PET release film manufacturing intelligent management method and system

Abstract

The invention is suitable for the technical field of release film production, and particularly relates to an intelligent management method and system for PET release film manufacturing, and the method comprises the steps: constructing a release film measurement control system; constructing a plane coordinate system, measuring the thickness of the first base material based on a plurality of pairs of laser ranging heads, constructing a first measurement track and a second measurement track, and outputting the thickness of the second base material and the thickness of the coating; extracting track intersection points, and performing data matching to obtain an actual matching result; and performing compensation verification based on an actual matching result, outputting a compensation correction parameter, calculating a position offset, and outputting a tension correction parameter. According to the method, whether the coating thickness of the infrared measurement point is matched with the compensation parameter or not can be accurately judged, accurate verification of the compensation parameter is achieved, a basis can be provided for tension adjustment based on the position offset between the theoretical anchoring point and the actual anchoring point, the requirements of data anchoring and tension correction are met at the same time, and the method is suitable for large-scale popularization and application. Therefore, the product quality is more stable, and the production parameter control is more accurate.

Description

Technical Field

[0002] This invention belongs to the field of release film production technology, and particularly relates to an intelligent management method and system for PET release film manufacturing. Background Technology

[0003] PET release film, also known as polyethylene terephthalate release film, is a functional composite material made of high-molecular-weight PET film as the base material and coated with release agents such as silicone oil or fluorine. Its core function is to achieve a balance between non-stickiness and easy peeling—ensuring that adhesive materials such as tapes and protective films remain stable and non-stick during storage and transportation, while allowing for easy removal without leaving residue during use. With its excellent high-temperature resistance (some products can withstand 200℃), high transparency (light transmittance > 90%), good dimensional stability, antistatic properties, and chemical inertness, PET release film has been deeply integrated into many high-tech and everyday consumer fields, including electronics, new energy, and medical.

[0004] In the current high-end PET release film production process, the coating amount is precisely controlled by measuring the thickness of the substrate. However, the final compensation effect needs to be measured by the subsequent thickness detection structure. Due to the tension fluctuation of the release film during processing, the release film as a whole will have lateral and longitudinal offset, resulting in mismatch between the positions of the two thickness measurements, making the compensation result verification inaccurate. Summary of the Invention

[0005] The purpose of this invention is to provide an intelligent management method for PET release film manufacturing, which aims to solve the problem that tension fluctuations in the release film during processing cause lateral and longitudinal shifts in the release film, resulting in mismatches in the positions of two consecutive thickness measurements and inaccurate compensation results.

[0006] This invention is implemented as follows: a smart management method for PET release film manufacturing, the method comprising: A release film measurement and control system is constructed, which includes multiple pairs of horizontally distributed laser rangefinders and a set of infrared thickness gauges. The infrared thickness gauges are equipped with filter wheels for time-division output of two wavelengths of infrared measurement light. A planar coordinate system is constructed. Based on the measurement of the thickness of the first substrate by multiple pairs of laser rangefinders, a first measurement trajectory is constructed. An infrared thickness gauge is controlled to measure the coated substrate to obtain a second measurement trajectory. The thickness of the second substrate and the coating thickness are then output. Extract the intersection points of the second measurement trajectory and the first measurement trajectory, and perform data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching results; Compensation verification is performed based on the actual matching results, and compensation correction parameters are output. The position offset is calculated based on the actual matching results, and tension correction parameters are output.

[0007] Preferably, the steps of constructing a planar coordinate system, based on multiple pairs of laser rangefinders measuring the thickness of the first substrate, constructing a first measurement trajectory, controlling an infrared thickness gauge to measure the coated substrate, obtaining a second measurement trajectory, and outputting the second substrate thickness and coating thickness specifically include: A planar coordinate system is constructed, and a first measurement trajectory is generated in the planar coordinate system according to the conveying speed of the substrate. The first measurement trajectory is used to determine the measurement position trajectory of the laser rangefinder on the substrate. The infrared thickness gauge is controlled to reciprocate periodically, and the coated substrate is continuously measured during the movement, and a second measurement trajectory is output. Simultaneously record the first substrate thickness output by the laser rangefinder and the second substrate thickness and coating thickness output by the infrared thickness gauge, and store the timestamp of the data generation.

[0008] Preferably, the step of extracting the intersection points of the second measurement trajectory and the first measurement trajectory, and performing data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching result specifically includes: Based on the generation time of the second measurement trajectory and the first measurement trajectory, they are superimposed on the same coordinate system, the intersection point of the second measurement trajectory and the first measurement trajectory is extracted, and the theoretical coordinates of the trajectory intersection point are output. Based on the theoretical coordinates, the thickness of the second substrate at the corresponding time is queried. Based on the multiple sets of second substrate thicknesses, a sliding window is constructed at the intersection of the corresponding trajectories on the first measurement trajectory. Data matching is performed, and the actual coordinates of the trajectory intersection points are output. Based on the actual coordinates of the trajectory intersection points, extract the theoretical coating thickness at the corresponding time and the actual measured coating thickness, and output the actual matching result.

[0009] Preferably, the steps of performing compensation verification based on actual matching results, outputting compensation correction parameters, calculating position offset based on actual matching results, and outputting tension correction parameters specifically include: The theoretical coating thickness and the actual measured coating thickness are retrieved, the difference between the two is calculated, and the corresponding compensation and correction parameters are output based on the difference. Extract the actual coordinates and theoretical coordinates of the trajectory intersection points from the actual matching results to determine the corresponding data acquisition time; The positional offset during this period is calculated based on the difference in data acquisition time and the conveying speed of the substrate, and tension correction parameters are output based on this positional offset.

