An infrared detector drive adjustment circuit

Abstract

This invention proposes an infrared detector driving adjustment circuit, relating to the field of infrared detector driving technology. The circuit constructs an infrared detector adjustment circuit to perform voltage regulation, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector. It calculates the operating performance coefficient of each component and, based on this coefficient, calculates the cumulative performance coefficient of each component. Based on the cumulative performance coefficient, it performs cumulative adjustment annotations and adjusts performance parameters. This invention has significant advantages in solving the problems existing in traditional infrared detector adjustment circuits and is of great significance for improving the performance stability and reliability of infrared detectors.

Description

Technical Field

[0001] This invention proposes an infrared detector driving adjustment circuit, which relates to the field of infrared detector driving technology. Background Technology

[0002] Infrared detectors face a variety of challenges in practical applications, including changes in ambient temperature, fluctuations in power supply voltage, and complex signal processing. These factors can all affect the imaging quality and stability of infrared detectors.

[0003] Traditional infrared detector conditioning circuits often suffer from problems such as inaccurate voltage regulation, unstable temperature control, untimely power-on / off control, and limited signal processing capabilities. These problems are particularly prominent in high-sensitivity and high-resolution infrared detection systems, severely impacting the overall system performance and reliability. Summary of the Invention

[0004] This invention provides an infrared detector drive adjustment circuit to solve the problems often found in traditional infrared detector adjustment circuits, such as inaccurate voltage regulation, unstable temperature control, untimely power-on / off control, and limited signal processing capabilities. These problems are particularly prominent in high-sensitivity and high-resolution infrared detection systems, severely impacting the overall system performance and reliability.

[0005] This invention proposes an infrared detector driving adjustment circuit, the adjustment circuit comprising:

[0006] The driver module is used to build the infrared detector adjustment circuit, which performs voltage adjustment, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector.

[0007] The performance monitoring and adjustment module is used to calculate the performance coefficient of each device and the cumulative performance coefficient of each device based on the performance coefficient of each device.

[0008] The cumulative adjustment label and performance parameters are adjusted according to the cumulative performance coefficient of the device.

[0009] Furthermore, the driver construction module includes:

[0010] The module is used to build an infrared detector adjustment circuit using an infrared detector, a cooling temperature test circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA.

[0011] The voltage regulation module is used to output a power supply voltage to the infrared detector through the bias voltage control circuit, and to regulate its bias voltage.

[0012] The temperature judgment module is used to connect the cooling temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source, acquire the internal temperature data, judge the temperature data, obtain the temperature judgment result, and output the temperature judgment result to the FPGA.

[0013] A power-off control module is added to the cooling temperature test circuit to determine whether the internal temperature of the Dewar has reached the specified value. Based on the determination result, the module controls the detector to be powered on or off. When the internal temperature of the Dewar reaches the specified value, the detector is powered on.

[0014] An analog signal processing module is used to acquire infrared radiation signals through the infrared detector and output level signals to the analog signal processing circuit through the infrared detector.

[0015] After the analog signal processing circuit converts the level signal output by the infrared detector into a specified level signal, it performs analog-to-digital conversion to obtain a digital image signal.

[0016] The image generation and power-on control module is used to receive the digital signal through the FPGA, perform digital processing, output the image signal, output digital control pulses to the infrared detector, and power on the bias voltage control circuit.

[0017] Furthermore, the analog signal processing module includes:

[0018] The analog image signal output from the infrared detector is used to drive the output impedance and obtain the boosted data.

[0019] After being driven, it enters the subtractor, which then sets the analog image signal low level starting from 0V;

[0020] Amplify the analog image signal to the preset dynamic range of the ADC;

[0021] The analog image signal is converted into a 14-bit parallel digital image signal by using an ADC.

[0022] The digital image signal is input into the FPGA;

[0023] One channel of image information is output from the FPGA and stored for later use.

[0024] Furthermore, the image generation and power-on control module includes:

[0025] Obtain a constant current source of 1mA;

[0026] When the temperature-sensing diode of the infrared detector is characterized by a preset resistance, it is converted into a level signal after passing through a constant current source.

[0027] Compare the level signal with the reference level signal;

[0028] Power-on protection is generated internally within the FPGA: when the voltage level signal exceeds or equals the reference voltage level signal, the infrared detector is powered on; when the voltage level signal falls below the reference voltage level signal, the infrared detector is powered off.

[0029] Obtain the reference level signal;

[0030] A potentiometer is placed between the reference level signal and the ground line to adjust the intermediate level signal and obtain adjustment data;

[0031] The input voltage is obtained by isolating and driving the level signal through an operational amplifier.

[0032] Furthermore, the performance monitoring and adjustment module includes:

[0033] Obtain the operating status data of each device, and calculate the operating performance coefficient of each device based on the operating status data;

[0034] The formula for calculating the operating performance coefficient is as follows:

[0035]

[0036] Among them, Y xn SS represents the device's operating performance coefficient, e represents the type of data monitoring the device provides, and SS represents the device's data monitoring type. i For the actual operational data of the i-th data monitoring category, MS i For the preset target data of the i-th data monitoring category, q i The preset weight data for the i-th data monitoring category;

[0037] The device is marked for operation adjustment according to the operation performance coefficient, and the operation parameters of the device with operation adjustment mark are adjusted to obtain adjustment data;

[0038] Calculate the cumulative performance coefficient of the device based on the aforementioned operating performance coefficient;

[0039] The formula for calculating the cumulative performance coefficient of the device is as follows:

[0040]

[0041] Among them, L xn Y is the cumulative performance coefficient of the device, d is the number of devices up to the current device, and Y is the cumulative performance coefficient of the device. xna Y is the performance coefficient of the d-th device. xna-1 Let be the operating performance coefficient of the (d-1)th device;

[0042] The device is cumulatively adjusted based on its cumulative performance coefficient. For devices with cumulative adjustment labels, the performance parameters are adjusted to obtain adjustment data.

[0043] Furthermore, the adjustment method includes:

[0044] Construct an infrared detector adjustment circuit to perform voltage regulation, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector;

[0045] Calculate the operating performance coefficient of each device, and then calculate the cumulative performance coefficient of each device based on the operating performance coefficient of each device.

[0046] The cumulative adjustment label and performance parameters are adjusted according to the cumulative performance coefficient of the device.

[0047] Furthermore, the construction of the infrared detector adjustment circuit, which performs voltage adjustment, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector, includes:

[0048] An infrared detector adjustment circuit is constructed using an infrared detector, a cooling temperature testing circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA.

[0049] The bias voltage control circuit outputs a power supply voltage to the infrared detector and adjusts its bias voltage.

[0050] The cooling temperature test circuit is connected to the temperature-sensing diode of the infrared detector through a constant current source to obtain the internal temperature data, judge the temperature data, obtain the temperature judgment result, and output the temperature judgment result to the FPGA.

[0051] After the cooling temperature test circuit determines whether the internal temperature of the Dewar has reached the specified value, it controls the power supply to or power off of the detector based on the determination result. When the internal temperature of the Dewar reaches the specified value, the detector is powered on.

[0052] Infrared radiation signals are acquired through the infrared detector, and level signals are output to the analog signal processing circuit through the infrared detector.

[0053] After the analog signal processing circuit converts the level signal output by the infrared detector into a specified level signal, it performs analog-to-digital conversion to obtain a digital image signal.

[0054] The FPGA receives the digital signal, performs digital processing, outputs the image signal, outputs digital control pulses to the infrared detector, and controls the bias voltage control circuit.

