Radio frequency conduction sensitivity simulation method, system, equipment and medium
By equivalently equating the RF conduction sensitivity test platform to a multi-port network, a scatter fit circuit model is built, which solves the problem of low accuracy of the existing CS114 simulation test, and achieves higher accuracy and cost reduction in simulation test.
Patent Information
- Application Number
- CN202411711693.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-27
- Publication Date
- 2025-03-21
AI Technical Summary
The existing CS114 simulation tests do not consider the shielded chamber environment, losses between test equipment and port scattering during modeling, resulting in low simulation test accuracy.
By equivalently equating the RF conduction sensitivity test platform to a multi-port network, the scattering parameters between multiple ports are obtained, the scattering fit circuit model is constructed, and the equipment to be tested is connected to the model for simulation testing.
Improve the accuracy of RF conduction sensitivity simulation tests, reduce the actual number of tests, and thus reduce the cost of CS114.
Smart Images
Figure CN119667321A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of signal simulation testing, and in particular to a radio frequency conducted sensitivity simulation method, system, device and medium. Background Art
[0002] The main purpose of the CS114 test (i.e., RF conducted sensitivity test) in GJB151B is to verify the ability of the equipment to withstand the interference of RF signals conducted through cable bundles in a complex electromagnetic environment. The implementation of the CS114 test is of great significance for the reliable operation of the equipment in a complex electromagnetic environment.
[0003] However, the equipment involved in the CS114 test, including calibration equipment, test equipment and test environment, is expensive, and the manpower and material resources required to obtain good test results are high. At the same time, when the CS114 test is actually carried out, if the test fails, it is necessary to modify the circuit inside the tested device and reassemble the test. Repeating this process is likely to cause unnecessary cost waste; and in the process of modifying the circuit, the coupling path of some interference signals in the internal circuit of the tested device is complex, and it is difficult to confirm the main coupling path that affects the interference of sensitive sources, which will also cause unnecessary modification time and increase in modification rounds. Therefore, when the existing technology actually carries out the CS114 test, it will first perform a CS114 simulation test to reduce the number of actual tests, thereby reducing cost expenditure. However, when modeling, the existing CS114 simulation test does not take into account the shielding room environment, the loss between each test equipment and the port scattering, which is too idealized, resulting in low accuracy of the simulation test. Therefore, how to improve the accuracy of the CS114 simulation test to further reduce the number of actual tests and thus reduce the cost of CS114 testing is still a problem that needs to be solved in the existing technology. Summary of the invention
[0004] The present application provides a radio frequency conducted sensitivity simulation method, system, device and medium to solve the technical problem of low simulation accuracy of the existing CS114 simulation test.
[0005] According to a first aspect of an embodiment of the present application, a method for simulating radio frequency conducted sensitivity is provided, comprising:
[0006] Acquire a multi-port network; wherein the multi-port network is equivalently obtained by a radio frequency conducted sensitivity test platform; the multi-port network comprises a plurality of ports; the plurality of ports comprises a current injection port, a plurality of power supply ports and a plurality of test ports;
[0007] Based on the multiple ports, acquiring test parameters between the multiple ports in pairs; wherein the test parameters include scattering parameters;
[0008] According to the scattering parameters, construct a scattering fitting circuit model of the multi-port network;
[0009] The device to be tested is connected to the scattering fitting circuit model, and a first interference excitation and a first power supply excitation are applied to the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
[0010] The present application first equates the RF conduction sensitivity test platform to a multi-port network, which can simplify the problem, streamline the structure of the subsequent fitting model, ensure the efficiency of the subsequent simulation according to the fitting model, and obtain the scattering parameters between the multiple ports based on the multiple ports of the multi-port network, and then construct a scattering fitting circuit model according to the scattering parameters. The test platform as an entity can be fitted into a virtual model, so that the device to be tested can be repeatedly simulated and tested through the virtual model. At the same time, a virtual model is constructed according to the scattering parameters between the multiple ports, and the scattering relationship between different ports in the actual test is taken into account, so that the constructed scattering fitting circuit model is more in line with the actual test, and the test error is reduced. When the RF conduction sensitivity of the device to be tested is simulated according to the scattering fitting circuit model, the simulation test accuracy is improved, and the actual test times are reduced, thereby reducing the CS114 test cost.
