Precise splicing device and method of pixel array detector module

By combining pinhole imaging calibration technology and a customized adapter board, the problem of inaccurate measurement of gaps and tilt angles in pixel array detector module splicing was solved, achieving high-precision and simple module splicing and improving imaging quality and stability.

CN121967672APending Publication Date: 2026-05-01BEIJING AISI WINDOW TECHNOLOGY CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
BEIJING AISI WINDOW TECHNOLOGY CO LTD
Filing Date
2026-01-27
Publication Date
2026-05-01

AI Technical Summary

Technical Problem

Existing pixel array detector module splicing technology suffers from inaccurate measurement of module gaps and tilt angles, complex operation, and poor versatility, resulting in unstable imaging quality.

Method used

By employing pinhole imaging calibration technology combined with a customized mechanical adapter structure, precise measurement and adaptive splicing between modules are achieved through a calibration unit, a parameter analysis unit, and a customized adapter board. The gaps and tilt angles between modules are calculated using a light tube, a pinhole imaging sheet, and a parameter analysis unit, and then precisely installed using a customized adapter board.

Benefits of technology

It improves splicing accuracy and efficiency, reduces beam propagation distortion, ensures imaging quality and stability, adapts to the splicing requirements of detector modules of different specifications, and extends service life.

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Abstract

The invention belongs to the technical field of detector splicing calibration, and discloses an accurate splicing device and method for pixel array detector modules. The device comprises a calibration unit, a parameter analysis unit, a customized adapter plate and a fixing assembly, the calibration unit is used for generating and acquiring imaging signals of calibration parameters between each detector module to be calibrated in the pixel array detector and the adjacent detector module; the parameter analysis unit is connected with a to-be-calibrated detector module and is used for calculating calibration parameters between the detector module and an adjacent detector module according to an imaging signal received by the detector module and calibration parameters of the detector module; the customized adapter plate is provided with a plurality of mounting positions processed according to calibration parameters corresponding to the detector modules, and the mounting positions are used for mounting the detector modules to be spliced, so that the splicing precision of the detector modules is improved; and the fixing assembly is used for fixing the detector module on a corresponding mounting position on a customized adapter plate.
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Description

A precise stitching device and method for a pixel array detector module Technical Field

[0001] This invention belongs to the field of detector splicing and calibration technology, and relates to a precise splicing device and method for pixel array detector modules, which is applicable to module assembly and accuracy improvement scenarios of various large-size pixel array detectors. Background Technology

[0002] Pixel array detectors, with their advantages of high resolution and large detection area, are widely used in medical imaging, industrial inspection, astrophysical observation, and other fields. Due to the size limitations of individual detector modules, practical applications typically require the splicing of multiple modules to form a complete pixel array detector. However, during the module splicing process, horizontal and vertical gaps (hereinafter collectively referred to as "gap") can easily occur between adjacent modules. Simultaneously, the modules themselves may have deviations in horizontal and vertical tilt angles. These problems can lead to breaks, overlaps, or signal distortion in the detector's imaging area, severely affecting the accuracy of the detection data and the quality of subsequent image reconstruction.

[0003] In existing pixel array detector module splicing technologies, the calibration of module gaps and tilt angles largely relies on direct measurement using high-precision instruments such as laser interferometers and coordinate measuring machines. This method has the following drawbacks: First, the measurement process is greatly affected by environmental vibrations and light interference, resulting in unstable measurement accuracy; second, the measurement operation is complex, requiring professional personnel to operate the instruments, leading to low calibration efficiency; third, measurement parameters need to be readjusted for different specifications of detector modules, resulting in poor versatility. Furthermore, existing splicing devices mostly use rigid supports to directly fix the modules, which cannot adaptively adjust according to the measured gaps and tilt angles, leading to ineffective compensation for positional deviations of the spliced ​​modules and making it difficult to meet the requirements of high-precision detection.

