Device for measuring end face coaxiality and parallelism of large-size outside micrometer

Abstract

The invention discloses a large-size outside micrometer end face coaxiality and parallelism measuring device, which comprises a laser light source, a polarization beam splitter assembly, a signal detector and a four-dimensional adjusting mechanism, and is characterized in that a laser beam emitted by the laser light source is split into two beams of light after being acted by the polarization beam splitter assembly, reflected laser sequentially passes through the anvil end face, the polarization beam splitter assembly, the micrometer spiral end face and the polarization beam splitter assembly and then enters the signal detector. Coaxiality is measured by monitoring the offset of the laser spots on the end face of the micrometer spiral, and end face parallelism measurement is completed through the offset of the laser spots on the signal detector.

Description

Technical Field

[0001] The invention belongs to the technical field of geometric measurement testing, and in particular relates to a device and method for measuring the coaxiality and parallelism of an end face of a large-size outside diameter micrometer. Background Art

[0002] Large-size outside micrometer is a commonly used measuring instrument, which consists of a fixed scale frame, anvil, micrometer screw, fixed sleeve, differential cylinder, force measuring device, locking device, etc. It is a more accurate length measuring instrument than vernier caliper and is widely used in mechanical processing and inspection. However, due to frequent use in daily activities, it is easy to cause rust, wear, bruises, scale frame deformation and other defects, which eventually lead to the coaxiality and parallelism of the two measuring surfaces of the anvil and micrometer screw, affecting the accuracy of measurement. Summary of the invention

[0003] The invention provides a device and method for measuring the coaxiality and parallelism of the end face of a large-size outside micrometer, characterized in that the device comprises a laser light source, a polarization beam splitter component, a signal detector and a four-dimensional adjustment mechanism.

[0004] Furthermore, the laser light emitted by the laser light source has good linear polarization characteristics.

[0005] Furthermore, the polarization beam splitter assembly includes a polarization beam splitter, a half wave plate, a first quarter wave plate and a second quarter wave plate, wherein the polarization beam splitter is used to reflect and transmit the laser beam, the half wave plate is used to adjust the intensity of the transmitted and reflected light of the polarization beam splitter, and the two quarter wave plates are used to transform the polarization of the laser beam.

[0006] Furthermore, the signal detector may be an area array CCD or a four-quadrant photoelectric detector.

[0007] Furthermore, the laser light source and the polarization beam splitter assembly are mounted on a four-dimensional adjustment mechanism to adjust the coaxiality of the laser beam and the anvil.

[0008] Furthermore, the laser beam emitted by the laser is split into two beams after being acted upon by a half-wave plate, wherein the laser beam transmitted through the polarization beam splitter assembly is directly incident upon the signal detector, and the laser beam reflected by the polarization beam splitter passes through the first quarter-wave plate, the end face of the anvil, the first quarter-wave plate, the polarization beam splitter, the second quarter-wave plate, the end face of the micrometer screw, the second quarter-wave plate, and the polarization beam splitter in sequence before entering the signal detector. When the micrometer screw is non-coaxial with respect to the anvil, the laser spot on the end face of the micrometer screw will be offset; when the end face of the micrometer screw is not parallel to the end face of the anvil, the laser spot on the signal detector reflected by the end face of the micrometer will be offset as the end face of the micrometer screw is translated. In this way, the coaxiality inspection of the measuring rod of the length measuring machine and the measurement of the end face parallelism can be completed.

[0009] Further, the following steps are included:

[0010] Step 1, set up the instrument. First, fix the large-size micrometer and place the measuring device between the micrometer anvil and the micrometer screw.

[0011] Step 2, adjust the incident state of the instrument. Carefully adjust the laser beam emitted by the polarization beam splitter assembly through the four-dimensional adjustment mechanism so that it is vertically incident on the end face of the anvil, and the reflected laser beam returns to the polarization beam splitter assembly along the original path. By adjusting the four-dimensional adjustment mechanism, the exit point and the incident point on the surface of the first quarter-wave plate are made to coincide.

[0012] Step 3: Check the coaxiality of the large-size micrometer anvil

[0013] Move the micrometer screw back and forth to check the position of the laser beam spot on the end face of the micrometer screw to verify the coaxiality of the micrometer screw relative to the anvil. If the two are not coaxial, the laser spot on the end face of the micrometer screw will shift sideways to a certain extent; if the two are coaxial, the position of the laser spot on the end face of the micrometer screw will remain basically unchanged.

[0014] Step 4: Measure the parallelism of the end face of the measuring rod of the length measuring machine head and tailstock

[0015] The micrometer screw is moved back and forth, and the position of the laser beam spot on the signal detector is used to measure the parallelism between the anvil and the end face of the micrometer screw.