[0010] Preferably, the method further includes constructing a transverse thickness prediction function based on the thickness of the first substrate, outputting a transverse prediction curve of the substrate thickness, and determining whether there is a thickness anomaly in the non-measured area of ​​the substrate based on the transverse prediction curve.

[0011] Another object of the present invention is an intelligent management system for PET release film manufacturing, the system comprising: The control system construction module is used to construct the release film measurement control system. The release film measurement control system includes multiple pairs of horizontally distributed laser rangefinders and a set of infrared thickness gauges. The infrared thickness gauges are equipped with filter wheels for time-division output of two wavelengths of infrared measurement light. The synchronous measurement module is used to construct a planar coordinate system, measure the thickness of the first substrate based on multiple pairs of laser rangefinders, construct a first measurement trajectory, control an infrared thickness gauge to measure the coated substrate, obtain a second measurement trajectory, and output the second substrate thickness and coating thickness. The data matching module is used to extract the intersection points of the second measurement trajectory and the first measurement trajectory, and perform data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching results; The parameter verification module is used to perform compensation verification based on the actual matching results, output compensation correction parameters, calculate the position offset based on the actual matching results, and output tension correction parameters.

[0012] Preferably, the synchronous measurement module includes: The first trajectory construction unit is used to construct a planar coordinate system and generate a first measurement trajectory in the planar coordinate system according to the conveying speed of the substrate. The first measurement trajectory is used to determine the measurement position trajectory of the laser rangefinder on the substrate. The second trajectory construction unit is used to control the periodic reciprocating motion of the infrared thickness gauge, continuously measure the coated substrate during the motion, and output the second measurement trajectory. The data recording unit is used to simultaneously record the first substrate thickness output by the laser rangefinder and the second substrate thickness and coating thickness output by the infrared thickness gauge, and to store the timestamp of the data generation.

[0013] Preferably, the data matching module includes: The theoretical trajectory calculation unit is used to superimpose the second measurement trajectory and the first measurement trajectory in the same coordinate system according to the generation time of the second measurement trajectory and the first measurement trajectory, extract the trajectory intersection point of the second measurement trajectory and the first measurement trajectory, and output the theoretical coordinates of the trajectory intersection point; The actual intersection calculation unit is used to query the thickness of the second substrate at the corresponding time based on the theoretical coordinates, construct a sliding window at the intersection of the corresponding trajectory on the first measurement trajectory according to multiple sets of second substrate thicknesses, perform data matching, and output the actual coordinates of the trajectory intersection. The thickness matching unit is used to extract the theoretical coating thickness and the actual measured coating thickness at the corresponding time based on the actual coordinates of the trajectory intersection point, and output the actual matching result.

[0014] Preferably, the parameter verification module includes: The coating compensation unit is used to retrieve the theoretical coating thickness and the actual measured coating thickness, calculate the difference between the two, and output the corresponding compensation and correction parameters based on the difference. The data acquisition time extraction unit is used to extract the actual coordinates and theoretical coordinates of the trajectory intersection points from the actual matching results, and to determine the corresponding data acquisition time. The tension correction unit is used to calculate the positional offset during this period based on the difference in data acquisition time and the conveying speed of the substrate, and outputs tension correction parameters based on the positional offset.

[0015] Preferably, the system further includes constructing a transverse thickness prediction function based on the thickness of the first substrate, outputting a transverse prediction curve of the substrate thickness, and determining whether there is a thickness anomaly in the non-measured area of ​​the substrate based on the transverse prediction curve.

[0016] The intelligent management method for PET release film manufacturing provided by this invention performs two measurements on the substrate and achieves precise data anchoring based on the measurement results. This allows for accurate determination of whether the coating thickness at the infrared measurement point matches the compensation parameters, thus achieving precise verification of the compensation parameters. Furthermore, the positional offset between the theoretical anchoring point and the actual anchoring point provides a basis for tension adjustment, simultaneously meeting the needs of data anchoring and tension correction. This results in more stable product quality and more precise control of production parameters. Attached Figure Description

[0017] Figure 1 A flowchart of the intelligent management method for PET release film manufacturing provided in an embodiment of the present invention; Figure 2 A flowchart for measuring a substrate and a coating and outputting a measurement trajectory is provided as an embodiment of the present invention; Figure 3 This is a flowchart illustrating the steps of extracting the intersection points of the second measurement trajectory and the first measurement trajectory, performing data matching based on the thickness of the second substrate corresponding to the trajectory intersection points, and obtaining the actual matching result, according to an embodiment of the present invention. Figure 4 A flowchart of the steps provided in this embodiment of the invention for performing compensation verification based on actual matching results, outputting compensation correction parameters, calculating position offset based on actual matching results, and outputting tension correction parameters; Figure 5 An architecture diagram of the intelligent management system for PET release film manufacturing provided in an embodiment of the present invention; Figure 6An architecture diagram of the synchronous measurement module provided in an embodiment of the present invention; Figure 7 An architecture diagram of the data matching module provided in an embodiment of the present invention; Figure 8 This is an architecture diagram of the parameter verification module provided in an embodiment of the present invention; Figure 9 This is a schematic diagram of the theoretical intersection point and the actual intersection point provided in the embodiments of the present invention. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0019] like Figure 1 The diagram shows a flowchart of an intelligent management method for PET release film manufacturing provided in an embodiment of the present invention. The method includes: S100, Construct a release film measurement and control system. The release film measurement and control system includes multiple pairs of horizontally distributed laser rangefinders and a set of infrared thickness gauges. The infrared thickness gauges are equipped with filter wheels for time-division output of infrared measurement light of two wavelengths.

