Electronic component test method and device, electronic equipment and storage medium

Abstract

The invention relates to a test method and device for an electronic component, electronic equipment and a storage medium. The test method comprises the following steps: acquiring electrical information of a to-be-tested electronic component; wherein the electrical information represents the voltage attribute of the electronic component; determining electrical characteristic parameters of the to-be-tested electronic component according to the electrical information; wherein the electrical characteristic parameters represent working parameters when the electronic component is in a failure state; testing the to-be-tested electronic component according to the electrical characteristic parameters to obtain a test result; wherein the test result represents whether the to-be-tested electronic component is qualified or not. The electrical characteristic parameters can be determined in a targeted manner according to the electrical information of each electronic component, so that testing is performed according to the electrical characteristic parameters, and the testing precision is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of computer testing, and in particular to a testing method, device, electronic equipment and storage medium for electronic components. Background Art

[0002] As people pursue the intelligent and technological advancement of transportation, vehicles and other transportation tools need to be equipped with more electronic components to realize various artificial intelligence functions. In order to ensure the safe driving of vehicles, electronic components need to be tested.

[0003] However, different electronic components have different parameters. How to test different electronic components efficiently and accurately is the current research focus. Summary of the invention

[0004] The invention provides a test method, a device, an electronic device and a storage medium for electronic components, so as to improve the test accuracy of the electronic components.

[0005] In a first aspect, the present invention provides a method for testing an electronic component, comprising:

[0006] Acquiring electrical information of the electronic component to be tested; wherein the electrical information represents a voltage property of the electronic component;

[0007] Determine electrical characteristic parameters of the electronic component to be tested according to the electrical information; wherein the electrical characteristic parameters represent working parameters of the electronic component when it is in a failure state;

[0008] The electronic component to be tested is tested according to the electrical characteristic parameters to obtain a test result; wherein the test result indicates whether the electronic component to be tested is qualified.

[0009] In a second aspect, the present invention provides a testing device for an electronic component, comprising:

[0010] An information acquisition module, used to acquire electrical information of the electronic component to be tested; wherein the electrical information represents a voltage property of the electronic component;

[0011] A parameter determination module, used to determine the electrical characteristic parameters of the electronic component to be tested according to the electrical information; wherein the electrical characteristic parameters represent the working parameters of the electronic component when it is in a failure state;

[0012] The test module is used to test the electronic component to be tested according to the electrical characteristic parameters to obtain a test result; wherein the test result indicates whether the electronic component to be tested is qualified.

[0013] In a third aspect, the invention provides an electronic device, comprising: a processor, and a memory communicatively connected to the processor;

[0014] The memory stores computer-executable instructions;

[0015] The processor executes the computer-executable instructions stored in the memory to implement the method according to the first aspect.

[0016] In a fourth aspect, the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer-executable instructions, and when the computer-executable instructions are executed by a processor, they are used to implement the method described in the first aspect.

[0017] In a fifth aspect, the present invention provides a computer program product, comprising a computer program, which implements the method described in the first aspect when executed by a processor.

[0018] The present invention provides a test method, device, electronic device and storage medium for electronic components. By acquiring the electrical information of the electronic component to be tested, the electrical characteristic parameters of the electronic component to be tested can be determined in a targeted manner. The electrical characteristic parameters characterize the working parameters of the electronic component when it is in a failed state, that is, the electrical characteristic parameters are the failure parameters of the electronic component. According to the electrical characteristic parameters, the electronic component to be tested is tested in a failed state to obtain the test results, and whether the electronic component to be tested is qualified is determined according to the test results. Fault testing of different electronic components under specific parameters is achieved, thereby improving the effectiveness and accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A schematic diagram of a flow chart of a method for testing an electronic component provided by an embodiment of the present invention;

[0020] Figure 2 A schematic diagram of a flow chart of a method for testing an electronic component provided by an embodiment of the present invention;

[0021] Figure 3 A schematic diagram of a flow chart of a method for testing an electronic component provided by an embodiment of the present invention;

[0022] Figure 4 A schematic diagram of a second use case template provided by an embodiment of the present invention;

[0023] Figure 5 A schematic diagram of a flow chart of a method for testing an electronic component provided by an embodiment of the present invention;

[0024] Figure 6 A structural block diagram of a testing device for electronic components provided by an embodiment of the present invention;

[0025] Figure 7 A structural block diagram of a testing device for electronic components provided by an embodiment of the present invention;

[0026] Figure 8 A structural block diagram of an electronic device provided by an embodiment of the present invention;

[0027] Fig. 9 A structural block diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0028] The following will describe the embodiments of the present invention with reference to the accompanying drawings and preferred embodiments. Those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention. It should be understood that the preferred embodiments are only for illustrating the present invention, not for limiting the scope of protection of the present invention.

[0029] It should be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present invention, and thus the drawings only show components related to the present invention rather than being drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component may be changed arbitrarily, and the component layout may also be more complicated.

[0030] In the description of the present invention, it should be understood that the terms "first", "second", "third", etc. are only used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence, nor can they be understood as indicating or implying relative importance. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances. In addition, in the description of the present invention, unless otherwise specified, "plurality" refers to two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the objects associated before and after are in an "or" relationship.

[0031] It should be noted that due to space limitations, this specification does not exhaustively list all optional implementations. After reading this specification, those skilled in the art should be able to think that as long as the technical features do not contradict each other, any combination of technical features can constitute an optional implementation. The following is a detailed description of each embodiment.

[0032] With the development of the economy, people are increasingly pursuing technological and intelligent means of transportation, which requires more electronic components to be equipped in vehicles. These electronic components have more and more functions and their designs are becoming more and more complex. As the design becomes more and more complex, the frequency of occasional failures of these electronic components is also increasing. Among them, an important failure factor is that different electronic components have different power drop time intervals or different power fluctuation degrees during the power drop or power fluctuation process, which causes the electronic components to work abnormally. There are also large differences in the length of the time interval and the degree of power fluctuation of the same type of electronic components, and there is no fixed value. In other words, different electronic components have different power-on and power-off times and unstable working voltages.

[0033] However, when testing electronic components, it is necessary to give power-on and power-off times and unstable operating voltages for testing. The current testing method often applies a preset unstable power supply to different electronic components, and all components use the same unstable operating voltage parameters. This parameter is often divorced from the actual design of the electronic components, and the effectiveness of the test is poor. The electronic component test does not apply the most appropriate voltage parameters, and it is difficult to test the failure of some electronic components under specific parameters. In addition, the current testing method uses different power-on and power-off times for testing, which takes up a lot of testing time, has low test efficiency, and has low test accuracy.

[0034] In order to avoid the electronic parts with this fault defect from being missed out on the market, it is extremely important to find these parameters accurately and efficiently and complete the test automatically and accurately.