[0016] Furthermore, the deflection angle of the micrometer screw head end face relative to the anvil end face is left-right deflection:

[0017] Up and down deflection:

[0018] L1 is the distance from the end face of the micrometer spiral to the splitting point of the polarization beam splitter, L2 is the distance from the signal detector to the splitting point of the polarization beam splitter, and X and Y are the two-dimensional lateral displacements of the laser spot relative to the initial position.

[0019] Compared with the prior art, the present invention has the following beneficial effects:

[0020] 1) The present invention adopts a coaxial method with the anvil and the micrometer screw to perform measurement, thereby eliminating the Abbe error caused by off-axis measurement and improving the measurement accuracy.

[0021] 2) The present invention directly utilizes the anvil and the end surface of the micrometer screw to perform the reflection operation, thereby avoiding the error caused by additional components.

[0022] 3) The present invention directly utilizes the anvil and the end surface of the micrometer screw to perform a reflection operation, so as to check the coaxiality of the measuring rod.

[0023] 4) The present invention directly utilizes the anvil and the end face of the micrometer screw to perform a reflection operation, and can measure the parallelism of the end face.

[0024] 5) The present invention can utilize reflection to replace the end face of the measuring rod, and can be applied to other purposes such as measuring the parallelism of the end face of the measuring rod of the head and tailstock of the length measuring machine. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 The present invention provides a measuring principle and arrangement (a large-size outside diameter micrometer end face parallelism measuring system). DETAILED DESCRIPTION

[0026] The present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be pointed out that the embodiments described below are intended to facilitate the understanding of the present invention and do not have any limiting effect on the present invention.

[0027] like Figure 1 As shown, a device and method for measuring the coaxiality and parallelism of the end face of a large-size outer diameter micrometer is provided. The direction of the laser beam is that the laser beam is adjusted by a half wave plate and then incident on a polarization beam splitter assembly, wherein the transmitted laser of the polarization beam splitter assembly is directly incident on the signal detector, and the first reflected laser of the polarization beam splitter first passes through the first quarter wave plate, and after the first action, it is reflected on the end face of the measuring anvil, and is acted on by the first quarter wave plate for the second time, and is transmitted to the polarization beam splitter, and passes through the second quarter wave plate for the first time, and is reflected on the end face of the micrometer spiral, and is acted on by the second quarter wave plate for the second time, and is reflected on the polarization beam splitter for the second time, and then exits the polarization beam splitter assembly and reaches the signal detector. The specific steps are as follows:

[0028] Step 1, set up the instrument: first fix the large size micrometer and place the measuring device between the micrometer anvil and the micrometer screw.

[0029] Step 2, adjust the incident state of the instrument: carefully adjust the laser beam emitted by the polarization beam splitter assembly through the four-dimensional adjustment mechanism so that it is vertically incident on the end face of the anvil, and the reflected laser beam returns to the original path and then enters the polarization beam splitter assembly, and finally is emitted from one end of the second quarter-wave plate.

[0030] Step 3: Check the coaxiality of the large-size micrometer anvil

[0031] Move the micrometer screw back and forth to check the position of the laser beam spot on the end face of the micrometer screw to verify the coaxiality of the micrometer screw relative to the anvil. If the two are not coaxial, the laser spot on the end face of the micrometer screw will shift sideways to a certain extent; if the two are coaxial, the position of the laser spot on the end face of the micrometer screw will remain basically unchanged.

[0032] Step 4: Measure the parallelism of the end face of the measuring rod of the length measuring machine head and tailstock

[0033] The micrometer screw is moved back and forth, and the parallelism between the anvil and the end face of the micrometer screw is measured by the position of the laser beam spot on the signal detector. The deflection angle of the end face of the micrometer screw side head relative to the end face of the anvil is

[0034] Left and right deflection:

[0035] Up and down deflection:

[0036] L1 is the distance from the end face of the micrometer spiral to the splitting point of the polarization beam splitter, L2 is the distance from the signal detector to the splitting point of the polarization beam splitter, and X and Y are the two-dimensional lateral displacements of the laser spot relative to the initial position.

[0037] The present invention adopts a coaxial method with the measuring anvil and the micrometer screw to perform measurement, thereby eliminating the Abbe error caused by off-axis measurement and improving the measurement accuracy.

[0038] The present invention directly utilizes the measuring anvil and the micrometer screw end surface to perform the reflection operation, thereby avoiding the error caused by additional components.

[0039] The present invention directly utilizes the measuring anvil and the micrometer screw end surface to perform the reflection operation, so as to check the coaxiality of the measuring rod.

