Mainboard function testing machine

Abstract

The invention provides a mainboard function testing machine, and belongs to the technical field of mainboard function testing. The two-way lead screws are arranged on the two sides of the inner wall of the testing platform through bearings, and the outer surfaces of the two-way lead screws are sleeved with two sleeves in a threaded mode. During use, the two fixing plates are pushed towards the two sides respectively, the two sides of a mainboard needing to be tested are placed on the inner walls of the two fixing plates, the two fixing plates are loosened, and the mainboard needing to be tested is placed on the inner walls of the two fixing plates; elastic force generated by two springs pushes two circular plates, so that two fixing plates clamp the two sides of the main plate, at the moment, a first handle is rotated clockwise to drive a two-way lead screw to rotate, two sleeves drive two connecting plates to move in the opposite directions, the two fixing plates further move in the opposite directions, and when the first handle cannot rotate, the two fixing plates can move in the opposite directions; therefore, when the testing machine is used for testing the mainboard, the mainboard can be conveniently and simply fixed on the testing machine, the mainboards with different sizes can be fixed, and the practicability of the testing machine is improved.

Description

Technical Field

[0001] The invention relates to the field of motherboard testing, and in particular to a motherboard function testing machine. Background Art

[0002] Motherboard functional testing refers to the testing of various hardware and functions of the computer motherboard to ensure that they can operate normally. The motherboard is one of the core components of the computer.

[0003] The motherboard function can be tested conveniently by the test machine. When testing the motherboard, some existing test machines need to fix the motherboard to prevent it from shifting during the test. Some of them fix the motherboard on the test machine by means of clips. Since the switch of the clips is small, it is not very convenient to use when fixing the motherboard. Moreover, the clips can only fix motherboards of a single size. It is difficult to fix motherboards of different sizes, which reduces the practicality of the test machine. Moreover, when testing the motherboard, different test instruments are needed to test the functions of the motherboard. When testing, some existing test machines first use one instrument to test one function of the motherboard. After the test, another test instrument is installed to test another function of the motherboard, which reduces the test efficiency of the motherboard. Summary of the invention

[0004] The present invention provides a motherboard function tester. When the tester is used to test the motherboard, the motherboard is fixed on the tester conveniently and simply, and motherboards of different sizes can be fixed, thereby improving the practicality of the tester. Different instruments can be controlled to test the motherboard, which is convenient to use and improves the test efficiency of the motherboard.

[0005] In order to achieve the above object, the present invention adopts the following technical solution: a motherboard function tester, the tester comprising: Test platform; A bidirectional screw rod is arranged on both sides of the inner wall of the test platform through a bearing, and two sleeves are threadedly sleeved on the outer surface of the bidirectional screw rod. The bidirectional screw rod can rotate because of the bearing, and the outer surface of the bidirectional screw rod has two thread grooves with different rotation directions, and the two sleeves are respectively connected to the two different thread grooves; Two connecting plates are respectively fixedly arranged on the outer surfaces of the two sleeves, and a hollow cylinder is fixedly arranged on one side of the two connecting plates. When the bidirectional screw rod rotates in different directions, the two sleeves move in relative or opposite directions on their outer surfaces; Two circular plates are movably embedded in the inner walls of the two hollow cylinders, and transmission rods are fixedly arranged on opposite sides of the two circular plates. The two circular plates can slide on the inner walls of the two hollow cylinders respectively. The two fixing plates are respectively fixedly arranged at the opposite ends of the two transmission rods, and sponge gaskets are fixedly arranged at the inner walls of the two fixing plates. The two sponge gaskets are soft. When the two fixing plates clamp the main board, the softness of the two sponge gaskets protects both sides of the main board.

[0006] As a further improvement scheme of the present invention: a spring is fixedly arranged on the opposite sides of the two circular plates, two slots are opened on one side of the test platform, the two connecting plates are respectively slidably arranged on the inner walls of the two slots, a first handle is fixedly arranged on one side of the bidirectional screw rod, the two connecting plates can respectively slide on the inner walls of the two slots, the first handle facilitates the rotation of the bidirectional screw rod, and rotating the first handle drives the bidirectional screw rod to rotate.

[0007] As a further improvement of the present invention: first telescopic columns are fixedly arranged at the four corners of one side of the test platform, second telescopic columns are movably sleeved on the outer surfaces of multiple first telescopic columns, and multiple second telescopic columns can slide on the outer surfaces of multiple first telescopic columns respectively.

