fixture, the method further includes:

[0028] collecting the voltage of the test circuit;

[0029] Comparing the voltage with the configuration information of the power supply to be tested to determine whether the voltage is the same as the voltage in the configuration information;

[0030] If they are not the same, stop running the test circuit in the test fixture and send an error prompt to the host computer;

[0031] If they are the same, continue to run the test circuit in the test fixture.

[0032] Optionally, collecting test data from the test circuit according to the test item, analyzing the test data, and obtaining a test result of the power supply to be tested includes:

[0033] According to the test item, determine to collect circuit data of the test circuit, collect signal data of the power supply to be tested in operation, or collect register data of the power supply to be tested in operation;

[0034] The circuit data, the signal data or the register data are analyzed to obtain a test result of the power supply to be tested.

[0035] Optionally, collecting test data from the test circuit according to the test item, analyzing the test data, and obtaining a test result of the power supply to be tested includes:

[0036] Determine a test type according to the test item, wherein the test type includes a signal test, a timing test, and a register reading test;

[0037] When the test instruction is a signal test, within a first preset time, the signal parameters of the signal of the power supply to be tested are collected multiple times, the characteristic values ​​of the signal parameters are screened out, and it is determined whether the characteristic values ​​are within a first preset range to obtain the test result of the power supply to be tested;

[0038] When the test instruction is a timing test, within a second preset time, the signal of the power supply to be tested is collected multiple times, each signal is converted into a digital signal, the level change of the digital signal is recorded, the time interval of the level change is calculated, and it is determined whether the time interval is within a second preset range to obtain the test result of the power supply to be tested;

[0039] When the test instruction is a register read value test, a write or read operation is performed on the register of the power supply to be tested, a return value of the power supply to be tested is collected, and it is determined whether the return value is consistent with an expected value to obtain a test result of the power supply to be tested.

[0040] In a fourth aspect, a computer device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the following steps when executing the computer program: determining configuration information and test items of a power supply to be tested in the test instruction according to a test instruction received from a host computer;

[0041] Determine the configuration information of the analog module and the capacitor group module in the test fixture according to the configuration information of the power supply to be tested;

[0042] According to the configuration information of the analog module and the capacitor group module, configure the analog module and the capacitor group module in the test fixture;

[0043] Powering on the power supply to be tested, and running a test circuit in the test fixture, wherein the test circuit includes the power supply to be tested, the simulation module, and the capacitor group module;

[0044] According to the test items, test data is collected from the test circuit, and the test data is analyzed to obtain a test result of the power supply to be tested.

[0045] In a fifth aspect, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented: according to a test instruction received from a host computer, configuration information and test items of a power supply to be tested in the test instruction are determined;

[0046] Determine the configuration information of the analog module and the capacitor group module in the test fixture according to the configuration information of the power supply to be tested;

[0047] According to the configuration information of the analog module and the capacitor group module, configure the analog module and the capacitor group module in the test fixture;

[0048] Powering on the power supply to be tested, and running a test circuit in the test fixture, wherein the test circuit includes the power supply to be tested, the simulation module, and the capacitor group module;

[0049] According to the test items, test data is collected from the test circuit, and the test data is analyzed to obtain a test result of the power supply to be tested.

[0050] The above-mentioned test fixture, power supply test system, method, equipment and medium, the test fixture includes a communication module, a processor module, a data acquisition module, an analog module, a capacitor group module and a conversion module; the communication module is connected to the processor module, the processor module is respectively connected to the data acquisition module, the capacitor group module and the analog module, the capacitor group is connected to the analog module, and the data acquisition module is connected to the analog module; in this way, the test fixture is connected to the test power interface using the corresponding conversion module, and various types of power supplies can be used uniformly on the same test fixture, and the entire test fixture is no longer frequently replaced. In addition, the test fixture is matched with a host computer to automatically test the software function and hardware function of the power supply to be tested, and judge the test results, thereby saving manpower while improving test efficiency. In addition, different test environments can be constructed through the analog module and the capacitor group module, making the test range more comprehensive. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] Figure 1 A structural block diagram of a test fixture in an embodiment;

[0052] Figure 2 is a schematic diagram of the overall structure of a power supply test system in one embodiment;

[0053] Figure 3 A schematic diagram of a power supply testing method according to an embodiment of the present invention;

[0054] Figure 4 A schematic diagram of a test item execution flow of a power supply testing method in an embodiment;

[0055] Figure 5 A schematic diagram of a test flow of a power supply test method in one embodiment;

[0056] Figure 6 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0057] In order to make the purpose, technical solutions and advantages of this application clearer, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the drawings in the embodiments of this application. Obviously, the described embodiments are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0058] It should be understood that in the description of the present application, unless the context clearly requires otherwise, words such as "include", "comprises", and the like throughout the specification should be interpreted as including rather than being exclusive or exhaustive; that is, as including but not limited to.

