Detection jig for testing PCB (Printed Circuit Board) group

Abstract

The invention relates to a detection jig for testing a PCB (Printed Circuit Board) group. Each probe moving assembly comprises a first motor, a driving rotating part, a plurality of driving assemblies and a plurality of gearboxes, the first motor is arranged on the test board, every two adjacent driving assemblies are connected through a gearbox, and one gearbox in the gearboxes is connected with the first motor; the driving assembly comprises a lead screw driving part and a probe detection device, the lead screw driving part is arranged on the gearbox, and the probe detection device is connected with the lead screw driving part through a driven rotating part; the driving rotating part is arranged on the first motor, the driven rotating parts are detachably connected with the driving rotating part, and the driving rotating part is configured to drive the probe detection device to rotate through the driven rotating parts. Therefore, the position of the probe can be flexibly adjusted so as to be suitable for different types of PCB groups.

Description

Technical Field

[0001] This invention relates to the field of PCB assembly manufacturing technology, and in particular to a testing fixture for PCB assembly testing. Background Technology

[0002] Printed circuit board (PCB) test fixtures are key tools for testing the electrical performance of PCBs, and must accurately perform tasks such as signal transmission, functional verification, and fault location. As a core component of electronic devices, the testing quality of PCB assemblies directly affects the performance and reliability of the final product.

[0003] In related technologies, most PCB test fixtures adopt a fixed probe structure. The position of the probe on the fixture is preset by a mechanical positioning mechanism. One fixture is only for one type of PCB board assembly. Different test fixtures are required for different models. Therefore, traditional PCB test fixtures have significant defects in probe adjustment and replacement, which restricts the testing efficiency and flexibility, and makes it difficult to adapt to the needs of high-density and variable PCB board production. Summary of the Invention

[0004] The present invention aims to at least partially solve one of the technical problems in the above-mentioned technologies.

[0005] Therefore, the purpose of this invention is to provide a testing fixture for PCB board assembly testing, which can be adapted to different models of PCB board assemblies by flexibly adjusting the probe position.

[0006] To achieve the above objectives, the present invention proposes a testing fixture for PCB board assembly testing, comprising: a test platform; and multiple probe moving assemblies, each probe moving assembly comprising: a first motor, an active rotating component, multiple drive components, and multiple gearboxes. The first motor is mounted on the test platform, two adjacent drive components are connected through the gearboxes, and one of the multiple gearboxes is connected to the first motor. Each drive component comprises: a lead screw drive component and a probe detection device, wherein the lead screw drive component is mounted on the gearboxes, and the probe detection device is connected to the lead screw drive component through a driven rotating component. The active rotating component is mounted on the first motor, and the multiple driven rotating components are detachably connected to the active rotating component. The active rotating component is configured to drive the probe detection device to rotate through the driven rotating components.

[0007] In one embodiment of the present invention, the probe moving assembly further includes: an electric push rod, a sliding seat, and an electric gear, wherein the first motor is disposed on the driving end of the electric push rod, the sliding seat is disposed on the electric push rod and is slidably connected to the test platform, the electric gear is disposed on the sliding seat, and a rack is disposed inside the test platform, and a plurality of electric gears respectively mesh with the rack.

[0008] In one embodiment of the present invention, the lead screw drive includes a ball screw and a ball slider, wherein the ball screw is disposed at the output end of the gearbox, and the ball slider is disposed on the ball screw.

[0009] In one embodiment of the present invention, the active rotating component includes a third motor and a rotating rod, wherein the third motor is disposed on the first motor and the rotating rod is disposed on the drive end of the third motor.

[0010] In one embodiment of the present invention, the driven rotating member includes: a rotating plate, a gear ring, a connecting plate, a tube body, a driven wheel, and a first electromagnet, wherein the rotating plate is rotatably mounted on the lead screw drive member, the gear ring is mounted on the rotating plate, the connecting plate is mounted on the lead screw drive member, the tube body is rotatably mounted on the connecting plate, the driven wheel is mounted on the tube body and meshes with the gear ring, the first electromagnet is mounted inside the tube body, and the rotating rod is magnetically connected to the first electromagnet.