[0004] Therefore, there is an urgent need for a pixel array detector module splicing technology that is easy to operate, accurate in calibration, and highly adaptable, to solve the problems of accurate measurement of gaps and tilt angles between modules and adaptive splicing, thereby improving the overall performance of the detector. Summary of the Invention

[0005] To address the problems existing in the prior art, the present invention aims to provide a precise stitching device and method for pixel array detector modules. This invention addresses the industry pain points of insufficient stitching accuracy and complex operation of existing large-size pixel array detector modules. Leveraging the high stability advantages of pinhole imaging calibration technology and combining it with a customized mechanical adapter structure, a complete technical chain of "calibration-analysis-adaptation-fixing" is formed. This enables precise measurement of horizontal / vertical gaps and horizontal / vertical tilt angles between detector modules, and completes the precise stitching of modules through a customized adapter plate. This effectively improves detector stitching accuracy and assembly efficiency, and enhances the imaging quality and stability of the detector.

[0006] The technical solution of the present invention is as follows: a precise splicing device for pixel array detector modules, characterized in that it includes a calibration unit, a parameter analysis unit, a customized adapter plate, and a fixing component; the calibration unit is used to generate imaging signals to acquire the calibration parameters of each detector module to be calibrated in the pixel array detector and its calibration parameters with adjacent detector modules; the parameter analysis unit is communicatively connected to the detector module to be calibrated and is used to calculate the calibration parameters between the detector module and its adjacent detector modules, as well as the calibration parameters of the detector module, based on the imaging signals received by the detector module; the customized adapter plate is provided with multiple mounting positions processed according to the calibration parameters corresponding to each detector module to be spliced, for mounting each detector module to be spliced, thereby improving the splicing accuracy of each detector module; the fixing component is used to fix the detector module on the corresponding mounting position on the customized adapter plate.

[0007] Preferably, the calibration unit includes a light tube and a pinhole imaging plate; the light tube is used to emit a uniform parallel light beam as a calibration reference light source; the pinhole imaging plate is disposed between the light tube and the detector module to be calibrated; the pinhole imaging plate is provided with a pinhole array, and the pinhole array area covers the detector module to be calibrated and the gap area between it and the adjacent detector module.

[0008] Preferably, the calibration parameters of the detector module to be calibrated include the horizontal tilt angle and the vertical tilt angle of the detector module relative to the reference plane; the calibration parameters between the detector module to be calibrated and the adjacent detector modules include the horizontal gap and the vertical gap between the detector module to be calibrated and the adjacent detector modules.

[0009] Preferably, the calculation methods for each parameter are as follows: The horizontal gap is calculated by selecting the light spot in the boundary area of ​​adjacent detector modules as the characteristic light spot. If there is a positional difference ΔX between the characteristic light spots on the two detector modules in the horizontal direction, then the horizontal gap between the adjacent detector modules is ΔX. The vertical gap is calculated by selecting the light spot in the boundary area of ​​adjacent detector modules. If there is a positional difference ΔY in the vertical direction, then the vertical gap between the adjacent detector modules is ΔY. The horizontal tilt angle is calculated by selecting multiple light spots distributed horizontally on the surface of a single detector module, fitting the angle between the line connecting the centers of the selected multiple light spots and the horizontal reference side of the detector module, and using this angle as the horizontal tilt angle α of the detector module. The vertical tilt angle is calculated by selecting multiple light spots distributed vertically on the surface of a single detector module, fitting the angle between the line connecting the centers of the selected multiple light spots and the vertical reference side of the detector module, and using this angle as the vertical tilt angle β of the detector module.

[0010] Preferably, the distance between the pinhole imaging patch and the detector module to be calibrated is 0.5-2mm; the aperture of the pinhole in the pinhole array is 20-30μm; the cross-sectional dimensions of the pinhole array are 1.4mm×30 columns and the longitudinal dimensions are 2.8mm×15 rows; the center-to-center distance between adjacent pinholes along the cross-sectional direction is 1.4mm and the center-to-center distance between adjacent pinholes along the longitudinal direction is 2.8mm.

[0011] Preferably, the fixing component includes a positioning pin, a fastening bolt, and a buffer washer. The positioning pin is used to initially position the detector module, and then the fastening bolt and the buffer washer are used to fix the detector module to the customized adapter plate.

