Method and system for improving ADC linearity

Abstract

The invention discloses a method and system for improving the linearity of an ADC, and relates to the technical field of analog-to-digital conversion, and the method comprises the steps: calibrating and recording capacitance ratio mismatch information, creating a correction table, and generating a correction coefficient; implementing a correction algorithm and dynamically adjusting a correction coefficient; the temperature of the working environment of the ADC is monitored in real time, a temperature compensation algorithm is implemented, and the influence of the temperature on the capacitor performance is compensated. According to the method, the accuracy of the subsequent correction process is ensured, the problem of capacitance ratio mismatch is solved in a targeted manner, ADC linearity errors caused by capacitance inconsistency are reduced, the initial linearity of the ADC is improved, the ADC can better adapt to the change of signal amplitude, high linearity is maintained, nonlinear errors are reduced, and the accuracy of the ADC is improved. According to the invention, the overall conversion precision of the ADC is improved, the influence of temperature on the performance of the capacitor is compensated, the capacitance change caused by temperature fluctuation is reduced, the linearity of the ADC is stabilized, and high-precision conversion under different temperature conditions is ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of analog-to-digital conversion, and in particular to a method and system for improving ADC linearity. Background Art

[0002] With the continuous advancement of information technology, analog-to-digital converters (ADCs) play a vital role in many fields such as communications, medical treatment, and aerospace. The linearity of ADCs is one of the key indicators to measure their performance. It is directly related to conversion accuracy and signal quality. In the past few decades, researchers have conducted a lot of research on improving ADC linearity and proposed a variety of technical solutions, including the optimization design of capacitor arrays, the improvement of analog front-end circuits, and the application of digital calibration algorithms. The development of these technologies has improved the linearity of ADCs to a certain extent, but it still faces bottlenecks in accuracy improvement and challenges in practical applications.

[0003] The existing related technologies have the following deficiencies in improving ADC linearity: First, the traditional capacitance ratio mismatch calibration method often relies on a fixed correction table. This static correction method cannot adapt to the performance changes of the capacitor in actual work due to process deviations, aging and other factors, thereby limiting the further improvement of linearity. The existing correction algorithms lack dynamics in adjusting the correction coefficients. Once environmental conditions change, such as temperature fluctuations, these algorithms are difficult to respond in real time, resulting in a decrease in the correction effect. Although some technologies have attempted to compensate for temperature changes, they often lack real-time monitoring of the ADC working environment temperature, resulting in poor implementation of the temperature compensation algorithm. These problems make the existing technologies obviously insufficient in dynamic adaptability and environmental adaptability, and cannot achieve the ideal linearity improvement effect. The present invention calibrates and records capacitance ratio mismatch information, creates a dynamic correction table, and implements real-time monitoring and temperature compensation algorithms, thereby opening up a new technical path for improving ADC linearity. Summary of the invention

[0004] In view of the above-mentioned problems, the present invention is proposed.

[0005] Therefore, the technical problem solved by the present invention is: the existing analog-to-digital conversion technology has the problems of static capacitance ratio mismatch correction, insufficient dynamics in correction coefficient adjustment, poor implementation effect of temperature compensation algorithm, and how to achieve real-time dynamic adjustment of correction coefficient and accurate temperature compensation.

[0006] To solve the above technical problems, the present invention provides the following technical solutions: a method for improving ADC linearity, comprising calibrating and recording capacitance ratio mismatch information, creating a correction table and generating correction coefficients; implementing a correction algorithm and dynamically adjusting the correction coefficients; real-time monitoring of the temperature of the ADC working environment, implementing a temperature compensation algorithm, and compensating for the influence of temperature on capacitor performance.

[0007] As a preferred solution of the method for improving ADC linearity of the present invention, wherein: the calibration and recording of capacitance ratio mismatch information includes recording the actual capacitance values ​​and expected capacitance values ​​of N capacitors, recording the capacitance ratio mismatch information of each capacitor through a correction table, including the difference between the actual value and the expected value of each capacitor; for each capacitor, measuring the actual capacitance value C i , and record the capacitance ratio mismatch information M i , expressed as:

[0008]

[0009] Among them, C exp,i is the actual value of the capacitor.