[0055] Further, the step of converting the level signal output by the infrared detector into a specified level signal through the analog signal processing circuit, and then performing analog-to-digital conversion to obtain a digital image signal includes:

[0056] The analog image signal output from the infrared detector is used to drive the output impedance and obtain the boosted data.

[0057] After being driven, it enters the subtractor, which then sets the analog image signal low level starting from 0V;

[0058] Amplify the analog image signal to the preset dynamic range of the ADC;

[0059] The analog image signal is converted into a 14-bit parallel digital image signal by using an ADC.

[0060] The digital image signal is input into the FPGA;

[0061] One channel of image information is output from the FPGA and stored for later use.

[0062] Furthermore, the method for powering on the detector when the internal temperature of the Dewar reaches a predetermined value and the adjustment method for the bias voltage control circuit include:

[0063] Obtain a constant current source of 1mA;

[0064] When the temperature-sensing diode of the infrared detector is characterized by a preset resistance, it is converted into a level signal after passing through a constant current source.

[0065] Compare the level signal with the reference level signal;

[0066] Power-on protection is generated internally within the FPGA: when the voltage level signal exceeds or equals the reference voltage level signal, the infrared detector is powered on; when the voltage level signal falls below the reference voltage level signal, the infrared detector is powered off.

[0067] Obtain the reference level signal;

[0068] A potentiometer is placed between the reference level signal and the ground line to adjust the intermediate level signal and obtain adjustment data;

[0069] The input voltage is obtained by isolating and driving the level signal through an operational amplifier.

[0070] Further, the operating performance coefficient of each device is calculated, and the cumulative performance coefficient of each device is calculated based on the operating performance coefficient. The cumulative adjustment labels and performance parameters are then adjusted based on the cumulative performance coefficient, including:

[0071] Obtain the operating status data of each device, and calculate the operating performance coefficient of each device based on the operating status data;

[0072] The formula for calculating the operating performance coefficient is as follows:

[0073]

[0074] Among them, Y xn SS represents the device's operating performance coefficient, e represents the type of data monitoring the device provides, and SS represents the device's data monitoring type. i For the actual operational data of the i-th data monitoring category, MS i For the preset target data of the i-th data monitoring category, q i The preset weight data for the i-th data monitoring category;

[0075] The device is marked for operation adjustment according to the operation performance coefficient, and the operation parameters of the device with operation adjustment mark are adjusted to obtain adjustment data;

[0076] Calculate the cumulative performance coefficient of the device based on the aforementioned operating performance coefficient;

[0077] The formula for calculating the cumulative performance coefficient of the device is as follows:

[0078]

[0079] Among them, L xn Y is the cumulative performance coefficient of the device, d is the number of devices up to the current device, and Y is the cumulative performance coefficient of the device. xna Y is the performance coefficient of the d-th device. xna-1 Let be the operating performance coefficient of the (d-1)th device;

[0080] The device is cumulatively adjusted based on its cumulative performance coefficient. For devices with cumulative adjustment labels, the performance parameters are adjusted to obtain adjustment data.

[0081] The beneficial effects of this invention are as follows: Precise voltage regulation and temperature control ensure the infrared detector operates under optimal conditions, thereby improving detection accuracy and stability. Real-time monitoring and adjustment of the operating status of each component in the system allows for timely detection and handling of potential problems, effectively preventing malfunctions and enhancing system reliability and durability. An automatic adjustment mechanism based on the cumulative performance coefficient of the components enables precise optimization of system performance bottlenecks, improving overall system performance. Automated monitoring and adjustment functions reduce the need for manual intervention and periodic inspections, thus lowering system maintenance costs. Stable detection performance and optimized system performance directly enhance the user experience, making the infrared detection system more efficient and convenient. Attached Figure Description

[0082] Figure 1 This is a schematic diagram of an infrared detector drive adjustment circuit.

[0083] Figure 2 This is a schematic diagram of the driving adjustment method. Detailed Implementation

[0084] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustration and explanation only and are not intended to limit the present invention.

[0085] In one embodiment of the present invention, an infrared detector driving adjustment circuit is provided, the adjustment circuit comprising:

[0086] The driver module is used to build the infrared detector adjustment circuit, which performs voltage adjustment, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector.

[0087] The performance monitoring and adjustment module is used to calculate the performance coefficient of each device and the cumulative performance coefficient of each device based on the performance coefficient of each device.

[0088] The cumulative adjustment label and performance parameters are adjusted according to the cumulative performance coefficient of the device.

[0089] The working principle of the above technical solution is as follows: It provides a stable and adjustable voltage to the infrared detector, ensuring that the detector maintains optimal operating conditions under different working environments. Voltage regulation is achieved through a precise power management circuit, which can automatically adjust the output voltage according to the detector's needs. Since the performance of the infrared detector is greatly affected by temperature, the module has a built-in temperature sensor that monitors the temperature of the detector and its surrounding environment in real time, and automatically adjusts or alarms based on preset temperature thresholds to ensure that the detector operates within a suitable temperature range. Based on system commands or preset conditions (such as abnormal temperature or unstable voltage), the module can control the power-on and power-off of the infrared detector, achieving safe and reliable power management. The infrared radiation signal received by the detector is converted and further processed by the module to generate an image signal.

[0090] The module collects operating parameters (such as voltage, current, temperature, and signal strength) of the detector and its related circuits to calculate the operating performance coefficient of each device. These coefficients reflect the current operating status and performance level of the devices. Based on the operating performance coefficients of individual devices, the module further calculates the cumulative performance coefficient of the entire system. This coefficient integrates the performance of all key devices, providing a basis for evaluating the overall system performance. Based on the cumulative performance coefficients, the module automatically performs cumulative adjustment annotations, identifying performance bottlenecks or potential problem points. Simultaneously, the module can automatically adjust relevant performance parameters (such as voltage and temperature setpoints) as needed to optimize the overall system performance.

[0091] After the detector output level is changed to the specified level, analog-to-digital conversion is performed to convert it into a digital image signal. The detector is powered on when the internal temperature of the Dewar reaches the specified value. The infrared detector is powered by a low dropout linear regulator (LDO) and biased by a low noise voltage reference source. The FPGA generates four digital control pulses for the infrared detector, and the serial port can be set with control words to control parameters such as gain and DE of the infrared detector.

[0092] After the detector output level is changed to a specified level, analog-to-digital conversion is performed to convert it into a digital image signal, including:

[0093] The image signal output from the detector is driven first to increase the output impedance;

[0094] After being driven, it enters the subtractor, causing the image signal to start at a low level from 0V;

[0095] Amplify the image signal to match the dynamic range of the ADC;

[0096] The analog-to-digital conversion is performed by an ADC, and the output is a 14-bit parallel digital image signal.

[0097] The digital image signal is input into the FPGA for further processing;

[0098] The FPGA outputs one channel of image information.

[0099] In summary, the level information output by the infrared detector is converted into the original grayscale LVDS digital image signal.

[0100] Once the internal temperature of the Dewar reaches a specified value, power is applied to the detector, including:

[0101] Provide a constant current source of 1mA;

[0102] If the temperature-sensing diode of the infrared detector is characterized by resistance, it will be converted into a level signal after passing through a constant current source.

[0103] The level signal is compared with the reference level signal;

[0104] Power is applied to the detector when the level signal exceeds the comparison value;

[0105] A power-on protection mechanism is implemented within the FPGA, which means that power is applied immediately when the voltage level reaches the power-on threshold, and power is delayed when the voltage level falls below the power-on threshold.