[0035] The present invention provides a testing method, device, electronic device and storage medium for electronic components, aiming to solve the above technical problems in the prior art.

[0036] The technical solution of the present invention and how the technical solution of the present invention solves the above-mentioned technical problems are described in detail below with specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present invention will be described below in conjunction with the accompanying drawings.

[0037] Figure 1 FIG. 1 is a flow chart of a method for testing an electronic component according to an embodiment of the present invention. The method can be performed by a testing device for an electronic component. Figure 1 As shown, the method comprises the following steps:

[0038] S101. Acquire electrical information of an electronic component to be tested; wherein the electrical information represents a voltage property of the electronic component.

[0039] Exemplarily, the electronic component to be tested refers to a device or equipment installed on the vehicle that can be controlled by the vehicle controller, for example, a display screen, an instrument, a sensor, etc. Each electronic component corresponds to its own electrical information, and the electrical information can characterize the voltage-related properties of the electronic component. The electrical information can be preset information, for example, it can be a preset voltage value. Specifically, the electrical information can include a pre-designed rated operating voltage, a maximum operating voltage, a minimum operating voltage, a minimum operating voltage of the main power supply inside the electronic component, an operating voltage range of the main controller chip inside the electronic component, a rated operating current, etc. It is also possible to obtain the communication protocol data of the electronic component when communicating, for example, it is possible to obtain custom communication protocol data and historical communication protocol data, etc.

[0040] The electrical information of each electronic component to be tested can be obtained at any time. In this embodiment, the basic attribute information of the electronic component to be tested can also be obtained. For example, the basic attribute information may include the electronic component name, part number, hardware version, software version, design unit, etc. When testing multiple electronic components to be tested, different electronic components can be distinguished by obtaining the basic attribute information to avoid confusion in the test results. In addition, even if the electronic components of the same type are different, the electrical characteristic parameters may also be different if the basic attribute information such as the design unit is different. By obtaining the basic attribute information, the electrical characteristic parameters of each electronic component can be obtained to improve the accuracy of the test.

[0041] In this embodiment, there is no specific limitation on the method of obtaining electrical information. For example, the user can enter the information. The information entry method can be diverse, and can be entered through the network or locally. The network can be a wired LAN, wired Internet, wireless LAN, wireless Internet, hotspot, Bluetooth, etc.; local entry refers to any form of entry in this test system. The network entry and local entry methods can be in various forms: keyboard entry, voice entry, file import, etc. The network entry and local entry devices can also be in various forms: special equipment, computer systems, handheld terminals, servers, microphones, etc.

[0042] If the electronic component is already in the test process, it can be designed to allow new electrical information to be entered, or it can be designed not to allow new electrical information to be entered. If the electrical information can be entered, to ensure the reliability of the test, the newly entered electrical information will not be executed in this test. If new electrical information needs to be executed, the test needs to be restarted in order to detect the latest electrical characteristic parameters.

[0043] When entering information, you can enter basic attribute information and electrical information. One purpose of entering basic attribute information is to state this information in the final automatically generated test report. Another purpose is to distinguish the different electrical characteristic parameters of the same type of electronic components when designed in different design schemes and by different design units. When the amount of test data is sufficient, the consistency of products designed by different design units can be analyzed through big data. The purpose of entering electrical information is to automatically calculate and generate a series of power waveforms for detecting the electrical characteristic parameters of electronic components.

[0044] S102. Determine electrical characteristic parameters of the electronic component to be tested according to the electrical information; wherein the electrical characteristic parameters represent working parameters of the electronic component when it is in a failed state.

[0045] Exemplarily, electrical information can be used to detect failure electrical parameters unique to electronic components, that is, electrical characteristic parameters. Electrical characteristic parameters can characterize the working parameters of electronic components when they are in a failed state, that is, electrical-related parameters when the electronic components cannot work normally. For example, electrical characteristic parameters may include power-on and power-off time and unstable working voltage of electronic components.

[0046] The electrical information obtained is used to control the electronic components to be tested to work. For example, by applying the rated working voltage to the electronic components to be tested, the current of the electronic components to be tested under the rated working voltage can be detected, so as to determine whether the electronic components to be tested are working correctly, and record the power-on time and power-off time of the electronic components to be tested, as well as the unstable working voltage of the electronic components to be tested. The electrical information may include multiple pieces of information, and for each piece of information in the electrical information, the corresponding electrical characteristic parameters can be obtained. For example, for the rated working voltage, the corresponding power-on and power-off time and unstable working voltage can be obtained; for the highest working voltage, the corresponding power-on and power-off time and unstable working voltage can be obtained; for the lowest working voltage, the corresponding power-on and power-off time and unstable working voltage can be obtained. The power-on and power-off time and unstable working voltage under the required voltage can be determined according to the actual test requirements.

[0047] In this embodiment, the electrical characteristic parameters may also include current waveform data, that is, the obtained electrical characteristic parameters may include power-off time at rated voltage, power-off time at maximum working voltage, power-off time at minimum working voltage, current waveform data when powering off at rated voltage, stable working current waveform data after powering on at rated voltage, current waveform data when powering off at maximum working voltage, stable working current waveform data after powering on at rated voltage, current waveform data when powering off at minimum working voltage, stable working current waveform data after powering on at rated voltage, current waveform data under step voltage, current waveform when component works abnormally, etc. After powering on and off, the electronic component to be tested may send feedback information, and may obtain signals fed back by the electronic component after powering off, signals fed back by the electronic component when working normally after powering on, and signals fed back by the electronic component when working normally after powering on, etc.

[0048] In this embodiment, the electrical characteristic parameters of the electronic component to be tested are determined based on the electrical information, including: obtaining environmental information of the current environment in which the electronic component to be tested is located; wherein the environmental information includes at least one of temperature, humidity, and light intensity; and determining the electrical characteristic parameters of the electronic component to be tested in the current environment based on the environmental information and the electrical information.

[0049] Specifically, the environmental information of the current environment of the electronic component to be tested can also be obtained. The environmental information may include the maximum operating temperature, minimum operating temperature, humidity, vibration, acceleration, angular velocity, light intensity, etc. of the electronic component. In actual testing, the environmental information that needs to be entered for different electronic components may be different. For example, for a camera, the maximum light intensity and the minimum light intensity need to be entered, but for a gateway, this information does not need to be entered, and the light intensity will not be used in the test of the gateway. That is, the association between the electronic component and the environmental information can be preset to determine what environmental information is required for the electronic component to be tested, so as to obtain the required environmental information.

[0050] The electrical characteristic parameters of the electronic component to be tested are determined according to the electrical information, and the electrical characteristic parameters of the electronic component to be tested in the current environment are determined according to the environmental information. That is, the electrical characteristic parameters are first determined according to the electrical information, and then the environmental information is annotated for the electrical characteristic parameters, thereby obtaining the difference in the electrical characteristic parameters of the electronic component in different environments.