[0011] In some implementations of the present application, acquiring test parameters between two of the multiple ports based on the multiple ports specifically includes:
[0012] A first interference excitation is applied to the current injection port, a first power excitation is applied to the multiple power ports, and based on the multiple ports, test parameters between the multiple ports are acquired.
[0013] The present application first applies a first interference excitation to a current injection port, applies a first power supply excitation to a plurality of power supply ports, and then obtains scattering parameters between the plurality of ports, taking into account the actual action paths of different excitations, which is more in line with actual testing.
[0014] In certain embodiments of the present application, constructing a scattering fitting circuit model of the multi-port network according to the scattering parameters specifically includes:
[0015] The test parameters include impedance matching values between any two of the multiple ports;
[0016] Extracting the scattering parameter to obtain the phase and amplitude of the scattering parameter;
[0017] A scattering fitting circuit model of the multi-port network is constructed according to the impedance matching values between the multiple ports, the phase and the amplitude of the scattering parameters.
[0018] This application first extracts the scattering parameters to obtain the phase and amplitude of the scattering parameters, and then constructs a scattering fitting circuit model based on the impedance matching value, the phase and amplitude of the scattering parameters. It takes into account the parameter requirements when describing a multi-port network through scattering parameters, and can accurately construct a scattering fitting circuit model.
[0019] In certain embodiments of the present application, the step of connecting the device to be tested to the scattering fitting circuit model, applying a first interference excitation and a first power supply excitation to the scattering fitting circuit model, and obtaining a simulation result of the radio frequency conducted sensitivity of the device to be tested specifically includes:
[0020] Connect multiple test ports of the device to be tested to the multiple test ports of the scattering fitting circuit model accordingly, apply a first interference excitation to the current injection port of the scattering fitting circuit model, and apply a first power supply excitation to the multiple power supply ports of the scattering fitting circuit model to obtain the RF conducted sensitivity simulation result of the device to be tested.
[0021] In the present application, multiple test ports of the device to be tested are connected to multiple test ports of the scattering fitting circuit model, and a first interference excitation is applied to the current injection port of the scattering fitting circuit model, and a first power supply excitation is applied to multiple power supply ports, so as to obtain the RF conducted sensitivity simulation result of the device to be tested. The actual interface and the action paths of different excitations when the test platform is tested are taken into consideration, which is more in line with the actual test.
[0022] According to a second aspect of the implementation manner of the present application, there is provided a radio frequency conducted sensitivity simulation device, comprising a test equivalent module, a parameter acquisition module, a model fitting module and a device simulation module;
[0023] The test equivalent module is used to obtain a multi-port network; wherein the multi-port network is equivalently obtained by a radio frequency conducted sensitivity test platform; the multi-port network includes a plurality of ports; the plurality of ports include a current injection port, a plurality of power ports and a plurality of test ports;
[0024] The parameter acquisition module is used to acquire test parameters between two of the multiple ports based on the multiple ports; wherein the test parameters include scattering parameters;
[0025] The model fitting module is used to construct a scattering fitting circuit model of the multi-port network according to the scattering parameters;
[0026] The device simulation module is used to connect the device to be tested to the scattering fitting circuit model, and apply a first interference excitation and a first power supply excitation to the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
[0027] In certain embodiments of the present application, the parameter acquisition module includes a parameter acquisition unit;
[0028] The parameter acquisition unit is used to apply a first interference excitation to the current injection port, apply a first power supply excitation to the multiple power supply ports, and acquire test parameters between the multiple ports based on the multiple ports.