[0020] In this step, a release film measurement and control system is constructed. A laser rangefinder and an infrared thickness gauge are installed in the PET release film production equipment. The laser rangefinder is positioned before the coating process to measure the thickness of the substrate. Based on this thickness, the coating amount of the coating equipment is controlled. The laser rangefinders are arranged in pairs, with one pair positioned at corresponding positions on both sides of the substrate. The distance between the pairs of laser rangefinders is fixed. Therefore, the measured thickness of the substrate can be output based on the individual measurements of the two laser rangefinders and the fixed distance between them. Multiple sets of laser rangefinders are set perpendicular to the substrate's conveying direction, defined as longitudinal. The direction perpendicular to the substrate's conveying direction in the horizontal plane is defined as transverse. Multiple sets of laser rangefinders are distributed along the transverse direction. The number of laser rangefinders is determined by the width of the substrate; the wider the substrate, the more laser rangefinders are required. The infrared thickness gauge generates a broadband infrared light spectrum. For the substrate and the coating, the corresponding characteristic absorption peak wavelengths are respectively... and The wavelength of the broadband infrared light covering the characteristic absorption peak generated by the infrared thickness gauge and Using a filter wheel, broadband infrared light can be filtered into narrowband infrared light (a) and narrowband infrared light (b), where narrowband infrared light (a) and narrowband infrared light (b) respectively contain characteristic absorption peak wavelengths. and The high-speed rotation of the filter wheel causes the infrared thickness gauge to alternately generate narrow-spectrum infrared light (a) and narrow-spectrum infrared light (b). These two wavelengths of infrared light pass alternately through the substrate coated with a release coating. The light is received by the receiver for spectral analysis. Based on the absorption coefficients of the coating and the substrate for the two wavelengths of infrared light, two sets of equations are constructed, expressed as follows: ; ; in, and The values ​​represent the total absorbance received by the receiver under narrow-spectrum infrared light (a) and narrow-spectrum infrared light (b), respectively. and For substrate with wavelength of and The characteristic absorption coefficient of infrared light was obtained through experimental calibration. and For the coating to wavelength and The characteristic absorption coefficient of infrared light was obtained through experimental calibration. The thickness of the substrate corresponding to the measurement point. The thickness of the coating corresponding to the measurement point; The substrate thickness and coating thickness at this location were calculated by solving a system of simultaneous equations.

[0021] S200: Construct a planar coordinate system, measure the thickness of the first substrate based on multiple pairs of laser rangefinders, construct a first measurement trajectory, control an infrared thickness gauge to measure the coated substrate, obtain a second measurement trajectory, and output the second substrate thickness and coating thickness.

[0022] In this step, a planar coordinate system is constructed, using the surface of the substrate as the plane. The substrate is designed to be free of tension fluctuations and transported at a fixed speed. The laser rangefinder determines the corresponding position on the substrate, forming a first measurement trajectory on the substrate surface. Since the laser rangefinders are fixed in position and numerous, multiple sets of parallel straight lines will form on the substrate surface. During measurement, the measured values ​​output by the laser rangefinders are recorded to obtain the first substrate thickness, and the timestamps corresponding to the measurement data are recorded simultaneously. Similarly, the trajectory of the infrared thickness gauge is also marked on the substrate, forming a second measurement trajectory on the substrate surface. Due to the reciprocating motion of the infrared thickness gauge, a Z-shaped measurement trajectory will form on the substrate surface. The second substrate thickness and coating thickness output by the infrared thickness gauge are recorded simultaneously.

[0023] S300: Extract the intersection points of the second measurement trajectory and the first measurement trajectory, and perform data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching results.

[0024] In this step, the intersection point of the second measurement trajectory and the first measurement trajectory is extracted. When the substrate tension is stable, the intersection point of the two measurement trajectories is the theoretical intersection point. However, due to the precision requirements of the production equipment, tension fluctuations occur, causing the actual intersection point to deviate from the theoretical one. Therefore, directly verifying whether the coating thickness meets the standard based on the theoretical intersection point is inaccurate. It is necessary to determine the actual intersection point of the first and second measurement trajectories and verify the coating thickness at the actual intersection point to accurately determine whether the coating amount output based on the substrate thickness at that point meets the production standard. When determining the actual intersection point, the second substrate thickness at the theoretical intersection point is retrieved, and data matching is performed in the area of ​​the first measurement trajectory close to the theoretical intersection point. Figure 9 As shown, L3 is the trajectory of the laser measurement point, L0 is the theoretical trajectory of the infrared thickness gauge, and P0 is the theoretical trajectory intersection. Due to the change in tension, the elongation of the substrate changes, causing the trajectory intersection to shift. P1 is the actual trajectory intersection, and L1 is the actual trajectory of the infrared thickness gauge after the shift. The second substrate thickness measured at each point at P0 is retrieved, and the first substrate thickness that matches the second substrate thickness is queried in the area near P0 on L3. That is, the point corresponding to the first substrate thickness and the second substrate thickness is found, and the actual trajectory intersection P1 is obtained. Then, the coating target corresponding to P1 on the laser measurement trajectory corresponds to the coating measurement thickness at P0, and the actual matching result is obtained.

