Drive test switching load system and method

Abstract

The invention provides a drive test load switching system and method, and belongs to the technical field of automobile basic software development, and the system comprises a storage module which is in communication connection with an upper computer and is used for obtaining load parameters and storing the load parameters, and a man-machine module which is in communication connection with the upper computer and is used for obtaining to-be-matched load parameters; the to-be-matched load parameters comprise various to-be-tested controller model data and load data of a plurality of to-be-configured drive test case configuration drive loops, the upper computer is in communication connection with the main control MCU and is used for obtaining load configuration information based on the load parameters and the to-be-matched load parameters and obtaining a drive loop configuration load result based on the test data, and the main control MCU is used for receiving the load configuration information and the drive loop configuration load result. And the configuration module is in communication connection with the driving loop and is used for configuring the grouped driving loop based on the load configuration information to obtain test data of the grouped driving loop configuration load. According to the drive test load switching system, the operation process is simplified, and the load switching efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of automobile basic software development, and in particular to a drive test load switching system and method. Background Art

[0002] Solution 1 CN118409914A-HIL test system and method: During HIL testing, the load switching of each channel is controlled separately according to the test signal. The main problems are: the basic software function verification is not completed, the problems cannot be fully exposed, if there is a problem after integration, it takes a lot of effort to troubleshoot and locate the cause of the problem, and the manual test results are easily affected by human factors and the test efficiency is low.

[0003] Solution 2 CN208459849U-A universal automotive electronic control unit functional test system: manual load switching. The main problem is that each test requires setting a load switching signal for each channel, and the test cases are complex and prone to errors. Each test requires setting a load switching signal for each channel, and the test cases are complex and prone to errors. Therefore, since the load type of each drive circuit of different controllers is different, it is necessary to manually switch the load when switching the controller for testing during functional verification. According to the needs of functional verification, connecting a real load or a resistive load to the circuit results in low efficiency of functional verification. Therefore, the prior art has technical problems of cumbersome operation and low efficiency for switching loads in drive tests. Summary of the invention

[0004] In view of this, it is necessary to provide a drive test load switching system and method to solve the technical problems of complicated operation and low efficiency in the prior art for drive test load switching.

[0005] In order to solve the above technical problems, on the one hand, the present invention provides a drive test switching load system, comprising: Storage module, human-machine module, host computer, main control MCU and drive circuit; The storage module is connected to the host computer for communication and is used to obtain and store load parameters; the load parameters are: multiple controller model data and multiple drive test case configuration drive loop load data; The human-machine module is connected to the host computer for communication and is used to obtain the load parameters to be matched; the load parameters to be matched are: multiple controller model data to be tested and multiple drive test cases to be configured to configure the load data of the drive circuit; The host computer is connected to the main control MCU for obtaining load configuration information based on load parameters and load parameters to be matched, and obtaining a load configuration result of the drive circuit based on test data; The main control MCU is connected to the drive circuit for communication, and is used to configure the grouped drive circuits based on the load configuration information, and obtain the test data of the grouped drive circuit configuration loads.

[0006] In a possible implementation, the system further includes: a communication bus for connecting the host computer and the main control MCU.

[0007] In a possible implementation, the system further includes: a display screen, which is communicatively connected to a host computer.

[0008] In a possible implementation, the system further includes: The host computer is used to generate control signals; The controller is connected to the host computer for communication, and is used for receiving the control signal and controlling the drive circuit to configure the load based on the control signal.

[0009] In a possible implementation, the control signal includes: The nominal frequency and duty cycle of the controller's XCP.

[0010] In a possible implementation, the host computer is also used to display the load result of the drive circuit configuration.

[0011] In a possible implementation, the test data of the drive circuit configuration load includes: The current, frequency, duty cycle and voltage of the drive circuit.

[0012] On the other hand, a method for driving and testing a switching load includes: Obtaining load parameters through a storage module and storing the load parameters; the load parameters are: multiple controller model data and multiple drive test case configuration drive loop load data; Obtaining the load parameters to be matched through the human-machine module; the load parameters to be matched are: multiple controller model data to be tested and multiple drive test cases to be configured to configure the load data of the drive circuit; The upper computer obtains the load configuration information based on the load parameters and the load parameters to be matched, and obtains the load configuration result of the drive circuit based on the test data; The main control MCU configures the grouped drive circuits based on the load configuration information to obtain test data of the grouped drive circuit configuration loads.

[0013] In a possible implementation, the step of obtaining load configuration information based on the load parameter and the load parameter to be matched includes: Data matching is performed based on the load parameters and the load parameters to be matched to obtain load configuration information.

