Equipment testing method, equipment testing device, electronic equipment and storage medium

Abstract

The invention relates to an equipment testing method, an equipment testing device, electronic equipment and a storage medium. The device testing method comprises the steps of determining a to-be-tested device type of a to-be-tested device in response to a received device testing instruction; and determining a first target test parameter corresponding to the type of the to-be-tested device according to the corresponding relationship between the device type and the test parameter. And under the condition that the test parameter is the first target test parameter, performing a radio frequency test on the to-be-tested device, and generating a test result, the radio frequency test comprising a test item realized by automatically adjusting a test level, and the test level comprising an initial test level and a test level change value. According to the invention, the equipment testing method for the terminal equipment with the satellite communication capability is provided, and the efficiency and accuracy of equipment testing can be improved.

Description

Technical Field

[0001] This disclosure relates to the field of communication technology, and in particular to equipment testing methods, equipment testing apparatus, electronic devices, and storage media. Background Technology

[0002] With the rise of satellite communication technology, some smart terminal devices have begun to support satellite communication services. Given that different countries and regions have different regulations for smart devices supporting satellite communication services, industry professionals need to conduct various tests on these devices to obtain test data that reflects their communication capabilities (such as maximum transmit power, bandwidth usage, and frequency tolerance). This allows for further adjustments to the smart devices to ensure their communication capabilities meet the relevant regulations. Summary of the Invention

[0003] To overcome the problems existing in related technologies, this disclosure provides a device testing method, a device testing apparatus, an electronic device, and a storage medium.

[0004] According to a first aspect of the present disclosure, a device testing method is provided, comprising: in response to receiving a device testing instruction, determining a device under test (DUT) type of the device under test; determining a first target test parameter corresponding to the DUT type based on a correspondence between the device type and test parameters; and performing radio frequency (RF) testing on the DUT and generating test results when the test parameter is the first target test parameter, wherein the RF testing includes test items implemented by automatically adjusting test levels, and the test levels include an initial test level and a test level change value.

[0005] In some implementations, the step of performing radio frequency testing on the device under test and generating test results includes: performing level testing based on a preset packet loss rate threshold, an initial test level, and a test level change value, and generating level test results.

[0006] In some implementations, the step of performing radio frequency testing on the device under test and generating test results further includes: performing transmission tests using the corresponding test path for each test item in the preset test item set, and obtaining transmission test results.

[0007] In some implementations, the preset test item set includes one or more of the following test items: maximum transmit power test, occupied bandwidth test, frequency tolerance test, vector error amplitude test, adjacent channel power leakage suppression test, power control test, switching test, time template test, equivalent isotropic radiated power test, occupied bandwidth test, instrument environment switching test, spurious emission test, and spectrum emission template test.

[0008] In some implementations, the initial test level includes an initial power level and an initial interference level, and the test level change value includes a power level change value and an interference level change value. Based on a preset packet loss rate threshold, the initial test level, and the test level change value, a level test is performed to generate a level test result, including: performing a sensitivity level test based on the packet loss rate threshold, the initial power level, and the power level change value, and generating a sensitivity level test result; and / or performing a blocking level test based on the packet loss rate threshold, the initial interference level, and the interference level change value, and generating a blocking level test result.

[0009] In some embodiments, the power level change value includes a first power level change value, a second power level change value, and a third power level change value, wherein the first power level change value is greater than the second power level change value, and the second power level change value is greater than the third power level change value; a sensitivity level test is performed based on the packet loss rate threshold, the initial power level, and the power level change value to generate a sensitivity level test result, including: sending a first initial test signal to the device under test based on the initial power level, and obtaining a first initial packet loss rate corresponding to the first initial test signal; obtaining a first power level based on the first initial packet loss rate, the second power level change value, the packet loss rate threshold, and the initial power level, wherein the first packet loss rate corresponding to the first power level is greater than the packet loss rate threshold; adjusting the first power level based on the first packet loss rate, the first power level change value, the third power level change value, and the packet loss rate threshold to obtain a second power level, wherein the second packet loss rate corresponding to the second power level is greater than the packet loss rate threshold; and determining the sensitivity level test result by summing the second power level and the third power level change value.

[0010] In some implementations, obtaining the first power level based on the first initial packet loss rate, the second power level change value, the packet loss rate threshold, and the initial power level includes: determining the initial power level as the first power level in response to the first initial packet loss rate being greater than the packet loss rate threshold; adjusting the initial power level down based on the second power level change value in response to the first initial packet loss rate being less than or equal to the packet loss rate threshold to obtain a first adjusted power level, and determining the packet loss rate corresponding to the first adjusted power level; and determining the first adjusted power level as the first power level when the packet loss rate corresponding to the first adjusted power level is greater than the packet loss rate threshold.

[0011] In some embodiments, adjusting the first power level based on the first packet loss rate, the first power level change value, the third power level change value, and the packet loss rate threshold to obtain a second power level includes: increasing the first power level based on the first power level change value to obtain a first increased power level; determining a third packet loss rate corresponding to the first increased power level; determining the first increased power level as the second power level in response to the third packet loss rate being greater than the packet loss rate threshold; decreasing the first increased power level based on the third power level change value in response to the third packet loss rate being less than or equal to the packet loss rate threshold to obtain a second decreased power level; determining the packet loss rate corresponding to the second decreased power level; and determining the second decreased power level as the second power level when the packet loss rate corresponding to the second decreased power level is greater than the packet loss rate threshold.

[0012] In some implementations, the step of performing a blocking level test based on the packet loss rate threshold, the initial interference level, and the interference level change value to generate a blocking level test result includes: sending a second initial test signal to the device under test based on the initial interference level, and obtaining a second initial packet loss rate corresponding to the second initial test signal; obtaining a first interference level based on the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level, wherein a fourth packet loss rate corresponding to the first interference level is greater than the packet loss rate threshold; and determining the difference between the first interference level and the interference level change value as the blocking level test result.

[0013] In some embodiments, obtaining the first interference level based on the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level includes: determining the initial interference level as the first interference level in response to the second initial packet loss rate being greater than the packet loss rate threshold; increasing the initial interference level based on the interference level change value in response to the second initial packet loss rate being less than or equal to the packet loss rate threshold to obtain an increased interference level, and determining the packet loss rate corresponding to the increased interference level; and determining the increased interference level as the first interference level if the packet loss rate corresponding to the increased interference level is greater than the packet loss rate threshold.

[0014] According to a second aspect of the present disclosure, a device testing apparatus is provided, comprising: a device type determination unit, configured to determine the device under test (DUT) type of the device under test in response to receiving a device test instruction; a test parameter determination unit, configured to determine a first target test parameter corresponding to the DUT type based on a correspondence between the device type and test parameters; and a radio frequency (RF) test unit, configured to perform RF testing on the DUT when the test parameter is the first target test parameter, and generate test results, wherein the RF testing includes test items implemented by automatically adjusting the test level, and the test level includes an initial test level and a test level change value.

[0015] In some implementations, the RF test unit performs RF testing on the device under test and generates test results in the following manner: based on a preset packet loss rate threshold, an initial test level, and a test level change value, it performs a level test and generates a level test result.

[0016] In some implementations, the radio frequency test unit performs radio frequency testing on the device under test and generates test results in the following manner: for each test item in the preset test item set, a transmission test is performed using the corresponding test path, and the transmission test results are obtained.

[0017] In some implementations, the preset test item set includes one or more of the following test items: maximum transmit power test, occupied bandwidth test, frequency tolerance test, vector error amplitude test, adjacent channel power leakage suppression test, power control test, switching test, time template test, equivalent isotropic radiated power test, occupied bandwidth test, instrument environment switching test, spurious emission test, and spectrum emission template test.

[0018] In some implementations, the initial test level includes an initial power level and an initial interference level, and the test level change value includes a power level change value and an interference level change value. The RF test unit performs level tests and generates level test results based on a preset packet loss rate threshold, the initial test level, and the test level change value in the following manner: performs sensitivity level tests based on the packet loss rate threshold, the initial power level, and the power level change value, and generates sensitivity level test results; and / or performs blocking level tests based on the packet loss rate threshold, the initial interference level, and the interference level change value, and generates blocking level test results.