[0059] It should also be understood that the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. In addition, in the description of this application, unless otherwise specified, "plurality" means two or more.

[0060] It should be noted that the terms "S1", "S2", etc. are only used for the purpose of describing the steps, and do not specifically refer to the order or sequence, nor are they used to limit the present application. They are only for the convenience of describing the method of the present application, and cannot be understood as indicating the order of the steps. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in this field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection required by the present application.

[0061] In one embodiment, Figure 1 As shown, a test fixture is provided, the test fixture includes a communication module, a processor module, a data acquisition module, an analog module, a capacitor group module and a conversion module; the communication module is connected to the processor module, the processor module is respectively connected to the data acquisition module, the capacitor group module and the analog module, the capacitor group is connected to the analog module, the data acquisition module is connected to the analog module, wherein;

[0062] The communication module is used to transmit test instructions and test results;

[0063] The processor module is used to process the test instructions and test data;

[0064] The data acquisition module is used to collect the test data generated by the simulation module and transmit it to the processor module;

[0065] The simulation module is connected to the capacitor group module and is used to simulate circuits corresponding to different power supply types;

[0066] The capacitor bank module is used to dynamically adjust the capacitance value of the circuit formed with the analog module;

[0067] The conversion module is used to connect different types of power supplies to be tested.

[0068] In the above implementation, by constructing a test fixture, the power supply to be tested can be connected to an analog circuit with a variable test environment, the power supply to be tested in different environments can be tested, and the dynamic performance of the power supply to be tested can be tested by connecting the power supply to the analog circuit and powering on it.

[0069] In some specific embodiments, the conversion module is detachably connected to the test fixture, and the conversion module includes a first connection port and a second connection port;

[0070] The interface of the power supply to be tested is connected to the first connection port of the conversion module;

[0071] The second connection port of the conversion module is connected to the test fixture.

[0072] Here, the interface of the power supply to be tested may be a gold finger, which is a special design on a circuit board and is used to be inserted into an expansion slot or a connector to achieve electrical connection between circuit boards.

[0073] Among them, since the interfaces of different power supplies to be tested are different, the first connection port of each conversion module is different, and since the second connection port is connected to the same test fixture, the second connection port of each conversion module is the same.

[0074] Specifically, according to the gold finger of the power supply to be tested, a connection port matching therewith is determined, and according to the connection port, a corresponding conversion module is determined, and the power supply to be tested is connected to the test fixture through the conversion module.

[0075] In this way, by using the corresponding conversion module to connect to the test fixture through the power supply interface to be tested, different types of power supplies can be used uniformly on the same test fixture, without the need to frequently replace the entire test fixture, thereby improving the utilization rate of the test fixture and saving the cost of redesigning the test fixture.

[0076] In some specific implementations, the test fixture further includes an alarm module and / or a protection circuit module;

[0077] The alarm module includes a plurality of alarm lights, one alarm light corresponds to a collection position of test data;

[0078] The protection circuit module is connected to the processor module and / or the data acquisition module in the test fixture.

[0079] Here, warning lights are arranged on the test fixture, and each warning light corresponds to an important register state and small signal state inside the power supply under test.

[0080] Specifically, under normal power-on conditions, the alarm module remains always on. When the processor module determines that the small signal or register being tested is abnormal, the corresponding alarm light will flash to indicate the location of the fault.

[0081] In this way, through the alarm module, the location of abnormal data can be directly displayed and located, which is convenient for troubleshooting. The protection circuit module can prevent damage to components caused by instantaneous large currents caused by unexpected situations such as overcurrent and short circuit, and isolate and protect the main key components.

[0082] In some specific implementations, the test fixture further includes: a normalization module;

[0083] One side of the normalization module is connected to the data acquisition module, and the other side is connected to the processor module;

[0084] The normalization module is used to convert test data of different configurations into data within a standard range.