[0106] A reference level is generated using a high-precision, low-noise voltage reference source;

[0107] A potentiometer is added between the reference level and the ground line to facilitate the adjustment of various intermediate levels;

[0108] An operational amplifier is used to isolate and drive the voltage level, generating an adjustable input voltage.

[0109] The technical effects of the above solution are as follows: Precise voltage regulation and temperature control ensure the infrared detector operates under optimal conditions, thereby improving detection accuracy and stability. Real-time monitoring and adjustment of the operating status of each component in the system allows for timely detection and handling of potential problems, effectively preventing malfunctions and enhancing system reliability and durability. An automatic adjustment mechanism based on the cumulative performance coefficient of the components enables precise optimization of system performance bottlenecks, improving overall system performance. Automated monitoring and adjustment functions reduce the need for manual intervention and periodic inspections, thus lowering system maintenance costs. Stable detection performance and optimized system performance directly enhance the user experience, making the infrared detection system more efficient and convenient.

[0110] In one embodiment of the present invention, the driver construction module includes:

[0111] The module is used to build an infrared detector adjustment circuit using an infrared detector, a cooling temperature test circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA.

[0112] The voltage regulation module is used to output a power supply voltage to the infrared detector through the bias voltage control circuit, and to regulate its bias voltage.

[0113] The temperature judgment module is used to connect the cooling temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source, acquire the internal temperature data, judge the temperature data, obtain the temperature judgment result, and output the temperature judgment result to the FPGA.

[0114] A power-off control module is added to the cooling temperature test circuit to determine whether the internal temperature of the Dewar has reached the specified value. Based on the determination result, the module controls the detector to be powered on or off. When the internal temperature of the Dewar reaches the specified value, the detector is powered on.

[0115] An analog signal processing module is used to acquire infrared radiation signals through the infrared detector and output level signals to the analog signal processing circuit through the infrared detector.

[0116] After the analog signal processing circuit converts the level signal output by the infrared detector into a specified level signal, it performs analog-to-digital conversion to obtain a digital image signal.

[0117] The image generation and power-on control module receives the digital signals via the FPGA, performs digital processing, outputs image signals, and provides digital control pulses to the infrared detector, as well as powering the bias voltage control circuit. The bias voltage control circuit powers the infrared detector through a low-dropout linear regulator (LDO) and provides a bias voltage to the infrared detector through a low-noise voltage reference source. The FPGA generates four digital control pulses for the infrared detector, with a serial port that can be used to set control words, thereby controlling parameters such as the infrared detector's gain and voltage gradient (DE).

[0118] The working principle of the above technical solution is as follows: The building module is the foundation of the entire regulation circuit. By integrating key components such as the infrared detector, cooling temperature test circuit, bias voltage control circuit, analog signal processing circuit, and FPGA (Field Programmable Gate Array), a complete infrared detector regulation circuit system is constructed. This system can realize comprehensive control of the infrared detector, signal processing, and image generation. The voltage regulation module uses the bias voltage control circuit to provide a stable operating voltage to the infrared detector through a low-dropout linear regulator (LDO). At the same time, this module can also finely adjust the bias voltage to adapt to different working environments and detection requirements, ensuring that the infrared detector can operate in the best performance state. The temperature judgment module, through the cooling temperature test circuit, uses a constant current source connected to the temperature sensing diode built into the infrared detector to acquire the internal temperature data of the detector in real time. This data is sent to the FPGA for processing and compared with the preset temperature threshold to obtain the temperature judgment result. When the temperature reaches or exceeds the specified range, the temperature judgment module will send a corresponding signal to trigger the subsequent power-on / power-off control. The power-on / power-off control module controls the power-on or power-off operation of the infrared detector based on the output result of the temperature judgment module. Specifically, when the cooling temperature test circuit detects that the internal temperature of the Dewar has reached a specified value, the power-on / off control module sends a power-on signal to the infrared detector to start it working; conversely, it sends a power-off signal to protect the detector from overheating or other adverse conditions. The analog signal processing module receives the level signal output from the infrared detector and converts it into a specified level signal through a series of processing steps (such as signal amplification, filtering, and level conversion). Subsequently, this module uses an analog-to-digital converter (ADC) to convert the analog signal into a digital image signal. The image generation and power-on control module receives the digital signal from the analog signal processing module via the FPGA and performs digital processing (such as image reconstruction, enhancement, and denoising) to ultimately output a high-quality image signal. Simultaneously, this module also generates digital control pulses for the infrared detector via the FPGA to control the power-on of the bias voltage control circuit. These control pulses can be set via a serial port to adjust parameters such as the gain and DE of the infrared detector, further optimizing detection performance and image quality.

[0119] An infrared detector is a device that converts incident infrared radiation signals into electrical signals. Infrared radiation is an electromagnetic wave with wavelengths between visible light and microwaves, which is not directly perceptible to the human eye. Infrared detectors utilize principles such as the infrared thermal effect and the photoelectric effect to convert infrared radiation into electrical signals. Infrared detectors are widely used in military reconnaissance, night vision devices, thermal imaging, environmental monitoring, and other fields, and are highly valued for their strong environmental adaptability, good concealment, and strong ability to identify camouflaged targets.

[0120] The cooling temperature testing circuit is primarily used to monitor and control the operating temperature of infrared detectors. Since the performance of infrared detectors is significantly affected by temperature, cooling technology is needed to lower their operating temperature to improve detection sensitivity and stability. A cooling temperature testing circuit typically includes a temperature sensor, a constant current source, and signal processing circuitry. It can acquire real-time temperature data from inside the infrared detector and adjust it as needed. When the temperature reaches a set value, the circuit controls the cooling device to stop operating, maintaining the detector within its optimal operating temperature range.

[0121] The bias voltage control circuit provides a stable bias voltage to the infrared detector to ensure its normal operation. The bias voltage is a stable reference level that plays a crucial role in electronic circuits, determining the operating point, eliminating DC offset, improving linearity, and stabilizing circuit operation. In infrared detectors, the bias voltage control circuit adjusts the power supply voltage and current to provide a suitable bias voltage, enabling the detector to output a stable electrical signal under optimal operating conditions.

[0122] Analog signal processing circuits are primarily used to amplify, filter, and perform analog-to-digital conversion on the analog signals output from infrared detectors. Since the signals output by infrared detectors are typically weak and contain noise, preprocessing by analog signal processing circuits is necessary to improve the signal-to-noise ratio and reliability. Analog signal processing circuits typically include amplifiers, filters, and analog-to-digital converters, which convert analog signals into digital signals and output them to subsequent digital signal processing systems for further processing.

[0123] An FPGA (Field-Programmable Gate Array) is a type of programmable logic device (PLD). It allows users to configure and reconfigure it via software to achieve different functions. FPGAs offer advantages such as high flexibility, strong parallelism, and short development cycles, and are widely used in communications, image processing, and embedded systems. In infrared detector modulation circuits, FPGAs are typically used to receive and process digital signals output from analog signal processing circuits, enabling functions such as image digitization and power-on control. FPGAs contain a large number of programmable logic units and interconnect resources, allowing for highly parallel computation and processing, thereby improving the overall performance and efficiency of the system.

[0124] The infrared detector, cooling temperature test circuit, bias voltage control circuit, analog signal processing circuit, and FPGA each play an important role in the infrared detector adjustment circuit, working together to achieve stable operation and efficient processing of the infrared detector.