[0051] The beneficial effect of such a setting is that, by acquiring environmental information, the test of electronic components can cover various environments, thereby improving the effectiveness and comprehensiveness of the test.

[0052] S103 . Test the electronic component to be tested according to the electrical characteristic parameters to obtain a test result; wherein the test result indicates whether the electronic component to be tested is qualified.

[0053] Exemplarily, based on the electrical characteristic parameters, the electronic components to be tested are controlled to operate, and electrical related information and signal data fed back by the electronic components to be tested are obtained, so as to automatically determine whether the electronic components to be tested are qualified, that is, obtain the test results. Based on the test results, a test report can be automatically generated.

[0054] When testing the electronic component to be tested, the electronic component to be tested can be controlled to work according to the unstable working voltage in the electrical characteristic parameters, and the power-on and power-off time of the electronic component to be tested under the unstable working voltage can be determined. According to the tested power-on and power-off time and the power-on and power-off time in the electrical characteristic parameters, it can be judged whether the electronic component to be tested is qualified. For example, if the tested power-on and power-off time is inconsistent with the power-on and power-off time in the electrical characteristic parameters, it is determined that the electronic component to be tested is unqualified. In this embodiment, the conditions for judging the electronic component can be preset. For example, the preset conditions can include the time difference between the tested power-on and power-off time and the power-on and power-off time in the electrical characteristic parameters. If the time difference is small, it is determined that the electronic component to be tested is qualified. It is also possible to control the electronic component to be tested to power on and off according to the power-on and power-off time in the electrical characteristic parameters, determine whether the working voltage during the power-on and power-off process is the unstable working voltage in the electrical characteristic parameters, and determine whether the electronic component to be tested is qualified according to the working voltage during the power-on and power-off process and the unstable working voltage in the electrical characteristic parameters. According to the test results, a test report can be generated and printed for the user to view.

[0055] In this embodiment, the electronic component to be tested is tested according to the electrical characteristic parameters to obtain the test result, including: testing the electronic component to be tested according to the environmental information and the electrical characteristic parameters to obtain the test result of the electronic component to be tested in the current environment.

[0056] Specifically, if environmental information is obtained when determining electrical characteristic parameters, different environments can be tested when testing the electronic component to be tested. For example, if the electrical characteristic parameters are electrical characteristic parameters at a certain temperature, the electronic component to be tested can be tested at this temperature. For the same electronic component to be tested, if the environmental information is different, the test results may be different. When a test report is generated based on the test results, the test environmental information can be indicated in the test report for the user to view.

[0057] The beneficial effect of such a setting is that, through different environmental information, the electronic components to be tested can be tested in a targeted manner, the test scenario is more comprehensive, and the test accuracy is effectively improved.

[0058] In the embodiment of the present invention, by acquiring the electrical information of the electronic component to be tested, the electrical characteristic parameters of the electronic component to be tested can be determined in a targeted manner. The electrical characteristic parameters characterize the working parameters of the electronic component when it is in a failed state, that is, the electrical characteristic parameters are the failure parameters of the electronic component. According to the electrical characteristic parameters, the electronic component to be tested is tested in a failed state to obtain the test results, and whether the electronic component to be tested is qualified is determined according to the test results. Fault testing of different electronic components under unique parameters is achieved, thereby improving the effectiveness and accuracy of the test.

[0059] Figure 2 A flowchart of a method for testing an electronic component provided in an embodiment of the present invention is provided. This embodiment is an optional embodiment based on the above embodiment.

[0060] In this embodiment, electrical characteristic parameters of the electronic component to be tested are determined according to electrical information, including: generating a parameter detection use case based on a preset first use case template according to the electrical information; wherein the parameter detection use case includes electrical information, and the parameter detection use case represents an exemplary method for determining electrical characteristic parameters; and determining the electrical characteristic parameters of the electronic component to be tested according to the parameter detection use case.

[0061] like Figure 2 As shown, the method comprises the following steps:

[0062] S201. Obtain electrical information of an electronic component to be tested; wherein the electrical information represents a voltage property of the electronic component.

[0063] Exemplarily, this step may refer to the above-mentioned step S101 and will not be described in detail.

[0064] S202. Generate a parameter detection use case according to the electrical information and based on a preset first use case template; wherein the parameter detection use case includes the electrical information, and the parameter detection use case represents an exemplary method for determining electrical characteristic parameters.

[0065] Exemplarily, a first use case template is pre-set, and the first use case template is a template of a parameter detection use case. The parameter detection use case represents an exemplary method for determining electrical characteristic parameters, and the parameter detection use case may include electrical information. For example, the parameter detection use case may be in the form of a waveform, that is, the first use case template is a template of a waveform diagram. If the electronic information is a rated working voltage, the waveform of the parameter detection use case is a horizontal line of the rated voltage size.

[0066] Different parameter detection cases can be generated according to different electrical information, that is, for an electronic component to be tested, a series of parameter detection cases can be generated. For example, when generating parameter detection cases, the power waveform of the rated voltage, the power waveform of the power-off time at the rated voltage, and the power waveform of the power-on time at the rated voltage can be generated; the power waveform of the highest voltage, the power waveform of the power-off time at the highest voltage, and the power waveform of the power-on time at the highest voltage can be generated; the power waveform of the lowest voltage, the power waveform of the power-off time at the lowest voltage, and the power waveform of the power-on time at the lowest voltage can be generated; the power waveform of the step voltage can be generated. Among them, the step voltage power waveform is used to detect whether the electronic component can work normally under certain voltages of the step voltage, and these voltages are used in the test.

[0067] The vertical axis of the waveform of the parameter detection use case is voltage, and the horizontal axis is time. The time length in each parameter detection use case needs to meet certain conditions. For example, for detecting the power waveform of the power-off time, it is necessary to ensure that the current at power-on and the current after power-off can be stably detected, and the feedback data of the electronic component can be stably read during the power-on operation and after the power-off is completed. The feedback data can characterize the working state of the electronic component. For the power waveform for detecting the power-on time, it is necessary to ensure that the current at power-off and the current after power-on can be stably detected, and the feedback data of the electronic component can be stably read during the power-off period and the power-on period. In this embodiment, different waveform time lengths can be preset according to different electronic components. For example, if the electronic component is a car computer, the time length is 20 seconds; if the electronic component is a sensor, the time length is 1 second.

[0068] The time length corresponding to the electronic component to be tested can be determined according to the preset association relationship between the electronic component and the time length, so as to generate a parameter detection case according to the time length and electrical information.

[0069] S203: Determine electrical characteristic parameters of the electronic component to be tested according to the parameter detection use case.