[0085] Here, the normalization module can process the test data generated by power supplies of different configurations in different simulation modules to obtain data within a unified standard range.

[0086] In this way, by normalizing the data of the power supplies to be tested with different configurations, it is possible to prevent the obtained data from being too large or too small, thereby facilitating the processor module to process the data.

[0087] In one embodiment, Figure 2 As shown, a power supply test system is provided, the system comprising a test fixture and a host computer, wherein:

[0088] The test fixture is connected to the host computer via a communication module;

[0089] The test fixture is connected to the power supply to be tested through a conversion module.

[0090] Specifically, Figure 2 As shown, the overall structure includes: a host computer, a communication unit, a single-chip minimum system (i.e., a processor module), an alarm unit, a data acquisition module, a simulation device, a capacitor group unit, a switching module, and a PSU.

[0091] Specifically, the host computer is used to select the test items. Depending on the test items, the corresponding capacitor capacity can be selected, and the single power supply mode or dual power supply mode can be selected to monitor the important registers and small signals of the two power supplies at the same time. And the test power supply type can be selected, using 54V circuit or 12V circuit.

[0092] Specifically, the communication unit is used to interact with the host computer through the communication interface, can receive host computer instructions and then pass them to the microcontroller minimum system, and can also transmit data determination test data and test results to the host computer from the communication interface of the test fixture.

[0093] Specifically, the single-chip microcomputer minimum system (i.e., the processor module) is used to process the test data;

[0094] Specifically, the alarm unit is composed of warning lights, which are arranged on the test fixture and represent the important register status and small signal status inside the power supply. They remain on under normal power-on conditions. When the microcontroller determines that the tested small signal or register is abnormal, the corresponding warning light will flash to indicate that a fault has occurred.

[0095] Specifically, the data acquisition unit is composed of a digital-to-analog conversion module, various sensors, filtering circuits and other parts. After the power is powered on, the data acquisition unit is used to collect small signals from the power module and the internal register information of the power module. The output current and output voltage of the power module can also be collected through sensors.

[0096] Specifically, the simulation device (i.e., the simulation module) is used to simulate the circuit of the server mainboard. For example, circuits of different voltages such as a 54V circuit and a 12V circuit can be simulated.

[0097] Specifically, the capacitor group unit is composed of a plurality of capacitor groups of different capacities connected in parallel. Under the control of the program in the single chip computer, the capacitor group unit will select a suitable capacitance size by breaking the circuit path.

[0098] Specifically, the adapter module is used to support the access of various power sources.

[0099] Specifically, the PSU is the power supply to be tested, which can be a single power supply or a dual power supply; in the case of dual power supplies, the capacitor group unit can include two capacitor group modules, the data acquisition unit can include two data acquisition modules, and the alarm unit can include two alarm modules.

[0100] Specifically, the overall structure may also include a protection circuit unit, which is used to prevent damage to components caused by instantaneous high currents due to accidents such as overcurrent and short circuit, isolate and protect key components, and can be connected to any unit, for example, the processor module and / or the data acquisition module.

[0101] For the specific definition of the power supply test system, please refer to the definition of the test fixture above, which will not be repeated here. Each unit in the above power supply test system can be implemented in whole or in part by software, hardware and their combination. The above units can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above units.

[0102] In one embodiment, Figure 3 As shown, a power supply testing method is provided, comprising the following steps:

[0103] S301: Determine configuration information and test items of the power supply to be tested in the test instruction according to the received test instruction sent by the host computer.

[0104] Here, the test fixture is a fixture that is specially used to test and experiment the product's functions, power calibration, life, performance, etc. The host computer refers to a computer that can directly issue control commands. The power supply to be tested can be a server power supply, PSU (PC Power supply unit).

[0105] The test instruction may include multiple contents. The configuration information of the power supply to be tested may be that the power supply to be tested is 12v, 54v or other voltages. The test items may include operating environment parameters and / or collected data contents.

[0106] In one embodiment, after the test fixture is connected to the host computer, a connectivity test is performed to ensure that the test fixture is connected to the host computer. If it fails, the connection is repeatedly attempted. After multiple failures, the host computer feedback indicates that the connection is not established.

[0107] S302: Determine configuration information of an analog module and a capacitor group module in a test fixture according to the configuration information of the power supply to be tested.

[0108] Here, the configuration information of the power supply to be tested may include power supply type, power supply capacity, output voltage, hot-swap capability, redundancy mode, environmental adaptability, power supply size, and the like.