[0008] As a further improvement scheme of the present invention: multiple second telescopic columns are grouped in pairs, and the outer surfaces of the two groups of second telescopic columns are fixedly sleeved with a horizontal plate, and two first adjustment plates are fixedly provided on one side of the test platform, and one side of the two first adjustment plates is movably sleeved with a second adjustment plate, and one side of the two second adjustment plates is respectively fixedly provided on one side of the two horizontal plates, and the two limiting nails are removed from the two second adjustment plates. At this time, the gravity of the two slide rails pushes the multiple second telescopic columns to further lower the height of the two slide rails, which is convenient for replacing the test instruments inside the two instrument boxes. After the replacement is completed, the two slide rails are lifted upwards, and after the two slide rails reach the maximum point, the two limiting nails are inserted into the two second adjustment plates to fix the positions of the two second adjustment plates, and the positions of the multiple second telescopic columns are fixed by the two horizontal plates, and the positions of the two slide rails are further fixed.

[0009] As a further improvement scheme of the present invention: one side of the two second adjustment plates is movably embedded with a limit pin, the two limit pins are movably embedded in one side of the two first adjustment plates, the two limit pins can slide on one side of the two first adjustment plates and the two second adjustment plates respectively, and the positions of the two second adjustment plates can be fixed by sliding the two limit pins.

[0010] As a further improvement of the present invention: a slide rail is fixedly provided on one side of the two groups of the second telescopic columns, and a protective plate is fixedly provided on one side of the two slide rails. The protective plate protects the internal structure thereof and prevents the internal structure from being exposed to the outside and being damaged.

[0011] As a further improvement scheme of the present invention: a slide plate is slidably provided on one side opposite to the two slide rails, and two instrument boxes are provided on the side of the slide plate close to the test platform through a threaded nail, a slide cylinder is fixedly embedded on one side of the two instrument boxes, and threaded rods are threadedly embedded on the inner walls of the two slide cylinders, and a first mounting plate is movably provided on one side of the two threaded rods, and a second handle is fixedly provided on one side of the two threaded rods, and the two instrument boxes can be disassembled and installed by turning the screws, and the two second handles are rotated counterclockwise to make the two threaded rods slide on the inner walls of the two slide cylinders, further pushing the two threaded rods to move toward the side of the two second mounting plates, and when the two second handles cannot be rotated, the two first mounting plates and the two second mounting plates fix the two test instruments inside the two instrument boxes.

[0012] As a further improvement scheme of the present invention: metal springs are fixedly set on the inner walls of the two instrument boxes, and a second mounting plate is fixedly set on one side of the two metal springs. The two second mounting plates are respectively slidably set on the inner walls of the two instrument boxes. The two metal springs have elastic force, and the two second mounting plates can slide on the inner walls of the two instrument boxes respectively. By sliding the two second mounting plates, the two instruments used for testing are respectively placed in the middle of the two first mounting plates and the two second mounting plates. At this time, the elastic force of the two metal springs pushes the two second mounting plates, so that the two first mounting plates and the two second mounting plates respectively clamp two different test instruments.

[0013] As a further improvement scheme of the present invention: a bidirectional motor is installed on one side of the skateboard, and the output shaft of the bidirectional motor is fixedly provided with a rotating rod, and the outer surface of the rotating rod is fixedly sleeved with a gear. When the external power switch of the bidirectional motor is turned on, the output shaft of the bidirectional motor can rotate forward and reverse, and then the output shaft of the bidirectional motor drives the rotating rod to rotate, and further drives the rack to move through the gear, so that the skateboard further slides. At this time, the rotation direction of the output shaft of the bidirectional motor is controlled so that one of the instrument boxes is on the upper side of the main board. At this time, the instrument inside one of the instrument boxes can be controlled to test the main board. After the test is completed, the rotation direction of the output shaft of the bidirectional motor is controlled again so that the other instrument box is on the upper side of the main board. At this time, the instrument inside the other instrument box can be controlled to test the main board.

[0014] As a further improvement of the present invention: a rack is meshed on the outer surface of the gear, and the rack is fixedly arranged on one side of the slide. When the gear rotates, the rack is driven to move, and the slide is further moved to different positions.