[0014] In a possible implementation, obtaining the drive circuit configuration load result based on the test data includes: The test data is matched with the preset standard threshold to obtain the drive circuit configuration load result.

[0015] The beneficial effects of the present invention are as follows: the drive test switching load system provided by the present invention comprises: a storage module, a man-machine module, a host computer, a main control MCU and a drive circuit; the storage module is connected to the host computer for obtaining load parameters and storing load parameters; the load parameters are: multiple controller model data and multiple drive test cases configuring the load data of the drive circuit; the man-machine module is connected to the host computer for obtaining load parameters to be matched; the load parameters to be matched are: multiple controller model data to be tested and multiple drive test cases to be configured configuring the load data of the drive circuit; the host computer is connected to the main control MCU for obtaining load configuration information based on the load parameters and the load parameters to be matched, and obtaining the load configuration result of the drive circuit based on the test data; the main control MCU is connected to the drive circuit for configuring the grouped drive circuit based on the load configuration information, and obtaining the test data of the grouped drive circuit configuration load. The present invention mainly proposes that the drive test switching load system can realize the test data of the drive circuit configuration load automatically through information exchange between the host computer, the main control MCU and the drive circuit, and the drive circuit is grouped in advance to simplify the load configuration process and improve work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 A schematic diagram of the structure of an embodiment of a drive test load switching system provided by the present invention; Figure 2 A schematic diagram of a basic software function verification device for an embodiment of a drive test switching load system provided by the present invention; Figure 3 A schematic diagram of the complex driving function verification principle of an embodiment of the driving test switching load system provided by the present invention; Figure 4 A load control principle diagram of an embodiment of a drive test switching load system provided by the present invention; Figure 5 A schematic diagram of an adjustable simulated load of an embodiment of a drive test switching load system provided by the present invention; Figure 6 A load switching flow chart of an embodiment of a drive test load switching system provided by the present invention; Figure 7 A schematic flow chart of an embodiment of a drive test load switching method provided by the present invention. DETAILED DESCRIPTION

[0018] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0019] In the description of the embodiments of the present application, unless otherwise specified, “plurality” means two or more than two.

[0020] The terms "including" and "having" and any variations thereof in the embodiments of the present invention are intended to cover non-exclusive inclusions. For example, a process, method, apparatus, product or equipment comprising a series of steps or modules is not necessarily limited to those steps or modules clearly listed, but may include other steps or modules not clearly listed or inherent to these processes, methods, products or equipment.

[0021] The naming or numbering of the steps in the embodiments of the present invention does not mean that the steps in the method flow must be executed in the time / logical sequence indicated by the naming or numbering. The execution order of the named or numbered process steps can be changed according to the technical purpose to be achieved, as long as the same or similar technical effects can be achieved.

[0022] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present invention. The appearance of the phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0023] The present invention provides a drive test load switching system and method, which are described below respectively.

[0024] Figure 1 A schematic diagram of the structure of an embodiment of the drive test load switching system provided by the present invention, Figure 2 A basic software function verification device schematic diagram of an embodiment of a drive test switching load system provided by the present invention and Figure 3A schematic diagram of a complex driving function verification principle of an embodiment of a driving test switching load system provided by the present invention includes: Storage module 101, human-machine module 102, host computer 103, main control MCU 104 and drive circuit 105; The storage module 101 is connected to the host computer 103 for acquiring and storing load parameters; the load parameters are: multiple controller model data and multiple drive test case configuration drive loop 105 load data; The human-machine module 102 is connected to the host computer 103 for communication and is used to obtain the load parameters to be matched; the load parameters to be matched are: multiple controller model data to be tested and multiple drive test cases to be configured to configure the load data of the drive circuit 105; The host computer 103 is connected to the main control MCU 104 for obtaining load configuration information based on load parameters and load parameters to be matched, and obtaining load configuration results of the drive circuit 105 based on test data; The main control MCU 104 is connected to the drive circuit 105 for communication, and is used to configure the grouped drive circuits 105 based on the load configuration information, and obtain the test data of the load configured for the grouped drive circuits 105 .

[0025] It can be understood that the specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0026] b) Set the controller model and test case to be tested in the human-machine module 102.