[0025] S400 performs compensation verification based on actual matching results, outputs compensation correction parameters, calculates position offset based on actual matching results, and outputs tension correction parameters.

[0026] In this step, compensation verification is performed based on the actual matching results. When setting the coating target, it is based on the substrate thickness. When the substrate thickness is too low, the coating thickness is increased to keep the overall thickness of the release film stable. The expected thickness value corresponding to the coating target is compared with the actual measured coating thickness. The difference is used to determine whether the compensation parameters meet the standard. Then, compensation correction parameters are generated based on the difference to form feedback adjustment. The offset between the theoretical trajectory intersection point and the actual trajectory position is calculated based on the actual matching results. The larger the offset, the greater the difference between the actual tension value and the set target tension value, thus the tension correction parameters are calculated.

[0027] like Figure 2 As shown, in a preferred embodiment of the present invention, the steps of constructing a planar coordinate system, measuring the thickness of the first substrate based on multiple pairs of laser rangefinders, constructing a first measurement trajectory, controlling an infrared thickness gauge to measure the coated substrate, obtaining a second measurement trajectory, and outputting the second substrate thickness and coating thickness specifically include: S201, Construct a planar coordinate system and generate a first measurement trajectory in the planar coordinate system according to the conveying speed of the substrate. The first measurement trajectory is used to determine the measurement position trajectory of the laser rangefinder on the substrate.

[0028] In this step, a planar coordinate system is constructed with the plane where the substrate is located as the reference. The positions of each laser rangefinder are recorded in real time and synchronously mapped into the planar coordinate system to determine the relative positional relationship between the substrate and the measurement position, thereby generating the first measurement trajectory.

[0029] S202 controls the infrared thickness gauge to reciprocate periodically, continuously measuring the coated substrate during the movement and outputting a second measurement trajectory.

[0030] In this step, the infrared thickness gauge is controlled to reciprocate periodically, that is, the direction of movement of the infrared thickness gauge is parallel to the substrate and perpendicular to the direction of substrate conveying. Due to the transverse reciprocating motion of the infrared thickness gauge, the measurement trajectory of the infrared thickness gauge on the substrate is Z-shaped, thus obtaining the second measurement trajectory.

[0031] S203 simultaneously records the first substrate thickness output by the laser rangefinder and the second substrate thickness and coating thickness output by the infrared thickness gauge, and stores the timestamp of the data generation.

[0032] In this step, the thickness of the first substrate output by the laser rangefinder and the thickness of the second substrate and coating output by the infrared thickness gauge are recorded simultaneously. Each measurement value is generated, including the thickness of the first substrate, the thickness of the second substrate, and the coating thickness. A corresponding timestamp is set, and the measurement value is associated with each trajectory point on the trajectory. That is, the corresponding measurement value can be obtained by looking up a point on the trajectory.

[0033] like Figure 3 As shown, in a preferred embodiment of the present invention, the step of extracting the intersection points of the second measurement trajectory and the first measurement trajectory, and performing data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching result specifically includes: S301, according to the generation time of the second measurement trajectory and the first measurement trajectory, superimpose them in the same coordinate system, extract the intersection point of the second measurement trajectory and the first measurement trajectory, and output the theoretical coordinates of the trajectory intersection point.

[0034] In this step, the second measurement trajectory is superimposed on the first measurement trajectory, so that the two sets of trajectories will intersect, such as... Figure 9 As shown, when there is no tension fluctuation in the substrate, the first measurement trajectory is as follows: Figure 9 As shown in L3, the second measurement trajectory is as follows: Figure 9 As shown in L0, the intersection point between the two is the theoretical trajectory intersection point, and the theoretical coordinates of the trajectory intersection point are output.

[0035] S302: Based on the theoretical coordinates, query the thickness of the second substrate at the corresponding time. Based on the multiple sets of second substrate thicknesses, construct a sliding window at the intersection of the corresponding trajectories on the first measurement trajectory, perform data matching, and output the actual coordinates of the trajectory intersection.

[0036] In this step, the thickness of the second substrate at the corresponding time is queried based on theoretical coordinates. When tension fluctuations occur in the substrate, the intersection of the trajectories will drift, such as moving to... Figure 9 The location of P1, that is, the thickness of the first substrate corresponding to P0 on the L3 trajectory, corresponds to the thickness of the second substrate at P1 on the L1 trajectory. P1 is the actual intersection of the trajectories, and the corresponding actual coordinates are output.

[0037] S303 extracts the theoretical coating thickness and the actual measured coating thickness at the corresponding time based on the actual coordinates of the trajectory intersection point, and outputs the actual matching result.

[0038] In this step, the theoretical coating thickness and the actual measured coating thickness at the corresponding time are extracted based on the actual coordinates of the intersection of the trajectories. That is, after determining the matching points on the two sets of trajectories, such as point M on trajectory L3 corresponding to point N on trajectory L1, the target coating thickness set for point M based on the first substrate thickness system is B1, and the actual measured coating thickness for point N on L1 is B2, which is output as the actual matching result.

[0039] like Figure 4 As shown in the preferred embodiment of the present invention, the steps of performing compensation verification based on the actual matching results, outputting compensation correction parameters, calculating the position offset based on the actual matching results, and outputting tension correction parameters specifically include: S401 retrieves the theoretical coating thickness and the actual measured coating thickness, calculates the difference between the two, and outputs the corresponding compensation and correction parameters based on the difference.