[0010] As a preferred solution of the method for improving ADC linearity of the present invention, wherein: the generating of the correction coefficient includes creating the correction coefficient K of each capacitor by measuring the nonlinear error and calculating the corresponding correction value. i , expressed as:

[0011]

[0012] Among them, E i is the nonlinear error.

[0013] As a preferred solution of the method for improving ADC linearity of the present invention, the implementation of the correction algorithm includes implementing the correction algorithm in the digital part of the digital-to-analog converter ADC, selecting a corresponding correction coefficient according to the amplitude of the input signal and the capacitance ratio mismatch information, and applying it to the analog input value to correct the nonlinear error; the amplitude of the input signal is V in , the correction factor selected is K selected,i , then the corrected output V out It is expressed as:

[0014]

[0015] Among them, K selected,i is the selected correction coefficient, which is interpolated or dynamically adjusted based on the input signal amplitude and capacitance ratio mismatch information, and N is the number of capacitors.

[0016] As a preferred solution of the method for improving ADC linearity of the present invention, the dynamic adjustment of the correction coefficient includes real-time monitoring of the change in capacitance ratio mismatch when the bias voltage of the capacitor changes during the operation of the digital-to-analog converter ADC, and calculating the real-time change in capacitance ratio mismatch by measuring the actual capacitance value of the capacitor and comparing it with the expected value at the time of initial calibration. The real-time capacitance ratio mismatch change of each capacitor is ΔM. i , expressed as:

[0017] ΔM i =C i -C exp,i

[0018] Based on the real-time monitoring of the change in capacitance ratio mismatch, adaptive correction is achieved by adjusting the correction parameter, which is K adaptive,i , then the dynamically adjusted correction parameter is expressed as:

[0019] K adaptive,i =K initial,i +α·ΔM i

[0020] Among them, K initial,i is the initial correction parameter, α is the coefficient of adaptive adjustment, which affects the speed of adjustment; the dynamically adjusted correction parameter is applied to the correction algorithm to adjust the nonlinear error, and the modified correction algorithm is expressed as:

[0021]

[0022] Among them, K selected,i is the selected correction factor that is dynamically adjusted based on the input signal amplitude and real-time monitored changes.

[0023] As a preferred solution of the method for improving ADC linearity described in the present invention, wherein: the implementation of the temperature compensation algorithm includes integrating a temperature sensor to monitor the ambient temperature of the ADC working environment, implementing the temperature compensation algorithm in the digital part of the digital-to-analog converter ADC, the temperature compensation algorithm adjusts the temperature correction parameter according to the temperature change, and applies the temperature correction parameter to the analog input value to correct the nonlinear error; the temperature correction parameter K temperature,i represents the temperature correction parameter of the i-th capacitor, including a set of values ​​obtained in advance, which represent the influence of each capacitor at different temperatures; the temperature compensation algorithm adjusts the correction parameter based on the change of ambient temperature, and the dynamically adjusted temperature correction parameter K temperature,adaptive,i , expressed as:

[0024] K temperature,adaptive,i =K temperature,i ·(1+β·(T ambient -T reference ))

[0025] Where β is the sensitivity coefficient of temperature adjustment, which indicates the influence of temperature change on the correction parameters. reference is the reference temperature, T ambient Fixed temperature value.

[0026] As a preferred solution of the method for improving ADC linearity described in the present invention, the implementation of the temperature compensation algorithm also includes modifying the expression of the correction algorithm based on the temperature compensated correction algorithm, introducing the temperature compensation parameter, and adjusting the nonlinear error caused by the temperature change. The modified correction algorithm is expressed as:

[0027]

[0028] Among them, K selected,i is the selected correction factor, which is dynamically adjusted based on the input signal amplitude and real-time monitoring changes, K temperature,adaptive,i It is a temperature correction parameter based on temperature compensation.