[0015] Compared with the prior art, the advantages and positive effects of the present invention are: 1. In the present invention, when the test machine is used to test the mainboard, the two circular plates can slide on the inner walls of the two hollow cylinders respectively, and push the two fixed plates to both sides respectively, and further push the two circular plates through the two transmission rods, so that the two circular plates and the inner walls of the two hollow cylinders squeeze the two springs. At this time, the two sides of the mainboard to be tested are placed on the inner walls of the two fixed plates, and the two fixed plates are loosened. The elastic force generated by the two springs pushes the two circular plates, and the two fixed plates are pushed through the two transmission rods, so that the two fixed plates clamp the two sides of the mainboard. The two sponge gaskets are soft. When the two fixed plates clamp the mainboard, the softness of the two sponge gaskets protects the two sides of the mainboard, and the bidirectional screw rod There are two thread grooves with different rotation directions on the outer surface, and the two sleeves are respectively connected to the two different thread grooves, and the two connecting plates can slide on the inner walls of the two grooves respectively. Then, when the bidirectional screw rotates in different directions, the two sleeves move in relative or opposite directions on their outer surfaces. At this time, rotating the first handle clockwise drives the bidirectional screw to rotate, so that the two sleeves drive the two connecting plates to move in relative directions, and further makes the two fixed plates move relative to each other. When the first handle cannot be rotated, the main board is fixed, so that when the test machine is used to test the main board, it is convenient and simple to fix the main board on the test machine, and main boards of different sizes can be fixed, thereby improving the practicality of the test machine.

[0016] 2. In the present invention, when testing the mainboard, the two metal springs have elastic force, and the two second mounting plates can slide on the inner walls of the two instrument boxes respectively. By sliding the two second mounting plates, the two instruments used for the test are placed in the middle of the two first mounting plates and the two second mounting plates respectively. At this time, the elastic force of the two metal springs pushes the two second mounting plates, so that the two first mounting plates and the two second mounting plates clamp two different test instruments respectively. At this time, the two second handles are rotated counterclockwise to make the two threaded rods slide on the inner walls of the two slides, further pushing the two threaded rods to move toward the two second mounting plates. When the two second handles cannot be rotated, the two first mounting plates and the two second mounting plates fix the two test instruments inside the two instrument boxes. The slide plate can slide on the inner walls of the two slide rails. By turning on the external power switch of the bidirectional motor, the output shaft of the bidirectional motor can rotate forward and backward, and then the output shaft of the bidirectional motor drives the rotating rod to rotate, and the gear drives the rack to move, so that the slide plate can slide further. At this time, the rotation direction of the output shaft of the bidirectional motor is controlled so that one of the instrument boxes is on the upper side of the main board. At this time, the instrument inside one of the instrument boxes can be controlled to test the main board. After the test is completed, the rotation direction of the output shaft of the bidirectional motor is controlled again so that the other instrument box is on the upper side of the main board. At this time, the instrument inside the other instrument box can be controlled to test the main board. Therefore, when testing the main board, different instruments can be controlled to test the main board, which is convenient to use and improves the testing efficiency of the main board.

[0017] 3. In the present invention, when the test machine is in use, the multiple second telescopic columns can slide on the outer surfaces of the multiple first telescopic columns respectively. When in use, by removing the two limit pins from the two second adjustment plates, the gravity of the two slide rails pushes the multiple second telescopic columns, and further reduces the height of the two slide rails. At this time, it is convenient to replace the test instruments inside the two instrument boxes. After the replacement is completed, by lifting the two slide rails upwards, after the two slide rails reach the maximum point, the two limit pins are inserted into the two second adjustment plates to fix the positions of the two second adjustment plates, and the positions of the multiple second telescopic columns are fixed by two cross plates, and the positions of the two slide rails are further fixed. Therefore, when the test machine is in use, the height of the two slide rails can be adjusted, which is convenient for use. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 The present invention provides a front view stereoscopic structural schematic diagram of a mainboard function tester.

[0019] Figure 2 The present invention provides a side-view stereoscopic structural schematic diagram of a mainboard function tester.

[0020] Figure 3 The present invention provides a side-view stereoscopic structural schematic diagram of a mainboard function tester.

[0021] Figure 4 The present invention provides a three-dimensional structural schematic diagram of a mainboard function tester with a protective plate removed.