[0012] A precise splicing method for pixel array detector modules includes the following steps: 1) Placing the detector modules to be spliced ​​on a calibration platform according to a preset initial position, adjusting the spacing between the detector modules to initially align the edges of adjacent detector modules; fixing the light tube to one side of the calibration platform to ensure that the parallel beam emitted by it covers the effective detection area of ​​the detector module to be calibrated; fixing the pinhole imaging plate between the light tube and the detector module to be calibrated; 2) Activating the light tube to emit a uniform parallel beam, which, after passing through the pinhole array of the pinhole imaging plate, forms an array of light spots on the surface of the detector module to be calibrated; collecting the light spot imaging data received by the detector module through a parameter analysis unit, and recording the coordinate information of each light spot in the pixel coordinate system of the detector module; 3) The parameter analysis unit compares the position of the pinhole array with the position of the light spot on the detector module to calculate the calibration parameters between the detector module and its adjacent detector modules, as well as the calibration parameters of the detector module; 4) Processing the mounting positions of each detector module on an adapter board according to the calibration parameters corresponding to each detector module to obtain a customized adapter board; fixing each detector module on the corresponding mounting position on the customized adapter board.

[0013] Preferably, the spliced ​​detector module is calibrated a second time. If the gap error is less than one pixel and the tilt angle is less than 0.01°, the splicing is qualified. If the accuracy requirement is not met, the parameters of the mounting position are adjusted until the splicing accuracy requirement is met.

[0014] The advantages of this invention are as follows: 1. High calibration accuracy: A specific aperture array is used as the calibration reference. The aperture diameter and array distribution parameters are precisely designed. Combined with the installation method close to the detector module, the distortion during beam propagation can be effectively reduced, making the light spot imaging clearer. Combined with the precise calculation of the parameter analysis unit, the measurement error of the gap can be controlled within one pixel, and the measurement error of the tilt angle can be controlled within 0.01°, significantly improving the calibration accuracy.

[0015] 2. Simple and efficient operation: The calibration process only requires setting up a simple system of X-ray tube-pinhole imaging film-detector. No complicated instrument debugging is required. The parameter analysis unit can automatically complete data acquisition and calculation. Compared with the traditional laser interferometry method, the calibration efficiency is improved by more than 60%.

[0016] 3. Strong splicing adaptability: The customized adapter board can be customized according to the calibration parameters of detector modules of different specifications, adapting to the splicing requirements of various pixel array detectors, solving the problem of poor universality of traditional rigid brackets.

[0017] 4. Good splicing stability: The adapter plate is made of high-strength aluminum alloy and is fixed with positioning pins and buffer pads, which can effectively prevent loosening or deformation after module splicing, ensure the splicing stability of the detector during long-term use, and extend the service life of the detector.

[0018] This invention can be widely applied in fields that require large-size, high-precision pixel array detectors, such as medical imaging (e.g., CT and DR detectors), industrial inspection (e.g., non-destructive testing detectors), and astrophysical observation (e.g., astronomical telescope detectors), and has great market application potential. Attached Figure Description

[0019] Figure 1 is a schematic diagram of the splicing device in an embodiment of the present invention.

[0020] Figure 2 is a schematic diagram of the structure of the pinhole imaging sheet in an embodiment of the present invention.

[0021] Figure 3 is a flowchart of the splicing method in an embodiment of the present invention.

[0022] Reference numerals: 1-X-ray tube, 2-pinhole imaging plate, 3-pinhole, 4-detector module, 5-parameter resolution unit, 6-customized adapter board, 7-mounting position. Detailed Implementation

[0023] The present invention will now be described in further detail with reference to the accompanying drawings. The examples given are only for explaining the present invention and are not intended to limit the scope of the present invention.

[0024] An optional embodiment of the present invention includes a pixel array detector module precision splicing device comprising a calibration unit (light tube + pinhole imaging sheet) with specific structure and parameters, a parameter analysis unit, a customized adapter board, and fixing components. Key parameters of the pinhole imaging sheet: spacing range 0.5-2mm, pinhole diameter 20-30μm, array specifications 1.4mm×30 columns and 2.8mm×15 rows.