[0019] In some embodiments, the power level change value includes a first power level change value, a second power level change value, and a third power level change value, wherein the first power level change value is greater than the second power level change value, and the second power level change value is greater than the third power level change value; the RF test unit performs sensitivity level testing using the packet loss rate threshold, the initial power level, and the power level change value in the following manner, generating a sensitivity level test result: a first initial test signal is sent to the device under test based on the initial power level, and a first initial packet loss rate corresponding to the first initial test signal is obtained; a first power level is obtained based on the first initial packet loss rate, the second power level change value, the packet loss rate threshold, and the initial power level, wherein the first packet loss rate corresponding to the first power level is greater than the packet loss rate threshold; the first power level is adjusted based on the first packet loss rate, the first power level change value, the third power level change value, and the packet loss rate threshold to obtain a second power level, wherein the second packet loss rate corresponding to the second power level is greater than the packet loss rate threshold; the sum of the second power level and the third power level change value is determined as the sensitivity level test result.

[0020] In some implementations, the radio frequency test unit obtains a first power level based on the first initial packet loss rate, the second power level change value, the packet loss rate threshold, and the initial power level in the following manner: In response to the first initial packet loss rate being greater than the packet loss rate threshold, the initial power level is determined as the first power level; in response to the first initial packet loss rate being less than or equal to the packet loss rate threshold, the initial power level is lowered based on the second power level change value to obtain a first lowered power level, and the packet loss rate corresponding to the first lowered power level is determined; if the packet loss rate corresponding to the first lowered power level is greater than the packet loss rate threshold, the first lowered power level is determined as the first power level.

[0021] In some implementations, the radio frequency test unit adjusts the first power level to obtain a second power level based on the first packet loss rate, the first power level change value, the third power level change value, and the packet loss rate threshold as follows: The first power level is increased based on the first power level change value to obtain a first increased power level; a third packet loss rate corresponding to the first increased power level is determined; in response to the third packet loss rate being greater than the packet loss rate threshold, the first increased power level is determined as the second power level; in response to the third packet loss rate being less than or equal to the packet loss rate threshold, the first increased power level is decreased based on the third power level change value to obtain a second decreased power level; the packet loss rate corresponding to the second decreased power level is determined; and if the packet loss rate corresponding to the second decreased power level is greater than the packet loss rate threshold, the second decreased power level is determined as the second power level.

[0022] In some implementations, the RF test unit performs a blocking level test based on the packet loss rate threshold, the initial interference level, and the interference level change value, and generates a blocking level test result as follows: A second initial test signal is sent to the device under test based on the initial interference level, and a second initial packet loss rate corresponding to the second initial test signal is obtained; a first interference level is obtained based on the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level, wherein a fourth packet loss rate corresponding to the first interference level is greater than the packet loss rate threshold; the difference between the first interference level and the interference level change value is determined as the blocking level test result.

[0023] In some embodiments, the radio frequency test unit obtains a first interference level based on the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level in the following manner: In response to the second initial packet loss rate being greater than the packet loss rate threshold, the initial interference level is determined as the first interference level; in response to the second initial packet loss rate being less than or equal to the packet loss rate threshold, the initial interference level is increased based on the interference level change value to obtain an increased interference level, and the packet loss rate corresponding to the increased interference level is determined; if the packet loss rate corresponding to the increased interference level is greater than the packet loss rate threshold, the increased interference level is determined as the first interference level.

[0024] According to a third aspect of the present disclosure, an electronic device is provided, comprising: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to: execute the test method described in the first aspect or any of the embodiments of the first aspect.

[0025] According to a fourth aspect of the present disclosure, a storage medium is provided, the storage medium storing instructions that, when executed by a processor, enable the processor to perform the device testing method described in the first aspect or any of the embodiments of the first aspect.

[0026] The technical solutions provided by the embodiments of this disclosure can include the following beneficial effects: After receiving a device test instruction, the device under test (DUT) type is determined. Based on the correspondence between device type and test parameters, a first target test parameter corresponding to the DUT type is determined. The test parameters are adjusted to the first target test parameter, and with the test parameters set to the first target test parameter, radio frequency (RF) testing is performed on the DUT, generating test results. The RF test includes test items implemented by automatically adjusting the test level, and the test level includes an initial test level and test level variation values. Through this disclosure, automated testing of the satellite communication capabilities of terminal devices is achieved, reducing time and labor costs, avoiding errors caused by manual testing, thereby improving the efficiency and accuracy of device testing.

[0027] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0028] The accompanying drawings, which are incorporated in and form a part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure.

[0029] Figure 1 This is a flowchart illustrating a device testing method according to an exemplary embodiment.

[0030] Figure 2 This is a schematic diagram of a connection method between a test system and a device under test according to an exemplary embodiment of the present disclosure. Figure 1 .

[0031] Figure 3 This is a flowchart illustrating a method for performing radio frequency testing on a device under test and generating test results according to an exemplary embodiment.

[0032] Figure 4 This is a flowchart illustrating a method for performing radio frequency testing on a device under test and generating test results according to another exemplary embodiment.

[0033] Figure 5 This is a schematic diagram of a connection method between a test system and a device under test according to an exemplary embodiment of the present disclosure. Figure 2 .

[0034] Figure 6This is a schematic diagram of a connection method between a test system and a device under test according to an exemplary embodiment of the present disclosure. Figure 3 .

[0035] Figure 7 This is a schematic diagram of a connection method between a test system and a device under test according to an exemplary embodiment of the present disclosure. Figure 4 .

[0036] Figure 8 This is a schematic diagram of a connection method between a test system and a device under test according to an exemplary embodiment of the present disclosure. Figure 5 .

[0037] Figure 9 This is a flowchart illustrating a method for performing a level test and generating a level test result according to an exemplary embodiment.

[0038] Figure 10 This is a flowchart illustrating a method for performing a sensitivity level test and generating a sensitivity level test result according to an exemplary embodiment.

[0039] Figure 11 This is a flowchart illustrating a method for obtaining a first power level according to an exemplary embodiment.

[0040] Figure 12 This is a flowchart illustrating a method for adjusting a first power level and obtaining a second power level according to an exemplary embodiment.

[0041] Figure 13 This is a flowchart illustrating a method for performing a blocking level test and generating blocking level test results according to an exemplary embodiment.

[0042] Figure 14 This is a flowchart illustrating a method for obtaining a first interference level according to an exemplary embodiment.

[0043] Figure 15 This is a flowchart illustrating a device testing method according to an exemplary embodiment of the present disclosure.

[0044] Figure 16 This is a block diagram illustrating a device testing apparatus according to an exemplary embodiment.

[0045] Figure 17 This is a block diagram illustrating an apparatus for device testing according to an exemplary embodiment.

[0046] Figure 18 This is a block diagram illustrating an apparatus for device testing according to an exemplary embodiment. Detailed Implementation

[0047] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure.

[0048] The device testing method provided in this disclosure is applied to scenarios where terminal devices with satellite communication capabilities are tested.

[0049] With the rise of satellite communication, some smart terminal devices have begun to support satellite communication services. However, different countries and regions have specific rules and requirements for smart devices that support satellite communication services, such as specific requirements for the services, functions, performance, protocols, and interfaces of smart devices.

[0050] In related technologies, given the various requirements of different countries and regions for smart devices supporting satellite communication services, manufacturers of smart devices need to conduct various tests to obtain test data that reflects the satellite communication capabilities of the smart devices. This allows manufacturers to make further adjustments to the smart devices, ensuring that their communication capabilities meet the relevant regulations. For example, test data may characterize the smart device's maximum transmit power, occupied bandwidth and frequency tolerance, sensitivity level, etc., which are indicators of the smart device's satellite communication capabilities.

[0051] Currently, according to relevant regulations, many satellite communication test cases for smart terminals are manually tested using independent testing instruments. However, the regulations require numerous tests, and the instrument connection methods and test environment setups vary significantly between different test items. Furthermore, the connection methods and setups for different test devices also differ, making the test setup complex and cumbersome. These factors pose challenges to manual testing, leading to low efficiency. In addition, manual testing is prone to errors due to human error, resulting in test results that deviate from the actual device conditions. Frequent environmental changes also place stringent requirements on consumables such as coaxial cables and the test sockets for the device under test. Extensive manual data review further increases labor and time costs. In summary, manually testing smart devices supporting satellite communication services suffers from low efficiency, high labor and time costs, and a high susceptibility to test errors.