[0109] In one embodiment, according to the configuration information of the power supply to be tested, the number of the alarm module, the capacitor group module and the data acquisition module in the test fixture can also be determined. For example, the configuration information of the power supply to be tested includes that the power supply to be tested is in a dual power supply mode, and the alarm module, the capacitor group module and the data acquisition module in the test fixture are configured as two groups of modules, serving two power supplies respectively. When the mode of the power supply to be tested is a dual power supply mode, the data acquisition modules of the two power supplies to be tested are carried out separately. According to the test requirements, the targets of the two power supply data acquisition modules to be tested can be different, for example, the test items of input voltage overvoltage and recovery are performed on the power supply, and a power supply A can be used to collect signal quality, and another power supply B can be used to collect and determine the status bit.

[0110] S303: configuring the analog module and the capacitor group module in the test fixture according to the configuration information of the analog module and the capacitor group module.

[0111] Here, the simulation module is used to simulate the mainboard circuit in the server, power on the power supply to be tested, and simulate the working state of the power supply to be tested.

[0112] Specifically, the configuration information of the power supply to be tested is selected on the host computer, and the configuration information of the power supply to be tested is transmitted to the test fixture, and the test fixture adjusts the configuration in the test fixture according to the configuration information of the power supply to be tested.

[0113] In one embodiment, the mainboard circuit in the analog module can be updated according to user needs to achieve more comprehensive functions.

[0114] S304: Power on the power supply to be tested, and run the test circuit in the test fixture, wherein the test circuit includes the power supply to be tested, the analog module, and the capacitor group module.

[0115] Here, the test circuit is used to simulate the operating environment of the power supply to be tested, and the power supply to be tested is powered on to realize the simulated working state of the power supply to be tested.

[0116] Among them, by selecting different capacitor group modules, test environments with different capacitance values ​​can be simulated; by selecting different simulation modules, test environments with different voltages of power supplies to be tested can be simulated.

[0117] Specifically, the power supply to be tested is connected to the capacitor group module, and the capacitor group module is connected to the analog module. After the power supply is powered on, the test circuit starts to run, and data generated by the power supply to be tested running in the current test environment can be collected.

[0118] S305: According to the test items, collect test data from the test circuit, analyze the test data, and obtain a test result of the power supply to be tested.

[0119] Here, the test items may include hardware testing and software testing. The software test mainly executes commands on the registers inside the power supply. One type of hardware test is to judge the signal quality, maximum and minimum values ​​and other parameters, and the other is to test the signal timing.

[0120] The collected test data may include data collected on the simulation device, such as current, voltage, etc., and may also include data of the internal register of the power supply.

[0121] Specifically, the test data may be analyzed by a processor module in the test fixture to obtain the test result of the power supply to be tested.

[0122] In one embodiment, the test items may include tests involving adjusting the capacitor group. The corresponding capacitor group may be selected according to different test items, and the capacitor size may be adjusted to meet the requirements of the test item content by adjusting the switch of the capacitor group module.

[0123] It should be noted that the present application constructs a variable test environment through a test fixture to more comprehensively evaluate the dynamic performance of the power supply. At the same time, it can test the software functions and hardware functions of the power supply to be tested and judge the test results, thereby saving manpower and improving test efficiency.

[0124] In some specific implementations, after powering on the power supply to be tested and running the test circuit in the test fixture, the method further includes:

[0125] collecting the voltage of the test circuit;

[0126] Comparing the voltage with the configuration information of the power supply to be tested to determine whether the voltage is the same as the voltage in the configuration information;

[0127] If they are not the same, stop running the test circuit in the test fixture and send an error prompt to the host computer;

[0128] If they are the same, continue to run the test circuit in the test fixture.

[0129] Specifically, the data acquisition module will first collect the output voltage and compare it with the voltage of the configuration information in the host computer. If the two conflict, the test will be stopped and the host computer will prompt that the power type is wrong. For example, a power supply with an output voltage of 54V mistakenly uses a 12V capacitor group and an analog motherboard circuit.

[0130] In this way, the configuration of the actual analog module and the capacitor group module in the test fixture is prevented from not matching the voltage of the power supply to be tested, which would cause damage to the analog mainboard circuit.

