High-voltage on-load automatic aging test assembly line and use method thereof

Abstract

The invention relates to a high-voltage on-load automatic aging test assembly line and a use method thereof, and relates to the technical field of new energy automobile motor controllers, and the high-voltage on-load automatic aging test assembly line comprises a butt joint interface, a bearing structure, a transfer structure, and a test board and an aging room which are arranged along a conveying path of a tested product; the butt joint interface is arranged on the test board and in the aging room and is used for being connected with a tested product; the bearing structure comprises a connector and a supporting plate used for bearing a to-be-tested product, the connector is arranged on the supporting plate, the connector is provided with a plurality of insertion holes for insertion of the butt joint interfaces, the insertion holes are internally provided with insertion parts, and the insertion parts are used for being in insertion connection with the butt joint interfaces and the to-be-tested product respectively; and the transfer structure is movably arranged between the test board and the aging room, has transverse and vertical movement strokes, and is used for transferring the bearing structure. The method has the characteristics of convenience in operation, high detection efficiency and the like.

Description

Technical Field

[0001] The present application relates to the technical field of new energy vehicle motor controllers, and in particular to a high-voltage load automatic aging test line and a method for using the same. Background Art

[0002] In the field of new energy vehicles, motor controllers, as key core components, must undergo a rigorous factory (offline) testing process before being assembled with the motor and then installed in the vehicle to verify their functional integrity and quality. This process is usually carried out in a stand-alone test station mode, and the process is as follows:

[0003] Install the motor controller to be tested on a fixed test station and proceed in sequence after connecting the water, electricity, and signal lines:

[0004] Whole machine test: simulate sensor signal reception and command response, verify communication protocol interaction capabilities, calibrate voltage and current benchmarks, etc.

[0005] Aging test: Run the controller at full load for 1 to 2 hours in a set high-temperature environment, monitor the operating temperature rise, and perform start-stop cycle tests to verify the long-term stability of the controller and evaluate the life and performance degradation of power devices.

[0006] Bench test: Collect key operating parameters (such as voltage, current, speed, torque) and test performance indicators such as rated power, peak power, and maximum torque.

[0007] After each test step in the above process, the motor controller needs to be removed from the test station and the water, electricity, and signal lines need to be disconnected, resulting in the motor controller being frequently plugged and unplugged. The disadvantages of its cumbersome operation and low testing efficiency make this model difficult to meet the growing large-scale industrial production needs of the new energy vehicle industry, and it has become a bottleneck link restricting production capacity expansion and cost control.

[0008] In view of this, there is an urgent need to provide a high-voltage load automatic aging test line with convenient operation and high detection efficiency to overcome the shortcomings of the existing technology. Summary of the Invention

[0009] The present application provides a high-voltage load automatic aging test line and a method for using the same, which has the characteristics of easy operation and high detection efficiency.

[0010] In the first aspect, the present application provides a high-voltage load automatic aging test line that adopts the following technical solutions:

[0011] A high-voltage load automatic aging test line, comprising:

[0012] Test benches and aging rooms are set up along the conveying path of the tested products;

[0013] A docking interface, which is provided on the test bench and in the aging room and is used to connect with the product under test;

[0014] A supporting structure comprising:

[0015] Pallet, used to support the product being tested;

[0016] A connector is provided on the support plate, wherein a plurality of plug holes are provided on the connector for inserting the docking interface, and a plug part is provided in each of the plurality of plug holes, and the plug part is used to be plugged into the docking interface and the product to be tested respectively;

[0017] The transfer structure is movably arranged between the test bench and the aging room and has a horizontal and vertical movement stroke for transferring the supporting structure.

[0018] Furthermore, the test bench comprises:

[0019] a frame body, on which a conveying member is provided;

[0020] A detection member, which is provided at one end of the conveying member, and the docking interface is provided on the detection member;

[0021] The lifting member is telescopically arranged on the frame, and lifts the supporting structure when the product to be tested is being tested, so that the connector is aligned with the docking interface.

[0022] Furthermore, it also includes a positioning member, which is arranged on the frame or the lifting member. When the lifting member lifts the supporting structure, the positioning member is clamped with the support plate.

