Semiconductor laser pricking measurement electrode length detection device

By designing an automated pin-testing electrode length detection device and using a high-precision glass gate displacement sensor for detection, the problem of low efficiency and poor accuracy of pin-testing electrode length detection is solved, efficient and accurate automatic detection is achieved, and labor costs are reduced.

CN120333277APending Publication Date: 2025-07-18Shandong Huaguang Optoelectronics Co. Ltd.
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Patent Information

Application Number
CN202510402949.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-04-01
Publication Date
2025-07-18

AI Technical Summary

Technical Problem

In the prior art, the detection efficiency of the pin-test electrode length is low, the accuracy is poor and the consistency is poor. Manual detection can easily damage the electrode and cannot meet the batching needs.

Method used

A semiconductor laser slicing electrode length detection device is designed, including feeding, flipping, detection and transfer mechanism, using automated assembly line operation, and using high-precision glass gate displacement sensor for detection, avoiding manual contact, and improving detection accuracy and efficiency.

Benefits of technology

The automated continuous operation of pin-test electrode length detection is realized, the detection accuracy is improved to ±0.003mm, and the efficiency is improved by 5-10 times, reducing labor costs and improving detection quality.

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Abstract

The invention discloses a semiconductor laser pricking measurement electrode length detection device. Comprising a base, a bracket arranged on the base, a feeding mechanism which is arranged on the bracket and is used for realizing sequential feeding of stabbing and measuring electrodes, a turnover mechanism which is arranged on the bracket and is used for supporting the stabbing and measuring electrodes to be detected, and a detection mechanism which is arranged on the bracket and is used for detecting the lengths of the stabbing and measuring electrodes, the base is a transfer mechanism used for pushing out the detected pricking detection electrode; in the detection process, a device starting switch is pressed down, the to-be-detected stabbing detection electrodes are placed at the upper end of the feeding mechanism through the automatic feeding machine, slide downwards in the feeding mechanism and are uniformly arranged, the stabbing detection electrode at the lowest end enters the position of the turnover mechanism, the detection mechanism detects the lengths of the stabbing detection electrodes, and then the stabbing detection electrodes are detected. And after detection is completed, the turnover mechanism drives the pricking detection electrode to turn over and fall into the transfer mechanism to be output. The automation degree is high, the operation is convenient, the whole detection process is automatically and continuously operated, and the efficiency is improved.
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Description

Technical Field

[0001] The present invention relates to the field of detecting the length of a probing electrode, and more particularly to a device for detecting the length of a probing electrode of a semiconductor laser. Background Art

[0002] In recent years, due to the unique characteristics of semiconductor lasers, such as small size, light weight, high efficiency and high reliability, they have been more and more widely used in the fields of medical treatment, display lighting, laser processing and military. In the process of semiconductor laser packaging, in order to improve the quality of the laser and screen out the lasers with unqualified performance in time, the commonly adopted screening method is to use a pulse or DC power supply to set a certain range of output voltage and current. The output end of the power supply is connected to a probing electrode with good electrical conductivity, and the probing electrode is connected to the positive and negative electrodes of the laser. The laser is powered on through the probing electrode, so as to carry out the aging and testing work of the laser. As a connecting structure between the power supply and the laser, the probing electrode plays a very important role in the aging and testing process of the laser.

[0003] In the process of laser production, in order to improve the production efficiency, a set of aging test fixtures has multiple groups of probing electrodes to simultaneously carry out aging tests on multiple lasers. Since there are certain deviations in the length dimensions of the probing electrodes during the processing, if the deviation exceeds a certain range, during the aging test, some lasers will have poor contact due to the inconsistent height of the probing electrodes, resulting in the lasers being burned out. Therefore, before using the probing electrode, it is necessary to detect the length of the probing electrode and screen out the probing electrodes whose detected values exceed the required range.