[0052] In view of this, this disclosure proposes a device testing method. Upon receiving a device testing instruction, the device under test (DUT) type is determined. Based on the correspondence between device type and test parameters, a first target test parameter corresponding to the DUT type is determined. The test parameters are adjusted to the first target test parameter, and with the test parameters set to the first target test parameter, radio frequency (RF) testing is performed on the DUT, generating test results. The RF testing includes test items implemented by automatically adjusting test levels, and the test levels include an initial test level and test level variation values.

[0053] Figure 1 This is a flowchart illustrating a device testing method according to an exemplary embodiment. Figure 1 As shown, the method includes the following steps.

[0054] In step S101, in response to receiving a device test instruction, the device under test type of the device to be tested is determined.

[0055] In step S102, the first target test parameter corresponding to the type of device under test is determined according to the correspondence between device type and test parameters.

[0056] In step S103, when the test parameters are the first target test parameters, the device under test is subjected to radio frequency (RF) testing and test results are generated. The RF test includes test items implemented by automatically adjusting the test level. The test level includes the initial test level and the test level change value.

[0057] In this embodiment of the disclosure, after the automated test system receives a device test instruction, it determines the type of the device under test (DUT). Based on the correspondence between the device type and test parameters, a first target test parameter is set for the current device. After the test parameters are set, the DUT undergoes radio frequency (RF) testing, including tests implemented by adjusting the power level, and test results are generated. The RF test includes... By automatically executing test procedures such as power level adjustment on the DUT through the automated test system, time and labor costs are avoided, and errors caused by manual testing are avoided, thereby improving the efficiency and accuracy of device testing. For example, the first target test parameter is a pre-set test parameter for the type of DUT; the first target test parameter can also be a default test parameter for an unknown type of DUT.

[0058] In an exemplary embodiment of this disclosure, such as Figure 2 A schematic diagram of the connection method between the test system and the device under test. Figure 1As shown, the automated testing system for performing equipment testing methods in this disclosure includes a terminal, a shielded box, a comprehensive tester, a signal source, a spectrum analyzer, multiple attenuators, switches, notch filters, and power dividers for executing the testing process. The terminal can be a computer terminal (PC). When testing the device under test (DUT) using the aforementioned automated testing system, the DUT is placed in a shielded box to shield the testing process from external signal interference. The PC controls the entire testing system, setting test parameters and adjusting the test circuitry. The comprehensive tester, signal source, spectrum analyzer, attenuators, and notch filters receive control from the PC to achieve automated testing for different test items. The power divider and switches receive control from the PC to adaptively adjust the test circuitry.

[0059] In this disclosure, during device testing of electronic equipment, there are test items that require frequent adjustment of the test level to obtain the test results. For the corresponding test items, this disclosure presets a packet loss rate threshold, an initial test level, and a test level change value. Based on the packet loss rate threshold, the initial test level, the test level change value, and preset test logic, automatic adjustment can be achieved to obtain the test results. The following embodiments of this disclosure describe a method for performing radio frequency testing and generating test results.

[0060] Figure 3 This is a flowchart illustrating a method for performing radio frequency (RF) testing on a device under test and generating test results, according to an exemplary embodiment. Figure 3 As shown, the method includes the following steps.

[0061] In step S201, based on the correspondence between device type and test parameters, a first target test parameter corresponding to the type of device under test is determined, and the test parameter is set as the first target test parameter.

[0062] In step S202, a level test is performed based on a preset packet loss rate threshold, an initial test level, and a test level change value, and a level test result is generated.

[0063] In this embodiment, for test items that require frequent adjustment of the test level to obtain level test results, a packet loss rate threshold, an initial test level, and a test level change value are preset. The initial test level is the initial input test parameter, and the test level change value is a fixed parameter that is sequentially adjusted based on the initial input test parameter. An intermediate test result is obtained for both the initial test parameter and the test parameter after each adjustment. The packet loss rate threshold is a preset parameter used to judge the intermediate test result. In summary, this disclosure, through the preset packet loss rate threshold, initial test level, test level change value, and preset control logic, achieves automatic sequential testing of the test process. This solves the problems of high manpower and time costs, and human error in test results associated with traditional manual testing solutions, thereby reducing time and manpower costs and improving the efficiency and accuracy of equipment testing.

[0064] It is understood that when performing RF testing on a device under test (DUT), the signal transmission (TX) and signal reception (RX) capabilities are typically tested. This disclosure provides a preset set of test items for the DUT's transmission capability. By performing tests on the items included in this set, test results characterizing its signal transmission capability are obtained. The following embodiments of this disclosure further illustrate the method for performing RF testing and generating test results.

[0065] Figure 4 This is a flowchart illustrating a method for performing radio frequency testing on a device under test and generating test results according to another exemplary embodiment. For example... Figure 4 As shown, the method includes the following steps.

[0066] In step S301, based on the correspondence between device type and test parameters, a first target test parameter corresponding to the type of device under test is determined, and the test parameter is set as the first target test parameter.

[0067] In step S302, for each test item in the preset test item set, a transmission test is performed using the corresponding test path to obtain the transmission test results.

[0068] In this embodiment, each test item in the preset test item set is tested separately, and the transmission test results characterizing the signal transmission capability of the device under test are obtained. It is understood that the required test instruments may differ for different test items in the preset test item set. Therefore, the automated test system corresponding to the automated test method of this disclosure integrates the test instruments required for testing different test items, and sets different connection methods for different test items. The automated test system of this disclosure also includes a power divider, attenuator, notch filter, and switch for adjusting the connection method, thereby switching the connection method of the test system to the corresponding test path when testing a specific item. This achieves automated testing of the signal transmission capability of the device under test, avoiding the tedious steps required for manually adjusting the test environment and avoiding errors that may be caused by manual settings, thereby reducing time and labor costs and improving the efficiency and accuracy of equipment testing.

[0069] It is understood that, based on different testing requirements, this disclosure may set different test items in the preset test item set. The following embodiments of this disclosure illustrate the preset test item set in this disclosure.

[0070] In one embodiment of this disclosure, the preset test item set includes one or more of the following test items: maximum transmit power test, occupied bandwidth test, frequency tolerance test, vector error amplitude test, adjacent channel power leakage suppression test, power control test, switching test, time template test, equivalent isotropic radiated power test, occupied bandwidth test, instrument environment switching test, spurious emission test, and spectrum emission template test.

[0071] In this embodiment of the disclosure, the test items included in the preset test item set can be pre-set based on the equipment testing requirements, and one or more of the above test items can be selected to constitute the preset test item set. In one example, when performing general RF testing on the device under test, the test items included in the preset test item set may be: maximum transmit power test, occupied bandwidth test, frequency tolerance test, vector error amplitude test, adjacent channel power leakage suppression test, power control test, switching test, or time template test. In another example, when performing type approval RF testing on the device under test, the test items included in the preset test item set may be: equivalent isotropic radiated power test, occupied bandwidth test, frequency tolerance test, instrument environment switching test, spurious emission test, and spectrum emission template test.

[0072] In this embodiment, corresponding test paths are set for different test items included in the preset test item set. That is, for different test items, the automated testing system of this disclosure can automatically set up the corresponding test equipment and test paths. The automated testing system of this disclosure is equipped with components such as power dividers and switches for adjusting the connection methods between different test devices, thereby switching the connection method of the testing system to the test path corresponding to the specific test item when testing it. This achieves automated testing of the signal transmission capability of the device under test, avoiding the tedious steps required for manual adjustment of the test environment and avoiding errors that may be caused by manual settings, thereby reducing time and labor costs and improving the efficiency and accuracy of equipment testing.

