Memory bank detection method and detection equipment thereof

Abstract

The invention provides a memory bank detection method and detection equipment thereof, the detection equipment comprises a hot plug mechanism, and the method comprises the following steps: during initialization, performing memory training on a memory bank to obtain training information of the memory bank; when it is determined that a memory bank failed in training exists according to the training information of the memory bank, the position of the memory bank is obtained; and according to the position of the memory bank failed in training, controlling the hot plug mechanism to replace the memory bank failed in training at present. Early fault detection is carried out in the test starting stage, the fault memory banks are rapidly identified and replaced, instant feedback is provided for an operator through a display lamp, the test system enters a conventional detailed test process only after all the fault memory banks are identified and replaced in the test starting stage, and the test efficiency is improved. According to the invention, the overall detection time is reduced, and the test efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of memory testing, and in particular to a memory bar testing method and a testing device thereof. Background Art

[0002] With the development of computer technology, computer memory sticks play an increasingly important role in the computer field, and the testing of memory sticks has also become more critical. The main reason why memory sticks need to be aged is to verify their performance and reliability, and to ensure that there will be no problems during long-term use. Memory sticks are a vital component of computer systems, which store and provide data and programs required for computer operation. Therefore, the quality and reliability of memory sticks are crucial to the performance and stability of computer systems.

[0003] The SLT (System Level Test) aging test time of traditional test machines is divided into two stages: startup and testing. The first stage startup takes about 5 minutes, while the second stage conventional test process takes several hours. During the power-on startup process of the test machine, if the training fails when the memory bar is initialized, the machine does not display the output and cannot locate which of the 32 memory bars has a problem. The machine will continue to perform the following test process. That is to say, in the case of training failure, the process continues, thereby reducing production efficiency. Therefore, a method is needed to detect when the memory bar is undergoing early training, perform early detection in the test startup phase, find the faulty memory bar and replace it, and prevent the detection from entering the conventional test process, thereby reducing the detection time and improving the test efficiency. Summary of the invention

[0004] The main purpose of the present invention is to propose a memory bar detection method and a detection device thereof, aiming to solve the problem that traditional test equipment cannot effectively perform early fault detection during the startup phase of aging test and accurately locate the problematic memory bar.

[0005] In view of the above problems, the present invention proposes a memory stick detection method, which is applied to a detection device, wherein the detection device includes a hot-swap mechanism, and the method includes: During initialization, memory training is performed on the memory bar to obtain training information of the memory bar; When it is determined according to the training information of the memory bar that there is a memory bar that has failed training, obtaining a position of the memory bar that has failed training; According to the position of the memory bar that failed training, the hot-swap mechanism is controlled to replace the current memory bar that failed training.

[0006] Optionally, the specific steps of performing memory training on the memory bar during initialization to obtain training information of the memory bar include: When the memory bar is initialized, memory training is performed on the memory bar, and training information of the memory bar during the memory training process is continuously obtained.

[0007] Optionally, when it is determined according to the training information of the memory bar that there is a memory bar that has failed training, the specific step of obtaining the position of the memory bar includes: Based on the training information, locate the memory bar where training failed; By locating the memory bar where training fails, obtain the location of the memory bar.

[0008] Optionally, the method further comprises: When it is determined according to the training information of the memory bar that there is a memory bar that has failed training, determining the reason for the failure of the training of the memory bar according to the training information of the memory bar; According to the determined cause of the memory bar training failure, the level of the memory bar training failure is determined.

[0009] Optionally, the levels of memory bar training failure include level one training failure, level two training failure, level three training failure and level four training failure.

[0010] Optionally, each group of memory bars is provided with a corresponding display light, and the method further comprises: Based on the position of the memory bar that failed training, a display light corresponding to the memory bar is controlled to flash.

[0011] Optionally, the step of controlling the hot-swap mechanism to replace the memory bar that has failed training according to the position of the memory bar that has failed training specifically includes: The location information of the memory bar that failed training is sent to the terminal control platform, so that the terminal control platform controls the hot-swap mechanism to replace the memory bar that failed training.