[0004] The commonly adopted method for detecting the probing electrode is to measure the length of the probing electrode one by one with a vernier caliper, and judge the quality of the probing electrode according to the measurement results. This method for detecting the probing electrode is relatively simple, but the efficiency is relatively low. Moreover, different operators apply different forces to the vernier caliper during detection, resulting in different detection data deviations, poor detection accuracy and consistency, and it is easy to damage the surface of the probing head during the detection process, affecting the quality of the probing electrode. With the increasing usage of probing electrodes, this detection method cannot meet the needs of batch detection, and there is no special device for detecting the length of probing electrodes on the market at present. Therefore, a device and a detection method for detecting the length of a probing electrode of a semiconductor laser, which have a simple structure, are easy to operate, have high detection efficiency, high precision and good consistency, are needed to solve the problems existing in the current detection of the length of probing electrodes. Summary of the Invention

[0005] The object of the present invention is to solve the above problems and provide a device for detecting the length of the wire bonding electrodes of a semiconductor laser. The device has a simple structure, convenient operation, high detection accuracy, and improves the detection efficiency of the wire bonding electrode length and the product quality.

[0006] The technical solution adopted by the present invention to solve its technical problems is as follows:

[0007] A device for detecting the length of the wire bonding electrodes of a semiconductor laser includes a base, a bracket provided on the base, a feeding mechanism provided on the bracket for sequentially feeding the wire bonding electrodes, a flipping mechanism provided on the bracket for supporting the wire bonding electrodes to be detected, a detecting mechanism provided on the bracket for detecting the length of the wire bonding electrodes, and a transfer mechanism provided on the base for pushing out the wire bonding electrodes after detection.

[0008] The feeding mechanism includes fixed frames symmetrically provided on the bracket, baffles symmetrically provided in the fixed frames, and inclined surfaces provided at the lower ends of the two baffles.

[0009] The flipping mechanism includes a flipping roller provided on the bracket and rotatable on the bracket, and a V-shaped groove is provided on the outer cylindrical surface of the flipping roller.

[0010] The detecting mechanism includes a fixed rod provided at the lower end of the left baffle and a displacement sensor provided at the lower end of the right baffle.

[0011] Further, a cross bar passing through the baffle is provided in the fixed frame.

[0012] Further, a discharge port is provided on the bracket at the position of the flipping roller, and a sliding frame is provided in the discharge port.

[0013] Further, locking blocks that move up and down on the baffles are provided at the inclined surface positions of the two baffles, a positioning block is provided at the front end of the baffle, and a protrusion that cooperates with the locking block to lock the penultimate wire bonding electrode is provided on the rear side surface of the positioning block.

[0014] Further, a locking cylinder for driving the locking block to move up and down is provided on the baffle, the cylinder body end of the locking cylinder is fixed on the baffle, the piston rod end of the locking cylinder is connected to the locking block through a connecting rod, and a long slot is provided on the baffle, and the connecting rod passes through the long slot to connect the cylinder piston rod and the locking block.

[0015] Further, a blocking mechanism for guiding the wire bonding electrodes to enter the position of the flipping mechanism is provided on the bracket.

[0016] Further, the blocking mechanism includes a blocking cylinder provided on the bracket, a first blocking plate and a second blocking plate provided at the piston rod end of the blocking cylinder, and the first blocking plate is located above the second blocking plate.

[0017] Further, a fixing mechanism for placing the electrode to be detected for measuring radial runout is provided on the bracket.

[0018] Further, the fixing mechanism includes a fixing cylinder, a moving rod arranged at the piston rod end of the fixing cylinder, vertical rods arranged at both ends of the moving rod, and balls arranged at the ends of the vertical rods. Guide plates are symmetrically arranged on the bracket, and guide holes for cooperating with the ends of the moving rod are arranged on the guide plates.

[0019] Further, the transfer mechanism includes a V-shaped guide rail arranged on the base, a transfer cylinder arranged at the end of the V-shaped guide rail, a sliding block arranged at the piston rod end of the transfer cylinder, and a sliding rod arranged on the side of the sliding block. An inclined plate is arranged on the side of the V-shaped guide rail, and a storage box is arranged at the end of the V-shaped guide rail.