[0040] The present invention directly utilizes the anvil and the micrometer screw end face to perform the reflection operation, so as to measure the parallelism of the end face.

[0041] The present invention can utilize reflection to replace the end face of the measuring rod, and can be extended to other applications such as measuring the parallelism of the end faces of the measuring rods of the head and tailstock of the length measuring machine.

[0042] The embodiments described above provide a detailed description of the technical solutions and beneficial effects of the present invention. It should be understood that the above are only specific embodiments of the present invention and are not intended to limit the present invention. Any modifications, supplements and equivalent substitutions made within the scope of the principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A device for measuring the coaxiality and parallelism of the end faces of a large-size outside micrometer, characterized in that: The device comprises a laser light source, a polarization beam splitter component, a signal detector and a four-dimensional adjustment mechanism.

2. A device for measuring the coaxiality and parallelism of the end faces of a large-size outside micrometer according to claim 1, characterized in that: The laser light source emits a laser with good linear polarization characteristics.

3. A device for measuring the coaxiality and parallelism of the end faces of a large-size outside micrometer according to claim 1, characterized in that: The polarization beam splitter assembly includes a polarization beam splitter, a half wave plate, a first quarter wave plate and a second quarter wave plate, wherein the polarization beam splitter is used to reflect and transmit the laser beam, the half wave plate is used to adjust the intensity of the transmitted and reflected light of the polarization beam splitter, and the two quarter wave plates are used to transform the polarization of the laser beam.

4. A device for measuring the coaxiality and parallelism of the end faces of a large-size outside micrometer according to claim 1, characterized in that: The signal detector can be an area array CCD or a four-quadrant photoelectric detector.

5. The device for measuring the end face coaxiality and parallelism of a large-size outside micrometer according to claim 1, characterized in that: The laser light source and polarization beam splitter assembly are mounted on a four-dimensional adjustment mechanism to adjust the coaxiality of the laser beam and the anvil.

6. A device for measuring the end face coaxiality and parallelism of a large-size outside micrometer according to claim 3, characterized in that: The laser beam emitted by the laser is split into two beams after passing through the half-wave plate. The laser beam transmitted through the polarization beam splitter assembly is directly incident on the signal detector, and the laser beam reflected by the polarization beam splitter passes through the first quarter-wave plate, the end face of the anvil, the first quarter-wave plate, the polarization beam splitter, the second quarter-wave plate, the end face of the micrometer screw, the second quarter-wave plate, and the polarization beam splitter in turn before entering the signal detector. When the micrometer screw is not coaxial with respect to the anvil, the laser spot on the end face of the micrometer screw will be offset; when the end face of the micrometer screw is not parallel to the end face of the anvil, the laser spot on the signal detector reflected by the micrometer end face will be offset as the end face of the micrometer screw is translated. In this way, the coaxiality inspection of the measuring rod of the length measuring machine and the measurement of the end face parallelism can be completed.

7. A large-size outside micrometer end face coaxiality and parallelism measuring device according to claims 1-6, wherein the steps for using the device are as follows: Step 1, set up the instrument: first fix the large size micrometer and place the measuring device between the micrometer anvil and the micrometer screw. Step 2, adjust the incident state of the instrument: carefully adjust the laser beam emitted by the polarization beam splitter assembly through the four-dimensional adjustment mechanism so that it is vertically incident on the end face of the anvil, and the reflected laser beam returns to the original path and then enters the polarization beam splitter assembly. By adjusting the four-dimensional adjustment mechanism, the exit point and the incident point on the surface of the first quarter-wave plate are made to coincide with each other. Step 3: Check the coaxiality of the large-size micrometer anvil Move the micrometer screw back and forth to check the position of the laser beam spot on the end face of the micrometer screw to verify the coaxiality of the micrometer screw relative to the anvil. If the two are not coaxial, the laser spot on the end face of the micrometer screw will shift sideways to a certain extent; if the two are coaxial, the position of the laser spot on the end face of the micrometer screw will remain basically unchanged. Step 4: Parallelism measurement between the large-size micrometer anvil and the micrometer screw end face The micrometer screw is moved back and forth, and the position of the laser beam spot on the signal detector is used to measure the parallelism between the anvil and the end face of the micrometer screw.

8. According to the method for measuring the coaxiality and parallelism of the end face of a large-size outside micrometer as claimed in claim 7, the deflection angle of the end face of the micrometer screw side head relative to the end face of the measuring anvil is left-right deflection: Up and down deflection: L1 is the distance from the end face of the micrometer spiral to the splitting point of the polarization beam splitter, L2 is the distance from the signal detector to the splitting point of the polarization beam splitter, and X and Y are the two-dimensional lateral displacements of the laser spot relative to the initial position.

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