[0029] Another object of the present invention is to provide a system for improving ADC linearity, which can solve the problems of static correction coefficients, inflexible adjustment and accumulation of nonlinear errors in the current analog-to-digital conversion technology by implementing a correction algorithm and dynamically adjusting the correction coefficients.

[0030] As a preferred solution of the system for improving ADC linearity described in the present invention, it includes: an information recording module, a correction coefficient adjustment module, and a temperature compensation module.

[0031] The information recording module is used to calibrate and record capacitance ratio mismatch information, create a correction table and generate a correction coefficient; the correction coefficient adjustment module is used to implement a correction algorithm and dynamically adjust the correction coefficient; the temperature compensation module is used to monitor the temperature of the ADC working environment in real time, implement a temperature compensation algorithm, and compensate for the impact of temperature on capacitor performance.

[0032] A computer device comprises a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of a method for improving ADC linearity.

[0033] A computer-readable storage medium stores a computer program, which implements the steps of a method for improving ADC linearity when executed by a processor.

[0034] Beneficial effects of the present invention: The method for improving ADC linearity provided by the present invention calibrates and records capacitance ratio mismatch information, creates a correction table and generates a correction coefficient, accurately identifies and records the difference between the actual capacitance value and the expected capacitance value of each capacitor, ensures the accuracy of the subsequent correction process, helps to solve the capacitance ratio mismatch problem in a targeted manner, reduces the ADC linearity error caused by capacitance inconsistency, thereby improving the initial linearity of the ADC, implements a correction algorithm and dynamically adjusts the correction coefficient, improves the flexibility and adaptability of the correction, enables the ADC to better adapt to changes in signal amplitude, thereby maintaining high linearity, effectively reduces nonlinear errors and improves the overall conversion accuracy of the ADC through the implementation of the correction algorithm, monitors the temperature of the ADC working environment in real time, implements a temperature compensation algorithm, compensates for the influence of temperature on capacitor performance, effectively compensates for the influence of temperature on capacitor performance, reduces the capacitance value change caused by temperature fluctuations through temperature compensation, thereby stabilizing the linearity of the ADC, and ensures high-precision conversion under different temperature conditions, and the present invention achieves better results in improving ADC linearity, enhancing environmental adaptability and improving dynamic response capabilities. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0036] Figure 1 An overall flow chart of a method for improving ADC linearity provided by the first embodiment of the present invention.

[0037] Figure 2 An overall flow chart of a system for improving ADC linearity provided by the third embodiment of the present invention. DETAILED DESCRIPTION

[0038] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the drawings of the specification. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary persons in the art without creative work should fall within the scope of protection of the present invention.

[0039] Example 1, reference Figure 1 , is an embodiment of the present invention, and provides a method for improving ADC linearity, comprising:

[0040] S1: Calibrate and record capacitance ratio mismatch information, create a correction table and generate correction coefficients.

[0041] Furthermore, calibrating and recording the capacitance ratio mismatch information includes recording the actual capacitance values ​​and the expected capacitance values ​​of N capacitors, recording the capacitance ratio mismatch information of each capacitor through a correction table, including the difference between the actual value and the expected value of each capacitor; for each capacitor, measuring the actual capacitance value C i , and record the capacitance ratio mismatch information M i , expressed as:

[0042]

[0043] Among them, C exp,i is the actual value of the capacitor.

[0044] It should be noted that generating the correction coefficient includes creating a correction coefficient K for each capacitor by measuring the nonlinear error and calculating the corresponding correction value. i , expressed as:

[0045]

[0046] Among them, E i is the nonlinear error.

[0047] It should also be noted that calibrating and recording the capacitance ratio mismatch information, creating a correction table and generating correction coefficients, accurately identifying and recording the difference between the actual capacitance value and the expected capacitance value of each capacitor, ensures the accuracy of the subsequent correction process, helps to solve the capacitance ratio mismatch problem in a targeted manner, and reduces the ADC linearity error caused by capacitance inconsistency, thereby improving the initial linearity of the ADC.