[0011] In one embodiment of the present invention, the probe detection device includes: a placement bucket and a clamping member, wherein the placement bucket is disposed on the driven rotating member, and the clamping member is disposed on the placement bucket for fixing the probe on the placement bucket.

[0012] In one embodiment of the present invention, the clamping member includes: an electric winding wheel, a connecting rope, a clamping plate, and a spring, wherein the placement bucket has an installation groove, the electric winding wheel is disposed in the installation groove, the clamping plate is slidably connected to the installation groove, the electric winding wheel is connected to the clamping plate through the connecting rope, and the clamping plate is connected to the placement bucket through the spring.

[0013] In one embodiment of the present invention, the test bench includes: a workbench, a pressing device, and a receiving platform, wherein the pressing device and the receiving platform are respectively disposed on the workbench, and the receiving platform is disposed below the pressing device.

[0014] In one embodiment of the present invention, the pressing device includes: a hydraulic telescopic device, a mounting plate and a plurality of top columns, wherein the hydraulic telescopic device is disposed on the workbench, the mounting plate is disposed on the drive end of the hydraulic telescopic device, and the plurality of top columns are respectively disposed on the lower part of the mounting plate.

[0015] In one embodiment of the present invention, the material receiving platform includes: a frame plate, an elastic element, and a loading platform, wherein a through groove is provided on the loading platform, the frame plate is disposed on the through groove, and the loading platform is connected to the frame plate through the elastic element.

[0016] The beneficial effects of this invention are: The lead screw drive unit can adjust the speed of its own driving probe detection device via a gearbox. The lead screw drive unit can freely adjust the working position of the corresponding probe detection device, eliminating the need for frequent fixture changes when inspecting different PCB board assemblies, thus improving inspection efficiency. It also allows the inspection fixture to adapt to the inspection needs of different PCB board assemblies, significantly improving the versatility of the inspection fixture and effectively reducing production costs.

[0017] The active rotating component can selectively drive the probe detection device to rotate. For probe detection devices that are not currently involved in the detection work, rotating them to a suitable position can prevent them from interfering with the ongoing detection work. When it is necessary to replace the probe, rotating the probe detection device to a position that facilitates probe placement optimizes the detection process and improves the convenience and efficiency of the detection.

[0018] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0019] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein: Figure 1 This is a schematic diagram of the overall structure of a testing fixture for PCB board assembly testing according to an embodiment of the present invention; Figure 2 This is a cross-sectional view of a testing fixture for PCB board assembly testing according to an embodiment of the present invention; Figure 3 This is a schematic diagram of the connection structure between the probe moving assembly and the rack according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the structure of a probe moving assembly according to an embodiment of the present invention; Figure 5 This is a schematic diagram of the connection structure between a lead screw drive and a driven rotating component according to an embodiment of the present invention; Figure 6 This is a schematic diagram of the connection structure between the lead screw drive and the driven rotating member according to another embodiment of the present invention; Figure 7 This is a cross-sectional structural schematic diagram of a probe detection device according to an embodiment of the present invention; Figure 8 This is a schematic diagram of the structure of an active rotating component according to an embodiment of the present invention; Figure 9 This is a schematic diagram of the connection structure between the tube body and the driven wheel according to an embodiment of the present invention; Figure 10 This is a schematic diagram of the connection structure between the rotating rod and the tube body according to an embodiment of the present invention; Figure 11 This is a cross-sectional structural schematic diagram of a material receiving platform according to an embodiment of the present invention; Figure 12 This is a cross-sectional view of a workbench according to an embodiment of the present invention; Figure 13 This is a cross-sectional view of a worktable according to another embodiment of the present invention.

[0020] As shown in the figure: 1. Test bench; 2. Probe moving assembly; 3. First motor; 4. Active rotating component; 5. Drive assembly; 6. Gearbox; 7. Screw drive component; 8. Probe detection device; 9. Driven rotating component; 10. Electric push rod; 11. Sliding seat; 12. Electric gear; 13. Rack; 14. Ball screw; 15. Ball slider; 16. Third motor; 17. Rotating rod; 18. Rotating plate; 19. Gear ring; 20. Connecting plate; 21. Tube body; 22. Driven wheel; 23. First electromagnet; 2 4. Placement bucket; 25. Clamping component; 26. Electric winding wheel; 27. Connecting rope; 28. Clamping plate; 29. ​​Spring; 30. Mounting groove; 31. Workbench; 32. Pressing device; 33. Material receiving platform; 34. Hydraulic telescopic device; 35. Mounting plate; 36. Top column; 37. Frame plate; 38. Elastic component; 39. Material carrying platform; 40. Plate body; 41. Electric telescopic rod; 42. Sliding plate; 43. Limiting slider; 44. Limiting slide groove; 45. Second electromagnet; 46. Magnetic slider; 47. Magnetic slide groove. Detailed Implementation