[0070] Exemplarily, after obtaining the parameter detection case, the electronic component to be tested can be run according to the waveform of the parameter detection case, that is, the parameter detection case is adaptively executed to obtain the power-on time, power-off time, and unstable working voltage value of the electronic component to be tested. By automatically generating parameter detection cases and executing parameter detection cases, the unique failure electrical parameters of the electronic component under test are detected, thereby improving the efficiency and accuracy of the test.

[0071] In this embodiment, the electrical characteristic parameters of the electronic component to be tested are determined according to the parameter detection use case, including: applying a preset voltage value to the electronic component to be tested according to the parameter detection use case to obtain the power-on time and power-off time of the electronic component to be tested.

[0072] Specifically, the electrical characteristic parameters include the power-on time and the power-off time of the electronic component. The parameter detection case contains electrical information, that is, it contains a preset voltage value. The parameter detection case is executed, the preset voltage value is applied to the electronic component to be tested, the electronic component to be tested is controlled to be powered on and off, and the power-on time and the power-off time of the electronic component to be tested are obtained.

[0073] For different electrical information, different parameter detection use cases can be obtained, that is, different power-on and power-off times can be obtained.

[0074] The beneficial effect of such a setting is that basic detection cases are automatically executed to obtain power-on and power-off times under different voltages, thereby improving the comprehensiveness of the test and further improving the efficiency and accuracy of the test.

[0075] In this embodiment, electrical characteristic parameters of the electronic component to be tested are determined according to a parameter detection use case, including: determining step voltage information corresponding to a preset voltage value according to the parameter detection use case; wherein the step voltage information includes multiple voltage values ​​to be applied, and the voltage value to be applied is less than the preset voltage value; applying the voltage values ​​to be applied to the electronic component to be tested respectively, and determining working feedback information of the electronic component to be tested; wherein the working feedback information characterizes the working condition of the electronic component; and determining an unstable working voltage value from multiple voltage values ​​to be applied according to the working feedback information corresponding to each voltage value to be applied.

[0076] Specifically, the electrical characteristic parameters also include unstable operating voltage values. When determining the unstable operating voltage values, the step voltage information can be generated based on the preset voltage value in the parameter detection use case. The step voltage information includes multiple voltage values ​​to be applied, and the voltage value to be applied is less than the preset voltage value. There is a certain interval between each voltage value to be applied, forming a step form, that is, starting from the preset voltage value, it can be gradually reduced to obtain multiple voltage values ​​to be applied. The algorithm for generating the step voltage information can be one or more of a step algorithm, a coefficient slope method, and a random method. For example, a step algorithm can be used to determine the step voltage information, that is, gradually decrease from the starting preset voltage value, and each step decreases a fixed voltage value to form a stepped voltage. The starting preset voltage value can be the rated operating voltage, and the fixed voltage value that decreases can be set to any voltage size.

[0077] After obtaining each voltage value to be applied, the voltage value to be applied can be applied to the electronic component to be tested. The voltage values ​​to be applied are applied to the electronic components to be tested respectively, and the working feedback information of the electronic components to be tested under the voltage values ​​to be applied is determined. The working feedback information can be feedback data, feedback signals, etc. of the electronic components to be tested, which can characterize the working condition of the electronic components. For example, the working feedback information can characterize whether the current working state of the electronic component to be tested is stable. According to the working feedback information corresponding to each voltage value to be applied, an unstable working voltage value can be determined from multiple voltage values ​​to be applied. If the working feedback information corresponding to a certain voltage value to be applied indicates that the electronic component to be tested is not very stable, the voltage value to be applied can be determined as an unstable working voltage value. One or more unstable working voltage values ​​can be determined.

[0078] When applying the voltage value to be applied to the electronic component to be tested, the application time of each voltage value to be applied needs to satisfy a complete detection cycle, which is the minimum unit of the time length of the waveform in the parameter detection use case. This detection cycle may depend on the time from power-on to normal operation and from power-off to stop working of the electronic component to be tested. In the case where the detection cycle is not explicitly input, the detection cycle may be automatically determined. For example, the length of time from the detected working state of the electronic component to be tested changing from the beginning to stability may be used as the detection cycle. For example, it may be the length of time from the start of operation of the electronic component to the stability of the current, feedback data, and feedback signal.

[0079] The beneficial effect of such a setting is that by generating step-type voltage information, the unstable operating voltage of the electronic component can be accurately found, the accuracy of determining the electrical characteristic parameters can be improved, and the test accuracy of the electronic component can be improved.

[0080] In this embodiment, when executing the parameter detection case, all parameter detection cases can be executed for the electronic component to be tested, including the power-off power waveform under the rated voltage, the power-off power waveform under the highest voltage, the power-off power waveform under the lowest voltage, the power-on power waveform under the rated voltage, the power-on power waveform under the highest voltage, the power-on power waveform under the lowest voltage, the step power waveform, etc. mentioned above. When detecting electrical characteristic parameters, in the detection cycle of each parameter detection case, the working state of the electronic component to be tested is read by a preset detection device to obtain electrical characteristic parameters. The electrical characteristic parameters may include: power-off time under the rated voltage, power-off time under the maximum working voltage, power-off time under the minimum working voltage, current waveform data when powering off at the rated voltage, stable working current waveform data after powering on at the rated voltage, current waveform data when powering off at the highest working voltage, stable working current waveform data after powering on at the rated voltage, current waveform data when powering off at the lowest working voltage, stable working current waveform data after powering on at the rated voltage, a signal fed back by the electronic component after powering off, a signal fed back by the electronic component when it works normally after powering on, and a signal fed back by the electronic component when it works normally after powering on. The voltage data of the electronic component to be tested under the step voltage when it works normally, the current data of the electronic component to be tested under the step voltage when it works normally, the voltage data when the electronic component to be tested cannot work normally, the current data when the electronic component to be tested cannot work normally, etc.

[0081] S204 . Test the electronic component to be tested according to the electrical characteristic parameters to obtain a test result; wherein the test result indicates whether the electronic component to be tested is qualified.

[0082] Exemplarily, this step may refer to the above-mentioned step S103 and will not be described in detail.

[0083] In the embodiment of the present invention, by acquiring the electrical information of the electronic component to be tested, the electrical characteristic parameters of the electronic component to be tested can be determined in a targeted manner. The electrical characteristic parameters characterize the working parameters of the electronic component when it is in a failed state, that is, the electrical characteristic parameters are the failure parameters of the electronic component. According to the electrical characteristic parameters, the electronic component to be tested is tested in a failed state to obtain the test results, and whether the electronic component to be tested is qualified is determined according to the test results. Fault testing of different electronic components under unique parameters is achieved, thereby improving the effectiveness and accuracy of the test.

[0084] Figure 3 A flowchart of a method for testing an electronic component provided in an embodiment of the present invention is provided. This embodiment is an optional embodiment based on the above embodiment.