[0048] S2: Implement the correction algorithm and dynamically adjust the correction coefficients.

[0049] Furthermore, implementing the correction algorithm includes implementing the correction algorithm in the digital part of the digital-to-analog converter ADC, selecting a corresponding correction coefficient according to the amplitude of the input signal and the capacitance ratio mismatch information, and applying it to the analog input value to correct the nonlinear error; the amplitude of the input signal is V in , the correction factor selected is K selected,i , then the corrected output V out It is expressed as:

[0050]

[0051] Among them, K selected,i is the selected correction coefficient, which is interpolated or dynamically adjusted based on the input signal amplitude and capacitance ratio mismatch information, and N is the number of capacitors.

[0052] It should be noted that the dynamic adjustment of the correction coefficient includes real-time monitoring of the change in capacitance ratio mismatch when the bias voltage to which the capacitor is subjected changes during the operation of the digital-to-analog converter ADC, and calculating the real-time change in capacitance ratio mismatch by measuring the actual capacitance value of the capacitor and comparing it with the expected value at the time of initial calibration. The real-time capacitance ratio mismatch change of each capacitor is ΔM. i , expressed as:

[0053] ΔM i =C i -C exp,i

[0054] Based on the real-time monitoring of the change in capacitance ratio mismatch, adaptive correction is achieved by adjusting the correction parameter, which is K adaptive,i , then the dynamically adjusted correction parameter is expressed as:

[0055] K adaptive,i =K initial,i +α·ΔM i

[0056] Among them, K initial,i is the initial correction parameter, α is the coefficient of adaptive adjustment, which affects the speed of adjustment; the dynamically adjusted correction parameter is applied to the correction algorithm to adjust the nonlinear error, and the modified correction algorithm is expressed as:

[0057]

[0058] Among them, K selected,i is the selected correction factor that is dynamically adjusted based on the input signal amplitude and real-time monitored changes.

[0059] It should also be noted that the implementation of the correction algorithm and the dynamic adjustment of the correction coefficient improve the flexibility and adaptability of the correction, so that the ADC can better adapt to changes in signal amplitude, thereby maintaining high linearity. Through the implementation of the correction algorithm, the nonlinear error is effectively reduced and the overall conversion accuracy of the ADC is improved.

[0060] S3: Monitor the temperature of the ADC working environment in real time and implement a temperature compensation algorithm to compensate for the effect of temperature on capacitor performance.

[0061] Furthermore, implementing the temperature compensation algorithm includes integrating a temperature sensor to monitor the ambient temperature of the ADC working environment, implementing the temperature compensation algorithm in the digital part of the digital-to-analog converter ADC, the temperature compensation algorithm adjusting the temperature correction parameter according to the temperature change, and applying the temperature correction parameter to the analog input value to correct the nonlinear error; the temperature correction parameter K temperature,irepresents the temperature correction parameter of the ith capacitor, including a set of values ​​obtained in advance, indicating the influence of each capacitor at different temperatures; the temperature compensation algorithm adjusts the correction parameter based on the change of ambient temperature, and the dynamically adjusted temperature correction parameter K temperature,adaptive,i , expressed as:

[0062] K temperature,adaptive,i =K temperature,i ·(1+β·(T ambient -T reference ))

[0063] Where β is the sensitivity coefficient of temperature adjustment, which indicates the influence of temperature change on the correction parameters. reference is the reference temperature, T ambient Fixed temperature value.

[0064] It should be noted that the implementation of the temperature compensation algorithm also includes modifying the expression of the correction algorithm based on the temperature compensation, introducing the temperature compensation parameters, and adjusting the nonlinear error caused by the temperature change. The modified correction algorithm is expressed as:

[0065]

[0066] Among them, K selected,i is the selected correction factor, which is dynamically adjusted based on the input signal amplitude and real-time monitoring changes, K temperature,adaptive,i It is a temperature correction parameter based on temperature compensation.