[0021] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0022] The following describes a test fixture for PCB board assembly testing according to an embodiment of the present invention with reference to the accompanying drawings.

[0023] like Figure 1 , Figure 2 , Figure 3 and Figure 4 As shown, the PCB board assembly testing fixture of this embodiment may include: a test stage 1 and multiple probe moving components 2. Each probe moving component 2 may include: a first motor 3, a driving rotating component 4, multiple drive components 5, and multiple gearboxes 6. The multiple drive components 5 and multiple gearboxes 6 correspond one-to-one. The first motor 3 is mounted on the test stage 1. Two adjacent drive components 5 are connected via gearboxes 6, and one of the gearboxes 6 is connected to the first motor 3. Each drive component 5 includes: a lead screw drive component 7 and a probe detection device 8. The lead screw drive component 7 is mounted on the gearbox 6, and the probe detection device 8 is connected to the lead screw drive component 7 via a driven rotating component 9.

[0024] It is understood that the gearbox 6 described in this embodiment can provide driving force to the corresponding lead screw drive 7. The speed at which the lead screw drive 7 drives the probe detection device 8 to move is positively correlated with the driving force it receives.

[0025] The active rotating component 4 is mounted on the first motor 3, and multiple driven rotating components 9 are detachably connected to the active rotating component 4. The active rotating component 4 is configured to drive the probe detection device 8 to rotate via the driven rotating components 9.

[0026] It should be noted that when the driven rotating component 9 is connected to the driving rotating component 4, the driving rotating component 4 can drive the probe detection device 8 to rotate via the driven rotating component 9. When the probe detection device 8 does not need to perform detection work, it can be driven to rotate so that the probe is vertically downward relative to the test platform 1. When the probe detection device 8 needs to be replaced, it can be driven to rotate so that the probe is vertically downward relative to the test platform 1, so as to facilitate the separation of the probe from the probe detection device 8 and improve the replacement efficiency.

[0027] In one embodiment of the present invention, such as Figure 2 , Figure 3 and Figure 4 As shown, the probe moving assembly 2 may further include: an electric push rod 10, a sliding seat 11, and an electric gear 12. The first motor 3 is mounted on the drive end of the electric push rod 10, the sliding seat 11 is mounted on the electric push rod 10, the sliding seat 11 is slidably connected to the test bench 1, the electric gear 12 is mounted on the sliding seat 11, and a rack 13 is provided inside the test bench 1. Multiple electric gears 12 mesh with the rack 13 respectively.

[0028] It is understood that the electric push rod 10 described in this embodiment can drive the probe moving assembly 2 to move vertically.

[0029] It should be noted that the electric gear 12 described in this embodiment may include: a first drive motor and a drive wheel. The drive wheel may be disposed on the drive end of the first drive motor, and the first drive motor may drive the drive wheel to rotate. The rotating drive wheel may rotate on the rack 13. A slider is provided on the sliding seat 11, and a sliding groove is provided on the inner wall of the test platform 1. The slider and the sliding groove are slidably connected.

[0030] The probe moving assembly 2 also includes: a plate 40, an electric telescopic rod 41 (equivalent to an electric push rod 10), and a sliding plate 42 (equivalent to a sliding seat 11). The lead screw drive 7, which is furthest from the first motor 3, is mounted on the plate 40. The plate 40 is mounted on the drive end of the electric telescopic rod 41, and the electric telescopic rod 41 is mounted on the sliding plate 42. The test bench 1 supports the sliding seat 11 and the sliding plate 42 to facilitate the movement of the probe moving assembly 2 on the test bench 1.