[0029] In certain embodiments of the present application, the test parameters include impedance matching values between the multiple ports, and the model fitting module includes a parameter extraction unit and a model fitting unit;
[0030] The parameter extraction unit is used to extract the scattering parameter to obtain the phase and amplitude of the scattering parameter;
[0031] The model fitting unit is used to construct a scattering fitting circuit model of the multi-port network according to the impedance matching values between the multiple ports in pairs, and the phase and amplitude of the scattering parameters.
[0032] In certain embodiments of the present application, the device simulation module includes a device simulation unit;
[0033] The device simulation unit is used to connect multiple test ports of the device to be tested to the multiple test ports of the scattering fitting circuit model, apply a first interference excitation to the current injection port of the scattering fitting circuit model, and apply a first power supply excitation to the multiple power supply ports of the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
[0034] The present application first equates the RF conduction sensitivity test platform to a multi-port network, which can simplify the problem, streamline the structure of the subsequent fitting model, ensure the efficiency of the subsequent simulation according to the fitting model, and obtain the scattering parameters between the multiple ports based on the multiple ports of the multi-port network, and then construct a scattering fitting circuit model according to the scattering parameters. The test platform as an entity can be fitted into a virtual model, so that the device to be tested can be repeatedly simulated and tested through the virtual model. At the same time, a virtual model is constructed according to the scattering parameters between the multiple ports, and the scattering relationship between different ports in the actual test is taken into account, so that the constructed scattering fitting circuit model is more in line with the actual test, and the test error is reduced. When the RF conduction sensitivity of the device to be tested is simulated according to the scattering fitting circuit model, the simulation test accuracy is improved, and the actual test times are reduced, thereby reducing the CS114 test cost.
[0035] According to a third aspect of the embodiments of the present application, there is provided a computer device, comprising: a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor;
[0036] Wherein, when the processor executes the computer program, a radio frequency conducted sensitivity simulation method of the present application is implemented.
[0037] According to a fourth aspect of the implementation of the present application, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores a plurality of instructions, wherein the instructions are suitable for loading by a processor to execute a radio frequency conducted sensitivity simulation method of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0038] Figure 1 : A flow chart of a radio frequency conduction sensitivity simulation method shown in certain embodiments of the present application;
[0039] Figure 2 : A circuit connection diagram of a radio frequency conduction sensitivity simulation method shown in certain embodiments of the present application;
[0040] Figure 3 : is a comparison diagram of radio frequency conduction sensitivity test simulation shown in certain embodiments of the present application;
[0041] Figure 4 : A module structure diagram of a radio frequency conduction sensitivity simulation device shown in certain embodiments of the present application. DETAILED DESCRIPTION
[0042] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals represent the same or similar elements or elements having the same or similar functions from beginning to end. The embodiments described below in conjunction with the accompanying drawings are exemplary and are only used to explain some embodiments of the present application, and should not be construed as limitations on the embodiments of the present application. Based on the embodiments shown in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application.
[0043] In the description of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, unless otherwise clearly and specifically defined, "multiple" and "several" mean two or more.
[0044] The prior art will first perform a CS114 simulation test when actually performing a CS114 test to reduce the number of actual tests, thereby reducing cost expenditures. However, the existing CS114 simulation test does not take into account the shielded room environment, the loss between the test equipment, and the port scattering when modeling, and is too idealistic, resulting in low accuracy of the simulation test. Therefore, how to improve the accuracy of the CS114 simulation test to further reduce the number of actual tests and thus reduce the cost of CS114 testing is still a problem that needs to be solved in the prior art.
[0045] Based on the above technical background, please refer to Figure 1 The present application embodiment provides a method for simulating radio frequency conducted sensitivity, including steps S101 to S104, each of which is as follows:
[0046] Step S101: obtaining a multi-port network; wherein the multi-port network is equivalently obtained by a radio frequency conducted sensitivity test platform; the multi-port network comprises a plurality of ports; the plurality of ports comprises a current injection port, a plurality of power supply ports and a plurality of test ports.
[0047] In certain embodiments of the present application, a preferred embodiment of the radio frequency conducted sensitivity test platform is a CS114 test platform.
[0048] Specifically, the plurality of ports include a current injection port, a first power port, a second power port, a first test port and a second test port.