[0085] In this embodiment, the electronic component to be tested is tested according to the electrical characteristic parameters to obtain the test results, including: generating a test case for the electronic component to be tested based on a preset second use case template according to the electrical characteristic parameters; wherein the test case represents an exemplary method for testing the electronic component; and according to the test case, the electronic component to be tested is tested to obtain the test results.

[0086] like Figure 3 As shown, the method comprises the following steps:

[0087] S301. Obtain electrical information of an electronic component to be tested; wherein the electrical information represents a voltage property of the electronic component.

[0088] Exemplarily, this step may refer to the above-mentioned step S101 and will not be described in detail.

[0089] S302. Determine electrical characteristic parameters of the electronic component to be tested according to the electrical information; wherein the electrical characteristic parameters represent working parameters of the electronic component when it is in a failure state.

[0090] Exemplarily, this step may refer to the above-mentioned step S102 and will not be described in detail.

[0091] S303 . Generate a test case for the electronic component to be tested according to the electrical characteristic parameters and based on a preset second test case template; wherein the test case represents an exemplary method for testing the electronic component.

[0092] Exemplarily, a second use case template is pre-set, and the second use case template is a template of a test case. The test case represents an exemplary way of testing an electronic component, so as to find out whether the electronic component under test can work normally. For example, the test case can be in the form of a waveform, that is, the second use case template is a template of a waveform graph. The horizontal axis of the waveform graph represents time, and the vertical axis represents voltage. When testing the electronic component, the voltage change of the electronic component during the power-on process and the power-on time can be tested, and the voltage change of the electronic component during the power-off process and the power-off time can also be tested. The waveform corresponding to the second use case template, or the waveform corresponding to the test case, can include three stages, namely: a stage of working at a fixed voltage value, a stage of voltage drop at a time interval, and a stage of returning to a fixed voltage value.

[0093] Figure 4 This is a schematic diagram of the second use case template. Figure 4 In the case of a power supply, the rated power supply is the fixed voltage value applied, that is, the rated working voltage. Figure 4The power waveform in includes three areas, namely the first normal working area, the fault working area, and the second normal working area. The first normal working area corresponds to the stage of working at a fixed voltage value, the fault working area corresponds to the stage of voltage drop at a time interval, that is, the power-on and power-off stage, and the second normal working area corresponds to the stage of recovery to a fixed voltage value. Unstable power supply refers to the test case in which an unstable working voltage is applied to the electronic component to be tested. After this voltage is applied, the electronic component to be tested is unstable when working, and the feedback data and feedback signal are also unstable. In addition, for the first normal working area, the time length of this working area can be greater than or equal to the detection cycle. For the fault working area, the time length of this working area is a variable range, ranging from 0 microseconds to tens of seconds. This maximum time depends on the time when the electronic component is fully started, which can be calculated based on the power-on and power-off time. For the second normal working area, the time length of this working area can also be greater than or equal to the detection cycle.

[0094] The power-on and power-off time and unstable working voltage can be characterized in the waveform of the test case. According to the power-on and power-off time and unstable working voltage in the electrical characteristic parameters, the specific test case can be determined. Different electrical information can correspond to different power-on and power-off times and / or unstable working voltages. Therefore, different electrical information can correspond to different test cases. For example, if the electrical information is the rated working voltage, the test case corresponding to the rated working voltage can be obtained; if the electrical information is the maximum working voltage, the test case corresponding to the maximum working voltage can be obtained.

[0095] In the present embodiment, according to electrical characteristic parameters, based on a preset second use case template, a test case for the electronic component to be tested is generated, including: determining a target time interval according to the power-off time and the power-on time of the electronic component to be tested; wherein the target time interval represents the time interval between power-on and power-off; determining a first target voltage value and a second target voltage value according to the unstable operating voltage value of the electronic component to be tested; wherein the first target voltage value represents the maximum value of the unstable voltage value applied to the electronic component during the test, and the second target voltage value represents the minimum value of the unstable voltage value applied to the electronic component during the test; according to the target time interval, the first target voltage value, and the second target voltage value, based on the preset second use case template, a test case for the electronic component to be tested is generated.

[0096] Specifically, when determining the test case, a corresponding power supply waveform is generated. The power supply waveform includes three parts: normal / rated working voltage, voltage drop within a time interval, and restoration of normal / rated power supply voltage. The parameters that need to be reflected in the power supply waveform include the power-off and power-on time interval, and unstable power supply. Among them, the calculation basis of the power-off and power-on time interval is derived from the power-off time and power-on time of the electronic component to be tested. The unstable power supply needs to be within a certain range, that is, a maximum value and a minimum value need to be determined. Fluctuating within the sum of the maximum value and the minimum value is an unstable power supply, and this maximum value and minimum value can be calculated based on the unstable working voltage.

[0097] That is, according to the power-off time and power-on time of the electronic component to be tested, a target time interval can be calculated, and the target time interval represents the time interval between power-on and power-off. According to the unstable working voltage value of the electronic component to be tested, a first target voltage value and a second target voltage value are determined, and the first target voltage value represents the maximum value of the unstable power applied to the electronic component during the test, and the second target voltage value represents the minimum value of the unstable power applied to the electronic component during the test.

[0098] After obtaining the target time interval, the first target voltage value, and the second target voltage value, a test case for the electronic component to be tested is generated according to the second test case template. If there are multiple target time intervals, first target voltage values, or second target voltage values, multiple test cases can be generated to perform a comprehensive test on the electronic component to be tested.

[0099] The beneficial effect of such a setting is that, according to the electronic characteristic parameters, targeted test cases are generated, accurate testing of the electronic components to be tested is achieved, and the effectiveness and comprehensiveness of the test are improved.

[0100] In this embodiment, the target time interval is:

[0101] T i =K×(T u +T f )+R;

[0102] Among them, T i is the target time interval, K is the preset coefficient, R is the random time length, T u is the power-on time, T f The power-off time.

[0103] Specifically, T i is the target time interval to be calculated, which will be reflected in the test case. K is the preset time coefficient, which can have a preset range limit to improve efficiency. R is a random time, and the time range of R can be preset, that is, a random time is randomly generated within this time range.

[0104] The beneficial effect of such a setting is that the target time interval can be quickly calculated through a preset formula, thereby obtaining a test case and improving the test efficiency.

[0105] In this embodiment, the first target voltage value and the second target voltage value are:

[0106] V1=V w +U;

[0107] V2=V w -U;

[0108] Wherein, V1 is the first target voltage value, V2 is the second target voltage value, V w is the unstable working voltage value, and U is the random voltage value.