[0031] In one embodiment of the present invention, such as Figure 5 and Figure 6 As shown, the lead screw drive 7 may include a ball screw 14 and a ball slider 15. The ball screw 14 is disposed at the output end of the gearbox 6, and the ball slider 15 is disposed on the ball screw 14. The gearbox 6 can drive the ball screw 14 to rotate, and the ball slider 15 can move on the rotating ball screw 14. A limit rod is provided on the gearbox 6, and the ball slider 15 is slidably connected to the limit rod.

[0032] In one embodiment of the present invention, such as Figure 3 and Figure 8 As shown, the active rotating component 4 may include a third motor 16 and a rotating rod 17, wherein the third motor 16 is mounted on the first motor 3, and the rotating rod 17 is mounted on the drive end of the third motor 16. The third motor 16 can drive the rotating rod 17 to rotate.

[0033] To clearly illustrate the previous embodiment, in one embodiment of the present invention, as follows: Figure 5 , Figure 6 , Figure 8 , Figure 9 and Figure 10 As shown, the driven rotating component 9 may include: a rotating plate 18, a gear ring 19, a connecting plate 20, a tube body 21, a driven wheel 22, and a first electromagnet 23. The rotating plate 18 is rotatably mounted on the ball slider 15 of the lead screw drive component 7, the gear ring 19 is mounted on the rotating plate 18, the connecting plate 20 is mounted on the ball slider 15 of the lead screw drive component 7, the tube body 21 is rotatably mounted on the connecting plate 20 via a bearing seat, the driven wheel 22 is mounted on the tube body 21 and meshes with the gear ring 19, the first electromagnet 23 is mounted inside the tube body 21, and the rotating rod 17 is magnetically connected to the first electromagnet 23.

[0034] As one possible scenario, such as Figure 5 As shown, a limiting slider 43 is provided on the rotating plate 18, and a limiting groove 44 is provided on the ball slider 15 of the lead screw drive 7. The limiting slider 43 is slidably connected to the limiting groove 44. A second electromagnet 45 is provided on the ball slider 15 of the lead screw drive 7, and the second electromagnet 45 is magnetically connected to the rotating plate 18. When the driven rotating part 9 of the driving part 4 rotates, the non-rotating driven rotating part 9 can be fixed on the lead screw drive 7 by the second electromagnet 45.

[0035] As another possible scenario, such as Figure 6 As shown, a magnetic slider 46 is provided on the rotating plate 18, and a magnetic groove 47 is provided on the ball slider 15 of the lead screw drive component 7. The magnetic slider 46 is slidably connected to the magnetic groove 47, and the magnetic slider 46 is also magnetically connected to the magnetic slider 46. The magnetic attraction between the magnetic slider 46 and the magnetic groove 47 will prevent the rotating plate 18 from rotating if it is not subjected to external force.

[0036] Specifically, the working position of the probe can be adjusted according to the model of the PCB board assembly. The sliding seat 11 can move horizontally (X-direction movement) along the extension direction of the rack 13 by the movement of the electric gear 12 on the rack 13. After all the probe moving components 2 have moved to the target working position, the Y-direction position of the probe detection device 8 is then adjusted.

[0037] The first motor 3 provides driving force to one of the multiple gearboxes 6. The force output by the gearbox 6 can drive the ball screw 14 device. One gearbox 6 can transmit driving force to the adjacent gearbox 6 through the ball screw 14. By adjusting the gearbox 6, the ball slider 15 moves at different speeds on the corresponding ball screw 14.

[0038] After the Y-axis position of the probe detection device 8 is adjusted, the probe detection device 8 can be selectively rotated (e.g., for probe detection devices 8 that do not participate in this round of detection, or for probes on the probe detection device 8 that need to be replaced). After the tube body 21 that needs to be rotated is connected to the rotating rod 17 via the first electromagnet 23, the third motor 16 can drive the tube body 21 to rotate on the connecting plate 20 via the rotating rod 17. The tube body 21 drives the gear ring 19 to rotate via the driven wheel 22. The rotating gear ring 19 can drive the rotating plate 18 to rotate on the ball slider 15, thereby achieving the effect of flipping the probe detection device 8.

[0039] In one embodiment of the present invention, such as Figure 4 and Figure 7 As shown, the probe detection device 8 includes a placement bucket 24 and a clamping member 25. The placement bucket 24 is disposed on the driven rotating member 9 (rotating plate 18), and the clamping member 25 is disposed on the placement bucket 24 for fixing the probe on the placement bucket 24.