[0125] The technical effects of the above solution are as follows: Through the coordinated operation of the cooling temperature testing circuit and the power-on / off control module, precise control of the internal temperature of the infrared detector is achieved, ensuring stable operation of the detector at its optimal operating temperature. The voltage regulation module and bias voltage control circuit provide stable and adjustable operating and bias voltages for the infrared detector, effectively improving the detector's signal-to-noise ratio and sensitivity. The integration of the analog signal processing module and the image generation and power-on control module enables efficient acquisition, processing, and conversion of infrared radiation signals, generating high-quality image signals. Through digital control pulses generated by the FPGA and serial port setting control words, users can flexibly adjust parameters such as the gain and DE of the infrared detector to adapt to different detection needs and environmental conditions. The entire adjustment circuit system adopts a modular design, with each module relatively independent and easy to maintain and upgrade, effectively improving the system's reliability and maintainability.

[0126] In one embodiment of the present invention, the analog signal processing module includes:

[0127] The analog image signal output from the infrared detector is used to drive the output impedance and obtain the boosted data.

[0128] After being driven, it enters the subtractor, which then sets the analog image signal low level starting from 0V;

[0129] Amplify the analog image signal to the preset dynamic range of the ADC;

[0130] The analog image signal is converted into a 14-bit parallel digital image signal by using an ADC.

[0131] The digital image signal is input into the FPGA;

[0132] One channel of image information is output from the FPGA and stored for later use.

[0133] In summary, the level information output by the infrared detector is converted into the original grayscale LVDS digital image signal.

[0134] The working principle of the above technical solution is as follows: The analog image signal output from the infrared detector is driven, and the output impedance is increased. This step aims to enhance signal stability and anti-interference capability, ensuring that the signal will not attenuate or reflect during transmission due to impedance mismatch. The analog image signal after impedance boosting enters the subtractor. In the subtractor, by setting an appropriate reference level, the low level of the analog image signal can be adjusted from 0V. This step helps optimize the dynamic range of the signal, making it better suited to the input requirements of the ADC. The module amplifies the analog image signal to the preset dynamic range of the ADC. This is to ensure that the signal can fully utilize the ADC's resolution during analog-to-digital conversion, thereby generating a higher quality digital image signal. The amplification factor is determined based on the ADC's performance parameters and the output characteristics of the infrared detector. The amplified analog image signal is then sent to the ADC for analog-to-digital conversion. The ADC converts the continuous analog signal into a discrete digital signal, i.e., a 14-bit parallel digital image signal. This step realizes the conversion of the signal from the analog domain to the digital domain. The 14-bit parallel digital image signal is then input into the FPGA. FPGAs possess powerful digital signal processing capabilities, enabling further digitization of input digital image signals, such as filtering, enhancement, and noise reduction. The processed image information is output as an image signal through the FPGA and stored for later use. In this way, the original grayscale LVDS digital image signal is successfully generated and saved.

[0135] The technical effects of the above solution are as follows: By improving output impedance, setting low levels, and amplifying signals, the analog signal processing module effectively improves the quality of the analog image signal output by the infrared detector, reducing attenuation and noise interference during signal transmission. Amplifying the analog image signal to the preset dynamic range of the ADC ensures that the signal can fully utilize the ADC's resolution during analog-to-digital conversion, thereby generating a higher-quality digital image signal. The introduction of the FPGA makes digital image signal processing more flexible and efficient. Users can program the FPGA according to actual needs to implement different image processing algorithms and functions. Converting the analog image signal to a digital image signal facilitates storage and transmission. Digital image signals have advantages such as strong anti-interference capabilities and ease of copying and processing. As a crucial component of the infrared detector's adjustment circuit, the performance improvement of the analog signal processing module directly drives the overall performance improvement of the entire system. By optimizing the signal processing flow and improving signal quality, the detection accuracy and stability of the infrared detector can be further improved.

[0136] In one embodiment of the present invention, the image generation and power-on control module includes:

[0137] Obtain a constant current source of 1mA;

[0138] When the temperature-sensing diode of the infrared detector is characterized by a preset resistance, it is converted into a level signal after passing through a constant current source.

[0139] Compare the level signal with the reference level signal;

[0140] Power-on protection is generated internally within the FPGA: when the voltage level signal exceeds or equals the reference voltage level signal, the infrared detector is powered on; when the voltage level signal falls below the reference voltage level signal, the infrared detector is powered off.

[0141] Obtain the reference level signal;

[0142] A potentiometer is placed between the reference level signal and the ground line to adjust the intermediate level signal and obtain adjustment data;

[0143] The input voltage is obtained by isolating and driving the level signal through an operational amplifier.

[0144] The working principle of the above technical solution is as follows: A stable current source is needed to drive the temperature-sensing diode of the infrared detector. This constant current source is set to 1mA to ensure that the temperature-sensing diode operates under stable and predictable conditions. The design of the constant current source typically involves precision resistors, operational amplifiers, or dedicated constant current chips to provide a stable current output. The temperature-sensing diode of the infrared detector exhibits a preset resistance characteristic at a specific temperature. When this temperature-sensing diode is connected to a 1mA constant current source, according to Ohm's law, a temperature-related voltage drop (i.e., a voltage level signal) is generated across it. This voltage level signal reflects the temperature of the temperature-sensing diode and indirectly reflects the temperature of the infrared detector or its surrounding environment. To control the power-on and power-off of the infrared detector, the voltage level signal generated by the temperature-sensing diode needs to be compared with a preset reference voltage level signal. This comparison process is usually implemented through a comparator circuit, which outputs a high-level or low-level signal depending on whether the input voltage level signal exceeds or equals the reference voltage level signal. After receiving the output signal of the comparator, the FPGA (Field-Programmable Gate Array) controls the power supply of the infrared detector based on this signal. If the voltage level signal exceeds or equals the reference voltage level signal, the FPGA triggers the power-on logic to supply power to the infrared detector; if the voltage level signal is lower than the reference voltage level signal, the FPGA triggers the power-off logic to cut off the power to the infrared detector. This mechanism ensures that the infrared detector only operates under safe or suitable temperature conditions. To flexibly set the power-on and power-off temperature thresholds, a potentiometer can be placed between the reference voltage level signal and ground. By adjusting the resistance of the potentiometer, the magnitude of the reference voltage level signal can be changed, thereby adjusting the intermediate voltage level signal. This adjustment process allows users to set the power-on and power-off conditions of the infrared detector according to actual needs. Before sending the voltage level signal to the comparator, it may need to be isolated and driven by an operational amplifier. The operational amplifier can improve the signal's driving capability while providing electrical isolation to prevent external noise or interference from affecting the signal. This ensures that the comparator receives a clean and stable voltage level signal.

[0145] The technical advantages of the above solution are as follows: By using a constant current source and a precise resistance-to-voltage conversion mechanism, the level signal generated by the temperature-sensing diode is ensured to be stable and reliable, thereby improving the stability of the entire system. By adjusting the potentiometer to change the magnitude of the reference level signal, users can flexibly set the power-on and power-off temperature thresholds of the infrared detector to adapt to different working environments and requirements. The power-on protection logic inside the FPGA ensures that the infrared detector only operates under safe or suitable temperature conditions, avoiding damage or malfunctions caused by overheating or other adverse conditions. The use of operational amplifiers achieves level signal isolation and driving, improving the signal's anti-interference capability and driving capability, thereby improving signal quality. The entire system adopts a modular design, with each module relatively independent and easy to maintain and upgrade. At the same time, the programmability of the FPGA makes the system highly flexible and scalable.