[0049] Step S102: Based on the multiple ports, obtain test parameters between any two of the multiple ports; wherein the test parameters include scattering parameters.
[0050] In some implementations of the present application, acquiring test parameters between two of the multiple ports based on the multiple ports specifically includes:
[0051] A first interference excitation is applied to the current injection port, a first power excitation is applied to the multiple power ports, and based on the multiple ports, test parameters between the multiple ports are acquired.
[0052] In some embodiments of the present application, the first interference excitation is specifically:
[0053] Acquire an interference signal; wherein the interference signal is generated by a signal source in response to a preset control signal;
[0054] The interference signal is passed through a power amplifier and a power sensor to generate a first interference stimulus.
[0055] In certain embodiments of the present application, a preferred implementation of applying the first interference excitation to the current injection port is to apply it by electromagnetic coupling.
[0056] The present application first applies a first interference excitation to a current injection port, applies a first power supply excitation to a plurality of power supply ports, and then obtains scattering parameters between the plurality of ports, taking into account the actual action paths of different excitations, which is more in line with actual testing.
[0057] Step S103: constructing a scattering fitting circuit model of the multi-port network according to the scattering parameters.
[0058] In certain embodiments of the present application, constructing a scattering fitting circuit model of the multi-port network according to the scattering parameters specifically includes:
[0059] The test parameters include impedance matching values between any two of the multiple ports;
[0060] Extracting the scattering parameter to obtain the phase and amplitude of the scattering parameter;
[0061] A scattering fitting circuit model of the multi-port network is constructed according to the impedance matching values between the multiple ports, the phase and the amplitude of the scattering parameters.
[0062] In some embodiments of the present application, the impedance matching value between any two of the plurality of ports is preferably 50Ω.
[0063] In some embodiments of the present application, the scattering parameter is extracted to obtain the phase and amplitude of the scattering parameter, specifically:
[0064] combining the scattering parameters into a scattering parameter matrix based on the plurality of ports;
[0065] The scattering parameter matrix is extracted to obtain the phase and amplitude of the scattering parameter.
[0066] Specifically, the number of rows and columns of the scattering parameter matrix is determined by the number of the multiple ports; more specifically, the scattering parameter matrix M S The number of rows and columns are both 5, that is, M S (i,j)=Sij,sti,j=1...5,M S A specific expression of is:
[0067]
[0068] Among them, i=j=1 represents the current injection port, i=j=2 represents the first power port, i=j=3 represents the second power port, i=j=4 represents the first test port, and i=j=5 represents the second test port.
[0069] It should be understood that the scattering parameters and scattering parameter matrices are commonly used measurement and analysis parameters in circuit networks, and their physical meanings are well known to those skilled in the art, so the physical meanings of S11 to S55 are not elaborated herein.
[0070] In certain embodiments of the present application, the scattering fitting circuit model is specifically in a matrix form. Specifically, the first column of the scattering fitting circuit model is a preset test frequency, the second column is the amplitude of S11, the third column is the phase of S11, the fourth column is the amplitude of S12, the fifth column is the phase of S12, and so on, each scattering parameter is embedded in each column of the scattering fitting model, and the last column is the impedance matching value between the multiple ports.
[0071] This application first extracts the scattering parameters to obtain the phase and amplitude of the scattering parameters, and then constructs a scattering fitting circuit model based on the impedance matching value, the phase and amplitude of the scattering parameters. It takes into account the parameter requirements when describing a multi-port network through scattering parameters, and can accurately construct a scattering fitting circuit model.
[0072] Step S104: connecting the device to be tested to the scattering fitting circuit model, and applying a first interference excitation and a first power supply excitation to the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
[0073] In certain embodiments of the present application, before connecting the device to be tested to the scattering fitting circuit model, the scattering fitting circuit model needs to be imported and loaded into a circuit simulation platform; specifically, a preferred embodiment of the circuit simulation platform is CST Circuit Studio.