[0073] In an exemplary embodiment of this disclosure, for possible tests such as maximum transmit power testing, occupied bandwidth testing, frequency tolerance testing, vector error amplitude testing, adjacent channel power leakage suppression testing, reference sensitivity level testing, frequency tolerance testing, power control testing, switching testing, or time template testing, the following methods can be used: Figure 5 A schematic diagram of the connection method between the test system and the device under test. Figure 2 The connection method shown is used for testing. The device under test (DUT) is placed in a shielded box, and the DUT is tested using a comprehensive test instrument, attenuator, and computer terminal (PC). For potential equivalent isotropic radiated power testing, occupied bandwidth testing, etc., methods such as... Figure 6 A schematic diagram of the connection method between the test system and the device under test. Figure 3 The connection method shown is used for testing. The device under test (DUT) is placed in a shielded box, and the DUT is tested using a comprehensive test instrument, attenuator, notch filter, spectrum analyzer, switch, power divider, and computer terminal. For potential spurious emission testing and spectrum emission template testing, methods such as... Figure 7 A schematic diagram of the connection method between the test system and the device under test. Figure 4 The connection method shown is used for testing. The device under test (DUT) is placed in a shielded box, and the DUT is tested using a comprehensive tester, attenuator, notch filter, spectrum analyzer, switch, power divider, and computer terminal. For potential receiver blocking level testing, the following methods can be used: Figure 8 A schematic diagram of the connection method between the test system and the device under test. Figure 5 The connection method shown is used for testing. The device under test is placed in a shielded box, and the device under test is tested using a comprehensive tester, attenuator, notch filter, signal source, power divider, and computer terminal.

[0074] In this embodiment of the disclosure, the test items implemented by automatically adjusting the test level include sensitivity level testing and blocking level testing. When performing sensitivity level testing, the initial test level is the initial power level, and the test level change value is the power level change value. When performing blocking level testing, the initial test level is the initial interference level, and the test level change value is the interference level change value. The following embodiments of this disclosure further illustrate the method for performing level tests and generating level test results.

[0075] Figure 9 This is a flowchart illustrating a method for performing a level test and generating a level test result according to an exemplary embodiment. Figure 9 As shown, the method includes the following steps.

[0076] In step S401, based on the correspondence between device type and test parameters, a first target test parameter corresponding to the type of device under test is determined, and the test parameter is set as the first target test parameter.

[0077] In step S402A, a sensitivity level test is performed based on the packet loss rate threshold, the initial power level, and the power level change value, and a sensitivity level test result is generated.

[0078] In step S402B, a blocking level test is performed based on the packet loss rate threshold, the initial interference level, and the interference level change value, and a blocking level test result is generated.

[0079] Steps S402A and S402B can be executed individually or simultaneously.

[0080] In this embodiment of the disclosure, the test items implemented by automatically adjusting the test level include sensitivity level testing based on a packet loss rate threshold, an initial power level, and a power level change value, and blocking level testing based on a packet loss rate threshold, an initial interference level, and an interference level change value. When testing the device under test, only sensitivity level testing or blocking level testing can be performed on the device under test, or both sensitivity level testing and blocking level testing can be performed on the device under test separately.

[0081] In this embodiment, when performing sensitivity level testing on the device under test, the initial power level is the initial input test parameter, and the power level change value is a fixed parameter that is sequentially adjusted based on the initial input test parameter. For both the initial test parameter and the test parameter after each adjustment, an intermediate parameter is obtained for comparison with the packet loss rate threshold. If the intermediate parameter does not meet the requirements, the adjustment continues based on the power level change value. If the intermediate parameter meets the requirements, the final sensitivity level test result can be obtained. In summary, this disclosure achieves automatic sequential testing of the sensitivity level test process through preset packet loss rate threshold, initial power level, power level change value, and preset control logic. This solves the problems of high manpower and time costs, and human error in test results in traditional manual testing schemes, thereby reducing time and manpower costs and improving the efficiency and accuracy of equipment testing.

[0082] Similarly, in this disclosure, when performing blocking level testing on the device under test, the initial interference level is the initial input test parameter, and the interference level change value is a fixed parameter that is sequentially adjusted based on the initial input test parameter. For both the initial test parameter and the test parameter after each adjustment, an intermediate parameter is obtained for comparison with the packet loss rate threshold. If the intermediate parameter does not meet the requirements, the adjustment continues based on the interference level change value. If the intermediate parameter meets the requirements, the final blocking level test result can be obtained. In summary, this disclosure achieves automatic sequential testing of the blocking level test process through preset packet loss rate threshold, initial interference level, interference level change value, and preset control logic. This solves the problems of high manpower and time costs, and human error in test results in traditional manual testing schemes, thereby reducing time and manpower costs and improving the efficiency and accuracy of equipment testing.

[0083] In this embodiment, a sensitivity level test is performed based on a preset packet loss rate threshold and a power level change value to obtain a sensitivity level test result characterizing the signal transmission capability of the device under test. The power level of the device under test is continuously adjusted by the power level change value and the preset packet loss rate threshold to ultimately obtain the target power level under preset conditions.

[0084] In this embodiment of the disclosure, when performing sensitivity level testing on the device under test, the power level change value includes multiple different power level change values, namely a first power level change value, a second power level change value, and a third power level change value. The first power level change value is greater than the second power level change value and also greater than the third power level change value. The second power level change value is greater than the third power level change value. Therefore, by using different power level change values, sensitivity level testing of the device under test with different accuracies can be achieved. The following embodiments of this disclosure describe the method for obtaining sensitivity level test results.

[0085] Figure 10 This is a flowchart illustrating a method for performing a sensitivity level test and generating a sensitivity level test result according to an exemplary embodiment. Figure 10 As shown, the method includes the following steps.

[0086] In step S501, a first initial test signal is sent to the device under test according to the initial power level, and the first initial packet loss rate corresponding to the first initial test signal is obtained.

[0087] In step S502, a first power level is obtained based on a first initial packet loss rate, a second power level change value, a packet loss rate threshold, and an initial power level. The first packet loss rate corresponding to the first power level is greater than the packet loss rate threshold.

[0088] In step S503, the first power level is adjusted according to the first packet loss rate, the first power level change value, the third power level change value, and the packet loss rate threshold to obtain the second power level. The second packet loss rate corresponding to the second power level is greater than the packet loss rate threshold.

[0089] In step S504, the sum of the changes in the second power level and the third power level is determined as the sensitivity level test result.

[0090] In this embodiment of the disclosure, during sensitivity level testing, the critical power level corresponding to a packet loss rate that is exactly less than a packet loss rate threshold is obtained as the final sensitivity level test result. Based on this, this disclosure combines a first initial packet loss rate, a second power level change value, a packet loss rate threshold, and an initial power level to perform a coarse scan phase of sensitivity level testing, obtaining a first power level corresponding to a packet loss rate greater than the packet loss rate threshold. Then, combining the first packet loss rate, a first power level change value, a third power level change value, and the packet loss rate threshold, the first power level is adjusted to perform a fine scan phase of sensitivity level testing, obtaining a second power level corresponding to a packet loss rate greater than the packet loss rate threshold. The second power level is the critical power level corresponding to a packet loss rate that is exactly greater than the packet loss rate threshold. Combining the second power level and a third power level change value used to adjust the power level, the critical power level corresponding to a packet loss rate that is exactly less than the packet loss rate threshold can be obtained, i.e., the sensitivity level test result is obtained.

[0091] In this embodiment, during sensitivity level testing, the corresponding instrument sends out a corresponding power level based on the initial power level set by the user. A first initial packet loss rate corresponding to the initial power level is obtained. By comparing the first initial packet loss rate with a packet loss rate threshold, and adjusting the initial power level using a relatively large second power level change value, a first power level greater than the packet loss rate threshold is obtained, achieving a sensitivity level test with lower accuracy. Then, based on the first packet loss rate, a third power level change value, the packet loss rate threshold, and a relatively small third power level change value, the first power level is adjusted to obtain a second power level greater than the packet loss rate threshold. The second power level and the change value of the third power level are used as the sensitivity level test result, achieving a higher accuracy sensitivity level test. This disclosure obtains a sensitivity level test result that accurately reflects the device's signal transmission capability through a coarse scan based on the second power level change value and a fine scan based on the third power level change value. Furthermore, through preset adjustment parameters and control logic, the sensitivity level test process is automatically executed, solving the problems of high manpower and time costs, and human error in test results associated with traditional manual testing schemes. This reduces time and manpower costs and improves the efficiency and accuracy of equipment testing. The initial power level can be a pre-set initial power level for a known type of device under test (DUT), or a different initial power level can be set for different types of DUTs. Alternatively, the initial power level can be the default initial power level for an unknown type of DUT.