[0027] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0028] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0029] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0030] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0031] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0032] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0033] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0034] It can be further understood that the pin of the load master MCU 104 is connected to the load control loop to control the connection or disconnection of the corresponding load in the drive loop 105. The load connection of the drive loop 1051 of the controller under test is controlled by p1.1, p1.2, and p1.3 of the load master MCU 104. At the same time, p1.1, p1.2, and p1.3 allow at most one pin to output a high level, and the pin that outputs a high level controls the corresponding load to connect to the drive loop 105.

[0035] It can be further understood that the test device can save the settings in groups according to the pre-set load of each drive circuit 105, different controllers correspond to different groups, and the same controller can correspond to multiple different groups. Specifically, as shown in Table 1: Table 1: Drive circuit configuration load table

[0036] It can be understood that the load master MCU 104 controls the relay coil circuit to be energized, controls the corresponding load circuit to be connected, and the corresponding load is connected to the tested controller drive circuit 105. After the connection, the corresponding connection indicator light is on.

[0037] Each drive circuit 105 can be connected to one load at most, and the system will report an error if multiple loads are connected.

[0038] When a simulated load is selected to be connected to the drive circuit 105, one of the switches K1\K2\K3 can be controlled to close by controlling one of the pins L1\L2\L3 to output a high level according to the predefined simulated load parameters, so as to adjust the simulated load parameters connected to the drive circuit 105.

[0039] In the embodiment provided by the present invention, the system further includes: a communication bus for connecting the host computer 103 and the main control MCU 104 .

[0040] It can be understood that the specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0041] b) Set the controller model and test case to be tested in the human-machine module 102.

[0042] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0043] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0044] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0045] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0046] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0047] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0048] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0049] In the embodiment provided by the present invention, the system further includes: a display screen, which is communicatively connected to the host computer 103.

[0050] It can be understood that the specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0051] b) Set the controller model and test case to be tested in the human-machine module 102.

[0052] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0053] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0054] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0055] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0056] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0057] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0058] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0059] Figure 4 A load control principle diagram of an embodiment of a drive test switching load system provided by the present invention includes: The host computer 103 is used to generate a control signal; The controller is connected to the host computer 103 for receiving control signals and controlling the drive circuit 105 to configure the load based on the control signals.

[0060] It can be understood that the specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0061] b) Set the controller model and test case to be tested in the human-machine module 102.

[0062] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0063] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0064] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0065] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0066] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0067] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0068] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0069] Figure 5 A schematic diagram of an adjustable simulated load of an embodiment of a drive test switching load system provided by the present invention includes: The nominal frequency and duty cycle of the controller's XCP.

[0070] It can be understood that the host computer 103 of the complex drive function verification device calibrates the frequency, duty cycle, and drive control switch through XCP to turn on the drive output of the controller under test.

[0071] The specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0072] b) Set the controller model and test case to be tested in the human-machine module 102.

[0073] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0074] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0075] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0076] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0077] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0078] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0079] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0080] In the embodiment provided by the present invention, the host computer 103 is also used to display the load result of the drive circuit 105.

[0081] It can be understood that the specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0082] b) Set the controller model and test case to be tested in the human-machine module 102.

[0083] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0084] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0085] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0086] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0087] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0088] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0089] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0090] Figure 6 A load switching flow chart of an embodiment of a drive test load switching system provided by the present invention includes: Data matching is performed based on the load parameters and the load parameters to be matched to obtain load configuration information.

[0091] It can be understood that the specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0092] b) Set the controller model and test case to be tested in the human-machine module 102.

[0093] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0094] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0095] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0096] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0097] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0098] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0099] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0100] In the embodiment provided by the present invention, the test data of the load configuration of the driving circuit 105 includes: The current, frequency, duty cycle and voltage of the driving circuit 105.

[0101] It is understandable that the signal acquisition module of the test equipment acquires the output signal of the actuator drive circuit 105 and measures the circuit current, voltage, frequency, and duty cycle.

[0102] The specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0103] b) Set the controller model and test case to be tested in the human-machine module 102.

[0104] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0105] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0106] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0107] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0108] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0109] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0110] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0111] In the embodiment provided by the present invention, obtaining the load result of the drive circuit 105 based on the test data includes: Based on matching the test data with a preset standard threshold, a load configuration result of the drive circuit 105 is obtained.

[0112] It can be understood that the expected current, voltage, calibrated frequency, and duty cycle are compared with the collected current, voltage, frequency, and duty cycle to determine whether the drive output signal is consistent with the design.

[0113] The specific steps of the drive test switching load system provided by the present invention are as follows: a) configuring the load of each drive circuit 105 according to the model of the controller under test and the test case, and pre-storing the load configuration information in the load data storage module 101 .