[0040] In this step, the theoretical coating thickness and the actual measured coating thickness are retrieved, i.e., B1 and B2 are retrieved. The difference between B1 and B2, B1-B2, is then calculated. Difference The larger the value, the worse the compensation effect. A positive value indicates insufficient coating thickness, requiring an increase in the amount of adhesive applied; conversely, a negative value indicates insufficient coating thickness. When the value is negative, it indicates that the amount of glue applied is excessive. In this case, the amount of glue applied is reduced, corresponding compensation and correction parameters are generated, and sent to the glue application mechanism.

[0041] S402, extract the actual coordinates and theoretical coordinates of the trajectory intersection points from the actual matching results, and determine the corresponding data acquisition time.

[0042] In this step, the actual coordinates and theoretical coordinates of the trajectory intersection points are extracted from the actual matching results. The time discrepancy between the actual and theoretical coordinates is caused by tension fluctuations. Therefore, the data acquisition time corresponding to the actual and theoretical coordinates is retrieved.

[0043] S403 calculates the positional offset during this period based on the difference in data acquisition time and the conveying speed of the substrate, and outputs tension correction parameters based on the positional offset.

[0044] In this step, the positional offset during this period is calculated based on the difference in data acquisition time and the conveying speed of the substrate. The larger the difference, the greater the tension drift. Corresponding tension correction parameters are then output to the tension adjustment mechanism to achieve feedback adjustment.

[0045] In one embodiment of the present invention, the method further includes constructing a lateral thickness prediction function based on the thickness of a first substrate, outputting a lateral prediction curve of the substrate thickness, and determining whether there is a thickness anomaly in the non-measured area of ​​the substrate based on the lateral prediction curve.

[0046] In this embodiment, the lateral position of the measurement point on the substrate is used as the abscissa, and the corresponding thickness value is used as the ordinate to construct the thickness coordinates corresponding to each measurement point. Based on multiple sets of measurement coordinates, a function is fitted to output a thickness prediction function. Based on the thickness prediction function, the predicted thickness of any point in the lateral direction can be output to output a lateral prediction curve. The maximum and minimum values ​​of the lateral prediction curve are used to determine whether the substrate has a thickness abnormality. If the maximum value exceeds the upper limit or the minimum value exceeds the lower limit, it is determined to be a thickness abnormality.

[0047] like Figure 5 As shown in the preferred embodiment of the present invention, the intelligent management system for PET release film manufacturing includes: The control system construction module 100 is used to construct a release film measurement control system. The release film measurement control system includes multiple pairs of horizontally distributed laser rangefinders and a set of infrared thickness gauges. The infrared thickness gauges are equipped with filter wheels for time-division output of two wavelengths of infrared measurement light.

[0048] In this system, the control system construction module 100 constructs a release film measurement control system. In the PET release film production equipment, laser rangefinders and infrared thickness gauges are installed. The laser rangefinders are positioned before the coating process to measure the thickness of the substrate. Based on this thickness, the coating amount of the coating equipment is controlled. The laser rangefinders are installed in pairs, with one pair positioned at corresponding positions on both sides of the substrate. The distance between the pairs of laser rangefinders is fixed. Therefore, the measured thickness of the substrate can be output based on the individual measurements of the two laser rangefinders and the fixed distance between them. Multiple sets of laser rangefinders are set perpendicular to the substrate's conveying direction, defined as longitudinal. In the horizontal plane, the direction perpendicular to the substrate's conveying direction is defined as transverse. Multiple sets of laser rangefinders are distributed along the transverse direction. The number of laser rangefinders is set according to the width of the substrate; the wider the substrate, the more laser rangefinders are required. The infrared thickness gauge generates a broadband infrared light. For the substrate and the coating, the corresponding characteristic absorption peak wavelengths are respectively... and The wavelength of the broadband infrared light covering the characteristic absorption peak generated by the infrared thickness gauge and Using a filter wheel, broadband infrared light can be filtered into narrowband infrared light (a) and narrowband infrared light (b), where narrowband infrared light (a) and narrowband infrared light (b) respectively contain characteristic absorption peak wavelengths. and The high-speed rotation of the filter wheel causes the infrared thickness gauge to alternately generate narrow-spectrum infrared light (a) and narrow-spectrum infrared light (b). These two wavelengths of infrared light pass alternately through the substrate coated with a release coating. The light is received by the receiver for spectral analysis. Based on the absorption coefficients of the coating and the substrate for the two wavelengths of infrared light, two sets of equations are constructed, expressed as follows: ; ; in, and The values ​​represent the total absorbance received by the receiver under narrow-spectrum infrared light (a) and narrow-spectrum infrared light (b), respectively. and For substrate with wavelength of and The characteristic absorption coefficient of infrared light was obtained through experimental calibration. and For the coating to wavelength and The characteristic absorption coefficient of infrared light was obtained through experimental calibration. The thickness of the substrate corresponding to the measurement point. The thickness of the coating corresponding to the measurement point; The substrate thickness and coating thickness at this location were calculated by solving a system of simultaneous equations.

[0049] The synchronous measurement module 200 is used to construct a planar coordinate system, measure the thickness of the first substrate based on multiple pairs of laser rangefinders, construct a first measurement trajectory, control an infrared thickness gauge to measure the coated substrate, obtain a second measurement trajectory, and output the second substrate thickness and coating thickness.