[0109] Specifically, V1 and V2 represent the voltage range of the unstable power supply that needs to be implemented, V w is the unstable working voltage value in the electrical characteristic parameters. U is a random voltage generated. The voltage range of U can be preset, that is, a random voltage is randomly generated within this voltage range. The target voltage range between the first target voltage value and the second target voltage value cannot be too large or too small. An unreasonable target voltage range will affect the test effect. In order to reduce the test error, a random voltage value within a preset voltage range is set so that the generated first target voltage value and the second target voltage value can be within a reasonable range. Even if V w If there is an error in the size of , it can also be compensated by a random voltage value, effectively improving the calculation accuracy of the first target voltage value and the second target voltage value.

[0110] The beneficial effect of such a setting is that, through a preset formula, the voltage range of the unstable power supply can be quickly calculated, thereby obtaining a test case and improving the test efficiency.

[0111] S304: Test the electronic component to be tested according to the test case and obtain the test result.

[0112] Exemplarily, after obtaining the test case, the test case is automatically executed, that is, according to the test case, a voltage is applied to the electronic component to be tested, and the electronic component to be tested is controlled to be powered on and off, so as to obtain data fed back by the electronic component to be tested. For example, the power-on and power-off time interval of the electronic component to be tested under an unstable power supply can be obtained. Based on the obtained feedback data, it can be determined whether the electronic component to be tested is qualified. The conditions for qualified judgment can be set in advance. If the feedback data meets the preset qualified judgment conditions, it is determined that the electronic component to be tested is qualified; otherwise, it is unqualified.

[0113] In this embodiment, the electronic component to be tested is tested according to the test case to obtain the test result, including: according to the target time interval in the test case, a fluctuating voltage value within a target voltage range is applied to the electronic component to be tested to obtain the test result; wherein the target voltage range is the range between a first target voltage value and a second target voltage value.

[0114] Specifically, the range between the first target voltage value and the second target voltage value is determined as the target voltage range. According to the target time interval and the target voltage range in the test case, the electronic component to be tested is controlled to work. For example, the rated operating voltage can be applied to the electronic component to be tested. After a period of application, the electronic component is controlled to be powered off, and a power drop occurs. A fluctuating voltage value within the target voltage range is applied to the electronic component to be tested within the target time interval to determine the working condition of the electronic component to be tested during the power fluctuation. Determine whether the working condition is the expected working condition. If so, the electronic component is determined to be qualified; if not, it is unqualified.

[0115] It is also possible to control the electronic component to be tested to be powered on after the target time interval to determine whether the electronic component to be tested can be quickly restored to the rated working voltage. If so, the electronic component is determined to be qualified; if not, it is determined to be unqualified.

[0116] The beneficial effect of such a setting is that by executing test cases, electronic components can be tested accurately and efficiently, saving manpower and time for testing and realizing test automation.

[0117] In the embodiment of the present invention, by acquiring the electrical information of the electronic component to be tested, the electrical characteristic parameters of the electronic component to be tested can be determined in a targeted manner. The electrical characteristic parameters characterize the working parameters of the electronic component when it is in a failed state, that is, the electrical characteristic parameters are the failure parameters of the electronic component. According to the electrical characteristic parameters, the electronic component to be tested is tested in a failed state to obtain the test results, and whether the electronic component to be tested is qualified is determined according to the test results. Fault testing of different electronic components under unique parameters is achieved, thereby improving the effectiveness and accuracy of the test.

[0118] Figure 5 A flowchart of a method for testing an electronic component provided in an embodiment of the present invention is provided. This embodiment is an optional embodiment based on the above embodiment.

[0119] like Figure 5 As shown, the method comprises the following steps:

[0120] S501. Enter electrical information and environmental information.

[0121] S502: Automatically generate and execute parameter detection use cases.

[0122] Among them, the parameter detection use case is a series of power supply waveforms. The power-off waveform and power-on waveform of the electronic component to be tested can be detected in different environments such as high temperature, normal temperature, and low temperature. Both the power-off waveform and the power-on waveform can include high voltage, normal, and low voltage. It is also possible to detect the step voltage to obtain the parameter detection use case of the working current.

[0123] When executing the parameter detection use case, it can be determined whether the parameter detection use cases of all power-off waveforms are completed. If not, continue to execute the unfinished parameter detection use cases of the power-off waveforms; if all are completed, it can be determined whether the parameter detection use cases of all power-on waveforms are completed. If not, continue to execute the unfinished parameter detection use cases of the power-on waveforms; if all are completed, it can be determined whether the parameter detection use case of the step voltage is completed. If not, continue to execute the unfinished parameter detection use case of the step voltage; if all are completed, then record each electrical characteristic parameter according to the execution results.

[0124] S503: Determine electrical characteristic parameters of the electronic component to be tested.

[0125] Among them, the electrical characteristic parameters include power-on time, power-off time, unstable operating voltage, current during normal operation, feedback data of electronic components during normal operation, current during abnormal operation, feedback data of electronic components during abnormal operation, etc.

[0126] S504: Automatically generate test cases.

[0127] The test cases are a series of power waveforms, each of which includes several steps: normal / rated operating voltage, voltage drop for a time interval, and restoration of normal / rated supply voltage.

[0128] S505: Automatically execute the test case, detect the working status of the electronic component to be tested, and store it.

[0129] When executing the test cases, each time a test case is executed, it can be determined whether the test case has been fully executed. If not, the execution continues; if it has been completed, the process proceeds to step S506.

[0130] S506: Perform data judgment, generate report, and print report.

[0131] Among them, all the executed data are compared with the normal data, where the normal data can be current data, specific bus protocol data, input and output port data, etc. After the comparison is completed, it is determined whether the electronic component is failed. If it is not failed, a qualified report is generated and the current round of testing is exited; if it is failed, a failed report is generated and the current round of testing is exited.

[0132] In this embodiment, steps such as generating and executing various use cases, detecting electrical characteristic parameters, test data, and test progress can all be remotely monitored through the network.

[0133] Figure 6 This is a structural block diagram of a test device for electronic components provided by an embodiment of the present invention. For ease of description, only the parts related to the embodiment of the present disclosure are shown. Figure 6 The electronic component testing device 600 includes: an information acquisition module 601 , a parameter determination module 602 and a testing module 603 .

[0134] The information acquisition module 601 is used to acquire electrical information of the electronic component to be tested; wherein the electrical information represents the voltage property of the electronic component;

[0135] The parameter determination module 602 is used to determine the electrical characteristic parameters of the electronic component to be tested according to the electrical information; wherein the electrical characteristic parameters represent the working parameters of the electronic component when it is in a failure state;

[0136] The testing module 603 is used to test the electronic component to be tested according to the electrical characteristic parameters to obtain a test result; wherein the test result indicates whether the electronic component to be tested is qualified.

[0137] Figure 7 A structural block diagram of a testing device for an electronic component provided in an embodiment of the present disclosure, such as Figure 7 As shown, the electronic component testing device 700 includes an information acquisition module 701 , a parameter determination module 702 and a testing module 703 , wherein the parameter determination module 702 includes a first generation unit 7021 and a parameter determination unit 7022 .