[0022] Figure 5 The present invention provides a bottom-up stereoscopic structural schematic diagram of a mainboard function tester.

[0023] Figure 6 The present invention provides a cross-sectional three-dimensional structural schematic diagram of a test platform in a mainboard function tester.

[0024] Figure 7 The present invention provides a schematic cross-sectional three-dimensional structure diagram of a hollow cylinder in a motherboard function tester.

[0025] Figure 8 The present invention proposes a motherboard function tester Figure 2 A in the figure is an enlarged schematic diagram of the three-dimensional structure.

[0026] Fig. 9 The present invention proposes a motherboard function tester Figure 5 B is a schematic diagram of the enlarged three-dimensional structure.

[0027] Legend: 1. Test platform; 2. Bidirectional lead screw; 201. Sleeve; 202. Connecting plate; 203. Hollow cylinder; 204. Round plate; 205. Spring; 206. Transmission rod; 207. Fixing plate; 208. Sponge gasket; 209. Notch; 210. First handle; 3. First telescopic column; 301. Second telescopic column; 302. Horizontal plate; 303. First adjustment plate; 304. Second adjustment plate; 305. Limiting nail; 4. Slide rail; 401. Slide plate; 402. Instrument box; 403. Slide cylinder; 404. Threaded rod; 405. First mounting plate; 406. Second handle; 407. Second mounting plate; 408. Metal spring; 409. Bidirectional motor; 410. Rotating rod; 411. Gear; 412. Rack; 413. Protective plate. DETAILED DESCRIPTION

[0028] In order to more clearly understand the above-mentioned purpose, features and advantages of the present invention, the present invention is further described below in conjunction with the accompanying drawings and embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

[0029] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways than those described herein. Therefore, the present invention is not limited to the specific embodiments of the following disclosure.

[0030] See also Figures 1 to 9 The present embodiment provides a motherboard function test machine, which includes a test platform 1; a bidirectional screw rod 2, which is arranged on both sides of the inner wall of the test platform 1 through a bearing, and two sleeves 201 are threadedly sleeved on the outer surface of the bidirectional screw rod 2; two connecting plates 202, which are respectively fixedly arranged on the outer surfaces of the two sleeves 201, and one side of the two connecting plates 202 is fixedly arranged with a hollow cylinder 203; two circular plates 204, which are respectively movably embedded in the inner walls of the two hollow cylinders 203, and the two circular plates 20 4 are fixedly provided with transmission rods 206 on opposite sides; two fixing plates 207 are respectively fixedly provided at opposite ends of the two transmission rods 206, and sponge gaskets 208 are fixedly provided at the inner walls of the two fixing plates 207, springs 205 are fixedly provided at the opposite sides of the two circular plates 204, two notches 209 are provided on one side of the test platform 1, and two connecting plates 202 are respectively slidably provided at the inner walls of the two notches 209, and a first handle 210 is fixedly provided on one side of the bidirectional screw rod 2.

[0031] When in use, the two circular plates 204 can slide on the inner walls of the two hollow cylinders 203 respectively, and push the two fixed plates 207 to both sides respectively, and further push the two circular plates 204 through the two transmission rods 206, so that the two circular plates 204 and the inner walls of the two hollow cylinders 203 squeeze the two springs 205. At this time, the two sides of the mainboard to be tested are placed on the inner walls of the two fixed plates 207, and the two fixed plates 207 are loosened. The elastic force generated by the two springs 205 pushes the two circular plates 204, and the two fixed plates 207 are pushed through the two transmission rods 206, so that the two fixed plates 207 clamp the two sides of the mainboard. The two sponge gaskets 208 are soft. When the plate is clamped, the softness of the two sponge gaskets 208 protects both sides of the main board. The outer surface of the bidirectional screw rod 2 has two thread grooves with different rotation directions. The two sleeves 201 are respectively connected to the two different thread grooves, and the two connecting plates 202 can slide on the inner walls of the two slots 209 respectively. Then, when the bidirectional screw rod 2 rotates in different directions, the two sleeves 201 move in relative or opposite directions on their outer surfaces. At this time, the first handle 210 is rotated clockwise to drive the bidirectional screw rod 2 to rotate, so that the two sleeves 201 drive the two connecting plates 202 to move in relative directions, and further the two fixed plates 207 move relative to each other. When the first handle 210 cannot rotate, the main board is fixed.