[0092] In an exemplary embodiment of this disclosure, the packet loss rate threshold can be set to 0.1%, the first power level change value can be set to 2dB, the second power level change value can be set to 1dB, and the third power level change value can be set to 0.5dB.

[0093] The following embodiments of this disclosure illustrate a method for adjusting an initial power level to obtain a first power level.

[0094] Figure 11 This is a flowchart illustrating a method for obtaining a first power level according to an exemplary embodiment. Figure 11 As shown, the method includes the following steps.

[0095] In step S601, a first initial test signal is sent to the device under test according to the initial power level, and the first initial packet loss rate corresponding to the first initial test signal is obtained.

[0096] In step S602A, in response to the first initial packet loss rate being greater than the packet loss rate threshold, the initial power level is determined as the first power level.

[0097] In step S602B, in response to the first initial packet loss rate being less than or equal to the packet loss rate threshold, the initial power level is lowered according to the second power level change value to obtain the first lowered power level, and the packet loss rate corresponding to the first lowered power level is determined. If the packet loss rate corresponding to the first lowered power level is greater than the packet loss rate threshold, the first lowered power level is determined as the first power level.

[0098] Among them, steps S602A and S602B are optional steps to be executed.

[0099] In this embodiment, if the initial packet loss rate is greater than a packet loss rate threshold, it is considered that the initial packet loss rate has met the preset requirements, and the initial power level corresponding to the initial packet loss rate is determined as the first power level. If the initial packet loss rate is less than or equal to the packet loss rate threshold, it is considered that the initial power level has not met the preset requirements, and the initial power level is lowered according to the second power level change value to obtain the first lowered power level. For the first lowered power level, the relationship between its corresponding packet loss rate and the packet loss rate threshold is determined. If the packet loss rate corresponding to the first lowered power level is greater than the packet loss rate threshold, the first lowered power level is determined as the first power level. Through this disclosure, a lower-precision sensitivity level test is performed on the device under test to obtain a first power level that meets the requirements, which facilitates a higher-precision sensitivity level test on the first power level in subsequent processes to obtain accurate sensitivity level test results.

[0100] The following embodiments of this disclosure illustrate a method for adjusting a first power level to obtain a second power level.

[0101] Figure 12 This is a flowchart illustrating a method for adjusting a first power level and obtaining a second power level according to an exemplary embodiment. Figure 12 As shown, the method includes the following steps.

[0102] In step S701, the first power level is increased according to the change value of the first power level to obtain the first increased power level.

[0103] In step S702, the third packet loss rate corresponding to the first power level after adjustment is determined.

[0104] In step S703A, in response to the third packet loss rate being greater than the packet loss rate threshold, the first up-adjusted power level is determined as the second power level.

[0105] In step S703B, in response to the third packet loss rate being less than or equal to the packet loss rate threshold, the first adjusted power level is lowered according to the third power level change value to obtain the second adjusted power level. The packet loss rate corresponding to the second adjusted power level is determined. If the packet loss rate corresponding to the second adjusted power level is greater than the packet loss rate threshold, the second adjusted power level is determined as the second power level.

[0106] Among them, steps S703A and S703B are optional steps to be executed.

[0107] In this embodiment, after obtaining a first power level through a low-precision sensitivity level test, the first power level is increased based on the change value of the first power level to obtain a first increased power level, and a third packet loss rate corresponding to the first increased power level is determined. If the third packet loss rate is greater than a packet loss rate threshold, the first increased power level is considered to meet a preset requirement, and the first increased power level is determined as the second power level. If the third packet loss rate is less than or equal to the packet loss rate threshold, the first increased power level is considered not to meet the preset requirement, and the first increased power level is decreased again based on the change value of the third power level to obtain a second decreased power level. For the second decreased power level, the relationship between its corresponding packet loss rate and the packet loss rate threshold is determined. If the packet loss rate corresponding to the second decreased power level is greater than the packet loss rate threshold, the second decreased power level is determined as the second power level, and the sum of the changes in the second power level and the third power level is determined as the sensitivity level test result. This disclosure provides a highly accurate sensitivity level test for the device under test (DUT), obtaining a second power level with high precision. Specifically, through two stages of coarse and fine scanning, a sensitivity level test result accurately reflecting the device's signal transmission capability is obtained. Furthermore, by using preset adjustment parameters and control logic, the sensitivity level test process is automated, automatically advancing and de-escalating. This solves the problems of high manpower and time costs, and human error in test results associated with traditional manual testing methods, thereby reducing time and labor costs and improving the efficiency and accuracy of equipment testing.

[0108] In this embodiment of the disclosure, a blocking level test can be performed on the device under test based on a preset interference level change value, a packet loss rate threshold, and an initial interference level, and the blocking level test result can be obtained. The following embodiments of this disclosure describe the method for performing a blocking level test to generate blocking level test results.

[0109] The following embodiments of this disclosure illustrate a method for performing a blocking level test to generate blocking level test results.

[0110] Figure 13This is a flowchart illustrating a method for performing a blocking level test and generating blocking level test results according to an exemplary embodiment. Figure 13 As shown, the method includes the following steps.

[0111] In step S801, a second initial test signal is sent to the device under test according to the initial interference level, and the second initial packet loss rate corresponding to the second initial test signal is obtained.

[0112] In step S802, a first interference level is obtained based on the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level. The fourth packet loss rate corresponding to the first interference level is greater than the packet loss rate threshold.

[0113] In step S803, the difference between the first interference level and the interference level change value is determined as the blocking level test result.

[0114] In this embodiment of the disclosure, during the blocking level test, the critical interference level corresponding to a packet loss rate that is exactly less than the packet loss rate threshold is obtained as the final blocking level test result. Based on this, this disclosure combines the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level to perform the blocking level test, and obtains the first interference level corresponding to a packet loss rate that is greater than the packet loss rate threshold. The first interference level is the critical interference level corresponding to a packet loss rate that is exactly greater than the packet loss rate threshold. By combining the first interference level and the interference level change value used to adjust the interference level, the critical interference level corresponding to a packet loss rate that is exactly less than the packet loss rate threshold can be obtained, i.e., the blocking level test result can be obtained.

[0115] In this embodiment, the instrument sends a corresponding second initial interference signal based on the initial interference level set by the user. A corresponding second initial packet loss rate is obtained. The second initial packet loss rate is adjusted based on a comparison between the second initial packet loss rate and a packet loss rate threshold, as well as the change in interference level, to obtain a first interference level greater than the packet loss rate threshold. The difference between the first interference level and the change in interference level is determined as the blocking level test result, thus completing the blocking level test.

[0116] This disclosure achieves automated sequential testing of the blocking level test process by pre-setting interference level change values, packet loss rate thresholds, initial interference levels, and corresponding control logic. This solves the problems of high manpower and time costs, and human error in test results associated with traditional manual testing methods, thereby reducing time and manpower costs and improving the efficiency and accuracy of equipment testing. The initial interference level can be a pre-set initial interference level for blocking level testing by the tester according to testing requirements. Different initial interference levels can be used for different known types of devices under test, while a default initial interference level can be used for unknown types of devices under test.

[0117] The following embodiments further illustrate the method for obtaining the first interference level.

[0118] Figure 14 This is a flowchart illustrating a method for obtaining a first interference level according to an exemplary embodiment. Figure 14 As shown, the method includes the following steps.

[0119] In step S901, a second initial test signal is sent to the device under test according to the initial interference level, and the second initial packet loss rate corresponding to the second initial test signal is obtained.

[0120] In step S902A, in response to the second initial packet loss rate being greater than the packet loss rate threshold, the initial interference level is determined as the first interference level.

[0121] In step S902B, in response to the second initial packet loss rate being less than or equal to the packet loss rate threshold, the initial interference level is increased according to the interference level change value to obtain the increased interference level, and the packet loss rate corresponding to the increased interference level is determined. If the packet loss rate corresponding to the increased interference level is greater than the packet loss rate threshold, the increased interference level is determined as the first interference level.

[0122] Among them, steps S902A and S902B are optional steps to be executed.