[0146] In one embodiment of the present invention, the performance monitoring and adjustment module includes:

[0147] Obtain the operating status data of each device, and calculate the operating performance coefficient of each device based on the operating status data;

[0148] The formula for calculating the operating performance coefficient is as follows:

[0149]

[0150] Among them, Y xn SS represents the device's operating performance coefficient, e represents the type of data monitoring the device provides, and SS represents the device's data monitoring type. i For the actual operational data of the i-th data monitoring category, MS i For the preset target data of the i-th data monitoring category, q i The preset weight data is for the i-th data monitoring category. The value range of the weight data is 0-1, excluding 0 and 1. The data monitoring categories include voltage regulation, temperature judgment, power-on / power-off control and image signal data monitoring.

[0151] The device is marked for operation adjustment according to the operation performance coefficient, and the operation parameters of the device with operation adjustment mark are adjusted to obtain adjustment data;

[0152] Calculate the cumulative performance coefficient of the device based on the aforementioned operating performance coefficient;

[0153] The formula for calculating the cumulative performance coefficient of the device is as follows:

[0154]

[0155] Among them, L xn Y is the cumulative performance coefficient of the device, d is the number of devices up to the current device, and Y is the cumulative performance coefficient of the device. xnaY is the performance coefficient of the d-th device. xna-1 Let be the operating performance coefficient of the (d-1)th device;

[0156] The device is cumulatively adjusted based on its cumulative performance coefficient. For devices with cumulative adjustment labels, the performance parameters are adjusted to obtain adjustment data.

[0157] The working principle of the above technical solution is as follows: the system needs to collect the operating status data of each device in real time or periodically. This data covers multiple monitoring categories, including voltage regulation, temperature judgment, power-on / power-off control, and image signals. Each data monitoring category corresponds to a key aspect of device operation and is an important basis for evaluating device performance. The actual operating data (SS) collected for each data monitoring category... i The system compares it with preset target data (MS). i The data is compared with the preset weighted data (qi) of each data monitoring type, and the operating performance coefficient (Y) of the device is calculated using a specific calculation formula. xn This coefficient comprehensively reflects the device's performance under its current operating condition. Based on the calculated operating performance coefficient, the system adjusts the device's operation. For devices with operating performance coefficients higher than the preset standard, the system marks them as requiring adjustment and automatically or prompts the user to adjust the operating parameters. After adjustment, the system collects data again and calculates a new operating performance coefficient to verify the adjustment effect. To more comprehensively evaluate the performance of the entire system, the system also calculates the device cumulative performance coefficient (L). xn This coefficient considers the operating performance coefficients of all components in the system and accumulates them according to a certain weight or order. By accumulating the performance coefficients, the system can evaluate the overall performance of the entire system. Based on the accumulated performance coefficients of the components, the system performs cumulative adjustment annotations on the overall system. If the accumulated performance coefficients are higher than the preset standard, the system will mark the system part that needs adjustment and automatically or prompt the user to adjust the performance parameters of the corresponding components. This adjustment aims to improve the overall performance of the entire system.

[0158] The technical effects of the above solution are as follows: By collecting real-time operating status data of devices and calculating operating performance coefficients, the system can evaluate device performance in real time, promptly identify potential problems, and make adjustments. Based on the operating performance coefficients, the system can accurately locate the devices and parameters requiring adjustment, avoiding blind adjustments and resource waste. By calculating the cumulative performance coefficients of devices and applying cumulative adjustment labels, the system can optimize the overall performance of the entire system, improving its stability and reliability. The entire process is automated and intelligent, reducing manual intervention and errors, and improving work efficiency and accuracy. The system supports the configuration of various data monitoring types and preset weight data, allowing for flexible adjustment and optimization according to different application scenarios and needs.

[0159] In one embodiment of the present invention, the adjustment method includes:

[0160] Construct an infrared detector adjustment circuit to perform voltage regulation, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector;

[0161] Calculate the operating performance coefficient of each device, and then calculate the cumulative performance coefficient of each device based on the operating performance coefficient of each device.

[0162] The cumulative adjustment label and performance parameters are adjusted according to the cumulative performance coefficient of the device.

[0163] The working principle of the above technical solution is as follows: It provides a stable and adjustable voltage to the infrared detector, ensuring that the detector maintains optimal operating conditions under different working environments. Voltage regulation is achieved through a precise power management circuit, which can automatically adjust the output voltage according to the detector's needs. Since the performance of the infrared detector is greatly affected by temperature, the module has a built-in temperature sensor that monitors the temperature of the detector and its surrounding environment in real time, and automatically adjusts or alarms based on preset temperature thresholds to ensure that the detector operates within a suitable temperature range. Based on system commands or preset conditions (such as abnormal temperature or unstable voltage), the module can control the power-on and power-off of the infrared detector, achieving safe and reliable power management. The infrared radiation signal received by the detector is converted and further processed by the module to generate an image signal.

[0164] The module collects operating parameters (such as voltage, current, temperature, and signal strength) of the detector and its related circuits to calculate the operating performance coefficient of each device. These coefficients reflect the current operating status and performance level of the devices. Based on the operating performance coefficients of individual devices, the module further calculates the cumulative performance coefficient of the entire system. This coefficient integrates the performance of all key devices, providing a basis for evaluating the overall system performance. Based on the cumulative performance coefficients, the module automatically performs cumulative adjustment annotations, identifying performance bottlenecks or potential problem points. Simultaneously, the module can automatically adjust relevant performance parameters (such as voltage and temperature setpoints) as needed to optimize the overall system performance.

[0165] The technical effects of the above solution are as follows: Precise voltage regulation and temperature control ensure the infrared detector operates under optimal conditions, thereby improving detection accuracy and stability. Real-time monitoring and adjustment of the operating status of each component in the system allows for timely detection and handling of potential problems, effectively preventing malfunctions and enhancing system reliability and durability. An automatic adjustment mechanism based on the cumulative performance coefficient of the components enables precise optimization of system performance bottlenecks, improving overall system performance. Automated monitoring and adjustment functions reduce the need for manual intervention and periodic inspections, thus lowering system maintenance costs. Stable detection performance and optimized system performance directly enhance the user experience, making the infrared detection system more efficient and convenient.

[0166] In one embodiment of the present invention, the construction of the infrared detector adjustment circuit, which performs voltage adjustment, temperature judgment, power-on / power-off control, and image signal generation on the infrared detector, includes:

[0167] An infrared detector adjustment circuit is constructed using an infrared detector, a cooling temperature testing circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA.

[0168] The bias voltage control circuit outputs a power supply voltage to the infrared detector and adjusts its bias voltage.

[0169] The cooling temperature test circuit is connected to the temperature-sensing diode of the infrared detector through a constant current source to obtain the internal temperature data, judge the temperature data, obtain the temperature judgment result, and output the temperature judgment result to the FPGA.

[0170] After the cooling temperature test circuit determines whether the internal temperature of the Dewar has reached the specified value, it controls the power supply to or power off of the detector based on the determination result. When the internal temperature of the Dewar reaches the specified value, the detector is powered on.

[0171] Infrared radiation signals are acquired through the infrared detector, and level signals are output to the analog signal processing circuit through the infrared detector.

[0172] After the analog signal processing circuit converts the level signal output by the infrared detector into a specified level signal, it performs analog-to-digital conversion to obtain a digital image signal.