[0023] Furthermore, a positioning hole for engaging with the positioning member is provided on the supporting plate, and the positioning member includes a positioning column provided on the frame or the lifting member.

[0024] Furthermore, the conveying member is provided with a limiting structure on both sides of its conveying path, and the limiting structure includes:

[0025] Limiting plate;

[0026] A limiting block is at least partially located on the inner side of the limiting plate and abuts against the top surface of the supporting plate when the supporting structure is lifted.

[0027] Furthermore, the lifting member includes:

[0028] roof;

[0029] A plurality of driving parts are evenly distributed between the two groups of the limiting structures and are all connected to the top plate.

[0030] Furthermore, it also includes a conveying structure arranged between the test bench and the aging room, and the conveying structure receives the supporting structure and conveys it to the test bench.

[0031] Furthermore, the aging room is provided with:

[0032] Aging racks;

[0033] A plurality of docking structures are uniformly distributed on the aging rack, and the docking interfaces are provided on the plurality of docking structures;

[0034] A plurality of pairs of pulleys are arranged in one-to-one correspondence with the plurality of docking structures. The pulleys are arranged on both sides of the docking structure in opposite directions and form a gap for the transfer structure to extend into.

[0035] In a second aspect, the present application provides a method for using a high-voltage load automatic aging test line, comprising the following steps:

[0036] Obtain the object to be tested and fix it to the supporting structure;

[0037] The product under test is connected to the docking interface through the connector, and the product under test is subjected to whole machine test, aging test and bench test in sequence;

[0038] If any of the tests in the whole machine test, aging test and bench test fails, the corresponding tested product will be sent to the defective product station and removed from the pallet;

[0039] If the whole machine test, aging test and bench test are all qualified, the tested product will flow to the next unit.

[0040] In summary, this application includes at least one of the following beneficial technical effects:

[0041] 1. This application uses a supporting structure to fix and plug in the product under test. The connectors in the supporting structure are compatible with products under test of different sizes and specifications. The connectors allow the product under test to be tested in sequence through the whole machine test, aging test and bench test only by plugging the connectors into the docking interface, thereby reducing the need to repeatedly plug and unplug the product under test when entering different tests. The application has the characteristics of simple operation and high testing efficiency.

[0042] 2. In this application, positioning parts and limiting structures are provided to constrain the position state of the supporting structure to reduce the possibility of the supporting structure being offset during transportation, so that the docking interface and the connector are accurately matched. After the matching is completed, the positioning parts fix the supporting structure to reduce the possibility of the connector and the test piece being out of engagement due to environmental factors such as water pressure during the testing process, thereby ensuring that the test can be carried out with high precision.

[0043] 3. In this application, the transfer structure is lifted by a lifting part so that the supporting structure can be smoothly lifted and transferred by the transfer structure. During the lifting process, the limit block and the top surface of the pallet are offset against each other, so that the supporting structure is limited by the limit block after being lifted, reducing the possibility of it tilting and causing the tested product to slip from the supporting structure. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 This is the overall schematic diagram of the high-voltage load automatic aging test line;

[0045] Figure 2 It is a schematic diagram of the three-dimensional structure of the test bench;

[0046] Figure 3 It is a schematic diagram of the three-dimensional structure of the supporting structure and the product being tested;

[0047] Figure 4 It is a three-dimensional structural diagram of the aging room and transfer structure.

[0048] In the figure, 1. test bench; 11. frame; 12. conveying part; 13. lifting part; 14. positioning part; 15. detection part; 2. aging room; 21. aging rack; 22. docking structure; 23. pulley; 3. docking interface; 4. supporting structure; 41. pallet; 42. connector; 421. plug-in hole; 43. plug-in part; 5. transfer structure; 51. first guide rail; 52. second guide rail; 53. lifting part; 6. limiting structure; 61. limiting plate; 62. limiting block; 7. conveying structure; 71. conveyor belt; 72. elevator; 8. product under test. DETAILED DESCRIPTION

[0049] The following will be combined with the Figure 1-4 The technical solution of the present application is described clearly and completely. The following embodiments are exemplary and are only used to explain the present application, and should not be construed as limiting the present application. In the following description, the same reference numerals are used to represent the same or equivalent elements, and repeated descriptions are omitted.