[0067] It should also be noted that the temperature of the ADC working environment is monitored in real time, and a temperature compensation algorithm is implemented to compensate for the effect of temperature on the performance of the capacitor. This effectively compensates for the effect of temperature on the performance of the capacitor. Through temperature compensation, the change in capacitance value caused by temperature fluctuations is reduced, thereby stabilizing the linearity of the ADC and ensuring high-precision conversion under different temperature conditions.

[0068] Embodiment 2 is an embodiment of the present invention, which provides a method for improving ADC linearity. In order to verify the beneficial effects of the present invention, scientific demonstration is carried out through economic benefit calculation and simulation experiments.

[0069] Firstly, six standard capacitors were selected for the experiment, each with a nominal value of 100pF. The actual capacitance value of each capacitor was measured using high-precision measuring equipment and recorded in a table. Then, the capacitance ratio mismatch information of each capacitor was calculated, which reflects the difference between the actual capacitance value and the expected value. According to the measured capacitance ratio mismatch information, a correction coefficient was generated to compensate for the nonlinear error. A correction algorithm was implemented in the digital processing part of the ADC, which dynamically selected the correction coefficient according to the amplitude of the input signal and the capacitance ratio mismatch information. In order to monitor and compensate for the influence of temperature changes on the performance of the capacitor, a temperature sensor was integrated to monitor the working environment temperature of the ADC in real time, and a temperature compensation algorithm was implemented. During the entire experimental process, the bias voltage changes of the capacitor and the capacitance ratio mismatch changes caused by the changes were monitored in real time. Based on these real-time data, dynamic correction was achieved by adaptively adjusting the correction parameters. The correction algorithm was adjusted to take into account the influence of temperature changes on the correction parameters, thereby optimizing the conversion accuracy of the ADC. In summary, the present invention can effectively correct the nonlinear error of the capacitor and has advantages in improving the conversion accuracy of the ADC.

[0070] Example 3, reference Figure 2 , as an embodiment of the present invention, provides a system for improving ADC linearity, including an information recording module, a correction coefficient adjustment module, and a temperature compensation module.

[0071] The information recording module is used to calibrate and record the capacitance ratio mismatch information, create a correction table and generate correction coefficients; the correction coefficient adjustment module is used to implement the correction algorithm and dynamically adjust the correction coefficient; the temperature compensation module is used to monitor the temperature of the ADC working environment in real time, implement the temperature compensation algorithm, and compensate for the impact of temperature on capacitor performance.

[0072] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the methods of each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0073] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in conjunction with such instruction execution systems, devices or apparatuses. For the purposes of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in conjunction with such instruction execution systems, devices or apparatuses.

[0074] More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or more wires (electronic device), a portable computer disk case (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be a paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, deciphering, or processing in another suitable manner as necessary, and then stored in a computer memory.

[0075] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, multiple steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc. It should be noted that the above embodiments are only used to illustrate the technical solution of the present invention and are not limited. Although the present invention is described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that the technical solution of the present invention can be modified or replaced by equivalents without departing from the spirit and scope of the technical solution of the present invention, which should be included in the scope of the claims of the present invention.

[0076] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

Claims

1. A method for improving ADC linearity, characterized in that: include: Calibrate and record capacitance ratio mismatch information, create correction tables and generate correction coefficients; Implement correction algorithms and dynamically adjust correction coefficients; Monitor the temperature of the ADC working environment in real time and implement a temperature compensation algorithm to compensate for the impact of temperature on capacitor performance.

2. The method for improving ADC linearity according to claim 1, wherein: The calibrating and recording the capacitance ratio mismatch information includes recording the actual capacitance values ​​and the expected capacitance values ​​of the N capacitors, and recording the capacitance ratio mismatch information of each capacitor through a correction table, including the difference between the actual value and the expected value of each capacitor; For each capacitor, measure the actual capacitance value C i , and record the capacitance ratio mismatch information M i , expressed as: Among them, C exp,i is the actual value of the capacitor.

3. The method for improving ADC linearity according to claim 2, wherein: Generating the correction coefficient includes creating a correction coefficient K for each capacitor by measuring the nonlinear error and calculating the corresponding correction value. i , expressed as: Among them, E i is the nonlinear error.