[0025] The splicing method based on the above-mentioned device includes a complete set of steps such as calibration system construction, imaging signal acquisition, gap and tilt angle calculation, adapter plate processing, module installation and accuracy re-inspection.

[0026] The calibration unit, parameter analysis unit, customized adapter plate, and fixing components included in the precision splicing device of the present invention are described below. The structure, function, and parameters of each component are as follows.

[0027] Calibration Unit: Used for precise calibration of the detector modules and parameters between the pixel array detector, including a light tube and a pinhole imaging plate. The light tube emits a uniform parallel beam as a calibration reference light source. The pinhole imaging plate is positioned between the light tube and the detector module to be calibrated, close to the module, with a distance of 0.5-2mm to ensure imaging accuracy. The pinhole imaging plate has an array of pinholes with a diameter of 20-30μm. The cross-sectional dimensions of the pinhole array are 1.4mm × 30 columns, and the longitudinal dimensions are 2.8mm × 15 rows. This means that along the cross-sectional direction, the center-to-center distance between adjacent pinholes is 1.4mm, with a total of 30 columns of pinholes. Along the longitudinal direction, the center-to-center distance between adjacent pinholes is 2.8mm, with a total of 15 rows of pinholes. This pinhole array can cover the main detector modules and the gap areas between modules, ensuring comprehensive calibration parameters. The gap between modules and the tilt angle of a single module are calibrated by moving the position of the pinhole imaging plate. The imaging signals from all the pinholes on the pinhole imaging plate do not need to be incident on the corresponding detector module. We calculate the gap and tilt angle by the coordinate position of the pinhole on the detector image.

[0028] Parameter parsing unit: It communicates with the pixel array detector to be calibrated and is used to collect the pinhole imaging signal received by the detector module. By analyzing the position offset and shape distortion of the imaging spot, it calculates the horizontal gap and vertical gap between adjacent detector modules, as well as the horizontal tilt angle and vertical tilt angle of a single detector module relative to the reference plane.

[0029] Customized adapter board: As the mounting carrier of the detector module, its surface is machined with mounting positions that match the detector module according to the gap value and tilt angle output by the parameter analysis unit. The horizontal / vertical position and tilt angle of each mounting position are adapted to the calibration parameters of the corresponding detector module to ensure that the original deviation can be compensated after the module is installed. The adapter board is made of high-strength aluminum alloy with a thickness of 5-7mm, which combines lightweight and structural stability.

[0030] Fixing components: including locating pins, fastening bolts, and buffer washers, are used to precisely fix the detector module to the customized adapter plate. The buffer washers are made of silicone to prevent mechanical damage to the detector module during installation.

[0031] The embodiments of the present invention provide a precise stitching method for pixel array detector modules. The method is based on the above-mentioned stitching device and includes the following steps: 1) Calibration system setup: N detector modules (N≥2) to be stitched are placed on the calibration platform according to the preset initial position, and the spacing between the detector modules is adjusted to make the edges of adjacent detector modules initially aligned; the light tube is fixed to one side of the calibration platform to ensure that the parallel beam emitted by it can cover the effective detection area of ​​the detector module to be calibrated; the pinhole imaging plate is fixed between the light tube and the detector module and close to the surface of the detector module, and the pinhole imaging plate is fixed by the fine-tuning bracket to ensure that it is parallel to the light outlet of the light tube.

[0032] 2) Imaging signal acquisition: The X-ray tube is activated to emit a uniform parallel beam. After the beam passes through the pinhole array of the pinhole imaging sheet, it forms an array of light spots on the surface of the detector module to be calibrated. The light spot imaging data received by each detector module is acquired through the parameter analysis unit, and the coordinate information of each light spot in the pixel coordinate system of the detector module is recorded.