[0074] In certain embodiments of the present application, the step of connecting the device to be tested to the scattering fitting circuit model, applying a first interference excitation and a first power supply excitation to the scattering fitting circuit model, and obtaining a simulation result of the radio frequency conducted sensitivity of the device to be tested specifically includes:
[0075] Connect multiple test ports of the device to be tested to the multiple test ports of the scattering fitting circuit model accordingly, apply a first interference excitation to the current injection port of the scattering fitting circuit model, and apply a first power supply excitation to the multiple power supply ports of the scattering fitting circuit model to obtain the RF conducted sensitivity simulation result of the device to be tested.
[0076] Specifically, the device to be tested includes two test ports.
[0077] See also Figure 2 , which is a circuit connection diagram of a RF conducted sensitivity simulation method provided in the present application; wherein, the two test ports of the device to be tested are connected to the first test port T1 and the second test port T2 of the scattering fitting circuit model through RF cables, and an induced voltage monitoring point TP1 is installed on the RF cable where the first test port T1 is located, and an induced voltage monitoring point TP2 is installed on the RF cable where the second test port T2 is located; the first interference excitation is connected to the current injection port E of the scattering fitting circuit model through the RF cable; the first power supply excitation is connected to the first power supply port P1 and the second power supply port P2 of the scattering fitting circuit model through the RF cable; the induced voltage monitoring points TP1 and TP2 are used to monitor the induced voltages of the ports corresponding to the RF cables.
[0078] In the present application, multiple test ports of the device to be tested are connected to multiple test ports of the scattering fitting circuit model, and a first interference excitation is applied to the current injection port of the scattering fitting circuit model, and a first power supply excitation is applied to multiple power supply ports, so as to obtain the RF conducted sensitivity simulation result of the device to be tested. The actual interface and the action paths of different excitations when the test platform is tested are taken into consideration, which is more in line with the actual test.
[0079] For a detailed description of the implementation effect of this application, please refer to Figure 3 , is a simulation comparison diagram of the RF conducted sensitivity test shown in this application; wherein, Figure 3 (a) is the test simulation comparison of the first test port, Figure 3 (b) is the test simulation comparison of the second test port; the test value is Figure 2 In the case of circuit connection, the scattering fitting circuit model is replaced with the RF conducted sensitivity test platform for testing, and the induced voltage monitoring points TP1 and TP2 are monitored; the simulation value is Figure 2 Under the circuit connection, the voltage is monitored at the induction voltage monitoring points TP1 and TP2. Figure 3 It can be seen that, within a certain frequency range, the simulation result obtained by the radio frequency conduction sensitivity simulation method of the present application is consistent with the test result obtained by actually performing the radio frequency conduction sensitivity simulation, and the simulation has high accuracy.
[0080] The present application first equates the RF conduction sensitivity test platform to a multi-port network, which can simplify the problem, streamline the structure of the subsequent fitting model, ensure the efficiency of the subsequent simulation according to the fitting model, and obtain the scattering parameters between the multiple ports based on the multiple ports of the multi-port network, and then construct a scattering fitting circuit model according to the scattering parameters. The test platform as an entity can be fitted into a virtual model, so that the device to be tested can be repeatedly simulated and tested through the virtual model. At the same time, a virtual model is constructed according to the scattering parameters between the multiple ports, and the scattering relationship between different ports in the actual test is taken into account, so that the constructed scattering fitting circuit model is more in line with the actual test, and the test error is reduced. When the RF conduction sensitivity of the device to be tested is simulated according to the scattering fitting circuit model, the simulation test accuracy is improved, and the actual test times are reduced, thereby reducing the CS114 test cost.