[0131] In some specific implementations, collecting test data from the test circuit according to the test items, analyzing the test data, and obtaining the test result of the power supply to be tested includes:

[0132] According to the test item, determine to collect circuit data of the test circuit, collect signal data of the power supply to be tested in operation, or collect register data of the power supply to be tested in operation;

[0133] The circuit data, the signal data or the register data are analyzed to obtain a test result of the power supply to be tested.

[0134] Here, the circuit data may include data such as voltage and current; the signal data may include the time point when the signal high and low levels change, the level of the signal, the frequency of the signal, etc.

[0135] In some specific implementations, collecting test data from the test circuit according to the test items, analyzing the test data, and obtaining the test result of the power supply to be tested includes:

[0136] Determine a test type according to the test item, wherein the test type includes a signal test, a timing test, and a register reading test;

[0137] When the test instruction is a signal test, within a first preset time, the signal parameters of the signal of the power supply to be tested are collected multiple times, the characteristic values ​​of the signal parameters are screened out, and it is determined whether the characteristic values ​​are within a first preset range to obtain the test result of the power supply to be tested;

[0138] When the test instruction is a timing test, within a second preset time, the signal of the power supply to be tested is collected multiple times, each signal is converted into a digital signal, the level change of the digital signal is recorded, the time interval of the level change is calculated, and it is determined whether the time interval is within a second preset range to obtain the test result of the power supply to be tested;

[0139] When the test instruction is a register read value test, a write or read operation is performed on the register of the power supply to be tested, a return value of the power supply to be tested is collected, and it is determined whether the return value is consistent with an expected value to obtain a test result of the power supply to be tested.

[0140] Here, the signal test can collect the output voltage, ripple and noise of the power supply through the data acquisition module; the timing test can observe the timing waveform of the power supply startup, shutdown and load change through the data acquisition module; the register reading test can read and write the internal register of the power supply through the data acquisition module.

[0141] Specifically, when executing the test related to the signal parameters, the data acquisition module collects the level, frequency and other parameters of the signal of the power supply to be tested and transmits them to the processor module. The processor module selects the maximum and minimum values, and compares the average value with the range required by the test to determine whether the test result passes; when executing the timing test, the data acquisition module converts the signal into a digital signal. The processor module calculates the time interval of the change point through the change of the high and low levels of the two signals, and determines whether the time interval meets the timing range required by the test. When executing the software test, the data acquisition module writes or reads certain values ​​to the register inside the power supply according to the instructions of the processor module, and transmits the return value to the processor module to determine whether the return value is consistent with the expected value. The processor module analyzes the results of each test, transmits the comprehensive results and the results of each test item to the host computer, and displays the specific test items that have not passed on the host computer.

[0142] For example, Figure 4 Schematic diagram of the test item execution process in the embodiment of the present application, such as Figure 4As shown, the test item execution process includes: executing the test item and determining whether the test item is a hardware test or a software test; when the test item is a hardware test, determining whether the hardware test is a signal test or a timing test, and when the test item is a signal test, executing the acquisition of signal parameters (maximum value, minimum value, frequency, etc.); when the test item is a timing test, acquiring digital signals and calculating the time interval of signal changes; when the test item is a register reading test, I2C communication executes writing or reading registers; comparing the acquired data with the test standard to obtain feedback results.

[0143] In this way, dynamic data of the power supply under test can be collected when it is working, and the test result is more accurate.

[0144] In one embodiment, Figure 5 Schematic diagram of the test process in the embodiment of the present application, such as Figure 5 As shown, the test process includes: S501: host computer settings; S502: test fixture connected to the host computer; S503: determine whether it is connected; if not connected, return to S502, record the number of times it is not connected, and end if multiple connections fail; if connected, execute S504: capacitor reset; S505: whether the output voltage is consistent with the host computer settings; if not, execute S513: prompt setting conflict; if consistent, execute S506: connect the analog motherboard circuit; S507: determine the power mode; if the power mode is single power mode, execute S508: enable a set of alarms, capacitors, and data acquisition; if the power mode is dual power mode, execute S509: enable two sets of alarms, capacitors, and data acquisition; S510: execute test items; S511: test result determination; S512: feedback results.

[0145] It should be understood that although Figure 1-5 The steps in the flowchart are shown in sequence as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, Figure 1-5 At least part of the steps may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be executed in turn or alternately with other steps or at least part of the sub-steps or stages of other steps.

[0146] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Figure 6As shown. The computer device includes a processor, a memory, a network interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a power supply testing method is implemented. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a key, trackball or touchpad set on the computer device housing, or an external keyboard, touchpad or mouse, etc.