[0012] Optionally, the method further comprises: The location information of the memory bar that failed training and the reason for the memory bar training failure are sent to the terminal control platform, so that the terminal control platform displays the location of the memory bar that failed training and the level of the memory bar training failure on the display screen.

[0013] The present invention further proposes a detection device, comprising a processor, a memory, a display light and a terminal control platform, wherein the memory stores a computer program, and when the computer program is executed by the processor, the steps of the above method are implemented.

[0014] Optionally, the terminal control platform includes a hot-swap mechanism and a display screen, and the processor is electrically connected to a display light, the hot-swap mechanism and the display screen.

[0015] The present invention proposes a memory stick detection method and device. The detection method performs early fault detection in the test startup phase, quickly identifies and replaces faulty memory sticks, and uses display lights to provide instant feedback to operators. In the present invention, after all faulty memory sticks have been identified and replaced in the test startup phase, the test system enters a conventional detailed test process. The present invention reduces the overall detection time and improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.

[0017] Figure 1 A flow chart of a memory bar detection method of the present invention; Figure 2 It is a logic diagram of S200 of an embodiment of a memory bar detection device of the present invention; Figure 3 It is a flow chart of S200 of an embodiment of a memory bar detection method of the present invention; Figure 4 A flow chart of another embodiment of a memory bar detection method of the present invention; Figure 5 The present invention provides a control logic diagram of a memory stick detection device.

[0018]

[0019] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0021] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0022] In the present invention, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0023] In addition, in the present invention, descriptions such as "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in the field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0024] The present invention proposes a memory bar detection method, such as Figure 1 As shown, it is applied to a detection device, the detection device includes a hot plug mechanism 02, and the method includes: S100: During initialization, memory training is performed on the memory bar to obtain training information of the memory bar; S200: when it is determined according to the training information of the memory bar that there is a memory bar that has failed training, obtaining a position of the memory bar that has failed training; S300: According to the position of the memory bar that has failed training, control the hot-swap mechanism 02 to replace the current memory bar that has failed training.

[0025] The present invention proposes a memory stick detection method and device. The detection method performs early fault detection in the test startup phase, quickly identifies and replaces the faulty memory stick, and uses a display light 01 to provide instant feedback to the operator. In the present invention, after all faulty memory sticks have been identified and replaced in the test startup phase, the test system enters a conventional detailed test process. The present invention reduces the overall detection time and improves the test efficiency.

[0026] More specifically, aging testing is a method of evaluating the performance changes of materials, products or equipment under long-term use or specific environmental conditions. Aging testing can be divided into many types according to different test purposes and objects. System-level testing (SLT) is an important part of semiconductor testing. It verifies chip functions in a simulated actual use environment. SLT checks each module of the chip by running system software, providing a test that is closer to the real scene.

[0027] The time of SLT (System Level Test) aging test is usually divided into two stages: startup and testing. The following are the detailed processes of these two stages: 1. Start-up phase (first phase) The startup phase is the beginning of the entire SLT aging test, and its main purpose is to prepare for the subsequent regular test process. This phase takes about 5 minutes, and the specific process is as follows: Before the test begins, the test system needs to be initialized, including loading the test program, configuring test parameters, etc. During the initialization process, the system will check the status of each hardware component to ensure that they are in normal condition for subsequent testing.

[0028] According to the test requirements, the test system will load the corresponding test environment, including operating system, application program, driver, etc. These test environments will simulate real-world usage scenarios to comprehensively test the chip.

[0029] During the test, it is necessary to monitor the system's operating status in real time, including the usage of hardware components such as memory, processor, hard disk, etc. The monitoring program will record various data during the test for subsequent analysis and evaluation.

[0030] 2. Conventional testing process (Phase II) The conventional test process is the core part of the SLT aging test and takes several hours to complete. This stage mainly performs various functional and performance tests on the chip to evaluate its performance in actual use. The specific process includes: functional testing, performance testing, stress testing, aging testing, data analysis and evaluation, and troubleshooting and repair.