[0114] b) Set the controller model and test case to be tested in the human-machine module 102.

[0115] c) The host computer 103 automatically retrieves the load configuration information that is consistent with the setting of the human-machine module 102 from the load data storage module 101 .

[0116] d) The load configuration information is transmitted to the load master MCU 104 via the communication bus.

[0117] e) Load The main control MCU 104 configures the load of each drive circuit 105 according to the received load configuration information.

[0118] f) The load master MCU 104 transmits the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0119] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0120] Method for determining simulated load parameters: 1. Measure the impedance of the real load, then calculate the maximum current of the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current of the loop.

[0121] 2. The simulated load resistance value is close to the measured real impedance resistance value, and the simulated load power is greater than the calculated minimum power value.

[0122] Figure 7 A schematic flow chart of an embodiment of a method for switching loads for driving test provided by the present invention includes: S701, obtaining load parameters through a storage module and storing the load parameters; the load parameters are: multiple controller model data and multiple drive test case configuration drive loop load data; S702, obtaining load parameters to be matched through the human-machine module; the load parameters to be matched are: multiple controller model data to be tested and multiple drive test cases to be configured to configure the load data of the drive circuit; S703, obtaining load configuration information based on the load parameters and the load parameters to be matched by the host computer, and obtaining the load configuration result of the drive circuit based on the test data; S704 , configuring the grouped drive circuits based on the load configuration information through the main control MCU, and obtaining test data of the grouped drive circuit configuration loads.

[0123] The above is a detailed introduction to the drive test switching load system and method provided by the present invention. Specific examples are used in this article to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea; at the same time, for technical personnel in this field, according to the idea of ​​the present invention, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims

1. A drive test switching load system, characterized in that: include: Storage module, human-machine module, host computer, main control MCU and drive circuit; The storage module is connected to the host computer for communication and is used to obtain and store load parameters; the load parameters are: multiple controller model data and multiple drive test case configuration drive loop load data; The human-machine module is connected to the host computer for communication and is used to obtain the load parameters to be matched; the load parameters to be matched are: multiple controller model data to be tested and multiple drive test cases to be configured to configure the load data of the drive circuit; The host computer is connected to the main control MCU for obtaining load configuration information based on load parameters and load parameters to be matched, and obtaining a load configuration result of the drive circuit based on test data; The main control MCU is connected to the drive circuit for communication, and is used to configure the grouped drive circuits based on the load configuration information, and obtain the test data of the grouped drive circuit configuration loads.

2. The drive test switching load system according to claim 1, characterized in that: The system also includes: a communication bus, which is used to connect the host computer and the main control MCU.

3. The drive test switching load system according to claim 2, characterized in that: The system also includes: a display screen, which is communicatively connected with the host computer.

4. The drive test switching load system according to claim 3, characterized in that: The system further comprises: The host computer is used to generate control signals; The controller is connected to the host computer for communication, and is used for receiving the control signal and controlling the drive circuit to configure the load based on the control signal.

5. The drive test switching load system according to claim 4, characterized in that: The control signal includes: The nominal frequency and duty cycle of the controller's XCP.

6. The drive test switching load system according to claim 1, characterized in that: The host computer is also used to display the load result of the drive circuit configuration.

7. The drive test switching load system according to claim 1, characterized in that: The test data of the drive circuit configuration load includes: The current, frequency, duty cycle and voltage of the drive circuit.

8. A method for driving, testing and switching loads, applied to the driving, testing and switching loads system according to any one of claims 1 to 7, characterized in that: The method comprises: Obtaining load parameters through a storage module and storing the load parameters; the load parameters are: multiple controller model data and multiple drive test case configuration drive loop load data; Obtaining the load parameters to be matched through the human-machine module; the load parameters to be matched are: multiple controller model data to be tested and multiple drive test cases to be configured to configure the load data of the drive circuit; The upper computer obtains the load configuration information based on the load parameters and the load parameters to be matched, and obtains the load configuration result of the drive circuit based on the test data; The main control MCU configures the grouped drive circuits based on the load configuration information to obtain test data of the grouped drive circuit configuration loads.

9. The drive test switching load system according to claim 8, characterized in that: The obtaining of load configuration information based on the load parameter and the load parameter to be matched includes: Data matching is performed based on the load parameters and the load parameters to be matched to obtain load configuration information.

10. The drive test load switching system according to claim 8, characterized in that: The drive circuit configuration load result is obtained based on the test data, including: The test data is matched with the preset standard threshold to obtain the drive circuit configuration load result.

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