[0050] In the description of this application, it should be understood that the terms "upper", "lower", "inside", "outside", "left", "right", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, or are the orientations or positional relationships in which the products of this application are conventionally placed when in use, or are the orientations or positional relationships conventionally understood by those skilled in the art. These are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or component referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they should not be understood as limitations on this application.

[0051] In addition, the terms "mounted," "connected," and "connected" should be interpreted broadly. For example, they can refer to fixed, detachable, or integral connections; mechanical or electrical connections; direct or indirect connections through an intermediary; and internal communication between two components. Those skilled in the art will understand the specific meanings of these terms in this application based on the specific circumstances.

[0052] It will be further understood that the term "and / or" used in this application refers to any and all possible combinations of one or more of the listed items.

[0053] A high-voltage, on-load, automatic aging test production line is used to sequentially perform whole-machine testing, aging testing, and bench testing on a product under test 8.

[0054] Reference Figure 1 and Figure 2 The high-voltage, under-load, automatic aging test line includes a test bench 1 and an aging room 2, which are arranged along the conveying path of the test product 8. The test bench 1 is used to perform whole-unit and bench tests on the test product 8, while the aging room 2 is used to perform aging tests on the test product 8. If the test product 8 fails any of the whole-unit, bench, or aging tests, it will be marked as defective, removed, and placed in a defective workstation, and an alarm will be triggered.

[0055] There are two groups of test benches 1. In this embodiment, one group of test benches 1 is set on one side of the aging rack 21, and the other group of test benches 1 is set on the other side of the aging rack 21. The test products 8 flow unidirectionally in a straight line direction when being tested; in another specific embodiment, the test benches 1 on both sides are set side by side on the same side of the aging rack 21, and the test products 8 flow back and forth in a straight line direction when being tested.

[0056] The product under test 8 is specifically a motor controller, which has ports such as a high-voltage input, a low-voltage input, a signal input, and a water inlet. Correspondingly, a docking interface 3 is provided on both the test bench 1 and the burn-in chamber 2. This interface 3 has circuits for outputting high-voltage, low-voltage, signal, and water supply. These circuits are connected one-to-one to the corresponding ports on the motor controller to test the product under test 8.

[0057] Further, refer to Figure 2 and Figure 3 The high-voltage load automatic aging test line also includes a supporting structure 4, which supports and carries the product under test 8 and serves as an intermediate structure to complete the connection between the product under test 8 and the docking interface 3.

[0058] Specifically, the supporting structure 4 includes a support plate 41 and a connector 42 arranged on the support plate 41. The support plate 41 is used to support the product under test 8. The connector 42 is provided with multiple plug holes 421 for inserting the docking interface 3. The multiple plug holes 421 are each provided with a connector 43, and the connector 43 is respectively connected to the docking interface 3 and the product under test 8.

[0059] Among them, the size of the plug hole 421 is specifically set according to the size of the high-voltage, low-voltage, signal and water supply lines to ensure that the docking interface 3 can be smoothly inserted, and the specific form of the connector 43 is matched accordingly. In this embodiment, the connector 43 includes a high-voltage interface, a low-voltage interface, a signal interface and a water supply interface.

[0060] When conducting the test, the product under test 8 is first installed on the supporting structure 4, so that several ports of the product under test 8 are correspondingly plugged into the connectors 42. The supporting structure 4 carries the product under test 8 to the test bench 1 and the aging room 2 in sequence to complete the test. During the test, the connection is automatically completed through the connector 42 and the docking interface 3, so as to reduce the process of repeatedly plugging and unplugging the line, thereby greatly improving the detection efficiency.

[0061] Reference Figure 2 The test bench 1 includes a frame 11, a conveying member 12 arranged on the frame 11, a lifting member 13 and a detection member 15. The lifting member is retractably arranged on the frame 11, and the detection member 15 is arranged at one end of the conveying member 12 and is provided with the above-mentioned docking interface 3.