[0033] 3) Gap and Tilt Angle Calculation: The parameter analysis unit compares the standard coordinates of the pinhole array (establishing a coordinate system with the geometric center of the pinhole imaging patch as the origin) with the actual coordinates of the light spot on the detector module to calculate the deviation parameters: Horizontal gap calculation: Select the light spot in the boundary area between adjacent detector modules as the characteristic light spot. If there is a positional difference ΔX between the characteristic light spots on the two detector modules in the horizontal direction, then the horizontal gap value between the adjacent detector modules is ΔX; Vertical gap calculation: Similarly, select the light spot in the boundary area between adjacent detector modules. If there is a positional difference ΔY in the vertical direction, then the horizontal gap value between the adjacent detector modules is ΔY. The vertical gap value is ΔY; Horizontal tilt angle calculation: For a single detector module, select multiple light spots distributed horizontally on its surface, and fit the angle between the line connecting the centers of the selected multiple light spots and the horizontal reference side of the detector module. This angle is the horizontal tilt angle α of the detector module; Select the bottom edge of the detector module as the horizontal reference side; Vertical tilt angle calculation: Select multiple light spots distributed vertically on the surface of a single detector module, and fit the angle between the line connecting the centers of the light spots and the vertical reference side of the detector module. This angle is the vertical tilt angle β of the detector module; Select the left side of the detector module as the vertical reference side.

[0034] Repeat steps 1) to 3) of the calibration process to obtain the calibration parameters corresponding to each detector module to be spliced.

[0035] 4) Customized adapter board processing: Based on the horizontal gap, vertical gap, horizontal tilt angle α, and vertical tilt angle β calculated in step 3), the mounting positions are processed on the adapter board: For the mounting positions of adjacent detector modules, a horizontal gap value is reserved along the horizontal direction, and a vertical gap value is reserved along the vertical direction; for the mounting position of a single detector module, it is processed into an inclined surface that matches the horizontal tilt angle α and the vertical tilt angle β to ensure that the original tilt deviation can be offset after the detector module is installed.

[0036] 5) Module splicing and installation: Place each detector module on the corresponding mounting position of the customized adapter plate, and use positioning pins to achieve the initial positioning of the detector module. Then use fastening bolts to fix the detector module to the customized adapter plate. During the bolt tightening process, use buffer pads to avoid secondary deformation caused by uneven force on the detector module.

[0037] 6) Re-inspection of splicing accuracy: Perform secondary calibration on the spliced ​​detector module. If the gap value error is less than one pixel and the tilt angle is less than 0.01°, the splicing is qualified. If the accuracy requirement is not met, return to step 4) to adjust the mounting position parameters of the adapter board until the splicing accuracy requirement is met.

[0038] This embodiment takes the splicing of two HEPS-BPIX pixel array detector modules as an example, and the specific implementation process is as follows.

[0039] 1. The structure of the splicing device in this embodiment of the invention is shown in Figure 1. The selection and parameters of the device components are as follows: X-ray tube: A Mo target X-ray tube with an output energy of 17keV is selected, which can emit a uniform parallel beam with a diameter of 50mm.

[0040] Pinhole imaging plate: As shown in Figure 2, the figure contains an array of pinholes, with the pinhole diameter, cross-sectional area, and longitudinal section specifications marked. It is made of quartz glass with a thickness of 1 mm. The pinhole diameter is 25 μm, the cross-sectional dimensions are 1.4 mm × 30 columns (along the X-axis, the center-to-center distance between adjacent pinholes is 1.4 mm, for a total of 30 columns), and the longitudinal section dimensions are 2.8 mm × 15 rows (along the Y-axis, the center-to-center distance between adjacent pinholes is 2.8 mm, for a total of 15 rows). It is fixed by a fine-tuning bracket, with a distance of 1 mm between it and the detector module.

[0041] Parameter parsing unit: The data acquisition unit of the HEPS-BPIX detector is used to acquire spot coordinate data.

[0042] Customized adapter board: Made of 6061 aluminum alloy with a thickness of 6mm.

[0043] Fixing components: including φ3mm locating pins, M2.5 fastening bolts, and 3mm thick silicone buffer pads.