[0031] Traditional test machines lack a mechanism to immediately stop testing and provide feedback on the specific fault location when a faulty memory stick is detected during the startup phase. This results in the system being unable to quickly locate the faulty memory stick and instead continuing to execute subsequent regular testing processes, thereby increasing the time and cost of invalid testing.

[0032] In view of the above problems, the present invention proposes a memory stick detection method, which is applied in the first stage of the SLT aging test of the test machine, and detects the faulty memory stick at the initial start-up of the test machine, so that the memory stick that has been detected to be faulty will not waste several hours undergoing the conventional test process. The faulty memory sticks screened out in the present invention are generally more thorough in failure, and there is no point in performing the conventional test process.

[0033] The detection method of the present invention is described more specifically: In step S100, the initialization of the memory bar occurs in the startup phase. Before the test begins, the test system needs to perform an initialization operation. During the initialization process, the system will check the status of each hardware component to ensure that they are in a normal state for subsequent testing.

[0034] The present invention records the training information of each memory bar in the memory training phase in real time by implanting software during the memory initialization process, and the software will be executed continuously without interruption until the end. It is not limited by time and will not be terminated due to a faulty memory bar.

[0035] In step S200, the memory bar where training failed can be located according to the obtained training information, and then the location of the memory bar is transmitted to the outside world.

[0036] In step S300, based on the obtained memory stick position, the hot-swap mechanism 02 is controlled to remove the DUT (Device Under Test, the device in the test phase), that is, the memory stick that currently fails in training, from the corresponding slot and insert a new memory stick. After replacing the memory stick, the system is restarted and initialized again. If the initialization is successful, the normal test process is entered.

[0037] The present invention proposes a memory stick detection method and device. The detection method performs early fault detection in the test startup phase, quickly identifies and replaces the faulty memory stick, and uses a display light 01 to provide instant feedback to the operator. In the present invention, after all faulty memory sticks have been identified and replaced in the test startup phase, the test system enters a conventional detailed test process. The present invention reduces the overall detection time and improves the test efficiency.

[0038] In one embodiment, during initialization, the specific steps of performing memory training on the memory bar to obtain training information of the memory bar include: When the memory bar is initialized, the memory bar is trained and the training information of the memory bar during the memory training process is continuously obtained.

[0039] BIOS (Basic Input / Output System) is the bridge between computer hardware and operating system. It is responsible for initializing hardware, loading operating system and providing basic input and output functions when the computer is turned on. BIOS firmware is stored in a special chip on the computer motherboard. This chip is usually not writable to ensure the stability and security of its contents.

[0040] In this embodiment, when the BIOS is performing memory initialization and memory training, the software code is used to detect early faults (memory bars that failed training). It should be noted that memory training and memory initialization are not the same concept. Memory training is part of memory initialization, and initialization also includes other tasks.

[0041] The detection method of the present invention focuses on memory training, and the time period is between the start of memory training and the end of memory training, which is about 1 to 2 minutes. This period of time is called "early training" in the description of the present invention, and the failure that occurs during early training is called "early training failure".

[0042] During the memory initialization process, this embodiment implants a program for detecting the memory bar training status in the BIOS, and the program records the training information of each memory bar in real time, and obtains the training information of all memory bars when the early training is finished. This program will be executed continuously during the early training until it is finished.

[0043] The training information of this implementation includes the training success result or training failure result of the memory bar during the memory training process. The above embodiment implants a program for detecting the training status of the memory bar in the BIOS, and the program records the training information of each memory bar in real time. In this embodiment, the training information obtained by the program is recorded regardless of whether the training is successful or failed.

[0044] It is worth noting that since the detection method of the present invention is applied in the initial stage of the test machine startup, the "early training" and "memory training" referred to in the present invention are different descriptions of the same meaning, and "early training failure" and "training failure" are different descriptions of the same meaning.