[0123] In this embodiment, if the second initial packet loss rate is greater than a packet loss rate threshold, it is considered that the second initial packet loss rate has met the preset requirements, and the initial interference level corresponding to the second initial packet loss rate is determined as the first interference level. If the second initial packet loss rate is less than or equal to the packet loss rate threshold, it is considered that the initial interference level has not met the preset requirements, and the initial interference level is adjusted upward according to the interference level change value to obtain the adjusted interference level. For the adjusted interference level, the relationship between its corresponding packet loss rate and the packet loss rate threshold is determined. If the packet loss rate corresponding to the adjusted interference level is greater than the packet loss rate threshold, the adjusted interference level is determined as the first interference level. Through this disclosure, a lower-precision sensitivity level test is performed on the device under test to obtain a first interference level that meets the requirements, which facilitates a higher-precision sensitivity level test on the first interference level in subsequent processes to obtain accurate sensitivity level test results. By using interference level change values, packet loss rate thresholds, initial interference levels, and corresponding control logic, the blocking level test process is automatically executed, and the blocking level test is automatically probed. This solves the problems of high manpower and time costs, and human error in test results in traditional manual testing schemes, thereby reducing time and manpower costs and improving the efficiency and accuracy of equipment testing.

[0124] In an exemplary embodiment of this disclosure, such as Figure 15As shown in the flowchart of the equipment testing method, equipment testing is conducted in the following manner. In response to the start of equipment testing, general RF testing, type approval RF testing, and network access RF testing are performed on the device under test (DUT). During testing, the instrument environment is first switched according to the DUT's equipment type, i.e., the test parameters are adjusted to the first target parameters and / or the test path of the test system is adjusted. After completing the instrument environment switch, the general RF testing procedure, type approval RF testing procedure, and network access RF testing procedure are performed respectively:

[0125] like Figure 15As shown, when performing a general RF test procedure, signal transmission testing is performed first. Each test item in the preset test item set is tested, and the corresponding transmission test results are obtained. For example, signal transmission testing could be a TX-related test to test the signal transmission capability of the device under test (DUT) when performing satellite communication. Signal transmission testing could involve sequentially using the corresponding test paths to perform maximum transmit power testing, occupied bandwidth testing, frequency tolerance testing, vector error amplitude testing, adjacent channel power leakage suppression testing, power control testing, and switching / time template testing. An initial power level is set based on a reference sensitivity level for sensitivity level testing. For example, sensitivity level testing could include two stages: coarse scan and fine scan. During the coarse scan stage of sensitivity level testing, a packet loss rate test is performed based on the initial power level, i.e., the first initial packet loss rate corresponding to the initial power level is determined. If the first initial packet loss rate is greater than a packet loss rate threshold, the next fine scan stage begins. For example, the packet loss rate threshold could be 0.1%. When the initial packet loss rate is less than or equal to the packet loss rate threshold, the initial power level is automatically lowered by a second power level change value to obtain a first lowered power level. This process continues until the packet loss rate corresponding to the first lowered power level is greater than the packet loss rate threshold, at which point the fine scan phase of the sensitivity level test begins. For example, the second power level change value could be 1 dB. During the fine scan phase of the sensitivity level test, the current power level is first increased by a first power level change value to obtain a first increased power level. For example, the first power level change value could be 2 dB. A packet loss rate test is then performed on the first increased power level to determine a third packet loss rate corresponding to the first increased power level. When the third packet loss rate is greater than the packet loss rate threshold, the sum of the first increased power level and the third power level change value is taken as the sensitivity level test result. When the third packet loss rate is less than or equal to the packet loss rate threshold, the third power level change value is automatically adjusted down after the first adjustment to obtain the second adjusted power level. This process continues until the packet loss rate corresponding to the second adjusted power level is greater than the packet loss rate threshold. The sum of the second adjusted power level and the third power level change value is used as the sensitivity level test result. Given that the fine scan stage has higher test accuracy, the third power level change value used in the fine scan stage is less than the second power level change value used in the coarse scan stage. For example, the third power level change value can be 0.5dB.

[0126] like Figure 15As shown, during the type approval RF test, each test item in the second preset test item set is tested sequentially using the corresponding test paths. This includes equivalent omnidirectional radiated power testing, occupied bandwidth testing, frequency tolerance testing, instrument environment switching testing, spurious emission testing, and spectrum emission template testing, obtaining the corresponding second transmission test results. For the blocking level test, the instrument environment is switched, the first target test parameter is adjusted to the target test parameter corresponding to the blocking level test, and the blocking level test process is entered. The initial interference level after the instrument environment switch is obtained, and a packet loss rate test is performed based on the initial interference level to determine the second initial packet loss rate corresponding to the initial interference level. When the second initial packet loss rate is greater than the packet loss rate threshold, the difference between the initial interference level and the change in interference level is taken as the blocking level test result. When the initial packet loss rate is less than or equal to the packet loss rate threshold, the initial interference level is automatically increased by the interference level change value to obtain the increased interference level. If the packet loss rate corresponding to the increased interference level is greater than the packet loss rate threshold, the difference between the increased interference level and the interference level change value is used as the blocking level test result. For example, the interference level change value can be 1dB.

[0127] like Figure 15 As shown, when performing network access RF testing, blocking level testing and sensitivity level testing are performed on the device under test to obtain blocking level test results and sensitivity level test results. The test procedures for blocking level testing and sensitivity level testing have been explained above and will not be repeated here.

[0128] After obtaining the general RF test results, type approval RF test results, and network access RF test results, the test is confirmed to be complete, and the equipment testing process ends.

[0129] This disclosure utilizes a program to control instruments in an automated testing system, enabling switching between instruments for different test cases, instrument states, and instrument functions. The program also filters, inputs, judges, and generates reports based on results, thereby reducing the time spent on setting up and converting test instrument environments, manual test setup, and manual result recording and judgment, thus improving testing efficiency. Simultaneously, automated setting and judgment reduce errors from manual settings and judgments, improving test accuracy, efficiency, and quality. Furthermore, user customization is supported, enhancing operability, practicality, and applicability, thus improving the usability and applicability of the equipment testing method disclosed herein. The preset test parameters and corresponding control logic of this disclosure enable automatic sequential testing and automated downward probing for sensitivity level testing processes, and automatic sequential testing and automated upward probing for blocking level testing processes, improving the efficiency and accuracy of equipment testing. Before testing, the system is set up and saved according to the form and test requirements. It can then be tested with one click. No additional settings are required during the test. Compared with fully manual testing and manual judgment of results, it reduces the manpower requirement. One person can test multiple automated systems at the same time, reducing labor costs. In addition, this solution supports the function of saving and importing test form settings. If there are no new test requirements, the system can be set up once and only the imported form needs to be tested, which simplifies the test operation, reduces training costs and the risk of incorrect settings. Therefore, this system is simple to use, easy to operate, and reduces labor costs.

[0130] Based on the same concept, this disclosure also provides a device testing apparatus 100.

[0131] It is understood that the device testing apparatus 100 provided in this disclosure includes hardware structures and / or software modules corresponding to each function in order to achieve the above-mentioned functions. In conjunction with the units and algorithm steps of the various examples disclosed in this disclosure, this disclosure can be implemented in hardware or a combination of hardware and computer software. Whether a function is executed by hardware or by computer software driving hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the technical solutions of this disclosure.

[0132] Figure 16 This is a block diagram illustrating a device testing apparatus 100 according to an exemplary embodiment. (Refer to...) Figure 16 The device includes a device type determination unit 101, a test parameter determination unit 102, and an RF test unit 103.

[0133] The device type determination unit 101 is used to determine the device type of the device under test in response to receiving a device test instruction.

[0134] The test parameter determination unit 102 determines the first target test parameter corresponding to the type of device under test based on the correspondence between the device type and the test parameters.

[0135] The radio frequency test unit 103 is used to perform radio frequency tests on the device under test when the test parameters are the first target test parameters, and generate test results. The radio frequency test includes test items implemented by automatically adjusting the test level. The test level includes the initial test level and the test level change value.

[0136] In some implementations, the RF test unit 103 performs RF testing on the device under test and generates test results in the following manner: based on a preset packet loss rate threshold, an initial test level, and a test level change value, it performs a level test and generates a level test result.

[0137] In some implementations, the RF test unit 103 performs RF testing on the device under test and generates test results in the following manner: for each test item in the preset test item set, a transmission test is performed using the corresponding test path, and the transmission test results are obtained.