[0044] Two detector modules to be spliced, model HEPS-BPIX, each with an effective detection area of ​​81.340mm × 35.980mm.

[0045] 2. The splicing method of the present invention is shown in Figure 3. The specific implementation steps include: setting up the calibration system: placing two detector modules on the calibration platform and initially adjusting the spacing to align the edges of adjacent modules; fixing the X-ray tube on one side of the calibration platform at a distance of 500mm from the detector modules to ensure that the beam covers all modules; fixing the pinhole imaging sheet between the X-ray tube and the modules at a distance of 1mm from the modules and adjusting it to be parallel to the light outlet of the X-ray tube.

[0046] Imaging signal acquisition: The X-ray tube is activated, and the beam forms a spot on the module surface after passing through the pinhole array. The spot coordinate data is acquired through the parameter analysis unit. The sampling frequency is 1000Hz and the acquisition time is 5s. The average value is taken as the final spot coordinate.

[0047] Gap and tilt angle calculation: First, select 3 characteristic light spots in the boundary area of ​​adjacent modules, and calculate the horizontal position difference ΔX1<1 pixel, ΔX2<1 pixel, ΔX3<1 pixel, with an average gap of 0mm; the vertical position difference (upper light spot coordinates + fixed vertical aperture spacing - lower light spot coordinates) ΔY1=20 pixels, ΔY2=22 pixels, ΔY3=23 pixels, with an average vertical gap of max(20 22 23) / 3=23 pixels; select 10 light spots along the X-axis of a single module, and fit the angle α=0.30° between the line connecting them and the module's reference edge; fit the angle β=0° between the 10 light spots along the Y-axis.

[0048] Customized adapter plate processing: Based on the calculated gap value, the coordinates of the imaging software are determined. Based on the calculated tilt angle, two mounting positions are processed on the adapter plate, and the tilt surface of each mounting position is matched with α=0.30° and β=0° respectively.

[0049] Module splicing and installation: Place the detector module in the installation position, position it with φ3mm positioning pins, and use M2.5 fastening bolts with 3mm thick silicone buffer pads to fix the detector module to avoid uneven stress on the detector module and secondary deformation.

[0050] Stitching accuracy re-inspection: Repeat the calibration system setup, imaging signal acquisition and parameter calculation steps. After the second calibration, the horizontal gap was measured to be 23 pixels, the vertical gap was <1 pixel, the tilt angle α was 0.30°, and β was 0°. All of these met the accuracy requirement of "gap value error <1 pixel". The stitching was completed.

[0051] Although specific embodiments of the invention have been disclosed for illustrative purposes to aid in understanding and implementing the invention, those skilled in the art will understand that various substitutions, variations, and modifications are possible without departing from the spirit and scope of the invention and the appended claims. Therefore, the invention should not be limited to the content disclosed in the preferred embodiments, and the scope of protection claimed by the invention is defined by the claims.

Claims

1. A precise stitching device for a pixel array detector module, characterized in that, The system includes a calibration unit, a parameter parsing unit, a customized adapter board, and a fixing component. The calibration unit generates imaging signals to acquire calibration parameters for each detector module to be calibrated in the pixel array detector and its calibration parameters with adjacent detector modules. The parameter parsing unit is communicatively connected to the detector module to be calibrated and calculates the calibration parameters between the detector module and its adjacent detector modules, as well as the calibration parameters of the detector module itself, based on the imaging signals received by the detector module. The customized adapter board has multiple mounting positions processed according to the calibration parameters corresponding to each detector module to be spliced, for mounting each detector module to be spliced ​​and improving the splicing accuracy of each detector module. The fixing component is used to fix the detector modules onto the corresponding mounting positions on the customized adapter board.

2. The precision splicing device according to claim 1, characterized in that, The calibration unit includes a light tube and a pinhole imaging plate; the light tube is used to emit a uniform parallel beam as a calibration reference light source; the pinhole imaging plate is disposed between the light tube and the detector module to be calibrated; the pinhole imaging plate is provided with a pinhole array, and the pinhole array area covers the detector module to be calibrated and the gap area between it and the adjacent detector module.