[0062] The supporting structure 4 supporting the product under test 8 flows toward the detection part 15 through the conveying part 12. When the supporting structure 4 flows to the end point of the conveying part 12 (that is, one end close to the detection part 15), the lifting part 13 lifts the supporting structure 4 so that the connector 42 is aligned with the docking interface 3. The detection part 15 moves so that the docking interface 3 is inserted into the plug hole 421 and completed with the plug part 43 to perform the detection of the product under test 8.

[0063] Reference Figure 2 The conveying member 12 is provided with a limiting structure 6 on both sides along its conveying path. The limiting structure 6 guides and limits the supporting structure 4 so that the docking interface 3 and the connector 42 are accurately matched.

[0064] The limiting structure 6 includes a limiting plate 61 and a limiting block 62 .

[0065] The spacing between the two sets of limit plates 61 matches the width of the support plate 41 to guide the support structure as it moves on the conveyor 12. It should be noted that this application does not specify the length or number of limit plates 61. For example, in this embodiment, the length of the limit plates 61 is consistent with the conveying distance of the conveyor 12; in another embodiment, multiple limit plates 61 can be provided, with the multiple limit plates 61 spaced apart and the spacing less than the length of the support plate 41.

[0066] Furthermore, the limit block 62 is at least partially located on the inner side of the limit plate 61, and the limit block 62 is abutted against the top surface of the support plate 41 when the supporting structure 4 is lifted, so that the supporting structure 4 is further fixed by the limit block 62 after being lifted, thereby reducing the possibility that the supporting structure 4 will tilt after being lifted and cause the test object 8 to slip from the supporting structure 4.

[0067] Reference Figure 2 The lifting member 13 includes a top plate and multiple drive units, each of which is distributed between the two sets of limiting structures and connected to the top plate. The top plate increases the contact area between the lifting member 13 and the support plate 41, while the multiple drive units further evenly distribute force on the support plate 41, ensuring that the lifting member 13 can smoothly lift the supporting structure 4.

[0068] It should be noted that this embodiment does not limit the specific form of the driving part. For example, a telescopic cylinder, a telescopic motor, etc. can be used.

[0069] On this basis, the high-voltage, on-load, automatic aging test line also includes a positioning member 14. When the docking interface 3 is plugged into the connector 42, the positioning member 14 engages with the support plate 41. The positioning member 14 positions the support structure 4, ensuring a smooth lifting of the support structure 4 and reducing the possibility of the connector 42 and the test member 15 becoming disengaged due to environmental factors such as water pressure during the test process.

[0070] The position of the positioning member 14 can be specifically configured based on actual circumstances. For example, in one embodiment, the positioning member 14 is retractably mounted on the frame 11, extending before the lifting member 13 lifts the supporting structure 4 to engage with the support plate 41, thereby positioning the supporting structure 4. In another embodiment, the positioning member 14 can be mounted on the lifting member 13, with the positioning post 14 moving synchronously with the lifting member 13 as the lifting member 13 moves toward the support plate 41. The positioning post 14 first positions the supporting structure 4, and then the lifting member 13 lifts the supporting structure 4.

[0071] In this embodiment, a positioning hole is formed on the support plate 41 to engage with the positioning member 14 . The positioning member 14 includes a positioning column. The positioning column is inserted into the positioning hole to achieve positioning of the supporting structure 4 .

[0072] In this embodiment, the positioning member 14 also includes a positioning plate provided on the frame 11. When the supporting structure 4 moves into position, it is blocked by the positioning plate and no longer moves. At this time, the positioning column is coaxially arranged with the positioning hole, and the positioning column is inserted into the positioning hole to complete the snap connection.

[0073] When the product 8 under test has been inspected, the inspection member 15 retracts to pull the docking interface 3 out of the plug hole 421, and the docking interface 3 is disengaged from the plug-in portion 43. The lifting member 13 is reset to make the supporting structure 4 fall back onto the conveying member 12, and the supporting structure 4 is then conveyed to the aging room 2 for aging testing. After the aging test, it is further moved out of the aging room and conveyed to the next unit.