4. The method for improving ADC linearity as claimed in claim 3, characterized in that: The implementation of the correction algorithm includes implementing the correction algorithm in the digital part of the digital-to-analog converter ADC, selecting a corresponding correction coefficient according to the amplitude of the input signal and the capacitance ratio mismatch information, and applying it to the analog input value to correct the nonlinear error; The input signal amplitude is V in , the correction factor selected is K selected,i , then the corrected output V out It is expressed as: Among them, K selected,i is the selected correction coefficient, which is interpolated or dynamically adjusted based on the input signal amplitude and capacitance ratio mismatch information, and N is the number of capacitors.

5. The method for improving ADC linearity according to claim 4, wherein: The dynamic adjustment correction coefficient includes monitoring the change of the capacitance ratio mismatch when the bias voltage of the capacitor changes in real time during the operation of the digital-to-analog converter ADC, and calculating the real-time change of the capacitance ratio mismatch by measuring the actual capacitance value of the capacitor and comparing it with the expected value during the initial calibration. The real-time capacitance ratio mismatch change of each capacitor is ΔM. i , expressed as: ΔM i =C i -C exp,i Based on the real-time monitoring of the change in capacitance ratio mismatch, adaptive correction is achieved by adjusting the correction parameter, which is K adaptive,i , then the dynamically adjusted correction parameter is expressed as: K adaptive,i =K initial,i +α·ΔM i Among them, K initial,i is the initial correction parameter, α is the coefficient of adaptive adjustment, which affects the speed of adjustment; The dynamically adjusted correction parameters are applied to the correction algorithm to adjust the nonlinear error. The modified correction algorithm is expressed as: Among them, K selected,i is the selected correction factor that is dynamically adjusted based on the input signal amplitude and real-time monitored changes.

6. The method for improving ADC linearity according to claim 5, wherein: The implementation of the temperature compensation algorithm includes integrating a temperature sensor to monitor the ambient temperature of the ADC working environment, implementing the temperature compensation algorithm in the digital part of the digital-to-analog converter ADC, the temperature compensation algorithm adjusting the temperature correction parameter according to the temperature change, and applying the temperature correction parameter to the analog input value to correct the nonlinear error; Temperature correction parameter K temperature,i represents the temperature correction parameter of the ith capacitor, including a set of values ​​obtained by pre-calibration, representing the effect of each capacitor at different temperatures; The temperature compensation algorithm adjusts the correction parameters based on the change of ambient temperature. The temperature correction parameter K is dynamically adjusted. temperature,adaptive,i , expressed as: K temperature,adaptive,i =K temperature,i ·(1+β·(T ambient -T reference )) Where β is the sensitivity coefficient of temperature adjustment, which indicates the influence of temperature change on the correction parameters. reference is the reference temperature, T ambient Fixed temperature value.

7. The method for improving ADC linearity according to claim 6, wherein: The implementation of the temperature compensation algorithm also includes modifying the expression of the correction algorithm based on the temperature compensated correction algorithm, introducing temperature compensation parameters, and adjusting the nonlinear error caused by temperature change. The modified correction algorithm is expressed as: Among them, K selected,i is the selected correction factor, which is dynamically adjusted based on the input signal amplitude and real-time monitoring changes, K temperature,adaptive,i It is a temperature correction parameter based on temperature compensation.

8. A system using the method for improving ADC linearity as claimed in any one of claims 1 to 7, characterized in that: It includes information recording module, correction coefficient adjustment module and temperature compensation module; The information recording module is used to calibrate and record capacitance ratio mismatch information, create a correction table and generate a correction coefficient; The correction coefficient adjustment module is used to implement the correction algorithm and dynamically adjust the correction coefficient; The temperature compensation module is used to monitor the temperature of the ADC working environment in real time, implement a temperature compensation algorithm, and compensate for the influence of temperature on capacitor performance.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method for improving ADC linearity according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method for improving ADC linearity according to any one of claims 1 to 7 are implemented.

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