[0138] The first generating unit 7021 is used to generate a parameter detection case according to the electrical information and based on a preset first case template; wherein the parameter detection case includes electrical information, and the parameter detection case represents an exemplary method for determining electrical characteristic parameters;

[0139] The parameter determination unit 7022 is used to determine the electrical characteristic parameters of the electronic component to be tested according to the parameter detection use case.

[0140] In one example, the electrical information is a preset voltage value, and the electrical characteristic parameters include a power-off time, a power-on time, and an unstable operating voltage value of the electronic component to be tested corresponding to the preset voltage value.

[0141] In one example, the parameter determination unit 7022 is specifically configured to:

[0142] According to the parameter detection use case, the preset voltage value is applied to the electronic component to be tested to obtain the power-on time and the power-off time of the electronic component to be tested.

[0143] In one example, the parameter determination unit 7022 is specifically configured to:

[0144] According to the parameter detection use case, determining the step voltage information corresponding to the preset voltage value; wherein the step voltage information includes a plurality of voltage values ​​to be applied, and the voltage value to be applied is less than the preset voltage value;

[0145] Applying the voltage values ​​to be applied to the electronic components to be tested respectively, and determining the working feedback information of the electronic components to be tested; wherein the working feedback information represents the working condition of the electronic components;

[0146] According to the working feedback information corresponding to each voltage value to be applied, an unstable working voltage value is determined from the multiple voltage values ​​to be applied.

[0147] In one example, the test module 703 includes:

[0148] A second generating unit, configured to generate a test case for the electronic component to be tested according to the electrical characteristic parameters and based on a preset second test case template; wherein the test case represents an exemplary method for testing the electronic component;

[0149] The result obtaining unit is used to test the electronic component to be tested according to the test case to obtain the test result.

[0150] In one example, the second generation unit is specifically configured to:

[0151] Determine a target time interval according to the power-off time and the power-on time of the electronic component to be tested; wherein the target time interval represents the time interval between power-on and power-off;

[0152] Determine a first target voltage value and a second target voltage value according to the unstable operating voltage value of the electronic component to be tested; wherein the first target voltage value represents the maximum value of the unstable voltage value applied to the electronic component during the test, and the second target voltage value represents the minimum value of the unstable voltage value applied to the electronic component during the test;

[0153] According to the target time interval, the first target voltage value, and the second target voltage value, a test case for the electronic component to be tested is generated based on a preset second test case template.

[0154] In an example, the target time interval is:

[0155] Ti =K×(T u +T f )+R;

[0156] Among them, T i is the target time interval, K is the preset coefficient, R is the random time length, T u is the power-on time, T f The power-off time.

[0157] In one example, the first target voltage value and the second target voltage value are:

[0158] V1=V w +U;

[0159] V2=V w -U;

[0160] Wherein, V1 is the first target voltage value, V2 is the second target voltage value, V w is the unstable working voltage value, and U is the random voltage value.

[0161] In one example, the result obtaining unit is specifically used for:

[0162] According to the target time interval in the test case, a fluctuating voltage value within a target voltage range is applied to the electronic component to be tested to obtain the test result; wherein the target voltage range is a range between a first target voltage value and a second target voltage value.

[0163] In one example, the parameter determination module 702 is specifically configured to:

[0164] Acquire environmental information of the current environment where the electronic component to be tested is located; wherein the environmental information includes at least one of temperature, humidity, and light intensity;

[0165] The electrical characteristic parameters of the electronic component to be tested under the current environment are determined according to the environmental information and the electrical information.

[0166] In one example, the test module 703 is specifically used to:

[0167] The electronic component to be tested is tested according to the environmental information and the electrical characteristic parameters to obtain a test result of the electronic component to be tested under the current environment.

[0168] Figure 8 A structural block diagram of an electronic device provided in an embodiment of the present application, such as Figure 8 As shown, the electronic device includes: a memory 81 and a processor 82; the memory 81 is a memory for storing instructions executable by the processor 82.

[0169] The processor 82 is configured to execute the method provided in the above embodiment.

[0170] The electronic device further includes a receiver 83 and a transmitter 84. The receiver 83 is used to receive instructions and data sent by other devices, and the transmitter 84 is used to send instructions and data to external devices.

[0171] Fig. 9 It is a block diagram of a terminal device according to an exemplary embodiment. The device may be a mobile phone, a computer, a digital broadcast terminal, a message transceiver, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, or the like.

[0172] Device 900 may include one or more of the following components: a processing component 902 , a memory 904 , a power component 906 , a multimedia component 908 , an audio component 910 , an input / output (I / O) interface 912 , a sensor component 914 , and a communication component 916 .

[0173] The processing component 902 generally controls the overall operation of the device 900, such as operations associated with display, phone calls, data communications, camera operations, and recording operations. The processing component 902 may include one or more processors 920 to execute instructions to complete all or part of the steps of the above-mentioned method. In addition, the processing component 902 may include one or more modules to facilitate the interaction between the processing component 902 and other components. For example, the processing component 902 may include a multimedia module to facilitate the interaction between the multimedia component 908 and the processing component 902.

[0174] Device 900 may include one or more of the following components: a processing component 902 , a memory 904 , a power component 906 , a multimedia component 908 , an audio component 910 , an input / output (I / O) interface 912 , a sensor component 914 , and a communication component 916 .

[0175] The memory 904 is configured to store various types of data to support operations on the device 900. Examples of such data include instructions for any application or method operating on the device 900, contact data, phone book data, messages, pictures, videos, etc. The memory 904 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0176] The power supply component 906 provides power to the various components of the device 900. The power supply component 906 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power for the device 900.

[0177] The multimedia component 908 includes a screen that provides an output interface between the device 900 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundaries of the touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 908 includes a front camera and / or a rear camera. When the device 900 is in an operating mode, such as a shooting mode or a video mode, the front camera and / or the rear camera may receive external multimedia data. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

[0178] The audio component 910 is configured to output and / or input audio signals. For example, the audio component 910 includes a microphone (MIC), and when the device 900 is in an operating mode, such as a call mode, a recording mode, and a speech recognition mode, the microphone is configured to receive an external audio signal. The received audio signal can be further stored in the memory 904 or sent via the communication component 916. In some embodiments, the audio component 910 also includes a speaker for outputting audio signals.

[0179] I / O interface 912 provides an interface between processing component 902 and peripheral interface modules, such as keyboards, click wheels, buttons, etc. These buttons may include but are not limited to: a home button, a volume button, a start button, and a lock button.