[0074] Correspondingly, refer to Figure 4 The aging room 2 is provided with an aging rack 21 and multiple docking structures 22. The multiple docking structures 22 are evenly distributed on the aging rack 21 and are all provided with docking interfaces 3. When the docking structure 22 is not provided with a supporting structure 4, it is marked as empty. When the docking structure 22 is provided with a supporting structure 4, it is marked as unoccupied.

[0075] Furthermore, the high-voltage load automatic aging test line also includes a transfer structure 5, which obtains the position information of several empty positions on the aging rack 21, and transfers the supporting structure 4 it holds to the empty positions of the aging rack 21 for testing; the transfer structure 5 obtains the position information of several occupied positions on the aging rack 21, and when the test product 8 at the occupied position is tested, the transfer structure 5 moves it out of the occupied position and transfers it to the test bench 1 corresponding to the bench test.

[0076] Reference Figure 4 The transfer structure 5 is disposed between the test bench 1 and the aging chamber 2 and has a horizontal and vertical travel range for transferring the supporting structure 4. In this embodiment, the transfer structure 5 lifts the supporting structure 4 for transfer. The transfer structure 5 includes a first guide rail 51, a second guide rail 52 slidably disposed on the first guide rail 51, and a retractable lifting portion 53 slidably disposed on the second guide rail 52.

[0077] Among them, the first guide rail 51 is set along the conveying path of the product under test 8, and the second guide rail 52 is set along the direction perpendicular to the table surface of the test bench 1. The position of the lifting part 53 is adjusted by the first guide rail 51 and the second guide rail 53. Then the lifting part 53 extends to the bottom of the supporting structure 4 to lift the product under test 8, and the product under test 8 is transferred after the lifting part 53 retracts.

[0078] It should be noted that, in another embodiment, the transfer structure 5 can also clamp the supporting structure 4 for transfer. In this case, the lifting part 53 can be replaced by a clamping part (for example, a clamping arm, a clamping claw, or other manipulator).

[0079] Furthermore, in this embodiment, a plurality of pairs of pulleys 23 are provided in the aging room 2, and the plurality of pairs of pulleys 23 are arranged in a one-to-one correspondence with the plurality of docking structures 22. The pulleys 23 are arranged on both sides of the docking structure 22, and form a gap for the transfer structure 5 to extend into. The gap is convenient for the insertion of the lifting portion 53, and the setting of the pulleys 23 further reduces the friction between the supporting structure 4 and the docking structure 22, so as to smoothly place or transfer the test product 8.

[0080] In addition, in this embodiment, positioning members 14 and lifting members 13 may be further provided on the docking structure 22 to ensure stable operation of the aging test. After the aging test is completed, the transfer structure 5 moves the tested product 8 to another test bench 1 for bench testing.

[0081] Furthermore, it also includes a conveying structure 7 arranged between the test bench 1 and the aging room 2, and the conveying structure 7 receives the supporting structure 4 and returns it to the test bench 1.

[0082] In this embodiment, the conveying structure 7 includes two elevators 72 and a conveyor belt 71 located between the two elevators 72. When no abnormalities are detected in the test piece 8 after the whole-machine test, aging test, and bench test, it is marked as a good product. The test piece 8 is removed from the corresponding supporting structure 4, and the supporting structure 4 is lowered onto the conveyor belt 71 via the elevator 72. The conveyor belt 71 transports the supporting structure 4 to another elevator 72, where it is lifted and returned to the test bench 1 for whole-machine testing, where it can be reconnected with the next test piece 8.

[0083] Example 2:

[0084] A method for using a high-voltage, on-load, automatic aging test line comprises the following steps:

[0085] Obtaining the test object 8 and fixing the test object 8 on the supporting structure 4;

[0086] The product under test 8 is docked with the docking interface 3 via the connector 42, and the product under test 8 is subjected to a whole-machine test, an aging test, and a bench test in sequence;

[0087] If any of the whole machine test, aging test and bench test fails, the corresponding tested product 8 will be sent to the defective product station and removed from the pallet 41;

[0088] If the whole-unit test, aging test, and bench test all pass, the tested product 8 will be transferred to the next unit. The examples in this specific implementation are all preferred embodiments of this application and are not intended to limit the scope of protection of this application. Identical components are denoted by the same reference numerals. Therefore, any equivalent changes based on the structure, shape, or principles of this application are intended to be covered by the scope of protection of this application.