[0020] The beneficial effects of the present invention are as follows:

[0021] 1. The present invention includes a base, a bracket arranged on the base, a feeding mechanism arranged on the bracket for sequentially feeding the electrodes to be measured, a flipping mechanism arranged on the bracket for supporting the electrodes to be detected for measurement, a detection mechanism arranged on the bracket for detecting the length of the electrodes to be measured, and a transfer mechanism arranged on the base for pushing out the electrodes to be measured after detection; during the detection process, the device start switch is pressed, and the electrodes to be detected for measurement are placed at the upper end of the feeding mechanism by an automatic feeding machine, and slide down and are evenly arranged in the feeding mechanism. The lowermost electrode to be measured enters the position of the flipping mechanism, and the detection mechanism detects the length of the electrode to be measured. After the detection is completed, the flipping mechanism drives the electrode to be measured to flip and fall to the transfer mechanism for output. It has a high degree of automation and is convenient to operate. The entire detection process runs automatically and continuously, improving the efficiency. When using this device to detect the length of the electrode to be measured, it avoids damage to the surface of the measuring head during manual detection, effectively improving the detection quality of the electrode to be measured. When detecting the length of the electrode to be measured through this device, one person can operate multiple devices simultaneously, greatly reducing the labor cost of production. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, other drawings can also be obtained based on these drawings without creative efforts.

[0023] Figure 1 It is a schematic structural diagram of the present invention;

[0024] Figure 2 It is a schematic structural diagram of the feeding mechanism of the present invention Figure 1 ;

[0025] Figure 3 Structural schematic of the feeding mechanism of the present invention Figure 2 ;

[0026] Figure 4 Front view of the feeding mechanism of the present invention;

[0027] Figure 5 Structural schematic of the transfer mechanism of the present invention;

[0028] Figure 6 Structural schematic of the blocking mechanism of the present invention;

[0029] Figure 7 Structural schematic of the turning roller of the present invention.

[0030] In the figure: base 1, bracket 2, measuring electrode 3, feeding mechanism 4, fixing frame 41, baffle 42, inclined plane 43, cross bar 44, locking block 45, positioning block 46, protrusion 47, locking cylinder 48, turning mechanism 5, turning roller 51, V-shaped groove 52, discharge port 53, sliding frame 54, detection mechanism 6, fixing rod 61, displacement sensor 62, transfer mechanism 7, V-shaped guide rail 71, transfer cylinder 72, sliding block 73, sliding rod 74, storage box 75, inclined plate 76, blocking mechanism 8, blocking cylinder 81, first blocking plate 82, second blocking plate 83, fixing mechanism 9, fixing cylinder 91, moving rod 92, vertical rod 93, ball 94, guide plate 95, guide hole 96. Detailed implementation manners

[0031] In order to enable those skilled in the art of the present technology to better understand the technical solutions in the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0032] Such as Figure 1As shown in the figure, a device for detecting the length of the probing electrode of a semiconductor laser includes a base 1, a bracket 2 arranged on the base 1, a feeding mechanism 4 arranged on the bracket 2 for sequentially feeding the probing electrode 3, a turning mechanism 5 arranged on the bracket 2 for supporting the probing electrode 3 to be detected, a detecting mechanism 6 arranged on the bracket 2 for detecting the length of the probing electrode 3, and a transfer mechanism 7 arranged on the base 1 for pushing out the probing electrode after the detection is completed. The base 1 is located at the lower end of the device, and a portal-shaped bracket 2 is arranged at the upper end of the base 1. A fixing plate is arranged at the upper end of the bracket 2, and the feeding mechanism 4 is installed on the fixing plate. During the detection process, the device start switch is pressed, and the probing electrode to be detected is placed at the upper end of the feeding mechanism by an automatic feeding machine, and then slides downward and is evenly arranged in the feeding mechanism. The lowermost probing electrode enters the position of the turning mechanism 5, and the detecting mechanism 6 detects the length of the probing electrode 3. After the detection is completed, the turning mechanism 5 drives the probing electrode 3 to turn over and fall to the transfer mechanism 7 for output. It has a high degree of automation and is convenient to operate. The entire detection process runs automatically and continuously. The efficiency of detecting the length of the probing electrode is 5 - 10 times higher than that of the previous manual operation. When using this device to detect the length of the probing electrode, it avoids the damage to the surface of the probing head during manual detection and effectively improves the detection quality of the probing electrode. By using this device to detect the length of the probing electrode, one person can operate multiple devices simultaneously, greatly reducing the production labor cost.