[0138] In some implementations, the preset test item set includes one or more of the following test items: maximum transmit power test, occupied bandwidth test, frequency tolerance test, vector error amplitude test, adjacent channel power leakage suppression test, power control test, switching test, time template test, equivalent isotropic radiated power test, occupied bandwidth test, instrument environment switching test, spurious emission test, and spectrum emission template test.

[0139] In some implementations, the initial test level includes an initial power level and an initial interference level, and the test level change value includes a power level change value and an interference level change value. The RF test unit 103 performs level tests based on a preset packet loss rate threshold, the initial test level, and the test level change value, generating level test results as follows: It performs sensitivity level tests based on the packet loss rate threshold, the initial power level, and the power level change value, generating sensitivity level test results; and / or performs blocking level tests based on the packet loss rate threshold, the initial interference level, and the interference level change value, generating blocking level test results.

[0140] In some implementations, the power level change value includes a first power level change value, a second power level change value, and a third power level change value, wherein the first power level change value is greater than the second power level change value, and the second power level change value is greater than the third power level change value. The RF test unit 103 performs sensitivity level testing using a packet loss rate threshold, an initial power level, and a power level change value in the following manner, generating a sensitivity level test result: A first initial test signal is sent to the device under test based on the initial power level, and the first initial packet loss rate corresponding to the first initial test signal is obtained. A first power level is obtained based on the first initial packet loss rate, the second power level change value, the packet loss rate threshold, and the initial power level, wherein the first packet loss rate corresponding to the first power level is greater than the packet loss rate threshold. The first power level is adjusted based on the first packet loss rate, the first power level change value, the third power level change value, and the packet loss rate threshold to obtain a second power level, wherein the second packet loss rate corresponding to the second power level is greater than the packet loss rate threshold. The sum of the second power level and the third power level change value is determined as the sensitivity level test result.

[0141] In some implementations, the RF test unit 103 obtains the first power level based on a first initial packet loss rate, a second power level change value, a packet loss rate threshold, and an initial power level as follows: In response to a first initial packet loss rate greater than the packet loss rate threshold, the initial power level is determined as the first power level. In response to a first initial packet loss rate less than or equal to the packet loss rate threshold, the initial power level is lowered based on the second power level change value to obtain a first lowered power level, and the packet loss rate corresponding to the first lowered power level is determined. If the packet loss rate corresponding to the first lowered power level is greater than the packet loss rate threshold, the first lowered power level is determined as the first power level.

[0142] In some implementations, the RF test unit 103 adjusts the first power level to obtain a second power level based on a first packet loss rate, a first power level change value, a third power level change value, and a packet loss rate threshold as follows: The first power level is increased based on the first power level change value to obtain a first increased power level. A third packet loss rate corresponding to the first increased power level is determined. In response to the third packet loss rate being greater than the packet loss rate threshold, the first increased power level is determined as the second power level. In response to the third packet loss rate being less than or equal to the packet loss rate threshold, the first increased power level is decreased based on the third power level change value to obtain a second decreased power level. The packet loss rate corresponding to the second decreased power level is determined. If the packet loss rate corresponding to the second decreased power level is greater than the packet loss rate threshold, the second decreased power level is determined as the second power level.

[0143] In some implementations, the RF test unit 103 performs a blocking level test based on a packet loss rate threshold, an initial interference level, and an interference level change value, generating a blocking level test result as follows: A second initial test signal is sent to the device under test based on the initial interference level, and a second initial packet loss rate corresponding to the second initial test signal is obtained. A first interference level is obtained based on the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level. The fourth packet loss rate corresponding to the first interference level is greater than the packet loss rate threshold. The difference between the first interference level and the interference level change value is determined as the blocking level test result.

[0144] In some implementations, the RF test unit 103 obtains a first interference level based on a second initial packet loss rate, an interference level change value, a packet loss rate threshold, and an initial interference level as follows: In response to a second initial packet loss rate greater than the packet loss rate threshold, the initial interference level is determined as the first interference level. In response to a second initial packet loss rate less than or equal to the packet loss rate threshold, the initial interference level is increased based on the interference level change value to obtain an increased interference level, and the packet loss rate corresponding to the increased interference level is determined. If the packet loss rate corresponding to the increased interference level is greater than the packet loss rate threshold, the increased interference level is determined as the first interference level.

[0145] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0146] Figure 17 This is a block diagram illustrating an apparatus 200 for device testing according to an exemplary embodiment. The apparatus 200 can be provided as a terminal. For example, the apparatus 200 can be a mobile phone, computer, digital broadcasting terminal, messaging device, game console, tablet device, medical device, fitness equipment, personal digital assistant, etc.

[0147] Reference Figure 17 The device 200 may include one or more of the following components: processing component 202, memory 204, power component 206, multimedia component 208, audio component 210, input / output (I / O) interface 212, sensor component 214, and communication component 216.

[0148] Processing component 202 typically controls the overall operation of device 200, such as operations associated with display, telephone calls, data communication, camera operation, and recording. Processing component 202 may include one or more processors 220 to execute instructions to perform all or part of the steps of the methods described above. Furthermore, processing component 202 may include one or more modules to facilitate interaction between processing component 202 and other components. For example, processing component 202 may include a multimedia module to facilitate interaction between multimedia component 208 and processing component 202.

[0149] Memory 204 is configured to store various types of data to support the operation of device 200. Examples of such data include instructions for any application or method operating on device 200, contact data, phonebook data, messages, pictures, videos, etc. Memory 204 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk.

[0150] The power supply component 206 provides power to the various components of the device 200. The power supply component 206 may include a power management system, one or more power sources, and other components associated with generating, managing, and distributing power to the device 200.

[0151] Multimedia component 208 includes a screen that provides an output interface between the device 200 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touchscreen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touches, swipes, and gestures on the touch panel. The touch sensors may sense not only the boundaries of the touch or swipe action but also the duration and pressure associated with the touch or swipe operation. In some embodiments, multimedia component 208 includes a front-facing camera and / or a rear-facing camera. When the device 200 is in an operating mode, such as a shooting mode or a video mode, the front-facing camera and / or the rear-facing camera may receive external multimedia data. Each front-facing camera and rear-facing camera may be a fixed optical lens system or have focal length and optical zoom capabilities.

[0152] Audio component 210 is configured to output and / or input audio signals. For example, audio component 210 includes a microphone (MIC) configured to receive external audio signals when device 200 is in an operating mode, such as call mode, recording mode, and voice recognition mode. The received audio signals may be further stored in memory 204 or transmitted via communication component 216. In some embodiments, audio component 210 also includes a speaker for outputting audio signals.

[0153] I / O interface 212 provides an interface between processing component 202 and peripheral interface modules, such as keyboards, click wheels, buttons, etc. These buttons may include, but are not limited to, home buttons, volume buttons, power buttons, and lock buttons.

[0154] Sensor assembly 214 includes one or more sensors for providing status assessments of various aspects of device 200. For example, sensor assembly 214 may detect the on / off state of device 200, the relative positioning of components such as the display and keypad of device 200, changes in the position of device 200 or a component of device 200, the presence or absence of user contact with device 200, the orientation or acceleration / deceleration of device 200, and temperature changes of device 200. Sensor assembly 214 may include a proximity sensor configured to detect the presence of nearby objects without any physical contact. Sensor assembly 214 may also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, sensor assembly 214 may also include an accelerometer, a gyroscope, a magnetometer, a pressure sensor, or a temperature sensor.

[0155] Communication component 216 is configured to facilitate wired or wireless communication between device 200 and other devices. Device 200 can access wireless networks based on communication standards, such as WiFi, 2G, or 3G, or combinations thereof. In one exemplary embodiment, communication component 216 receives broadcast signals or broadcast-related information from an external broadcast management system via a broadcast channel. In one exemplary embodiment, communication component 216 also includes a near-field communication (NFC) module to facilitate short-range communication. For example, the NFC module may be implemented based on radio frequency identification (RFID) technology, Infrared Data Association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.

[0156] In an exemplary embodiment, the apparatus 200 may be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to perform the methods described above.

[0157] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 204 including instructions, which can be executed by a processor 220 of the device 200 to perform the above-described method. For example, the non-transitory computer-readable storage medium may be a ROM, random access memory (RAM), CD-ROM, magnetic tape, floppy disk, and optical data storage device, etc.