[0045] In one embodiment, if Figure 2 As shown, when it is determined according to the training information of the memory bar that there is a memory bar that has failed training, the specific steps of obtaining the position of the memory bar include: S210: Locate the memory bar where training fails based on the training information; During the system startup process, the memory training program is started through the BIOS (Basic Input Output System) or UEFI (Unified Extensible Firmware Interface). Memory training usually includes the following key steps: ZQ calibration: used to calibrate the resistor values ​​on the DQ (data pins). The circuit behind each DQ pin consists of a set of parallel resistor branches, and the precise values ​​of these resistors are critical to ensure signal integrity. ZQ calibration adjusts the values ​​of these resistors to optimize the signal drive strength and termination resistance.

[0046] DQ calibration: DQ calibration is closely related to ZQ calibration, which involves further adjustment and optimization of the circuit on the DQ pin. This includes adjusting parameters such as drive strength and termination resistance to ensure the integrity and stability of the signal during transmission.

[0047] Read / Write Training: By running a series of algorithms, the memory controller is able to calculate the correct read and write latency of the memory and center the data eye (i.e. the valid window of the signal) for reading. This process is critical to ensuring the read and write performance and stability of the memory.

[0048] During memory training, a dedicated memory test software is used to monitor the memory training process. The test software collects various memory-related fault information, such as error code, failure stage, memory address, etc. The test software obtains monitoring results by monitoring the performance of the memory bar and comparing it with the performance of normal memory bars. Combined with the results of error code analysis, memory address tracking, and performance monitoring, the test software identifies the memory bar that failed training, and determines the specific location of the faulty memory bar and the cause of the memory bar failure.

[0049] The training information of the memory bar already contains the training results of the memory bar in the memory training phase, from which the memory bar that failed the training can be located, that is, which of the 32 DIMMs has a problem. DIMM (Dual In-line Memory Module) is a dual in-line memory module, which is a memory bar specification. In other words, one DIMM stores two memory bars.

[0050] S220: The memory bar where the training failed is located, and the location of the memory bar is obtained. After the location of the memory bar is obtained, the operator can be informed which memory bar has a problem, and the operator can replace the failed memory bar.

[0051] In one embodiment, if Figure 3 As shown, the method also includes: S230: when it is determined according to the training information of the memory bar that there is a memory bar that has failed training, determining a reason for the failure of the training of the memory bar according to the training information of the memory bar; First, you need to collect the training information of all memory sticks. This information usually includes the training log, error code, signal strength, etc. of the memory stick. By comparing the training information of normal memory sticks, find out the data with differences or abnormalities. Based on the analysis results, determine which memory sticks failed during the training process.

[0052] S240: Determine the level of the memory bar training failure according to the reason for the memory bar training failure. Use special memory test software to collect data, diagnose the specific reason for the memory bar training failure, and define different failure levels according to the reason and severity of the memory bar training failure. Finally, the interface should include the location of the memory bar (such as the slot number) and the failure level to the operator through the display interface. The operator can judge which level of training failure the memory bar belongs to through the level of the memory bar training failure. In order to perform subsequent processing on the replaced memory bar.

[0053] Based on the above embodiment, the levels of memory bar training failure include level one training failure, level two training failure, level three training failure and level four training failure.

[0054] In detail, the first-level training failure is the failure of DQS (Data Strobe Signal). DQS failure usually means that during the memory training process, the DQS signal cannot be properly aligned or achieve the required signal quality. This may be caused by delay, jitter or other signal integrity issues of the DQS signal. The DQS signal is the key to memory data transmission. It is used to synchronize the read and write operations of the data signal (DQ). If the DQS signal fails, the memory module may not be able to perform data transmission correctly. Generally speaking, the training failure of 1-bit DQ / DQS is the lightest fault.

[0055] Secondary training failure is CA (command / address) failure, which refers to the failure of CA signal training during memory training. This may be caused by incorrect timing adjustment of address and command signals, insufficient signal integrity, or hardware failure. CA signal training is critical to ensure that the memory module can correctly receive and process commands and addresses from the memory controller.