[0050] In this system, the synchronous measurement module 200 constructs a planar coordinate system, using the surface of the substrate as the plane to construct the coordinate system. The substrate is set to be free of tension fluctuations and transported at a fixed speed. Based on the measurement position of the laser rangefinder, a corresponding position is determined on the substrate, forming a first measurement trajectory on the substrate surface corresponding to the laser rangefinder. Since the laser rangefinder's position is fixed and there are multiple sets, multiple sets of parallel straight lines will form on the substrate surface. During the measurement process, the measured value output by the laser rangefinder is recorded to obtain the first substrate thickness, and the timestamp corresponding to the measurement data is recorded synchronously. Similarly, the trajectory of the infrared thickness gauge is also marked on the substrate, thus forming a second measurement trajectory on the substrate surface. Due to the reciprocating motion of the infrared thickness gauge, a Z-shaped measurement trajectory will form on the substrate surface. The second substrate thickness and coating thickness output by the infrared thickness gauge are recorded synchronously.

[0051] The data matching module 300 is used to extract the intersection points of the second measurement trajectory and the first measurement trajectory, and to perform data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching result.

[0052] In this system, the data matching module 300 extracts the intersection point of the second measurement trajectory and the first measurement trajectory. When the tension of the substrate is stable, the intersection point of the two measurement trajectories is the theoretical intersection point. However, due to the precision requirements of the production equipment, tension fluctuates, so the actual intersection point will deviate from the theoretical intersection point. Therefore, directly verifying whether the coating thickness meets the standard based on the theoretical intersection point is inaccurate. It is necessary to determine the actual intersection point of the first and second measurement trajectories and verify the coating thickness at the actual intersection point to accurately determine whether the coating amount output based on the substrate thickness at that point meets the production standard. When determining the actual intersection point, the second substrate thickness at the theoretical intersection point is retrieved, and data matching is performed in the area of ​​the first measurement trajectory close to the theoretical intersection point. Figure 9As shown, L3 is the trajectory of the laser measurement point, L0 is the theoretical trajectory of the infrared thickness gauge, and P0 is the theoretical trajectory intersection. Due to the change in tension, the elongation of the substrate changes, causing the trajectory intersection to shift. P1 is the actual trajectory intersection, and L1 is the actual trajectory of the infrared thickness gauge after the shift. The second substrate thickness measured at each point at P0 is retrieved, and the first substrate thickness that matches the second substrate thickness is queried in the area near P0 on L3. That is, the point corresponding to the first substrate thickness and the second substrate thickness is found, and the actual trajectory intersection P1 is obtained. Then, the coating target corresponding to P1 on the laser measurement trajectory corresponds to the coating measurement thickness at P0, and the actual matching result is obtained.

[0053] The parameter verification module 400 is used to perform compensation verification based on the actual matching results, output compensation correction parameters, calculate the position offset based on the actual matching results, and output tension correction parameters.

[0054] In this system, the parameter verification module 400 performs compensation verification based on the actual matching results. When setting the coating target, it is based on the substrate thickness. When the substrate thickness is too low, the coating thickness is increased to keep the overall thickness of the release film stable. The expected thickness value corresponding to the coating target is compared with the actual measured coating thickness. Based on the difference, it is determined whether the compensation parameter meets the standard. Then, compensation correction parameters are generated based on the difference to form feedback adjustment. The offset between the theoretical trajectory intersection point and the actual trajectory position is calculated based on the actual matching results. The larger the offset, the greater the difference between the actual tension value and the set target tension value, thus the tension correction parameters are adjusted.

[0055] like Figure 6 As shown, in a preferred embodiment of the present invention, the synchronous measurement module 200 includes: The first trajectory construction unit 201 is used to construct a planar coordinate system and generate a first measurement trajectory in the planar coordinate system according to the conveying speed of the substrate. The first measurement trajectory is used to determine the measurement position trajectory of the laser rangefinder on the substrate.

[0056] In this module, the first trajectory construction unit 201 constructs a planar coordinate system with the plane where the substrate is located as a reference, records the position of each laser rangefinder in real time, synchronously maps it into the planar coordinate system, determines the relative positional relationship between the substrate and the measurement position, and generates the first measurement trajectory.

[0057] The second trajectory construction unit 202 is used to control the periodic reciprocating motion of the infrared thickness gauge, continuously measure the coated substrate during the motion, and output the second measurement trajectory.

[0058] In this module, the second trajectory construction unit 202 controls the infrared thickness gauge to reciprocate periodically. That is, the movement direction of the infrared thickness gauge is parallel to the substrate and perpendicular to the direction of substrate conveying. Due to the transverse reciprocating motion of the infrared thickness gauge, the measurement trajectory of the infrared thickness gauge on the substrate is Z-shaped, thus obtaining the second measurement trajectory.

[0059] The data recording unit 203 is used to simultaneously record the first substrate thickness output by the laser rangefinder and the second substrate thickness and coating thickness output by the infrared thickness gauge, and to store the timestamp of the data generation.

[0060] In this module, the data recording unit 203 simultaneously records the first substrate thickness output by the laser rangefinder and the second substrate thickness and coating thickness output by the infrared thickness gauge. Each time, a measurement value is generated, including the first substrate thickness, the second substrate thickness and the coating thickness. A corresponding timestamp is set, and the measurement value is associated with each trajectory point on the trajectory. That is, the corresponding measurement value can be obtained by querying a point on the trajectory.

[0061] like Figure 7 As shown, in a preferred embodiment of the present invention, the data matching module 300 includes: The theoretical trajectory calculation unit 301 is used to superimpose the second measurement trajectory and the first measurement trajectory in the same coordinate system according to the generation time of the second measurement trajectory and the first measurement trajectory, extract the trajectory intersection point of the second measurement trajectory and the first measurement trajectory, and output the theoretical coordinates of the trajectory intersection point.