[0147] Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0148] In one embodiment, a computer device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the following steps when executing the computer program: S1: determining configuration information and test items of a power supply to be tested in the test instruction according to a test instruction received from a host computer; S2: determining configuration information of an analog module and a capacitor group module in a test fixture according to the configuration information of the power supply to be tested; S3: configuring the analog module and the capacitor group module in the test fixture according to the configuration information of the analog module and the capacitor group module; S4: powering on the power supply to be tested and running a test circuit in the test fixture, wherein the test circuit comprises the power supply to be tested, the analog module, and the capacitor group module; S5: collecting test data from the test circuit according to the test items, analyzing the test data, and obtaining a test result of the power supply to be tested.

[0149] In one embodiment, when the processor executes the computer program, the following steps are also implemented: collecting the voltage of the test circuit; comparing the voltage with the configuration information of the power supply to be tested to determine whether the voltage is the same as the voltage in the configuration information; if they are not the same, stopping the operation of the test circuit in the test fixture and sending an error prompt to the host computer; if they are the same, continuing to operate the test circuit in the test fixture.

[0150] In one embodiment, when the processor executes the computer program, the following steps are also implemented: according to the test item, it is determined to collect circuit data of the test circuit, collect signal data of the power supply to be tested in operation, or collect register data of the power supply to be tested in operation; the circuit data, the signal data, or the register data are analyzed to obtain the test result of the power supply to be tested.

[0151] In one embodiment, when the processor executes the computer program, the following steps are also implemented: according to the test item, the test type is determined, wherein the test type includes a signal test, a timing test, and a register reading test; when the test instruction is a signal test, within a first preset time, the signal parameters of the signal of the power supply to be tested in operation are collected multiple times, the characteristic values ​​of the signal parameters are screened out, and it is determined whether the characteristic values ​​are within a first preset range to obtain the test result of the power supply to be tested; when the test instruction is a timing test, within a second preset time, the signal of the power supply to be tested in operation is collected multiple times, each signal is converted into a digital signal, the level change of the digital signal is recorded, the time interval of the level change is calculated, and it is determined whether the time interval is within a second preset range to obtain the test result of the power supply to be tested; when the test instruction is a register reading test, a write or read operation is performed on the register of the power supply to be tested, the return value of the power supply to be tested is collected, and it is determined whether the return value is consistent with the expected value to obtain the test result of the power supply to be tested.

[0152] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented: S1: according to the test instruction sent by the host computer, the configuration information and test items of the power supply to be tested in the test instruction are determined; S2: according to the configuration information of the power supply to be tested, the configuration information of the analog module and the capacitor group module in the test fixture is determined; S3: according to the configuration information of the analog module and the capacitor group module, the analog module and the capacitor group module in the test fixture are configured; S4: the power supply to be tested is powered on, and the test circuit in the test fixture is run, wherein the test circuit includes the power supply to be tested, the analog module and the capacitor group module; S5: according to the test items, test data is collected from the test circuit, and the test data is analyzed to obtain the test result of the power supply to be tested.

[0153] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: collecting the voltage of the test circuit; comparing the voltage with the configuration information of the power supply to be tested to determine whether the voltage is the same as the voltage in the configuration information; if they are not the same, stopping the operation of the test circuit in the test fixture and sending an error prompt to the host computer; if they are the same, continuing to operate the test circuit in the test fixture.

[0154] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: according to the test item, determining to collect circuit data of the test circuit, collecting signal data of the power supply to be tested in operation, or collecting register data of the power supply to be tested in operation; analyzing the circuit data, the signal data, or the register data to obtain a test result of the power supply to be tested.

[0155] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: according to the test item, the test type is determined, wherein the test type includes a signal test, a timing test and a register reading test; when the test instruction is a signal test, within a first preset time, the signal parameters of the signal of the power supply to be tested in operation are collected multiple times, the characteristic values ​​of the signal parameters are screened out, and it is determined whether the characteristic values ​​are within a first preset range to obtain the test result of the power supply to be tested; when the test instruction is a timing test, within a second preset time, the signal of the power supply to be tested in operation is collected multiple times, each signal is converted into a digital signal, the level change of the digital signal is recorded, the time interval of the level change is calculated, and it is determined whether the time interval is within a second preset range to obtain the test result of the power supply to be tested; when the test instruction is a register reading test, a write or read operation is performed on the register of the power supply to be tested, the return value of the power supply to be tested is collected, and it is determined whether the return value is consistent with the expected value to obtain the test result of the power supply to be tested.