Claims

1. A high-voltage load automatic aging test line, characterized in that: include: A test bench (1) and an aging room (2) are arranged along a conveying path of the tested product (8); A docking interface (3), which is provided on the test bench (1) and in the aging room (2) and is used for connecting with the tested product (8); A supporting structure (4), comprising: A support plate (41) for supporting the product to be tested (8); A connector (42) is provided on the support plate (41), and a plurality of plug holes (421) are provided on the connector (42) for inserting the docking interface (3), and a plug portion (43) is provided in each of the plurality of plug holes (421), and the plug portion (43) is used to be plugged into the docking interface (3) and the product to be tested respectively; A transfer structure (5) is movably arranged between the test bench (1) and the aging room (2) and has a horizontal and vertical movement stroke for transferring the supporting structure (4).

2. A high-voltage load automatic aging test line according to claim 1, characterized in that: The test bench (1) comprises: A frame (11) is provided with a conveying member (12); A detection member (15) is provided at one end of the conveying member (12), and the docking interface (3) is provided on the detection member (15); A lifting member (13) is retractably arranged on the frame (11) and lifts the supporting structure (4) before the product (8) is tested, so that the connector (42) is aligned with the docking interface (3).

3. A high-voltage load automatic aging test line according to claim 2, characterized in that: It also includes a positioning member (14), which is arranged on the frame (11) or the lifting member (13). When the lifting member (13) lifts the supporting structure (4), the positioning member (14) is engaged with the support plate (41).

4. A high-voltage load automatic aging test line according to claim 3, characterized in that: The support plate (41) is provided with a positioning hole for engaging with the positioning member (14), and the positioning member (14) includes a positioning column arranged on the frame (11) or the lifting member (13).

5. The high-voltage load automatic aging test line according to claim 2 is characterized in that: The conveying member (12) is provided with a limiting structure (6) on both sides along its conveying path, and the limiting structure (6) includes: Limiting plate (61); A limiting block (62) is at least partially located on the inner side of the limiting plate (62) and abuts against the top surface of the supporting plate (41) when the supporting structure (4) is lifted.

6. A high-voltage load automatic aging test line according to claim 2, characterized in that: The lifting member (13) comprises: roof; A plurality of driving parts are evenly distributed between the two groups of the limiting structures and are all connected to the top plate.

7. The high-voltage load automatic aging test line according to claim 1 is characterized in that: It also includes a conveying structure (7) arranged between the test bench (1) and the aging room (2), wherein the conveying structure (7) receives the supporting structure (4) and conveys it to the test bench (1).

8. The high-voltage load automatic aging test line according to claim 1 is characterized in that: The aging room (2) is provided with: Aging rack (21); A plurality of docking structures (22) are uniformly distributed on the aging rack (21), and the docking interfaces (3) are all provided on the plurality of docking structures (22); A plurality of pairs of pulleys (23) are arranged in one-to-one correspondence with the plurality of docking structures (22); the pulleys (23) are arranged on both sides of the docking structure (22) and form a gap for the transfer structure (5) to extend into.

9. A method for using a high-voltage load automatic aging test line, characterized in that: Using the test system according to any one of claims 1 to 8, the method of using the system comprises the following steps: Obtaining a test object (8), and fixing the test object (8) to a supporting structure (4); The product under test (8) is docked with the docking interface (3) via the connector (42), and the product under test (8) is subjected to a whole-machine test, an aging test, and a bench test in sequence; If any of the whole machine test, aging test and bench test fails, the corresponding tested product (8) flows to the defective product station, and the tested product (8) is removed from the pallet (41); If the whole machine test, aging test and bench test are all qualified, the tested product (8) will flow to the next unit.

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