[0173] The FPGA receives the digital signals, processes them digitally, outputs image signals, and provides digital control pulses to the infrared detector to power the bias voltage control circuit. The bias voltage control circuit powers the infrared detector through a low-dropout linear regulator (LDO) and provides a bias voltage through a low-noise voltage reference source. The FPGA generates four digital control pulses for the infrared detector, with a serial port for setting control words to control parameters such as gain and DE of the infrared detector.

[0174] The working principle of the above technical solution is as follows: By integrating key components such as an infrared detector, a cooling temperature testing circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA (Field-Programmable Gate Array), a complete infrared detector adjustment circuit system is constructed. This system can achieve comprehensive control of the infrared detector, signal processing, and image generation. The bias voltage control circuit provides a stable operating voltage to the infrared detector through a low-dropout linear regulator (LDO). Simultaneously, the bias voltage can be finely adjusted to adapt to different working environments and detection requirements, ensuring that the infrared detector operates at its optimal performance. Through the cooling temperature testing circuit, a constant current source is connected to the temperature-sensing diode built into the infrared detector to acquire the detector's internal temperature data in real time. This data is sent to the FPGA for processing and compared with a preset temperature threshold to derive a temperature judgment result. When the temperature reaches or exceeds the specified range, the temperature judgment module sends a corresponding signal to trigger subsequent power-on / power-off control. The power-on / power-off control module controls the power-on or power-off operation of the infrared detector based on the output of the temperature judgment module. Specifically, when the cooling temperature test circuit detects that the internal temperature of the Dewar has reached a specified value, the power-on / off control module sends a power-on signal to the infrared detector to start it working; conversely, it sends a power-off signal to protect the detector from overheating or other adverse conditions. The module receives the level signal output from the infrared detector and converts it to a specified level signal through a series of processing steps (such as signal amplification, filtering, and level conversion). Then, an analog-to-digital converter (ADC) is used to convert the analog signal into a digital image signal. The FPGA receives the digital signal from the analog signal processing module and performs digital processing (such as image reconstruction, enhancement, and denoising) to ultimately output a high-quality image signal. Simultaneously, the FPGA generates digital control pulses for the infrared detector to control the power-on of the bias voltage control circuit. These control pulses can be set via a serial port to adjust parameters such as the gain and DE of the infrared detector, further optimizing detection performance and image quality.

[0175] The technical effects of the above solution are as follows: Through the coordinated operation of the cooling temperature testing circuit and the power-on / off control module, precise control of the internal temperature of the infrared detector is achieved, ensuring stable operation of the detector at its optimal operating temperature. The voltage regulation module and bias voltage control circuit provide stable and adjustable operating and bias voltages for the infrared detector, effectively improving the detector's signal-to-noise ratio and sensitivity. The integration of the analog signal processing module and the image generation and power-on control module enables efficient acquisition, processing, and conversion of infrared radiation signals, generating high-quality image signals. Through digital control pulses generated by the FPGA and serial port setting control words, users can flexibly adjust parameters such as the gain and DE of the infrared detector to adapt to different detection needs and environmental conditions. The entire adjustment circuit system adopts a modular design, with each module relatively independent and easy to maintain and upgrade, effectively improving the system's reliability and maintainability.

[0176] In one embodiment of the present invention, the step of converting the level signal output by the infrared detector into a predetermined level signal through an analog signal processing circuit, and then performing analog-to-digital conversion to obtain a digital image signal includes:

[0177] The analog image signal output from the infrared detector is used to drive the output impedance and obtain the boosted data.

[0178] After being driven, it enters the subtractor, which then sets the analog image signal low level starting from 0V;

[0179] Amplify the analog image signal to the preset dynamic range of the ADC;

[0180] The analog image signal is converted into a 14-bit parallel digital image signal by using an ADC.

[0181] The digital image signal is input into the FPGA;

[0182] One channel of image information is output from the FPGA and stored for later use.

[0183] In summary, the level information output by the infrared detector is converted into the original grayscale LVDS digital image signal.

[0184] The working principle of the above technical solution is as follows: The analog image signal output from the infrared detector is driven, and the output impedance is increased. This step aims to enhance signal stability and anti-interference capability, ensuring that the signal will not attenuate or reflect during transmission due to impedance mismatch. The analog image signal after impedance boosting enters the subtractor. In the subtractor, by setting an appropriate reference level, the low level of the analog image signal can be adjusted from 0V. This step helps optimize the dynamic range of the signal, making it better suited to the input requirements of the ADC. The module amplifies the analog image signal to the preset dynamic range of the ADC. This is to ensure that the signal can fully utilize the ADC's resolution during analog-to-digital conversion, thereby generating a higher quality digital image signal. The amplification factor is determined based on the ADC's performance parameters and the output characteristics of the infrared detector. The amplified analog image signal is then sent to the ADC for analog-to-digital conversion. The ADC converts the continuous analog signal into a discrete digital signal, i.e., a 14-bit parallel digital image signal. This step realizes the conversion of the signal from the analog domain to the digital domain. The 14-bit parallel digital image signal is then input into the FPGA. FPGAs possess powerful digital signal processing capabilities, enabling further digitization of input digital image signals, such as filtering, enhancement, and noise reduction. The processed image information is output as an image signal through the FPGA and stored for later use. In this way, the original grayscale LVDS digital image signal is successfully generated and saved.

[0185] The technical effects of the above solution are as follows: By improving output impedance, setting low levels, and amplifying signals, the analog signal processing module effectively improves the quality of the analog image signal output by the infrared detector, reducing attenuation and noise interference during signal transmission. Amplifying the analog image signal to the preset dynamic range of the ADC ensures that the signal can fully utilize the ADC's resolution during analog-to-digital conversion, thereby generating a higher-quality digital image signal. The introduction of the FPGA makes digital image signal processing more flexible and efficient. Users can program the FPGA according to actual needs to implement different image processing algorithms and functions. Converting the analog image signal to a digital image signal facilitates storage and transmission. Digital image signals have advantages such as strong anti-interference capabilities and ease of copying and processing. As a crucial component of the infrared detector's adjustment circuit, the performance improvement of the analog signal processing module directly drives the overall performance improvement of the entire system. By optimizing the signal processing flow and improving signal quality, the detection accuracy and stability of the infrared detector can be further improved.

[0186] In one embodiment of the present invention, the method for powering on the detector when the internal temperature of the Dewar reaches a predetermined value and the adjustment method for the bias voltage control circuit include:

[0187] Obtain a constant current source of 1mA;

[0188] When the temperature-sensing diode of the infrared detector is characterized by a preset resistance, it is converted into a level signal after passing through a constant current source.

[0189] Compare the level signal with the reference level signal;

[0190] Power-on protection is generated internally within the FPGA: when the voltage level signal exceeds or equals the reference voltage level signal, the infrared detector is powered on; when the voltage level signal falls below the reference voltage level signal, the infrared detector is powered off.

[0191] Obtain the reference level signal;

[0192] A potentiometer is placed between the reference level signal and the ground line to adjust the intermediate level signal and obtain adjustment data;

[0193] The input voltage is obtained by isolating and driving the level signal through an operational amplifier.