[0156] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0157] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0158] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A test fixture, characterized in that: The test fixture includes a communication module, a processor module, a data acquisition module, an analog module, a capacitor group module and a conversion module; the communication module is connected to the processor module, the processor module is respectively connected to the data acquisition module, the capacitor group module and the analog module, the capacitor group is connected to the analog module, and the data acquisition module is connected to the analog module; The communication module is used to transmit test instructions and test results; The processor module is used to process the test instructions and test data; The data acquisition module is used to collect the test data generated by the simulation module and transmit it to the processor module; The simulation module is connected to the capacitor group module and is used to simulate circuits corresponding to different power supply types; The capacitor bank module is used to dynamically adjust the capacitance value of the circuit formed with the analog module; The conversion module is used to connect different types of power supplies to be tested.

2. The test fixture according to claim 1, characterized in that: The conversion module is detachably connected to the test fixture, and the conversion module includes a first connection port and a second connection port; The interface of the power supply to be tested is connected to the first connection port of the conversion module; The second connection port of the conversion module is connected to the test fixture.

3. The test fixture according to claim 1, characterized in that: The test fixture also includes an alarm module and / or a protection circuit module; The alarm module includes a plurality of alarm lights, one alarm light corresponds to a test data collection position; The protection circuit module is connected to the processor module and / or the data acquisition module in the test fixture.

4. A power supply test system, characterized in that: The power supply test system comprises a test fixture and a host computer as described in any one of claims 1 to 3; The test fixture is connected to the host computer via a communication module; The test fixture is connected to the power supply to be tested through a conversion module.

5. A power supply testing method, applied to the power supply testing system as claimed in claim 4, characterized in that: The method comprises: Determine the configuration information and test items of the power supply to be tested in the test instruction according to the test instruction received from the host computer; Determine the configuration information of the analog module and the capacitor group module in the test fixture according to the configuration information of the power supply to be tested; According to the configuration information of the analog module and the capacitor group module, configure the analog module and the capacitor group module in the test fixture; Powering on the power supply to be tested, and running a test circuit in the test fixture, wherein the test circuit includes the power supply to be tested, the simulation module, and the capacitor group module; According to the test items, test data is collected from the test circuit, and the test data is analyzed to obtain a test result of the power supply to be tested.

6. The power supply testing method according to claim 5, characterized in that: After powering on the power supply to be tested and running the test circuit in the test fixture, the method further includes: collecting the voltage of the test circuit; Comparing the voltage with the configuration information of the power supply to be tested to determine whether the voltage is the same as the voltage in the configuration information; If they are not the same, stop running the test circuit in the test fixture and send an error prompt to the host computer; If they are the same, continue to run the test circuit in the test fixture.

7. The power supply testing method according to claim 5, characterized in that: The collecting test data from the test circuit according to the test items, analyzing the test data, and obtaining the test result of the power supply to be tested includes: According to the test item, determine to collect circuit data of the test circuit, collect signal data of the power supply to be tested in operation, or collect register data of the power supply to be tested in operation; The circuit data, the signal data or the register data are analyzed to obtain a test result of the power supply to be tested.

8. The power supply testing method according to claim 5, characterized in that: The collecting test data from the test circuit according to the test items, analyzing the test data, and obtaining the test result of the power supply to be tested includes: Determine a test type according to the test item, wherein the test type includes a signal test, a timing test, and a register reading test; When the test instruction is a signal test, within a first preset time, the signal parameters of the signal of the power supply to be tested are collected multiple times, the characteristic values ​​of the signal parameters are screened out, and it is determined whether the characteristic values ​​are within a first preset range to obtain the test result of the power supply to be tested; When the test instruction is a timing test, within a second preset time, the signal of the power supply to be tested is collected multiple times, each signal is converted into a digital signal, the level change of the digital signal is recorded, the time interval of the level change is calculated, and it is determined whether the time interval is within a second preset range to obtain the test result of the power supply to be tested; When the test instruction is a register read value test, a write or read operation is performed on the register of the power supply to be tested, a return value of the power supply to be tested is collected, and it is determined whether the return value is consistent with an expected value to obtain a test result of the power supply to be tested.

9. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 5 to 8 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 5 to 8 are implemented.

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