[0056] Level 3 training failure is a complete failure, which means that the memory module cannot complete any stage of training during the training process, resulting in the failure of the entire training process. This may be caused by serious hardware failures in the memory module itself, incompatibility with the motherboard, or unstable power supply. Complete failure usually means that the memory module is not working properly and needs to be replaced or repaired.

[0057] Level 4 training failure is a complete failure. Training not started means that the memory module did not enter the training process, which may be caused by a variety of reasons. For example, the memory module may not be properly installed on the motherboard, or there is a problem with the connection between the memory module and the motherboard. In addition, if the BIOS settings are incorrect or the memory module does not support the current memory training mode, training may not start.

[0058] In one embodiment, if Figure 4As shown, each group of memory bars is provided with a corresponding display light 01, and the method further comprises: S400: Based on the position of the memory bar where training failed, control the display light 01 corresponding to the memory bar to flash. On the motherboard circuit, each DIMM slot is usually equipped with a corresponding LED display light 01. The main function of these LED lights is to provide working status indication of the memory bar. When early training fails, the LED light corresponding to the memory bar flashes to remind the user to perform troubleshooting.

[0059] Preferably, the display light 01 is a yellow-green bicolor LED display light 01, the first LED light is a green light, and the second LED light is a yellow light. Furthermore, the LED lights can be arranged in two rows in a zigzag shape for easy viewing by the operator. The first LED light is used to indicate that the memory bar has been successfully trained during the memory training process by being constantly on; if the training is successful, the green LED light is constantly on. The second LED light is used to indicate that the memory bar has failed to be trained during the memory training process by flashing. If a training failure occurs, the yellow LED light flashes.

[0060] It is worth noting that the flashing of the display light 01 does not correspond to the level of the memory bar training failure. All levels will flash, and as long as it flashes, it will control the hot swap mechanism 02 to replace the current memory bar that failed to be trained. The flashing is only to tell the operator that a fault has occurred, and the operator cannot know the cause of the fault from the display light 01.

[0061] In one embodiment, the step of controlling the hot-swap mechanism 02 to replace the memory bar that has failed training according to the position of the memory bar that has failed training specifically includes: The location information of the memory bar that failed training is sent to the terminal control platform, so that the terminal control platform controls the hot-swap mechanism 02 to replace the memory bar that failed training.

[0062] The terminal control platform receives the memory bar location information and sends an instruction to the hot-swap mechanism 02. After receiving the instruction, the hot-swap mechanism 02 moves to the location of the failed memory bar. Using appropriate tools or fixtures, the hot-swap mechanism 02 removes the failed memory bar from the motherboard. A new memory bar compatible with the failed memory bar is selected from the spare memory bar library. The hot-swap mechanism 02 installs the new memory bar into the corresponding DIMM slot on the motherboard.

[0063] In one embodiment, the method further comprises: The location information of the memory bar that failed training and the reason for the memory bar training failure are sent to the terminal control platform, so that the terminal control platform displays the location of the memory bar that failed training and the level of the memory bar training failure on the display screen 03.

[0064] After receiving the memory bar location information and the level of memory bar training failure, the terminal control platform will immediately parse and process it. Subsequently, this information will be displayed on the platform's display screen 03 for technicians to view and analyze. The information on the display screen 03 should be clear and concise, including the location of the memory bar that failed training, the level of training failure, and possible solutions or suggestions. During the processing, the technician should record the operation and results of each step in detail. After the processing is completed, it is necessary to continuously monitor the system performance and stability to ensure that the problem is effectively solved and does not cause other potential problems.

[0065] The present invention further proposes a detection device, comprising a processor, a memory, a display light 01 and a terminal control platform, wherein the memory stores a computer program, and when the computer program is executed by the processor, the steps of the above method are implemented.