[0194] The working principle of the above technical solution is as follows: A stable current source is needed to drive the temperature-sensing diode of the infrared detector. This constant current source is set to 1mA to ensure that the temperature-sensing diode operates under stable and predictable conditions. The design of the constant current source typically involves precision resistors, operational amplifiers, or dedicated constant current chips to provide a stable current output. The temperature-sensing diode of the infrared detector exhibits a preset resistance characteristic at a specific temperature. When this temperature-sensing diode is connected to a 1mA constant current source, according to Ohm's law, a temperature-related voltage drop (i.e., a voltage level signal) is generated across it. This voltage level signal reflects the temperature of the temperature-sensing diode and indirectly reflects the temperature of the infrared detector or its surrounding environment. To control the power-on and power-off of the infrared detector, the voltage level signal generated by the temperature-sensing diode needs to be compared with a preset reference voltage level signal. This comparison process is usually implemented through a comparator circuit, which outputs a high-level or low-level signal depending on whether the input voltage level signal exceeds or equals the reference voltage level signal. After receiving the output signal of the comparator, the FPGA (Field-Programmable Gate Array) controls the power supply of the infrared detector based on this signal. If the voltage level signal exceeds or equals the reference voltage level signal, the FPGA triggers the power-on logic to supply power to the infrared detector; if the voltage level signal is lower than the reference voltage level signal, the FPGA triggers the power-off logic to cut off the power to the infrared detector. This mechanism ensures that the infrared detector only operates under safe or suitable temperature conditions. To flexibly set the power-on and power-off temperature thresholds, a potentiometer can be placed between the reference voltage level signal and ground. By adjusting the resistance of the potentiometer, the magnitude of the reference voltage level signal can be changed, thereby adjusting the intermediate voltage level signal. This adjustment process allows users to set the power-on and power-off conditions of the infrared detector according to actual needs. Before sending the voltage level signal to the comparator, it may need to be isolated and driven by an operational amplifier. The operational amplifier can improve the signal's driving capability while providing electrical isolation to prevent external noise or interference from affecting the signal. This ensures that the comparator receives a clean and stable voltage level signal.

[0195] The technical advantages of the above solution are as follows: By using a constant current source and a precise resistance-to-voltage conversion mechanism, the level signal generated by the temperature-sensing diode is ensured to be stable and reliable, thereby improving the stability of the entire system. By adjusting the potentiometer to change the magnitude of the reference level signal, users can flexibly set the power-on and power-off temperature thresholds of the infrared detector to adapt to different working environments and requirements. The power-on protection logic inside the FPGA ensures that the infrared detector only operates under safe or suitable temperature conditions, avoiding damage or malfunctions caused by overheating or other adverse conditions. The use of operational amplifiers achieves level signal isolation and driving, improving the signal's anti-interference capability and driving capability, thereby improving signal quality. The entire system adopts a modular design, with each module relatively independent and easy to maintain and upgrade. At the same time, the programmability of the FPGA makes the system highly flexible and scalable.

[0196] One embodiment of the present invention includes calculating the operating performance coefficient of each device, calculating the cumulative performance coefficient of each device based on the operating performance coefficient, and adjusting the cumulative adjustment label and performance parameters based on the cumulative performance coefficient, including:

[0197] Obtain the operating status data of each device, and calculate the operating performance coefficient of each device based on the operating status data;

[0198] The formula for calculating the operating performance coefficient is as follows:

[0199]

[0200] Among them, Y xn SS represents the device's operating performance coefficient, e represents the type of data monitoring the device provides, and SS represents the device's data monitoring type. i For the actual operational data of the i-th data monitoring category, MS i For the preset target data of the i-th data monitoring category, q i The preset weight data is for the i-th data monitoring category; the data monitoring categories include voltage regulation, temperature judgment, power-on / power-off control, and image signal data monitoring.

[0201] The device is marked for operation adjustment according to the operation performance coefficient, and the operation parameters of the device with operation adjustment mark are adjusted to obtain adjustment data;

[0202] Calculate the cumulative performance coefficient of the device based on the aforementioned operating performance coefficient;

[0203] The formula for calculating the cumulative performance coefficient of the device is as follows:

[0204]

[0205] Among them, L xnY is the cumulative performance coefficient of the device, d is the number of devices up to the current device, and Y is the cumulative performance coefficient of the device. xna Y is the performance coefficient of the d-th device. xna-1 Let be the operating performance coefficient of the (d-1)th device;

[0206] The device is cumulatively adjusted based on its cumulative performance coefficient. For devices with cumulative adjustment labels, the performance parameters are adjusted to obtain adjustment data.

[0207] The working principle of the above technical solution is as follows: the system needs to collect the operating status data of each device in real time or periodically. This data covers multiple monitoring categories, including voltage regulation, temperature judgment, power-on / power-off control, and image signals. Each data monitoring category corresponds to a key aspect of device operation and is an important basis for evaluating device performance. The actual operating data (SS) collected for each data monitoring category... i The system compares it with preset target data (MS). i The data is compared with the preset weighted data (qi) of each data monitoring type to calculate the device's operating performance coefficient (Y). xn This coefficient comprehensively reflects the device's performance under its current operating condition. Based on the calculated operating performance coefficient, the system adjusts the device's operation. For devices with operating performance coefficients higher than the preset standard, the system marks them as requiring adjustment and automatically or prompts the user to adjust the operating parameters. After adjustment, the system collects data again and calculates a new operating performance coefficient to verify the adjustment effect. To more comprehensively evaluate the performance of the entire system, the system also calculates the device cumulative performance coefficient (L). xn This coefficient considers the operating performance coefficients of all components in the system and accumulates them according to a certain weight or order. By accumulating the performance coefficients, the system can evaluate the overall performance of the entire system. Based on the accumulated performance coefficients of the components, the system performs cumulative adjustment annotations on the overall system. If the accumulated performance coefficients are higher than the preset standard, the system will mark the system part that needs adjustment and automatically or prompt the user to adjust the performance parameters of the corresponding components. This adjustment aims to improve the overall performance of the entire system.

[0208] The technical effects of the above solution are as follows: By collecting real-time operating status data of devices and calculating operating performance coefficients, the system can evaluate device performance in real time, promptly identify potential problems, and make adjustments. Based on the operating performance coefficients, the system can accurately locate the devices and parameters requiring adjustment, avoiding blind adjustments and resource waste. By calculating the cumulative performance coefficients of devices and applying cumulative adjustment labels, the system can optimize the overall performance of the entire system, improving its stability and reliability. The entire process is automated and intelligent, reducing manual intervention and errors, and improving work efficiency and accuracy. The system supports the configuration of various data monitoring types and preset weight data, allowing for flexible adjustment and optimization according to different application scenarios and needs.