[0032] See also Figures 1 to 9 In one embodiment, first telescopic columns 3 are fixedly provided at the four corners of one side of the test platform 1, and second telescopic columns 301 are movably sleeved on the outer surfaces of the plurality of first telescopic columns 3, and the plurality of second telescopic columns 301 can slide on the outer surfaces of the plurality of first telescopic columns 3 respectively.

[0033] See also Figures 1 to 9 In one embodiment, multiple second telescopic columns 301 are grouped in pairs, and the outer surfaces of the two groups of second telescopic columns 301 are fixedly sleeved with a horizontal plate 302. Two first adjustment plates 303 are fixedly arranged on one side of the test platform 1, and one side of the two first adjustment plates 303 is movably sleeved with a second adjustment plate 304. One side of the two second adjustment plates 304 is respectively fixedly arranged on one side of the two horizontal plates 302. The two limiting nails 305 are removed from the two second adjustment plates 304. At this time, the gravity of the two slide rails 4 pushes the multiple second telescopic columns 301, further reducing the height of the two slide rails 4. At this time, it is convenient to replace the test instruments inside the two instrument boxes 402. After the replacement is completed, the two slide rails 4 are lifted up. After the two slide rails 4 reach the maximum point, the two limiting nails 305 are inserted into the two second adjustment plates 304 to fix the positions of the two second adjustment plates 304, and the positions of the multiple second telescopic columns 301 are fixed by the two horizontal plates 302, and the positions of the two slide rails 4 are further fixed.

[0034] See also Figures 1 to 9 In one embodiment, a limiting nail 305 is movably embedded on one side of the two second adjustment plates 304, and the two limiting nails 305 are movably embedded in one side of the two first adjustment plates 303. The two limiting nails 305 can slide on one side of the two first adjustment plates 303 and the two second adjustment plates 304 respectively. By sliding the two limiting nails 305, the positions of the two second adjustment plates 304 can be fixed.

[0035] See also Figures 1 to 9 In one embodiment, a slide rail 4 is fixedly provided on one side of the two sets of second telescopic columns 301, and a protective plate 413 is fixedly provided on one side of the two slide rails 4. The protective plate 413 protects the internal structure thereof and prevents the internal structure from being exposed to the outside and being damaged.

[0036] See also Figures 1 to 9 In one embodiment, a slide plate 401 is slidably provided on one side opposite to the two slide rails 4, and two instrument boxes 402 are provided on one side of the slide plate 401 close to the test platform 1 through a threaded nail, a slide tube 403 is fixedly embedded on one side of the two instrument boxes 402, and threaded rods 404 are threadedly embedded on the inner walls of the two slide tubes 403, and a first mounting plate 405 is movably provided on one side of the two threaded rods 404, and a second handle 406 is fixedly provided on one side of the two threaded rods 404, and the two instrument boxes 402 can be disassembled and installed by rotating the screws, and the two second handles 406 are rotated counterclockwise to make the two threaded rods 404 slide on the inner walls of the two slide tubes 403, further pushing the two threaded rods 404 to move toward the side of the two second mounting plates 407, and when the two second handles 406 cannot be rotated, the two first mounting plates 405 and the two second mounting plates 407 fix the two test instruments inside the two instrument boxes 402.

[0037] See also Figures 1 to 9 In one embodiment, metal springs 408 are fixedly provided on the inner walls of the two instrument boxes 402, and a second mounting plate 407 is fixedly provided on one side of the two metal springs 408. The two second mounting plates 407 are respectively slidably provided on the inner walls of the two instrument boxes 402. The two metal springs 408 have elastic force, and the two second mounting plates 407 can slide on the inner walls of the two instrument boxes 402 respectively. By sliding the two second mounting plates 407, the two instruments used for testing are respectively placed in the middle of the two first mounting plates 405 and the two second mounting plates 407. At this time, the elastic force of the two metal springs 408 pushes the two second mounting plates 407, so that the two first mounting plates 405 and the two second mounting plates 407 respectively clamp two different test instruments.