[0033] As Figure 2 shown, the feeding mechanism 4 includes fixing frames 41 symmetrically arranged on the bracket 2, baffles 42 symmetrically arranged in the fixing frames 41, and inclined surfaces 43 arranged at the lower ends of the two baffles 42. The feeding mechanism 4 is used to place multiple probing electrodes 3 to be detected. The probing electrode 3 is supported on the inclined surface 43 to limit the probing electrode 3, and due to the self-gravity of the probing electrode 3, the probing electrode 3 can slide downward automatically. A sloped surface 17 is respectively arranged on the inner side of each baffle 15, and the surface of the sloped surface 17 is smooth. The angle of the sloped surface 17 is 30 - 60°, and the probing electrode 7 can slide downward freely on the sloped surface 17.

[0034] As Figure 3 and Figure 7 shown, the turning mechanism 5 includes a turning roller 51 arranged on the bracket 2 and rotating on the bracket 2. A V-shaped groove 52 is arranged on the outer cylindrical surface of the turning roller 51. The rotating shaft of the turning roller 51 is supported on the bracket 2 through a bearing. A motor is arranged on the bracket 2, and the output shaft of the motor is connected to the rotating shaft of the turning roller 51 through a belt to drive the turning roller 51 to rotate 360°. The number of V-shaped grooves 52 is 2. The probing electrode 3 falls into the V-shaped groove 52, and the detecting mechanism 6 detects the length of the probing electrode 3 in the V-shaped groove 52.

[0035] As Figure 4As shown in the figure, the detection mechanism 6 includes a fixed rod 61 provided at the lower end of the left baffle 42 and a displacement sensor 62 provided at the lower end of the right baffle 42. The displacement sensor 62 is coaxial with the fixed rod 61. The displacement sensor 62 uses a high-precision glass grating displacement sensor. After the detection electrode 3 falls into the V-shaped groove 52, the fixed rod 61 positions the left end of the detection electrode 3. The high-precision glass grating displacement sensor contacts the right end of the detection electrode 3, and the high-precision glass grating displacement sensor detects the length dimension of the detection electrode 7. The high-precision glass grating displacement sensor has a maximum detection accuracy of ±0.003 mm. By using the high-precision glass grating displacement sensor instead of the vernier caliper for detection, the detection accuracy is improved from ±0.05 mm before to ±0.003 mm, and the accuracy and reliability of the detection data are greatly improved.

[0036] As Figure 2 shown in the figure, a cross bar 44 passing through the baffle 42 is provided inside the fixing frame 41. In this embodiment, there are three cross bars 44. Two cross bars 44 are provided at the upper end of the fixing frame 41, and one cross bar 44 is provided at the lower end of the fixing frame 41. One baffle 42 is provided on each inner side of the two fixing frames 41. A sleeve cooperating with the cross bar 44 is provided on the baffle 42 and is positioned by screws, and the interval between the two baffles 42 can be adjusted according to the length of the electrode to be measured.

[0037] As Figure 3 shown in the figure, a discharge port 53 is provided on the bracket 2 at the position of the turning roller 51. A sliding frame 54 is provided inside the discharge port 53. After the length measurement of the detection electrode is completed, the turning roller 51 rotates, and the detection electrode falls from the V-shaped groove 52 into the sliding frame 54 and slides to the transfer mechanism 7.