[0209] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. An infrared detector drive adjustment circuit, characterized in that, The regulating circuit includes: The driver module is used to build the infrared detector adjustment circuit, which performs voltage adjustment, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector. The performance monitoring and adjustment module is used to calculate the performance coefficient of each device and to calculate the cumulative performance coefficient of the devices based on the performance coefficient of each device. The cumulative adjustment label and performance parameters are adjusted according to the cumulative performance coefficient of the device; The driver construction module includes: The module is used to build an infrared detector adjustment circuit using an infrared detector, a cooling temperature test circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA. The voltage regulation module is used to output a power supply voltage to the infrared detector through the bias voltage control circuit, and to regulate its bias voltage. The temperature judgment module is used to connect the cooling temperature test circuit to the temperature measuring diode of the infrared detector through a constant current source, acquire the internal temperature data, judge the temperature data, obtain the temperature judgment result, and output the temperature judgment result to the FPGA. A power-off control module is added to the cooling temperature test circuit to determine whether the internal temperature of the Dewar has reached the specified value. Based on the determination result, the module controls the detector to be powered on or off. When the internal temperature of the Dewar reaches the specified value, the detector is powered on. An analog signal processing module is used to acquire infrared radiation signals through the infrared detector and output level signals to the analog signal processing circuit through the infrared detector. After the analog signal processing circuit converts the level signal output by the infrared detector into a specified level signal, it performs analog-to-digital conversion to obtain a digital image signal. The image generation and power-on control module is used to receive the digital image signal through the FPGA, perform digital processing, output the image signal, output digital control pulses to the infrared detector, and perform power-on control on the bias voltage control circuit. The performance monitoring and adjustment module includes: Obtain the operating status data of each device, and calculate the operating performance coefficient of each device based on the operating status data; The formula for calculating the operating performance coefficient is as follows: Among them, Y xn SS represents the device's operating performance coefficient, e represents the type of data monitoring the device provides, and SS represents the device's data monitoring type. i For the actual operational data of the i-th data monitoring category, MS i For the preset target data of the i-th data monitoring category, q i The preset weight data for the i-th data monitoring category; The device is marked for operation adjustment according to the operation performance coefficient, and the operation parameters of the device with operation adjustment mark are adjusted to obtain adjustment data; Calculate the cumulative performance coefficient of the device based on the aforementioned operating performance coefficient; The formula for calculating the cumulative performance coefficient of the device is as follows: Among them, L xn Y is the cumulative performance coefficient of the device, d is the number of devices up to the current device, and Y is the cumulative performance coefficient of the device. xna Y is the operating performance coefficient of the d-th device. xna-1 Let be the operating performance coefficient of the (d-1)th device; The device is cumulatively adjusted based on its cumulative performance coefficient. For devices with cumulative adjustment labels, the performance parameters are adjusted to obtain adjustment data.

2. The infrared detector drive adjustment circuit according to claim 1, characterized in that, The analog signal processing module includes: The analog image signal output from the infrared detector is used to drive the output impedance and obtain the boosted data. After being driven, it enters the subtractor, which then sets the analog image signal low level starting from 0V; Amplify the analog image signal to the preset dynamic range of the ADC; The analog image signal is converted into a 14-bit parallel digital image signal by using an ADC. The digital image signal is input into the FPGA; One channel of image information is output from the FPGA and stored for later use.

3. The infrared detector drive adjustment circuit according to claim 1, characterized in that, The image generation and power-on control module includes: Obtain a constant current source of 1mA; When the temperature-sensing diode of the infrared detector is characterized by a preset resistance, it is converted into a level signal after passing through a constant current source. Compare the level signal with the reference level signal; Power-on protection is generated internally within the FPGA: when the voltage level signal exceeds or equals the reference voltage level signal, the infrared detector is powered on; when the voltage level signal falls below the reference voltage level signal, the infrared detector is powered off. Obtain the reference level signal; A potentiometer is placed between the reference level signal and the ground line to adjust the intermediate level signal and obtain adjustment data; The input voltage is obtained by isolating and driving the level signal through an operational amplifier.

4. A method for implementing an infrared detector drive adjustment circuit as described in claim 1, characterized in that, The adjustment method includes: Construct an infrared detector adjustment circuit to perform voltage regulation, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector; Calculate the operating performance coefficient for each device, and then calculate the cumulative performance coefficient for the devices based on the operating performance coefficient for each device. The cumulative adjustment label and performance parameters are adjusted according to the cumulative performance coefficient of the device; The infrared detector adjustment circuit, which performs voltage adjustment, temperature judgment, power-on / power-off control, and image signal generation for the infrared detector, includes: An infrared detector adjustment circuit is constructed using an infrared detector, a cooling temperature testing circuit, a bias voltage control circuit, an analog signal processing circuit, and an FPGA. The bias voltage control circuit outputs a power supply voltage to the infrared detector and adjusts its bias voltage. The cooling temperature test circuit is connected to the temperature-sensing diode of the infrared detector through a constant current source to obtain the internal temperature data, judge the temperature data, obtain the temperature judgment result, and output the temperature judgment result to the FPGA. After the cooling temperature test circuit determines whether the internal temperature of the Dewar has reached the specified value, it controls the power supply to or power off of the detector based on the determination result. When the internal temperature of the Dewar reaches the specified value, the detector is powered on. Infrared radiation signals are acquired through the infrared detector, and level signals are output to the analog signal processing circuit through the infrared detector. After the analog signal processing circuit converts the level signal output by the infrared detector into a specified level signal, it performs analog-to-digital conversion to obtain a digital image signal. The FPGA receives the digital image signal, performs digital processing, outputs the image signal, and outputs digital control pulses to the infrared detector to power up the bias voltage control circuit. This process includes calculating the operating performance coefficient of each device, calculating the cumulative performance coefficient of the devices based on the operating performance coefficient of each device, and adjusting the cumulative adjustment labels and performance parameters based on the cumulative performance coefficient of the devices, including: Obtain the operating status data of each device, and calculate the operating performance coefficient of each device based on the operating status data; The formula for calculating the operating performance coefficient is as follows: Among them, Y xn SS represents the device's operating performance coefficient, e represents the type of data monitoring the device provides, and SS represents the device's data monitoring type. i For the actual operational data of the i-th data monitoring category, MS i For the preset target data of the i-th data monitoring category, q i The preset weight data for the i-th data monitoring category; The device is marked for operation adjustment according to the operation performance coefficient, and the operation parameters of the device with operation adjustment mark are adjusted to obtain adjustment data; Calculate the cumulative performance coefficient of the device based on the aforementioned operating performance coefficient; The formula for calculating the cumulative performance coefficient of the device is as follows: Among them, L xn Y is the cumulative performance coefficient of the device, d is the number of devices up to the current device, and Y is the cumulative performance coefficient of the device. xna Y is the operating performance coefficient of the d-th device. xna-1 Let be the operating performance coefficient of the (d-1)th device; The device is cumulatively adjusted based on its cumulative performance coefficient. For devices with cumulative adjustment labels, the performance parameters are adjusted to obtain adjustment data.

5. The adjustment method for an infrared detector drive adjustment circuit according to claim 4, characterized in that, The process of converting the level signal output by the infrared detector into a specified level signal via an analog signal processing circuit, followed by analog-to-digital conversion to obtain a digital image signal, includes: The analog image signal output from the infrared detector is used to drive the output impedance and obtain the boosted data. After being driven, it enters the subtractor, which then sets the analog image signal low level starting from 0V; Amplify the analog image signal to the preset dynamic range of the ADC; The analog image signal is converted into a 14-bit parallel digital image signal by using an ADC. The digital image signal is input into the FPGA; One channel of image information is output from the FPGA and stored for later use.

6. The adjustment method for an infrared detector drive adjustment circuit according to claim 4, characterized in that, The method for powering on the detector when the internal temperature of the Dewar reaches a specified value and the adjustment method for the bias voltage control circuit include: Obtain a constant current source of 1mA; When the temperature-sensing diode of the infrared detector is characterized by a preset resistance, it is converted into a level signal after passing through a constant current source. Compare the level signal with the reference level signal; Power-on protection is generated internally within the FPGA: when the voltage level signal exceeds or equals the reference voltage level signal, the infrared detector is powered on; when the voltage level signal falls below the reference voltage level signal, the infrared detector is powered off. Obtain the reference level signal; A potentiometer is placed between the reference level signal and the ground line to adjust the intermediate level signal and obtain adjustment data; The input voltage is obtained by isolating and driving the level signal through an operational amplifier.

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