[0158] Figure 18 This is a block diagram illustrating an apparatus 300 for device testing according to an exemplary embodiment. For example, apparatus 300 may be provided as a server. (Refer to...) Figure 18 The device 300 includes a processing component 322, which further includes one or more processors, and memory resources represented by memory 332 for storing instructions, such as application programs, that can be executed by the processing component 322. The application programs stored in memory 332 may include one or more modules, each corresponding to a set of instructions. Furthermore, the processing component 322 is configured to execute instructions to perform the aforementioned device testing method.

[0159] Device 300 may also include a power supply component 326 configured to perform power management of device 300, a wired or wireless network interface 350 configured to connect device 300 to a network, and an input / output (I / O) interface 358. Device 300 may operate on an operating system stored in memory 332, such as Windows Server™, MacOSX™, Unix™, Linux™, FreeBSD™, or similar.

[0160] It is understood that in this disclosure, "multiple" refers to two or more, and other quantifiers are similar. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, and B alone. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. The singular forms "a," "the," and "the" are also intended to include the plural forms unless the context clearly indicates otherwise.

[0161] It is further understood that the terms "first," "second," etc., are used to describe various types of information, but this information should not be limited to these terms. These terms are only used to distinguish information of the same type from one another, and do not indicate a specific order or degree of importance. In fact, the expressions "first," "second," etc., are completely interchangeable. For example, without departing from the scope of this disclosure, first information can also be referred to as second information, and similarly, second information can also be referred to as first information.

[0162] It is further understood that the terms “center,” “longitudinal,” “lateral,” “front,” “rear,” “up,” “down,” “left,” “right,” “vertical,” “horizontal,” “top,” “bottom,” “inner,” and “outer,” etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this embodiment and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation.

[0163] It can be further understood that, unless otherwise specified, "connection" includes both direct connections where no other components exist between the two parties and indirect connections where other components exist between them.

[0164] It is further understood that although operations are described in a specific order in the accompanying drawings in the embodiments of this disclosure, this should not be construed as requiring these operations to be performed in the specific order or serial order shown, or requiring all of the shown operations to be performed to obtain the desired result. In certain environments, multitasking and parallel processing may be advantageous.

[0165] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of the invention that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein.

[0166] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A device testing method, characterized in that, include: Upon receiving a device test instruction, determine the type of device under test (DUT) for the device to be tested; Based on the correspondence between device type and test parameters, determine the first target test parameter corresponding to the device type under test; When the test parameters are the first target test parameters, the device under test is subjected to radio frequency (RF) testing, and test results are generated. The RF test includes test items implemented by automatically adjusting the test level, and the test level includes the initial test level and the test level change value.

2. The method according to claim 1, characterized in that, The step of performing radio frequency testing on the device under test and generating test results includes: Based on the preset packet loss rate threshold, initial test level, and test level change value, a level test is performed, and a level test result is generated.

3. The method according to claim 2, characterized in that, The step of performing radio frequency testing on the device under test and generating test results also includes: For each test item in the preset test item set, a sending test is performed using the corresponding test path, and the sending test results are obtained.

4. The method according to claim 3, characterized in that, The preset test item set includes one or more of the following test items: Maximum transmit power test, frequency tolerance test, vector error amplitude test, adjacent channel power leakage suppression test, power control test, switching test, time template test, equivalent isotropic radiated power test, occupied bandwidth test, instrument environment switching test, spurious emission test, spectrum emission template test.

5. The method according to claim 2, characterized in that, The initial test level includes the initial power level and the initial interference level, and the test level change value includes the power level change value and the interference level change value. The step of performing a level test based on a preset packet loss rate threshold, an initial test level, and a test level change value, and generating a level test result, includes: Based on the packet loss rate threshold, the initial power level, and the power level change value, a sensitivity level test is performed to generate a sensitivity level test result; and / or Based on the packet loss rate threshold, the initial interference level, and the interference level change value, a blocking level test is performed to generate a blocking level test result.

6. The method according to claim 5, characterized in that, The power level change value includes a first power level change value, a second power level change value, and a third power level change value, wherein the first power level change value is greater than the second power level change value, and the second power level change value is greater than the third power level change value; The step of performing a sensitivity level test based on the packet loss rate threshold, the initial power level, and the power level change value, and generating a sensitivity level test result, includes: A first initial test signal is sent to the device under test according to the initial power level, and the first initial packet loss rate corresponding to the first initial test signal is obtained; A first power level is obtained based on the first initial packet loss rate, the second power level change value, the packet loss rate threshold, and the initial power level, wherein the first packet loss rate corresponding to the first power level is greater than the packet loss rate threshold. Based on the first packet loss rate, the first power level change value, the third power level change value, and the packet loss rate threshold, the first power level is adjusted to obtain a second power level, and the second packet loss rate corresponding to the second power level is greater than the packet loss rate threshold. The sum of the changes in the second power level and the third power level is determined as the sensitivity level test result.

7. The method according to claim 6, characterized in that, The step of obtaining the first power level based on the first initial packet loss rate, the second power level change value, the packet loss rate threshold, and the initial power level includes: In response to the first initial packet loss rate being greater than the packet loss rate threshold, the initial power level is determined as the first power level; In response to the first initial packet loss rate being less than or equal to the packet loss rate threshold, the initial power level is lowered according to the second power level change value to obtain a first lowered power level, and the packet loss rate corresponding to the first lowered power level is determined. If the packet loss rate corresponding to the first lowered power level is greater than the packet loss rate threshold, the first lowered power level is determined as the first power level.

8. The method according to claim 6, characterized in that, The step of adjusting the first power level to obtain the second power level based on the first packet loss rate, the first power level change value, the third power level change value, and the packet loss rate threshold includes: The first power level is adjusted upward based on the first power level change value to obtain the first adjusted power level; Determine the third packet loss rate corresponding to the first adjusted power level; In response to the third packet loss rate being greater than the packet loss rate threshold, the first up-adjusted power level is determined as the second power level; In response to the third packet loss rate being less than or equal to the packet loss rate threshold, the first adjusted power level is lowered according to the third power level change value to obtain a second adjusted power level. The packet loss rate corresponding to the second adjusted power level is determined. If the packet loss rate corresponding to the second adjusted power level is greater than the packet loss rate threshold, the second adjusted power level is determined as the second power level.

9. The method according to claim 5, characterized in that, The step of performing a blocking level test based on the packet loss rate threshold, the initial interference level, and the interference level change value, and generating a blocking level test result, includes: A second initial test signal is sent to the device under test based on the initial interference level, and the second initial packet loss rate corresponding to the second initial test signal is obtained; Based on the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level, a first interference level is obtained, and the fourth packet loss rate corresponding to the first interference level is greater than the packet loss rate threshold. The difference between the first interference level and the change value of the interference level is determined as the blocking level test result.

10. The method according to claim 9, characterized in that, The step of obtaining the first interference level based on the second initial packet loss rate, the interference level change value, the packet loss rate threshold, and the initial interference level includes: In response to the second initial packet loss rate being greater than the packet loss rate threshold, the initial interference level is determined as the first interference level; In response to the second initial packet loss rate being less than or equal to the packet loss rate threshold, the initial interference level is increased according to the interference level change value to obtain the increased interference level, and the packet loss rate corresponding to the increased interference level is determined. If the packet loss rate corresponding to the increased interference level is greater than the packet loss rate threshold, the increased interference level is determined as the first interference level.

11. A device for testing equipment, characterized in that, include: The device type determination unit is used to determine the device type under test in response to receiving a device test instruction; The test parameter determination unit determines the first target test parameter corresponding to the type of device under test based on the correspondence between device type and test parameters; The radio frequency (RF) test unit is used to perform RF tests on the device under test (DUT) with the test parameters being the first target test parameters, and to generate test results. The RF test includes test items implemented by automatically adjusting the test level, and the test level includes the initial test level and the test level change value.

12. An electronic device, characterized in that, include: processor: Memory used to store processor-executable instructions; The processor is configured to execute the device testing method according to any one of claims 1 to 10.

13. A storage medium, characterized in that, The storage medium stores instructions that, when executed by a processor, enable the processor to perform the device testing method according to any one of claims 1 to 10.

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