[0180] The sensor assembly 914 includes one or more sensors for providing various aspects of status assessment for the device 900. For example, the sensor assembly 914 can detect the open / closed state of the device 900, the relative positioning of components, such as the display and keypad of the device 900, and the sensor assembly 914 can also detect the position change of the device 900 or a component of the device 900, the presence or absence of user contact with the device 900, the orientation or acceleration / deceleration of the device 900, and the temperature change of the device 900. The sensor assembly 914 may include a proximity sensor configured to detect the presence of nearby objects without any physical contact. The sensor assembly 914 may also include an optical sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 914 may also include an accelerometer, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0181] The communication component 916 is configured to facilitate wired or wireless communication between the device 900 and other devices. The device 900 can access a wireless network based on a communication standard, such as WiFi, 2G or 3G, or a combination thereof. In an exemplary embodiment, the communication component 916 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 916 also includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology and other technologies.

[0182] In an exemplary embodiment, the apparatus 900 may be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to perform the above method.

[0183] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 904 including instructions, and the instructions can be executed by the processor 920 of the device 900 to perform the above method. For example, the non-transitory computer-readable storage medium can be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0184] A non-transitory computer-readable storage medium, when instructions in the storage medium are executed by a processor of a terminal device, enables the terminal device to execute the above-mentioned method for testing electronic components of the terminal device.

[0185] Those skilled in the art will readily appreciate other embodiments of the present application after considering the specification and practicing the invention disclosed herein. The present application is intended to cover any modification, use or adaptation of the present application, which follows the general principles of the present application and includes common knowledge or customary techniques in the art that are not disclosed in the present application. The specification and examples are intended to be exemplary only, and the true scope and spirit of the present application are indicated by the following claims.

[0186] It should be understood that the present application is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.

Claims

1. A method for testing electronic components, characterized in that: include: Acquiring electrical information of the electronic component to be tested; wherein the electrical information represents a voltage property of the electronic component; Determine electrical characteristic parameters of the electronic component to be tested according to the electrical information; wherein the electrical characteristic parameters represent working parameters of the electronic component when it is in a failure state; The electronic component to be tested is tested according to the electrical characteristic parameters to obtain a test result; wherein the test result indicates whether the electronic component to be tested is qualified.

2. The method according to claim 1, characterized in that Determining electrical characteristic parameters of the electronic component to be tested according to the electrical information includes: According to the electrical information, based on a preset first use case template, a parameter detection use case is generated; wherein the parameter detection use case includes electrical information, and the parameter detection use case represents an exemplary method for determining electrical characteristic parameters; According to the parameter detection use case, the electrical characteristic parameters of the electronic component to be tested are determined.

3. The method according to claim 2, characterized in that The electrical information is a preset voltage value, and the electrical characteristic parameters include a power-off time, a power-on time, and an unstable operating voltage value of the electronic component to be tested corresponding to the preset voltage value.

4. The method according to claim 3, characterized in that Determining electrical characteristic parameters of the electronic component to be tested according to the parameter detection use case includes: According to the parameter detection use case, the preset voltage value is applied to the electronic component to be tested to obtain the power-on time and the power-off time of the electronic component to be tested.

5. The method according to claim 3, characterized in that: Determining electrical characteristic parameters of the electronic component to be tested according to the parameter detection use case includes: According to the parameter detection use case, determining the step voltage information corresponding to the preset voltage value; wherein the step voltage information includes a plurality of voltage values ​​to be applied, and the voltage value to be applied is less than the preset voltage value; Applying the voltage values ​​to be applied to the electronic components to be tested respectively, and determining the working feedback information of the electronic components to be tested; wherein the working feedback information represents the working condition of the electronic components; According to the working feedback information corresponding to each voltage value to be applied, an unstable working voltage value is determined from the multiple voltage values ​​to be applied.

6. The method according to claim 3, characterized in that Testing the electronic component to be tested according to the electrical characteristic parameters to obtain a test result includes: According to the electrical characteristic parameters, based on a preset second use case template, a test case of the electronic component to be tested is generated; wherein the test case represents an exemplary way of testing the electronic component; According to the test case, the electronic component to be tested is tested to obtain the test result.

7. The method according to claim 6, characterized in that According to the electrical characteristic parameters, based on a preset second test case template, a test case of the electronic component to be tested is generated, including: Determine a target time interval according to the power-off time and the power-on time of the electronic component to be tested; wherein the target time interval represents the time interval between power-on and power-off; Determine a first target voltage value and a second target voltage value according to the unstable operating voltage value of the electronic component to be tested; wherein the first target voltage value represents the maximum value of the unstable voltage value applied to the electronic component during the test, and the second target voltage value represents the minimum value of the unstable voltage value applied to the electronic component during the test; According to the target time interval, the first target voltage value, and the second target voltage value, a test case for the electronic component to be tested is generated based on a preset second test case template.

8. The method according to claim 7, characterized in that The target time interval is: T i =K×(T u +T f )+R; Among them, T i is the target time interval, K is the preset coefficient, R is the random time length, T u is the power-on time, T f The power-off time.

9. The method according to claim 7, characterized in that: The first target voltage value and the second target voltage value are: V1=V w +U; V2=V w -SHE IS; Wherein, V1 is the first target voltage value, V2 is the second target voltage value, V w is the unstable working voltage value, and U is the random voltage value.

10. The method according to claim 6, characterized in that According to the test case, the electronic component to be tested is tested to obtain the test result, including: According to the target time interval in the test case, a fluctuating voltage value within a target voltage range is applied to the electronic component to be tested to obtain the test result; wherein the target voltage range is a range between a first target voltage value and a second target voltage value.

11. The method according to any one of claims 1 to 10, characterized in that Determining electrical characteristic parameters of the electronic component to be tested according to the electrical information includes: Acquire environmental information of the current environment where the electronic component to be tested is located; wherein the environmental information includes at least one of temperature, humidity, and light intensity; The electrical characteristic parameters of the electronic component to be tested under the current environment are determined according to the environmental information and the electrical information.

12. The method according to claim 11, characterized in that Testing the electronic component to be tested according to the electrical characteristic parameters to obtain a test result includes: The electronic component to be tested is tested according to the environmental information and the electrical characteristic parameters to obtain a test result of the electronic component to be tested under the current environment.

13. A testing device for electronic components, characterized in that: include: An information acquisition module, used to acquire electrical information of the electronic component to be tested; wherein the electrical information represents a voltage property of the electronic component; A parameter determination module, used to determine the electrical characteristic parameters of the electronic component to be tested according to the electrical information; wherein the electrical characteristic parameters represent the working parameters of the electronic component when it is in a failure state; The test module is used to test the electronic component to be tested according to the electrical characteristic parameters to obtain a test result; wherein the test result indicates whether the electronic component to be tested is qualified.

14. An electronic device, characterized in that: include: A processor, and a memory communicatively connected to the processor; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the method according to any one of claims 1 to 12.

15. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 1 to 12 when executed by a processor.

16. A computer program product, characterized in that The invention comprises a computer program, which implements the method according to any one of claims 1 to 12 when being executed by a processor.

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