[0066] In one embodiment, if Figure 5 As shown, the terminal control platform includes a hot-swap mechanism 02 and a display screen 03, and the processor is electrically connected to the display light 01, the hot-swap mechanism 02 and the display screen 03. In this embodiment, the working process of the detection device is as follows: the detection program is implanted into the BIOS, and during the memory initialization process, the training information of each memory bar is recorded in real time, and the system BIOS transmits the training information to the central control chip BMC on the test motherboard; the BMC processes the information, and then relays the information (location, fault level, cause) of the memory bar that failed the training.

[0067] The training results will be sent to two places: one is the LED light, and the other is the terminal control platform. These two places do not interfere with each other and have no time sequence relationship. The terminal control platform includes a hot-swap mechanism 02 and a display screen 03.

[0068] On the motherboard circuit, there is a corresponding yellow-green dual-color LED display light 01 next to each DIMM slot. The light will flash yellow when the early training of the memory stick fails. When the early training of a memory stick fails, the result of the memory training will be displayed on the screen, and the hot-swap mechanism 02 will be controlled to replace the memory stick. Then the system restarts and initializes again. If the initialization passes, it enters the normal test process.

[0069] The above descriptions are only optional embodiments of the present invention, and are not intended to limit the patent scope of the present invention. All equivalent structural changes made using the contents of the present invention's specification and drawings, or directly / indirectly applied in other related technical fields, are included in the patent protection scope of the present invention.

Claims

1. A memory bar detection method, characterized in that: Applied to a detection device, the detection device includes a hot plug mechanism, and the method includes: During initialization, memory training is performed on the memory bar to obtain training information of the memory bar; When it is determined according to the training information of the memory bar that there is a memory bar that has failed training, obtaining a position of the memory bar that has failed training; According to the position of the memory bar that failed training, the hot-swap mechanism is controlled to replace the current memory bar that failed training.

2. The memory bar detection method according to claim 1, characterized in that: The specific steps of performing memory training on the memory bar during initialization to obtain training information of the memory bar include: When the memory bar is initialized, memory training is performed on the memory bar, and training information of the memory bar during the memory training process is continuously obtained.

3. The memory bar detection method according to any one of claims 1 or 2, characterized in that: The specific steps of determining, based on the training information of the memory bar, that there is a memory bar that has failed training and obtaining the position of the memory bar include: Based on the training information, locate the memory bar where training failed; By locating the memory bar where training fails, obtain the location of the memory bar.

4. The memory bar detection method according to any one of claims 1 or 2, characterized in that: The method further comprises: When it is determined according to the training information of the memory bar that there is a memory bar that has failed training, determining the reason for the failure of the training of the memory bar according to the training information of the memory bar; According to the determined cause of the memory bar training failure, the level of the memory bar training failure is determined.

5. The memory bar detection method according to claim 4, characterized in that: The levels of memory bar training failure include level one training failure, level two training failure, level three training failure and level four training failure.

6. The memory bar detection method according to claim 1, characterized in that: Each group of memory bars is provided with a corresponding display light, and the method further comprises: Based on the position of the memory bar that failed training, a display light corresponding to the memory bar is controlled to flash.

7. The memory bar detection method according to claim 1, characterized in that: The step of controlling the hot-swap mechanism to replace the memory bar that has failed training according to the position of the memory bar that has failed training specifically includes: The location information of the memory bar that failed training is sent to the terminal control platform, so that the terminal control platform controls the hot-swap mechanism to replace the memory bar that failed training.

8. The memory bar detection method according to claim 7, characterized in that: The method further comprises: The location information of the memory bar that failed training and the reason for the memory bar training failure are sent to the terminal control platform, so that the terminal control platform displays the location of the memory bar that failed training and the level of the memory bar training failure on the display screen.

9. A detection device, characterized in that: The method comprises a processor, a memory, a display light and a terminal control platform, wherein the memory stores a computer program, and when the computer program is executed by the processor, the steps of the method according to any one of claims 1 to 8 are implemented.

10. The detection device according to claim 9, characterized in that: The terminal control platform comprises a hot-swap mechanism and a display screen, and the processor is electrically connected to the display light, the hot-swap mechanism and the display screen.

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