[0038] As Figure 3 shown in the figure, locking blocks 45 that move up and down on the baffle 42 are provided at the inclined plane positions of the two baffles 42. A positioning block 46 is provided at the front end of the baffle 42. A protrusion 47 that cooperates with the locking block 45 to lock the second-to-last detection electrode 3 is provided on the rear side of the positioning block 46. The upper surface of the locking block 45 is parallel to the plane where the inclined plane 43 is located. During the process of the detection electrode 3 falling into the V-shaped groove 52, the upper surface of the locking block 45 overlaps with the plane where the inclined plane 43 is located, and the detection electrode 3 can slide into the V-shaped groove 52. After the lowermost detection electrode 3 slides into the V-shaped groove 52, the locking block 45 rises and cooperates with the protrusion 47 to clamp the second-to-last detection electrode 3, and the remaining detection electrodes 3 will not all fall.

[0039] As Figure 3As shown in the figure, a locking cylinder 48 for driving the lifting of the locking block 45 is provided on the baffle 42. The cylinder body end of the locking cylinder 48 is fixed on the baffle 42, and the piston rod end of the locking cylinder 48 is connected to the locking block 45 through a connecting rod. A long slot is provided on the baffle 42, and the connecting rod passes through the long slot to connect the piston rod of the cylinder 48 with the locking block 45. When performing the detection of the probing electrode, the movement of the locking block is controlled by the telescopic movement of the piston rod of the locking cylinder of the locking mechanism, and then the gap between the locking block and the positioning block is controlled, so as to control the feeding of the probing electrode. When the piston rod of the locking cylinder of the locking mechanism extends, the gap between the locking block and the positioning block decreases, and the probing electrode cannot continue to slide down through the gap. On the contrary, when the piston rod of the locking cylinder of the locking mechanism contracts, the gap increases and the probing electrode can continue to slide down.

[0040] As Figure 2 shown, a blocking mechanism 8 for guiding the probing electrode 3 to enter the position of the flipping mechanism is provided on the bracket 2.

[0041] As Figure 6 shown, the blocking mechanism 8 includes a blocking cylinder 81 provided on the bracket 2, a first blocking plate 82 and a second blocking plate 83 provided at the piston rod end of the blocking cylinder 81. The first blocking plate 82 is located above the second blocking plate 83. The blocking cylinder 81 is located between the two baffles 42. The motor of the flipping mechanism 5 is located on one side of the blocking cylinder 81, and the flipping roller 51 is located at the lower end of the second blocking plate 83. The blocking mechanism 8 is used to block the probing electrode 3 sliding down from the inclined surface of the feeding mechanism 4, so that the probing electrode 3 accurately falls into the V-shaped groove 52 of the flipping roller 51. When the probing electrode 3 to be detected starts to fall from the gap between the positioning block 46 and the locking block 45 at the lower end of the feeding mechanism, the blocking cylinder 81 drives the first blocking plate 82 and the second blocking plate 83 to move forward, so that the probing electrode 3 falls onto the upper end of the second blocking plate 83. When the V-shaped groove 52 of the flipping roller 51 rotates to the uppermost end and the probing electrode 3 falls to the test position, the blocking cylinder 81 drives the first blocking plate 82 and the second blocking plate 83 to move backward, so that the probing electrode 3 just falls into the V-shaped groove 52 of the flipping roller 51.

[0042] As Figure 2 shown, a fixing mechanism 9 for placing the radial runout of the probing electrode 3 to be detected is provided on the bracket 2.

[0043] As Figure 3As shown, the fixing mechanism 9 includes a fixing cylinder 91, a moving rod 92 arranged at the piston rod end of the fixing cylinder 91, vertical rods 93 arranged at both ends of the moving rod 92, and balls 94 arranged at the ends of the vertical rods 93. Guide plates 95 are symmetrically arranged on the bracket 2, and guide holes 96 cooperating with the ends of the moving rod 92 are arranged on the guide plates 95. The fixing cylinder 91 is located in front of the turning roller 51. By driving the fixing cylinder 91, the moving rod 92 and the vertical rods 93 can be moved back and forth, and then the balls 94 can be driven to move back and forth. The balls 94 are used to fix the measuring electrode 3 in the V-shaped groove 52 of the turning roller 51. During the detection process of the measuring electrode 3, the balls 94 on the left and right sides move to the upper end of the measuring electrode 3, so that the measuring electrode 3 will not move up and down during the detection process. After the detection of the measuring electrode 3 is completed, the fixing cylinder 91 drives the balls 94 to move outwards, and the fixing of the measuring electrode 3 is released.