[0038] See also Figures 1 to 9In one embodiment, a bidirectional motor 409 is installed on one side of the skateboard 401, and a rotating rod 410 is fixedly provided on the output shaft of the bidirectional motor 409, and a gear 411 is fixedly provided on the outer surface of the rotating rod 410. When the external power switch of the bidirectional motor 409 is turned on, the output shaft of the bidirectional motor 409 can rotate forward and reverse, and then the output shaft of the bidirectional motor 409 drives the rotating rod 410 to rotate, and further drives the rack 412 to move through the gear 411, so that the skateboard 401 slides. At this time, the direction of rotation of the output shaft of the bidirectional motor 409 is controlled so that one of the instrument boxes 402 is on the upper side of the main board. At this time, the instrument inside one of the instrument boxes 402 can be controlled to test the main board. After the test is completed, the direction of rotation of the output shaft of the bidirectional motor 409 is controlled again so that the other instrument box 402 is on the upper side of the main board. At this time, the instrument inside the other instrument box 402 can be controlled to test the main board.

[0039] See also Figures 1 to 9 In one embodiment, a rack 412 is meshed on the outer surface of the gear 411, and the rack 412 is fixedly disposed on one side of the slide 401. When the gear 411 rotates, the rack 412 is driven to move, and the slide 401 is further moved to different positions.

[0040] Working principle: When using the testing machine to test the motherboard, the two circular plates 204 can slide on the inner walls of the two hollow cylinders 203 respectively, and push the two fixed plates 207 to both sides respectively, and further push the two circular plates 204 through the two transmission rods 206, so that the two circular plates 204 and the inner walls of the two hollow cylinders 203 squeeze the two springs 205. At this time, the two sides of the motherboard to be tested are placed on the inner walls of the two fixed plates 207, and the two fixed plates 207 are loosened. The elastic force generated by the two springs 205 pushes the two circular plates 204, and the two fixed plates 207 are pushed through the two transmission rods 206, so that the two fixed plates 207 clamp the two sides of the motherboard. The two sponge gaskets 208 are soft. When the two fixed plates 207 clamp the motherboard, the softness of the two sponge gaskets 208 is very important. The two sides of the main board are protected, and the outer surface of the bidirectional screw rod 2 has two thread grooves with different rotation directions. The two sleeves 201 are respectively connected to the two different thread grooves, and the two connecting plates 202 can slide on the inner walls of the two notches 209 respectively, so that when the bidirectional screw rod 2 rotates in different directions, the two sleeves 201 move in relative or opposite directions on their outer surfaces. At this time, the first handle 210 is rotated clockwise to drive the bidirectional screw rod 2 to rotate, so that the two sleeves 201 drive the two connecting plates 202 to move in relative directions, and further the two fixing plates 207 move relative to each other. When the first handle 210 cannot be rotated, the main board is fixed, so that when the test machine is used to test the main board, it is convenient and simple to fix the main board on the test machine, and main boards of different sizes can be fixed, thereby improving the practicality of the test machine; When testing the mainboard, the two metal springs 408 have elastic force, and the two second mounting plates 407 can slide on the inner walls of the two instrument boxes 402 respectively. By sliding the two second mounting plates 407, the two instruments used for testing are placed in the middle of the two first mounting plates 405 and the two second mounting plates 407 respectively. At this time, the elastic force of the two metal springs 408 pushes the two second mounting plates 407, so that the two first mounting plates 405 and the two second mounting plates 407 clamp two different test instruments respectively. At this time, the two second handles 406 are rotated counterclockwise to make the two threaded rods 404 slide on the inner walls of the two slide cylinders 403, further pushing the two threaded rods 404 to move toward the side of the two second mounting plates 407. When the two second handles 406 cannot be rotated, the two first mounting plates 405 and the two second mounting plates 407 fix the two test instruments on the two instrument boxes 402. 401 is a kind of sliding plate 402, which is a kind of sliding plate 403. The sliding plate 401 ... When using the testing machine, multiple second telescopic columns 301 can slide on the outer surfaces of multiple first telescopic columns 3 respectively. When in use, by removing the two limit pins 305 from the two second adjustment plates 304, the gravity of the two slide rails 4 pushes the multiple second telescopic columns 301, and further reduces the height of the two slide rails 4. At this time, it is convenient to replace the test instruments inside the two instrument boxes 402. After the replacement is completed, by lifting the two slide rails 4 upwards, after the two slide rails 4 reach the maximum point, the two limit pins 305 are inserted into the two second adjustment plates 304 to fix the positions of the two second adjustment plates 304, and the positions of the multiple second telescopic columns 301 are fixed by the two cross plates 302, and the positions of the two slide rails 4 are further fixed. Therefore, when using the testing machine, the height of the two slide rails 4 can be adjusted, which is convenient for use.