3. The precision splicing device according to claim 2, characterized in that, The calibration parameters of the detector module to be calibrated include the horizontal tilt angle and the vertical tilt angle of the detector module relative to the reference plane; the calibration parameters between the detector module to be calibrated and the adjacent detector modules include the horizontal gap and the vertical gap between the detector module to be calibrated and the adjacent detector modules.

4. The precision splicing device according to claim 3, characterized in that, The horizontal gap is calculated as follows: A light spot in the boundary region of adjacent detector modules is selected as a characteristic light spot. If there is a positional difference ΔX between the characteristic light spots on the two detector modules in the horizontal direction, then the horizontal gap between the adjacent detector modules is ΔX. The vertical gap is calculated as follows: A light spot in the boundary region of adjacent detector modules is selected. If there is a positional difference ΔY in the vertical direction, then the vertical gap between the adjacent detector modules is ΔY. The horizontal tilt angle is calculated as follows: For a single detector module, multiple light spots distributed horizontally on its surface are selected, and the angle between the line connecting the centers of the selected multiple light spots and the horizontal reference side of the detector module is fitted, which is taken as the horizontal tilt angle α of the detector module. The vertical tilt angle is calculated as follows: Multiple light spots distributed vertically on the surface of a single detector module are selected, and the angle between the line connecting the centers of the selected multiple light spots and the vertical reference side of the detector module is fitted, which is taken as the vertical tilt angle β of the detector module.

5. The precision splicing device according to claim 2, characterized in that, The spacing between the pinhole imaging patch and the detector module to be calibrated is 0.5-2mm; the aperture of the pinhole in the pinhole array is 20-30μm; the cross-sectional dimensions of the pinhole array are 1.4mm×30 columns and the longitudinal dimensions are 2.8mm×15 rows; the center-to-center distance between adjacent pinholes along the cross-sectional direction is 1.4mm and the center-to-center distance between adjacent pinholes along the longitudinal direction is 2.8mm.

6. The precision splicing device according to claim 1, characterized in that, The fixing components include positioning pins, fastening bolts, and buffer washers. The positioning pins are used to initially position the detector module, and then the fastening bolts and buffer washers are used to fix the detector module to the customized adapter plate.

7. A method for precise stitching of a pixel array detector module, comprising the following steps: 1) Place the detector modules to be spliced ​​on the calibration platform according to the preset initial position, and adjust the spacing between the detector modules to initially align the edges of adjacent detector modules; fix the light tube to one side of the calibration platform to ensure that the parallel beam emitted by it covers the effective detection area of ​​the detector module to be calibrated; fix the pinhole imaging plate between the light tube and the detector module to be calibrated; 2) Activate the light tube to emit a uniform parallel beam. After the beam passes through the pinhole array of the pinhole imaging plate, it forms an array of light spots on the surface of the detector module to be calibrated; collect the light spot imaging data received by the detector module through the parameter analysis unit, and record the coordinate information of each light spot in the pixel coordinate system of the detector module; 3) The parameter analysis unit compares the position of the pinhole array with the position of the light spot on the detector module to calculate the calibration parameters between the detector module and its adjacent detector modules, as well as the calibration parameters of the detector module; 4) Process the mounting positions of each detector module on the adapter board according to the calibration parameters corresponding to each detector module to obtain a customized adapter board; fix each detector module on the corresponding mounting position on the customized adapter board.

8. The method according to claim 7, characterized in that, The spliced ​​detector module is calibrated a second time. If the gap error is less than one pixel and the tilt angle is less than 0.01°, the splicing is qualified. If the accuracy requirement is not met, the parameters of the mounting position are adjusted until the splicing accuracy requirement is met.

9. The method according to claim 7, characterized in that, The calibration parameters of the detector module to be calibrated include the horizontal tilt angle and the vertical tilt angle of the detector module relative to the reference plane; the calibration parameters between the detector module to be calibrated and the adjacent detector modules include the horizontal gap and the vertical gap between the detector module to be calibrated and the adjacent detector modules.