[0044] As Figure 5 shown, the transfer mechanism 7 includes a V-shaped guide rail 71 arranged on the base 1, a transfer cylinder 72 arranged at the end of the V-shaped guide rail 71, a sliding block 73 arranged at the piston rod end of the transfer cylinder 72, and a sliding rod 74 arranged on the side of the sliding block 73. Columns supporting the V-shaped guide rail 71 are arranged on the base 1. The transfer mechanism 7 is located below the sliding frame 54. An inclined plate 76 is arranged on the side of the V-shaped guide rail 71, and a storage box 75 is arranged at the end of the V-shaped guide rail 71. The transfer mechanism 7 is used to transfer the detected measuring electrode 3 into the storage box 75. The detected measuring electrode 3 falls onto the inclined plate 76 through the sliding frame 54, and then slides onto the V-shaped guide rail 71 through the inclined plate 76. The measuring electrode 3 is pushed into the storage box 75 by the sliding rod 74 of the transfer mechanism to store the detected measuring electrode 3.

[0045] The specific working process is as follows:

[0046] Press the device start switch, and the measuring electrode 3 to be detected is put onto the upper end of the feeding mechanism 4 through the automatic feeding machine. The measuring electrode 3 slides down through the inclined plane 43 and is arranged evenly. After the inclined plane 43 is full of the measuring electrodes 3;

[0047] The blocking mechanism 8 and the locking block 45 operate simultaneously, so that the measuring electrode 3 at the lowermost end of the inclined plane 43 falls onto the second blocking plate 83 in the blocking mechanism 8;

[0048] The turning mechanism 5 starts to operate, and the motor drives the turning roller 51 to rotate, so that the V-shaped groove 52 rotates to the detection position, and the blocking mechanism 8 places the measuring electrode 3 into the V-shaped groove 52;

[0049] The fixing mechanism 9 starts to operate. The fixing cylinder 91 drives the ball 94 to move forward, and fixes the puncture and measurement electrode 3 in the V-shaped groove 52 through the ball 94. At this time, the puncture and measurement electrode 3 can move left and right in the V-shaped groove 52;

[0050] The detection mechanism 6 starts to operate. The displacement sensor 62 of the detection mechanism 6 pushes the puncture and measurement electrode 3 forward, so that the other end of the puncture and measurement electrode 3 contacts the fixed rod 61. The puncture and measurement electrode 3 is detected by the displacement sensor of the detection mechanism 6, and the detection data is transmitted to the computer.

[0051] After the detection is completed, the detection mechanism 6 and the fixing mechanism 9 automatically reset, and the fixing of the puncture and measurement electrode 3 is released;

[0052] The flipping mechanism 5 starts to operate. The flipping roller 51 rotates, so that the puncture and measurement electrode 3 falls from the V-shaped groove 52 into the sliding frame 54, and falls into the V-shaped guide rail 71 through the inclined plate 76 of the sliding frame 54;

[0053] The transfer cylinder 72 starts to operate. The transfer cylinder 72 drives the sliding rod 74 to push the puncture and measurement electrode 3 into the storage box 75, stores the puncture and measurement electrode 3 after the detection is completed, and completes the detection work of the puncture and measurement electrode 3.

[0054] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "left", "right", "up", "down", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation to the present invention.