[0040] As one possible scenario, the clamping component 25 includes: an electric winding wheel 26, a connecting rope 27, a clamping plate 28, and a spring 29. The placement bucket 24 has an installation groove 30, the electric winding wheel 26 is disposed in the installation groove 30, the clamping plate 28 is slidably connected to the installation groove 30, the electric winding wheel 26 is connected to the clamping plate 28 through the connecting rope 27, and the clamping plate 28 is connected to the placement bucket 24 through the spring 29.

[0041] It should be noted that, in this embodiment, the clamping member 25 may have multiple connecting ropes 27, clamping plates 28, and springs 29. The electric winding wheel 26 can drive the clamping plate 28 to compress the springs 29 by winding the connecting ropes 27, thereby moving the clamping plate 28 away from the probe. As another possible scenario, the clamping member 25 includes an electric telescopic device and a clamping plate. The electric telescopic device is mounted on the placement bucket 24, and the clamping plate is mounted on the drive end of the electric telescopic device.

[0042] When the probe needs to be replaced, the probe detection device 8 can be rotated so that the probe is vertically downward. After the clamping member 25 loses its clamping limit on the probe, the probe can be separated from the placement bucket 24 through free fall. When the probe needs to be placed again, the probe detection device 8 that does not need to be replaced can be rotated to face the lower part of the test platform 1, while the probe detection device 8 that needs to be replaced can be rotated to face the upper part of the test platform 1, so as to facilitate the quick replacement of the probe detection device 8 that needs to be replaced.

[0043] In one embodiment of the present invention, such as Figure 11 , Figure 12 and Figure 13 As shown, the test bench 1 may include: a workbench 31, a pressing device 32 and a receiving platform 33, wherein the pressing device 32 and the receiving platform 33 are respectively disposed on the workbench 31, and the receiving platform 33 is disposed below the pressing device 32.

[0044] It should be noted that the probe moving assembly 2 is installed inside the worktable 31, and the lower inner wall of the worktable 31 is provided with a discharge tilting plate, and the side of the worktable 31 is provided with a discharge port.

[0045] The pressing device 32 includes a hydraulic telescopic device 34, a mounting plate 35, and multiple top columns 36. The hydraulic telescopic device 34 is mounted on the workbench 31, the mounting plate 35 is mounted on the drive end of the hydraulic telescopic device 34, and the multiple top columns 36 are respectively mounted on the lower part of the mounting plate 35.

[0046] The material receiving platform 33 includes: a frame plate 37, an elastic element 38 (e.g., multiple springs) and a loading platform 39. The worktable 31 has a through groove, the frame plate 37 is disposed on the through groove, and the loading platform 39 is connected to the frame plate 37 through the elastic element 38.

[0047] Specifically, the PCB board assembly is placed on the frame plate 37. The hydraulic telescopic device 34 controls multiple top posts 36 to move towards the PCB board assembly through the mounting plate 35. After the multiple top posts 36 come into contact with the PCB board assembly, the frame plate 37 moves towards the probe detection device 8 by pressing the elastic element 38 until it contacts the detection part of the probe.

[0048] It should be noted that the motor described in the above embodiments is equipped with a brake, which can make the motor stop running quickly. A gearbox is provided on the drive end of the motor. The drive end of the motor is connected to the input end of the gearbox, and the output end of the gearbox constitutes the drive end of the motor. The output speed of the motor is adjusted by the gearbox.

[0049] In summary, the PCB board assembly testing fixture of this invention can be adapted to different PCB board assemblies by flexibly adjusting the probe position.

[0050] In the description of this specification, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0051] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," and "example" refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of the present invention. Furthermore, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of those different embodiments or examples.