[0081] Corresponding to the previous method, see Figure 4 , the embodiment of the present application provides a radio frequency conducted sensitivity simulation device, including a test equivalent module 410, a parameter acquisition module 420, a model fitting module 430 and a device simulation module 440;
[0082] The test equivalent module 410 is used to obtain a multi-port network; wherein the multi-port network is equivalently obtained by a radio frequency conducted sensitivity test platform; the multi-port network includes a plurality of ports; the plurality of ports include a current injection port, a plurality of power ports and a plurality of test ports;
[0083] The parameter acquisition module 420 is used to acquire test parameters between the multiple ports based on the multiple ports; wherein the test parameters include scattering parameters;
[0084] The model fitting module 430 is used to construct a scattering fitting circuit model of the multi-port network according to the scattering parameters;
[0085] The device simulation module 440 is used to connect the device to be tested to the scattering fitting circuit model, and apply a first interference excitation and a first power supply excitation to the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
[0086] In certain embodiments of the present application, the parameter acquisition module 420 includes a parameter acquisition unit;
[0087] The parameter acquisition unit is used to apply a first interference excitation to the current injection port, apply a first power supply excitation to the multiple power supply ports, and acquire test parameters between the multiple ports based on the multiple ports.
[0088] In certain embodiments of the present application, the test parameters include impedance matching values between the multiple ports, and the model fitting module 430 includes a parameter extraction unit and a model fitting unit;
[0089] The parameter extraction unit is used to extract the scattering parameter to obtain the phase and amplitude of the scattering parameter;
[0090] The model fitting unit is used to construct a scattering fitting circuit model of the multi-port network according to the impedance matching values between the multiple ports in pairs, and the phase and amplitude of the scattering parameters.
[0091] In certain embodiments of the present application, the device simulation module 440 includes a device simulation unit;
[0092] The device simulation unit is used to connect multiple test ports of the device to be tested to the multiple test ports of the scattering fitting circuit model, apply a first interference excitation to the current injection port of the scattering fitting circuit model, and apply a first power supply excitation to the multiple power supply ports of the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
[0093] The present application first equates the RF conduction sensitivity test platform to a multi-port network, which can simplify the problem, streamline the structure of the subsequent fitting model, ensure the efficiency of the subsequent simulation according to the fitting model, and obtain the scattering parameters between the multiple ports based on the multiple ports of the multi-port network, and then construct a scattering fitting circuit model according to the scattering parameters. The test platform as an entity can be fitted into a virtual model, so that the device to be tested can be repeatedly simulated and tested through the virtual model. At the same time, a virtual model is constructed according to the scattering parameters between the multiple ports, and the scattering relationship between different ports in the actual test is taken into account, so that the constructed scattering fitting circuit model is more in line with the actual test, and the test error is reduced. When the RF conduction sensitivity of the device to be tested is simulated according to the scattering fitting circuit model, the simulation test accuracy is improved, and the actual test times are reduced, thereby reducing the CS114 test cost.
[0094] It should be understood that the device provided in the embodiments of the present application corresponds to the aforementioned method, and a radio frequency conduction sensitivity simulation device provided in the embodiments of the present application can implement a radio frequency conduction sensitivity simulation method provided in any embodiment of the present application.
[0095] Adaptively, the embodiments of the present application also provide a computer device and a computer-readable storage medium.
[0096] The computer device includes: a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor; wherein, when the processor executes the computer program, a radio frequency conducted sensitivity simulation method of the present application is implemented.
[0097] The computer-readable storage medium stores a plurality of instructions, and the instructions are suitable for being loaded by a processor to execute a radio frequency conducted sensitivity simulation method of the present application.
[0098] The above are some implementation methods of the present application, and the purpose, technical scheme and beneficial effects of the present application are further described in detail. It should be clear that the above-mentioned partial implementation methods of the present application cannot be understood as limiting the present application. It is particularly pointed out that for those skilled in the art, any changes, modifications, equivalent substitutions and variations made within the spirit and principles of the present application should be included in the protection scope of the present application.