[0055] In the description of the present invention, it should be noted that unless otherwise clearly specified and limited, the terms "installation", "connection", and "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection. It can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

Claims

1. A semiconductor laser pin electrode length detection device, characterized in that, It includes a base (1), a bracket (2) arranged on the base (1), a feeding mechanism (4) arranged on the bracket (2) for realizing the sequential feeding of the probing electrodes (3), a flipping mechanism (5) arranged on the bracket (2) for supporting the probing electrodes (3) to be detected, a detection mechanism (6) arranged on the bracket (2) for detecting the length of the probing electrodes (3), and a transfer mechanism (7) arranged on the base (1) for pushing out the probing electrodes after detection is completed; The feeding mechanism (4) includes fixing frames (41) symmetrically arranged on the bracket (2), baffles (42) symmetrically arranged in the fixing frames (41), and inclined surfaces (43) arranged at the lower ends of the two baffles (42); The flipping mechanism (5) includes a flipping roller (51) arranged on the bracket (2) and rotatable on the bracket (2), and a V-shaped groove (52) is arranged on the outer cylindrical surface of the flipping roller (51); The detection mechanism (6) includes a fixing rod (61) arranged at the lower end of the left baffle (42) and a displacement sensor (62) arranged at the lower end of the right baffle (42).

2. The semiconductor laser pin electrode length detection device according to claim 1, characterized in that, A cross bar (44) passing through the baffle (42) is arranged in the fixing frame (41).

3. The semiconductor laser zapping measurement electrode length detection device according to claim 1, wherein An outlet (53) is arranged on the bracket (2) at the position of the flipping roller (51), and a sliding frame (54) is arranged in the outlet (53).

4. A semiconductor laser pin electrode length detection device according to claim 1, characterized in that, Locking blocks (45) that move up and down on the baffles (42) are arranged at the inclined surface positions of the two baffles (42). A positioning block (46) is arranged at the front end of the baffle (42), and a protrusion (47) that cooperates with the locking block (45) to lock the penultimate probing electrode (3) is arranged on the rear side of the positioning block (46).

5. The semiconductor laser pin electrode length detection device according to claim 4, characterized in that, A locking cylinder (48) for driving the locking block (45) to move up and down is arranged on the baffle (42). The cylinder body end of the locking cylinder (48) is fixed on the baffle (42), the piston rod end of the locking cylinder (48) is connected to the locking block (45) through a connecting rod, a long hole is arranged on the baffle (42), and the connecting rod passes through the long hole to connect the piston rod of the cylinder (48) and the locking block (45).

6. The semiconductor laser pin electrode length detection device according to claim 1, wherein A blocking mechanism (8) for guiding the probing electrode (3) to enter the position of the flipping mechanism is arranged on the bracket (2).

7. The semiconductor laser pin electrode length detection device according to claim 6, characterized in that, The blocking mechanism (8) includes a blocking cylinder (81) arranged on the bracket (2), a first blocking plate (82) and a second blocking plate (83) arranged at the piston rod end of the blocking cylinder (81), and the first blocking plate (82) is located above the second blocking plate (83).

8. The semiconductor laser pin electrode length detection device according to claim 1, characterized in that, A fixing mechanism (9) for placing the radial runout of the probing electrode (3) to be detected is arranged on the bracket (2).

9. The semiconductor laser pin electrode length detection device according to claim 8, characterized in that The fixing mechanism (9) includes a fixing cylinder (91), a moving rod (92) arranged at the piston rod end of the fixing cylinder (91), vertical rods (93) arranged at both ends of the moving rod (9), balls (94) arranged at the ends of the vertical rods (93), guiding plates (95) symmetrically arranged on the bracket (2), and guiding holes (96) arranged on the guiding plates (95) and cooperating with the ends of the moving rod (9).

10. A semiconductor laser pin electrode length detection device according to claim 1, characterized in that, The transfer mechanism (7) includes a V-shaped guide rail (71) provided on the base (1), a transfer cylinder (72) provided at the end of the V-shaped guide rail (71), a sliding block (73) provided at the piston rod end of the transfer cylinder (72), and a sliding rod (74) provided on the side of the sliding block (73). An inclined plate (76) is provided on the side of the V-shaped guide rail (71), and a storage box (75) is provided at the end of the V-shaped guide rail (71).