[0041] The above description is only a preferred embodiment of the present invention and does not limit the present invention in other forms. Any technician familiar with the profession may use the technical content disclosed above to change or modify it into an equivalent embodiment with equivalent changes and apply it to other fields. However, any simple modification, equivalent change and modification made to the above embodiment based on the technical essence of the present invention without departing from the content of the technical solution of the present invention still falls within the protection scope of the technical solution of the present invention.

Claims

1. A motherboard function tester, characterized in that: The test machine includes: Test platform (1); A bidirectional screw rod (2) is arranged on both sides of the inner wall of the test platform (1) via bearings, and two sleeves (201) are threadedly sleeved on the outer surface of the bidirectional screw rod (2); Two connecting plates (202) are respectively fixedly arranged on the outer surfaces of the two sleeves (201), and a hollow cylinder (203) is fixedly arranged on one side of the two connecting plates (202); Two circular plates (204) are movably embedded in the inner walls of the two hollow cylinders (203), and transmission rods (206) are fixedly arranged on opposite sides of the two circular plates (204); The two fixing plates (207) are respectively fixedly arranged at opposite ends of the two transmission rods (206), and sponge gaskets (208) are fixedly arranged on the inner walls of the two fixing plates (207).

2. A motherboard function tester according to claim 1, characterized in that: A spring (205) is fixedly provided on one side of the two circular plates (204) facing away from each other, two notches (209) are provided on one side of the test platform (1), the two connecting plates (202) are slidably provided on the inner walls of the two notches (209), and a first handle (210) is fixedly provided on one side of the bidirectional screw rod (2).

3. A motherboard function tester according to claim 1, characterized in that: First telescopic columns (3) are fixedly arranged at four corners of one side of the test platform (1), and second telescopic columns (301) are movably sleeved on the outer surfaces of a plurality of the first telescopic columns (3).

4. A motherboard function tester according to claim 3, characterized in that: A plurality of the second telescopic columns (301) are grouped in pairs, and the outer surfaces of the two groups of the second telescopic columns (301) are fixedly sleeved with a transverse plate (302). Two first adjustment plates (303) are fixedly provided on one side of the test platform (1), and one side of the two first adjustment plates (303) is movably sleeved with a second adjustment plate (304), and one side of the two second adjustment plates (304) is respectively fixedly provided on one side of the two transverse plates (302).

5. A motherboard function tester according to claim 4, characterized in that: One side of the two second adjustment plates (304) is movably embedded with a limiting pin (305), and the two limiting pins (305) are movably embedded in one side of the two first adjustment plates (303).

6. A motherboard function tester according to claim 4, characterized in that: A slide rail (4) is fixedly provided on one side of each of the two groups of the second telescopic columns (301), and a protective plate (413) is fixedly provided on one side of the two slide rails (4).

7. A motherboard function tester according to claim 6, characterized in that: A slide plate (401) is slidably provided on one side opposite to the two slide rails (4); two instrument boxes (402) are provided on one side of the slide plate (401) close to the test platform (1) via threaded nails; a slide cylinder (403) is fixedly embedded on one side of the two instrument boxes (402); threaded rods (404) are threadedly embedded on the inner walls of the two slide cylinders (403); a first mounting plate (405) is movably provided on one side of the two threaded rods (404); and a second handle (406) is fixedly provided on one side of the two threaded rods (404).

8. A motherboard function tester according to claim 7, characterized in that: Metal springs (408) are fixedly arranged on the inner walls of the two instrument boxes (402), a second mounting plate (407) is fixedly arranged on one side of the two metal springs (408), and the two second mounting plates (407) are respectively slidably arranged on the inner walls of the two instrument boxes (402).

9. A motherboard function tester according to claim 8, characterized in that: A bidirectional motor (409) is installed on one side of the slide plate (401), a rotating rod (410) is fixedly provided on the output shaft of the bidirectional motor (409), and a gear (411) is fixedly sleeved on the outer surface of the rotating rod (410).

10. A motherboard function tester according to claim 9, characterized in that: The outer surface of the gear (411) is meshed with a rack (412), and the rack (412) is fixedly arranged on one side of the slide plate (401).

Images