[0052] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A testing fixture for PCB board assembly testing, characterized in that, include: Test stand (1); Multiple probe moving components (2), the probe moving components (2) include: a first motor (3), an active rotating component (4), multiple drive components (5) and multiple gearboxes (6). The first motor (3) is mounted on the test bench (1), and two adjacent drive components (5) are connected through the gearbox (6). One of the multiple gearboxes (6) is connected to the first motor (3). The drive assembly (5) includes a lead screw drive (7) and a probe detection device (8), wherein the lead screw drive (7) is disposed on the gearbox (6), and the probe detection device (8) is connected to the lead screw drive (7) through a driven rotating part (9); The active rotating component (4) is mounted on the first motor (3), and a plurality of driven rotating components (9) are detachably connected to the active rotating component (4). The active rotating component (4) is configured to drive the probe detection device (8) to rotate via the driven rotating components (9).

2. The testing fixture for PCB board assembly testing according to claim 1, characterized in that, The probe moving assembly (2) further includes: an electric push rod (10), a sliding seat (11), and an electric gear (12). The first motor (3) is disposed on the driving end of the electric push rod (10), the sliding seat (11) is disposed on the electric push rod (10), the sliding seat (11) is slidably connected to the test bench (1), the electric gear (12) is disposed on the sliding seat (11), and a rack (13) is disposed inside the test bench (1). The multiple electric gears (12) respectively mesh with the rack (13).

3. The testing fixture for PCB board assembly testing according to claim 1, characterized in that, The lead screw drive component (7) includes a ball screw (14) and a ball slider (15), wherein the ball screw (14) is disposed at the output end of the gearbox (6), and the ball slider (15) is disposed on the ball screw (14).

4. The testing fixture for PCB board assembly testing according to claim 1, characterized in that, The active rotating component (4) includes a third motor (16) and a rotating rod (17), wherein the third motor (16) is mounted on the first motor (3), and the rotating rod (17) is mounted on the driving end of the third motor (16).

5. The PCB board assembly testing fixture according to claim 4, characterized in that, The driven rotating component (9) includes: a rotating plate (18), a gear ring (19), a connecting plate (20), a tube body (21), a driven wheel (22), and a first electromagnet (23). The rotating plate (18) is rotatably mounted on the lead screw drive component (7), the gear ring (19) is mounted on the rotating plate (18), the connecting plate (20) is mounted on the lead screw drive component (7), the tube body (21) is rotatably mounted on the connecting plate (20), the driven wheel (22) is mounted on the tube body (21), and the driven wheel (22) meshes with the gear ring (19). The first electromagnet (23) is mounted inside the tube body (21), and the rotating rod (17) is magnetically connected to the first electromagnet (23).

6. The testing fixture for PCB board assembly testing according to claim 1, characterized in that, The probe detection device (8) includes a placement bucket (24) and a clamping member (25), wherein the placement bucket (24) is disposed on the driven rotating member (9), and the clamping member (25) is disposed on the placement bucket (24) for fixing the probe on the placement bucket (24).

7. The PCB board assembly testing fixture according to claim 6, characterized in that, The clamping component (25) includes: an electric winding wheel (26), a connecting rope (27), a clamping plate (28), and a spring (29). The placement bucket (24) has an installation groove (30) inside. The electric winding wheel (26) is disposed in the installation groove (30). The clamping plate (28) is slidably connected to the installation groove (30). The electric winding wheel (26) is connected to the clamping plate (28) through the connecting rope (27). The clamping plate (28) is connected to the placement bucket (24) through the spring (29).

8. The testing fixture for PCB board assembly testing according to claim 1, characterized in that, The test bench (1) includes a workbench (31), a pressing device (32), and a receiving platform (33), wherein the pressing device (32) and the receiving platform (33) are respectively disposed on the workbench (31), and the receiving platform (33) is disposed below the pressing device (32).

9. The testing fixture for PCB board assembly testing according to claim 8, characterized in that, The pressing device (32) includes: a hydraulic telescopic device (34), a mounting plate (35) and a plurality of top columns (36), wherein the hydraulic telescopic device (34) is disposed on the workbench (31), the mounting plate (35) is disposed at the drive end of the hydraulic telescopic device (34), and the plurality of top columns (36) are respectively disposed at the lower part of the mounting plate (35).

10. The testing fixture for PCB board assembly testing according to claim 8, characterized in that, The material receiving platform (33) includes: a frame plate (37), an elastic element (38) and a loading platform (39). The worktable (31) has a through groove, the frame plate (37) is disposed on the through groove, and the loading platform (39) is connected to the frame plate (37) through the elastic element (38).

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