[0062] In this module, the theoretical trajectory calculation unit 301 superimposes the second measurement trajectory with the first measurement trajectory, so that an intersection point will be generated between the two sets of trajectories, such as... Figure 9 As shown, when there is no tension fluctuation in the substrate, the first measurement trajectory is as follows: Figure 9 As shown in L3, the second measurement trajectory is as follows: Figure 9 As shown in L0, the intersection point between the two is the theoretical trajectory intersection point, and the theoretical coordinates of the trajectory intersection point are output.

[0063] The actual intersection calculation unit 302 is used to query the thickness of the second substrate at the corresponding time based on the theoretical coordinates, construct a sliding window at the intersection of the corresponding trajectories on the first measurement trajectory according to multiple sets of second substrate thicknesses, perform data matching, and output the actual coordinates of the trajectory intersection.

[0064] In this module, the actual intersection calculation unit 302 queries the thickness of the second substrate at the corresponding time based on the theoretical coordinates. When the substrate experiences tension fluctuations, the trajectory intersection will drift, such as moving to... Figure 9 The location of P1, that is, the thickness of the first substrate corresponding to P0 on the L3 trajectory, corresponds to the thickness of the second substrate at P1 on the L1 trajectory. P1 is the actual intersection of the trajectories, and the corresponding actual coordinates are output.

[0065] The thickness matching unit 303 is used to extract the theoretical coating thickness and the actual measured coating thickness at the corresponding time based on the actual coordinates of the trajectory intersection point, and output the actual matching result.

[0066] In this module, the thickness matching unit 303 extracts the theoretical coating thickness and the actual measured coating thickness at the corresponding time based on the actual coordinates of the trajectory intersection. That is, after determining the matching points on the two sets of trajectories, such as point M on trajectory L3 corresponding to point N on trajectory L1, the target coating thickness set for point M based on the first substrate thickness system is B1, and the actual measured coating thickness for point N on L1 is B2, which is output as the actual matching result.

[0067] like Figure 8 As shown, in a preferred embodiment of the present invention, the parameter verification module 400 includes: The coating compensation unit 401 is used to retrieve the theoretical coating thickness and the actual measured coating thickness, calculate the difference between the two, and output the corresponding compensation and correction parameters based on the difference.

[0068] In this module, the coating compensation unit 401 retrieves the theoretical coating thickness and the actual measured coating thickness, i.e., retrieves B1 and B2. When calculating the difference between B1 and B2, B1 - B2 = ... Difference The larger the value, the worse the compensation effect. A positive value indicates insufficient coating thickness, requiring an increase in the amount of adhesive applied; conversely, a negative value indicates insufficient coating thickness. When the value is negative, it indicates that the amount of glue applied is excessive. In this case, the amount of glue applied is reduced, corresponding compensation and correction parameters are generated, and sent to the glue application mechanism.

[0069] The data acquisition time extraction unit 402 is used to extract the actual coordinates and theoretical coordinates of the trajectory intersection points from the actual matching results, and to determine the corresponding data acquisition time.

[0070] In this module, the acquisition time extraction unit 402 extracts the actual coordinates and theoretical coordinates of the trajectory intersection points from the actual matching results. The deviation between the actual coordinates and the theoretical coordinates is caused by tension fluctuations. Therefore, the data acquisition time corresponding to the actual coordinates and the theoretical coordinates is retrieved.

[0071] Tension correction unit 403 is used to calculate the position offset during this period based on the difference in data acquisition time and the conveying speed of the substrate, and output tension correction parameters based on the position offset.

[0072] In this module, the tension correction unit 403 calculates the positional offset during this period based on the difference in data acquisition time and the conveying speed of the substrate. The larger the difference, the greater the tension drift. The unit outputs the corresponding tension correction parameters to the tension adjustment mechanism to achieve feedback adjustment.

[0073] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A smart management method for PET release film manufacturing, characterized in that, The method includes: A release film measurement and control system is constructed, which includes multiple pairs of horizontally distributed laser rangefinders and a set of infrared thickness gauges. The infrared thickness gauges are equipped with filter wheels for time-division output of two wavelengths of infrared measurement light. A planar coordinate system is constructed. Based on the measurement of the thickness of the first substrate by multiple pairs of laser rangefinders, a first measurement trajectory is constructed. An infrared thickness gauge is controlled to measure the coated substrate to obtain a second measurement trajectory. The thickness of the second substrate and the coating thickness are then output. Extract the intersection points of the second measurement trajectory and the first measurement trajectory, and perform data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching results; Compensation verification is performed based on the actual matching results, and compensation correction parameters are output. The position offset is calculated based on the actual matching results, and tension correction parameters are output.

2. The intelligent management method for PET release film manufacturing according to claim 1, characterized in that, The steps of constructing a planar coordinate system, measuring the thickness of the first substrate using multiple pairs of laser rangefinders to create a first measurement trajectory, controlling an infrared thickness gauge to measure the coated substrate to obtain a second measurement trajectory, and outputting the second substrate thickness and coating thickness specifically include: A planar coordinate system is constructed, and a first measurement trajectory is generated in the planar coordinate system according to the conveying speed of the substrate. The first measurement trajectory is used to determine the measurement position trajectory of the laser rangefinder on the substrate. The infrared thickness gauge is controlled to reciprocate periodically, and the coated substrate is continuously measured during the movement, and a second measurement trajectory is output. Simultaneously record the first substrate thickness output by the laser rangefinder and the second substrate thickness and coating thickness output by the infrared thickness gauge, and store the timestamp of the data generation.