Claims
1. A method for simulating radio frequency conduction sensitivity, characterized in that: include: Acquire a multi-port network; wherein the multi-port network is equivalently obtained by a radio frequency conducted sensitivity test platform; the multi-port network comprises a plurality of ports; the plurality of ports comprises a current injection port, a plurality of power supply ports and a plurality of test ports; Based on the multiple ports, acquiring test parameters between the multiple ports in pairs; wherein the test parameters include scattering parameters; According to the scattering parameters, construct a scattering fitting circuit model of the multi-port network; The device to be tested is connected to the scattering fitting circuit model, and a first interference excitation and a first power supply excitation are applied to the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
2. The method for simulating radio frequency conduction sensitivity according to claim 1, characterized in that: The acquiring, based on the multiple ports, test parameters between the multiple ports in pairs specifically includes: A first interference excitation is applied to the current injection port, a first power excitation is applied to the multiple power ports, and based on the multiple ports, test parameters between the multiple ports are acquired.
3. The method for simulating radio frequency conduction sensitivity according to claim 1, characterized in that: The constructing a scattering fitting circuit model of the multi-port network according to the scattering parameters specifically includes: The test parameters include impedance matching values between any two of the multiple ports; Extracting the scattering parameter to obtain the phase and amplitude of the scattering parameter; A scattering fitting circuit model of the multi-port network is constructed according to the impedance matching values between the multiple ports, the phase and the amplitude of the scattering parameters.
4. The method for simulating radio frequency conduction sensitivity according to claim 1, characterized in that: The step of connecting the device to be tested to the scattering fitting circuit model and applying a first interference excitation and a first power supply excitation to the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested specifically includes: Connect multiple test ports of the device to be tested to the multiple test ports of the scattering fitting circuit model accordingly, apply a first interference excitation to the current injection port of the scattering fitting circuit model, and apply a first power supply excitation to the multiple power supply ports of the scattering fitting circuit model to obtain the RF conducted sensitivity simulation result of the device to be tested.
5. A radio frequency conduction sensitivity simulation system, characterized in that: It includes test equivalent module, parameter acquisition module, model fitting module and equipment simulation module; The test equivalent module is used to obtain a multi-port network; wherein the multi-port network is equivalently obtained by a radio frequency conducted sensitivity test platform; the multi-port network includes a plurality of ports; the plurality of ports include a current injection port, a plurality of power ports and a plurality of test ports; The parameter acquisition module is used to acquire test parameters between two of the multiple ports based on the multiple ports; wherein the test parameters include scattering parameters; The model fitting module is used to construct a scattering fitting circuit model of the multi-port network according to the scattering parameters; The device simulation module is used to connect the device to be tested to the scattering fitting circuit model, and apply a first interference excitation and a first power supply excitation to the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
6. The radio frequency conducted sensitivity simulation system according to claim 5, characterized in that: The parameter acquisition module includes a parameter acquisition unit; The parameter acquisition unit is used to apply a first interference excitation to the current injection port, apply a first power supply excitation to the multiple power supply ports, and acquire test parameters between the multiple ports based on the multiple ports.
7. The radio frequency conducted sensitivity simulation system according to claim 5, characterized in that: The test parameters include impedance matching values between the multiple ports, and the model fitting module includes a parameter extraction unit and a model fitting unit; The parameter extraction unit is used to extract the scattering parameter to obtain the phase and amplitude of the scattering parameter; The model fitting unit is used to construct a scattering fitting circuit model of the multi-port network according to the impedance matching values between the multiple ports in pairs, and the phase and amplitude of the scattering parameters.
8. The radio frequency conduction sensitivity simulation system according to claim 5, characterized in that: The device simulation module includes a device simulation unit; The device simulation unit is used to connect multiple test ports of the device to be tested to the multiple test ports of the scattering fitting circuit model, apply a first interference excitation to the current injection port of the scattering fitting circuit model, and apply a first power supply excitation to the multiple power supply ports of the scattering fitting circuit model to obtain a simulation result of the radio frequency conducted sensitivity of the device to be tested.
9. A computer device, characterized in that: include: processor; Memory; a computer program stored in the memory and configured to be executed by the processor; Wherein, when the processor executes the computer program, a radio frequency conducted sensitivity simulation method as claimed in any one of claims 1 to 4 is implemented.
10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a plurality of instructions, and the instructions are suitable for being loaded by a processor to execute a radio frequency conducted sensitivity simulation method as claimed in any one of claims 1 to 4.