3. The intelligent management method for PET release film manufacturing according to claim 1, characterized in that, The step of extracting the intersection points of the second measurement trajectory and the first measurement trajectory, and performing data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching result, specifically includes: Based on the generation time of the second measurement trajectory and the first measurement trajectory, they are superimposed on the same coordinate system, the intersection point of the second measurement trajectory and the first measurement trajectory is extracted, and the theoretical coordinates of the trajectory intersection point are output. Based on the theoretical coordinates, the thickness of the second substrate at the corresponding time is queried. Based on the multiple sets of second substrate thicknesses, a sliding window is constructed at the intersection of the corresponding trajectories on the first measurement trajectory. Data matching is performed, and the actual coordinates of the trajectory intersection points are output. Based on the actual coordinates of the trajectory intersection points, extract the theoretical coating thickness at the corresponding time and the actual measured coating thickness, and output the actual matching result.

4. The intelligent management method for PET release film manufacturing according to claim 3, characterized in that, The steps of performing compensation verification based on actual matching results, outputting compensation correction parameters, calculating position offset based on actual matching results, and outputting tension correction parameters specifically include: The theoretical coating thickness and the actual measured coating thickness are retrieved, the difference between the two is calculated, and the corresponding compensation and correction parameters are output based on the difference. Extract the actual coordinates and theoretical coordinates of the trajectory intersection points from the actual matching results to determine the corresponding data acquisition time; The positional offset during this period is calculated based on the difference in data acquisition time and the conveying speed of the substrate, and tension correction parameters are output based on this positional offset.

5. The intelligent management method for PET release film manufacturing according to claim 1, characterized in that, The method further includes constructing a transverse thickness prediction function based on the thickness of the first substrate, outputting a transverse prediction curve of the substrate thickness, and determining whether there is a thickness anomaly in the non-measured area of ​​the substrate based on the transverse prediction curve.

6. An intelligent management system for PET release film manufacturing, characterized in that, The system includes: The control system construction module is used to construct the release film measurement control system. The release film measurement control system includes multiple pairs of horizontally distributed laser rangefinders and a set of infrared thickness gauges. The infrared thickness gauges are equipped with filter wheels for time-division output of two wavelengths of infrared measurement light. The synchronous measurement module is used to construct a planar coordinate system, measure the thickness of the first substrate based on multiple pairs of laser rangefinders, construct a first measurement trajectory, control an infrared thickness gauge to measure the coated substrate, obtain a second measurement trajectory, and output the second substrate thickness and coating thickness. The data matching module is used to extract the intersection points of the second measurement trajectory and the first measurement trajectory, and perform data matching based on the thickness of the second substrate corresponding to the trajectory intersection points to obtain the actual matching results; The parameter verification module is used to perform compensation verification based on the actual matching results, output compensation correction parameters, calculate the position offset based on the actual matching results, and output tension correction parameters.

7. The intelligent management system for PET release film manufacturing according to claim 6, characterized in that, The synchronous measurement module includes: The first trajectory construction unit is used to construct a planar coordinate system and generate a first measurement trajectory in the planar coordinate system according to the conveying speed of the substrate. The first measurement trajectory is used to determine the measurement position trajectory of the laser rangefinder on the substrate. The second trajectory construction unit is used to control the periodic reciprocating motion of the infrared thickness gauge, continuously measure the coated substrate during the motion, and output the second measurement trajectory. The data recording unit is used to simultaneously record the first substrate thickness output by the laser rangefinder and the second substrate thickness and coating thickness output by the infrared thickness gauge, and to store the timestamp of the data generation.

8. The intelligent management system for PET release film manufacturing according to claim 6, characterized in that, The data matching module includes: The theoretical trajectory calculation unit is used to superimpose the second measurement trajectory and the first measurement trajectory in the same coordinate system according to the generation time of the second measurement trajectory and the first measurement trajectory, extract the trajectory intersection point of the second measurement trajectory and the first measurement trajectory, and output the theoretical coordinates of the trajectory intersection point; The actual intersection calculation unit is used to query the thickness of the second substrate at the corresponding time based on the theoretical coordinates, construct a sliding window at the intersection of the corresponding trajectory on the first measurement trajectory according to multiple sets of second substrate thicknesses, perform data matching, and output the actual coordinates of the trajectory intersection. The thickness matching unit is used to extract the theoretical coating thickness and the actual measured coating thickness at the corresponding time based on the actual coordinates of the trajectory intersection point, and output the actual matching result.

9. The intelligent management system for PET release film manufacturing according to claim 8, characterized in that, The parameter verification module includes: The coating compensation unit is used to retrieve the theoretical coating thickness and the actual measured coating thickness, calculate the difference between the two, and output the corresponding compensation and correction parameters based on the difference. The data acquisition time extraction unit is used to extract the actual coordinates and theoretical coordinates of the trajectory intersection points from the actual matching results, and to determine the corresponding data acquisition time. The tension correction unit is used to calculate the positional offset during this period based on the difference in data acquisition time and the conveying speed of the substrate, and outputs tension correction parameters based on the positional offset.

10. The intelligent management system for PET release film manufacturing according to claim 6, characterized in that, The system also includes constructing a lateral thickness prediction function based on the thickness of the first substrate, outputting a lateral prediction curve of the substrate thickness, and determining whether there is a thickness anomaly in the non-measured area of ​​the substrate based on the lateral prediction curve.

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